Electron microscope

Description

FIG. 1 is a front, top and right side perspective view of electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for an electron microscope, as shown and described.

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Inventors:	Oonuma; Mitsuru (Tokyo, JP), Omachi; Akira (Komae, JP), Ajima; Masahiko (Hitachinaka, JP), Ohtaki; Tomohisa (Hitachinaka, JP)
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/339,397
Filed:	June 30, 2009

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Foreign Application Priority Data

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Mar 19, 2009 [JP]			2009-006242

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D16/130,131,221,234 ;D24/186,232,216 ;D10/81 ;D13/184 ;250/311 ;359/383,384,385,389,390,368,370,371,372,363

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References Cited [Referenced By]

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U.S. Patent Documents

D141832	July 1945	Holley
D172780	August 1954	Briskin et al.
D182698	April 1958	Wells
3551019	December 1970	Michel
D225580	December 1972	Reinecke
D299861	February 1989	Hunsdale et al.
4812029	March 1989	Onanhian
D332616	January 1993	Hashimoto et al.
D491272	June 2004	Alden et al.
D527464	August 2006	Ina et al.
D574280	August 2008	Wakamatsu et al.
D591864	May 2009	Schmidt
D607569	January 2010	Yukikado et al.

Foreign Patent Documents

	D11233735		Mar 2005		JP

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.