U.S. patent number D888,275 [Application Number D/646,727] was granted by the patent office on 2020-06-23 for substrate for spectroscopic analysis.
This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Mitsuhiro Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.
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United States Patent |
D888,275 |
Ito , et al. |
June 23, 2020 |
Substrate for spectroscopic analysis
Claims
CLAIM The ornamental design for a substrate for spectroscopic
analysis, as shown and described.
Inventors: |
Ito; Masashi (Hamamatsu,
JP), Shibayama; Katsumi (Hamamatsu, JP),
Ofuji; Kazuto (Hamamatsu, JP), Maruyama;
Yoshihiro (Hamamatsu, JP), Ito; Mitsuhiro
(Hamamatsu, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
HAMAMATSU PHOTONICS K.K. |
Hamamatsu-shi, Shizuoka |
N/A |
JP |
|
|
Assignee: |
HAMAMATSU PHOTONICS K.K.
(Hamamatsu-shi, Shizuoka, JP)
|
Appl.
No.: |
D/646,727 |
Filed: |
May 7, 2018 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
|
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35502709 |
Sep 30, 2016 |
D838003 |
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Foreign Application Priority Data
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Apr 27, 2016 [JP] |
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2016-009310 |
Apr 27, 2016 [JP] |
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2016-009312 |
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Current U.S.
Class: |
D24/225 |
Current International
Class: |
2402 |
Field of
Search: |
;D16/130,131
;D24/225-227,229-231 ;356/244-246 ;359/391-398 |
References Cited
[Referenced By]
U.S. Patent Documents
Other References
Notice of Allowance dated Aug. 28, 2018 in U.S. Appl. No.
35/502,705. cited by applicant.
|
Primary Examiner: Chilcot; Richard E
Attorney, Agent or Firm: Faegre Drinker Biddle & Reath
LLP
Description
FIG. 1 is a perspective view of a substrate for spectroscopic
analysis of the present invention.
FIG. 2 is a front view of the substrate for spectroscopic analysis
of FIG. 1.
FIG. 3 is a back view of the substrate for spectroscopic analysis
of FIG. 1.
FIG. 4 is a top view of the substrate for spectroscopic analysis of
FIG. 1.
FIG. 5 is a bottom view of the substrate for spectroscopic analysis
of FIG. 1.
FIG. 6 is a left view of the substrate for spectroscopic analysis
of FIG. 1.
FIG. 7 is a right view of the substrate for spectroscopic analysis
of FIG. 1.
FIG. 8 is a sectional view taken along the line 8-8 of the
substrate for spectroscopic analysis of FIG. 2.
FIG. 9 is a sectional view taken along the line 9-9 of the
substrate for spectroscopic analysis of FIG. 2; and,
FIG. 10 is a perspective view without the cover part of the
substrate for spectroscopic analysis of FIG. 1.
The broken line showing of the substrate for spectroscopic analysis
is for the purpose of illustrating environmental structure and
forms no part of the claimed design.
The dot-dash broken lines define the bounds of the claimed design
and form no part thereof.
* * * * *