U.S. patent number 11,344,976 [Application Number 16/766,259] was granted by the patent office on 2022-05-31 for solder material, solder paste, and solder joint.
This patent grant is currently assigned to SENJU METAL INDUSTRY CO., LTD.. The grantee listed for this patent is SENJU METAL INDUSTRY CO., LTD.. Invention is credited to Takashi Akagawa, Hiroshi Kawanago, Hiroyoshi Kawasaki, Osamu Munekata, Hiroshi Okada, Takahiro Roppongi, Daisuke Soma, Hiroki Sudo, Hiroshi Takahashi, Satoshi Yokota.
United States Patent |
11,344,976 |
Kawasaki , et al. |
May 31, 2022 |
Solder material, solder paste, and solder joint
Abstract
The present invention provides a solder material containing Sn
or a Sn-containing alloy and 40 to 320 ppm by mass of A, the solder
material including an As-enriched layer.
Inventors: |
Kawasaki; Hiroyoshi (Tokyo,
JP), Sudo; Hiroki (Tokyo, JP), Roppongi;
Takahiro (Tokyo, JP), Okada; Hiroshi (Tokyo,
JP), Soma; Daisuke (Tokyo, JP), Akagawa;
Takashi (Tokyo, JP), Takahashi; Hiroshi (Tokyo,
JP), Kawanago; Hiroshi (Tokyo, JP), Yokota;
Satoshi (Tokyo, JP), Munekata; Osamu (Tokyo,
JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
SENJU METAL INDUSTRY CO., LTD. |
Tokyo |
N/A |
JP |
|
|
Assignee: |
SENJU METAL INDUSTRY CO., LTD.
(Tokyo, JP)
|
Family
ID: |
1000006338839 |
Appl.
No.: |
16/766,259 |
Filed: |
November 21, 2018 |
PCT
Filed: |
November 21, 2018 |
PCT No.: |
PCT/JP2018/042943 |
371(c)(1),(2),(4) Date: |
May 21, 2020 |
PCT
Pub. No.: |
WO2019/103025 |
PCT
Pub. Date: |
May 31, 2019 |
Prior Publication Data
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Document
Identifier |
Publication Date |
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US 20200376607 A1 |
Dec 3, 2020 |
|
Foreign Application Priority Data
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Nov 24, 2017 [JP] |
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JP2017-225677 |
Jul 20, 2018 [JP] |
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JP2018-136676 |
Jul 20, 2018 [JP] |
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JP2018-136678 |
Jul 20, 2018 [JP] |
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JP2018-136761 |
Jul 20, 2018 [JP] |
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JP2018-136766 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
C22C
13/02 (20130101); C22C 13/00 (20130101); B23K
35/025 (20130101); B23K 35/262 (20130101); H05K
3/3457 (20130101); Y10T 428/12708 (20150115) |
Current International
Class: |
B23K
35/26 (20060101); B23K 35/02 (20060101); C22C
13/00 (20060101); C22C 13/02 (20060101); B22F
1/00 (20220101); H05K 3/34 (20060101) |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
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1603056 |
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Apr 2005 |
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CN |
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1712175 |
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Dec 2005 |
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CN |
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103267834 |
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Aug 2013 |
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CN |
|
105431253 |
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Mar 2016 |
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CN |
|
105829016 |
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Aug 2016 |
|
CN |
|
3 062 956 |
|
Sep 2019 |
|
EP |
|
2002-224881 |
|
Aug 2002 |
|
JP |
|
2006-181636 |
|
Jul 2006 |
|
JP |
|
2006-181637 |
|
Jul 2006 |
|
JP |
|
2006-212660 |
|
Aug 2006 |
|
JP |
|
2008-030105 |
|
Feb 2008 |
|
JP |
|
2013-049088 |
|
Mar 2013 |
|
JP |
|
2013-126671 |
|
Jun 2013 |
|
JP |
|
2013-237088 |
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Nov 2013 |
|
JP |
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2013-237089 |
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Nov 2013 |
|
JP |
|
2013-237091 |
|
Nov 2013 |
|
JP |
|
2014-069227 |
|
Apr 2014 |
|
JP |
|
2014-087814 |
|
May 2014 |
|
JP |
|
2015-020181 |
|
Feb 2015 |
|
JP |
|
2015-020182 |
|
Feb 2015 |
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JP |
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2015-098052 |
|
May 2015 |
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JP |
|
5807733 |
|
Nov 2015 |
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JP |
|
2016-500578 |
|
Jan 2016 |
|
JP |
|
2016-026882 |
|
Feb 2016 |
|
JP |
|
2016-068105 |
|
May 2016 |
|
JP |
|
2016-179496 |
|
Oct 2016 |
|
JP |
|
2016-537206 |
|
Dec 2016 |
|
JP |
|
6322881 |
|
May 2018 |
|
JP |
|
2018-136678 |
|
Aug 2018 |
|
JP |
|
2018-167310 |
|
Nov 2018 |
|
JP |
|
2020-011286 |
|
Jan 2020 |
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JP |
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10-2016-0078379 |
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Jul 2016 |
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KR |
|
WO 03/020468 |
|
Mar 2003 |
|
WO |
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WO 2007/029589 |
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Mar 2007 |
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WO |
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WO 2010/113833 |
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Oct 2010 |
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WO |
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WO 2014/168027 |
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Oct 2014 |
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WO |
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WO 2015/66155 |
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May 2015 |
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WO |
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Other References
English machine translation of CN 1712175, EPO, accessed Aug. 25,
2021. cited by examiner .
International Search Report for International Application No.
PCT/JP2019/046947 dated Mar. 3, 2020. cited by applicant .
International Preliminary Report on Patentability (Chapter II) for
International Application No. PCT/JP2019/046947 dated Jul. 13,
2020. cited by applicant .
International Search Report and Written Opinion for International
Application No. PCT/JP2019/020855 dated Aug. 27, 2019. cited by
applicant .
International Search Report and Written Opinion for International
Application No. PCT/JP2019/020798 dated Aug. 27, 2019. cited by
applicant .
International Search Report and Written Opinion for International
Application No. PCT/JP2019/041397 dated Jan. 21, 2020. cited by
applicant .
International Preliminary Report on Patentability for International
Application No. PCT/JP2019/041397 dated Apr. 27, 2021. cited by
applicant .
Office Action for U.S. Appl. No. 17/261,558 dated Jun. 9, 2021 and
claims pending as of Jun. 9, 2021. cited by applicant .
Hasnine et al., Effect of Ge addition on wettability, copper
dissolution, microstructural and mechanical behavior of SnCu--Ge
solder alloy. J Mater Sci: Mater Electron. Jul. 17,
2017;28:16106-19. doi: 10.1007/s10854-017-7511-4. cited by
applicant .
Yamasumi, Examination of sample pretreatment method for
quantification of added impurity elements in lead-free solder by
ICP-AES. The Japan Society for Analytical Chemistry. Proceedings of
the 50th Annual Meeting. Nov. 9, 2011:6. 3 pages. cited by
applicant .
International Search Report and Written Opinion for International
Application No. PCT/JP2018/042943, dated Feb. 19, 2019. cited by
applicant .
International Preliminary Report on Patentability for International
Application No. PCT/JP2018/042943, dated Jun. 4, 2020. cited by
applicant .
[No Author Listed] JIS Z 3282:2017 (JWES/JSA) Soft
solders--Chemical compositions and forms. Japanese Industrial
Standard. 2017. 36 pages. cited by applicant .
[No Author Listed] Tin metal JIS H 2108-1996. Japanese Industrial
Standard. Nov. 20, 1996, revised Feb. 20, 2009. 7 pages. cited by
applicant .
Office Action for U.S. Appl. No. 17/261,557 dated Nov. 5, 2021 and
claims pending as of Nov. 5, 2021. cited by applicant .
Office Action for U.S. Appl. No. 17/261,558 dated Sep. 27, 2021 and
claims pending as of Sep. 27, 2021. cited by applicant .
[No Author Listed], RoHS-Richtlinien. Wikipedia. Oct. 6, 2021.
https://de.wikipedia.org/w/index.php?tile=RoHS-Richtlinien&oldid=17368736-
9 [last accessed Oct. 3, 2021]. 11 pages. cited by applicant .
Office Action for U.S. Appl. No. 17/261,557 dated Aug. 9, 2021 and
claims pending as of Aug. 9, 2021. cited by applicant.
|
Primary Examiner: Wang; Xiaobei
Attorney, Agent or Firm: Wolf, Greenfield & Sacks,
P.C.
Claims
The invention claimed is:
1. A solder powder or solder ball comprising Sn or a Sn-containing
alloy and 40 to 320 ppm by mass of As, the solder powder or solder
ball including an As-enriched layer that is present at least in
part on a surface side of the solder powder or solder ball.
2. The solder powder or solder ball according to claim 1, further
comprising 20 ppm by mass to 3% by mass of Bi.
3. The solder powder or solder ball according to claim 1, further
comprising 20 ppm by mass to 0.5% by mass of Sb.
4. The solder powder or solder ball according to claim 1, further
comprising 20 ppm by mass to 0.7% by mass of Pb.
5. The solder powder or solder ball according to claim 1, further
comprising 0 to 3000 ppm by mass of Sb, 0 to 10000 ppm by mass of
Bi, and 0 to 5100 ppm by mass of Pb, wherein contents of Bi and Pb
are not simultaneously 0 ppm by mass.
6. The solder powder or solder ball according to claim 5, wherein
contents of As, Sb, Bi and Pb satisfy the following formulas (1)
and (2): 275.ltoreq.2As+Sb+Bi+Pb (1)
0.01.ltoreq.(2As+Sb)/(Bi+Pb).ltoreq.10.00 (2) wherein As, Sb, Bi
and Pb in the formulas (1) and (2) respectively represent contents
(in ppm by mass) of As, Sb, Bi and Pb in the solder powder or
solder ball.
7. The solder powder or solder ball according to claim 1, wherein
the Sn-containing alloy contains 0.005 to 40% by mass of Ag and/or
0.001 to 10% by mass of Cu.
8. The solder powder or solder ball according to claim 1, wherein
the Sn-containing alloy contains 0 to 4% by mass of Ag, 0 to 1% by
mass of Cu, 0 to 52% by mass of In, 0 to 0.15% by mass of Ni, 0 to
0.015% by mass of Co, and a balance of Sn.
9. The solder powder or solder ball according to claim 1, wherein
the solder powder or solder ball is in the form of a powder.
10. A solder paste comprising the solder powder according to claim
9 and a flux.
11. The solder paste according to claim 10, further comprising a
zirconium oxide powder.
12. The solder paste according to claim 11, wherein a content of
the zirconium oxide powder is 0.05 to 20.0% by mass with respect to
a total mass of the solder paste.
13. The solder powder or solder ball according to claim 1, formed
into a solder joint.
14. The solder powder or solder ball according to claim 7, wherein
the solder powder or solder ball is in the form of a powder.
15. A solder paste comprising the solder powder according to claim
14 and a flux.
16. The solder powder or solder ball according to claim 8, wherein
the solder powder or solder ball is in the form of a powder.
17. A solder paste comprising the solder powder according to claim
16 and a flux.
18. The solder powder or solder ball according to claim 7, formed
into a solder joint.
19. The solder powder or solder ball according to claim 8, formed
into a solder joint.
Description
CROSS-REFERENCE TO RELATED APPLICATIONS
This Application is a national stage filing under 35 U.S.C. 371 of
International Application Serial No. PCT/JP2018/042943, filed Nov.
21, 2018, which claims priority to Japanese application number
2018-136676, filed Jul. 20, 2018, Japanese application number
2018-136678, filed Jul. 20, 2018, Japanese application number
2018-136761, filed Jul. 20, 2018, Japanese application number
2018-136766, filed Jul. 20, 2018, and Japanese application number
2017-225677, filed Nov. 24, 2017, each of which is herein
incorporated by reference in their entirety.
TECHNICAL FIELD
The present invention relates to a solder material, a solder paste,
and a solder joint.
BACKGROUND ART
Fixation and electrical connection of electronic components in an
electronic device, such as packaging of electronic components on a
printed circuit board, is generally performed by soldering, which
is the most advantageous in terms of cost and reliability.
Solder materials generally contain Sn as a main component, and the
Sn reacts with oxygen in the air during or after production to form
a film of a Sn oxide on the surface thereof, which may cause
yellowing color change in some cases.
As a solder whose color change is suppressed, the following solder
material has been proposed: a solder material comprising a solder
layer composed of either a metal material containing an alloy
including Sn content of 40% or more, or a metal material including
Sn content of 100%; and a covering layer covering a surface of the
solder layer, the solder material being a sphere having a diameter
of 1 to 1000 .mu.m, wherein the covering layer includes a SnO film
which is formed outside the solder layer and a SnO.sub.2 film which
is formed outside the SnO film, and a thickness of the covering
layer is more than 0 nm and equal to or less than 4.5 nm (Patent
Literature 1). In the solder of Patent Literature 1, since the
SnO.sub.2 film is formed, the yellowing color change of the surface
of the solder is inhibited.
For the solder of Patent Literature 1, however, it is necessary to
perform plasma exposure in a high energy state for forming the
SnO.sub.2 film, which makes production process complicated.
As another method for improving the color change of a solder
material, adding an element such as P, Ge or Ga to a solder
material is known. Such an element has lower standard free energy
of formation of an oxide than Sn, and is very easily oxidized.
Therefore, in forming a solder material such as a solder powder or
a solder ball from a molten solder, not Sn but the element such as
P, Ge or Ga is oxidized to be concentrated on the surface, and
thus, the yellowing color change of the surface of the solder can
be inhibited. However, a solder material is generally required to
have a property of spreading on a metal of an electronic component
(wettability) when molten, and when the element such as P, Ge or Ga
is added, the wettability of the solder material is degraded. Poor
wettability of a solder material causes soldering failure.
Besides, in bonding/assembling electronic components onto a
substrate of an electronic device, soldering using a solder paste
is advantageous in terms of cost and reliability as compared with
the other type of soldering, and is most commonly employed. A
solder paste is a mixture in the form of a paste obtained by
kneading a solder material (solder powder) together with a flux
containing components other than the solder material, such as
rosin, an activator, a thixotropic agent and a solvent.
A solder paste is applied onto a substrate by, for example, screen
printing using a metal mask. Therefore, in order to ensure
printability of a solder paste, the solder paste needs to have an
appropriate viscosity. A solder paste is, however, poor in storage
stability in general, and the viscosity of the solder paste may
increase with time.
In addition, when a difference (.DELTA.T=T.sub.L-T.sub.S) between a
liquidus temperature (T.sub.L) and a solidus temperature (T.sub.S)
of a solder material contained in a solder paste is large, the
structure of the solder material becomes easily uneven when the
solder paste is solidified after application onto a substrate of an
electronic device, which can be a cause of degradation of the
reliability in the future.
As a solder material containing Bi, a solder alloy powder for
forming a bump, having a composition containing 2.8 to 4.2% by
weight of Ag, 0.4 to 0.6% by weight of Cu, 50 to 1000 ppm of Bi,
and a balance of Sn and an incidental impurity has been proposed,
for example (Patent Literature 2).
As a solder material containing Sb, a solder alloy powder for
forming a bump, having a composition containing 2.8 to 4.2% by
weight of Ag, 0.4 to 0.6% by weight of Cu, 50 to 3000 ppm of Sb,
and a balance of Sn and an incidental impurity has been proposed,
for example (Patent Literature 3).
As a solder material containing Pb, a solder alloy powder for
forming a bump, having a composition containing 2.8 to 4.2% by
weight of Ag, 0.4 to 0.6% by weight of Cu, 50 to 5000 ppm of pb,
and a balance of Sn and an incidental impurity has been proposed,
for example (Patent Literature 4).
However, all the solder materials described in Patent Literatures 2
to 4 aim to inhibit a projection caused in forming a bump, and do
not solve the problems of the color change and the viscosity
increase with time when in the form of a solder paste.
Thus, there is a demand for a solder material that is capable of
inhibiting the color change and the viscosity increase with time
when in the form of a solder paste, and that is excellent in
wettability and reliability.
CITATION LIST
Patent Literature
Patent Literature 1: Japanese Patent No. 5807733
Patent Literature 2: Japanese Patent Laid-Open No. 2013-237089
Patent Literature 3: Japanese Patent Laid-Open No. 2013-237091
Patent Literature 4: Japanese Patent Laid-Open No. 2013-237088
SUMMARY OF INVENTION
Technical Problem
An object of the present invention is to provide a solder material
that is minimally changed in color and increased in viscosity with
time when in the form of a paste, and is excellent in wettability
and reliability.
Solution to Problem
As a result of earnest studies for solving the above-described
problems, the present inventors have found that a solder material
having an As-enriched layer on a surface side is minimally changed
in color and changed in viscosity with time when in the form of a
paste, and that although a solder material containing As tends to
have lower wettability in general, such lowering of the wettability
is not caused when the As-enriched layer is formed on the surface.
Thus, the present inventors have found that the above-described
problems can be solved by using such a material, and thus, the
present invention has been accomplished.
Specifically, specific aspects of the present invention are as
follows.
It is noted that a numerical range expressed with "to" herein means
that the range includes numerical values on both sides of "to". A
content of each element can be measured, for example, by ICP-AES
analysis performed in accordance with JIS Z 3910.
[1] A solder material, comprising Sn or a Sn-containing alloy and
40 to 320 ppm by mass of As, the solder material including an
As-enriched layer.
[2] The solder material according to [1] described above, further
comprising 20 ppm by mass to 3% by mass of Bi.
[3] The solder material according to [1] described above, further
comprising 20 ppm by mass to 0.5% by mass of Sb.
[4] The solder material according to [1] described above, further
comprising 20 ppm by mass to 0.7% by mass of Pb.
[5] The solder material according to [1] described above, further
comprising 0 to 3000 ppm by mass of Sb, 0 to 10000 ppm by mass of
Bi, and 0 to 5100 ppm by mass of Pb, wherein contents of Bi and Pb
are not simultaneously 0 ppm by mass.
[6] The solder material according to [5] described above, wherein
contents of As, Sb, Bi and Pb satisfy the following formulas (1)
and (2): 275.ltoreq.2As+Sb+Bi+Pb (1)
0.01.ltoreq.(2As+Sb)/(Bi+Pb).ltoreq.10.00 (2)
wherein As, Sb, Bi and Pb in the formulas (1) and (2) respectively
represent contents (in ppm by mass) of As, Sb, Bi and Pb in the
solder material.
[7] The solder material according to any one of [1] to [6]
described above, wherein the Sn or Sn-containing alloy is a
Sn-containing alloy containing 0.005 to 40% by mass of Ag and/or
0.001 to 10% by mass of Cu.
[8] The solder material according to any one of [1] to [7]
described above, wherein the Sn or Sn-containing alloy contains 0
to 4% by mass of Ag, 0 to 1% by mass of Cu, 0 to 52% by mass of In,
0 to 0.15% by mass of Ni, 0 to 0.015% by mass of Co, and a balance
of Sn.
[9] The solder material according to any one of [1] to [8]
described above, wherein the solder material is in the form of a
powder.
[10] A solder paste comprising the solder material according to [9]
described above and a flux.
[11] The solder paste according to [10] described above, further
comprising a zirconium oxide powder.
[12] The solder paste according to [11] described above, wherein a
content of the zirconium oxide powder is 0.05 to 20.0% by mass with
respect to a total mass of the solder paste.
[13] The solder material according to any one of [1] to [8]
described above, serving as a solder joint.
Advantageous Effects of Invention
According to the present invention, a solder material that is
minimally changed in color, is good in wettability, has high
reliability in cycle characteristics and the like, and is minimally
increased in viscosity with time when in a solder paste can be
provided.
BRIEF DESCRIPTION OF DRAWINGS
FIG. 1 is an example of an XPS analysis chart of a surface of a
solder material.
FIG. 2 is another example of the XPS analysis chart of the surface
of the solder material.
FIG. 3 is still another example of the XPS analysis chart of the
surface of the solder material.
DESCRIPTION OF EMBODIMENT
Now, an embodiment for practicing the present invention
(hereinafter referred to as the "present embodiment") will be
described.
The present invention is not limited to the following embodiment
but can be variously modified within the spirit and scope
thereof.
In the present embodiment, a solder material contains at least Sn
or a Sn-containing alloy and 40 to 320 ppm by mass of As.
Here, the purity of Sn is not especially limited, and for example,
those having a purity of 3N (99.9% or more), 4N (99.99% or more) or
5N (99.999% or more) generally used in the art can be used.
Examples of the Sn-containing alloy include a Sn--Ag alloy, a
Sn--Cu alloy, a Sn--Ag--Cu alloy, a Sn--Ag--Cu--Ni--Co alloy, a
Sn--In alloy, and alloys obtained by further adding, to any of
these alloys, Ag, Cu, In, Ni, Co, Ge, P, Fe, Zn, Al, Ga or the
like. A content of Sn in the Sn-containing alloy is not especially
limited, and can be, for example, over 40% by mass.
The Sn and the Sn-containing alloy may contain an incidental
impurity.
In the present embodiment, in view of physical properties of the
solder material, such as solder wettability and a melting point,
the Sn-containing alloy preferably contains 0.005 to 40% by mass of
Ag and/or 0.001 to 10% by mass of Cu, and the balance of Sn.
