U.S. patent number D769,834 [Application Number D/503,992] was granted by the patent office on 2016-10-25 for semiconductor device.
This patent grant is currently assigned to Mitsubishi Electric Corporation. The grantee listed for this patent is Mitsubishi Electric Corporation. Invention is credited to Mikio Ishihara, Tatsuya Kawase, Noboru Miyamoto.
United States Patent |
D769,834 |
Kawase , et al. |
October 25, 2016 |
Semiconductor device
Claims
CLAIM The ornamental design for a semiconductor device, as shown
and described.
Inventors: |
Kawase; Tatsuya (Tokyo,
JP), Miyamoto; Noboru (Tokyo, JP),
Ishihara; Mikio (Tokyo, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
Mitsubishi Electric Corporation |
Chiyoda-ku, Tokyo |
N/A |
JP |
|
|
Assignee: |
Mitsubishi Electric Corporation
(Tokyo, JP)
|
Appl.
No.: |
D/503,992 |
Filed: |
October 1, 2014 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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29464434 |
Aug 16, 2013 |
D719537 |
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Foreign Application Priority Data
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May 8, 2013 [JP] |
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2013-010099 |
May 8, 2013 [JP] |
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2013-010100 |
May 8, 2013 [JP] |
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2013-010101 |
May 8, 2013 [JP] |
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2013-010102 |
May 8, 2013 [JP] |
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2013-010103 |
May 8, 2013 [JP] |
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2013-010104 |
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Current U.S.
Class: |
D13/182 |
Current International
Class: |
1303 |
Field of
Search: |
;D13/182 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
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1411477 |
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Apr 2011 |
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JP |
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1411478 |
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Apr 2011 |
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JP |
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Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Sughrue Mion, PLLC Turner; Richard
C.
Description
FIG. 1 is a front, top and right side perspective view of a
semiconductor device showing our new design;
FIG. 2 is a rear, top, and left side perspective view thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a top plan view thereof;
FIG. 8 is a bottom plan view thereof;
FIG. 9 is a front, top and right side perspective view thereof,
shown in a used condition attached to a mount shown in broken
lines; and,
FIG. 10 is another front elevational view thereof, attached to a
mount shown in broken lines.
The broken lines shown in the drawings represent portions of the
semiconductor device that form no part of the claimed design.
* * * * *