Electron microscope

Description

FIG. 1 is a front, top and right side perspective view of electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a front, top, and right side perspective view thereof with the covers opened, the undisclosed portions are not part of the claimed design.

Claims

CLAIM We claim the ornamental design for electron microscope, as shown and described.

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Inventors:	Onuma; Mitsuru (Tokyo, JP), Nakamura; Kuniyasu (Hitachinaka, JP), Saito; Koichirou (Hitachi, JP), Hashimoto; Takahito (Hitachinaka, JP), Inada; Hiromi (Hitachinaka, JP)
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/266,560
Filed:	September 25, 2006

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Foreign Application Priority Data

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Jun 19, 2006 [JP]			2006-015751

Current U.S. Class:	D16/131
Current International Class:	1601
Field of Search:	;D16/130,131 ;250/306-309,310,311,397,440.11 ;359/368,376,385,390,393,383 ;D24/186,216,232

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References Cited [Referenced By]

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U.S. Patent Documents

D141832	July 1945	Holley
2424791	July 1947	Bachman et al.
D332616	January 1993	Hashimoto et al.
D381031	July 1997	Miyata et al.

Primary Examiner: Greene; Paula A.
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.