Substrate for spectroscopic analysis
Ito , et al. Dec
U.S. patent number D835,799 [Application Number 35/502,702] was granted by the patent office on 2018-12-11 for substrate for spectroscopic analysis. This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Mitsuhiro Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.
| United States Patent | D835,799 |
| Ito , et al. | December 11, 2018 |
Substrate for spectroscopic analysis
Claims
CLAIM The ornamental design for a substrate for spectroscopic analysis, as shown and described.
| Inventors: | Ito; Masashi (Hamamatsu, JP), Shibayama; Katsumi (Hamamatsu, JP), Ofuji; Kazuto (Hamamatsu, JP), Maruyama; Yoshihiro (Hamamatsu, JP), Ito; Mitsuhiro (Hamamatsu, JP) | ||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
| Applicant: |
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| Assignee: | HAMAMATSU PHOTONICS K.K.
(Hamamatsu-shi, Shizuoka, JP) |
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| Appl. No.: | 35/502,702 | ||||||||||
| Filed: | September 30, 2016 |
International Registration
| Int'l Reg. No. | Int'l Reg. Date | Int'l Reg. Publication Date |
Hague Int'l Filing Date |
|---|---|---|---|
| DM/092887 | Sep 30, 2016 | Mar 31, 2017 | Sep 30, 2016 |
Foreign Application Priority Data
| Apr 27, 2016 [JP] | 2016-009315 | |||
| Current U.S. Class: | D24/225 |
| Current International Class: | 2402 |
| Field of Search: | ;D24/216,222-226,231,232,169 ;D10/80,81 ;422/502-507,430,560-566,68.1,69,547 ;435/288.2-288.5,283.1,289.1,44,46 |
References Cited [Referenced By]
U.S. Patent Documents
| 3736042 | May 1973 | Markovits |
| D273898 | May 1984 | Valencia |
| D274261 | June 1984 | Valencia |
| 4761381 | August 1988 | Blatt et al. |
| D320269 | September 1991 | Hammond |
| 5784193 | July 1998 | Ferguson |
| 5812312 | September 1998 | Lorincz |
| D500142 | December 2004 | Crisanti et al. |
| D530826 | October 2006 | Rich et al. |
| D531321 | October 2006 | Godfrey et al. |
| D683045 | May 2013 | Domack |
| D692578 | October 2013 | Kikuhara et al. |
| D702364 | April 2014 | Iqbal |
| D733911 | July 2015 | Ito |
| D733912 | July 2015 | Ito |
| D733913 | July 2015 | Ito |
| D735877 | August 2015 | Chang |
| D739954 | September 2015 | Ito |
| D740439 | October 2015 | Ito |
| D740440 | October 2015 | Ito |
| D750799 | March 2016 | Ito |
| D750800 | March 2016 | Ito |
| D754871 | April 2016 | Morrell-Falvey |
| 2005/0237607 | October 2005 | Tenney |
Description
1. Substrate for spectroscopic analysis
1.1 : Perspective
1.2 : Front
1.3 : Back
1.4 : Top
1.5 : Bottom
1.6 : Left
1.7 : Right
1.8 : SECTIONAL VIEW
1.9 : SECTIONAL VIEW
The broken line showing the substrate for spectroscopic analysis is for the purpose of illustrating environmental structure and forms no part of the claimed design.
The dot-dash broken lines define the bounds of the claimed design and form no part thereof.
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