U.S. patent application number 16/795081 was filed with the patent office on 2021-08-19 for gate-all-around integrated circuit structures having depopulated channel structures.
The applicant listed for this patent is Intel Corporation. Invention is credited to Hsu-Yu CHANG, Ting CHANG, Babak FALLAHAZAD, Walid M. HAFEZ, Jeong Dong KIM, Rahul RAMASWAMY, Tanuj TRIVEDI.
Application Number | 20210257452 16/795081 |
Document ID | / |
Family ID | 1000005750144 |
Filed Date | 2021-08-19 |
United States Patent
Application |
20210257452 |
Kind Code |
A1 |
TRIVEDI; Tanuj ; et
al. |
August 19, 2021 |
GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING DEPOPULATED
CHANNEL STRUCTURES
Abstract
Gate-all-around integrated circuit structures having depopulated
channel structures, and methods of fabricating gate-all-around
integrated circuit structures having depopulated channel
structures, are described. For example, an integrated circuit
structure includes a first vertical arrangement of nanowires and a
second vertical arrangement of nanowires above a substrate, the
first vertical arrangement of nanowires having a greater number of
active nanowires than the second vertical arrangement of nanowires,
and the first and second vertical arrangements of nanowires having
co-planar uppermost nanowires. The integrated circuit structure
also includes a first vertical arrangement of nanoribbons and a
second vertical arrangement of nanoribbons above the substrate, the
first vertical arrangement of nanoribbons having a greater number
of active nanoribbons than the second vertical arrangement of
nanoribbons, and the first and second vertical arrangements of
nanoribbons having co-planar uppermost nanoribbons.
Inventors: |
TRIVEDI; Tanuj; (Hillsboro,
OR) ; KIM; Jeong Dong; (Scappoose, OR) ;
HAFEZ; Walid M.; (Portland, OR) ; CHANG; Hsu-Yu;
(Hillsboro, OR) ; RAMASWAMY; Rahul; (Portland,
OR) ; CHANG; Ting; (Portland, OR) ;
FALLAHAZAD; Babak; (Portland, OR) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Intel Corporation |
Santa Clara |
CA |
US |
|
|
Family ID: |
1000005750144 |
Appl. No.: |
16/795081 |
Filed: |
February 19, 2020 |
Current U.S.
Class: |
1/1 |
Current CPC
Class: |
H01L 21/823431 20130101;
H01L 29/0847 20130101; H01L 29/0673 20130101; H01L 21/823412
20130101; H01L 29/1037 20130101; H01L 21/823437 20130101; H01L
27/0886 20130101; H01L 21/28568 20130101; H01L 29/42392
20130101 |
International
Class: |
H01L 29/06 20060101
H01L029/06; H01L 29/10 20060101 H01L029/10; H01L 27/088 20060101
H01L027/088; H01L 29/423 20060101 H01L029/423; H01L 29/08 20060101
H01L029/08; H01L 21/8234 20060101 H01L021/8234 |
Claims
1. An integrated circuit structure, comprising: a first vertical
arrangement of nanowires and a second vertical arrangement of
nanowires above a substrate, the first vertical arrangement of
nanowires having a greater number of active nanowires than the
second vertical arrangement of nanowires, and the first and second
vertical arrangements of nanowires having co-planar uppermost
nanowires; and a first vertical arrangement of nanoribbons and a
second vertical arrangement of nanoribbons above the substrate, the
first vertical arrangement of nanoribbons having a greater number
of active nanoribbons than the second vertical arrangement of
nanoribbons, and the first and second vertical arrangements of
nanoribbons having co-planar uppermost nanoribbons.
2. The integrated circuit structure of claim 1, further comprising:
a third vertical arrangement of nanowires above the substrate, the
first vertical arrangement of nanowires having a greater number of
active nanowires than the third vertical arrangement of nanowires,
and the first and third vertical arrangements of nanowires having
co-planar lowermost nanowires; and a third vertical arrangement of
nanoribbons above the substrate, the first vertical arrangement of
nanoribbons having a greater number of active nanoribbons than the
third vertical arrangement of nanoribbons, and the first and third
vertical arrangements of nanoribbons having co-planar lowermost
nanoribbons.
3. The integrated circuit structure of claim 1, further comprising:
one or more first gate stacks over the first and second vertical
arrangements of nanowires; and one or more second gate stacks over
the first and second vertical arrangements of nanoribbons.
4. The integrated circuit structure of claim 1, further comprising:
first epitaxial source or drain structures at ends of the first and
second vertical arrangements of nanowires; and second epitaxial
source or drain structures at ends of the first and second vertical
arrangements of nanoribbons.
5. The integrated circuit structure of claim 4, wherein the first
and second epitaxial source or drain structures are discrete first
and second epitaxial source or drain structures.
6. The integrated circuit structure of claim 4, wherein the first
and second epitaxial source or drain structures are non-discrete
first and second epitaxial source or drain structures.
7. The integrated circuit structure of claim 4, further comprising:
first conductive contact structures coupled to the first epitaxial
source or drain structures; and second conductive contact
structures coupled to the first epitaxial source or drain
structures.
8. The integrated circuit structure of claim 1, wherein the first
vertical arrangement of nanowires is over a first sub-fin, the
second vertical arrangement of nanowires is over a second sub-fin,
the first vertical arrangement of nanoribbons is over a third
sub-fin, and the second vertical arrangement of nanoribbons is over
a fourth sub-fin.
9. The integrated circuit structure of claim 1, further comprising:
a first dielectric cap over the first vertical arrangement of
nanowires, a second dielectric cap over the second vertical
arrangement of nanowires, a third dielectric cap over the first
vertical arrangement of nanoribbons, and a fourth dielectric cap
over the second vertical arrangement of nanoribbons, wherein the
first, second, third and fourth dielectric caps are co-planar with
one another.
10. An integrated circuit structure, comprising: a first vertical
arrangement of nanowires and a second vertical arrangement of
nanowires above a substrate, the first vertical arrangement of
nanowires having a greater number of active nanowires than the
second vertical arrangement of nanowires, and the first and second
vertical arrangements of nanowires having co-planar lowermost
nanowires; and a first vertical arrangement of nanoribbons and a
second vertical arrangement of nanoribbons above the substrate, the
first vertical arrangement of nanoribbons having a greater number
of active nanoribbons than the second vertical arrangement of
nanoribbons, and the first and second vertical arrangements of
nanoribbons having co-planar lowermost nanoribbons.
11. The integrated circuit structure of claim 10, further
comprising: one or more first gate stacks over the first and second
vertical arrangements of nanowires; and one or more second gate
stacks over the first and second vertical arrangements of
nanoribbons.
12. The integrated circuit structure of claim 10, further
comprising: first epitaxial source or drain structures at ends of
the first and second vertical arrangements of nanowires; and second
epitaxial source or drain structures at ends of the first and
second vertical arrangements of nanoribbons.
13. The integrated circuit structure of claim 12, wherein the first
and second epitaxial source or drain structures are discrete first
and second epitaxial source or drain structures.
14. The integrated circuit structure of claim 12, wherein the first
and second epitaxial source or drain structures are non-discrete
first and second epitaxial source or drain structures.
15. The integrated circuit structure of claim 12, further
comprising: first conductive contact structures coupled to the
first epitaxial source or drain structures; and second conductive
contact structures coupled to the first epitaxial source or drain
structures.
16. The integrated circuit structure of claim 10, wherein the first
vertical arrangement of nanowires is over a first sub-fin, the
second vertical arrangement of nanowires is over a second sub-fin,
the first vertical arrangement of nanoribbons is over a third
sub-fin, and the second vertical arrangement of nanoribbons is over
a fourth sub-fin.
17. The integrated circuit structure of claim 10, further
comprising: a first dielectric cap over the first vertical
arrangement of nanowires, a second dielectric cap over the second
vertical arrangement of nanowires, a third dielectric cap over the
first vertical arrangement of nanoribbons, and a fourth dielectric
cap over the second vertical arrangement of nanoribbons, wherein
the first, second, third and fourth dielectric caps are co-planar
with one another.
18. A computing device, comprising: a board; and a component
coupled to the board, the component including an integrated circuit
structure, comprising: a first vertical arrangement of nanowires
and a second vertical arrangement of nanowires above a substrate,
the first vertical arrangement of nanowires having a greater number
of active nanowires than the second vertical arrangement of
nanowires, and the first and second vertical arrangements of
nanowires having co-planar uppermost nanowires; and a first
vertical arrangement of nanoribbons and a second vertical
arrangement of nanoribbons above the substrate, the first vertical
arrangement of nanoribbons having a greater number of active
nanoribbons than the second vertical arrangement of nanoribbons,
and the first and second vertical arrangements of nanoribbons
having co-planar uppermost nanoribbons.
19. The computing device of claim 18, further comprising: a memory
coupled to the board.
20. The computing device of claim 18, further comprising: a
communication chip coupled to the board.
21. The computing device of claim 18, further comprising: a camera
coupled to the board.
22. The computing device of claim 18, further comprising: a battery
coupled to the board.
23. The computing device of claim 18, further comprising: an
antenna coupled to the board.
24. The computing device of claim 18, wherein the component is a
packaged integrated circuit die.
25. The computing device of claim 18, wherein the component is
selected from the group consisting of a processor, a communications
chip, and a digital signal processor.
Description
TECHNICAL FIELD
[0001] Embodiments of the disclosure are in the field of integrated
circuit structures and processing and, in particular,
gate-all-around integrated circuit structures having depopulated
channel structures, and methods of fabricating gate-all-around
integrated circuit structures having depopulated channel
structures.
BACKGROUND
[0002] For the past several decades, the scaling of features in
integrated circuits has been a driving force behind an ever-growing
semiconductor industry. Scaling to smaller and smaller features
enables increased densities of functional units on the limited real
estate of semiconductor chips. For example, shrinking transistor
size allows for the incorporation of an increased number of memory
or logic devices on a chip, lending to the fabrication of products
with increased capacity. The drive for ever-more capacity, however,
is not without issue. The necessity to optimize the performance of
each device becomes increasingly significant.
[0003] In the manufacture of integrated circuit devices, multi-gate
transistors, such as tri-gate transistors, have become more
prevalent as device dimensions continue to scale down. In
conventional processes, tri-gate transistors are generally
fabricated on either bulk silicon substrates or
silicon-on-insulator substrates. In some instances, bulk silicon
substrates are preferred due to their lower cost and because they
enable a less complicated tri-gate fabrication process. In another
aspect, maintaining mobility improvement and short channel control
as microelectronic device dimensions scale below the 10 nanometer
(nm) node provides a challenge in device fabrication. Nanowires
used to fabricate devices provide improved short channel
control.
[0004] Scaling multi-gate and nanowire transistors has not been
without consequence, however. As the dimensions of these
fundamental building blocks of microelectronic circuitry are
reduced and as the sheer number of fundamental building blocks
fabricated in a given region is increased, the constraints on the
lithographic processes used to pattern these building blocks have
become overwhelming. In particular, there may be a trade-off
between the smallest dimension of a feature patterned in a
semiconductor stack (the critical dimension) and the spacing
between such features.
BRIEF DESCRIPTION OF THE DRAWINGS
[0005] FIG. 1A illustrates a cross-sectional view representing a
starting structure for fabricating a gate-all-around integrated
circuit structure having a depopulated channel structure, in
accordance with an embodiment of the present disclosure.
[0006] FIG. 1B illustrates cross-sectional views representing
FinFET structures having varied fin counts.
[0007] FIG. 1C illustrates cross-sectional views representing
various gate-all-around integrated circuit structures having
depopulated channel structures, in accordance with an embodiment of
the present disclosure.
[0008] FIGS. 2A-2F illustrate cross-sectional views representing
various operations in a method of fabricating a gate-all-around
integrated circuit structure having a depopulated channel
structure, in accordance with an embodiment of the present
disclosure.
[0009] FIGS. 3A-3I illustrate cross-sectional views representing
various operations in a method of fabricating a gate-all-around
integrated circuit structure having a depopulated channel
structure, in accordance with an embodiment of the present
disclosure.
[0010] FIGS. 4A-4J illustrates cross-sectional views of various
operations in a method of fabricating a gate-all-around integrated
circuit structure, in accordance with an embodiment of the present
disclosure.
[0011] FIG. 5 illustrates a cross-sectional view of a non-planar
integrated circuit structure as taken along a gate line, in
accordance with an embodiment of the present disclosure.
[0012] FIG. 6 illustrates cross-sectional views taken through
nanowires and fins for a non-endcap architecture (left-hand side
(a)) versus a self-aligned gate endcap (SAGE) architecture
(right-hand side (b)), in accordance with an embodiment of the
present disclosure.
[0013] FIG. 7 illustrate cross-sectional views representing various
operations in a method of fabricating a self-aligned gate endcap
(SAGE) structure with gate-all-around devices, in accordance with
an embodiment of the present disclosure.
[0014] FIG. 8A illustrates a three-dimensional cross-sectional view
of a nanowire-based integrated circuit structure, in accordance
with an embodiment of the present disclosure.
[0015] FIG. 8B illustrates a cross-sectional source or drain view
of the nanowire-based integrated circuit structure of FIG. 8A, as
taken along the a-a' axis, in accordance with an embodiment of the
present disclosure.
