U.S. patent number D381,031 [Application Number D/041,935] was granted by the patent office on 1997-07-15 for electron microscope.
This patent grant is currently assigned to Hitachi, Ltd.. Invention is credited to Peter Hohmann, Atsushi Katayama, Hiroyuki Kobayashi, Tomoyuki Miyata, Hisashi Sato, Sadao Terakado, Daiji Tsuboi.
United States Patent |
D381,031 |
Miyata , et al. |
July 15, 1997 |
Electron microscope
Claims
The ornamental design for an electron microscope, as shown and
described.
Inventors: |
Miyata; Tomoyuki (Mitaka,
JP), Katayama; Atsushi (Kokubunji, JP),
Tsuboi; Daiji (Kodaira, JP), Kobayashi; Hiroyuki
(Mito, JP), Sato; Hisashi (Hitachinaka,
JP), Terakado; Sadao (Hitachinaka, JP),
Hohmann; Peter (Kirchseeon, DE) |
Assignee: |
Hitachi, Ltd. (Tokyo,
JP)
|
Appl.
No.: |
D/041,935 |
Filed: |
July 27, 1995 |
Foreign Application Priority Data
Current U.S.
Class: |
D16/131 |
Current International
Class: |
1601 |
Field of
Search: |
;D16/130-131
;250/311,306,440.11,307-309,310 ;359/368-372 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Gandy; James M.
Assistant Examiner: Sinuik; Stacia
Attorney, Agent or Firm: Antonelli, Terry, Stout &
Kraus
Description
FIG. 1 is a front, top and right side perspective view of an
Electron Microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view therof;
FIG. 6 is a left side view therof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a front, top and right side perspective view of an
Electron Microscope in condition of usage, it being understood that
the broken line showing of environment is for illustrative purposes
only and forms no part of the claimed design.
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