U.S. patent number D625,749 [Application Number D/339,397] was granted by the patent office on 2010-10-19 for electron microscope.
This patent grant is currently assigned to Hitachi High-Technologies Corporation. Invention is credited to Masahiko Ajima, Tomohisa Ohtaki, Akira Omachi, Mitsuru Oonuma.
United States Patent |
D625,749 |
Oonuma , et al. |
October 19, 2010 |
Electron microscope
Claims
CLAIM We claim the ornamental design for an electron microscope, as
shown and described.
Inventors: |
Oonuma; Mitsuru (Tokyo,
JP), Omachi; Akira (Komae, JP), Ajima;
Masahiko (Hitachinaka, JP), Ohtaki; Tomohisa
(Hitachinaka, JP) |
Assignee: |
Hitachi High-Technologies
Corporation (Tokyo, JP)
|
Appl.
No.: |
D/339,397 |
Filed: |
June 30, 2009 |
Foreign Application Priority Data
|
|
|
|
|
Mar 19, 2009 [JP] |
|
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2009-006242 |
|
Current U.S.
Class: |
D16/131 |
Current International
Class: |
1606 |
Field of
Search: |
;D16/130,131,221,234
;D24/186,232,216 ;D10/81 ;D13/184 ;250/311
;359/383,384,385,389,390,368,370,371,372,363 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout &
Kraus, LLP.
Description
FIG. 1 is a front, top and right side perspective view of electron
microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken lines form no part of the claimed design.
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