[0016] FIG. 8C illustrates a cross-sectional channel view of the
nanowire-based integrated circuit structure of FIG. 8A, as taken
along the b-b' axis, in accordance with an embodiment of the
present disclosure.
[0017] FIGS. 9A-9E illustrate three-dimensional cross-sectional
views representing various operations in a method of fabricating a
nanowire portion of a fin/nanowire structure, in accordance with an
embodiment of the present disclosure.
[0018] FIG. 10 illustrates a computing device in accordance with
one implementation of an embodiment of the disclosure.
[0019] FIG. 11 illustrates an interposer that includes one or more
embodiments of the disclosure.
DESCRIPTION OF THE EMBODIMENTS
[0020] Gate-all-around integrated circuit structures having
depopulated channel structures, and methods of fabricating
gate-all-around integrated circuit structures having depopulated
channel structures, are described. In the following description,
numerous specific details are set forth, such as specific
integration and material regimes, in order to provide a thorough
understanding of embodiments of the present disclosure. It will be
apparent to one skilled in the art that embodiments of the present
disclosure may be practiced without these specific details. In
other instances, well-known features, such as integrated circuit
design layouts, are not described in detail in order to not
unnecessarily obscure embodiments of the present disclosure.
Furthermore, it is to be appreciated that the various embodiments
shown in the Figures are illustrative representations and are not
necessarily drawn to scale.
[0021] Certain terminology may also be used in the following
description for the purpose of reference only, and thus are not
intended to be limiting. For example, terms such as "upper",
"lower", "above", and "below" refer to directions in the drawings
to which reference is made. Terms such as "front", "back", "rear",
and "side" describe the orientation and/or location of portions of
the component within a consistent but arbitrary frame of reference
which is made clear by reference to the text and the associated
drawings describing the component under discussion. Such
terminology may include the words specifically mentioned above,
derivatives thereof, and words of similar import.
[0022] Embodiments described herein may be directed to
front-end-of-line (FEOL) semiconductor processing and structures.
FEOL is the first portion of integrated circuit (IC) fabrication
where the individual devices (e.g., transistors, capacitors,
resistors, etc.) are patterned in the semiconductor substrate or
layer. FEOL generally covers everything up to (but not including)
the deposition of metal interconnect layers. Following the last
FEOL operation, the result is typically a wafer with isolated
transistors (e.g., without any wires).
[0023] Embodiments described herein may be directed to back end of
line (BEOL) semiconductor processing and structures. BEOL is the
second portion of IC fabrication where the individual devices
(e.g., transistors, capacitors, resistors, etc.) are interconnected
with wiring on the wafer, e.g., the metallization layer or layers.
BEOL includes contacts, insulating layers (dielectrics), metal
levels, and bonding sites for chip-to-package connections. In the
BEOL part of the fabrication stage contacts (pads), interconnect
wires, vias and dielectric structures are formed. For modern IC
processes, more than 10 metal layers may be added in the BEOL.
[0024] Embodiments described below may be applicable to FEOL
processing and structures, BEOL processing and structures, or both
FEOL and BEOL processing and structures. In particular, although an
exemplary processing scheme may be illustrated using a FEOL
processing scenario, such approaches may also be applicable to BEOL
processing. Likewise, although an exemplary processing scheme may
be illustrated using a BEOL processing scenario, such approaches
may also be applicable to FEOL processing.
[0025] One or more embodiments described herein are directed to
multi-stack thick-gate high voltage nanoribbon gate all around
(GAA) architectures with tunable power performance capability. One
or more embodiments described herein are directed to nanoribbon
transistor channel depopulation and/or nanowire transistor channel
depopulation.
[0026] As used throughout, a nanowire typically refers to a
structure having similar or the same width and height dimensions
orthogonal to a channel length. A nanoribbon typically refers to a
structure having differing width and height dimensions orthogonal
to a channel length, e.g., greater width than height orthogonal to
a channel length. In general, unless described relative to one
another, e.g., a structure having both a nanowire stack and a
nanoribbon stack, or unless specified as such, the term nanowire is
often used throughout to exemplify a gate-all-around device which
could be sized as a nanoribbon or a nanowire.
[0027] To provide context, FinFET-based thick gate devices provide
higher drive current compared to planar transistors and also offer
better electrostatic control of the channel. Owing to the
aggressive scaling of transistors, embodiments described herein are
directed to nanoribbon based thick gate all around (GAA) devices
for high speed system on chip (SoC) applications such as DDR, I/O
blocks GPIO, etc. More specifically, in a multi-stack nanoribbon
architecture, drive current is defined by the number of
nanoribbons. Embodiments described herein allow for tunable drive
current capability for thick gate devices by selectively removing
one or more nanoribbons from either a top or bottom of the stack in
order to modify the total channel area available for conduction or
drive strength.
[0028] To provide further context, in previous approaches for gate
all around multi stack nanoribbon architectures, the drive current
is usually modified by changing either the width or length or
number of nanoribbons. For example, instead of four nanoribbons, a
transistor contains three nanoribbons. Disadvantages include the
observation that wide nanoribbons (e.g., beyond a width of greater
than 10 nm can cause issues for atomic layer deposition (ALD) of
gate oxide and metals in between channel stacks due to narrow
spaces between the ribbons.
[0029] Implementation of embodiments described herein enable the
ability to remove nanoribbons from the middle, bottom or top of the
stack and modify/tune the drive current of the transistor.
Approaches described herein can enable the drive current of a
device to be fine-tuned by selectively removing one or more
nanoribbons. Cross-sectional SEM/TEM imaging can reveal areas
having a combination of full and etched nanoribbon stacks, in
accordance with embodiments described herein.
[0030] To provide further context, integration of nanowire and/or
nanoribbon complementary metal oxide semiconductor (CMOS)
transistors is faced with the challenge of creating devices with
different strengths. In the current FinFET technology, device
strength granularity is achieved by varying the number of fins in
the device channel. This option is unfortunately not easily
available for nanowire and nanoribbon architectures since the
channels are vertically stacked. Furthermore, transistors with
different drive currents may be needed for different circuit types.
Embodiments disclosed herein are directed to achieving different
drive currents by de-populating the number of nanowire transistor
channels in device structures. One or more embodiments provide an
approach for deleting discrete numbers of wires from a transistor
structure. Approaches may be suitable for both ribbons and wires
(RAW).
[0031] Fin height can be based on varying the number of wires or
ribbons during growth. As an example, FIG. 1A illustrates a
cross-sectional view representing a starting structure 100 for
fabricating a gate-all-around integrated circuit structure having a
depopulated channel structure, in accordance with an embodiment of
the present disclosure.
[0032] Referring to FIG. 1A, the starting structure 100 includes a
substrate 102 having a plurality of nanoribbon-forming stacks 104
and nanowire-forming stacks 106 thereon. Each of the
nanowire-forming stacks 106 includes a plurality of nanowires 112A,
a plurality of sacrificial nanowire release layers 110A, and a
subfin structure 108. Each of the nanoribbon-forming stacks 104
includes a plurality of nanoribbons 112B, a plurality of
sacrificial nanowire release layers 110B, and a subfin structure
108. Each of the plurality of nanoribbon-forming stacks 104 and
nanowire-forming stacks 106 can include a dielectric cap 114
thereon, as is depicted. As fabricated, each of the plurality of
nanoribbon-forming stacks 104 and nanowire-forming stacks 106 has a
same ribbon or wire count, without variation.
[0033] By contrast, to FIG. 1A, FIG. 1B illustrates cross-sectional
views representing FinFET structures having varied fin counts,
as-fabricated.
[0034] Referring to FIG. 1B, a single fin structure 120 includes
one fin 122, a gate dielectric 124 and gate electrode 126 and,
possibly, a gate spacer 128. A double fin structure 130 includes
two fins 132, a gate dielectric 134 and gate electrode 136 and,
possibly, a gate spacer 138. A triple fin structure 140 includes
three fins 142, a gate dielectric 144 and gate electrode 146 and,
possibly, a gate spacer 148. The number of fins per structure can
be determined without necessarily relying fin depopulation but
rather during gate patterning.
[0035] With reference again to FIG. 1A, state-of-the-art gate all
around nanoribbon stacks are not associated with a selective
nanoribbon trim. Embodiments described herein can be implemented to
provide for (a) nanoribbon trim from a bottom of a stack (b)
nanoribbon trim from a top of a stack, or (c) a combination of top
and bottom nanoribbon trim. As an example, FIG. 1C illustrates
cross-sectional views representing various gate-all-around
integrated circuit structures having depopulated channel
structures, in accordance with an embodiment of the present
disclosure.
[0036] Referring to FIG. 1C, a structure 150 is fabricated from the
starting structure 100 of FIG. 1A by performing a nanoribbon trim
from the bottom of a stack. In the example shown, a nanowire stack
106A is depopulated at location 152, and a nanoribbon stack 104A is
depopulated at location 154.
[0037] Referring again to FIG. 1C, a structure 160 is fabricated
from the starting structure 100 of FIG. 1A by performing a
nanoribbon trim from the top of a stack. In the example shown, a
nanowire stack 106B is depopulated at location 162, and a
nanoribbon stack 104B is depopulated at location 164.
[0038] Referring again to FIG. 1C, a structure 170 is fabricated
from the starting structure 100 of FIG. 1A by performing both a
nanoribbon trim from the bottom of a stack and a nanoribbon trim
from the top of a stack. In the example shown, a nanowire stack
106A is depopulated at location 152, and a nanoribbon stack 104A is
depopulated at location 154. Additionally, a nanowire stack 106B is
depopulated at location 162, and a nanoribbon stack 104B is
depopulated at location 164.
[0039] In accordance with an embodiment of the present disclosure,
with reference to FIGS. 1A and 1C, nanowire and nanoribbon
processing involves fabrication of an alternating Si/SiGe stack,
and then patterning the stack into fins, which can vary in width to
provide nanoribbon-forming stacks and/or nanowire-forming stacks.
Generic dummy gates can then be patterned and etched. During a
replacement gate process, portions of the stack can be removed for
wire or ribbon depopulation. The remaining nanowires and/or
nanoribbon channels can be released in an opened gate trench by
removing the sacrificial release layers. A permanent gate stack may
then be formed. In other embodiments, the depopulation is performed
earlier in the process flow.
[0040] With reference to FIGS. 1A and 1C as a foundation, in
accordance with an embodiment of the present disclosure, an
integrated circuit structure includes a first vertical arrangement
of nanowires (112A of 106) and a second vertical arrangement of
nanowires (112A of 106A) above a substrate 102. The first vertical
arrangement of nanowires (112A of 106) has a greater number of
active nanowires than the second vertical arrangement of nanowires
(112A of 106A). The first (112A of 106) and second (112A of 106A)
vertical arrangements of nanowires have co-planar uppermost
nanowires. The integrated circuit structure also includes a first
vertical arrangement of nanoribbons (112B of 104) and a second
vertical arrangement of nanoribbon (112B of 104A) above the
substrate 102. The first vertical arrangement of nanoribbons (112B
of 104) has a greater number of active nanoribbons than the second
vertical arrangement of nanoribbons (112B of 104A). The first (112B
of 104) and second (112B of 104A) vertical arrangements of
nanoribbons have co-planar uppermost nanoribbons.
[0041] In one such embodiment, the integrated circuit structure
further includes a third vertical arrangement of nanowires (112A of
106B) above the substrate 102. The first vertical arrangement of
nanowires (112A of 106) has a greater number of active nanowires
than the third vertical arrangement of nanowires (112A of 106B).
The first (112A of 106) and third (112A of 106B) vertical
arrangements of nanowires have co-planar lowermost nanowires. The
integrated circuit structure further includes a third vertical
arrangement of nanoribbons (112B of 104B) above the substrate 102.
The first vertical arrangement of nanoribbons (112B of 104) has a
greater number of active nanoribbons than the third vertical
arrangement of nanoribbons (112B of 104B). The first (112B of 104)
and third (112B of 104B) vertical arrangements of nanoribbons have
co-planar lowermost nanoribbons.
[0042] In accordance with another embodiment of the present
disclosure, an integrated circuit structure includes a first
vertical arrangement of nanowires (112A of 106) and a second
vertical arrangement of nanowires (112A of 106B) above a substrate
102. The first vertical arrangement of nanowires (112A of 106) has
a greater number of active nanowires than the second vertical
arrangement of nanowires (112A of 106B). The first (112A of 106)
and second (112A of 106B) vertical arrangements of nanowires have
co-planar lowermost nanowires. The integrated circuit structure
also includes a first vertical arrangement of nanoribbons (112B of
104) and a second vertical arrangement of nanoribbon (112B of 104B)
above the substrate 102. The first vertical arrangement of
nanoribbons (112B of 104) has a greater number of active
nanoribbons than the second vertical arrangement of nanoribbons
(112B of 104B). The first (112B of 104) and second (112B of 104B)
vertical arrangements of nanoribbons have co-planar lowermost
nanoribbons.
[0043] In an embodiment, one or more first gate stacks is over the
first and second vertical arrangements of nanowires, and one or
more second gate stacks over the first and second vertical
arrangements of nanoribbons, where examples of such gate stacks are
described in greater detail below. In an embodiment, the first
vertical arrangement of nanowires is over a first sub-fin, the
second vertical arrangement of nanowires is over a second sub-fin,
the first vertical arrangement of nanoribbons is over a third
sub-fin, and the second vertical arrangement of nanoribbons is over
a fourth sub-fin, as is depicted.
