Inada; Hiromi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Inada; Hiromi.The latest application filed is for "scanning electron microscope".

Company Profile

0.22.21

Inada; Hiromi - Tsu JP
Inada; Hiromi - Tokyo JP
INADA; Hiromi - Tsu-shi JP
Inada; Hiromi - Hitachinaka JP
Inada; Hiromi - Pleasanton CA
Inada; Hiromi - Mie-pref. JP
Inada, Hiromi - Age-gun JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of detecting defects in honeycomb structural body Grant 9,709,457 - Sugiyama , et al. July 18, 2	2017-07-18
Scanning electron microscope Grant 9,305,745 - Mori , et al. April 5, 2	2016-04-05
Scanning Electron Microscope App 20150034824 - Mori; Wataru ; et al.	2015-02-05
Method Of Detecting Defects In Honeycomb Structural Body App 20150013435 - SUGIYAMA; Tomio ; et al.	2015-01-15
Scanning electron microscope and scanning transmission electron microscope Grant 8,878,130 - Inada , et al. November 4, 2	2014-11-04
Scanning Electron Microscope And Scanning Transmission Electron Microscope App 20140138542 - Inada; Hiromi ; et al.	2014-05-22
Scanning transmission electron microscope and axial adjustment method thereof Grant 8,710,438 - Nakamura , et al. April 29, 2	2014-04-29
Scanning Transmission Electron Microscope And Axial Adjustment Method Thereof App 20130112875 - Nakamura; Kuniyasu ; et al.	2013-05-09
Charged particle beam equipment and charged particle microscopy Grant 8,304,722 - Inada , et al. November 6, 2	2012-11-06
Charged particle beam equipment Grant 7,923,701 - Inada , et al. April 12, 2	2011-04-12
Charged particle beam equipment with magnification correction Grant 7,649,172 - Ozawa , et al. January 19, 2	2010-01-19
Electric charged particle beam microscopy and electric charged particle beam microscope Grant 7,633,064 - Tsuneta , et al. December 15, 2	2009-12-15
Charged particle beam equipment App 20090242794 - Inada; Hiromi ; et al.	2009-10-01
Method and device for observing a specimen in a field of view of an electron microscope Grant 7,544,936 - Inada , et al. June 9, 2	2009-06-09
Charged Particle Beam Equipment And Charged Particle Microscopy App 20090084955 - Inada; Hiromi ; et al.	2009-04-02
Charged particle beam equipment and charged particle microscopy Grant 7,435,957 - Inada , et al. October 14, 2	2008-10-14
Electron microscope Grant D571,385 - Onuma , et al. June 17, 2	2008-06-17
Charged particle beam equipment Grant 7,375,330 - Inada , et al. May 20, 2	2008-05-20
Charged particle system and a method for measuring image magnification Grant 7,372,047 - Sato , et al. May 13, 2	2008-05-13
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system Grant 7,372,051 - Tsuneta , et al. May 13, 2	2008-05-13
Electric Charged Particle Beam Microscopy And Electric Charged Particle Beam Microscope App 20080093551 - TSUNETA; Ruriko ; et al.	2008-04-24
Charged particle beam equipment App 20080067380 - Ozawa; Masaru ; et al.	2008-03-20
Method and device for observing a specimen in a field of view of an electron microscope App 20070176103 - Inada; Hiromi ; et al.	2007-08-02
Method and device for observing a specimen in a field of view of an electron microscope Grant 7,164,129 - Inada , et al. January 16, 2	2007-01-16
Electron microscope Grant 7,126,120 - Inada October 24, 2	2006-10-24
Charged particle beam equipment App 20060219908 - Inada; Hiromi ; et al.	2006-10-05
Method of producing ceramic body Grant 7,112,294 - Inada September 26, 2	2006-09-26
Charged particle beam equipment and charged particle microscopy App 20060151697 - Inada; Hiromi ; et al.	2006-07-13
Method and device for observing a specimen in a field of view of an electron microscope App 20060097169 - Inada; Hiromi ; et al.	2006-05-11
Method and device for observing a specimen in a field of view of an electron microscope Grant 7,022,989 - Inada , et al. April 4, 2	2006-04-04
Method and device for observing a specimen in a field of view of an electron microscope Grant 7,012,254 - Inada , et al. March 14, 2	2006-03-14
Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system App 20060038125 - Tsuneta; Ruriko ; et al.	2006-02-23
Charged particle system and a method for measuring image magnification App 20050189501 - Sato, Mitsugu ; et al.	2005-09-01
Method and device for observing a specimen in a field of view of an electron Grant 6,878,934 - Inada , et al. April 12, 2	2005-04-12
Electron microscope App 20050072920 - Inada, Hiromi	2005-04-07
Method and device for observing a specimen in a field of view of an electron microscope App 20050035293 - Inada, Hiromi ; et al.	2005-02-17
Method and device for observing a specimen in a field of view of an electron microscope App 20040173749 - Inada, Hiromi ; et al.	2004-09-09
Method of producing ceramic body App 20020180121 - Inada, Hiromi	2002-12-05
Method and device for observing a specimen in a field of view of an electron microscope App 20020027199 - Inada, Hiromi ; et al.	2002-03-07

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