Electron microscope

Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

The broken lines shown are for illustrative purposes only and form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for an electron microscope, as shown and described.

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Inventors:	Noda; Hiroyuki (Kokubunji, JP), Oonuma; Mitsuru (Tokyo, JP), Omachi; Akira (Komae, JP), Nemoto; Masahiro (Hitachiota, JP), Sasagawa; Kiyoshi (Honjo, JP)
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/366,697
Filed:	July 29, 2010

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Foreign Application Priority Data

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Feb 22, 2010 [JP]			2010-004040

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D16/131,130 ;D24/186,216,232 ;D10/81 ;250/307,310,311,397,440.11 ;359/383,384,385,389,390,368,370,371,372,363,388

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References Cited [Referenced By]

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U.S. Patent Documents

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Foreign Patent Documents

	D973373-2		Feb 1997		JP

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.