U.S. patent number D835,799 [Application Number 35/502,702] was granted by the patent office on 2018-12-11 for substrate for spectroscopic analysis.
This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masashi Ito, Mitsuhiro Ito, Yoshihiro Maruyama, Kazuto Ofuji, Katsumi Shibayama.
United States Patent |
D835,799 |
Ito , et al. |
December 11, 2018 |
Substrate for spectroscopic analysis
Claims
CLAIM The ornamental design for a substrate for spectroscopic
analysis, as shown and described.
Inventors: |
Ito; Masashi (Hamamatsu,
JP), Shibayama; Katsumi (Hamamatsu, JP),
Ofuji; Kazuto (Hamamatsu, JP), Maruyama;
Yoshihiro (Hamamatsu, JP), Ito; Mitsuhiro
(Hamamatsu, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
HAMAMATSU PHOTONICS K.K. |
Shizuoka |
N/A |
JP |
|
|
Assignee: |
HAMAMATSU PHOTONICS K.K.
(Hamamatsu-shi, Shizuoka, JP)
|
Appl.
No.: |
35/502,702 |
Filed: |
September 30, 2016 |
International Registration
Int'l Reg. No. |
Int'l Reg. Date |
Int'l Reg.
Publication Date |
Hague Int'l
Filing Date |
DM/092887 |
Sep 30, 2016 |
Mar 31, 2017 |
Sep 30, 2016 |
Foreign Application Priority Data
|
|
|
|
|
Apr 27, 2016 [JP] |
|
|
2016-009315 |
|
Current U.S.
Class: |
D24/225 |
Current International
Class: |
2402 |
Field of
Search: |
;D24/216,222-226,231,232,169 ;D10/80,81
;422/502-507,430,560-566,68.1,69,547
;435/288.2-288.5,283.1,289.1,44,46 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Chilcot; Richard E
Description
1. Substrate for spectroscopic analysis
1.1 : Perspective
1.2 : Front
1.3 : Back
1.4 : Top
1.5 : Bottom
1.6 : Left
1.7 : Right
1.8 : SECTIONAL VIEW
1.9 : SECTIONAL VIEW
The broken line showing the substrate for spectroscopic analysis is
for the purpose of illustrating environmental structure and forms
no part of the claimed design.
The dot-dash broken lines define the bounds of the claimed design
and form no part thereof.
* * * * *