In this case, in view of .DELTA.T, a content of Ag with respect to
the total mass of the solder material is preferably 4% by mass or
less. When the content of Ag is over 3.8% by mass, .DELTA.T tends
to largely increase. The content of Ag with respect to the total
mass of the solder material is more preferably 0.1 to 3.8% by mass,
and most preferably 0.5 to 3.5% by mass.
Besides, in view of .DELTA.T, a content of Cu with respect to the
total mass of the solder material is preferably 1.0% by mass or
less. When the content of Cu is over 0.9% by mass, .DELTA.T tends
to largely increase. The content of Cu with respect to the total
mass of the solder material is more preferably 0.05 to 0.9% by
mass, and most preferably 0.1 to 0.7% by mass.
The preferable numerical ranges of the contents of Ag and Cu are
independent of each other, and the contents of Ag and Cu can be
each independently determined.
Alternatively, the Sn-containing alloy preferably contains 0 to 4%
by mass of Ag, 0 to 1% by mass of Cu, 0 to 52% by mass of In, 0 to
0.15% by mass of Ni, 0 to 0.015% by mass of Co, and the balance of
Sn. In this case, the content of Ag with respect to the total mass
of the solder material is preferably 0 to 4% by mass, more
preferably 1 to 4% by mass, and most preferably 1 to 3% by mass.
The content of Cu with respect to the total mass of the solder
material is preferably 0 to 1% by mass, more preferably 0.3 to
0.75% by mass, and most preferably 0.5 to 0.7% by mass.
The content of In with respect to the total mass of the solder
material is preferably 0 to 52% by mass, and more preferably 0 to
10% by mass or 40 to 52% by mass.
The preferable numerical ranges of the contents of these elements
are independent of one another, or the contents of these elements
can be each independently determined.
In the present embodiment, the content of As with respect to the
total mass of the solder material is 40 to 320 ppm by mass (0.0040
to 0.0320% by mass).
A preferable content of As is varied depending on the composition
of the solder material, and when the solder material contains
merely Sn or a Sn-containing alloy and As, the content of As is
more preferably 70 to 320 ppm by mass, and further preferably 70 to
200 ppm by mass.
Alternatively, when the solder material contains one or more
elements selected from Bi, Sb and Pb, the content of As is
preferably 40 to 250 ppm by mass, more preferably 50 to 150 ppm by
mass, and further preferably 50 to 100 ppm by mass.
In either case, however, when the content of As is less than 40 ppm
by mass, it is extremely difficult to form an As-enriched
layer.
As long as an As-enriched layer is present in the solder material
with a content of As of 40 to 320 ppm by mass with respect to the
total mass of the solder material, a part or the whole of As may
constitute an alloy (such as an intermetallic compound or a solid
solution) together with Sn or the Sn-containing alloy, or may be
present, separately from the Sn-containing alloy, in the form of,
for example, simple As or an oxide thereof.
In the present embodiment, the solder material may contain merely
Sn or a Sn-containing alloy, and 40 to 320 ppm by mass of As, and
preferably further contains one or more elements selected from Bi,
Sb and Pb.
When Bi is contained, a content of Bi with respect to the total
mass of the solder material is preferably 20 ppm by mass to 3% by
mass (0.002 to 3% by mass). It has been found that adequate
presence of Bi tends to inhibit viscosity increase. Although the
reason is not clear, it is presumed that since Bi is noble to Sn, a
Sn--Bi alloy is more difficult to be ionized than Sn, and hence is
difficult to elute into a flux in an ionized state (as a salt).
However, the mechanism is not limited to this. On the other hand,
when the content of Bi is too high, a difference
(.DELTA.T=T.sub.L-T.sub.S) between a liquidus temperature (T.sub.L)
and a solidus temperature (T.sub.S) is large, and hence it is
apprehended that reliability in cycle characteristics and the like
may be degraded. In view of these, the content of Bi with respect
to the total mass of the solder material is preferably 0.005 to
2.5% by mass, and further preferably 0.01 to 1% by mass.
As long as the content of Bi with respect to the total mass of the
solder material is 20 ppm by mass to 3% by mass, the whole of Bi
may constitute an alloy (such as an intermetallic compound or a
solid solution) together with Sn or a Sn-containing alloy, or a
part of Bi may be present separately from the Sn-containing
alloy.
When Sb is contained, a content of Sb with respect to the total
mass of the solder material is preferably 20 ppm by mass to 0.5% by
mass (0.002 to 0.5% by mass). It has been found that adequate
presence of Sb tends to inhibit the viscosity increase. Although
the reason is not clear, it is presumed that since Sb is noble to
Sn, a Sn--Sb alloy is more difficult to be ionized than Sn, and
hence is difficult to elute into a flux in an ionized state (as a
salt). However, the mechanism is not limited to this. On the other
hand, when the content of Sb is too high, it is apprehended that
the wettability may be degraded. In view of these, the content of
Sb with respect to the total mass of the solder material is more
preferably 0.005 to 0.3% by mass, and further preferably 0.01 to
0.1% by mass.
As long as the content of Sb with respect to the total mass of the
solder material is 20 ppm by mass to 0.5% by mass, the whole of Sb
may constitute an alloy (such as an intermetallic compound or a
solid solution) together with Sn or a Sn-containing alloy, or a
part of Sb may be present separately from the Sn-containing
alloy.
When Pb is contained, a content of Pb with respect to the total
mass of the solder material is preferably 20 ppm by mass to 0.7% by
mass (0.002 to 0.7% by mass). It has been found that adequate
presence of Pb tends to inhibit the viscosity increase. Although
the reason is not clear, it is presumed that since Pb is noble to
Sn, a Sn--Pb alloy is more difficult to be ionized than Sn, and
hence is difficult to elute into a flux in an ionized state (as a
salt). However, the mechanism is not limited to this. On the other
hand, when the content of Pb is too high, the difference
(.DELTA.T=T.sub.L-T.sub.S) between the liquidus temperature
(T.sub.L) and the solidus temperature (T.sub.S) is large, and hence
it is apprehended that reliability in cycle characteristics and the
like may be degraded. In view of these, the content of Pb with
respect to the total mass of the solder material is more preferably
0.005 to 0.7% by mass, and further preferably 0.01 to 0.5% by
mass.
As long as the content of Pb with respect to the total mass of the
solder material is 20 ppm by mass to 0.7% by mass, the whole of Pb
may constitute an alloy (such as an intermetallic compound or a
solid solution) together with Sn or a Sn-containing alloy, or a
part of Pb may be present separately from the Sn-containing
alloy.
When two or more elements out of Bi, Sb and Pb are contained, it is
preferable that the contents of Sb be 0 to 3000 ppm by mass, of Bi
be 0 to 10000 ppm by mass, and of Pb be 0 to 5100 ppm by mass, with
respect to the total mass of the solder material.
It has been found that adequate presence of Sb, Bi or Pb tends to
inhibit the viscosity increase. Although the reason is not clear,
it is presumed that since these elements are noble to Sn, a
Sn--Sb/Bi/Pb alloy is more difficult to be ionized than Sn, and
hence is difficult to elute into a flux in an ionized state (as a
salt). However, the mechanism is not limited to this. Particularly,
Bi and Pb tend to inhibit wettability degradation otherwise caused
when the solder material contains As.
On the other hand, when the contents of Sb, Bi and Pb are too high,
the solidus temperature is lowered to increase the difference
(.DELTA.T=T.sub.L-T.sub.S) between the liquidus temperature
(T.sub.L) and the solidus temperature (T.sub.S). Therefore, in a
solidification process of a molten solder, a high-melting point
crystalline phase having low contents of Bi and Pb deposits
priorly, and thereafter, a low-melting point crystalline phase
having high concentrations of Bi and Pb segregates. As a result,
mechanical strength and the like of the solder material are
degraded, which may degrade the reliability in cycle
characteristics and the like. Particularly, since a crystalline
phase having a high concentration of Bi is hard and fragile, it is
apprehended that the reliability may be greatly degraded when such
a phase segregates in the solder material.
In view of these, when two or more elements out of Bi, Sb and Pb
are contained, preferable ranges of the contents of Sb, Bi and Pb
are as follows.
The lower limit of the Sb content is preferably 25 ppm by mass or
more, more preferably 50 ppm by mass or more, further preferably
100 ppm by mass or more, and particularly preferably 300 ppm by
mass or more. The upper limit of the Sb content is preferably 1150
ppm by mass or less, and more preferably 500 ppm by mass or
less.
The lower limit of the Bi content is preferably 25 ppm by mass or
more, more preferably 50 ppm by mass or more, further preferably 75
ppm by mass or more, particularly preferably 100 ppm by mass or
more, and most preferably 250 ppm by mass or more. The upper limit
of the Bi content is preferably 1000 ppm by mass or less, more
preferably 600 ppm by mass or less, and further preferably 500 ppm
by mass or less.
The lower limit of the Pb content is preferably 25 ppm by mass or
more, more preferably 50 ppm by mass or more, further preferably 75
ppm by mass or more, particularly preferably 100 ppm by mass or
more, and most preferably 250 ppm by mass or more. The upper limit
of the Pb content is preferably 5000 ppm by mass or less, more
preferably 1000 ppm by mass or less, further preferably 850 ppm by
mass or less, and particularly preferably 500 ppm by mass or
less.
As long as the contents of Sb, Bi and Pb with respect to the total
mass of the solder material satisfy the aforementioned conditions,
the whole of these may constitute an alloy (such as an
intermetallic compound or a solid solution) together with Sn or a
Sn-containing alloy, or a part of these may be present separately
from the Sn-containing alloy.
When the solder material of the present embodiment contains two or
more elements out of Bi, Sb and Pb, the contents of As, Sb, Bi and
Pb preferably satisfy the following formula (1):
275.ltoreq.2As+Sb+Bi+Pb (1)
In the formula (1), As, Sb, Bi and Pb respectively represent
contents (in ppm by mass) of As, Sb, Bi and Pb in the solder
material.
As, Sb, Bi and Pb are all elements having the effect of inhibiting
the viscosity increase when the solder material is in the form of a
paste (viscosity increase inhibitory effect), and therefore, in
view of inhibition of viscosity increase, a total contents of these
is preferably 275 ppm or more. In the formula (1), the As content
is doubled because As has a high viscosity increase inhibitory
effect as compared with Sb, Bi and Pb.
2As+Sb+Bi+Pb is preferably 350 or more, and more preferably 1200 or
more. On the other hand, there is no upper limit in 2As+Sb+Bi+Pb,
but in view of setting .DELTA.T in a suitable range, the upper
limit is 18600 or less, preferably 10200 or less, further
preferably 5300 or less, and particularly preferably 3800 or
less.
The upper limits and the lower limits appropriately selected from
the aforementioned preferable aspects are represented as the
following formulas (1a) and (1b):
275.ltoreq.2As+Sb+Bi+Pb.ltoreq.18600 (1a)
275.ltoreq.2As+Sb+Bi+Pb.ltoreq.5300 (1b)
In the formulas (1a) and (1b), As, Sb, Bi and Pb respectively
represent the contents (in ppm by mass) of As, Ab, Bi and Pb in the
solder material.
In the present embodiment, the contents of As, Sb, Bi and Pb
preferably satisfy the following formula (2):
0.01.ltoreq.(2As+Sb)/(Bi+Pb).ltoreq.10.00 (2)
In the formula (2), As, Sb, Bi and Pb respectively represent the
contents (in ppm by mass) of As, Sb, Bi and Pb in the solder
material.
In general, when the contents of As and Sb are high, the
wettability of the solder material tends to be degraded. On the
other hand, Bi and Pb tend to inhibit the degradation of the
wettability otherwise caused when As is contained. Accordingly,
either of Bi and Pb is preferably contained. When the contents of
Bi and Pb are too high, however, .DELTA.T is unavoidably increased,
and hence, it is necessary to strictly control these contents. In
particular, in an alloy composition simultaneously containing Bi
and Pb, .DELTA.T is easily increased, and when the wettability is
to be excessively improved by increasing the contents of Bi and Pb,
.DELTA.T is unavoidably increased. On the other hand, when the
viscosity increase inhibitory effect is to be improved by
increasing the contents of As and Sb, the wettability is
unavoidably degraded. However, these elements are divided into a
group of As and Sb and a group of Bi and Pb, and when the total
contents of the respective groups are set to satisfy the
relationship of the formula (2), the contents of the group of As
and Sb and the group of Bi and Pb are appropriately balanced, and
as a result, the viscosity increase inhibitory effect, reduction of
.DELTA.T and satisfactory wettability can be all simultaneously
attained.
When (2As+Sb)/(Bi+Pb) is less than 0.01, the total content of Bi
and Pb is relatively high to the total content of As and Pb, and
hence .DELTA.T is unavoidably increased. (2As+Sb)/(Bi+Pb) is
preferably 0.01 or more, more preferably 0.02 or more, further
preferably 0.41 or more, still further preferably 0.90 or more,
particularly preferably 1.00 or more, and most preferably 1.40 or
more. On the other hand, when (2As+Sb)/(Bi+Pb) is over 10.00, the
total content of As and Sb is relatively high to the total content
of Bi and Pb, and hence the wettability is unavoidably degraded.
(2As+Sb)/(Bi+Pb) is preferably 10.00 or less, more preferably 5.33
or less, further preferably 4.50 or less, still further preferably
4.18 or less, particularly preferably 2.67 or less, and most
preferably 2.30 or less.
Since a denominator of the formula (2) is "Bi+Pb", at least one of
Bi and Pb is always contained when the formula (2) is satisfied. As
described above, Bi and Pb tend to inhibit the degradation of the
wettability otherwise caused when As is contained, and therefore,
at least one of these is preferably contained.
The upper limit and the lower limit appropriately selected from the
aforementioned preferable aspects are represented by the following
formula (2a): 0.31.ltoreq.(2As+Sb)/(Bi+Pb).ltoreq.10.00 (2a)
In the formula (2a), As, Sb, Bi and Pb respectively represent the
contents (in ppm by mass) of As, Sb, Bi and Pb in the solder
material.
When the solder material of the present embodiment contains two or
more elements out of Bi, Sb and Pb, the contents of As, Sb, Bi and
Pb satisfy preferably at least one of, and more preferably both of
the formulas (1) and (2) described above.
In the present embodiment, the solder material includes an
As-enriched layer in at least a part thereof. Here, an As-enriched
layer refers to a region where an As concentration is higher than
an average As concentration (a content of As with respect to the
total mass of the solder material) in the solder material, and
specifically, the presence of such a region can be checked in
accordance with the criterion described below.
The As-enriched layer is preferably present at least in a part on
the surface side of the solder material, and preferably covers the
whole surface.
(Criterion)
A sample with a size of 5.0 mm.times.5.0 mm is prepared (when the
solder material is not in a plate shape, the solder material (a
solder powder, a solder ball or the like) are put in an area of 5.0
mm.times.5.0 mm without any gap to prepare a sample), and an
arbitrary area of 700 .mu.m.times.300 .mu.m is selected therein and
subjected to XPS analysis involving ion sputtering. One area is
selected in each sample, and the analysis is performed once in each
of three samples, namely, three times in total. When magnitude
relationship between S1 and S2 described later is the same in all
the analysis performed three times (when S1>S2 in all the
analysis performed three times in a case where an As-enriched layer
is present on the surface side), it is determined that an
As-enriched layer is formed.
Here, S1, S2 and D1 are defined as follows:
S1: an integral value of the detected intensity of As in an area
having a depth in terms of SiO.sub.2 of 0 to 2.times.D1 (nm) in a
chart obtained by the XPS analysis of the sample
S2: an integral value of the detected intensity of As in an area
having a depth in terms of SiO.sub.2 of 2.times.D1 to 4.times.D1
(nm) in the chart obtained by the XPS analysis of the sample
D1: a first depth (nm) in terms of SiO.sub.2 at which the detected
intensity of O atom is 1/2 of the maximum detected intensity
(intensity at Domax) in a portion deeper than a depth (Domax (nm))
in terms of SiO.sub.2 corresponding to the maximum detected
intensity of O atom in the chart obtained by the XPS analysis of
the sample (see FIG. 3)
Detailed conditions of the XPS analysis for this criterion follow
those described in "(1) Evaluation of Presence of As-enriched
Layer" described later.
In this criterion, it is assumed that D1 can be defined, namely,
the detected intensity of O atom has a maximum value in the XPS
analysis chart. When D1 cannot be defined (for example, when the
detected intensity of O atom is always constant), it is determined
that an As-enriched layer is not present.
The reason why the problems such as the color change, the
wettability and the viscosity increase caused when in the form of a
solder paste can be overcome by the presence of an As-enriched
layer is not clear, but is presumed as follows. The viscosity
increase is probably caused because a salt or an aggregate of the
solder material is formed through a reaction between Sn or a Sn
oxide and various additives such as an activator contained in the
solder paste (flux). When an As-enriched layer is present on the
surface of the solder material, the As-enriched layer is disposed
between the solder alloy and the flux, and hence the aforementioned
reaction is difficult to occur. However, the mechanism is not
limited to this.
In the present embodiment, a thickness (in terms of SiO.sub.2) of
the As-enriched layer is not limited, and is preferably 0.5 to 8.0
nm, more preferably 0.5 to 4.0 nm, and most preferably 0.5 to 2.0
nm. Here, the thickness of the As-enriched layer corresponds to
2.times.D1.
When the thickness of the As-enriched layer falls in the
aforementioned range, the color change and the viscosity increase
caused with time when in the form of a solder paste can be
sufficiently inhibited without harmfully affecting the
wettability.
The solder material of the present embodiment has the As content
with respect to the total mass of the solder material falling in
the aforementioned range, and the solder material includes an
As-enriched layer. Therefore, the color change and the viscosity
increase caused with time when in the form of a solder paste can be
inhibited, and in addition, the wettability and the reliability are
excellent.
In the present embodiment, a yellowness index b* in the L*a*b*
color space of the solder material is preferably 0 to 10.0, more
preferably 3.0 to 5.7, and most preferably 3.0 to 5.0. When the
yellowness index b* in the L*a*b* color space of the solder
material falls in the aforementioned range, the yellowness index is
low and the solder has a metallic luster. Therefore, the solder can
be accurately detected in automatic process for image recognition
of the solder.
The yellowness index b* can be obtained from color values (L*, and
b*) obtained by measuring spectral transmittance, for example,
using CM-3500d2600d spectrophotometer (manufactured by Konica
Minolta, Inc.) with a D65 light source and 10-degree visual field
in accordance with JIS Z 8722 "Methods of color
measurement--Reflecting and transmitting objects".
A production method for the solder material of the present
embodiment is not limited, and the solder material can be produced
by melt mixing raw material metals.
A method for forming an As-enriched layer in the solder material is
not also limited. In an example of the method for forming an
As-enriched layer, the solder material is heated in an oxidation
atmosphere (an atmosphere of air or oxygen). A heating temperature
is not limited, and it can be, for example, 40 to 200.degree. C.,
and may be 50 to 80.degree. C. A heating time is also not limited,
and it can be, for example, several minutes to several days, and
preferably several minutes to several hours. In order to form an
adequate amount of an As-enriched layer, the heating time is
preferably 10 minutes or more, and further preferably 20 minutes or
more.
In the present embodiment, the shape of the solder material is not
especially limited, and may be a bar shape like a solder bar, a
wire shape, a solder ball, or a particulate shape like a solder
powder.
When the solder material is in a particulate shape, flowability of
the solder material is improved.
A method for producing the solder material in a particulate shape
is not limited, and any of known methods, such as a drop method in
which a particle is obtained by dropping the solder material in a
molten state, a spray method in which a particle is obtained by of
performing centrifugal spray, and a method in which the solder
material in a bulk state is crushed, can be employed. In the drop
method or the spray method, dropping or spraying is performed
preferably in an inert atmosphere or in a solvent for obtaining a
particulate shape.
In a case where the solder material is in the form of a powder, it
can be used in soldering onto a minute component when it has a size
(particle size distribution) corresponding to Nos. 1 to 8 of
particle size classification (Table 2) of JIS Z 3284-1: 2004. The
size of the solder material in a particulate shape is preferably a
size corresponding to Nos. 4 to 8, and more preferably a size
corresponding to Nos. 5 to 8.
When the solder material is in the form of a ball, an average ball
diameter is preferably 1 to 1000 .mu.m, more preferably 1 to 300
.mu.m, and most preferably 1 to 120 .mu.m. When the ball diameter
falls in this range, the solder material can be used in soldering
onto a minute component.
When the solder material is in the form of a ball, its sphericity
is preferably 0.90 or more, more preferably 0.95 or more, and most
preferably 0.99 or more.
Here, the average ball diameter and the sphericity of a solder ball
can be measured using a CNC image measurement system (such as Ultra
Quick Vision ULTRA QV 350-PRO manufactured by Mitutoyo Corporation)
employing a minimum zone circle method (MZC method). Specifically,
the "particle size" refers to an average of a major axis and a
minor axis of a bounding rectangle having the smallest area of a
particle among particles imaged using the image measurement system.
The "average particle size" refers to an average of particle sizes
measured for 500 particles arbitrarily extracted from an image
captured using the image measurement system. Besides, the
sphericity corresponds to a deviation from a true sphere, and is
obtained as an arithmetic mean of values each obtained by dividing
the particle size by the major axis of a bounding rectangle having
the smallest area for 500 balls arbitrarily extracted from an image
captured using the image measurement system. When this value is
closer to the upper limit of 1.00, the ball is more approximate to
a true sphere.
