U.S. patent number D855,210 [Application Number 35/504,286] was granted by the patent office on 2019-07-30 for substrate for spectroscopic analysis.
The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.
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United States Patent |
D855,210 |
Ito , et al. |
July 30, 2019 |
Substrate for spectroscopic analysis
Claims
CLAIM The ornamental design for a substrate for spectroscopic
analysis, as shown and described.
Inventors: |
Ito; Masashi (Hamamatsu,
JP), Shibayama; Katsumi (Hamamatsu, JP),
Ofuji; Kazuto (Hamamatsu, JP), Maruyama;
Yoshihiro (Hamamatsu, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
HAMAMATSU PHOTONICS K.K. |
Shizuoka |
N/A |
JP |
|
|
Appl.
No.: |
35/504,286 |
Filed: |
July 5, 2017 |
International Registration
Int'l Reg. No. |
Int'l Reg. Date |
Int'l Reg.
Publication Date |
Hague Int'l
Filing Date |
DM/097056 |
Jul 5, 2017 |
Jan 5, 2018 |
Jul 5, 2017 |
Foreign Application Priority Data
|
|
|
|
|
Jan 25, 2017 [JP] |
|
|
2017-001198 |
|
Current U.S.
Class: |
D24/225 |
Current International
Class: |
2402 |
Field of
Search: |
;D24/225,216,126,189,155
;D10/81 ;D19/26 ;356/41,246,301,328 ;206/569,362,616,558,456
;422/412,537,420,408,534 ;435/7.92 ;211/74 ;600/509 ;250/576
;359/396 ;400/212 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Shields; Rhea
Description
1. Substrate for spectroscopic analysis
1.1 : Perspective
1.2 : Front
1.3 : Back
1.4 : Top
1.5 : Bottom
1.6 : Left
1.7 : Right
1.8 is a sectional view taken along the vertical center of 1.2;
1.9 is a sectional view taken along the vertical upper portion of
1.2;
1.10 : Perspective view without the cover part
1.11 : Reference view showing the state in use
In the reproductions, the broken lines are for the purpose of
illustrating environment only and form no part of the claimed
design. The dot-dash broken lines are for the purpose of showing
the boundaries of the claim and form no part of the claimed
design.
* * * * *