U.S. patent number D808,349 [Application Number D/574,604] was granted by the patent office on 2018-01-23 for elastic membrane for semiconductor wafer polishing apparatus.
This patent grant is currently assigned to EBARA CORPORATION. The grantee listed for this patent is EBARA CORPORATION. Invention is credited to Makoto Fukushima, Osamu Nabeya, Keisuke Namiki, Shingo Togashi, Satoru Yamaki, Hozumi Yasuda.
United States Patent |
D808,349 |
Fukushima , et al. |
January 23, 2018 |
Elastic membrane for semiconductor wafer polishing apparatus
Claims
CLAIM The ornamental design for an elastic membrane for
semiconductor wafer polishing apparatus, as shown and described.
Inventors: |
Fukushima; Makoto (Tokyo,
JP), Yasuda; Hozumi (Tokyo, JP), Namiki;
Keisuke (Tokyo, JP), Nabeya; Osamu (Tokyo,
JP), Togashi; Shingo (Tokyo, JP), Yamaki;
Satoru (Tokyo, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
EBARA CORPORATION |
Tokyo |
N/A |
JP |
|
|
Assignee: |
EBARA CORPORATION (Tokyo,
JP)
|
Appl.
No.: |
D/574,604 |
Filed: |
August 17, 2016 |
Foreign Application Priority Data
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May 15, 2013 [JP] |
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2013-10672 |
May 15, 2013 [JP] |
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2013-10673 |
May 15, 2013 [JP] |
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2013-10674 |
May 15, 2013 [JP] |
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2013-10675 |
May 15, 2013 [JP] |
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2013-10676 |
May 15, 2013 [JP] |
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2013-10677 |
May 15, 2013 [JP] |
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2013-10678 |
Nov 11, 2013 [JP] |
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2013-026346 |
Nov 11, 2013 [JP] |
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2013-026347 |
Nov 11, 2013 [JP] |
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2013-026348 |
Nov 11, 2013 [JP] |
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2013-026349 |
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Current U.S.
Class: |
D13/182 |
Current International
Class: |
1303 |
Field of
Search: |
;D13/182
;451/66,288,289 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
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301348233 |
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Sep 2010 |
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CN |
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301445758 |
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Jan 2011 |
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CN |
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D 138225 |
|
Dec 2010 |
|
TW |
|
D 139857 |
|
Apr 2011 |
|
TW |
|
D 146491 |
|
Apr 2012 |
|
TW |
|
Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Pearne & Gordon LLP
Description
FIG. 1 is a bottom plan view of a first elastic membrane for
semiconductor wafer polishing apparatus showing our new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is an enlarged perspective view of a portion taken along
section 4 in FIG. 2;
FIG. 5 is a cross-sectional view taken along the line 5-5 in FIG.
2; and,
FIG. 6 is an enlarged portion view taken along line 6-6 in FIG.
5.
The broken lines shown in the drawings represent portions of the
elastic membrane for semiconductor wafer polishing apparatus that
form no part of the claimed design. The dashed-dot-dashed lines
represent boundary lines of the claimed design.
All surfaces not shown form no part of the claimed design.
* * * * *