In the present embodiment, the form of the solder material when
used is not especially limited. For example, the solder material
may be mixed with a fat or oil to obtain a resin flux cored solder,
or when the solder material is in the form of a powder, the solder
material may be mixed with a flux containing a rosin-based resin,
an activator, a solvent or the like to use the resultant as a
solder paste or a solder ball. Since the solder material of the
present embodiment is small in the viscosity increase caused with
time when in the form of a solder paste, it is particularly
suitably used as a solder paste.
In the present embodiment, a solder paste contains a solder powder
of the present embodiment and a flux.
Here, the term "flux" refers to the whole components excluding the
solder powder contained in the solder paste, and a mass ratio
between the solder powder and the flux (solder powder:flux) is not
limited, and can be appropriately set in accordance with use.
In the present embodiment, the composition of the flux is not
limited, and the flux can contain, for example, a resin component;
a solvent; and various additives such as an activator, a
thixotropic agent, a pH adjuster, an antioxidant, a colorant and an
antifoaming agent in arbitrary ratios. The resin, the solvent and
the various additives are not limited, and those generally used in
a solder paste can be used. Specific preferable examples of the
activator include an organic acid, amine, and a halogen (such as an
organic halogen compound or amine hydrohalide).
In the present embodiment, the solder paste can further contain a
zirconium oxide powder. A content of the zirconium oxide powder
with respect to the total mass of the solder paste is preferably
0.05 to 20.0% by mass, more preferably 0.05 to 10.0% by mass, and
most preferably 0.1 to 3% by mass.
When the content of the zirconium oxide powder falls in the
aforementioned range, the activator contained in the flux
predominantly reacts with the zirconium oxide powder, and hence a
reaction with Sn or a Sn oxide present on the surface of the solder
powder is difficult to occur. Thus, the effect of further
inhibiting the viscosity increase otherwise caused with time is
exhibited.
There is no upper limit of the particle size of the zirconium oxide
powder added to the solder paste, but the particle size is
preferably 5 .mu.m or less. When the particle size is 5 .mu.m or
less, printability of the paste can be retained. Also, there is no
lower limit, but the particle size is preferably 0.5 .mu.m or more.
For obtaining the particle size, a SEM photograph of the zirconium
oxide powder is obtained to measure equivalent projected circle
diameters of respective particles present in a visual field by
image analysis, and an average of equivalent projected circle
diameters of 0.1 .mu.m or more is calculated to be defined as the
particle size.
The shape of the zirconium oxide particle is not especially
limited, and when the particle has an irregular shape, a contact
area with the flux is so large that the viscosity increase
inhibitory effect can be obtained. When the particle has a
spherical shape, good flowability can be obtained, and hence
excellent printability as a paste can be obtained. The shape may be
appropriately selected in accordance with desired properties.
In the present embodiment, the solder paste can be produced by
kneading the solder material (solder powder) of the present
embodiment and the flux by a known method.
The solder paste of the present embodiment can be used on, for
example, a fine circuit board of an electronic device, and
specifically, it can be applied onto a soldered portion by, for
example, a printing method using a metal mask, an ejecting method
using a dispenser, or a transferring method with a transfer pin to
perform reflow.
In the present embodiment, the solder material can be used as a
joint (connecting portion) connecting two or more members of
various types. Members to be connected are not limited, and the
solder material is useful as, for example, a joint between
electronic device members.
When the solder joint includes an As-enriched layer with a content
of As with respect to a total mass of the solder joint within the
aforementioned range, the solder joint is free from color change
and has excellent reliability.
In the present embodiment, the solder joint can be produced by a
method generally employed in the art, such as a method in which a
solder ball containing the solder material of the present
embodiment or the solder paste of the present embodiment is
disposed or applied on a portion to be connected, followed by
heating.
Now, the present invention will be more specifically described with
reference to examples, but the present invention is not limited to
contents described in the examples.
EXAMPLES
(Evaluation)
A solder material of each of examples and comparative examples was
subjected to three or four evaluations out of evaluations of (1)
presence of an As-enriched layer, (2) inhibition of viscosity
increase, (3) solder wettability, (4) reliability and (5)
inhibition of yellowing color change as described below.
(1) Evaluation of Presence of as-Enriched Layer
The presence of an As-enriched layer was evaluated by depth
direction analysis using XPS (X-ray Photoelectron Spectroscopy) as
follows:
(Analysis Conditions) Analyzer: micro area X-ray photoelectron
spectrometer (AXIS Nova manufactured by Kratos Analytical Ltd.)
Analysis Conditions: X-ray source: AlK.alpha. rays, X-ray gun
voltage: 15 kV, X-ray gun current: 10 mA, analysis area: 700
.mu.m.times.300 .mu.m Sputtering Conditions: ion species: Ar.sup.+,
acceleration voltage: 2 kV, sputtering rate: 0.5 nm/min (in terms
of SiO.sub.2) Sample: A solder material (a solder powder of each of
the examples and comparative examples) was put flat without any gap
on a stage covered with a carbon tape adhering thereto to obtain a
sample, and three such samples were prepared. Each sample had a
size of 5.0 mm.times.5.0 mm.
(Evaluation Procedures)
In each sample having a size of 5.0 mm.times.5.0 mm, an arbitrary
area of 700 .mu.m X 300 .mu.m was selected, and the XPS analysis
was performed for Sn, O and As atoms with ion sputtering performed,
so as to obtain an XPS analysis chart. One area was selected in
each sample, and the analysis was performed once on each of the
three samples, namely, three times in total.
Examples of the chart thus obtained by the XPS analysis are
illustrated in FIGS. 1 to 3. FIGS. 1 to 3 are obtained from the
same sample with a scale of the detected intensity (cps) indicated
on the ordinate changed, and the abscissa indicates a depth (nm) in
terms of SiO.sub.2 calculated based on sputtering time. In an XPS
analysis chart, the ordinate indicates the detected intensity
(cps), and as the abscissa, either one of the sputtering time (min)
and the depth (nm) in terms of SiO.sub.2 calculated based on the
sputtering time by using a sputter etching rate of a SiO.sub.2
standard sample can be selected. In FIGS. 1 to 3, the abscissa of
the XPS analysis chart is set to indicate the depth (nm) in terms
of SiO.sub.2 calculated based on the sputtering time by using a
sputter etching rate of a SiO.sub.2 standard sample.
In the XPS analysis chart of each sample, a depth in terms of
SiO.sub.2 at which the detected intensity of O atom was maximum was
defined as Domax (nm) (see FIG. 2). In addition, a first depth in
terms of SiO.sub.2 at which the detected intensity of O atom is 1/2
of the maximum detected intensity (intensity at Domax) in a portion
deeper than Domax was defined as D1 (nm).
Next, in the XPS analysis chart of each sample, an integral value
(S1) of the detected intensity of As in a region from the outermost
surface down to a depth 2.times.D1 (a region having a depth in
terms of SiO.sub.2 of 0 to 2.times.D1 (nm)), and an integral value
(S2) of the detected intensity of As in a region from the depth
2.times.D1 to a portion further deeper by 2.times.D1 (a region
having a depth in terms of SiO.sub.2 of 2.times.D1 to 4.times.D1
(nm)) (see FIG. 3) were obtained, and these integral values were
compared.
Then, the evaluation was performed based on the following criteria:
S1>S2 in all the measurement performed three times: As-enriched
layer is formed therein (.largecircle.) S1>S2 twice or less in
all the measurement performed three times: As-enriched layer is not
formed therein (x)
(2) Evaluation of Inhibition of Viscosity Increase
Respective materials of a composition shown in Table 1 below were
stirred under heating, and the resultant was cooled to prepare a
flux. The thus prepared flux and the solder powder of each of the
examples and comparative examples were kneaded in a mass ratio
between the flux and the solder powder (flux:solder powder) of
11:89 to produce a solder paste.
TABLE-US-00001 TABLE 1 Mixing Ratio Flux Material (mass %) Rosin 42
Glycolic Solvent 35 Thixotropic Agent 8 Organic Acid 10 Amine 2
Halogen 3 Total 100
For the solder paste thus obtained, the viscosity was continuously
measured for 12 hours using a rotational viscometer (PCU-205,
manufactured by Malcom Co., Ltd.) at a rotational speed of 10 rpm
and a measurement temperature of 25.degree. C. in accordance with a
method described in JIS Z 3284-3 "4.2 Test Method for Viscosity".
Then, an initial viscosity (viscosity obtained after stirring for
30 minutes) and a viscosity obtained after 12 hours were compared
with each other to evaluate the viscosity increase inhibitory
effect based on the following criteria:
Viscosity after 12 hours.ltoreq.Initial Viscosity.times.1.2: good
because viscosity increase with time is small (.largecircle.)
Viscosity after 12 hours>Initial Viscosity.times.1.2: poor
because viscosity increase with time is large (x)
(3) Evaluation of Solder Wettability
A solder paste was produced by using the solder powder of each of
the examples and comparative examples in the same manner as
described in "(2) Evaluation of Inhibition of viscosity increase"
above.
The thus obtained solder paste was printed on a Cu plate by using a
metal mask having an opening diameter of 6.5 mm, including 4
openings, and having a mask thickness of 0.2 mm, the resultant was
heated in a reflow furnace under a N.sub.2 atmosphere at a
temperature increasing rate of 1.degree. C./sec from 25.degree. C.
to 260.degree. C., and the resultant was air-cooled to room
temperature (25.degree. C.). Thus, four solder bumps were formed.
The appearances of the obtained solder bumps were observed with an
optical microscope (magnification: 100 times) to perform the
evaluation based on the following criteria:
Solder particles not sufficiently molten are observed in none of
the four solder bumps: good solder wettability (.largecircle.)
Solder particles not sufficiently molten are observed one or more
of the four solder bumps: poor solder wettability (x)
(4) Evaluation of Reliability
The solder powder of each of the examples and comparative examples
was measured for a liquidus temperature (T.sub.L) and a solidus
temperature (T.sub.S) by DSC measurement using a differential
scanning calorimeter (EXSTAR DSC7020, manufactured by SII Nano
Technology Inc.) under measurement conditions of a temperature
increasing rate of 5.degree. C./min (180.degree. C. to
250.degree.), a temperature decreasing rate of -3.degree. C./min
(250.degree. C. to 150.degree. C.) and a carrier gas of N.sub.2.
Then, a difference (.DELTA.T=T.sub.L-T.sub.S) between the liquidus
temperature (T.sub.L) and the solidus temperature (T.sub.S) was
calculated to perform the evaluation based on the following
criteria:
.DELTA.T is 10.degree. C. or less: excellent reliability
(.largecircle.)
.DELTA.T is over 10.degree. C.: poor reliability (x)
In a case where the difference (.DELTA.T=T.sub.L-T.sub.S) between
the liquidus temperature (T.sub.L) and the solidus temperature
(T.sub.S) of a solder powder is large, a structure having a high
melting point easily deposits on the surface of the solder powder
when a solder paste containing the solder powder is solidified
after application onto a substrate of an electronic device. When a
structure having a high melting point deposits on the surface of
the solder powder, a structure having a lower melting point
successively deposits toward the inside of the solder powder, and
as a result, the structure of the solder powder easily becomes
ununiform. This can be a cause of degrading reliability in the
cycle characteristics and the like.
(5) Evaluation of Inhibition of Yellowing Color Change
A constant temperature bath placed in an air atmosphere was heated
to 200.degree. C., and a solder ball (ball diameter: 0.3 mm)
according to each of Examples 1 to 44 and comparative examples 1 to
40 was heated in the constant temperature bath for 2 hours. Before
and after the heating, the solder ball was measured for a
yellowness index b* in the L*a*b* color space, and an increment
(.DELTA.b*) obtained by subtracting a b* value before the heating
from a b* value after the heating was calculated. Sn--In-containing
solders of Examples 38 to 44 and Comparative Examples 35 to 40
have, however, a melting point of 200.degree. C. or less, and hence
were heated for 20 days in a constant temperature bath heated to
100.degree. C. to perform similar measurement and calculation.
The yellowness index b* was obtained from color values (L*, and b*)
obtained by measuring spectral transmittance using CM-3500d2600d
spectrophotometer (manufactured by Konica Minolta, Inc.) with a D65
light source and 10-degree visual field in accordance with JIS Z
8722 "Methods of color measurement--Reflecting and transmitting
objects". It is noted that the color values (L*, *a and b*) are
defined in JIS Z 8729 "Color Specification--Color Values of L*a*b*
Color Space and L*U*V* Color Space".
The increment of the solder ball of each metal composition was
compared with the increment .DELTA.b* (.DELTA.b* (standard)) of the
solder ball of Comparative Example 1, 7, 13, 19, 25, 27, 33 or 35
containing no As to perform the evaluation based on the following
criteria:
The value .DELTA.b* is 50% or less of .DELTA.b* (standard):
.largecircle..largecircle. (very good)
The value .DELTA.b* is over 50% and 70% or less of .DELTA.b*
(standard): .largecircle. (good)
The value .DELTA.b* is more than 70% of .DELTA.b* (standard): x
(bad)
1. Sn--As-Containing Solder
Examples 1 to 7 and Comparative Examples 1 to 6
Sn and As were weighed to satisfy the contents shown in Table 2
below, and melt mixed to prepare metal solder materials of Examples
1 to 7 and Comparative Examples 1 to 6. Each of the metal solder
materials of Examples 1 to 7 and Comparative Examples 1 to 6 thus
prepared was used to produce a solder ball (ball diameter: 0.3 mm)
by the drop method. Each of the thus obtained solder balls of
Examples 1 to 7 and Comparative Examples 1 to 6 was heated with a
drying apparatus in the air at 60.degree. C. for 30 minutes to
concentrate As on a surface side of the solder ball.
The content of each component shown in tables below indicates mass
percentage of the component with respect to the total mass of the
metal solder material. Contents of elements excluding Sn are the
amounts actually weighed for mixing, and the content of Sn is an
amount mixed as the balance to make the sum 100% by mass. In each
of Tables 2 to 7 below, Sn used in each metal solder material is a
3N material, and contains an incidental impurity.
Each of the solder balls of Examples 1 to 7 and Comparative
Examples 1 to 6 was subjected to the evaluations of (1) the
presence of an As-enriched layer, (5) the inhibition of the
yellowing color change, and (3) the solder wettability as described
above. Results of the evaluations are shown in the following
table:
TABLE-US-00002 TABLE 2 Example 1 2 3 4 5 6 7 Element Sn (wt .%)
99.9960 99.9930 99.9900 99.9850 99.9800 99.9700 99.9680 As (wt. %)
0.0040 0.0070 0.0100 0.0150 0.0200 0.0300 0.0320 Total (wt. %) 100
100 100 100 100 100 100 Evaluation Presence of As- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.-
.smallcircle. .smallcircle. Enriched Layer Inhibition of
.smallcircle. .smallcircle..smallcircle. .smallcircle..smallcircle.
.s- mallcircle..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcir- cle. .smallcircle..smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .smal-
lcircle. .smallcircle. Wettability Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. Evaluation Comparable Example 1 2 3 4 5
6 Element Sn (wt .%) 100 99.9999 99.9990 99.9980 99.9975 99.9500 As
(wt. %) 0 0.0001 0.0010 0.0020 0.0025 0.0500 Total (wt. %) 100 100
100 100 100 100 Evaluation Presence of As- -- x x x x .smallcircle.
Enriched Layer Inhibition of x x x x x .smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. x Wettability
Comprehensive x x x x x x Evaluation *"--" means that the
evaluation was not performed.
According to the results shown in the table, with respect to a
solder containing Sn in Examples 1 to 7, in which the content of As
was 40 to 320 ppm by mass (0.0040 to 0.0320% by mass), an
As-enriched layer was formed, and the inhibition of the yellowing
color change and the solder wettability were both very good or
good. In particular, in Examples 2 to 5, in which the content of As
was 70 to 200 ppm by mass (0.0070 to 0.0200% by mass), the
inhibition of the yellowing color change and the solder wettability
were both very good.
On the other hand, in Comparative Example 1, in which As was not
contained, although the solder wettability was very good, the
yellowing color change could not be inhibited. In Comparative
Examples 2 to 5, in which the content of As was less than 40 ppm by
mass (0.0040% by mass), although the solder wettability was very
good, an As-enriched layer was not formed, and the yellowing color
change could not be inhibited. In Comparative Example 6, in which
the content of As was over 320 ppm by mass (0.0320% by mass), an
As-enriched layer was not formed, and although the inhibition of
the yellowing color change was good, adequate solder wettability
could not be obtained.
Examples 8 to 14 and Comparative Examples 7 to 12
Solder balls of Examples 8 to 14 and Comparative Examples 7 to 12
were produced in the same manner as in Examples 1 to 7 and
Comparative Examples 1 to 6 except that compositions shown in the
following table were employed.
Each of the solder balls of Examples 8 to 14 and Comparative
Examples 7 to 12 was subjected to the evaluations of (1) the
presence of an As-enriched layer, (5) the inhibition of the
yellowing color change, and (3) the solder wettability as described
above. Results of the evaluations are shown in the following
table.
TABLE-US-00003 TABLE 3 Example 8 9 10 11 12 13 14 Element Sn (wt
.%) 96.4960 96.4930 96.4900 96.4850 96.4800 96.4700 96.4680 As (wt.
%) 0.0040 0.0070 0.0100 0.0150 0.0200 0.0300 0.0320 Ag (wt. %) 3 3
3 3 3 3 3 Cu (wt. %) 0.5 0.5 0.5 0.5 0.5 0.5 0.5 Total (wt. %) 100
100 100 100 100 100 100 Evaluation Presence of As- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.-
.smallcircle. .smallcircle. Enriched Layer Inhibition of
.smallcircle. .smallcircle..smallcircle. .smallcircle..smallcircle.
.s- mallcircle..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcir- cle. .smallcircle..smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .smal-
lcircle. .smallcircle. Wettability Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. Evaluation Comparable Example 7 8 9 10
11 12 Element Sn (wt .%) 96.5 96.4999 96.4990 96.4980 96.4975
96.4500 As (wt. %) 0 0.0001 0.0010 0.0020 0.0025 0.0500 Ag (wt. %)
3 3 3 3 3 3 Cu (wt. %) 0.5 0.5 0.5 0.5 0.5 0.5 Total (wt. %) 100
100 100 100 100 100 Evaluation Presence of As- -- x x x x
.smallcircle. Enriched Layer Inhibition of x x x x x
.smallcircle..smallcircle. Yellowing Color Change Solder
.smallcircle..smallcircle. .smallcircle..smallcircle. .smallcircle-
..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcircle. x Wettability Comprehensive x x x x x x
Evaluation *"--" means that the evaluation was not performed.
According to the results shown in Table 3, also with respect to a
solder containing a Sn--Ag--Cu alloy (Ag content: 3% by mass, Cu
content: 0.5% by mass) in Examples 8 to 14, in which the content of
As was 40 to 320 ppm by mass (0.0040 to 0.0320% by mass), an
As-enriched layer was formed, and the inhibition of the yellowing
color change and the solder wettability were both very good or good
as with Examples 1 to 7. In particular, in Examples 9 to 12, in
which the content of As was 70 to 200 ppm by mass (0.0070 to
0.0200% by mass), the inhibition of the yellowing color change and
the solder wettability were both very good.
On the other hand, also with respect to the solder containing a
Sn--Ag--Cu alloy (Ag content: 3% by mass, Cu content: 0.5% by mass)
in Comparative Example 7, in which As was not contained, although
the solder wettability was very good, the yellowing color change
could not be inhibited as with Comparative Example 1. In
Comparative Examples 8 to 11, in which the content of As was less
than 40 ppm by mass (0.0040% by mass), although the solder
wettability was very good, an As-enriched layer was not formed, and
the yellowing color change could not be inhibited as with
Comparative Examples 2 to 5. In Comparative Example 12, in which
the content of As was over 320 ppm by mass (0.0320% by mass),
although an As-enriched layer was formed and the inhibition of the
yellowing color change was very good, adequate solder wettability
could not be obtained.
Examples 15 to 21 and Comparative Examples 13 to 18
Solder balls of Examples 15 to 21 and Comparative Examples 13 to 18
were produced in the same manner as in Examples 1 to 7 and
Comparative Examples 1 to 6 except that compositions shown in the
following table were employed.
Each of the solder balls of Examples 15 to 21 and Comparative
Examples 13 to 18 was subjected to the evaluations of (1) the
presence of an As-enriched layer, (5) the inhibition of the
yellowing color change, and (3) the solder wettability as described
above. Results of the evaluations are shown in the following
table.
TABLE-US-00004 TABLE 4 Example 15 16 17 18 19 20 21 Element Sn (wt
.%) 98.4960 98.4930 98.4900 98.4850 98.4800 98.4700 98.4680 As (wt.
%) 0.0040 0.0070 0.0100 0.0150 0.0200 0.0300 0.0320 Ag (wt. %) 1 1
1 1 1 1 1 Cu (wt. %) 0.5 0.5 0.5 0.5 0.5 0.5 0.5 Total (wt. %) 100
100 100 100 100 100 100 Evaluation Presence of As- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.-
.smallcircle. .smallcircle. Enriched Layer Inhibition of
.smallcircle. .smallcircle..smallcircle. .smallcircle..smallcircle.
