Substrate for spectroscopic analysis
Ito , et al. J
U.S. patent number D838,003 [Application Number 35/502,709] was granted by the patent office on 2019-01-08 for substrate for spectroscopic analysis. This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Mitsuhiro Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.
| United States Patent | D838,003 |
| Ito , et al. | January 8, 2019 |
Substrate for spectroscopic analysis
Claims
CLAIM The ornamental design for a substrate for spectroscopic analysis, as shown and described.
| Inventors: | Ito; Masashi (Hamamatsu, JP), Shibayama; Katsumi (Hamamatsu, JP), Ofuji; Kazuto (Hamamatsu, JP), Maruyama; Yoshihiro (Hamamatsu, JP), Ito; Mitsuhiro (Hamamatsu, JP) | ||||||||||
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| Applicant: |
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| Assignee: | HAMAMATSU PHOTONICS K.K.
(Hamamatsu-shi, Shizuoka, JP) |
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| Appl. No.: | 35/502,709 | ||||||||||
| Filed: | September 30, 2016 |
International Registration
| Int'l Reg. No. | Int'l Reg. Date | Int'l Reg. Publication Date |
Hague Int'l Filing Date |
|---|---|---|---|
| DM/092894 | Sep 30, 2016 | Mar 31, 2017 | Sep 30, 2016 |
Foreign Application Priority Data
| Apr 27, 2016 [JP] | 2016-009310 | |||
| Apr 27, 2016 [JP] | 2016-009312 | |||
| Current U.S. Class: | D24/225 |
| Current International Class: | 2402 |
| Field of Search: | ;D16/130,131 ;D24/225-227,229-231 ;356/244-246 ;359/391-398 |
References Cited [Referenced By]
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Description
1. Substrate for spectroscopic analysis
1.1 : Perspective
1.2 : Front
1.3 : Back
1.4 : Top
1.5 : Bottom
1.6 : Left
1.7 : Right
1.8 : SECTIONAL VIEW
1.9 : SECTIONAL VIEW
1.10 : PERSPECTIVE VIEW WITHOUT THE COVER PART
The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.
The dot-dash broken lines define the hounds of the claimed design and form no part thereof.
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