Ohtaki; Tomohisa
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ohtaki; Tomohisa.The latest application filed is for "method for manufacturing semiconductor device".
- Ohtaki; Tomohisa - Tokyo JP
- Ohtaki; Tomohisa - Hitachinaka JP
| Patent | Date |
|---|---|
| Probe module and probe Grant 11,391,756 - Hirano , et al. July 19, 2 | 2022-07-19 |
| Method for Manufacturing Semiconductor Device App 20210048450 - OHTAKI; Tomohisa ; et al. | 2021-02-18 |
| Probe Module and Probe App 20210033642 - HIRANO; Ryo ; et al. | 2021-02-04 |
| Evaluation Apparatus for Semiconductor Device App 20210025936 - OHTAKI; Tomohisa ; et al. | 2021-01-28 |
| Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample Grant 9,673,020 - Ominami , et al. June 6, 2 | 2017-06-06 |
| Charged particle beam device Grant 9,263,232 - Ominami , et al. February 16, 2 | 2016-02-16 |
| Inspection or observation apparatus and sample inspection or observation method Grant 9,236,217 - Ominami , et al. January 12, 2 | 2016-01-12 |
| Charged Particle Beam Device, Method For Adjusting Charged Particle Beam Device, And Method For Inspecting Or Observing Sample App 20150380208 - OMINAMI; Yusuke ; et al. | 2015-12-31 |
| Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample Grant 9,165,741 - Ominami , et al. October 20, 2 | 2015-10-20 |
| Charged particle beam apparatus Grant 9,105,442 - Ominami , et al. August 11, 2 | 2015-08-11 |
| Charged Particle Beam Device App 20150129763 - Ominami; Yusuke ; et al. | 2015-05-14 |
| Inspection Or Observation Apparatus And Sample Inspection Or Observation Method App 20150083908 - OMINAMI; Yusuke ; et al. | 2015-03-26 |
| Charged Particle Beam Apparatus App 20150076347 - Ominami; Yusuke ; et al. | 2015-03-19 |
| Inspection or observation apparatus and sample inspection or observation method Grant 8,933,400 - Ominami , et al. January 13, 2 | 2015-01-13 |
| Charged particle beam apparatus Grant 8,921,786 - Ominami , et al. December 30, 2 | 2014-12-30 |
| Scanning electron microscope Grant 8,921,784 - Iwaya , et al. December 30, 2 | 2014-12-30 |
| Inspection Or Observation Apparatus And Sample Inspection Or Observation Method App 20140246583 - Ominami; Yusuke ; et al. | 2014-09-04 |
| Scanning electron microscope Grant 8,809,782 - Ohtaki , et al. August 19, 2 | 2014-08-19 |
| Charged Particle Beam Apparatus App 20140175278 - OMINAMI; Yusuke ; et al. | 2014-06-26 |
| Charged Particle Beam Device, Method For Adjusting Charged Particle Beam Device, And Method For Inspecting Or Observing Sample App 20140151553 - Ominami; Yusuke ; et al. | 2014-06-05 |
| Charged particle beam apparatus Grant 8,710,439 - Ominami , et al. April 29, 2 | 2014-04-29 |
| Charged Particle Beam Apparatus App 20140021347 - Ominami; Yusuke ; et al. | 2014-01-23 |
| Scanning Electron Microscope App 20120211654 - Iwaya; Toru ; et al. | 2012-08-23 |
| Scanning Electron Microscope App 20120127299 - Ohtaki; Tomohisa ; et al. | 2012-05-24 |
| Portion of an electron microscope Grant D635,167 - Oonuma , et al. March 29, 2 | 2011-03-29 |
| Portion of an electron microscope Grant D635,168 - Oonuma , et al. March 29, 2 | 2011-03-29 |
| Electron microscope Grant D633,538 - Oonuma , et al. March 1, 2 | 2011-03-01 |
| Electron microscope Grant D633,537 - Oonuma , et al. March 1, 2 | 2011-03-01 |
| Electron microscope Grant D632,323 - Oonuma , et al. February 8, 2 | 2011-02-08 |
| Electron microscope Grant D626,579 - Oonuma , et al. November 2, 2 | 2010-11-02 |
| Electron microscope Grant D625,749 - Oonuma , et al. October 19, 2 | 2010-10-19 |
| Electron microscope Grant D623,211 - Oonuma , et al. September 7, 2 | 2010-09-07 |
| Scanning Electron Microscope App 20090057558 - Iwaya; Toru ; et al. | 2009-03-05 |
| Environmental scanning electron microcope Grant 7,365,323 - Ohtaki , et al. April 29, 2 | 2008-04-29 |
| Environmental scanning electron microscope App 20060219912 - Ohtaki; Tomohisa ; et al. | 2006-10-05 |
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