.s- mallcircle..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcir- cle. .smallcircle..smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .smal-
lcircle. .smallcircle. Wettability Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. Evaluation Comparable Example 13 14 15
16 17 18 Element Sn (wt .%) 98.5 98.4999 98.4990 98.4980 98.4975
98.4500 As (wt. %) 0 0.0001 0.0010 0.0020 0.0025 0.0500 Ag (wt. %)
1 1 1 1 1 1 Cu (wt. %) 0.5 0.5 0.5 0.5 0.5 0.5 Total (wt. %) 100
100 100 100 100 100 Evaluation Presence of As- -- x x x x
.smallcircle. Enriched Layer Inhibition of x x x x x
.smallcircle..smallcircle. Yellowing Color Change Solder
.smallcircle..smallcircle. .smallcircle..smallcircle. .smallcircle-
..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcircle. x Wettability Comprehensive x x x x x x
Evaluation *"--" means that the evaluation was not performed.
According to the results shown in the table, also with respect to a
solder containing a Sn--Ag--Cu alloy (Ag content: 1% by mass, Cu
content: 0.5% by mass) in Examples 15 to 21, in which the content
of As was 40 to 320 ppm by mass (0.0040 to 0.0320% by mass), an
As-enriched layer was formed, and the inhibition of the yellowing
color change and the solder wettability were both very good or good
in the same manner as in Examples 1 to 7. In particular, in
Examples 16 to 19 in which the content of As was 70 to 200 ppm by
mass (0.0070 to 0.0200% by mass), the inhibition of the yellowing
color change and the solder wettability were both very good.
On the other hand, also with respect to the solder containing a
Sn--Ag--Cu alloy (Ag content: 1% by mass, Cu content: 0.5% by mass)
in Comparative Example 13, in which As was not contained, although
the solder wettability was very good, the yellowing color change
could not be inhibited in the same manner as in Comparative Example
1. In Comparative Examples 14 to 17, in which the content of As was
less than 40 ppm by mass (0.0040% by mass), although the solder
wettability was very good, an As-enriched layer was not formed, and
the yellowing color change could not be inhibited in the same
manner as in Comparative Examples 2 to 5. In Comparative Example
18, in which the content of As was over 320 ppm by mass (0.0320% by
mass), although an As-enriched layer was formed and the inhibition
of the yellowing color change was very good, adequate solder
wettability could not be obtained.
Examples 22 to 29 and Comparative Examples 19 to 26
Solder balls of Examples 22 to 29 and Comparative Examples 19 to 26
were produced in the same manner as in Examples 1 to 7 and
Comparative Examples 1 to 6 except that compositions shown in the
following table were employed.
Each of the solder balls of Examples 22 to 29 and Comparative
Examples 19 to 26 was subjected to the evaluations of (1) the
presence of an As-enriched layer, (5) the inhibition of the
yellowing color change, and (3) the solder wettability as described
above. Results of the evaluations are shown in the following
table.
TABLE-US-00005 TABLE 5 Example 22 23 24 25 26 27 28 29 Element Sn
(wt .%) 95.4960 95.4930 95.4900 95.4850 95.4800 95.4700 95.4680
94.9850 As (wt. %) 0.0040 0.0070 0.0100 0.0150 0.0200 0.0300 0.0320
0.0150 Ag (wt. %) 4 4 4 4 4 4 4 4 Cu (wt. %) 0.5 0.5 0.5 0.5 0.5
0.5 0.5 1 Total (wt. %) 100 100 100 100 100 100 100 100 Evaluation
Presence of As- .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle.- .smallcircle. .smallcircle.
.smallcircle. Enriched Layer Inhibition of .smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .s-
mallcircle..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcir- cle. .smallcircle..smallcircle.
.smallcircle..smallcircle. Yellowing Color Change Solder
.smallcircle..smallcircle. .smallcircle..smallcircle. .smallcircle-
..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcircle. .smal- lcircle. .smallcircle.
.smallcircle..smallcircle. Wettability Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. .smallcircle. Evaluation Comparative
Example 19 20 21 22 23 24 25 26 Element Sn (wt .%) 95.5 95.4999
95.4990 95.4980 95.4975 95.4500 95.0000 94.9500 As (wt. %) 0 0.0001
0.0010 0.0020 0.0025 0.0500 0 0.0500 Ag (wt. %) 4 4 4 4 4 4 4 4 Cu
(wt. %) 0.5 0.5 0.5 0.5 0.5 0.5 1 1 Total (wt. %) 100 100 100 100
100 100 100 100 Evaluation Presence of As- -- x x x x .smallcircle.
-- .smallcircle. Enriched Layer Inhibition of x x x x x
.smallcircle..smallcircle. x .smallcircle..smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. x .sm-
allcircle..smallcircle. x Wettability Comprehensive x x x x x x x x
Evaluation *"--" means that the evaluation was not performed.
According to the results shown in the table, also with respect to a
solder containing a Sn--Ag--Cu alloy (Ag content: 4% by mass, Cu
content: 0.5% by mass) in Examples 22 to 28, in which the content
of As was 40 to 320 ppm by mass (0.0040 to 0.0320% by mass), an
As-enriched layer was formed, and the inhibition of the yellowing
color change and the solder wettability were both very good or good
in the same manner as in Examples 1 to 7. In particular, in
Examples 23 to 26 in which the content of As was 70 to 200 ppm by
mass (0.0070 to 0.0200% by mass), the inhibition of the yellowing
color change and the solder wettability were both very good.
Besides, also with respect to a solder containing a Sn--Ag--Cu
alloy in which the Ag content and the Cu content were respectively
changed to 4% by mass and 1% by mass in Example 29, in which the
content of As was 40 to 320 ppm by mass (0.0040 to 0.0320% by
mass), good evaluation results were obtained as with Examples 22 to
28. In Example 29, the inhibition of the yellowing color change and
the solder wettability were both very good in the same manner as in
Examples 23 to 26.
On the other hand, also with respect to the solder containing a
Sn--Ag--Cu alloy (Ag content: 4% by mass, Cu content: 0.5% by mass)
in Comparative Example 19, in which As was not contained, although
the solder wettability was very good, the yellowing color change
could not be inhibited, as with Comparative Example 1. In
Comparative Examples 20 to 23, in which the content of As was less
than 40 ppm by mass (0.0040% by mass), although the solder
wettability was very good, an As-enriched layer was not formed, and
the yellowing color change could not be inhibited, as with
Comparative Examples 2 to 5. In Comparative Example 24, in which
the content of As was over 320 ppm by mass (0.0320% by mass), an
As-enriched layer was formed and the inhibition of the yellowing
color change was very good; however, adequate solder wettability
could not be obtained.
Besides, also with respect to the solder containing a Sn--Ag--Cu
alloy in which the Ag content and the Cu content were respectively
changed to 4% by mass and 1% by mass, evaluation results were
inadequate in Comparative Example 25, in which As was not contained
as with Comparative Example 19, and in Comparative Example 26, in
which the content of As was over 320 ppm by mass (0.0320% by mass)
as with Comparative Example 23.
Examples 30 to 37 and Comparative Examples 27 to 34
Solder balls of Examples 30 to 37 and Comparative Examples 27 to 34
were produced in the same manner as in Examples 1 to 7 and
Comparative Examples 1 to 6 except that compositions shown in the
following table were employed.
Each of the solder balls of Examples 30 to 37 and Comparative
Examples 27 to 34 was subjected to the evaluations of (1) the
presence of an As-enriched layer, (5) the inhibition of the
yellowing color change, and (3) the solder wettability as described
above. Results of the evaluations are shown in the following
table.
TABLE-US-00006 TABLE 6 Example 30 31 32 33 34 35 36 37 Element Sn
(wt .%) 96.4960 96.4930 96.4900 96.4850 96.4800 96.4700 96.4680
96.4850 As (wt. %) 0.0040 0.0070 0.0100 0.0150 0.0200 0.0300 0.0320
0.0150 Ag (wt. %) 3 3 3 3 3 3 3 3 Cu (wt. %) 0.5 0.5 0.5 0.5 0.5
0.5 0.5 0.5 Ni (wt. %) 0.05 0.05 0.05 0.05 0.05 0.05 0.05 0.15 Co
(wt. %) 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.15 Total (wt. %) 100
100 100 100 100 100 100 100 Evaluation Presence of As-
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle.- .smallcircle. .smallcircle. .smallcircle. Enriched
Layer Inhibition of .smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcircle. .s- mallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcir- cle.
.smallcircle..smallcircle. .smallcircle..smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .smal-
lcircle. .smallcircle. .smallcircle..smallcircle. Wettability
Comprehensive .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sm- allcircle. .smallcircle. .smallcircle.
.smallcircle. Evaluation Comparative Example 27 28 29 30 31 32 33
34 Element Sn (wt .%) 96.5000 96.4999 96.4990 96.4980 96.4975
96.4500 96.0000 96.4500 As (wt. %) 0 0.0001 0.0010 0.0020 0.0025
0.0500 0 0.0500 Ag (wt. %) 3 3 3 3 3 3 3 3 Cu (wt. %) 0.5 0.5 0.5
0.5 0.5 0.5 0.5 0.5 Ni (wt. %) 0.05 0.05 0.05 0.05 0.05 0.05 0.15
0.15 Co (wt. %) 0.01 0.01 0.01 0.01 0.01 0.01 0.015 0.015 Total
(wt. %) 100 100 100 100 100 100 100 100 Evaluation Presence of As-
-- x x x x .smallcircle. -- .smallcircle. Enriched Layer Inhibition
of x x x x x .smallcircle..smallcircle. x
.smallcircle..smallcircle. Yellowing Color Change Solder
.smallcircle..smallcircle. .smallcircle..smallcircle. .smallcircle-
..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcircle. x .sm- allcircle..smallcircle. x
Wettability Comprehensive x x x x x x x x Evaluation *"--" means
that the evaluation was not performed.
According to the results shown in the table, also with respect to a
solder containing a Sn--Ag--Cu--Ni--Co alloy (Ag content: 3% by
mass, Cu content: 0.5% by mass, Ni content: 0.05% by mass, Co
content: 0.01% by mass) in Examples 30 to 36, in which the content
of As was 40 to 320 ppm by mass (0.0040 to 0.0320% by mass), an
As-enriched layer was formed, and the inhibition of the yellowing
color change and the solder wettability were both very good or good
as with Examples 1 to 7. In particular, in Examples 31 to 34, in
which the content of As was 70 to 200 ppm by mass (0.0070 to
0.0200% by mass), the inhibition of the yellowing color change and
the solder wettability were both very good.
Besides, also with respect to a solder containing a
Sn--Ag--Cu--Ni--Co alloy in which the Ni content and the Co content
were respectively changed to 0.15% by mass and 0.015% by mass in
Example 37, in which the content of As was 40 to 320 ppm by mass
(0.0040 to 0.0320% by mass), good evaluation results were obtained
as with Examples 30 to 36. In Example 37, the inhibition of the
yellowing color change and the solder wettability were both very
good as with Examples 31 to 34.
On the other hand, also with respect to the solder containing a
Sn--Ag--Cu--Ni--Co alloy (Ag content: 3% by mass, Cu content: 0.5%
by mass, Ni content: 0.05% by mass, Co content: 0.01% by mass) in
Comparative Example 27, in which As was not contained, although the
solder wettability was very good, the yellowing color change could
not be inhibited, as with Comparative Example 1. In Comparative
Examples 28 to 31, in which the content of As was less than 40 ppm
by mass (0.0040% by mass), although the solder wettability was very
good, an As-enriched layer was not formed and the yellowing color
change could not be inhibited, as with Comparative Examples 2 to 5.
In Comparative Example 32, in which the content of As was over 320
ppm by mass (0.0320% by mass), an As-enriched layer was formed and
the inhibition of the yellowing color change was very good;
however, adequate solder wettability could not be obtained.
Besides, also with respect to the solder containing a
Sn--Ag--Cu--Ni--Co alloy in which the Ni content and the Co content
were respectively changed to 0.15% by mass and 0.015% by mass,
evaluation results were inadequate in Comparative Example 33, in
which As was not contained as with Comparative Example 27, and in
Comparative Example 34, in which the content of As was over 320 ppm
by mass (0.0320% by mass) as with Comparative Example 32.
Examples 38 to 44 and Comparative Examples 35 to 40
Solder balls of Examples 38 to 44 and Comparative Examples 35 to 40
were produced in the same manner as in Examples 1 to 7 and
Comparative Examples 1 to 6 except that compositions shown in the
following table were employed.
Each of the solder balls of Examples 38 to 44 and Comparative
Examples 35 to 40 was subjected to the evaluations of (1) the
presence of an As-enriched layer, (5) the inhibition of the
yellowing color change, and (3) the solder wettability as described
above. Results of the evaluations are shown in the following
table.
TABLE-US-00007 TABLE 7 Example 38 39 40 41 42 43 44 Element Sn (wt
.%) 47.9960 47.9930 47.9900 47.9850 47.9800 47.9700 47.9680 As (wt.
%) 0.0040 0.0070 0.0100 0.0150 0.0200 0.0300 0.0320 In (wt. %) 52
52 52 52 52 52 52 Total (wt. %) 100 100 100 100 100 100 100
Evaluation Presence of As- .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle.- .smallcircle.
.smallcircle. Enriched Layer Inhibition of .smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .s-
mallcircle..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcir- cle. .smallcircle..smallcircle. Yellowing
Color Change Solder .smallcircle..smallcircle.
.smallcircle..smallcircle. .smallcircle- ..smallcircle.
.smallcircle..smallcircle. .smallcircle..smallcircle. .smal-
lcircle. .smallcircle. Wettability Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. Evaluation Comparable Example 35 36 37
38 39 40 Element Sn (wt .%) 48 47.9999 47.9990 47.9980 47.9975
47.9500 As (wt. %) 0 0.0001 0.0010 0.0020 0.0025 0.0500 In (wt. %)
52 52 52 52 52 52 Total (wt. %) 100 100 100 100 100 100 Evaluation
Presence of As- -- x x x x .smallcircle. Enriched Layer Inhibition
of x x x x x .smallcircle..smallcircle. Yellowing Color Change
Solder .smallcircle..smallcircle. .smallcircle..smallcircle.
.smallcircle- ..smallcircle. .smallcircle..smallcircle.
.smallcircle..smallcircle. x Wettability Comprehensive x x x x x x
Evaluation *"--" means that the evaluation was not performed.
According to the results shown in the table, also with respect to a
solder containing a Sn--In alloy in Examples 38 to 44, in which the
content of As was 40 to 320 ppm by mass (0.0040 to 0.0320% by
mass), an As-enriched layer was formed, and the inhibition of the
yellowing color change and the solder wettability were both very
good or good as with Examples 1 to 7. In particular, in Examples 39
to 42, in which the content of As was 70 to 200 ppm by mass (0.0070
to 0.0200% by mass), the inhibition of the yellowing color change
and the solder wettability were both very good.
On the other hand, also with respect to the solder containing a
Sn--In alloy in Comparative Example 35, in which As was not
contained, although the solder wettability was very good, the
yellowing color change could not be inhibited as with Comparative
Example 1. In Comparative Examples 36 to 39, in which the content
of As was less than 40 ppm by mass (0.0040% by mass), although the
solder wettability was very good, an As-enriched layer was not
formed, and the yellowing color change could not be inhibited as
with Comparative Examples 2 to 5. In Comparative Example 40, in
which the content of As was over 320 ppm by mass (0.0320% by mass),
although an As-enriched layer was formed and the inhibition of the
yellowing color change was very good, adequate solder wettability
could not be obtained.
Besides, a solder joint can be produced by processing each of the
solder balls of Examples 1 to 44 by a method common in the art. In
the solder balls of Examples 1 to 44, in which the content of As
was 40 to 320 ppm by mass (0.0040 to 0.0320% by mass), an
As-enriched layer was formed, and the inhibition of the yellowing
color change and the solder wettability were both excellent. Thus,
the solder balls of Examples 1 to 44 are difficult to change in
color even when heated, and therefore, solder joints obtained from
these solder balls are also difficult to change in color.
II. Sn--As--Bi-Containing Solder
Examples II-A1 to II-A35 and Comparative Examples II-A1 to
II-A12
Sn, As and Bi were weighed to satisfy the contents of As and Bi
shown in Table IIA below with a balance of Sn (balance for making
the sum of Sn, As and Bi 100% by mass), and were melt mixed, and
the resultant was centrifugally sprayed in an Ar atmosphere to
prepare a powder (average particle size: 21 .mu.m, classified as
No. 5 of the particle size classification (Table 2) of JIS
Z3284-1:2004). The thus obtained powder was heated with a drying
apparatus in the air at 60.degree. C. for 30 minutes to obtain a
solder powder of each of examples and comparative examples. In
Comparative Examples II-A1 to II-A6, however, a heat treatment was
not performed but a powder as is obtained by the centrifugal
spraying was used as a solder powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the content of Bi is shown in % by
mass with respect to the total mass of the solder material in the
following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00008 TABLE 8 Table IIA-1 Comp. Comp. Comp. Comp. Comp.
Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-A1 II-A2 II-A3 II-A4 II-A5
II-A6 II-A1 II-A2 Composition As 0 10 20 25 25 40 40 40 (mass ppm)
Bi (mass %) 0.000 0.000 0.000 0.000 0.002 0.000 0.010 1.000
Evaluation Presence of As- x x x x x x .smallcircle. .smallcircle.
Enriched Layer Inhibition of x x x x x x .smallcircle.
.smallcircle. Viscosity Increase Solder Wettability .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . .smallcircle.
.smallcircle. .smallcircle. .smallcircle. Reliability .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. (.DELTA.T < 10.degree.
C.) Comprehensive x x x x x x .smallcircle. .smallcircle.
Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-A7 II-A3 II-A4
II-A5 II-A6 II-A7 II-A8 II-A9 Composition As 40 50 60 70 80 90 100
100 (mass ppm) Bi (mass %) 5.000 0.010 0.010 0.010 0.010 0.010
0.002 0.005 Evaluation Presence of As- .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle.- .smallcircle.
.smallcircle. .smallcircle. Enriched Layer Inhibition of
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. Viscosity
Increase Solder Wettability .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Reliability x .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. -
.smallcircle. .smallcircle. (.DELTA.T < 10.degree. C.)
Comprehensive x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-A10 II-A11
II-A12 II-A13 II-A14 II-A8 II-A15 II-A16 Composition As 100 100 100
100 100 100 150 150 (mass ppm) Bi (mass %) 0.010 0.050 0.100 0.500
1.000 5.000 0.002 0.005 Evaluation Presence of As- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.-
.smallcircle. .smallcircle. .smallcircle. Enriched Layer Inhibition
of .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. Viscosity
Increase Solder Wettability .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Reliability .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. x - .smallcircle.
.smallcircle. (.DELTA.T < 10.degree. C.) Comprehensive
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sm-
allcircle. x .smallcircle. .smallcircle. Evaluation
TABLE-US-00009 TABLE 9 Table IIA-2 Comp. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. II-A17 II-A18 II-A19 II-A20 II-A21 II-A9 II-A22 II-A23
Composition As (mass ppm) 150 150 150 150 150 150 200 200 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Evaluation
Presence of As-Enriched Layer Inhibition of Viscosity Increase
Solder Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
II-A24 II-A25 II-A26 II-A27 II-A28 II-A10 II-A29 II-A30 Composition
As (mass ppm) 200 200 200 200 200 200 250 250 Bi (mass %) 0.010
0.050 0.100 0.500 1.000 5.000 0.002 0.005 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
II-A31 II-A32 II-A33 II-A34 II-A35 II-A11 II-A12 Composition As
(mass ppm) 250 250 250 250 250 250 500 Bi (mass %) 0.010 0.050
0.100 0.500 1.000 5.000 0.000 Evaluation Presence of As-Enriched
Layer Inhibition of Viscosity Increase Solder Wettability x
Reliability (.DELTA.T < 10.degree. C.) x Comprehensive
Evaluation v x x
Examples II-B1 to II-B35 and Comparative Examples II-B1 to
II-B12
Sn, As, Bi and Cu were weighed to satisfy a content of Cu of 0.7%
by mass and the contents of As and Bi shown in Table IIA below with
a balance of Sn (balance for making the sum of Sn, As, Bi and Cu
100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 5 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples II-B1 to II-B6, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Bi and Cu are shown
in % by mass with respect to the total mass of the solder material
in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00010 TABLE 10 Table IIB-1 0% Ag and 0.7% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-B1
II-B2 II-B3 II-B4 II-B5 II-B6 II-B1 II-B2 Composition As (mass ppm)
0 10 20 25 25 40 40 40 Bi (mass %) 0.000 0.000 0.000 0.000 0.002
0.000 0.010 1.000 Cu (mass %) 0.700 0.700 0.700 0.700 0.700 0.700
0.700 0.700 Evaluation Presence of As-Enriched Layer x x x x x x
Inhibition of Viscosity Increase x x x x x x Solder Wettability
Reliability (.DELTA.T < 10.degree. C.) Comprehensive Evaluation
x x x x x x Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-B7 II-B3
II-B4 II-B5 II-B6 II-B7 II-B8 II-B9 Composition As (mass ppm) 40 50
60 70 80 90 100 100 Bi (mass %) 5.000 0.010 0.010 0.010 0.010 0.010
0.002 0.005 Cu (mass %) 0.700 0.700 0.700 0.700 0.700 0.700 0.700
0.700 Evaluation Presence of As-Enriched Layer Inhibition of
Viscosity Increase Solder Wettability Reliability (.DELTA.T <
10.degree. C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex Ex.
