U.S. patent number D571,385 [Application Number D/266,560] was granted by the patent office on 2008-06-17 for electron microscope.
This patent grant is currently assigned to Hitachi High-Technologies Corporation. Invention is credited to Takahito Hashimoto, Hiromi Inada, Kuniyasu Nakamura, Mitsuru Onuma, Koichirou Saito.
United States Patent |
D571,385 |
Onuma , et al. |
June 17, 2008 |
Electron microscope
Claims
CLAIM We claim the ornamental design for electron microscope, as
shown and described.
Inventors: |
Onuma; Mitsuru (Tokyo,
JP), Nakamura; Kuniyasu (Hitachinaka, JP),
Saito; Koichirou (Hitachi, JP), Hashimoto;
Takahito (Hitachinaka, JP), Inada; Hiromi
(Hitachinaka, JP) |
Assignee: |
Hitachi High-Technologies
Corporation (Tokyo, JP)
|
Appl.
No.: |
D/266,560 |
Filed: |
September 25, 2006 |
Foreign Application Priority Data
|
|
|
|
|
Jun 19, 2006 [JP] |
|
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2006-015751 |
|
Current U.S.
Class: |
D16/131 |
Current International
Class: |
1601 |
Field of
Search: |
;D16/130,131
;250/306-309,310,311,397,440.11 ;359/368,376,385,390,393,383
;D24/186,216,232 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Greene; Paula A.
Attorney, Agent or Firm: Antonelli, Terry, Stout &
Kraus, LLP.
Description
FIG. 1 is a front, top and right side perspective view of electron
microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is a front, top, and right side perspective view thereof
with the covers opened, the undisclosed portions are not part of
the claimed design.
* * * * *