[0044] In an embodiment, a first dielectric cap is over the first
vertical arrangement of nanowires, a second dielectric cap is over
the second vertical arrangement of nanowires, a third dielectric
cap is over the first vertical arrangement of nanoribbons, and a
fourth dielectric cap is over the second vertical arrangement of
nanoribbons. In one such embodiment, the first, second, third and
fourth dielectric caps are co-planar with one another.
[0045] In an embodiment, first epitaxial source or drain structures
are at ends of the first and second vertical arrangements of
nanowires, and second epitaxial source or drain structures at ends
of the first and second vertical arrangements of nanoribbons. In
one such embodiment, the first and second epitaxial source or drain
structures are discrete first and second epitaxial source or drain
structures. In another such embodiment, the first and second
epitaxial source or drain structures are non-discrete first and
second epitaxial source or drain structures. In an embodiment,
first conductive contact structures are coupled to the first
epitaxial source or drain structures, and second conductive contact
structures are coupled to the first epitaxial source or drain
structures.
[0046] It is to be appreciated that, in a particular embodiment,
channel layers of nanowires (or nanoribbons) may be composed of
silicon. As used throughout, a silicon layer may be used to
describe a silicon material composed of a very substantial amount
of, if not all, silicon. However, it is to be appreciated that,
practically, 100% pure Si may be difficult to form and, hence,
could include a tiny percentage of carbon, germanium or tin. Such
impurities may be included as an unavoidable impurity or component
during deposition of Si or may "contaminate" the Si upon diffusion
during post deposition processing. As such, embodiments described
herein directed to a silicon layer may include a silicon layer that
contains a relatively small amount, e.g., "impurity" level, non-Si
atoms or species, such as Ge, C or Sn. It is to be appreciated that
a silicon layer as described herein may be undoped or may be doped
with dopant atoms such as boron, phosphorous or arsenic.
[0047] It is to be appreciated that, in a particular embodiment,
sacrificial layers between nanowires (or nanoribbons) may be
composed of silicon germanium. As used throughout, a silicon
germanium layer may be used to describe a silicon germanium
material composed of substantial portions of both silicon and
germanium, such as at least 5% of both. In some embodiments, the
amount of germanium is greater than the amount of silicon. In
particular embodiments, a silicon germanium layer includes
approximately 60% germanium and approximately 40% silicon
(Si.sub.40Ge.sub.60). In other embodiments, the amount of silicon
is greater than the amount of germanium. In particular embodiments,
a silicon germanium layer includes approximately 30% germanium and
approximately 70% silicon (Si.sub.70Ge.sub.30). It is to be
appreciated that, practically, 100% pure silicon germanium
(referred to generally as SiGe) may be difficult to form and,
hence, could include a tiny percentage of carbon or tin. Such
impurities may be included as an unavoidable impurity or component
during deposition of SiGe or may "contaminate" the SiGe upon
diffusion during post deposition processing. As such, embodiments
described herein directed to a silicon germanium layer may include
a silicon germanium layer that contains a relatively small amount,
e.g., "impurity" level, non-Ge and non-Si atoms or species, such as
carbon or tin. It is to be appreciated that a silicon germanium
layer as described herein may be undoped or may be doped with
dopant atoms such as boron, phosphorous or arsenic.
[0048] Detailed exemplary processing schemes are described below.
In a first example, ribbons are wires are depopulated from the
bottom of a stack. In a second example, ribbons are wires are
depopulated from the top of a stack.
[0049] As an example of nanoribbon trim from a bottom of a stack,
FIGS. 2A-2F illustrate cross-sectional views representing various
operations in a method of fabricating a gate-all-around integrated
circuit structure having a depopulated channel structure, in
accordance with an embodiment of the present disclosure.
[0050] Referring to FIG. 2A, a fin pattern and etch process is used
to provide a starting structure 200. The starting structure 200
includes a substrate 202 having a plurality of nanoribbon-forming
stacks 204 and nanowire-forming stacks 206 thereon. Each of the
nanowire-forming stacks 206 includes a plurality of nanowires 212A,
a plurality of sacrificial nanowire release layers 210A, and a
subfin structure 208. Each of the nanoribbon-forming stacks 204
includes a plurality of nanoribbons 212B, a plurality of
sacrificial nanowire release layers 210B, and a subfin structure
208. Each of the plurality of nanoribbon-forming stacks 204 and
nanowire-forming stacks 206 can include a dielectric cap 214
thereon, as is depicted. An isolation layer or structure 209 can be
included between adjacent ones of the subfin structures 208, as is
depicted. As explained in greater detail in other embodiments
described herein, channel regions of the plurality of
nanoribbon-forming stacks 204 and nanowire-forming stacks 206 may
then be exposed, e.g., during a replacement gate process, prior to
performing the subsequent operations described below.
[0051] Referring to FIG. 2B, a resist layer is patterned to form a
resist portion 216A where nanowires are to be removed and to form a
resist portion 216B where nanoribbons are to be removed.
[0052] Referring to FIG. 2C, a protection layer 218 is formed over
the structure of FIG. 2B. In an embodiment, the protection layer
218 is a metal layer formed using ALD, e.g., a titanium (Ti) ALD
layer. The protection layer 218 does not form on the resist
portions 216A and 216B.
[0053] Referring to FIG. 2D, the resist portions 216A and 216B are
removed. The protection layer 218 is retained.
[0054] Referring to FIG. 2E, exposed portions of the
nanoribbon-forming stacks 204 and nanowire-forming stacks 206 not
covered by the protection layer 218 are removed. This depopulation
process provides a depopulated nanoribbon-forming stack 204A with
depopulated location 222, and a depopulated nanowire-forming stack
206A with depopulated location 220.
[0055] Referring to FIG. 2F, the protection layer 218 is removed.
The remaining nanowires and/or nanoribbon channels can then be
released, e.g., in an opened gate trench, by removing the
sacrificial release layers. A permanent gate stack may then be
formed, e.g., by forming one or more gate stacks over one or more
of the released nanowire and nanoribbon stacks.
[0056] As an example of nanoribbon trim from a top of a stack,
FIGS. 3A-3I illustrate cross-sectional views representing various
operations in a method of fabricating a gate-all-around integrated
circuit structure having a depopulated channel structure, in
accordance with an embodiment of the present disclosure.
[0057] Referring to FIG. 3A, a fin pattern and etch process is used
to provide a starting structure 300. The starting structure 300
includes a substrate 302 having a plurality of nanoribbon-forming
stacks 304 and nanowire-forming stacks 306 thereon. Each of the
nanowire-forming stacks 306 includes a plurality of nanowires 312A,
a plurality of sacrificial nanowire release layers 310A, and a
subfin structure 308. Each of the nanoribbon-forming stacks 304
includes a plurality of nanoribbons 312B, a plurality of
sacrificial nanowire release layers 310B, and a subfin structure
308. Each of the plurality of nanoribbon-forming stacks 304 and
nanowire-forming stacks 306 can include a dielectric cap 314
thereon, as is depicted.
[0058] As explained in greater detail in other embodiments
described herein, channel regions of the plurality of
nanoribbon-forming stacks 304 and nanowire-forming stacks 306 may
then be exposed, e.g., during a replacement gate process, prior to
performing the subsequent operations described below. A protection
oxide layer 316 is then formed along the sidewalls of each of the
plurality of nanoribbon-forming stacks 304 and nanowire-forming
stacks 306 of the starting structure 300, as is depicted in FIG.
3A.
[0059] Referring to FIG. 3B, a hardmask 318 is formed over the
structure of FIG. 3A. In a particular embodiment, the hardmask 318
is a carbon hardmask formed in a chemical vapor deposition, cure
and polish process.
[0060] Referring to FIG. 3C, a protection layer 320 is formed on
the hardmask 318. In a particular embodiment, the protection layer
320 is a titanium nitride (TiN) layer.
[0061] Referring to FIG. 3D, a patterned resist layer 322 having
openings 324 is formed over the structure of FIG. 3C. In one
embodiment, the patterned resist layer 322 is formed using extreme
ultra-violet (EUV) lithography.
[0062] Referring to FIG. 3E, portions of the protection layer 320
and upper portions of the hardmask 318 exposed by the openings 324
are etched to form patterned protection layer 326 and patterned
hardmask 328. Patterned protection layer 326 and patterned hardmask
328 expose upper portions of select ones of the plurality of
nanoribbon-forming stacks 304 and nanowire-forming stacks 306.
Corresponding portions of the protection oxide layer 316 are also
exposed.
[0063] Referring to FIG. 3F, the exposed portions of the portions
of the protection oxide layer 316 to form patterned protection
oxide layer 316A, and the exposed upper portions of the select ones
of the plurality of nanoribbon-forming stacks 304 and
nanowire-forming stacks 306 are removed, e.g., using an etch
process. This depopulation process provides a depopulated
nanoribbon-forming stack 304A and a depopulated nanowire-forming
stack 306A.
[0064] Referring to FIG. 3G, the patterned protection layer 326 is
removed. The patterned hardmask 328 is then removed, as is depicted
in FIG. 3H. In an embodiment, the patterned hardmask 328 is a
carbon based hardmask and is removed by an ash and clean
process.
[0065] Referring to FIG. 3I, the oxide layer 316 and patterned
protection oxide layer 316A are removed. The remaining nanowires
and/or nanoribbon channels can then be released, e.g., in an opened
gate trench, by removing the sacrificial release layers. A
permanent gate stack may then be formed, e.g., by forming one or
more gate stacks over one or more of the released nanowire and
nanoribbon stacks.
[0066] It is to be appreciated that although some embodiments
describe the use of Si (wire or ribbon) and SiGe (sacrificial)
layers, other pairs of semiconductor materials which can be alloyed
and grown epitaxially could be implemented to achieve various
embodiments herein, for example, InAs and InGaAs, or SiGe and Ge.
Embodiments described herein enable the fabrication of self-aligned
stacked transistors with variable numbers of active nanowires or
nanoribbons in the channel, and methods to achieve such
structures.
[0067] It is to be appreciated that the above are illustrative
examples of wire counts for upper and/or lower ribbon or wire
depopulation, it is to be appreciated that all such wire counts may
be varied. It is also to be appreciated that the embodiments
described herein can also include other implementations such as
nanowires and/or nanoribbons with various widths, thicknesses
and/or materials including but not limited to Si and SiGe. It is
also to be appreciated that following the processing described
above, a permanent gate structure may be fabricated. In an
embodiment, the permanent gate structure is formed around all
nanowire/nanoribbon channels in one or more stacks. As exemplified
above, in an embodiment, in order to engineer different devices
having different drive-current strengths, a self-aligned
depopulation flow can be patterned with lithography so that ribbons
and wires (RAW) are depopulated only from specific devices. In an
embodiment, depopulation is performed through a gate trench, with
pre-gate anchors, or at source/drain processing.
[0068] As mentioned above, in one aspect, nanowire release
processing may be performed through a replacement gate trench.
Examples of such release processes are described below.
Additionally, in another aspect, backend (BE) interconnect scaling
can result in lower performance and higher manufacturing cost due
to patterning complexity. Embodiments described herein may be
implemented to enable front and back-side interconnect integration
for nanowire transistors. Embodiments described herein may provide
an approach to achieve a relatively wider interconnect pitch. The
result may be improved product performance and lower patterning
costs. Embodiments may be implemented to enable robust
functionality of scaled nanowire or nanoribbon transistors with low
power and high performance.
[0069] One or more embodiments described herein are directed dual
epitaxial (EPI) connections for nanowire or nanoribbon transistors
using partial source or drain (SD) and asymmetric trench contact
(TCN) depth. In an embodiment, an integrated circuit structure is
fabricated by forming source-drain openings of nanowire/nanoribbon
transistors which are partially filled with SD epitaxy. A remainder
of the opening is filled with a conductive material. Deep trench
formation on one of the source or drain side enables direct contact
to a backside interconnect level.
[0070] In an exemplary process flow, FIGS. 4A-4J illustrates
cross-sectional views of various operations in a method of
fabricating a gate-all-around integrated circuit structure, in
accordance with an embodiment of the present disclosure.
[0071] Referring to FIG. 4A, a method of fabricating an integrated
circuit structure includes forming a starting stack 400 which
includes alternating silicon germanium layer 404 and silicon layers
406 above a fin 402, such as a silicon fin. The silicon layers 406
may be referred to as a vertical arrangement of silicon nanowires.
A protective cap 408 may be formed above the alternating silicon
germanium layer 404 and silicon layers 406, as is depicted.
[0072] Referring to FIG. 4B, a gate stack 410 is formed over the
vertical arrangement of nanowires 406. Portions of the vertical
arrangement of nanowires 406 are then released by removing portions
of the silicon germanium layer 404 to provide recessed silicon
germanium layers 404' and cavities 412, as is depicted in FIG.
4C.
[0073] It is to be appreciated that the structure of FIG. 4C may be
fabricated to completion without first performing the deep etch and
asymmetric contact processing described below in association with
FIG. 4D. In either case (e.g., with or without asymmetric contact
processing), in an embodiment, a fabrication process involves use
of a process scheme that provides a gate-all-around integrated
circuit structure having a depopulated channel structure, examples
of which are described above in association with FIG. 1C, FIGS.