Ex. Ex. Ex. Ex. II-B10 II-B11 II-B12 II-B13 II-B14 II-B8 II-B15
II-B16 Composition As (mass ppm) 100 100 100 100 100 100 150 150 Bi
(mass %) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Cu (mass
%) 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 Evaluation
Presence of As-Enriched Layer Inhibition of Viscosity Increase
Solder Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x
TABLE-US-00011 TABLE 11 Table IIB-2 0% Ag and 0.7% Cu added Comp.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-B17 II-B18 II-B19 II-B20 II-B21
II-B9 II-B22 II-B23 Composition As (mass ppm) 150 150 150 150 150
150 200 200 Bi (mass %) 0.010 0.050 0.100 0.500 1.000 5.000 0.002
0.005 Cu (mass %) 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. II-B24 II-B25 II-B26 II-B27 II-B28 II-B10 II-B29 II-B30
Composition As (mass ppm) 200 200 200 200 200 200 250 250 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Cu (mass %)
0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 Evaluation Presence
of As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
II-B31 II-B32 II-B33 II-B34 II-B35 II-B11 II-B12 Composition As
(mass ppm) 250 250 250 250 250 250 500 Bi (mass %) 0.010 0.050
0.100 0.500 1.000 5.000 0.000 Cu (mass %) 0.700 0.700 0.700 0.700
0.700 0.700 0.700 Evaluation Presence of As-Enriched Layer
Inhibition of Viscosity Increase Solder Wettability x Reliability
(.DELTA.T < 10.degree. C.) x Comprehensive Evaluation x x
Examples II-C1 to II-C35 and Comparative Examples II-C1 to
II-C12
Sn, As, Bi, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 1.0% by mass, and the contents of
As and Bi shown in Table II-C below with a balance of Sn (balance
for making the sum of Sn, As, Bi, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples II-C1 to
II-C6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Bi, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
The solder powder obtained in Example II-C1 was analyzed for the
contents of Sn, As, Bi, Ag and Cu by ICP-AES in accordance with JIS
Z 3910, and it was confirmed that these contents accorded with
those of the starting materials.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00012 TABLE 12 Table IIC-1 1% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-C1
II-C2 II-C3 II-C4 II-C5 II-C6 II-C1 II-C2 Composition As (mass ppm)
0 10 20 25 25 40 40 40 Bi (mass %) 0.000 0.000 0.000 0.000 0.002
0.000 0.010 1.000 Ag (mass %) 1.000 1.000 1.000 1.000 1.000 1.000
1.000 1.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer x x x x x x
Inhibition of Viscosity Increase x x x x x x Solder Wettability
Reliability (.DELTA.T < 10.degree. C.) Comprehensive Evaluation
x x x x x x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-C7 II-C3 II-C4
II-C5 II-C6 II-C7 II-C8 II-C9 Composition As (mass ppm) 40 50 60 70
80 90 100 100 Bi (mass %) 5.000 0.010 0.010 0.010 0.010 0.010 0.002
0.005 Ag (mass %) 1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
Ex. II-C10 II-C11 II-C12 II-C13 II-C14 II-C8 II-C15 II-C16
Composition As (mass ppm) 100 100 100 100 100 100 150 150 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x
TABLE-US-00013 TABLE 13 Table IIC-2 1% Ag and 0.5% Cu added Comp.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-C17 II-C18 II-C19 II-C20 II-C21
II-C9 II-C22 II-C23 Composition As (mass ppm) 150 150 150 150 150
150 200 200 Bi (mass %) 0.010 0.050 0.100 0.500 1.000 5.000 0.002
0.005 Ag (mass %) 1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. II-C24 II-C25 II-C26 II-C27 II-C28 II-C10 II-C29 II-C30
Composition As (mass ppm) 200 200 200 200 200 200 250 250 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
II-C31 II-C32 II-C33 II-C34 II-C35 II-C11 II-C12 Composition As
(mass ppm) 250 250 250 250 250 250 500 Bi (mass %) 0.010 0.050
0.100 0.500 1.000 5.000 0.000 Ag (mass %) 1.000 1.000 1.000 1.000
1.000 1.000 1.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer Inhibition of
Viscosity Increase Solder Wettability x Reliability (.DELTA.T <
10.degree. C.) x Comprehensive Evaluation x x
Examples II-D1 to II-D35 and Comparative Examples II-D1 to
II-D12
Sn, As, Bi, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 2.0% by mass, and the contents of
As and Bi shown in Table IID below with a balance of Sn (balance
for making the sum of Sn, As, Bi, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples II-D1 to
II-D6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Bi, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00014 TABLE 14 Table IID-1 2% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-D1
II-D2 II-D3 II-D4 II-D5 II-D6 II-D1 II-D2 Composition As (mass ppm)
0 10 20 25 25 40 40 40 Bi (mass %) 0.000 0.000 0.000 0.000 0.002
0.000 0.010 1.000 Ag (mass %) 2.000 2.000 2.000 2.000 2.000 2.000
2.000 2.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer x x x x x x
Inhibition of Viscosity Increase x x x x x x Solder Wettability
Reliability (.DELTA.T < 10.degree. C.) Comprehensive Evaluation
x x x x x x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-D7 II-D3 II-D4
II-D5 II-D6 II-D7 II-D8 II-D9 Composition As (mass ppm) 40 50 60 70
80 90 100 100 Bi (mass %) 5.000 0.010 0.010 0.010 0.010 0.010 0.002
0.005 Ag (mass %) 2.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
Ex. II-D10 II-D11 II-D12 II-D13 II-D14 II-D8 II-D15 II-D16
Composition As (mass ppm) 100 100 100 100 100 100 150 150 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
2.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x
TABLE-US-00015 TABLE 15 Table IID-2 2% Ag and 0.5% Cu added Comp.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-D17 II-D18 II-D19 II-D20 II-D21
II-D9 II-D22 II-D23 Composition As (mass ppm) 150 150 150 150 150
150 200 200 Bi (mass %) 0.010 0.050 0.100 0.500 1.000 5.000 0.002
0.005 Ag (mass %) 2.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. II-D24 II-D25 II-D26 II-D27 II-D28 II-D10 II-D29 II-D30
Composition As (mass ppm) 200 200 200 200 200 200 250 250 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
2.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
II-D31 II-D32 II-D33 II-D34 II-D35 II-D11 II-D12 Composition As
(mass ppm) 250 250 250 250 250 250 500 Bi (mass %) 0.010 0.050
0.100 0.500 1.000 5.000 0.000 Ag (mass %) 2.000 2.000 2.000 2.000
2.000 2.000 2.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer Inhibition of
Viscosity Increase Solder Wettability x Reliability (.DELTA.T <
10.degree. C.) x Comprehensive Evaluation x x
Examples II-E1 to II-E35 and Comparative Examples II-E1 to
II-E12
Sn, As, Bi, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 3.0% by mass, and the contents of
As and Bi shown in Table IIE below with a balance of Sn (balance
for making the sum of Sn, As, Bi, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples II-E1 to
II-E6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Bi, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00016 TABLE 16 Table IIE-1 3% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-E1
II-E2 II-E3 II-E4 II-E5 II-E6 II-E1 II-E2 Composition As (mass ppm)
0 10 20 25 25 40 40 40 Bi (mass %) 0.000 0.000 0.000 0.000 0.002
0.000 0.010 1.000 Ag (mass %) 3.000 3.000 3.000 3.000 3.000 3.000
3.000 3.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer x x x x x x
Inhibition of Viscosity Increase x x x x x x Solder Wettability
Reliability (.DELTA.T < 10.degree. C.) Comprehensive Evaluation
x x x x x x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-E7 II-E3 II-E4
II-E5 II-E6 II-E7 II-E8 II-E9 Composition As (mass ppm) 40 50 60 70
80 90 100 100 Bi (mass %) 5.000 0.010 0.010 0.010 0.010 0.010 0.002
0.005 Ag (mass %) 3.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
Ex. II-E10 II-E11 II-E12 II-E13 II-E14 II-E8 II-E15 II-E16
Composition As (mass ppm) 100 100 100 100 100 100 150 150 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
3.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x
TABLE-US-00017 TABLE 17 Table IIE-2 3% Ag and 0.5% Cu added Comp.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-E17 II-E18 II-E19 II-E20 II-E21
II-E9 II-E22 II-E23 Composition As (mass ppm) 150 150 150 150 150
150 200 200 Bi (mass %) 0.010 0.050 0.100 0.500 1.000 5.000 0.002
0.005 Ag (mass %) 3.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. II-E24 II-E25 II-E26 II-E27 II-E28 II-E10 II-E29 II-E30
Composition As (mass ppm) 200 200 200 200 200 200 250 250 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
3.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
II-E31 II-E32 II-E33 II-E34 II-E35 II-E11 II-E12 Composition As
(mass ppm) 250 250 250 250 250 250 500 Bi (mass %) 0.010 0.050
0.100 0.500 1.000 5.000 0.000 Ag (mass %) 3.000 3.000 3.000 3.000
3.000 3.000 3.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer Inhibition of
Viscosity Increase Solder Wettability x Reliability (.DELTA.T <
10.degree. C.) x Comprehensive Evaluation x x
Examples II-F1 to II-F35 and Comparative Examples II-F1 to
II-F12
Sn, As, Bi, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 3.5% by mass, and the contents of
As and Bi shown in Table IIF below with a balance of Sn (balance
for making the sum of Sn, As, Bi, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples II-F1 to
II-F6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Bi, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00018 TABLE 18 Table IIF-1 3.5% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-F1
II-F2 II-F3 II-F4 II-F5 II-F6 II-F1 II-F2 Composition As (mass ppm)
0 10 20 25 25 40 40 40 Bi (mass %) 0.000 0.000 0.000 0.000 0.002
0.000 0.010 1.000 Ag (mass %) 3.500 3.500 3.500 3.500 3.500 3.500
3.500 3.500 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer x x x x x x
Inhibition of Viscosity Increase x x x x x x Solder Wettability
Reliability (.DELTA.T < 10.degree. C.) Comprehensive Evaluation
x x x x x x Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-F7 II-F3
II-F4 II-F5 II-F6 II-F7 II-F8 II-F9 Composition As (mass ppm) 40 50
60 70 80 90 100 100 Bi (mass %) 5.000 0.010 0.010 0.010 0.010 0.010
0.002 0.005 Ag (mass %) 3.500 3.500 3.500 3.500 3.500 3.500 3.500
3.500 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
Ex. II-F10 II-F11 II-F12 II-F13 II-F14 II-F8 II-F15 II-F16
Composition As (mass ppm) 100 100 100 100 100 100 150 150 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x
TABLE-US-00019 TABLE 19 Table IIF-2 3.5% Ag and 0.5% Cu added Comp.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. II-F17 II-F18 II-F19 II-F20 II-F21
II-F9 II-F22 II-F23 Composition As (mass ppm) 150 150 150 150 150
150 200 200 Bi (mass %) 0.010 0.050 0.100 0.500 1.000 5.000 0.002
0.005 Ag (mass %) 3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500
Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of As-Enriched Layer Inhibition of Viscosity
Increase Solder Wettability Reliability (.DELTA.T < 10.degree.
C.) x Comprehensive Evaluation x Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. II-F24 II-F25 II-F26 II-F27 II-F28 II-F10 II-F29 II-F30
Composition As (mass ppm) 200 200 200 200 200 200 250 250 Bi (mass
%) 0.010 0.050 0.100 0.500 1.000 5.000 0.002 0.005 Ag (mass %)
3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500 Cu (mass %) 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
As-Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Reliability (.DELTA.T < 10.degree. C.) x
Comprehensive Evaluation x Comp. Comp. Ex. Ex. Ex Ex. Ex. Ex. Ex.
II-F31 II-F32 II-F33 II-F34 II-F35 II-F11 II-F12 Composition As
(mass ppm) 250 250 250 250 250 250 500 Bi (mass %) 0.010 0.050
0.100 0.500 1.000 5.000 0.000 Ag (mass %) 3.500 3.500 3.500 3.500
3.500 3.500 3.500 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500
0.500 Evaluation Presence of As-Enriched Layer Inhibition of
Viscosity Increase Solder Wettability x Reliability (.DELTA.T <
10.degree. C.) x Comprehensive Evaluation x x
III. Sn--As--Sb-Containing Solder
Examples III-A1 to III-A32 and Comparative Examples III-A1 to
III-A12
Sn, As and Sb were weighed to satisfy the contents of As and Sb
shown in Table IIIA below with a balance of Sn (balance for making
the sum of Sn, As and Sb 100% by mass), and were melt mixed, and
the resultant was centrifugally sprayed in an Ar atmosphere to
prepare a powder (average particle size: 21 .mu.m, classified as
No. 5 of the particle size classification (Table 2) of JIS
Z3284-1:2004). The thus obtained powder was heated with a drying
apparatus in the air at 60.degree. C. for 30 minutes to obtain a
solder powder of each of examples and comparative examples. In
Comparative Examples III-A1 to III-A6, however, a heat treatment
was not performed but a powder as is obtained by the centrifugal
spraying was used as a solder powder.
The content of As is shown in ppm by mass with respect to the total
mass of solder materials and the content of Sb is shown in % by
mass with respect to the total mass of the solder materials in the
following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, and (3) the solder
wettability of the solder powders of the examples and comparative
examples are shown in the following tables.
TABLE-US-00020 TABLE 20 Table IIIA Comp. Comp. Comp. Comp. Comp.
Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. III-A1 III-A2
III-A3 III-A4 III-A5 III-A6 III-A1 III-A2 III-A3 III-A7 Compo- As
(mass ppm) 0 10 20 25 25 40 40 40 40 40 sition Sb (mass %) 0.000
0.000 0.000 0.000 0.002 0.000 0.010 0.100 0.500 1.000 Evalua-
Presence of x x x x x x tion As-Enriched Layer Inhibition of x x x
x x x Viscosity Increase Solder Wettability x Comprehensive x x x x
x x x Evaluation Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. III-A4
III-A5 III-A6 III-A7 III-A8 III-A9 III-A10 III-A11 III-A12 III-A1-
3 Compo- As (mass ppm) 50 60 70 80 90 100 100 100 100 100 sition Sb
(mass %) 0.010 0.010 0.010 0.010 0.010 0.002 0.005 0.010 0.050
0.100 Evalua- Presence of tion As-Enriched Layer Inhibition of
Viscosity Increase Solder Wettability Comprehensive Evaluation
TABLE-US-00021 TABLE 21 Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. III-A14 III-A8 III-A15 III-A16 III-A17 III-A18
III-A19 III-A20 III-A9 III-- A21 III-A22 III-A23 100 100 150 150
150 150 150 150 150 200 200 200 0.500 1.000 0.002 0.005 0.010 0.050
0.100 0.500 1.000 0.002 0.005 0.010 x x x x Comp. Comp. Comp. Ex.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. III-A24 III-A25 III-A26
III-A10 III-A27 III-A28 III-A29 III-A30 III-A31 II- I-A32 III-A11
III-A12 200 200 200 200 200 200 250 250 250 250 250 500 0.050 0.100
0.500 1.000 0.002 0.005 0.010 0.050 0.100 0.500 1.000 0.000 x x x x
x x
Examples III-B1 to III-B32 and Comparative Examples III-B1 to
III-B12
Sn, As, Sb and Cu were weighed to satisfy a content of Cu of 0.7%
by mass and the contents of As and Sb shown in Table IIIB below
with a balance of Sn (balance for making the sum of Sn, As, Sb and
Cu 100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 5 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples III-B1 to III-B6, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Sb and Cu are shown
in % by mass with respect to the total mass of the solder material
in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, and (3) the solder
wettability of the solder powders of the examples and comparative
examples are shown in the following tables.
TABLE-US-00022 TABLE 22 Table IIIB 0% Ag and 0.7% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. III-B1 III-B2 III-B3 III-B4 III-B5 III-B6 III-B1 III-B2
III-B3 III-B7 Compo- As (mass ppm) 0 10 20 25 25 40 40 40 40 40
sition Bi (mass %) 0.000 0.000 0.000 0.000 0.002 0.000 0.010 0.100
0.500 1.000 Cu (mass %) 0.700 0.700 0.700 0.700 0.700 0.700 0.700
0.700 0.700 0.700 Evalua- Presence of x x x x x x tion As-Enriched
Layer Inhibition of x x x x x x Viscosity Increase Solder
Wettability x Comprehensive x x x x x x x Evaluation Ex. Ex. Ex.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. III-B4 III-B5 III-B6 III-B7 III-B8
III-B9 III-B10 III-B11 III-B12 III-B1- 3 Compo- As (mass ppm) 50 60
70 80 90 100 100 100 100 100 sition Bi (mass %) 0.010 0.010 0.010
0.010 0.010 0.002 0.005 0.010 0.050 0.100 Cu (mass %) 0.700 0.700
0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 Evalua- Presence of
As- tion Enriched Layer Inhibition of Viscosity Increase Solder
Wettability Comprehensive Evaluation
TABLE-US-00023 TABLE 23 Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. III-B14 III-B8 III-B15 III-B16 III-B17 III-B18
III-B19 III-B20 III-B9 III-- B21 III-B22 III-B23 100 100 150 150
150 150 150 150 150 200 200 200 0.500 1.000 0.002 0.005 0.010 0.050
0.100 0.500 1.000 0.002 0.005 0.010 0.700 0.700 0.700 0.700 0.700
0.700 0.700 0.700 0.700 0.700 0.700 0.700 x x x x Comp. Comp. Comp.
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. III-B24 III-B25
III-B26 III-B10 III-B27 III-B28 III-B29 III-B30 III-B31 II- I-B32
III-B11 III-B12 200 200 200 200 250 250 250 250 250 250 250 500
0.050 0.100 0.500 1.000 0.002 0.005 0.010 0.050 0.100 0.500 1.000
0.000 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700
0.700 0.700 x x x x x x
Examples III-C1 to III-C32 and Comparative Examples III-C1 to
III-C12
Sn, As, Sb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 1.0% by mass, and the contents of
As and Sb shown in Table IIIC below with a balance of Sn (balance
for making the sum of Sn, As, Sb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples III-C1
to III-C6, however, a heat treatment was not performed but a powder
as is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Sb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
The solder powder obtained in Example III-C1 was analyzed for the
contents of Sn, As, Sb, Ag and Cu by ICP-AES in accordance with JIS
Z 3910, and it was confirmed that these contents accorded with
those of the starting materials.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, and (3) the solder
wettability of the solder powders of the examples and comparative
examples are shown in the following tables.
TABLE-US-00024 TABLE 24 TABLE III C1% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex Ex Ex. III-C1 III-C2 III-C3 III-C4 III-C5 III-C6 III-C1 III-C2
III-C3 III-C7 II- I-C4 Com- As (mass 0 10 20 25 25 40 40 40 40 40
50 po- ppm) sition Sb (mass 0.000 0.000 0.000 0.000 0.002 0.000
0.010 0.100 0.500 1.00- 0 0.010 %) Ag (mass 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 1.000 1.000 1.0- 00 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.5- 00 %) Eval-
Presence x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. uation of As- Enriched Layer
Inhibition x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircl- e. Wet- tability Com- x x x x x x .smallcircle.
.smallcircle. .smallcircle. x .smallcircle- . pre- hensive Eval-
uation Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex Ex III-C5 III-C6 III-C7
III-C8 III-C9 III-C10 III-C11 III-C12 III-C13 Com- As (mass 60 70
80 90 100 100 100 100 100 po- ppm) sition Sb (mass 0.010 0.010
0.010 0.010 0.002 0.005 0.010 0.050 0.100 %) Ag (mass 1.000 1.000
1.000 1.000 1.000 1.000 1.000 1.000 1.000 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 %) Eval- Presence
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle.
.smallcircle. uation of As- Enriched Layer Inhibition .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. .smallcircle. of Viscosity
Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcir- cle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Wet- tability Com- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. .smallcircle. .smallcircle. pre-
hensive Eval- uation
TABLE-US-00025 TABLE 25 Comp. Comp Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. III-C14 III-C8 III-C15 III-C16 III-C17 III-C18
III-C19 III-C20 III-C9 III-- C21 III-C22 III-C23 100 100 150 150
150 150 150 150 150 200 200 200 0.500 1.000 0.002 0.005 0.010 0.050
0.100 0.500 1.000 0.002 0.005 0.010 1.000 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 1.000 1.000 1.000 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. III-C24 III-C25 III-C26 III-C10 III-C27 III-C28 III-C29
III-C30 III-C31 II- I-C32 III-C11 III-C12 200 200 200 200 250 250
250 250 250 250 250 500 0.050 0.100 0.500 1.000 0.002 0.005 0.010
0.050 0.100 0.500 1.000 0.000 1.000 1.000 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 1.000 1.000 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle.
.smallcircle. .smallcircle. x x .smallcircle. .smallcircle.
.smallcircle. x .smallcircle. .smallcircle. .s- mallcircle.
.smallcircle. .smallcircle. .smallcircle. x x
Examples III-D1 to III-D32 and Comparative Examples III-D1 to
III-D12
Sn, As, Sb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 2.0% by mass, and the contents of
As and Sb shown in Table IIID below with a balance of Sn (balance
for making the sum of Sn, As, Sb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples III-D1
to III-D6, however, a heat treatment was not performed but a powder
as is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Sb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, and (3) the solder
wettability of the solder powders of the examples and comparative
examples are shown in the following tables.
