Dummy wafer

Description

FIG. 1 is a top plan view of a dummy wafer showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is an enlarged portion view taken along lines 3-3 in FIG. 1;

FIG. 4 is a cross-sectional view taken along line 4-4 in FIG. 3; and,

FIG. 5 is a cross-sectional view taken along line 5-5 in FIG. 3.

The broken lines shown in the drawings represent portions of the dummy wafer that form no part of the claimed design. Right, left and back views of the dummy wafer shown in FIG. 1 have been omitted because they are the same as the front view. The bottom view of the dummy wafer shown in FIG. 1 has been omitted because it forms no part of the claimed design.

Claims

CLAIM The ornamental design for a dummy wafer, as shown and described.

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Inventors:	Motoyama; Yutaka (Iwate, JP), Fukushima; Kohei (Iwate, JP)
Applicant:	Name City State Country Type Tokyo Electron Limited Tokyo N/A JP
Assignee:	Tokyo Electron Limited (Tokyo, JP)
Appl. No.:	D/524,912
Filed:	April 24, 2015

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Foreign Application Priority Data

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Nov 13, 2014 [JP]			2014-025307

Current U.S. Class:	D13/182
Current International Class:	1303
Field of Search:	;D13/182 ;428/408,212,688,689,698

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References Cited [Referenced By]

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Other References

US. Appl. No. 29/524,897, filed Apr. 24, 2015, Tokyo Electron Limited. cited by applicant . U.S. Appl. No. 29/524,898, filed Apr. 24, 2015, Tokyo Electron Limited. cited by applicant.

Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: IPUSA, PLLC