2A-2F and/or FIGS. 3A-3I.
[0074] Referring to FIG. 4D, upper gate spacers 414 are formed at
sidewalls of the gate structure 410. Cavity spacers 416 are formed
in the cavities 412 beneath the upper gate spacers 414. A deep
trench contact etch is then performed to form trenches 418 and to
formed recessed nanowires 406'. A sacrificial material 420 is then
formed in the trenches 418, as is depicted in FIG. 4E.
[0075] Referring to FIG. 4F, a first epitaxial source or drain
structure (e.g., left-hand features 422) is formed at a first end
of the vertical arrangement of nanowires 406'. A second epitaxial
source or drain structure (e.g., right-hand features 422) is formed
at a second end of the vertical arrangement of nanowires 406'. An
inter-layer dielectric (ILD) material 424 is then formed at the
sides of the gate electrode 410 and adjacent to the source or drain
structures 422, as is depicted in FIG. 4G.
[0076] Referring to FIG. 4H, a replacement gate process is used to
form a permanent gate dielectric 428 and a permanent gate electrode
426. In an embodiment, subsequent to removal of gate structure 410
and form a permanent gate dielectric 428 and a permanent gate
electrode 426, the recessed silicon germanium layers 404' are
removed to leave upper active nanowires or nanoribbons 406'. In an
embodiment, the the recessed silicon germanium layers 404' are
removed selectively with a wet etch that selectively removes the
silicon germanium while not etching the silicon layers. Etch
chemistries such as carboxylic acid/nitric acid/HF chemistry, and
citric acid/nitric acid/HF, for example, may be utilized to
selectively etch the silicon germanium. Halide-based dry etches or
plasma-enhanced vapor etches may also be used to achieve the
embodiments herein.
[0077] Referring again to FIG. 4H, one or more of the bottommost
nanowires or nanoribbons 406' is then removed for depopulation such
as at location 499, e.g., by an approach described in association
with FIGS. 2A-2F. Also, or alternatively, one or more of the
uppermost nanowires or nanoribbons 406' is then removed for
depopulation, e.g., by an approach described in association with
FIGS. 3A-3I. The permanent gate dielectric 428 and a permanent gate
electrode 426 is then formed to surround the remaining nanowires or
nanoribbons 406'.
[0078] Referring to FIG. 4I, the ILD material 424 is then removed.
The sacrificial material 420 is then removed from one of the source
drain locations (e.g., right-hand side) to form trench 432, but is
not removed from the other of the source drain locations to form
trench 430.
[0079] Referring to FIG. 4J, a first conductive contact structure
434 is formed coupled to the first epitaxial source or drain
structure (e.g., left-hand features 422). A second conductive
contact structure 436 is formed coupled to the second epitaxial
source or drain structure (e.g., right-hand features 422). The
second conductive contact structure 436 is formed deeper along the
fin 402 than the first conductive contact structure 434. In an
embodiment, although not depicted in FIG. 4J, the method further
includes forming an exposed surface of the second conductive
contact structure 436 at a bottom of the fin 402.
[0080] In an embodiment, the second conductive contact structure
436 is deeper along the fin 402 than the first conductive contact
structure 434, as is depicted. In one such embodiment, the first
conductive contact structure 434 is not along the fin 402, as is
depicted. In another such embodiment, not depicted, the first
conductive contact structure 434 is partially along the fin
402.
[0081] In an embodiment, the second conductive contact structure
436 is along an entirety of the fin 402. In an embodiment, although
not depicted, in the case that the bottom of the fin 402 is exposed
by a backside substrate removal process, the second conductive
contact structure 436 has an exposed surface at a bottom of the fin
402.
[0082] In another aspect, in order to enable access to both
conductive contact structures of a pair of asymmetric source and
drain contact structures, integrated circuit structures described
herein may be fabricated using a back-side reveal of front-side
structures fabrication approach. In some exemplary embodiments,
reveal of the back-side of a transistor or other device structure
entails wafer-level back-side processing. In contrast to a
conventional through-Silicon via TSV-type technology, a reveal of
the back-side of a transistor as described herein may be performed
at the density of the device cells, and even within sub-regions of
a device. Furthermore, such a reveal of the back-side of a
transistor may be performed to remove substantially all of a donor
substrate upon which a device layer was disposed during front-side
device processing. As such, a microns-deep TSV becomes unnecessary
with the thickness of semiconductor in the device cells following a
reveal of the back-side of a transistor potentially being only tens
or hundreds of nanometers.
[0083] Reveal techniques described herein may enable a paradigm
shift from "bottom-up" device fabrication to "center-out"
fabrication, where the "center" is any layer that is employed in
front-side fabrication, revealed from the back-side, and again
employed in back-side fabrication. Processing of both a front-side
and revealed back-side of a device structure may address many of
the challenges associated with fabricating 3D ICs when primarily
relying on front-side processing.
[0084] A reveal of the back-side of a transistor approach may be
employed for example to remove at least a portion of a carrier
layer and intervening layer of a donor-host substrate assembly. The
process flow begins with an input of a donor-host substrate
assembly. A thickness of a carrier layer in the donor-host
substrate is polished (e.g., CMP) and/or etched with a wet or dry
(e.g., plasma) etch process. Any grind, polish, and/or wet/dry etch
process known to be suitable for the composition of the carrier
layer may be employed. For example, where the carrier layer is a
group IV semiconductor (e.g., silicon) a CMP slurry known to be
suitable for thinning the semiconductor may be employed. Likewise,
any wet etchant or plasma etch process known to be suitable for
thinning the group IV semiconductor may also be employed.
[0085] In some embodiments, the above is preceded by cleaving the
carrier layer along a fracture plane substantially parallel to the
intervening layer. The cleaving or fracture process may be utilized
to remove a substantial portion of the carrier layer as a bulk
mass, reducing the polish or etch time needed to remove the carrier
layer. For example, where a carrier layer is 400-900 .mu.m in
thickness, 100-700 .mu.m may be cleaved off by practicing any
blanket implant known to promote a wafer-level fracture. In some
exemplary embodiments, a light element (e.g., H, He, or Li) is
implanted to a uniform target depth within the carrier layer where
the fracture plane is desired. Following such a cleaving process,
the thickness of the carrier layer remaining in the donor-host
substrate assembly may then be polished or etched to complete
removal. Alternatively, where the carrier layer is not fractured,
the grind, polish and/or etch operation may be employed to remove a
greater thickness of the carrier layer.
[0086] Next, exposure of an intervening layer is detected.
Detection is used to identify a point when the back-side surface of
the donor substrate has advanced to nearly the device layer. Any
endpoint detection technique known to be suitable for detecting a
transition between the materials employed for the carrier layer and
the intervening layer may be practiced. In some embodiments, one or
more endpoint criteria are based on detecting a change in optical
absorbance or emission of the back-side surface of the donor
substrate during the polishing or etching performed. In some other
embodiments, the endpoint criteria are associated with a change in
optical absorbance or emission of byproducts during the polishing
or etching of the donor substrate back-side surface. For example,
absorbance or emission wavelengths associated with the carrier
layer etch byproducts may change as a function of the different
compositions of the carrier layer and intervening layer. In other
embodiments, the endpoint criteria are associated with a change in
mass of species in byproducts of polishing or etching the back-side
surface of the donor substrate. For example, the byproducts of
processing may be sampled through a quadrupole mass analyzer and a
change in the species mass may be correlated to the different
compositions of the carrier layer and intervening layer. In another
exemplary embodiment, the endpoint criteria is associated with a
change in friction between a back-side surface of the donor
substrate and a polishing surface in contact with the back-side
surface of the donor substrate.
[0087] Detection of the intervening layer may be enhanced where the
removal process is selective to the carrier layer relative to the
intervening layer as non-uniformity in the carrier removal process
may be mitigated by an etch rate delta between the carrier layer
and intervening layer. Detection may even be skipped if the grind,
polish and/or etch operation removes the intervening layer at a
rate sufficiently below the rate at which the carrier layer is
removed. If an endpoint criteria is not employed, a grind, polish
and/or etch operation of a predetermined fixed duration may stop on
the intervening layer material if the thickness of the intervening
layer is sufficient for the selectivity of the etch process. In
some examples, the carrier etch rate: intervening layer etch rate
is 3:1-10:1, or more.
[0088] Upon exposing the intervening layer, at least a portion of
the intervening layer may be removed. For example, one or more
component layers of the intervening layer may be removed. A
thickness of the intervening layer may be removed uniformly by a
polish, for example. Alternatively, a thickness of the intervening
layer may be removed with a masked or blanket etch process. The
process may employ the same polish or etch process as that employed
to thin the carrier, or may be a distinct process with distinct
process parameters. For example, where the intervening layer
provides an etch stop for the carrier removal process, the latter
operation may employ a different polish or etch process that favors
removal of the intervening layer over removal of the device layer.
Where less than a few hundred nanometers of intervening layer
thickness is to be removed, the removal process may be relatively
slow, optimized for across-wafer uniformity, and more precisely
controlled than that employed for removal of the carrier layer. A
CMP process employed may, for example employ a slurry that offers
very high selectively (e.g., 100:1-300:1, or more) between
semiconductor (e.g., silicon) and dielectric material (e.g., SiO)
surrounding the device layer and embedded within the intervening
layer, for example, as electrical isolation between adjacent device
regions.
[0089] For embodiments where the device layer is revealed through
complete removal of the intervening layer, back-side processing may
commence on an exposed back-side of the device layer or specific
device regions there in. In some embodiments, the back-side device
layer processing includes a further polish or wet/dry etch through
a thickness of the device layer disposed between the intervening
layer and a device region previously fabricated in the device
layer, such as a source or drain region.
[0090] In some embodiments where the carrier layer, intervening
layer, or device layer back-side is recessed with a wet and/or
plasma etch, such an etch process may be a patterned etch or a
materially selective etch that imparts significant non-planarity or
topography into the device layer back-side surface. As described
further below, the patterning may be within a device cell (i.e.,
"intra-cell" patterning) or may be across device cells (i.e.,
"inter-cell" patterning). In some patterned etch embodiments, at
least a partial thickness of the intervening layer is employed as a
hard mask for back-side device layer patterning. Hence, a masked
etch process may preface a correspondingly masked device layer
etch.
[0091] The above described processing scheme may result in a
donor-host substrate assembly that includes IC devices that have a
back-side of an intervening layer, a back-side of the device layer,
and/or back-side of one or more semiconductor regions within the
device layer, and/or front-side metallization revealed. Additional
back-side processing of any of these revealed regions may then be
performed during downstream processing.
[0092] It is to be appreciated that the structures resulting from
the above exemplary processing schemes may be used in a same or
similar form for subsequent processing operations to complete
device fabrication, such as CMOS, PMOS and/or NMOS device
fabrication. As an example of a completed device, FIG. 5 illustrate
a cross-sectional view of a non-planar integrated circuit structure
as taken along a gate line, in accordance with an embodiment of the
present disclosure.
[0093] Referring to FIG. 5, a semiconductor structure or device 500
includes a non-planar active region (e.g., a fin structure
including protruding fin portion 504 and sub-fin region 505) within
a trench isolation region 506. In an embodiment, instead of a solid
fin, the non-planar active region is separated into nanowires (such
as nanowires 504A and 504B) above sub-fin region 505, as is
represented by the dashed lines. In either case, for ease of
description for non-planar integrated circuit structure 500, a
non-planar active region 504 is referenced below as a protruding
fin portion. In an embodiment, a fabrication process involves use
of a process scheme that provides active regions 504 as a
depopulated channel structure, examples of which are described
above in association with FIG. 1C, FIGS. 2A-2F and/or FIGS. 3A-3I.
For example, in one embodiment, lower nanowires 504B are removed.
In another embodiment, upper nanowires 504A are removed.
[0094] A gate line 508 is disposed over the protruding portions 504
of the non-planar active region (including, if applicable,
surrounding nanowires 504A and 504B), as well as over a portion of
the trench isolation region 506. As shown, gate line 508 includes a
gate electrode 550 and a gate dielectric layer 552. In one
embodiment, gate line 508 may also include a dielectric cap layer
554. A gate contact 514, and overlying gate contact via 516 are
also seen from this perspective, along with an overlying metal
interconnect 560, all of which are disposed in inter-layer
dielectric stacks or layers 570. Also seen from the perspective of
FIG. 5, the gate contact 514 is, in one embodiment, disposed over
trench isolation region 506, but not over the non-planar active
regions.
[0095] In an embodiment, the semiconductor structure or device 500
is a non-planar device such as, but not limited to, a fin-FET
device, a tri-gate device, a nano-ribbon device, or a nano-wire
device. In such an embodiment, a corresponding semiconducting
channel region is composed of or is formed in a three-dimensional
body. In one such embodiment, the gate electrode stacks of gate
lines 508 surround at least a top surface and a pair of sidewalls
of the three-dimensional body.
[0096] As is also depicted in FIG. 5, in an embodiment, an
interface 580 exists between a protruding fin portion 504 and
sub-fin region 505. The interface 580 can be a transition region
between a doped sub-fin region 505 and a lightly or undoped upper
fin portion 504. In one such embodiment, each fin is approximately
10 nanometers wide or less, and sub-fin dopants are supplied from
an adjacent solid state doping layer at the sub-fin location. In a
particular such embodiment, each fin is less than 10 nanometers
wide.