TABLE-US-00026 TABLE 26 TABLE IIID 2% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex Ex Ex. III-D1 III-D2 III-D3 III-D4 III-D5 III-D6 III-D1 III-D2
III-D3 III-D7 II- I-D4 Com- As (mass 0 10 20 25 25 40 40 40 40 40
50 po- ppm) sition Sb (mass 0.000 0.000 0.000 0.000 0.002 0.000
0.010 0.100 0.500 1.00- 0 0.010 %) Ag (mass 2.000 2.000 2.000 2.000
2.000 2.000 2.000 2.000 2.000 2.000 2.0- 00 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.5- 00 %) Eval-
Presence x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. uation of As- Enriched Layer
Inhibition x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircl- e. Wet- tability Com- x x x x x x .smallcircle.
.smallcircle. .smallcircle. x .smallcircle- . pre- hensive Eval-
uation Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex Ex III-D5 III-D6 III-D7
III-D8 III-D9 III-D10 III-D11 III-D12 III-D13 Com- As (mass 60 70
80 90 100 100 100 100 100 po- ppm) sition Sb (mass 0.010 0.010
0.010 0.010 0.002 0.005 0.010 0.050 0.100 %) Ag (mass 2.000 2.000
2.000 2.000 2.000 2.000 2.000 2.000 2.000 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 %) Eval- Presence
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle.
.smallcircle. uation of As- Enriched Layer Inhibition .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. .smallcircle. of Viscosity
Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcir- cle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Wet- tability Com- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. .smallcircle. .smallcircle. pre-
hensive Eval- uation
TABLE-US-00027 TABLE 27 Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. III-D14 III-D8 III-D15 III-D16 III-D17 III-D18
III-D19 III-D20 III-D9 III-- D21 III-D22 III-D23 100 100 150 150
150 150 150 150 150 200 200 200 0.500 1.000 0.002 0.005 0.010 0.050
0.100 0.500 1.000 0.002 0.005 0.010 2.000 2.000 2.000 2.000 2.000
2.000 2.000 2.000 2.000 2.000 2.000 2.000 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. III-D24 III-D25 III-D26 III-D10 III-D27 III-D28 III-D29
III-D30 III-D31 II- I-D32 III-D11 III-D12 200 200 200 200 250 250
250 250 250 250 250 500 0.050 0.100 0.500 1.000 0.002 0.005 0.010
0.050 0.100 0.500 1.000 0.000 2.000 2.000 2.000 2.000 2.000 2.000
2.000 2.000 2.000 2.000 2.000 2.000 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle.
.smallcircle. .smallcircle. x x .smallcircle. .smallcircle.
.smallcircle. x .smallcircle. .smallcircle. .s- mallcircle.
.smallcircle. .smallcircle. .smallcircle. x x
Examples III-E1 to III-E32 and Comparative Examples III-E1 to
III-E12
Sn, As, Sb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 3.0% by mass, and the contents of
As and Sb shown in Table IIIE below with a balance of Sn (balance
for making the sum of Sn, As, Sb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples III-E1
to III-E6, however, a heat treatment was not performed but a powder
as is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Sb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, and (3) the solder
wettability of the solder powders of the examples and comparative
examples are shown in the following tables.
TABLE-US-00028 TABLE 28 TABLE IIIE 3% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex Ex Ex. III-E1 III-E2 III-E3 III-E4 III-E5 III-E6 III-E1 III-E2
III-E3 III-E7 II- I-E4 Com- As (mass 0 10 20 25 25 40 40 40 40 40
50 po- ppm) sition Sb (mass 0.000 0.000 0.000 0.000 0.002 0.000
0.010 0.100 0.500 1.00- 0 0.010 %) Ag (mass 3.000 3.000 3.000 3.000
3.000 3.000 3.000 3.000 3.000 3.000 3.0- 00 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.5- 00 %) Eval-
Presence x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. uation of As- Enriched Layer
Inhibition x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircl- e. Wet- tability Com- x x x x x x .smallcircle.
.smallcircle. .smallcircle. x .smallcircle- . pre- hensive Eval-
uation Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex Ex III-E5 III-E6 III-E7
III-E8 III-E9 III-E10 III-E11 III-E12 III-E13 Com- As (mass 60 70
80 90 100 100 100 100 100 po- ppm) sition Sb (mass 0.010 0.010
0.010 0.010 0.002 0.005 0.010 0.050 0.100 %) Ag (mass 3.000 3.000
3.000 3.000 3.000 3.000 3.000 3.000 3.000 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 %) Eval- Presence
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle.
.smallcircle. uation of As- Enriched Layer Inhibition .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. .smallcircle. of Viscosity
Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcir- cle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Wet- tability Com- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. .smallcircle. .smallcircle. pre-
hensive Eval- uation
TABLE-US-00029 TABLE 29 Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. III-E14 III-E8 III-E15 III-E16 III-E17 III-E18
III-E19 III-E20 III-E9 III-- E21 III-E22 III-E23 100 100 150 150
150 150 150 150 150 200 200 200 0.500 1.000 0.002 0.005 0.010 0.050
0.100 0.500 1.000 0.002 0.005 0.010 3.000 3.000 3.000 3.000 3.000
3.000 3.000 3.000 3.000 3.000 3.000 3.000 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. III-E24 III-E25 III-E26 III-E10 III-E27 III-E28 III-E29
III-E30 III-E31 II- I-E32 III-E11 III-E12 200 200 200 200 250 250
250 250 250 250 250 500 0.050 0.100 0.500 1.000 0.002 0.005 0.010
0.050 0.100 0.500 1.000 0.000 3.000 3.000 3.000 3.000 3.000 3.000
3.000 3.000 3.000 3.000 3.000 3.000 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle.
.smallcircle. .smallcircle. x x .smallcircle. .smallcircle.
.smallcircle. x .smallcircle. .smallcircle. .s- mallcircle.
.smallcircle. .smallcircle. .smallcircle. x x
Examples III-F1 to III-F32 and Comparative Examples III-F1 to
III-F12
Sn, As, Sb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 3.5% by mass, and the contents of
As and Sb shown in Table IIIF below with a balance of Sn (balance
for making the sum of Sn, As, Sb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples III-F1
to III-F6, however, a heat treatment was not performed but a powder
as is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Sb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, and (3) the solder
wettability of the solder powders of the examples and comparative
examples are shown in the following tables.
TABLE-US-00030 TABLE 30 TABLE IIIF 4% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex Ex Ex. III-F1 III-F2 III-F3 III-F4 III-F5 III-F6 III-F1 III-F2
III-F3 III-F7 II- I-F4 Com- As (mass 0 10 20 25 25 40 40 40 40 40
50 po- ppm) sition Sb (mass 0.000 0.000 0.000 0.000 0.002 0.000
0.010 0.100 0.500 1.00- 0 0.010 %) Ag (mass 4.000 4.000 4.000 4.000
4.000 4.000 4.000 4.000 4.000 4.000 4.0- 00 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.5- 00 %) Eval-
Presence x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. uation of As- Enriched Layer
Inhibition x x x x x x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircl- e. Wet- tability Com- x x x x x x .smallcircle.
.smallcircle. .smallcircle. x .smallcircle- . pre- hensive Eval-
uation Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex Ex III-F5 III-F6 III-F7
III-F8 III-F9 III-F10 III-F11 III-F12 III-F13 Com- As (mass 60 70
80 90 100 100 100 100 100 po- ppm) sition Sb (mass 0.010 0.010
0.010 0.010 0.002 0.005 0.010 0.050 0.100 %) Ag (mass 4.000 4.000
4.000 4.000 4.000 4.000 4.000 4.000 4.000 %) Cu (mass 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 %) Eval- Presence
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle.
.smallcircle. uation of As- Enriched Layer Inhibition .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. .smallcircle. of Viscosity
Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcir- cle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Wet- tability Com- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. .smallcircle. .smallcircle. pre-
hensive Eval- uation
TABLE-US-00031 TABLE 31 Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. III-F14 III-F8 III-F15 III-F16 III-F17 III-F18
III-F19 III-F20 III-F9 III-- F21 III-F22 III-F23 100 100 150 150
150 150 150 150 150 200 200 200 0.500 1.000 0.002 0.005 0.010 0.050
0.100 0.500 1.000 0.002 0.005 0.010 4.000 4.000 4.000 4.000 4.000
4.000 4.000 4.000 4.000 4.000 4.000 4.000 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. III-F24 III-F25 III-F26 III-F10 III-F27 III-F28 III-F29
III-F30 III-F31 II- I-F32 III-F11 III-F12 200 200 200 200 250 250
250 250 250 250 250 500 0.050 0.100 0.500 1.000 0.002 0.005 0.010
0.050 0.100 0.500 1.000 0.000 4.000 4.000 4.000 4.000 4.000 4.000
4.000 4.000 4.000 4.000 4.000 4.000 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle.
.smallcircle. .smallcircle. x x .smallcircle. .smallcircle.
.smallcircle. x .smallcircle. .smallcircle. .s- mallcircle.
.smallcircle. .smallcircle. .smallcircle. x x
IV. Sn--As--Pb-Containing Solder
Examples IV-A1 to IV-A35 and Comparative Examples IV-A1 to
IV-A12
Sn, As and Pb were weighed to satisfy the contents of As and Pb
shown in Table IVA below with a balance of Sn (balance for making
the sum of Sn, As and Pb 100% by mass), and were melt mixed, and
the resultant was centrifugally sprayed in an Ar atmosphere to
prepare a powder (average particle size: 21 .mu.m, classified as
No. 5 of the particle size classification (Table 2) of JIS
Z3284-1:2004). The thus obtained powder was heated with a drying
apparatus in the air at 60.degree. C. for 30 minutes to obtain a
solder powder of each of examples and comparative examples. In
Comparative Examples IV-A1 to IV-A6, however, a heat treatment was
not performed but a powder as is obtained by the centrifugal
spraying was used as a solder powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the content of Pb is shown in % by
mass with respect to the total mass of the solder material in the
following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00032 TABLE 32 TABLE IVA Comp. Comp. Comp. Comp. Comp.
Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Element IV-A1 IV-A2 IV-A3
IV-A4 IV-A5 IV-A6 IV-A1 IV-A2 Composition As 0 10 20 25 25 40 40 40
(mass ppm) Pb 0.000 0.000 0.000 0.000 0.002 0.000 0.010 0.700 (mass
%) Evaluation Presence of As- x x x x x x .smallcircle.
.smallcircle. Enriched Layer Inhibition of x x x x x x
.smallcircle. .smallcircle. Viscosity Increase Solder .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcirc- le.
.smallcircle. .smallcircle. .smallcircle. Wettability Reliability
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. (.DELTA.T
< 10.degree. C.) Comprehensive x x x x x x .smallcircle.
.smallcircle. Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-A7 IV-A3 IV-A4 IV-A5 IV-A6 IV-A7 IV-A8 IV-A9 Composition
As 40 50 60 70 80 90 100 100 (mass ppm) Pb 5.000 0.010 0.010 0.010
0.010 0.010 0.002 0.005 (mass %) Evaluation Presence of As-
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle.- .smallcircle. .smallcircle. .smallcircle. Enriched
Layer Inhibition of .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. - .smallcircle. .smallcircle.
.smallcircle. Viscosity Increase Solder .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcirc- le. .smallcircle.
.smallcircle. .smallcircle. Wettability Reliability x .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. -
.smallcircle. .smallcircle. (.DELTA.T < 10.degree. C.)
Comprehensive x .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
Evaluation Comp. Ex. Ex. Ex Ex Ex. Ex. Element IV-A10 IV-A11 IV-A12
IV-A13 IV-A14 IV-A8 Composition As 100 100 100 100 100 100 (mass
ppm) Pb 0.010 0.050 0.100 0.500 0.700 5.000 (mass %) Evaluation
Presence of As- .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle.- .smallcircle. Enriched Layer
Inhibition of .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. - .smallcircle. Viscosity Increase
Solder .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcirc- le. .smallcircle. Wettability Reliability .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x -
(.DELTA.T < 10.degree. C.) Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle. x
Evaluation
TABLE-US-00033 TABLE 33 Ex. Ex. Ex. Ex. Ex. Ex. Ex. Comp. Ex. Ex.
Ex. Ex. Ex. IV- IV- IV- IV- IV- IV- IV- Ex. IV- IV- IV- IV- IV- A15
A16 A17 A18 A19 A20 A21 IV-A9 A22 A23 A24 A25 A26 150 150 150 150
150 150 150 150 200 200 200 200 200 0.002 0.005 0.010 0.050 0.100
0.500 0.700 5.000 0.002 0.005 0.010 0.050 0.100 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallci- rcle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .sma-
llcircle. .smallcircle. x .smallcircle. .smallcircle. .smallcircle.
.small- circle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .small-
circle. .smallcircle. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. Ex. IV- IV- IV- IV- IV- IV- IV- IV- IV- IV- IV- IV-
A27 A28 A10 A29 A30 A31 A32 A33 A34 A35 A11 A12 200 200 200 250 250
250 250 250 250 250 250 500 0.500 0.700 5.000 0.002 0.005 0.010
0.050 0.100 0.500 0.700 5.000 0.000 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallc-
ircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle. x
.smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .- smallcircle.
.smallcircle. .smallcircle. .smallcircle. x x
Examples IV-B1 to IV-B35 and Comparative Examples IV-B1 to
IV-B12
Sn, As, Pb and Cu were weighed to satisfy a content of Cu of 0.7%
by mass and the contents of As and Pb shown in Table IVB below with
a balance of Sn (balance for making the sum of Sn, As, Pb and Cu
100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 5 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples B1 to B6, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Pb and Cu are shown
in % by mass with respect to the total mass of the solder material
in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00034 TABLE 34 TABLE IVB 0% Ag and 0.7% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-B1 IV-B2 IV-B3 IV-B4 IV-B5 IV-B6 IV-B1 IV-B2 Composition
As 0 10 20 25 25 40 40 40 (mass ppm) Pb 0.000 0.000 0.000 0.000
0.002 0.000 0.010 0.700 (mass %) Cu 0.700 0.700 0.700 0.700 0.700
0.700 0.700 0.700 (mass %) Evaluation Presence of As- x x x x x x
.smallcircle. .smallcircle. Enriched Layer Inhibition of x x x x x
x .smallcircle. .smallcircle. Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcirc-
le. .smallcircle. .smallcircle. .smallcircle. Wettability
Reliability .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. (.DELTA.T
< 10.degree. C.) Comprehensive x x x x x x .smallcircle.
.smallcircle. Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-B7 IV-B3 IV-B4 IV-B5 IV-B6 IV-B7 IV-B8 IV-B9 Composition
As 40 50 60 70 80 90 100 100 (mass ppm) Pb 5.000 0.010 0.010 0.010
0.010 0.010 0.002 0.005 (mass %) Cu 0.700 0.700 0.700 0.700 0.700
0.700 0.700 0.700 (mass %) Evaluation Presence of As- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.-
.smallcircle. .smallcircle. .smallcircle. Enriched Layer Inhibition
of .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. - .smallcircle. .smallcircle. .smallcircle. Viscosity
Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcirc- le. .smallcircle. .smallcircle.
.smallcircle. Wettability Reliability x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. - .smallcircle.
.smallcircle. (.DELTA.T < 10.degree. C.) Comprehensive x
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .-
smallcircle. .smallcircle. .smallcircle. Evaluation Comp. Ex. Ex.
Ex Ex Ex. Ex. Element IV-B10 IV-B11 IV-B12 IV-B13 IV-B14 IV-B8
Composition As 100 100 100 100 100 100 (mass ppm) Pb 0.010 0.050
0.100 0.500 0.700 5.000 (mass %) Cu 0.700 0.700 0.700 0.700 0.700
0.700 (mass %) Evaluation Presence of As- .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.-
.smallcircle. Enriched Layer Inhibition of .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. -
.smallcircle. Viscosity Increase Solder .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcirc- le. .smallcircle.
Wettability Reliability .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. x - (.DELTA.T < 10.degree. C.)
Comprehensive .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sm- allcircle. x Evaluation
TABLE-US-00035 TABLE 35 Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. IV- IV- IV- IV- IV-B15 IV-B16 IV-B17 IV-B18 IV-B19
IV-B20 IV-B21 IV-B9 IV-B22 B23 B24 B25 - B26 150 150 150 150 150
150 150 150 200 200 200 200 200 0.002 0.005 0.010 0.050 0.100 0.500
0.700 5.000 0.002 0.005 0.010 0.050 0.- 100 0.700 0.700 0.700 0.700
0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.- 700
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallci- rcle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallci- rcle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .small-
circle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. x .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smal- lcircle. Comp. Ex.
Ex. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. IV- IV- Ex. Ex.
IV-B27 IV-B28 IV-B10 IV-B29 IV-B30 IV-B31 IV-B32 IV-B33 B34 B35
IV-B11 IV- -812 200 200 200 250 250 250 250 250 250 250 250 500
0.500 0.700 5.000 0.002 0.005 0.010 0.050 0.100 0.500 0.700 5.000
0.000 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700 0.700
0.700 0.700 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sm- allcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallc- ircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sm- allcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallc- ircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sm- allcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallc- ircle. x .smallcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .-
smallcircle. .smallcircle. .smallcircle. .smallcircle. x x
.smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
.smallcircle. x x
Examples IV-C1 to IV-C35 and Comparative Examples IV-C1 to
IV-C12
Sn, As, Pb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 1.0% by mass, and the contents of
As and Pb shown in Table IVC below with a balance of Sn (balance
for making the sum of Sn, As, Pb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples IV-C1 to
IV-C6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Pb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
The solder powder obtained in Example IV-C1 was analyzed for the
contents of Sn, As, Pb, Ag and Cu by ICP-AES in accordance with JIS
Z 3910, and it was confirmed that these contents accorded with
those of the starting materials.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00036 TABLE 36 TABLE IVC 1% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-C1 IV-C2 IV-C3 IV-C4 IV-C5 IV-C6 IV-C1 IV-C2 Composition
As (mass ppm) 0 10 20 25 25 40 40 40 Pb (mass %) 0.000 0.000 0.000
0.000 0.002 0.000 0.010 0.700 Ag (mass %) 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 Evaluation Presence of x x x x x x .smallcircle.
.smallcircle. As-Enriched Layer Inhibition x x x x x x
.smallcircle. .smallcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. .smallcircle. .smallcircle. Wettability
Reliability .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. (.DELTA.T
< 10.degree. C.) Compre- x x x x x x .smallcircle. .smallcircle.
hensive Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Element
IV-C7 IV-C3 IV-C4 IV-C5 IV-C6 IV-C7 IV-C8 IV-C9 Composition As
(mass ppm) 40 50 60 70 80 90 100 100 Pb (mass %) 5.000 0.010 0.010
0.010 0.010 0.010 0.002 0.005 Ag (mass %) 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 Evaluation Presence of .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. -
.smallcircle. .smallcircle. .smallcircle. As-Enriched Layer
Inhibition .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. of
Viscosity Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcir- cle. .smallcircle. .smallcircle.
.smallcircle. Wettability Reliability x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. - .smallcircle.
.smallcircle. (.DELTA.T < 10.degree. C.) Compre- x .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle.
.smallcircle. .smallcircle. hensive Evaluation Comp. Ex. Ex. Ex.
Ex. Ex. Ex. Element IV-C10 IV-C11 IV-C12 IV-C13 IV-C14 IV-C8
Composition As (mass ppm) 100 100 100 100 100 100 Pb (mass %) 0.010
0.050 0.100 0.500 0.700 5.000 Ag (mass %) 1.000 1.000 1.000 1.000
1.000 1.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. - .smallcircle. As-Enriched Layer
Inhibition .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. Wettability Reliability .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x -
(.DELTA.T < 10.degree. C.) Compre- .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcir- cle. x hensive
Evaluation
TABLE-US-00037 TABLE 37 Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex
Ex. Ex. Ex. Ex. IV- IV- IV- IV- IV-C5 IV-C16 IV-C17 IVC18 IV-C19
IV-C20 IV-C21 IV-C9 IV-C22 C23 C24 C25 C2- 6 150 150 150 150 150
150 150 150 200 200 200 200 200 0.002 0.005 0.010 0.050 0.100 0.500
0.700 5.000 0.002 0.005 0.010 0.050 0.100 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000 0.530 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallci- rcle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallci- rcle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .small-
circle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .small- circle.
.smallcircle. Comp. Ex. Ex. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. IV- IV- Ex. Ex. IV-C27 IV-C28 IV-C10 IV-C29 IV-C30 IV-C31
IV-C32 IV-C33 C34 C35 IV-C11 IV- -C12 200 200 200 250 250 250 250
250 250 250 250 500 0.500 0.700 5.000 0.002 0.005 0.010 0.050 0.100
0.500 0.700 5.000 0.000 1.000 1.000 1.000 1.000 1.000 1.000 1.000
1.000 1.000 1.000 1.000 1.000 0.500 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallc-
ircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle. x
.smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
.smallcircle. x x .smallcircle. .smallcircle. x .smallcircle.
.smallcircle. .smallcircle. .- smallcircle. .smallcircle.
