Substrate for spectroscopic analysis

Ito , et al.

Patent Grant D888275

U.S. patent number D888,275 [Application Number D/646,727] was granted by the patent office on 2020-06-23 for substrate for spectroscopic analysis. This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Mitsuhiro Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.


United States Patent D888,275
Ito ,   et al. June 23, 2020

Substrate for spectroscopic analysis

Claims

CLAIM The ornamental design for a substrate for spectroscopic analysis, as shown and described.
Inventors: Ito; Masashi (Hamamatsu, JP), Shibayama; Katsumi (Hamamatsu, JP), Ofuji; Kazuto (Hamamatsu, JP), Maruyama; Yoshihiro (Hamamatsu, JP), Ito; Mitsuhiro (Hamamatsu, JP)
Applicant:
Name City State Country Type

HAMAMATSU PHOTONICS K.K.

Hamamatsu-shi, Shizuoka

N/A

JP
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka, JP)
Appl. No.: D/646,727
Filed: May 7, 2018

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
35502709 Sep 30, 2016 D838003

Foreign Application Priority Data

Apr 27, 2016 [JP] 2016-009310
Apr 27, 2016 [JP] 2016-009312
Current U.S. Class: D24/225
Current International Class: 2402
Field of Search: ;D16/130,131 ;D24/225-227,229-231 ;356/244-246 ;359/391-398

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Other References

Notice of Allowance dated Aug. 28, 2018 in U.S. Appl. No. 35/502,705. cited by applicant.

Primary Examiner: Chilcot; Richard E
Attorney, Agent or Firm: Faegre Drinker Biddle & Reath LLP

Description



FIG. 1 is a perspective view of a substrate for spectroscopic analysis of the present invention.

FIG. 2 is a front view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 3 is a back view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 4 is a top view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 5 is a bottom view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 6 is a left view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 7 is a right view of the substrate for spectroscopic analysis of FIG. 1.

FIG. 8 is a sectional view taken along the line 8-8 of the substrate for spectroscopic analysis of FIG. 2.

FIG. 9 is a sectional view taken along the line 9-9 of the substrate for spectroscopic analysis of FIG. 2; and,

FIG. 10 is a perspective view without the cover part of the substrate for spectroscopic analysis of FIG. 1.

The broken line showing of the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.

The dot-dash broken lines define the bounds of the claimed design and form no part thereof.

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