[0097] Although not depicted in FIG. 5, it is to be appreciated
that source or drain regions of or adjacent to the protruding fin
portions 504 are on either side of the gate line 508, i.e., into
and out of the page. In one embodiment, the source or drain regions
are doped portions of original material of the protruding fin
portions 504. In another embodiment, the material of the protruding
fin portions 504 is removed and replaced with another semiconductor
material, e.g., by epitaxial deposition to form discrete epitaxial
nubs or non-discrete epitaxial structures. In either embodiment,
the source or drain regions may extend below the height of
dielectric layer of trench isolation region 506, i.e., into the
sub-fin region 505. In accordance with an embodiment of the present
disclosure, the more heavily doped sub-fin regions, i.e., the doped
portions of the fins below interface 580, inhibits source to drain
leakage through this portion of the bulk semiconductor fins. In an
embodiment, the source and drain structures are N-type epitaxial
source and drain structures, both including phosphorous dopant
impurity atoms. In accordance with one or more embodiments of the
present disclosure, the source and drain regions have associated
asymmetric source and drain contact structures, as described above
in association with FIG. 4J.
[0098] With reference again to FIG. 5, in an embodiment, fins
504/505 (and, possibly nanowires 504A and 504B) are composed of a
crystalline silicon, silicon/germanium or germanium layer doped
with a charge carrier, such as but not limited to phosphorus,
arsenic, boron or a combination thereof. In one embodiment, the
concentration of silicon atoms is greater than 97%. In another
embodiment, fins 504/505 are composed of a group III-V material,
such as, but not limited to, gallium nitride, gallium phosphide,
gallium arsenide, indium phosphide, indium antimonide, indium
gallium arsenide, aluminum gallium arsenide, indium gallium
phosphide, or a combination thereof. Trench isolation region 506
may be composed of a dielectric material such as, but not limited
to, silicon dioxide, silicon oxy-nitride, silicon nitride, or
carbon-doped silicon nitride.
[0099] Gate line 508 may be composed of a gate electrode stack
which includes a gate dielectric layer 552 and a gate electrode
layer 550. In an embodiment, the gate electrode of the gate
electrode stack is composed of a metal gate and the gate dielectric
layer is composed of a high-k material. For example, in one
embodiment, the gate dielectric layer 552 is composed of a material
such as, but not limited to, hafnium oxide, hafnium oxy-nitride,
hafnium silicate, lanthanum oxide, zirconium oxide, zirconium
silicate, tantalum oxide, barium strontium titanate, barium
titanate, strontium titanate, yttrium oxide, aluminum oxide, lead
scandium tantalum oxide, lead zinc niobate, or a combination
thereof. Furthermore, a portion of gate dielectric layer 552 may
include a layer of native oxide formed from the top few layers of
the protruding fin portions 504. In an embodiment, the gate
dielectric layer 552 is composed of a top high-k portion and a
lower portion composed of an oxide of a semiconductor material. In
one embodiment, the gate dielectric layer 552 is composed of a top
portion of hafnium oxide and a bottom portion of silicon dioxide or
silicon oxy-nitride. In some implementations, a portion of the gate
dielectric is a "U"-shaped structure that includes a bottom portion
substantially parallel to the surface of the substrate and two
sidewall portions that are substantially perpendicular to the top
surface of the substrate.
[0100] In one embodiment, the gate electrode layer 550 is composed
of a metal layer such as, but not limited to, metal nitrides, metal
carbides, metal silicides, metal aluminides, hafnium, zirconium,
titanium, tantalum, aluminum, ruthenium, palladium, platinum,
cobalt, nickel or conductive metal oxides. In a specific
embodiment, the gate electrode layer 550 is composed of a
non-workfunction-setting fill material formed above a metal
workfunction-setting layer. The gate electrode layer 550 may
consist of a P-type workfunction metal or an N-type workfunction
metal, depending on whether the transistor is to be a PMOS or an
NMOS transistor. In some implementations, the gate electrode layer
550 may consist of a stack of two or more metal layers, where one
or more metal layers are workfunction metal layers and at least one
metal layer is a conductive fill layer. For a PMOS transistor,
metals that may be used for the gate electrode include, but are not
limited to, ruthenium, palladium, platinum, cobalt, nickel, and
conductive metal oxides, e.g., ruthenium oxide. A P-type metal
layer will enable the formation of a PMOS gate electrode with a
workfunction that is between about 4.9 eV and about 5.2 eV. For an
NMOS transistor, metals that may be used for the gate electrode
include, but are not limited to, hafnium, zirconium, titanium,
tantalum, aluminum, alloys of these metals, and carbides of these
metals such as hafnium carbide, zirconium carbide, titanium
carbide, tantalum carbide, and aluminum carbide. An N-type metal
layer will enable the formation of an NMOS gate electrode with a
workfunction that is between about 3.9 eV and about 4.2 eV. In some
implementations, the gate electrode may consist of a "U"-shaped
structure that includes a bottom portion substantially parallel to
the surface of the substrate and two sidewall portions that are
substantially perpendicular to the top surface of the substrate. In
another implementation, at least one of the metal layers that form
the gate electrode may simply be a planar layer that is
substantially parallel to the top surface of the substrate and does
not include sidewall portions substantially perpendicular to the
top surface of the substrate. In further implementations of the
disclosure, the gate electrode may consist of a combination of
U-shaped structures and planar, non-U-shaped structures. For
example, the gate electrode may consist of one or more U-shaped
metal layers formed atop one or more planar, non-U-shaped
layers.
[0101] Spacers associated with the gate electrode stacks may be
composed of a material suitable to ultimately electrically isolate,
or contribute to the isolation of, a permanent gate structure from
adjacent conductive contacts, such as self-aligned contacts. For
example, in one embodiment, the spacers are composed of a
dielectric material such as, but not limited to, silicon dioxide,
silicon oxy-nitride, silicon nitride, or carbon-doped silicon
nitride.
[0102] Gate contact 514 and overlying gate contact via 516 may be
composed of a conductive material. In an embodiment, one or more of
the contacts or vias are composed of a metal species. The metal
species may be a pure metal, such as tungsten, nickel, or cobalt,
or may be an alloy such as a metal-metal alloy or a
metal-semiconductor alloy (e.g., such as a silicide material).
[0103] In an embodiment (although not shown), a contact pattern
which is essentially perfectly aligned to an existing gate pattern
508 is formed while eliminating the use of a lithographic step with
exceedingly tight registration budget. In an embodiment, the
contact pattern is a vertically asymmetric contact pattern, such as
described in association with FIG. 4J. In other embodiments, all
contacts are front-side connected and are not asymmetric. In one
such embodiment, the self-aligned approach enables the use of
intrinsically highly selective wet etching (e.g., versus
conventionally implemented dry or plasma etching) to generate
contact openings. In an embodiment, a contact pattern is formed by
utilizing an existing gate pattern in combination with a contact
plug lithography operation. In one such embodiment, the approach
enables elimination of the need for an otherwise critical
lithography operation to generate a contact pattern, as used in
conventional approaches. In an embodiment, a trench contact grid is
not separately patterned, but is rather formed between poly (gate)
lines. For example, in one such embodiment, a trench contact grid
is formed subsequent to gate grating patterning but prior to gate
grating cuts.
[0104] In an embodiment, providing structure 500 involves
fabrication of the gate stack structure 508 by a replacement gate
process. In such a scheme, dummy gate material such as polysilicon
or silicon nitride pillar material, may be removed and replaced
with permanent gate electrode material. In one such embodiment, a
permanent gate dielectric layer is also formed in this process, as
opposed to being carried through from earlier processing. In an
embodiment, dummy gates are removed by a dry etch or wet etch
process. In one embodiment, dummy gates are composed of
polycrystalline silicon or amorphous silicon and are removed with a
dry etch process including use of SF.sub.6. In another embodiment,
dummy gates are composed of polycrystalline silicon or amorphous
silicon and are removed with a wet etch process including use of
aqueous NH.sub.4OH or tetramethylammonium hydroxide. In one
embodiment, dummy gates are composed of silicon nitride and are
removed with a wet etch including aqueous phosphoric acid.
[0105] Referring again to FIG. 5, the arrangement of semiconductor
structure or device 500 places the gate contact over isolation
regions. Such an arrangement may be viewed as inefficient use of
layout space. In another embodiment, however, a semiconductor
device has contact structures that contact portions of a gate
electrode formed over an active region, e.g., over a sub-fin 505,
and in a same layer as a trench contact via.
[0106] It is to be appreciated that not all aspects of the
processes described above need be practiced to fall within the
spirit and scope of embodiments of the present disclosure. Also,
the processes described herein may be used to fabricate one or a
plurality of semiconductor devices. The semiconductor devices may
be transistors or like devices. For example, in an embodiment, the
semiconductor devices are a metal-oxide semiconductor (MOS)
transistors for logic or memory, or are bipolar transistors. Also,
in an embodiment, the semiconductor devices have a
three-dimensional architecture, such as a nanowire device, a
nanoribbon device, a gate-all-around (GAA) device, a tri-gate
device, an independently accessed double gate device, or a FIN-FET.
One or more embodiments may be particularly useful for fabricating
semiconductor devices at a sub-10 nanometer (10 nm) technology
node.
[0107] In an embodiment, as used throughout the present
description, interlayer dielectric (ILD) material is composed of or
includes a layer of a dielectric or insulating material. Examples
of suitable dielectric materials include, but are not limited to,
oxides of silicon (e.g., silicon dioxide (SiO.sub.2)), doped oxides
of silicon, fluorinated oxides of silicon, carbon doped oxides of
silicon, various low-k dielectric materials known in the arts, and
combinations thereof. The interlayer dielectric material may be
formed by conventional techniques, such as, for example, chemical
vapor deposition (CVD), physical vapor deposition (PVD), or by
other deposition methods.
[0108] In an embodiment, as is also used throughout the present
description, metal lines or interconnect line material (and via
material) is composed of one or more metal or other conductive
structures. A common example is the use of copper lines and
structures that may or may not include barrier layers between the
copper and surrounding ILD material. As used herein, the term metal
includes alloys, stacks, and other combinations of multiple metals.
For example, the metal interconnect lines may include barrier
layers (e.g., layers including one or more of Ta, TaN, Ti or TiN),
stacks of different metals or alloys, etc. Thus, the interconnect
lines may be a single material layer, or may be formed from several
layers, including conductive liner layers and fill layers. Any
suitable deposition process, such as electroplating, chemical vapor
deposition or physical vapor deposition, may be used to form
interconnect lines. In an embodiment, the interconnect lines are
composed of a conductive material such as, but not limited to, Cu,
Al, Ti, Zr, Hf, V, Ru, Co, Ni, Pd, Pt, W, Ag, Au or alloys thereof.
The interconnect lines are also sometimes referred to in the art as
traces, wires, lines, metal, or simply interconnect.
[0109] In an embodiment, as is also used throughout the present
description, hardmask materials, capping layers, or plugs are
composed of dielectric materials different from the interlayer
dielectric material. In one embodiment, different hardmask, capping
or plug materials may be used in different regions so as to provide
different growth or etch selectivity to each other and to the
underlying dielectric and metal layers. In some embodiments, a
hardmask layer, capping or plug layer includes a layer of a nitride
of silicon (e.g., silicon nitride) or a layer of an oxide of
silicon, or both, or a combination thereof. Other suitable
materials may include carbon-based materials. Other hardmask,
capping or plug layers known in the arts may be used depending upon
the particular implementation. The hardmask, capping or plug layers
maybe formed by CVD, PVD, or by other deposition methods.
[0110] In an embodiment, as is also used throughout the present
description, lithographic operations are performed using 193 nm
immersion litho (i193), EUV and/or EBDW lithography, or the like. A
positive tone or a negative tone resist may be used. In one
embodiment, a lithographic mask is a trilayer mask composed of a
topographic masking portion, an anti-reflective coating (ARC)
layer, and a photoresist layer. In a particular such embodiment,
the topographic masking portion is a carbon hardmask (CHM) layer
and the anti-reflective coating layer is a silicon ARC layer.
[0111] In another aspect, one or more embodiments are directed to
neighboring semiconductor structures or devices separated by
self-aligned gate endcap (SAGE) structures. Particular embodiments
may be directed to integration of multiple width (multi-Wsi)
nanowires and nanoribbons in a SAGE architecture and separated by a
SAGE wall. In an embodiment, nanowires/nanoribbons are integrated
with multiple Wsi in a SAGE architecture portion of a front end
process flow. Such a process flow may involve integration of
nanowires and nanoribbons of different Wsi to provide robust
functionality of next generation transistors with low power and
high performance. Associated epitaxial source or drain regions may
be embedded (e.g., portions of nanowires removed and then source or
drain (S/D) growth is performed) or formed by vertical merging
(e.g., epitaxial regions are formed around existing wires), as
described in greater detail below in association with FIGS.
9A-9E.
[0112] To provide further context, advantages of a self-aligned
gate endcap (SAGE) architecture may include the enabling of higher
layout density and, in particular, scaling of diffusion to
diffusion spacing. To provide illustrative comparison, FIG. 6
illustrates cross-sectional views taken through nanowires and fins
for a non-endcap architecture (left-hand side (a)) versus a
self-aligned gate endcap (SAGE) architecture (right-hand side (b)),
in accordance with an embodiment of the present disclosure.
