Semiconductor device

Kawase May 2, 2

Patent Grant D785577

U.S. patent number D785,577 [Application Number D/555,470] was granted by the patent office on 2017-05-02 for semiconductor device. This patent grant is currently assigned to Mitsubishi Electric Corporation. The grantee listed for this patent is Mitsubishi Electric Corporation. Invention is credited to Tatsuya Kawase.


United States Patent D785,577
Kawase May 2, 2017

Semiconductor device

Claims

CLAIM The ornamental design for a semiconductor device, as shown and described.
Inventors: Kawase; Tatsuya (Chiyoda-ku, JP)
Applicant:
Name City State Country Type

Mitsubishi Electric Corporation

Tokyo

N/A

JP
Assignee: Mitsubishi Electric Corporation (Tokyo, JP)
Appl. No.: D/555,470
Filed: February 22, 2016

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
29472087 Nov 8, 2013 D754084

Foreign Application Priority Data

Aug 21, 2013 [JP] 2013-019030
Aug 21, 2013 [JP] 2013-019056
Aug 21, 2013 [JP] 2013-019057
Current U.S. Class: D13/182
Current International Class: 1303
Field of Search: ;D13/110,182 ;257/678,684,690,691 ;361/679.01,713,728,736,760,761,772,775,783,820 ;174/250,253 ;438/15,25,26,51,55,63,64,106

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Foreign Patent Documents
1411990 Apr 2011 JP
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Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Sughrue Mion, PLLC Turner; Richard C.

Description



FIG. 1 is a top, right and rear side perspective view of a semiconductor device, showing my new design;

FIG. 2 is a front, left and bottom side perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a top plan view thereof;

FIG. 8 is a bottom plan view thereof;

FIG. 9 is another perspective view thereof, shown in a used condition mounted to a board in broken lines; and,

FIG. 10 is another rear elevational view thereof, shown in a used condition mounted to a board in broken lines.

The broken lines shown in the drawings represent portions of the semiconductor device, that form no part of the claimed design.

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