Electron microscope
Oonuma , et al. February 8, 2
U.S. patent number D632,323 [Application Number D/356,731] was granted by the patent office on 2011-02-08 for electron microscope. This patent grant is currently assigned to Hitachi High-Technologies Corporation. Invention is credited to Masahiko Ajima, Tomohisa Ohtaki, Akira Omachi, Mitsuru Oonuma.
| United States Patent | D632,323 |
| Oonuma , et al. | February 8, 2011 |
Electron microscope
Claims
CLAIM We claim the ornamental design for an electron microscope, as shown and described.
| Inventors: | Oonuma; Mitsuru (Tokyo, JP), Omachi; Akira (Komae, JP), Ajima; Masahiko (Hitachinaka, JP), Ohtaki; Tomohisa (Hitachinaka, JP) |
|---|---|
| Assignee: | Hitachi High-Technologies
Corporation (Tokyo, JP) |
| Appl. No.: | D/356,731 |
| Filed: | March 2, 2010 |
Foreign Application Priority Data
| Sep 30, 2009 [JP] | 2009-022636 | |||
| Current U.S. Class: | D16/131 |
| Current International Class: | 1606 |
| Field of Search: | ;D16/130,131,221,234 ;D24/186,232,216 ;D7/390 ;D10/81 ;D13/184 ;250/311 ;359/383,384,385,389,390,368,370,371,372 |
References Cited [Referenced By]
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Other References
|
US. Patent Application of Oonuma et al., U.S. Appl. No. 29/343,661, filed Sep. 17, 2009. cited by other. |
Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.
Description
FIG. 1 is front, top and right side perspective view of an electron microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines form no part of the claimed design.
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