[0113] Referring to the left-hand side (a) of FIG. 6, an integrated
circuit structure 600 includes a substrate 602 having sub-fins 604
protruding therefrom within an isolation structure 608 laterally
surrounding the sub-fins 604. Corresponding nanowires 649 and 605
are over the sub-fins 604. In one embodiment, lower nanowires 649
are removed. In another embodiment, upper nanowires 605 are
removed. A gate structure may be formed over the integrated circuit
structure 600 to fabricate a device. However, breaks in such a gate
structure may be accommodated for by increasing the spacing between
sub-fin 604/nanowire 649/605 pairings.
[0114] By contrast, referring to the right-hand side (b) of FIG. 6,
an integrated circuit structure 650 includes a substrate 652 having
sub-fins 654 protruding therefrom within an isolation structure 658
laterally surrounding the sub-fins 654. Corresponding nanowires 699
and 655 are over the sub-fins 654. In one embodiment, lower
nanowires 699 are removed. In another embodiment, upper nanowires
655 are removed. Isolating SAGE walls 660 are included within the
isolation structure 658 and between adjacent sub-fin 654/nanowire
699/655 pairings. The distance between an isolating SAGE wall 660
and a nearest sub-fin 654/nanowire 699/655 pairings defines the
gate endcap spacing 662. A gate structure may be formed over the
integrated circuit structure 650, between insolating SAGE walls to
fabricate a device. Breaks in such a gate structure are imposed by
the isolating SAGE walls. Since the isolating SAGE walls 660 are
self-aligned, restrictions from conventional approaches can be
minimized to enable more aggressive diffusion to diffusion spacing.
Furthermore, since gate structures include breaks at all locations,
individual gate structure portions may be layer connected by local
interconnects formed over the isolating SAGE walls 660. In an
embodiment, as depicted, the SAGE walls 660 each include a lower
dielectric portion and a dielectric cap on the lower dielectric
portion, as is depicted.
[0115] In accordance with an embodiment of the present disclosure,
a fabrication process for structures associated with FIG. 6
involves use of a process scheme that provides a gate-all-around
integrated circuit structure having a depopulated channel
structure, examples of which are described above in association
with FIG. 1C, FIGS. 2A-2F and/or FIGS. 3A-3I.
[0116] A self-aligned gate endcap (SAGE) processing scheme involves
the formation of gate/trench contact endcaps self-aligned to fins
without requiring an extra length to account for mask
mis-registration. Thus, embodiments may be implemented to enable
shrinking of transistor layout area. Embodiments described herein
may involve the fabrication of gate endcap isolation structures,
which may also be referred to as gate walls, isolation gate walls
or self-aligned gate endcap (SAGE) walls.
[0117] In an exemplary processing scheme for structures having SAGE
walls separating neighboring devices, FIG. 7 illustrates
cross-sectional views representing various operations in a method
of fabricating a self-aligned gate endcap (SAGE) structure with
gate-all-around devices, in accordance with an embodiment of the
present disclosure.
[0118] Referring to part (a) of FIG. 7, a starting structure
includes a nanowire patterning stack 704 above a substrate 702. A
lithographic patterning stack 706 is formed above the nanowire
patterning stack 704. The nanowire patterning stack 704 includes
alternating silicon germanium layers 710 and silicon layers 712. A
protective mask 714 is between the nanowire patterning stack 704
and the lithographic patterning stack 706. In one embodiment, the
lithographic patterning stack 706 is trilayer mask composed of a
topographic masking portion 720, an anti-reflective coating (ARC)
layer 722, and a photoresist layer 724. In a particular such
embodiment, the topographic masking portion 720 is a carbon
hardmask (CHM) layer and the anti-reflective coating layer 722 is a
silicon ARC layer.
[0119] Referring to part (b) of FIG. 7, the stack of part (a) is
lithographically patterned and then etched to provide an etched
structure including a patterned substrate 702 and trenches 730.
[0120] Referring to part (c) of FIG. 7, the structure of part (b)
has an isolation layer 740 and a SAGE material 742 formed in
trenches 730. The structure is then planarized to leave patterned
topographic masking layer 720' as an exposed upper layer.
[0121] Referring to part (d) of FIG. 7, the isolation layer 740 is
recessed below an upper surface of the patterned substrate 702,
e.g., to define a protruding fin portion and to provide a trench
isolation structure 741 beneath SAGE walls 742.
[0122] Referring to part (e) of FIG. 7, the silicon germanium
layers 710 are removed at least in the channel region to release
silicon nanowires 712A and 712B.
[0123] In accordance with an embodiment of the present disclosure,
a fabrication process for structures associated with FIG. 7
involves use of a process scheme that provides a gate-all-around
integrated circuit structure having a depopulated channel
structure, examples of which are described above in association
with FIG. 1C, FIGS. 2A-2F and/or FIGS. 3A-3I. For example,
referring to part (e) of FIG. 7, in an embodiment, nanowire 712B
and nanoribbon 712A are removed. In another such embodiment,
nanowire 712B and nanoribbon 799A are removed. In another such
embodiment, nanowire 799B and nanoribbon 799A are removed.
[0124] Subsequent to the formation of the structure of part (e) of
FIG. 7, one or more gate stacks may be formed around the active
nanowires and/or nanoribbons, over protruding fins of substrate
702, and between SAGE walls 742. In one embodiment, prior to
formation of the gate stacks, the remaining portion of protective
mask 714 is removed. In another embodiment, the remaining portion
of protective mask 714 is retained as an insulating fin hat as an
artifact of the processing scheme.
[0125] Referring again to part (e) of FIG. 7, it is to be
appreciated that a channel view is depicted, with source or drain
regions being locating into and out of the page. In an embodiment,
the channel region including nanowires 712B has a width less than
the channel region including nanowires 712A. Thus, in an
embodiment, an integrated circuit structure includes multiple width
(multi-Wsi) nanowires. Although structures of 712B and 712A may be
differentiated as nanowires and nanoribbons, respectively, both
such structures are typically referred to herein as nanowires. It
is also to be appreciated that reference to or depiction of a
fin/nanowire pair throughout may refer to a structure including a
fin and one or more overlying nanowires (e.g., two overlying
nanowires are shown in FIG. 7).
[0126] To highlight an exemplary integrated circuit structure
having three vertically arranged nanowires, FIG. 8A illustrates a
three-dimensional cross-sectional view of a nanowire-based
integrated circuit structure, in accordance with an embodiment of
the present disclosure. FIG. 8B illustrates a cross-sectional
source or drain view of the nanowire-based integrated circuit
structure of FIG. 8A, as taken along the a-a' axis. FIG. 8C
illustrates a cross-sectional channel view of the nanowire-based
integrated circuit structure of FIG. 8A, as taken along the b-b'
axis.
[0127] Referring to FIG. 8A, an integrated circuit structure 800
includes one or more vertically stacked nanowires (804 set) above a
substrate 802. An optional fin between the bottommost nanowire and
the substrate 802 is not depicted for the sake of emphasizing the
nanowire portion for illustrative purposes. Embodiments herein are
targeted at both single wire devices and multiple wire devices. As
an example, a three nanowire-based devices having nanowires 804A,
804B and 804C is shown for illustrative purposes. For convenience
of description, nanowire 804A is used as an example where
description is focused on one of the nanowires. It is to be
appreciated that where attributes of one nanowire are described,
embodiments based on a plurality of nanowires may have the same or
essentially the same attributes for each of the nanowires.
[0128] Each of the nanowires 804 includes a channel region 806 in
the nanowire. The channel region 806 has a length (L). Referring to
FIG. 8C, the channel region also has a perimeter (Pc) orthogonal to
the length (L). Referring to both FIGS. 8A and 8C, a gate electrode
stack 808 surrounds the entire perimeter (Pc) of each of the
channel regions 806. The gate electrode stack 808 includes a gate
electrode along with a gate dielectric layer between the channel
region 806 and the gate electrode (not shown). In an embodiment,
the channel region 806 is discrete in that it is completely
surrounded by the gate electrode stack 808 without any intervening
material such as underlying substrate material or overlying channel
fabrication materials. Accordingly, in embodiments having a
plurality of nanowires 804, the channel regions 806 of the
nanowires are also discrete relative to one another.
[0129] In accordance with an embodiment of the present disclosure,
a fabrication process for structures associated with FIGS. 8A-8C
involves use of a process scheme that provides a gate-all-around
integrated circuit structure having a depopulated channel structure
806, examples of which are described above in association with FIG.
1C, FIGS. 2A-2F and/or FIGS. 3A-3I. For example, in one embodiment,
nanowire 804A is removed. In another embodiment, both nanowire 804A
and nanowire 804B are removed. In one embodiment, nanowire 804C is
removed. In another embodiment, both nanowire 804C and nanowire
804B are removed.
[0130] Referring to both FIGS. 8A and 8B, integrated circuit
structure 800 includes a pair of non-discrete source or drain
regions 810/812. The pair of non-discrete source or drain regions
810/812 is on either side of the channel regions 806 of the
plurality of vertically stacked nanowires 804. Furthermore, the
pair of non-discrete source or drain regions 810/812 is adjoining
for the channel regions 806 of the plurality of vertically stacked
nanowires 804. In one such embodiment, not depicted, the pair of
non-discrete source or drain regions 810/812 is directly vertically
adjoining for the channel regions 806 in that epitaxial growth is
on and between nanowire portions extending beyond the channel
regions 806, where nanowire ends are shown within the source or
drain structures. In another embodiment, as depicted in FIG. 8A,
the pair of non-discrete source or drain regions 810/812 is
indirectly vertically adjoining for the channel regions 806 in that
they are formed at the ends of the nanowires and not between the
nanowires.
[0131] In an embodiment, as depicted, the source or drain regions
810/812 are non-discrete in that there are not individual and
discrete source or drain regions for each channel region 806 of a
nanowire 804. Accordingly, in embodiments having a plurality of
nanowires 804, the source or drain regions 810/812 of the nanowires
are global or unified source or drain regions as opposed to
discrete for each nanowire. In one embodiment, from a
cross-sectional perspective orthogonal to the length of the
discrete channel regions 806, each of the pair of non-discrete
source or drain regions 810/812 is approximately rectangular in
shape with a bottom tapered portion and a top vertex portion, as
depicted in FIG. 8B. In other embodiments, however, the source or
drain regions 810/812 of the nanowires are relatively larger yet
discrete non-vertically merged epitaxial structures such as nubs
described in association with FIGS. 4F-4J.
[0132] In accordance with an embodiment of the present disclosure,
and as depicted in FIGS. 8A and 8B, integrated circuit structure
800 further includes a pair of contacts 814, each contact 814 on
one of the pair of non-discrete source or drain regions 810/812. In
one such embodiment, in a vertical sense, each contact 814
completely surrounds the respective non-discrete source or drain
region 810/812. In another aspect, the entire perimeter of the
non-discrete source or drain regions 810/812 may not be accessible
for contact with contacts 814, and the contacts 814 thus only
partially surrounds the non-discrete source or drain regions
810/812, as depicted in FIG. 8B. In a contrasting embodiment, not
depicted, the entire perimeter of the non-discrete source or drain
regions 810/812, as taken along the a-a' axis, is surrounded by the
contacts 814. In accordance with an embodiment of the present
disclosure, although not depicted, the pair of contacts 814 is an
asymmetric pair of contacts, as described in association with FIG.
4J.
[0133] Referring to FIGS. 8B and 8C, the non-discrete source or
drain regions 810/812 are global in the sense that a single unified
feature is used as a source or drain region for a plurality (in
this case, 3) of nanowires 804 and, more particularly, for more
than one discrete channel region 806. In an embodiment, the pair of
non-discrete source or drain regions 810/812 is composed of a
semiconductor material different than the semiconductor material of
the discrete channel regions 806, e.g., the pair of non-discrete
source or drain regions 810/812 is composed of a silicon germanium
while the discrete channel regions 806 are composed of silicon. In
another embodiment, the pair of non-discrete source or drain
regions 810/812 is composed of a semiconductor material the same or
essentially the same as the semiconductor material of the discrete
channel regions 806, e.g., both the pair of non-discrete source or
drain regions 810/812 and the discrete channel regions 806 are
composed of silicon.
[0134] Referring again to FIG. 8A, in an embodiment, integrated
circuit structure 800 further includes a pair of spacers 816. As is
depicted, outer portions of the pair of spacers 816 may overlap
portions of the non-discrete source or drain regions 810/812,
providing for "embedded" portions of the non-discrete source or
drain regions 810/812 beneath the pair of spacers 816. As is also
depicted, the embedded portions of the non-discrete source or drain
regions 810/812 may not extend beneath the entirety of the pair of
spacers 816.
[0135] Substrate 802 may be composed of a material suitable for
integrated circuit structure fabrication. In one embodiment,
substrate 802 includes a lower bulk substrate composed of a single
crystal of a material which may include, but is not limited to,
silicon, germanium, silicon-germanium or a group III-V compound
semiconductor material. An upper insulator layer composed of a
material which may include, but is not limited to, silicon dioxide,
silicon nitride or silicon oxy-nitride is on the lower bulk
substrate. Thus, the structure 800 may be fabricated from a
starting semiconductor-on-insulator substrate. Alternatively, the
structure 800 is formed directly from a bulk substrate and local
oxidation is used to form electrically insulative portions in place
of the above described upper insulator layer. In another
alternative embodiment, the structure 800 is formed directly from a
bulk substrate and doping is used to form electrically isolated
active regions, such as nanowires, thereon. In one such embodiment,
the first nanowire (i.e., proximate the substrate) is in the form
of an omega-FET type structure.
