Portion of a cover for an electron microscope

Description

FIG. 1 is a front, top and right side perspective view of a portion of a cover for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The long and short dashed lines immediately adjacent the shaded area represent the bounds of the claimed design while all other broken lines are directed to an environment and form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for a portion of a cover for an electron microscope, as shown and described.

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Inventors:	Matoba; Kosuke (Tokyo, JP), Suzuki; Hiroyuki (Hitachinaka, JP), Sato; Hirofumi (Hitachinaka, JP), Sakamoto; Naoki (Naka, JP), Moriya; Toshiyuki (Tokorozawa, JP)
Applicant:	Name City State Country Type Hitachi High-Technologies Corporation Tokyo N/A JP
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/456,329
Filed:	May 30, 2013

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Foreign Application Priority Data

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Nov 30, 2012 [JP]			2012-029394

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D16/130,131 ;250/310,311,440.11 ;D24/216,232 ;D10/81 ;422/63,66 ;D15/79,81,84-89 ;312/405,116,407.1,409 ;4/607,614 ;D99/41,43

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References Cited [Referenced By]

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Other References

Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English. cited by applicant . Jeol News, Introduction of New Products, High Throughput Electron Microscope, Electron Microscope, JEM-2800, Jul. 2011, vol. 46, No. 1, in English. cited by applicant . Imaging & Microscopy, Imaging-GIT.com, Fei Ultra-High Resolution Titan, Issue 1, Nov. 1, 2007, in English. cited by applicant.

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.