Cover for an electron microscope

Description

FIG. 1 is a front, top and right side perspective view of a cover for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof;

FIG. 8 is a perspective view thereof shown in an opened position; and,

FIG. 9 is a perspective view thereof shown in another opened position.

Claims

CLAIM We claim the ornamental design for a cover for an electron microscope, as shown and described.

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Inventors:	Matoba; Kosuke (Tokyo, JP), Suzuki; Hiroyuki (Hitachinaka, JP), Sato; Hirofumi (Hitachinaka, JP), Sakamoto; Naoki (Naka, JP), Moriya; Toshiyuki (Tokorozawa, JP)
Applicant:	Name City State Country Type Hitachi High-Technologies Corporation Tokyo N/A JP
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Family ID:	50982582
Appl. No.:	D/456,325
Filed:	May 30, 2013

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Foreign Application Priority Data

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Nov 30, 2012 [JP]			2012-029393

Current U.S. Class:	D16/131
Current CPC Class:	H01J37/26 20130101
Current International Class:	1601
Field of Search:	;D16/131,130 ;D24/216,232 ;D15/85,86 ;250/310,311,440.11 ;D10/81 ;422/63,64

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References Cited [Referenced By]

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Other References

Hitachi High-Technologies Corporation, News Release, Hitachi High-Technologies Launches Sale of New SU9000 Scanning Electron Microscope, Field Emission Scanning Electron Microscope Featuring Ultra-High Resolution Imaging, Apr. 19, 2011 in English. cited by applicant . Jeol News, Introduction of New Products, High Throughput Electron Microscope, Jem-2800, Jul. 2011, vol. 46, No. 1, in English. cited by applicant . Imaging & Microscopy, Imaging-GIT.com, Fei Ultra-High Resolution Titan, Issue 1, Nov. 1, 2007, in English. cited by applicant.

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.