.smallcircle. .smallcircle. x x
Examples IV-D1 to IV-D35 and Comparative Examples IV-D1 to
IV-D12
Sn, As, Pb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 2.0% by mass, and the contents of
As and Pb shown in Table IVD below with a balance of Sn (balance
for making the sum of Sn, As, Pb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples IV-D1 to
IV-D6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Pb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00038 TABLE 38 TABLE IVD 2% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-D1 IV-D2 IV-D3 IV-D4 IV-D5 IV-D6 IV-D1 IV-D2 Composition
As (mass ppm) 0 10 20 25 25 40 40 40 Pb (mass %) 0.000 0.000 0.000
0.000 0.002 0.000 0.010 0.700 Ag (mass %) 2.000 2.000 2.000 2.000
2.000 2.000 2.000 2.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 Evaluation Presence of x x x x x x .smallcircle.
.smallcircle. As-Enriched Layer Inhibition x x x x x x
.smallcircle. .smallcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. .smallcircle. .smallcircle. Wettability
Reliability .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. (.DELTA.T
< 10.degree. C.) Comprehensive x x x x x x .smallcircle.
.smallcircle. Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-D7 IV-D3 IV-D4 IV-D5 IV-D6 IV-D7 IV-D8 IV-D9 Composition
As (mass ppm) 40 50 60 70 80 90 100 100 Pb (mass %) 5.000 0.010
0.010 0.010 0.010 0.010 0.002 0.005 Ag (mass %) 2.000 2.000 2.000
2.000 2.000 2.000 2.000 2.000 Cu (mass %) 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 Evaluation Presence of .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. As-Enriched Layer
Inhibition .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. of
Viscosity Increase Solder .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcir- cle. .smallcircle. .smallcircle.
.smallcircle. Wettability Reliability x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. - .smallcircle.
.smallcircle. (.DELTA.T < 10.degree. C.) Comprehensive x
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. - .smallcircle. .smallcircle. Evaluation Comp. Ex.
Ex. Ex. Ex. Ex. Ex. Element IV-D10 IV-D11 IV-D12 IV-D13 IV-D14
IV-D8 Composition As (mass ppm) 100 100 100 100 100 100 Pb (mass %)
0.010 0.050 0.100 0.500 0.700 5.000 Ag (mass %) 2.000 2.000 2.000
2.000 2.000 2.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500 0.500
Evaluation Presence of .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .s- mallcircle. As-Enriched Layer
Inhibition .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. of Viscosity Increase Solder
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallcir-
cle. .smallcircle. Wettability Reliability .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x -
(.DELTA.T < 10.degree. C.) Comprehensive .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. x -
Evaluation
TABLE-US-00039 TABLE 39 Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. IV- IV- IV- IV- IV-D15 IVD16 IV-D17 IV-D18 IV-D19
IV-D20 IV-D21 IV-D9 IV-D22 D23 D24 D25 D- 26 150 150 150 150 150
150 150 150 200 200 200 200 200 0.002 0.005 0.010 0.050 0.100 0.500
0.700 5.000 0.002 0.005 0.010 0.050 0.100 2.000 2.000 2.000 2.000
2.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallci- rcle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallci- rcle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .small-
circle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .small- circle.
.smallcircle. Comp. Ex. Ex. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. IV- IV- Ex. Ex. IV-D27 IV-D28 IV-D10 IV-D29 IV-D30 IV-D31
IV-D32 IV-D33 D34 D35 IV-D11 IV- -D12 200 200 200 250 250 250 250
250 250 250 250 500 0.500 0.700 5.000 0.002 0.005 0.010 0.050 0.100
0.500 0.700 5.000 0.000 2.000 2.000 2.000 2.000 2.000 2.000 2.000
2.000 2.000 2.000 2.000 2.000 0.500 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallc-
ircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle. x
.smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
.smallcircle. x x .smallcircle. .smallcircle. x .smallcircle.
.smallcircle. .smallcircle. .- smallcircle. .smallcircle.
.smallcircle. .smallcircle. x x
Examples IV-E1 to IV-E35 and Comparative Examples IV-E1 to
IV-E12
Sn, As, Pb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 3.0% by mass, and the contents of
As and Pb shown in Table IVE below with a balance of Sn (balance
for making the sum of Sn, As, Pb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples IV-E1 to
IV-E6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Pb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00040 TABLE 40 TABLE IVE 3% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-E1 IV-E2 IV-E3 IV-E4 IV-E5 IV-E6 IV-E1 IV-E2 Composition
As (mass ppm) 0 10 20 25 25 40 40 40 Pb (mass %) 0.000 0.000 0.000
0.000 0.002 0.000 0.010 0.700 Ag (mass %) 3.000 3.000 3.000 3.000
3.000 3.000 3.000 3.000 Cu (mass %) 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 Evaluation Presence of x x x x x x .smallcircle.
.smallcircle. As-Enriched Layer Inhibition of x x x x x x
.smallcircle. .smallcircle. Viscosity Increase Solder Wettability
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. .smallcircle. .smallcircle. Reliability
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. .smallcircle. .smallcircle. (.DELTA.T
< 10.degree. C.) Comprehensive x x x x x x .smallcircle.
.smallcircle. Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Element IV-E7 IV-E3 IV-E4 IV-E5 IV-E6 IV-E7 IV-E8 IV-E9 Composition
As (mass ppm) 40 50 60 70 80 90 100 100 Pb (mass %) 5.000 0.010
0.010 0.010 0.010 0.010 0.002 0.005 Ag (mass %) 3.000 3.000 3.000
3.000 3.000 3.000 3.000 3.000 Evaluation Cu (mass %) 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 Presence of .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .s-
mallcircle. .smallcircle. .smallcircle. As-Enriched Layer
Inhibition of .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .s- mallcircle. .smallcircle.
.smallcircle. Viscosity Increase Solder Wettability .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . .smallcircle.
.smallcircle. .smallcircle. .smallcircle. Reliability x
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. - .smallcircle. .smallcircle. (.DELTA.T <
10.degree. C.) Comprehensive x .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. - .smallcircle.
.smallcircle. Evaluation Comp. Ex. Ex. Ex. Ex. Ex. Ex. Element
IV-E10 IV-E11 IV-E12 IV-E13 IV-E14 IV-E8 Composition As (mass ppm)
100 100 100 100 100 100 Pb (mass %) 0.010 0.050 0.100 0.500 0.700
5.000 Ag (mass %) 3.000 3.000 3.000 3.000 3.000 3.000 Cu (mass %)
0.500 0.500 0.500 0.500 0.500 0.500 Evaluation Presence of
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. As-Enriched Layer Inhibition of
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .s- mallcircle. Viscosity Increase Solder Wettability
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. Reliability .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. x - (.DELTA.T <
10.degree. C.) Comprehensive .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. x - Evaluation
TABLE-US-00041 TABLE 41 Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Ex. Ex. Ex. IV- IV- IV- IV- IV-E15 IV-E16 IV-E17 IV-E18 IV-E19
IV-E20 IV-E21 IV-E9 IV-E22 E23 E24 E25 - E26 150 150 150 150 150
150 150 150 200 200 200 200 200 0.002 0.005 0.010 0.050 0.100 0.500
0.700 5.000 0.002 0.005 0.010 0.050 0.100 3.000 3.000 3.000 3.000
3.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallci- rcle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallci- rcle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .small-
circle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .small- circle.
.smallcircle. Comp. Ex. Ex. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. IV- IV- Ex. Ex. IV-E27 IV-E28 IV-E10 IV-E29 IV-E30 IV-E31
IV-E32 IV-E33 E34 E35 IV-E11 IV- -E12 200 200 200 250 250 250 250
250 250 250 250 500 0.500 0.700 5.000 0.002 0.005 0.010 0.050 0.100
0.500 0.700 5.000 0.000 3.000 3.000 3.000 3.000 3.000 3.000 3.000
3.000 3.000 3.000 3.000 3.000 0.500 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallc-
ircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle. x
.smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
.smallcircle. x x .smallcircle. .smallcircle. x .smallcircle.
.smallcircle. .smallcircle. .- smallcircle. .smallcircle.
.smallcircle. .smallcircle. x x
Examples IV-F1 to IV-F35 and Comparative Examples IV-F1 to
IV-F12
Sn, As, Pb, Ag and Cu were weighed to satisfy a content of Cu of
0.5% by mass, a content of Ag of 3.5% by mass, and the contents of
As and Pb shown in Table IVF below with a balance of Sn (balance
for making the sum of Sn, As, Pb, Ag and Cu 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 5 of the particle size classification). The thus
obtained powder was heated with a drying apparatus in the air at
60.degree. C. for 30 minutes to obtain a solder powder of each of
examples and comparative examples. In Comparative Examples IV-F1 to
IV-F6, however, a heat treatment was not performed but a powder as
is obtained by the centrifugal spraying was used as a solder
powder.
The content of As is shown in ppm by mass with respect to the total
mass of the solder material and the contents of Pb, Ag and Cu are
shown in % by mass with respect to the total mass of the solder
material in the following tables.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
tables.
TABLE-US-00042 TABLE 42 TABLE IVF 3.5% Ag and 0.5% Cu added Comp.
Comp. Comp. Comp. Comp. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. Element IV-F1 IV-F2 IV-F3 IV-F4 IV-F5 IV-F6 IV-F1 IV-F2 IV-F7
Composition As (mass ppm) 0 10 20 25 25 40 40 40 40 Pb (mass %)
0.000 0.000 0.000 0.000 0.002 0.000 0.010 0.700 5.000 Ag (mass %)
3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500 Cu (mass %)
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 Evaluation
Presence of As-Enriched Layer x x x x x x .smallcircle.
.smallcircle. .smallcircle. Inhibition of Viscosity Increase x x x
x x x .smallcircle. .smallcircle. .smallcircle. Solder Wettability
.smallcircle. .smallcircle. .smallcircle. .smallcircle- .
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. Reliability (.DELTA.T < 10.degree. C.)
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle.- .smallcircle. .smallcircle. .smallcircle. x
Comprehensive Evaluation x x x x x x .smallcircle. .smallcircle. x
Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Element IV-F3 IV-F4 IV-F5 IV-F6
IV-F7 IV-F8 IV-F9 IV-F10 IV-F11 Composition As (mass ppm) 50 60 70
80 90 100 100 100 100 Pb (mass %) 0.010 0.010 0.010 0.010 0.010
0.002 0.005 0.010 0.050 Ag (mass %) 3.500 3.500 3.500 3.500 3.500
3.500 3.500 3.500 3.500 Cu (mass %) 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 Evaluation Presence of As-Enriched Layer
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircl- e. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. Inhibition of Viscosity Increase .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallci- rcle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. Solder
Wettability .smallcircle. .smallcircle. .smallcircle. .smallcircle-
. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. Reliability (.DELTA.T < 10.degree. C.)
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle.- .smallcircle. .smallcircle. .smallcircle.
.smallcircle. Comprehensive Evaluation .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .small- circle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. Comp. Ex. Ex. Ex. Ex.
Element IV-F12 IV-F13 IV-F14 IV-F8 Composition As (mass ppm) 100
100 100 100 Pb (mass %) 0.100 0.500 0.700 5.000 Ag (mass %) 3.500
3.500 3.500 3.500 Cu (mass %) 0.500 0.500 0.500 0.500 Evaluation
Presence of As-Enriched Layer .smallcircle. .smallcircle.
.smallcircle. .smallcircle. Inhibition of Viscosity Increase
.smallcircle. .smallcircle. .smallcircle. .smallcircle. Solder
Wettability .smallcircle. .smallcircle. .smallcircle. .smallcircle-
. Reliability (.DELTA.T < 10.degree. C.) .smallcircle.
.smallcircle. .smallcircle. x Comprehensive Evaluation
.smallcircle. .smallcircle. .smallcircle. x
TABLE-US-00043 TABLE 43 Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex. Ex Ex.
Ex. Ex. IV- IV- Ex. Ex. IV-F15 IV-F16 IV-F17 IV-F18 IV-F19 IV-F20
IV-F21 IV-F9 IV-F22 F23 F24 IV-F- 25 IV-F26 150 150 150 150 150 150
150 150 200 200 200 200 200 0.002 0.005 0.010 0.050 0.100 0.500
0.700 5.000 0.002 0.005 0.010 0.050 0.100 3.500 3.500 3.500 3.500
3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500 3.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500 0.500
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .sma- llcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallci- rcle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallci- rcle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallci-
rcle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sma- llcircle.
.smallcircle. x .smallcircle. .smallcircle. .smallcircle. .small-
circle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sma- llcircle. .smallcircle. x
.smallcircle. .smallcircle. .smallcircle. .small- circle.
.smallcircle. Comp. Ex. Ex. Comp. Comp. Ex. Ex. Ex. Ex. Ex. Ex. Ex.
Ex. IV- IV- Ex. Ex. IV-F27 IV-F28 IV-F10 IV-F29 IV-F30 IV-F31
IV-F32 IV-F33 F34 F35 IV-F11 IV- -F12 200 200 200 250 250 250 250
250 250 250 250 500 0.500 0.700 5.000 0.002 0.005 0.010 0.050 0.100
0.500 0.700 5.000 0.000 3.500 3.500 3.500 3.500 3.500 3.500 3.500
3.500 3.500 3.500 3.500 3.500 0.500 0.500 0.500 0.500 0.500 0.500
0.500 0.500 0.500 0.500 0.500 0.500 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .sm- allcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle. .smallc-
ircle. .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .sm- allcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallc- ircle. x
.smallcircle. .smallcircle. x .smallcircle. .smallcircle.
.smallcircle. .- smallcircle. .smallcircle. .smallcircle.
.smallcircle. x x .smallcircle. .smallcircle. x .smallcircle.
.smallcircle. .smallcircle. .- smallcircle. .smallcircle.
.smallcircle. .smallcircle. x x
V. Sn--As--(Sb, Bi and Pb)-Containing Solder
Examples V-A1 to V-A18 and Comparative Examples V-A1 to V-A24
Sn, As, Sb, Bi and Pb were weighed to satisfy the contents of As,
Sb, Bi and Pb shown in Table VA below with a balance of Sn (balance
for making the sum of Sn, As, Sb, Bi and Pb 100% by mass), and were
melt mixed, and the resultant was centrifugally sprayed in an Ar
atmosphere to prepare a powder (average particle size: 21 .mu.m,
classified as No. 4 of the particle size classification (Table 2)
of JIS Z3284-1:2004). The thus obtained powder was heated with a
drying apparatus in the air at 60.degree. C. for 30 minutes to
obtain a solder powder of each of examples and comparative
examples. In Comparative Examples V-A3 to V-A14, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
table.
TABLE-US-00044 TABLE 44 Evaluation Item Presence Inhibition Formula
(1) Formula (2) of As- of Synthesis Composition (mass ppm) 2As + Sb
+ (2As + Sb)/ Enriched Viscosity Reliability Solder Comprehensive
As Sb Bi Pb Bi + Pb (Bi + Pb) Layer Increase (.DELTA.T) Wettability
Evaluation Ex. V-A1 100 25 25 25 275 4.50 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-A2
100 50 25 0 275 10.00 .smallcircle. .smallcircle. .smallcircle. .-
smallcircle. .smallcircle. Ex. V-A3 100 0 75 0 275 2.67
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-A4 100 0 0 75 275 2.67 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-A5
100 50 50 50 350 2.50 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-A6 50 100 100 50 350 1.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-A7 250 0 300 300 1100 0.83 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-A8
200 300 250 250 1200 1.40 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-A9 100 500 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-A10 200 50 600 850 1900 0.31 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-A11
200 500 500 500 1900 0.90 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-A12 200 500 1000 0 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-A13 200 500 0 1000 1900 0.90 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-A14
40 500 350 1000 1930 0.43 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-A15 100 3000 300 300 3800 5.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-A16 100 0 0 5100 5300 0.04 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-A17
100 0 10000 0 10200 0.02 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-A18 100 0 10000 5000 15200 0.01
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Comp. 0 100 100 100 300 0.50 x x .smallcircle.
.smallcircle. x Ex. V-A1 Comp. 40 0 0 0 80 -- .smallcircle. x
.smallcircle. .smallcircle. x Ex. V-A2 Comp. Ex. V-A3 40 20 0 0 100
-- x x .smallcircle. .smallcircle. x Comp. Ex. V-A4 40 0 20 0 100
-- x x .smallcircle. .smallcircle. x Comp. Ex. V-A5 40 0 0 20 100
-- x x .smallcircle. .smallcircle. x Comp. Ex. V-A6 10 20 0 0 40 --
x x .smallcircle. .smallcircle. x Comp. Ex. V-A7 10 0 20 0 40 1.00
x x .smallcircle. .smallcircle. x Comp. Ex. V-A8 10 0 0 20 40 1.00
x x .smallcircle. .smallcircle. x Comp. Ex. V-A9 20 20 0 0 60 -- x
x .smallcircle. .smallcircle. x Comp. Ex. V-A10 20 0 20 0 60 2.00 x
x .smallcircle. .smallcircle. x Comp. Ex. V-A11 20 0 0 20 60 2.00 x
x .smallcircle. .smallcircle. x Comp. Ex. V-A12 25 20 0 0 70 -- x x
.smallcircle. .smallcircle. x Comp. Ex. V-A13 25 0 20 0 70 2.50 x x
.smallcircle. .smallcircle. x Comp. Ex. V-A14 25 0 0 20 70 2.50 x x
.smallcircle. .smallcircle. x Comp. Ex. V-A15 300 500 50 50 1200
11.00 .smallcircle. .smallcircle. .smallcircle. x x Comp. Ex. V-A16
350 1150 25 25 1900 37.00 .smallcircle. .smallcircle. .smallcircle.
x x Comp. Ex. V-A17 800 800 100 100 2600 12.00 .smallcircle.
.smallcircle. .smallcircle. x x Comp. Ex. V-A18 800 3500 100 100
5300 25.50 .smallcircle. .smallcircle. .smallcircle. x x Comp. Ex.
V-A19 100 10000 1 0 10201 10200.00 .smallcircle. .smallcircle.
.smallc- ircle. x x Comp. Ex. V-A20 100 100 50000 0 50300 0.01
.smallcircle. .smallcircle. x .smallcircle. x Comp. Ex. V-A21 100
100 0 50000 50300 0.01 .smallcircle. .smallcircle. x .smallcircle.
x Comp. Ex. V-A22 300 3000 0 0 3600 -- .smallcircle. .smallcircle.
.smallcircle. x- x Comp. Ex. V-A23 250 5100 0 0 5600 --
.smallcircle. .smallcircle. .smallcircle. x- x Comp. Ex. V-A24 100
0 100 25000 25300 0.01 .smallcircle. .smallcircle. x .smallcircle.
x
Examples V-B1 to V-B18 and Comparative Examples V-B1 to V-B24
Sn, Cu, As, Sb, Bi and Pb were weighed to satisfy a content of Cu
of 0.7% by mass and the contents of As, Sb, Bi and Pb shown in
Table VB below with a balance of Sn (balance for making the sum of
Sn, Cu, As, Sb, Bi and Pb 100% by mass), and were melt mixed, and
the resultant was centrifugally sprayed in an Ar atmosphere to
prepare a powder (average particle size: 21 .mu.m, classified as
No. 4 of the particle size classification). The thus obtained
powder was heated with a drying apparatus in the air at 60.degree.
C. for 30 minutes to obtain a solder powder of each of examples and
comparative examples. In Comparative Examples V-B3 to V-B14,
however, a heat treatment was not performed but a powder as is
obtained by the centrifugal spraying was used as a solder
powder.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
table.
TABLE-US-00045 TABLE 45 Evaluation Item (1) Formula (2) Formula
Presence Inhibition Synthesis Composition Formula (1) Formula (2)
of As- of (As, Bi, Pb: mass ppm, Cu: mass %) 2As + Sb + (2As + Sb)/
Enriched Viscosity Reliability Solder Comprehensive Cu As Sb Bi Pb
Bi + Pb (Bi + Pb) Layer Increase (.DELTA.T) Wettability Evaluation
Ex. V-B1 0.7 100 25 25 25 275 4.50 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-B2 0.7 100 50 25
0 275 10.00 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircl- e. Ex. V-B3 0.7 100 0 75 0 275 2.67 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-B4
0.7 100 0 0 75 275 2.67 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-B5 0.7 100 50 50 50 350 2.50
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B6 0.7 50 100 100 50 350 1.33 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-B7
0.7 250 0 300 300 1200 1.00 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-B8 0.7 200 300
250 250 1200 1.40 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-B9 0.7 100 500 250 250 1200
1.40 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B10 0.7 200 50 600 850 1900 0.31
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B11 0.7 200 500 500 500 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B12 0.7 200 500 1000 0 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B13 0.7 200 500 0 1000 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B14 0.7 40 500 350 1000 1900 0.41
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B15 0.7 100 3000 300 300 3800 5.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-B16 0.7 100 0 0 5100 5300 0.04 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-B17
0.7 100 0 10000 0 10200 0.02 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-B18 0.7 100 0
10000 5000 15200 0.01 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Comp. 0.7 0 100 100 100 300 0.50 x x
.smallcircle. .smallcircle. x Ex. V-B1 Comp. 0.7 40 0 0 0 80 --
.smallcircle. x .smallcircle. .smallcircle. x Ex. V-B2 Comp. 0.7 40
20 0 0 100 -- x x .smallcircle. .smallcircle. x Ex. V-B3 Comp. 0.7
40 0 20 0 100 -- x x .smallcircle. .smallcircle. x Ex. V-B4 Comp.
0.7 40 0 0 20 100 -- x x .smallcircle. .smallcircle. x Ex. V-B5
Comp. 0.7 10 20 0 0 40 -- x x .smallcircle. .smallcircle. x Ex.
