Elastic membrane for semiconductor wafer polishing apparatus

Namiki , et al. March 1, 2

Patent Grant D633452

U.S. patent number D633,452 [Application Number D/356,456] was granted by the patent office on 2011-03-01 for elastic membrane for semiconductor wafer polishing apparatus. This patent grant is currently assigned to Ebara Corporation. Invention is credited to Makoto Fukushima, Osamu Nabeya, Keisuke Namiki, Shingo Togashi, Katsuhide Watanabe, Satoru Yamaki, Hozumi Yasuda.


United States Patent D633,452
Namiki ,   et al. March 1, 2011

Elastic membrane for semiconductor wafer polishing apparatus

Claims

CLAIM The ornamental design for an elastic membrane for semiconductor wafer polishing apparatus, as shown and described.
Inventors: Namiki; Keisuke (Ohta-ku, JP), Yasuda; Hozumi (Ohta-ku, JP), Nabeya; Osamu (Ohta-ku, JP), Fukushima; Makoto (Ohta-ku, JP), Togashi; Shingo (Ohta-ku, JP), Yamaki; Satoru (Ohta-ku, JP), Watanabe; Katsuhide (Ohta-ku, JP)
Assignee: Ebara Corporation (Tokyo, JP)
Appl. No.: D/356,456
Filed: February 25, 2010

Foreign Application Priority Data

Aug 27, 2009 [JP] 2009-19715
Current U.S. Class: D13/182
Current International Class: 1303
Field of Search: ;D13/182 ;257/E21.304 ;451/66,288,289

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Primary Examiner: Sikder; Selina
Attorney, Agent or Firm: Sughrue Mion, PLLC

Description



FIG. 1 is a bottom view of an elastic membrane for semiconductor wafer polishing apparatus showing our new design;

FIG. 2 is a top view thereof;

FIG. 3 is a front view thereof;

FIG. 4 is a rear view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a perspective view, observed from below thereof,

FIG. 8 is a perspective view, observed from above thereof;

FIG. 9 is a cross-section view taken along the line 9--9 of FIG. 1 thereof; and,

FIG. 10 is a enlarged view of part 10 of FIG. 9 thereof.

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