Specimen analysis apparatus

Description

FIG. 1 is a front, top and right side perspective view of a specimen analysis apparatus, showing my new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof;

FIG. 7 is a bottom view thereof;

FIG. 8 is an enlarged cross sectional view thereof, taken along the line 8-8 in FIG. 6 with its internal mechanisms omitted; and,

FIG. 9 is a perspective view showing a state in which a slide cover is slid to open.

The eneven broken line in FIG. 6 is included to indicate the cutting plane of FIG. 8. The broken lines are for illustrative purpose only and form no part of the claimed design.

Claims

CLAIM The ornamental design for a specimen analysis apparatus, as shown and described.

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Inventors:	Chang; Shianwei (Kanagawa, JP)
Applicant:	Name City State Country Type Kabushiki Kaisha Toshiba Toshiba Medical Systems Corporation Minato-ku, Tokyo Otawara-shi, Tochigi-ken N/A N/A JP JP
Assignee:	Kabushiki Kaisha Toshiba (Minato-ku, Tokyo, JP) Toshiba Medical Systems Corporation (Otawara-shi, Tochigi-ken, JP)
Appl. No.:	D/518,489
Filed:	February 24, 2015

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Foreign Application Priority Data

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Aug 25, 2014 [JP]			2014-018467

Current U.S. Class:	D24/216
Current International Class:	2401
Field of Search:	;D24/216,223-225,231,232,186,107 ;D10/81 ;436/43,45,47 ;422/500,547,62-65,67 ;435/287.1,287.3

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References Cited [Referenced By]

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U.S. Patent Documents

D638545	May 2011	Okawa et al.
D647209	October 2011	Muller et al.
D655421	March 2012	Lee et al.
D665917	August 2012	TerMaat et al.
8298484	October 2012	Takagi et al.
D689193	September 2013	Shinohara et al.
D717968	November 2014	Klein et al.
D730535	May 2015	Gutmann et al.

Foreign Patent Documents

	S1386808		May 2010		JP
	S1399185		Oct 2010		JP
	S1400050		Nov 2010		JP
	S1457056		Dec 2012		JP

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Banner & Witcoff, Ltd.