[0136] In an embodiment, the nanowires 804 may be sized as wires or
ribbons, as described below, and may have squared-off or rounder
corners. In an embodiment, the nanowires 804 are composed of a
material such as, but not limited to, silicon, germanium, or a
combination thereof. In one such embodiment, the nanowires 804 are
single-crystalline. For example, for a silicon nanowire 804, a
single-crystalline nanowire may be based from a (100) global
orientation, e.g., with a <100> plane in the z-direction. As
described below, other orientations may also be considered. In an
embodiment, the dimensions of the nanowires 804, from a
cross-sectional perspective, are on the nano-scale. For example, in
a specific embodiment, the smallest dimension of the nanowires 804
is less than approximately 20 nanometers. In an embodiment, the
nanowires 804 are composed of a strained material, particularly in
the channel regions 806.
[0137] Referring to FIG. 8C, in an embodiment, each of the channel
regions 806 has a width (Wc) and a height (Hc), the width (Wc)
approximately the same as the height (Hc). That is, in both cases,
the channel regions 806 are square-like or, if corner-rounded,
circle-like in cross-section profile. In another aspect, the width
and height of the channel region need not be the same, such as the
case for nanoribbbons as described throughout.
[0138] In another aspect, methods of fabricating a nanowire portion
of a fin/nanowire integrated circuit structure are provided. For
example, FIGS. 9A-9E illustrate three-dimensional cross-sectional
views representing various operations in a method of fabricating a
nanowire portion of a fin/nanowire structure, in accordance with an
embodiment of the present disclosure.
[0139] A method of fabricating a nanowire integrated circuit
structure may include forming a nanowire above a substrate. In a
specific example showing the formation of two silicon nanowires,
FIG. 9A illustrates a substrate 902 (e.g., composed of a bulk
substrate silicon substrate 902A with an insulating silicon dioxide
layer 902B there on) having a silicon layer 904/silicon germanium
layer 906/silicon layer 908 stack thereon. It is to be understood
that, in another embodiment, a silicon germanium layer/silicon
layer/silicon germanium layer stack may be used to ultimately form
two silicon germanium nanowires.
[0140] Referring to FIG. 9B, a portion of the silicon layer
904/silicon germanium layer 906/silicon layer 908 stack as well as
a top portion of the silicon dioxide layer 902B is patterned into a
fin-type structure 910, e.g., with a mask and plasma etch process.
It is to be appreciated that, for illustrative purposes, the etch
for FIG. 9B is shown as forming two silicon nanowire precursor
portions. Although the etch is shown for ease of illustration as
ending within a bottom isolation layer, more complex stacks are
contemplated within the context of embodiments of the present
disclosure. For example, the process may be applied to a
nanowire/fin stack as described in association with FIG. 7.
[0141] The method may also include forming a channel region in the
nanowire, the channel region having a length and a perimeter
orthogonal to the length. In a specific example showing the
formation of three gate structures over the two silicon nanowires,
FIG. 9C illustrates the fin-type structure 910 with three
sacrificial gates 912A, 912B, and 912C thereon. In one such
embodiment, the three sacrificial gates 912A, 912B, and 912C are
composed of a sacrificial gate oxide layer 914 and a sacrificial
polysilicon gate layer 916 which are blanket deposited and
patterned with a plasma etch process.
[0142] Following patterning to form the three sacrificial gates
912A, 912B, and 912C, spacers may be formed on the sidewalls of the
three sacrificial gates 912A, 912B, and 912C, doping may be
performed (e.g., tip and/or source and drain type doping), and an
interlayer dielectric layer may be formed to cover the three
sacrificial gates 912A, 912B, and 912C. The interlayer dielectric
layer may be polished to expose the three sacrificial gates 912A,
912B, and 912C for a replacement gate, or gate-last, process.
[0143] Referring to FIG. 9D, the three sacrificial gates 912A,
912B, and 912C are removed, leaving spacers 918 and a portion of
the interlayer dielectric layer 920 remaining. Additionally, the
portions of the silicon germanium layer 906 and the portion of the
insulating silicon dioxide layer 902B of the fin structure 910 are
removed in the regions originally covered by the three sacrificial
gates 912A, 912B, and 912C. Discrete portions of the silicon layers
904 and 908 thus remain, as depicted in FIG. 9D.
[0144] The discrete portions of the silicon layers 904 and 908
shown in FIG. 9D will, in one embodiment, ultimately become channel
regions in a nanowire-based device. Thus, at the process stage
depicted in FIG. 9D, channel engineering or tuning may be
performed. For example, in one embodiment, the discrete portions of
the silicon layers 904 and 908 shown in FIG. 9D are thinned using
oxidation and etch processes. Such an etch process may be performed
at the same time the wires are separated by etching the silicon
germanium layer 906. Accordingly, the initial wires formed from
silicon layers 904 and 908 begin thicker and are thinned to a size
suitable for a channel region in a nanowire device, independent
from the sizing of the source and drain regions of the device.
Thus, in an embodiment, forming the channel region includes
removing a portion of the nanowire, and the resulting perimeters of
the source and drain regions (described below) are greater than the
perimeter of the resulting channel region.
[0145] In accordance with an embodiment of the present disclosure,
following removal of the three sacrificial gates 912A, 912B, and
912C and removal of the portions of the silicon germanium layer 906
and the portion of the insulating silicon dioxide layer 902B of the
fin structure 910 from the regions originally covered by the three
sacrificial gates 912A, 912B, and 912C, a fabrication process is
performed that provides a gate-all-around integrated circuit
structure having a depopulated channel structure, examples of which
are described above in association with FIG. 1C, FIGS. 2A-2F and/or
FIGS. 3A-3I.
[0146] The method may also include forming a gate electrode stack
surrounding the entire perimeter of the channel region. In the
specific example showing the formation of three gate structures
over the two silicon nanowires, FIG. 9E illustrates the structure
following deposition of a gate dielectric layer 922 (such as a
high-k gate dielectric layer) and a gate electrode layer 924 (such
as a metal gate electrode layer), and subsequent polishing, in
between the spacers 918. That is, gate structures are formed in the
trenches 921 of FIG. 9D. Additionally, FIG. 9E depicts the result
of the subsequent removal of the interlayer dielectric layer 920
after formation of the permanent gate stack. The portions of the
silicon germanium layer 906 and the portion of the insulating
silicon dioxide layer 902B of the fin structure 910 are also
removed in the regions originally covered by the portion of the
interlayer dielectric layer 920 depicted in FIG. 9D. Discrete
portions of the silicon layers 904 and 908 thus remain, as depicted
in FIG. 9E.
[0147] The method may also include forming a pair of source and
drain regions in the nanowire, on either side of the channel
region, each of the source and drain regions having a perimeter
orthogonal to the length of the channel region. Specifically, the
discrete portions of the silicon layers 904 and 908 shown in FIG.
9E will, in one embodiment, ultimately become at least a portion of
the source and drain regions in a nanowire-based device. In one
such embodiment, epitaxial source or drain structures are formed by
merging epitaxial material around existing nanowires 904 and 908.
In another embodiment, epitaxial source or drain structures are
embedded, e.g., portions of nanowires 904 and 908 are removed and
then source or drain (S/D) growth is performed. In the latter case,
in accordance with an embodiment of the present disclosure, such
epitaxial source or drain structures may be non-discrete, as
exemplified in association with FIGS. 8A and 8B, or may be
discrete, as exemplified in association with FIG. 4J. In either
case, in one embodiment, source or drain structures are N-type
epitaxial source or drain structures, both including phosphorous
dopant impurity atoms.
[0148] The method may subsequently include forming a pair of
contacts, a first of the pair of contacts completely or nearly
completely surrounding the perimeter of the source region, and a
second of the pair of contacts completely or nearly completely
surrounding the perimeter of the drain region. In an embodiment,
the pair of contacts is an asymmetric pair of source and drain
contact structures, such as described in association with FIG. 4J.
In other embodiments, the pair of contacts is a symmetric pair of
source and drain contact structures. Specifically, contacts are
formed in the trenches 925 of FIG. 9E following epitaxial growth.
One of the trenches may first be recessed further than the other of
the trenches. In an embodiment, the contacts are formed from a
metallic species. In one such embodiment, the metallic species is
formed by conformally depositing a contact metal and then filling
any remaining trench volume. The conformal aspect of the deposition
may be performed by using chemical vapor deposition (CVD), atomic
layer deposition (ALD), or metal reflow.
[0149] In an embodiment, as described throughout, an integrated
circuit structure includes non-planar devices such as, but not
limited to, a finFET or a tri-gate device with corresponding one or
more overlying nanowire structures. In such an embodiment, a
corresponding semiconducting channel region is composed of or is
formed in a three-dimensional body with one or more discrete
nanowire channel portions overlying the three-dimensional body. In
one such embodiment, the gate structures surround at least a top
surface and a pair of sidewalls of the three-dimensional body, and
further surrounds each of the one or more discrete nanowire channel
portions.
[0150] In an embodiment, as described throughout, a substrate may
be composed of a semiconductor material that can withstand a
manufacturing process and in which charge can migrate. In an
embodiment, the substrate is a bulk substrate composed of a
crystalline silicon, silicon/germanium or germanium layer doped
with a charge carrier, such as but not limited to phosphorus,
arsenic, boron or a combination thereof, to form an active region.
In one embodiment, the concentration of silicon atoms in a bulk
substrate is greater than 97%. In another embodiment, a bulk
substrate is composed of an epitaxial layer grown atop a distinct
crystalline substrate, e.g. a silicon epitaxial layer grown atop a
boron-doped bulk silicon mono-crystalline substrate. A bulk
substrate may alternatively be composed of a group III-V material.
In an embodiment, a bulk substrate is composed of a group III-V
material such as, but not limited to, gallium nitride, gallium
phosphide, gallium arsenide, indium phosphide, indium antimonide,
indium gallium arsenide, aluminum gallium arsenide, indium gallium
phosphide, or a combination thereof. In one embodiment, a bulk
substrate is composed of a group III-V material and the
charge-carrier dopant impurity atoms are ones such as, but not
limited to, carbon, silicon, germanium, oxygen, sulfur, selenium or
tellurium.
[0151] In an embodiment, as described throughout, a trench
isolation layer may be composed of a material suitable to
ultimately electrically isolate, or contribute to the isolation of,
portions of a permanent gate structure from an underlying bulk
substrate or isolate active regions formed within an underlying
bulk substrate, such as isolating fin active regions. For example,
in one embodiment, a trench isolation layer is composed of a
dielectric material such as, but not limited to, silicon dioxide,
silicon oxy-nitride, silicon nitride, or carbon-doped silicon
nitride.
[0152] In an embodiment, as described throughout, self-aligned gate
endcap isolation structures may be composed of a material or
materials suitable to ultimately electrically isolate, or
contribute to the isolation of, portions of permanent gate
structures from one another. Exemplary materials or material
combinations include a single material structure such as silicon
dioxide, silicon oxy-nitride, silicon nitride, or carbon-doped
silicon nitride. Other exemplary materials or material combinations
include a multi-layer stack having lower portion silicon dioxide,
silicon oxy-nitride, silicon nitride, or carbon-doped silicon
nitride and an upper portion higher dielectric constant material
such as hafnium oxide.
[0153] Embodiments disclosed herein may be used to manufacture a
wide variety of different types of integrated circuits and/or
microelectronic devices. Examples of such integrated circuits
include, but are not limited to, processors, chipset components,
graphics processors, digital signal processors, micro-controllers,
and the like. In other embodiments, semiconductor memory may be
manufactured. Moreover, the integrated circuits or other
microelectronic devices may be used in a wide variety of electronic
devices known in the arts. For example, in computer systems (e.g.,
desktop, laptop, server), cellular phones, personal electronics,
etc. The integrated circuits may be coupled with a bus and other
components in the systems. For example, a processor may be coupled
by one or more buses to a memory, a chipset, etc. Each of the
processor, the memory, and the chipset, may potentially be
manufactured using the approaches disclosed herein.
[0154] FIG. 10 illustrates a computing device 1000 in accordance
with one implementation of an embodiment of the present disclosure.
The computing device 1000 houses a board 1002. The board 1002 may
include a number of components, including but not limited to a
processor 1004 and at least one communication chip 1006. The
processor 1004 is physically and electrically coupled to the board
1002. In some implementations the at least one communication chip
1006 is also physically and electrically coupled to the board 1002.
In further implementations, the communication chip 1006 is part of
the processor 1004.
[0155] Depending on its applications, computing device 1000 may
include other components that may or may not be physically and
electrically coupled to the board 1002. These other components
include, but are not limited to, volatile memory (e.g., DRAM),
non-volatile memory (e.g., ROM), flash memory, a graphics
processor, a digital signal processor, a crypto processor, a
chipset, an antenna, a display, a touchscreen display, a
touchscreen controller, a battery, an audio codec, a video codec, a
power amplifier, a global positioning system (GPS) device, a
compass, an accelerometer, a gyroscope, a speaker, a camera, and a
mass storage device (such as hard disk drive, compact disk (CD),
digital versatile disk (DVD), and so forth).
