Sample holder for ionized sample analysis

Description

FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged view showing a portion of FIG. 7 defined by lines 9-9 and 9'-9';

FIG. 10 is an enlarged view showing a portion of FIG. 7 defined by lines 10-10 and 10'-10';

FIG. 11 is an enlarged view showing a portion of FIG. 7 defined by lines 11-11 and 11'-11';

FIG. 12 is a cross-sectional view along the line 12-12 in FIG. 3;

FIG. 13 is a top plan view of the main body;

FIG. 14 is a cross-sectional view along the line 14-14 in FIG. 3;

FIG. 15 is a top plan view of the separator;

FIG. 16 is an enlarged cross-sectional view along the line 16-16 in FIG. 1, in the area designated by 16'-16' in FIG. 1;

FIG. 17 is an enlarged cross-sectional view along the line 17-17 in FIG. 1, in the area designated by 17'-17' in. FIG. 1;

FIG. 18 is an enlarged cross-sectional view along the line 18-18 in FIG. 1, in the area designated by 18'-18' in FIG. 1;

FIG. 19 is an enlarged cross-sectional view along the line 19-19 in FIG. 1, in the area designated by 19'-19' in FIG. 1; and,

FIG. 20 is an enlarged cross-sectional view along the line 20-20 in FIG. 1, in the area designated by 20'-20' in FIG. 1.

The features shown in evenly-dashed broken lines depict environmental subject matter only and form no part of the claimed design. The dot-dash broken lines in the drawings represent the bounds of the claimed subject matter, the dot-dash broken lines, themselves forming no part thereof.

The portions shown in solid-broken alternated hatching lines in FIGS. 16 to 20 are transparent.

Claims

CLAIM The ornamental design for a sample holder for ionized sample analysis, as shown and described.

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Inventors:	Ohmura; Takayuki (Hamamatsu, JP), Kotani; Masahiro (Hamamatsu, JP)
Applicant:	Name City State Country Type HAMAMATSU PHOTONICS K.K. Hamamatsu-shi, Shizuoka N/A JP
Assignee:	HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka, JP)
Appl. No.:	D/656,981
Filed:	July 18, 2018

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Foreign Application Priority Data

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Jan 19, 2018 [JP]			2018-000952

Current U.S. Class:	D24/226; D10/103
Current International Class:	2402
Field of Search:	;D10/81,103 ;D24/224,225,226,227,229,230

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References Cited [Referenced By]

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U.S. Patent Documents

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Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Drinker Biddle & Reath LLP

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