Substrate for spectroscopic analysis

Ito , et al.

Patent Grant D855210

U.S. patent number D855,210 [Application Number 35/504,286] was granted by the patent office on 2019-07-30 for substrate for spectroscopic analysis. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.


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United States Patent D855,210
Ito ,   et al. July 30, 2019

Substrate for spectroscopic analysis

Claims

CLAIM The ornamental design for a substrate for spectroscopic analysis, as shown and described.
Inventors: Ito; Masashi (Hamamatsu, JP), Shibayama; Katsumi (Hamamatsu, JP), Ofuji; Kazuto (Hamamatsu, JP), Maruyama; Yoshihiro (Hamamatsu, JP)
Applicant:
Name City State Country Type

HAMAMATSU PHOTONICS K.K.

Shizuoka

N/A

JP
Appl. No.: 35/504,286
Filed: July 5, 2017

International Registration

Int'l Reg. No. Int'l Reg. Date Int'l Reg.
Publication Date
Hague Int'l
Filing Date
DM/097056 Jul 5, 2017 Jan 5, 2018 Jul 5, 2017


Foreign Application Priority Data

Jan 25, 2017 [JP] 2017-001198
Current U.S. Class: D24/225
Current International Class: 2402
Field of Search: ;D24/225,216,126,189,155 ;D10/81 ;D19/26 ;356/41,246,301,328 ;206/569,362,616,558,456 ;422/412,537,420,408,534 ;435/7.92 ;211/74 ;600/509 ;250/576 ;359/396 ;400/212

References Cited [Referenced By]

U.S. Patent Documents
3856656 December 1974 Brink
4227810 October 1980 Sandrock
4294931 October 1981 Levin
D273898 May 1984 Valencia
D290042 May 1987 Ford
4761381 August 1988 Blatt
4777964 October 1988 Briggs
4819804 April 1989 Levy
4857453 August 1989 Ullman
4943522 July 1990 Eisinger
4981786 January 1991 Dafforn
5002062 March 1991 Suzuki
5075078 December 1991 Osikowicz
5217012 June 1993 Young
5451112 September 1995 Ito
5484572 January 1996 Katakura
5484731 January 1996 Stevens
5525304 June 1996 Matsson
D383215 September 1997 Levy
5812312 September 1998 Lorincz
D418228 December 1999 Fisch
D431300 September 2000 Fisch
6372514 April 2002 Lee
D500142 December 2004 Crisanti
D530826 October 2006 Rich
D531321 October 2006 Godfrey
D569990 May 2008 Fisch
D631166 January 2011 Leffew
D692578 October 2013 Kikuhara
D733911 July 2015 Ito
D733912 July 2015 Ito
D733913 July 2015 Ito
D735878 August 2015 Chang
D739954 September 2015 Ito
D740439 October 2015 Ito
D740440 October 2015 Ito
D750799 March 2016 Ito
D750800 March 2016 Ito
D754871 April 2016 Morrell-Falvey
D762874 August 2016 Ito
D772424 November 2016 Kram
D774189 December 2016 Wolfe
D800912 October 2017 Uzri
D812502 March 2018 Yokino
D819209 May 2018 DaCosta
D825360 August 2018 Ito
D829117 September 2018 Hirose
D829582 October 2018 Hirose
2011/0141469 June 2011 Shibayama
2016/0061736 March 2016 Ito
2018/0136134 May 2018 Shibayama
Primary Examiner: Shields; Rhea

Description



1. Substrate for spectroscopic analysis

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Top

1.5 : Bottom

1.6 : Left

1.7 : Right

1.8 is a sectional view taken along the vertical center of 1.2;

1.9 is a sectional view taken along the vertical upper portion of 1.2;

1.10 : Perspective view without the cover part

1.11 : Reference view showing the state in use

In the reproductions, the broken lines are for the purpose of illustrating environment only and form no part of the claimed design. The dot-dash broken lines are for the purpose of showing the boundaries of the claim and form no part of the claimed design.

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