[0156] The communication chip 1006 enables wireless communications
for the transfer of data to and from the computing device 1000. The
term "wireless" and its derivatives may be used to describe
circuits, devices, systems, methods, techniques, communications
channels, etc., that may communicate data through the use of
modulated electromagnetic radiation through a non-solid medium. The
term does not imply that the associated devices do not contain any
wires, although in some embodiments they might not. The
communication chip 1006 may implement any of a number of wireless
standards or protocols, including but not limited to Wi-Fi (IEEE
802.11 family), WiMAX (IEEE 802.16 family), IEEE 802.20, long term
evolution (LTE), Ev-DO, HSPA+, HSDPA+, HSUPA+, EDGE, GSM, GPRS,
CDMA, TDMA, DECT, Bluetooth, derivatives thereof, as well as any
other wireless protocols that are designated as 3G, 4G, 5G, and
beyond. The computing device 1000 may include a plurality of
communication chips 1006. For instance, a first communication chip
1006 may be dedicated to shorter range wireless communications such
as Wi-Fi and Bluetooth and a second communication chip 1006 may be
dedicated to longer range wireless communications such as GPS,
EDGE, GPRS, CDMA, WiMAX, LTE, Ev-DO, and others.
[0157] The processor 1004 of the computing device 1000 includes an
integrated circuit die packaged within the processor 1004. The
integrated circuit die of the processor 1004 may include one or
more structures, such as gate-all-around integrated circuit
structures having depopulated channel structures built in
accordance with implementations of embodiments of the present
disclosure. The term "processor" may refer to any device or portion
of a device that processes electronic data from registers and/or
memory to transform that electronic data into other electronic data
that may be stored in registers and/or memory.
[0158] The communication chip 1006 also includes an integrated
circuit die packaged within the communication chip 1006. The
integrated circuit die of the communication chip 1006 may include
one or more structures, such as gate-all-around integrated circuit
structures having depopulated channel structures built in
accordance with implementations of embodiments of the present
disclosure.
[0159] In further implementations, another component housed within
the computing device 1000 may contain an integrated circuit die
that includes one or structures, such as gate-all-around integrated
circuit structures having depopulated channel structures built in
accordance with implementations of embodiments of the present
disclosure.
[0160] In various implementations, the computing device 1000 may be
a laptop, a netbook, a notebook, an ultrabook, a smartphone, a
tablet, a personal digital assistant (PDA), an ultra mobile PC, a
mobile phone, a desktop computer, a server, a printer, a scanner, a
monitor, a set-top box, an entertainment control unit, a digital
camera, a portable music player, or a digital video recorder. In
further implementations, the computing device 1000 may be any other
electronic device that processes data.
[0161] FIG. 11 illustrates an interposer 1100 that includes one or
more embodiments of the present disclosure. The interposer 1100 is
an intervening substrate used to bridge a first substrate 1102 to a
second substrate 1104. The first substrate 1102 may be, for
instance, an integrated circuit die. The second substrate 1104 may
be, for instance, a memory module, a computer motherboard, or
another integrated circuit die. Generally, the purpose of an
interposer 1100 is to spread a connection to a wider pitch or to
reroute a connection to a different connection. For example, an
interposer 1100 may couple an integrated circuit die to a ball grid
array (BGA) 1106 that can subsequently be coupled to the second
substrate 1104. In some embodiments, the first and second
substrates 1102/1104 are attached to opposing sides of the
interposer 1100. In other embodiments, the first and second
substrates 1102/1104 are attached to the same side of the
interposer 1100. And in further embodiments, three or more
substrates are interconnected by way of the interposer 1100.
[0162] The interposer 1100 may be formed of an epoxy resin, a
fiberglass-reinforced epoxy resin, a ceramic material, or a polymer
material such as polyimide. In further implementations, the
interposer 1100 may be formed of alternate rigid or flexible
materials that may include the same materials described above for
use in a semiconductor substrate, such as silicon, germanium, and
other group III-V and group IV materials.
[0163] The interposer 1100 may include metal interconnects 1108 and
vias 1110, including but not limited to through-silicon vias (TSVs)
1112. The interposer 1100 may further include embedded devices
1114, including both passive and active devices. Such devices
include, but are not limited to, capacitors, decoupling capacitors,
resistors, inductors, fuses, diodes, transformers, sensors, and
electrostatic discharge (ESD) devices. More complex devices such as
radio-frequency (RF) devices, power amplifiers, power management
devices, antennas, arrays, sensors, and MEMS devices may also be
formed on the interposer 1100. In accordance with embodiments of
the disclosure, apparatuses or processes disclosed herein may be
used in the fabrication of interposer 1100 or in the fabrication of
components included in the interposer 1100.
[0164] Thus, embodiments of the present disclosure include
gate-all-around integrated circuit structures having depopulated
channel structures, and methods of fabricating gate-all-around
integrated circuit structures having depopulated channel
structures.
[0165] The above description of illustrated implementations of
embodiments of the disclosure, including what is described in the
Abstract, is not intended to be exhaustive or to limit the
disclosure to the precise forms disclosed. While specific
implementations of, and examples for, the disclosure are described
herein for illustrative purposes, various equivalent modifications
are possible within the scope of the disclosure, as those skilled
in the relevant art will recognize.
[0166] These modifications may be made to the disclosure in light
of the above detailed description. The terms used in the following
claims should not be construed to limit the disclosure to the
specific implementations disclosed in the specification and the
claims. Rather, the scope of the disclosure is to be determined
entirely by the following claims, which are to be construed in
accordance with established doctrines of claim interpretation.
[0167] Example embodiment 1: An integrated circuit structure
includes a first vertical arrangement of nanowires and a second
vertical arrangement of nanowires above a substrate, the first
vertical arrangement of nanowires having a greater number of active
nanowires than the second vertical arrangement of nanowires, and
the first and second vertical arrangements of nanowires having
co-planar uppermost nanowires. The integrated circuit structure
also includes a first vertical arrangement of nanoribbons and a
second vertical arrangement of nanoribbons above the substrate, the
first vertical arrangement of nanoribbons having a greater number
of active nanoribbons than the second vertical arrangement of
nanoribbons, and the first and second vertical arrangements of
nanoribbons having co-planar uppermost nanoribbons.
[0168] Example embodiment 2: The integrated circuit structure of
example embodiment 1, further including a third vertical
arrangement of nanowires above the substrate, the first vertical
arrangement of nanowires having a greater number of active
nanowires than the third vertical arrangement of nanowires, and the
first and third vertical arrangements of nanowires having co-planar
lowermost nanowires, and further including a third vertical
arrangement of nanoribbons above the substrate, the first vertical
arrangement of nanoribbons having a greater number of active
nanoribbons than the third vertical arrangement of nanoribbons, the
first and third vertical arrangements of nanoribbons having
co-planar lowermost nanoribbons.
[0169] Example embodiment 3: The integrated circuit structure of
example embodiment 1 or 2, further including one or more first gate
stacks over the first and second vertical arrangements of
nanowires, and one or more second gate stacks over the first and
second vertical arrangements of nanoribbons.
[0170] Example embodiment 4: The integrated circuit structure of
example embodiment 1, 2 or 3, further including first epitaxial
source or drain structures at ends of the first and second vertical
arrangements of nanowires, and second epitaxial source or drain
structures at ends of the first and second vertical arrangements of
nanoribbons.
[0171] Example embodiment 5: The integrated circuit structure of
example embodiment 4, wherein the first and second epitaxial source
or drain structures are discrete first and second epitaxial source
or drain structures.
[0172] Example embodiment 6: The integrated circuit structure of
example embodiment 4, wherein the first and second epitaxial source
or drain structures are non-discrete first and second epitaxial
source or drain structures.
[0173] Example embodiment 7: The integrated circuit structure of
example embodiment 4, 5 or 6, further including first conductive
contact structures coupled to the first epitaxial source or drain
structures, and second conductive contact structures coupled to the
first epitaxial source or drain structures.
[0174] Example embodiment 8: The integrated circuit structure of
example embodiment 1, 2, 3, 4, 5, 6 or 7, wherein the first
vertical arrangement of nanowires is over a first sub-fin, the
second vertical arrangement of nanowires is over a second sub-fin,
the first vertical arrangement of nanoribbons is over a third
sub-fin, and the second vertical arrangement of nanoribbons is over
a fourth sub-fin.
[0175] Example embodiment 9: The integrated circuit structure of
example embodiment 1, 2, 3, 4, 5, 6, 7 or 8, further including a
first dielectric cap over the first vertical arrangement of
nanowires, a second dielectric cap over the second vertical
arrangement of nanowires, a third dielectric cap over the first
vertical arrangement of nanoribbons, and a fourth dielectric cap
over the second vertical arrangement of nanoribbons, wherein the
first, second, third and fourth dielectric caps are co-planar with
one another.
[0176] Example embodiment 10: An integrated circuit structure
includes a first vertical arrangement of nanowires and a second
vertical arrangement of nanowires above a substrate, the first
vertical arrangement of nanowires having a greater number of active
nanowires than the second vertical arrangement of nanowires, and
the first and second vertical arrangements of nanowires having
co-planar lowermost nanowires. The integrated circuit structure
also includes a first vertical arrangement of nanoribbons and a
second vertical arrangement of nanoribbons above the substrate, the
first vertical arrangement of nanoribbons having a greater number
of active nanoribbons than the second vertical arrangement of
nanoribbons, and the first and second vertical arrangements of
nanoribbons having co-planar lowermost nanoribbons.
[0177] Example embodiment 11: The integrated circuit structure of
example embodiment 10, further including one or more first gate
stacks over the first and second vertical arrangements of
nanowires, and one or more second gate stacks over the first and
second vertical arrangements of nanoribbons.
[0178] Example embodiment 12: The integrated circuit structure of
example embodiment 10 or 11, further including first epitaxial
source or drain structures at ends of the first and second vertical
arrangements of nanowires, and second epitaxial source or drain
structures at ends of the first and second vertical arrangements of
nanoribbons.
[0179] Example embodiment 13: The integrated circuit structure of
example embodiment 12, wherein the first and second epitaxial
source or drain structures are discrete first and second epitaxial
source or drain structures.
[0180] Example embodiment 14: The integrated circuit structure of
example embodiment 12, wherein the first and second epitaxial
source or drain structures are non-discrete first and second
epitaxial source or drain structures.
[0181] Example embodiment 15: The integrated circuit structure of
example embodiment 12, 13 or 14, further including first conductive
contact structures coupled to the first epitaxial source or drain
structures, and second conductive contact structures coupled to the
first epitaxial source or drain structures.
[0182] Example embodiment 16: The integrated circuit structure of
example embodiment 10, 11, 12, 13, 14 or 15, wherein the first
vertical arrangement of nanowires is over a first sub-fin, the
second vertical arrangement of nanowires is over a second sub-fin,
the first vertical arrangement of nanoribbons is over a third
sub-fin, and the second vertical arrangement of nanoribbons is over
a fourth sub-fin.
[0183] Example embodiment 17: The integrated circuit structure of
example embodiment 10, 11, 12, 13, 14, 15 or 16, further including
a first dielectric cap over the first vertical arrangement of
nanowires, a second dielectric cap over the second vertical
arrangement of nanowires, a third dielectric cap over the first
vertical arrangement of nanoribbons, and a fourth dielectric cap
over the second vertical arrangement of nanoribbons, wherein the
first, second, third and fourth dielectric caps are co-planar with
one another.
[0184] Example embodiment 18: A computing device includes a first
vertical arrangement of nanowires and a second vertical arrangement
of nanowires above a substrate, the first vertical arrangement of
nanowires having a greater number of active nanowires than the
second vertical arrangement of nanowires, and the first and second
vertical arrangements of nanowires having co-planar uppermost
nanowires. The integrated circuit structure also includes a first
vertical arrangement of nanoribbons and a second vertical
arrangement of nanoribbons above the substrate, the first vertical
arrangement of nanoribbons having a greater number of active
nanoribbons than the second vertical arrangement of nanoribbons,
and the first and second vertical arrangements of nanoribbons
having co-planar uppermost nanoribbons.
[0185] Example embodiment 19: The computing device of example
embodiment 18, further including a memory coupled to the board.
[0186] Example embodiment 20: The computing device of example
embodiment 18 or 19, further including a communication chip coupled
to the board.
[0187] Example embodiment 21: The computing device of example
embodiment 18, 19 or 20, further including a camera coupled to the
board.
[0188] Example embodiment 22: The computing device of example
embodiment 18, 19, 20 or 21, further including a battery coupled to
the board.
[0189] Example embodiment 23: The computing device of example
embodiment 18, 19, 20, 21 or 22, further including an antenna
coupled to the board.
[0190] Example embodiment 24: The computing device of example
embodiment 18, 19, 20, 21, 22 or 23, wherein the component is a
packaged integrated circuit die.
[0191] Example embodiment 25: The computing device of example
embodiment 18, 19, 20, 21, 22, 23 or 24, wherein the component is
selected from the group consisting of a processor, a communications
chip, and a digital signal processor.
* * * * *