V-B6 Comp. 0.7 10 0 20 0 40 1.00 x x .smallcircle. .smallcircle. x
Ex. V-B7 Comp. 0.7 10 0 0 20 40 1.00 x x .smallcircle.
.smallcircle. x Ex. V-B8 Comp. 0.7 20 20 0 0 60 -- x x
.smallcircle. .smallcircle. x Ex. V-B9 Comp. 0.7 20 0 20 0 60 2.00
x x .smallcircle. .smallcircle. x Ex. V-B10 Comp. 0.7 20 0 0 20 60
2.00 x x .smallcircle. .smallcircle. x Ex. V-B11 Comp. 0.7 25 20 0
0 70 -- x x .smallcircle. .smallcircle. x Ex. V-B12 Comp. 0.7 25 0
20 0 70 2.50 x x .smallcircle. .smallcircle. x Ex. V-B13 Comp. 0.7
25 0 0 20 70 2.50 x x .smallcircle. .smallcircle. x Ex. V-B14 Comp.
0.7 300 500 50 50 1200 11.00 .smallcircle. .smallcircle.
.smallcircle. x x Ex. V-B15 Comp. 0.7 350 1150 25 25 1900 37.00
.smallcircle. .smallcircle. .smallcircle. x x Ex. V-B16 Comp. 0.7
800 800 100 100 2600 12.00 .smallcircle. .smallcircle.
.smallcircle. x x Ex. V-B17 Comp. 0.7 800 3500 100 100 5300 25.50
.smallcircle. .smallcircle. .smallcircle. x x Ex. V-B18 Comp. 0.7
100 10000 1 0 10201 10200.00 .smallcircle. .smallcircle. .smallc-
ircle. x x Ex. V-B19 Comp. 0.7 100 100 50000 0 50300 0.01
.smallcircle. .smallcircle. x .smallcircle. x Ex. V-B20 Comp. 0.7
100 100 0 50000 50300 0.01 .smallcircle. .smallcircle. x
.smallcircle. x Ex. V-B21 Comp. 0.7 300 3000 0 0 3600 --
.smallcircle. .smallcircle. .smallcircle. x- x Ex. V-B22 Comp. 0.7
250 5100 0 0 5600 -- .smallcircle. .smallcircle. .smallcircle. x- x
Ex. V-B23 Comp. 0.7 100 0 100 25000 25300 0.01 .smallcircle.
.smallcircle. x .smallcircle. x Ex. V-B24
Examples V-C1 to V-C18 and Comparative Examples V-CE to V-C24
Sn, Ag, Cu, As, Sb, Bi and Pb were weighed to satisfy a content of
Cu of 0.5% by mass, a content of Ag of 1.0% by mass, and the
contents of As, Sb, Bi and Pb shown in Table VC below with a
balance of Sn (balance for making the sum of Sn, Ag, Cu, As, Sb, Bi
and Pb 100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 4 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples V-C3 to V-C14, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
A 3N material containing an incidental impurity was used as Sn.
The solder powder obtained in Example V-C1 was analyzed for the
contents of Sn, Ag, Cu, As, Sb, Bi, and Pb by ICP-AES in accordance
with JIS Z 3910, and it was confirmed that these contents accorded
with those of the starting materials.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
table.
TABLE-US-00046 TABLE 46 (1) Formula (2) Formula Evaluation Item
Synthesis Composition Formula (1) Formula (2) Presence Inhibition
(As, Sb, Bi, Pb: mass 2As + (2As + of As- Viscosity Reli- Compre-
ppm, Ag, Cu: mass %) Sb + Sb)/ Enriched of ability Solder hensive
Ag Cu As Sb Bi Pb Bi + Pb (Bi + Pb) Layer Increase (.DELTA.T)
Wettability Evaluation Ex. V-C1 1 0.5 100 25 25 25 275 4.50
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C2 1 0.5 100 50 25 0 275 10.00 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircl- e. Ex. V-C3
1 0.5 100 0 75 0 275 2.67 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-C4 1 0.5 100 0 0 75 275 2.67
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C5 1 0.5 100 50 50 50 350 2.50 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-C6
1 0.5 50 100 100 50 350 1.33 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-C7 1 0.5 250 0
300 300 1200 1.00 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-C8 1 0.5 200 300 250 250 1200
1.40 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C9 1 0.5 100 500 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C10 1 0.5 200 50 600 850 1900 0.31
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C11 1 0.5 200 500 500 500 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C12 1 0.5 200 500 1000 0 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C13 1 0.5 200 500 0 1000 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C14 1 0.5 40 500 350 1000 1900 0.41
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C15 1 0.5 100 3000 300 300 3800 5.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C16 1 0.5 100 0 0 5100 5300 0.04
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C17 1 0.5 100 0 10000 0 10200 0.02
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-C18 1 0.5 100 0 10000 5000 15200 0.01
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Comp. 1 0.5 0 100 100 100 300 0.50 x x
.smallcircle. .smallcircle. x Ex. V-Cl Comp 1 0.5 40 0 0 0 80 --
.smallcircle. x .smallcircle. .smallcircle. x Ex. V-C2 Comp. 1 0.5
40 20 0 0 100 -- x x .smallcircle. .smallcircle. x Ex. V-C3 Comp. 1
0.5 40 0 20 0 100 -- x x .smallcircle. .smallcircle. x Ex. V-C4
Comp. 1 0.5 10 0 0 20 100 -- x x .smallcircle. .smallcircle. x Ex.
V-C5 Comp. 1 0.5 10 20 0 0 40 -- x x .smallcircle. .smallcircle. x
Ex. V-C6 Comp. 1 0.5 10 0 20 0 40 1.00 x x .smallcircle.
.smallcircle. x Ex. V-C7 Comp. 1 0.5 20 0 0 20 40 2.00 x x
.smallcircle. .smallcircle. x Ex. V-C8 Comp. 1 0.5 20 20 0 0 60 --
x x .smallcircle. .smallcircle. x Ex. V-C9 Comp. 1 0.5 20 0 20 0 60
2.00 x x .smallcircle. .smallcircle. x Ex. V-C10 Comp. 1 0.5 25 0 0
20 60 2.50 x x .smallcircle. .smallcircle. x Ex. V-C11 Comp. 1 0.5
25 20 0 0 70 -- x x .smallcircle. .smallcircle. x Ex. V-C12 Comp. 1
0.5 25 0 20 0 70 2.50 x x .smallcircle. .smallcircle. x Ex. V-C13
Comp. 1 0.5 25 0 0 20 70 2.50 x x .smallcircle. .smallcircle. x Ex.
V-C14 Comp. 1 0.5 300 500 50 50 1200 11.00 .smallcircle.
.smallcircle. .smallcircle. x x Ex. V-C15 Comp. 1 0.5 350 1150 25
25 1900 37.00 .smallcircle. .smallcircle. .smallcircle. x x Ex.
V-C16 Comp. 1 0.5 800 800 100 100 2600 12.00 .smallcircle.
.smallcircle. .smallcircle. x x Ex. V-C17 Comp. 1 0.5 800 3500 100
100 5300 25.50 .smallcircle. .smallcircle. .smallcircle. x x Ex.
V-C18 Comp. 1 0.5 100 10000 1 0 10201 10200.00 .smallcircle.
.smallcircle. .smallcircle. x- x Ex. V-C19 Comp. 1 0.5 100 100
50000 0 50300 0.01 .smallcircle. .smallcircle. x .smallcircle. x
Ex. V-C20 Comp. 1 0.5 100 100 0 50000 50300 0.01 .smallcircle.
.smallcircle. x .smallcircle. x Ex. V-C21 Comp. 1 0.5 300 3000 0 0
3600 -- .smallcircle. .smallcircle. .smallcircle. x x Ex. V-C22
Comp. 1 0.5 250 5100 0 0 5600 -- .smallcircle. .smallcircle.
.smallcircle. x x Ex. V-C23 Comp. 1 0.5 100 0 100 25000 25300 0.01
.smallcircle. .smallcircle. x .smallcircle. x Ex. V-C24
Examples V-D1 to V-D18 and Comparative Examples V-D1 to V-D24
Sn, Ag, Cu, As, Sb, Bi and Pb were weighed to satisfy a content of
Cu of 0.5% by mass, a content of Ag of 2.0% by mass, and the
contents of As, Sb, Bi and Pb shown in Table VD below with a
balance of Sn (balance for making the sum of Sn, Ag, Cu, As, Sb, Bi
and Pb 100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 4 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples V-D3 to V-D14, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
table.
TABLE-US-00047 TABLE 47 (1) Formula Evaluation Item Formula (1) (2)
Formula Presence Inhibition Synthesis Composition 2As + Formula (2)
of As- of Reli- Solder Compre- (As, Sb, Bi, Pb: mass ppm, Ag, Cu:
mass %) Sb + (2As + Sb)/ Enriched Viscosity ability Wett- hensive
Ag Cu As Sb Bi Pb Bi + Pb (Bi + Pb) Layer Increase (.DELTA.T)
ability Evaluation Ex. V-D1 2 0.5 100 25 25 25 275 4.50
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D2 2 0.5 100 50 25 0 275 10.00 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircl- e. Ex. V-D3
2 0.5 100 0 75 0 275 2.67 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-D4 2 0.5 100 0 0 75 275 2.67
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D5 2 0.5 100 50 50 50 350 2.50 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-D6
2 0.5 50 100 100 50 350 1.33 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-D7 2 0.5 250 0
300 300 1100 0.83 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-D8 2 0.5 200 300 250 250 1200
1.40 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D9 2 0.5 100 500 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D10 2 0.5 200 50 600 850 1900 0.31
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D11 2 0.5 200 500 500 500 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D12 2 0.5 200 500 1000 0 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D13 2 0.5 200 500 0 1000 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D14 2 0.5 40 500 350 1000 1930 0.43
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D15 2 0.5 100 3000 300 300 3800 5.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D16 2 0.5 100 0 0 5100 5300 0.04
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D17 2 0.5 100 0 10000 0 10200 0.02
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-D18 2 0.5 100 0 10000 5000 15200 0.01
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Comp. Ex. V-D1 2 0.5 0 100 100 100 300 0.50 x x
.smallcircle. .smallcircle. x Comp. 2 0.5 40 0 0 0 80 --
.smallcircle. x .smallcircle. .smallcircle. x Ex. V-D2 Comp. 2 0.5
40 20 0 0 100 -- x x .smallcircle. .smallcircle. x Ex. V-D3 Comp. 2
0.5 40 0 20 0 100 -- x x .smallcircle. .smallcircle. x Ex. V-D4
Comp. 2 0.5 10 0 0 20 100 -- x x .smallcircle. .smallcircle. x Ex.
V-D5 Comp. 2 0.5 10 20 0 0 40 -- x x .smallcircle. .smallcircle. x
Ex. V-D6 Comp. 2 0.5 10 0 20 0 40 1.00 x x .smallcircle.
.smallcircle. x Ex. V-D7 Comp. 2 0.5 20 0 0 20 40 2.00 x x
.smallcircle. .smallcircle. x Ex. V-D8 Comp. 2 0.5 20 20 0 0 60 --
x x .smallcircle. .smallcircle. x Ex. V-D9 Comp. 2 0.5 20 0 20 0 60
2.00 x x .smallcircle. .smallcircle. x Ex. V-D10 Comp. 2 0.5 25 0 0
20 60 2.50 x x .smallcircle. .smallcircle. x Ex. V-D11 Comp. 2 0.5
25 20 0 0 70 -- x x .smallcircle. .smallcircle. x Ex. V-D12 Comp. 2
0.5 25 0 20 0 70 2.50 x x .smallcircle. .smallcircle. x Ex. V-D13
Comp. 2 0.5 25 0 0 20 70 2.50 x x .smallcircle. .smallcircle. x Ex.
V-D14 Comp. 2 0.5 300 500 50 50 1200 11.00 .smallcircle.
.smallcircle. .smallcircle. x x Ex. V-D15 Comp. 2 0.5 350 1150 25
25 1900 37.00 .smallcircle. .smallcircle. .smallcircle. x x Ex.
V-D16 Comp. 2 0.5 800 800 100 100 2600 12.00 .smallcircle.
.smallcircle. .smallcircle. x x Ex. V-D17 Comp. 2 0.5 800 3500 100
100 5300 25.50 .smallcircle. .smallcircle. .smallcircle. x x Ex.
V-D18 Comp. 2 0.5 100 10000 1 0 10201 10200.00 .smallcircle.
.smallcircle. .smal- lcircle. x x Ex. V-D19 Comp. 2 0.5 100 100
50000 0 50300 0.01 .smallcircle. .smallcircle. x .smallcircle. x
Ex. V-D20 Comp. 2 0.5 100 100 0 50000 50300 0.01 .smallcircle.
.smallcircle. x .smallcircle. x Ex. V-D21 Comp. 2 0.5 300 3000 0 0
3600 -- .smallcircle. .smallcircle. .smallcircle.- x x Ex. V-D22
Comp. 2 0.5 250 5100 0 0 5600 -- .smallcircle. .smallcircle.
.smallcircle.- x x Ex. V-D23 Comp. 2 0.5 100 0 100 25000 25300 0.01
.smallcircle. .smallcircle. x .smallcircle. x Ex. V-D24
Examples V-E1 to V-E18 and Comparative Examples V-E1 to V-E24
Sn, Ag, Cu, As, Sb, Bi and Pb were weighed to satisfy a content of
Cu of 0.5% by mass, a content of Ag of 3.0% by mass, and the
contents of As, Sb, Bi and Pb shown in Table VE below with a
balance of Sn (balance for making the sum of Sn, Ag, Cu, As, Sb, Bi
and Pb 100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 4 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples V-E3 to V-E14, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
table.
TABLE-US-00048 TABLE 48 Evaluation Item Synthesis Composition
Presence Inhibition (As, Sb, Bi, Pb: mass Formula (1) Formula (2)
of As- of ppm, Ag, Cu: mass %) 2As + Sb + (2As + Sb)/ Enriched
Viscosity Reliability Solder Comprehensive Ag Cu As Sb Bi Pb Bi +
Pb (Bi + Pb) Layer Increase (.DELTA.T) Wettability Evaluation Ex.
V-El 3 0.5 100 25 25 25 275 4.50 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-E2 3 0.5 100 50
25 0 275 10.00 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircl- e. Ex. V-E3 3 0.5 100 0 75 0 275 2.67
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E4 3 0.5 100 0 0 75 275 2.67 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-E5
3 0.5 100 50 50 50 350 2.50 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-E6 3 0.5 50 100
100 50 350 1.33 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-E7 3 0.5 250 0 300 300 1200
1.00 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E8 3 0.5 200 300 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E9 3 0.5 100 500 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E10 3 0.5 200 50 600 850 1900 0.31
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E11 3 0.5 200 500 500 500 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E12 3 0.5 200 500 1000 0 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E14 3 0.5 200 500 0 1000 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E14 3 0.5 40 500 350 1000 1900 0.41
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E15 3 0.5 100 3000 300 300 3800 5.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E16 3 0.5 100 0 0 5100 5300 0.04
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E18 3 0.5 100 0 10000 0 10200 0.02
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-E18 3 0.5 100 0 10000 5000 15200 0.01
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Comp. Ex. V-E1 3 0.5 0 100 100 100 300 0.50
.smallcircle. x .smallcircle. .smallcircle. x Comp. Ex. V-E2 3 0.5
40 0 0 0 80 -- .smallcircle. x .smallcircle. .smallcircle. - x
Comp. Ex. V-E3 3 0.5 40 20 0 0 100 -- x x .smallcircle.
.smallcircle. x Comp. Ex. V-E4 3 0.5 40 0 20 0 100 -- x x
.smallcircle. .smallcircle. x Comp. Ex. V-E5 3 0.5 10 0 0 20 100 --
x x .smallcircle. .smallcircle. x Comp. Ex. V-E6 3 0.5 10 20 0 0 40
-- x x .smallcircle. .smallcircle. x Comp. Ex. V-E7 3 0.5 10 0 20 0
40 1.00 x x .smallcircle. .smallcircle. x Comp. Ex. V-E8 3 0.5 20 0
0 20 40 2.00 x x .smallcircle. .smallcircle. x Comp. Ex. V-E9 3 0.5
20 20 0 0 60 -- x x .smallcircle. .smallcircle. x Comp. Ex. V-E10 3
0.5 20 0 20 0 60 2.00 x x .smallcircle. .smallcircle. x Comp. Ex.
V-E11 3 0.5 25 0 0 20 60 2.50 x x .smallcircle. .smallcircle. x
Comp. Ex. V-E12 3 0.5 25 20 0 0 70 -- x x .smallcircle.
.smallcircle. x Comp. Ex. V-E13 3 0.5 25 0 20 0 70 2.50 x x
.smallcircle. .smallcircle. x Comp. Ex. V-E14 3 0.5 25 0 0 20 70
2.50 x x .smallcircle. .smallcircle. x Comp. Ex. V-El5 3 0.5 300
500 50 50 1200 11.00 .smallcircle. .smallcircle. .smallcircle. x x
Comp. Ex. V-E16 3 0.5 350 1150 25 25 1900 37.00 .smallcircle.
.smallcircle. .smallcircle. x x Comp. Ex. V-E17 3 0.5 800 800 100
100 2600 12.00 .smallcircle. .smallcircle. .smallcircle. x x Comp.
Ex. V-E18 3 0.5 800 3500 100 100 5300 25.50 .smallcircle.
.smallcircle. .smallcircle. x x Comp. Ex. V-E19 3 0.5 100 10000 1 0
10201 10200.00 .smallcircle. .smallcircle. .- smallcircle. x x
Comp. Ex. V-E20 3 0.5 100 100 50000 0 50300 0.01 .smallcircle.
.smallcircle. x .smallcircle. x Comp. Ex. V-E21 3 0.5 100 100 0
50000 50300 0.01 .smallcircle. .smallcircle. x .smallcircle. x
Comp. Ex. V-E22 3 0.5 300 3000 0 0 3600 -- .smallcircle.
.smallcircle. .smallcir- cle. x x Comp. Ex. V-E23 3 0.5 250 5100 0
0 5600 -- .smallcircle. .smallcircle. .smallcir- cle. x x Comp. Ex.
V-E24 3 0.5 100 0 100 25000 25300 0.01 .smallcircle. .smallcircle.
x .smallcircle. x
Examples V-F1 to V-F18 and Comparative Examples V-F1 to V-F24
Sn, Ag, Cu, As, Sb, Bi and Pb were weighed to satisfy a content of
Cu of 0.5% by mass, a content of Ag of 3.5% by mass, and the
contents of As, Sb, Bi and Pb shown in Table VF below with a
balance of Sn (balance for making the sum of Sn, Ag, Cu, As, Sb, Bi
and Pb 100% by mass), and were melt mixed, and the resultant was
centrifugally sprayed in an Ar atmosphere to prepare a powder
(average particle size: 21 .mu.m, classified as No. 4 of the
particle size classification). The thus obtained powder was heated
with a drying apparatus in the air at 60.degree. C. for 30 minutes
to obtain a solder powder of each of examples and comparative
examples. In Comparative Examples V-F3 to V-F14, however, a heat
treatment was not performed but a powder as is obtained by the
centrifugal spraying was used as a solder powder.
A 3N material containing an incidental impurity was used as Sn.
Results of the evaluations of (1) the presence of an As-enriched
layer, (2) the inhibition of viscosity increase, (3) the solder
wettability, and (4) the reliability of the solder powders of the
examples and comparative examples are shown in the following
table.
TABLE-US-00049 TABLE 49 (1) Formula (2) Formula Evaluation Item
Synthesis Composition Formula (1) Formula (2) Presence Inhibition
(As, Sb, Bi, Pb: mass 2As + (2As + of As- of Compre- ppm, Ag, Cu:
mass %) Sb + Sb)/ Enriched Viscosity Reli- Solder hensive Ag Cu As
Increase (.DELTA.T) Pb Bi + Pb (Bi + Pb) Layer Increase ability
Wettability Evaluation Ex. V-F1 3.5 0.5 100 25 25 25 275 4.50
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F2 3.5 0.5 100 50 25 0 275 10.00
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircl- e. Ex. V-F3 3.5 0.5 100 0 75 0 275 2.67 .smallcircle.
.smallcircle. .smallcircle. .smallcircle. .smallcircle- . Ex. V-F4
3.5 0.5 100 0 0 75 275 2.67 .smallcircle. .smallcircle.
.smallcircle. .smallcircle. .smallcircle- . Ex. V-F5 3.5 0.5 100 50
50 50 350 2.50 .smallcircle. .smallcircle. .smallcircle.
.smallcircle. .smallcircle- . Ex. V-F6 3.5 0.5 50 100 100 50 350
1.33 .smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F7 3.5 0.5 250 0 300 300 1100 0.83
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F8 3.5 0.5 200 300 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F9 3.5 0.5 100 500 250 250 1200 1.40
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F10 3.5 0.5 200 50 600 850 1900 0.31
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F11 3.5 0.5 200 500 500 500 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F12 3.5 0.5 200 500 1000 0 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F13 3.5 0.5 200 500 0 1000 1900 0.90
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F14 3.5 0.5 40 500 350 1000 1930 0.43
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F15 3.5 0.5 100 3000 300 300 3800 5.33
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F16 3.5 0.5 100 0 0 5100 5300 0.04
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F17 3.5 0.5 100 0 10000 0 10200 0.02
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Ex. V-F18 3.5 0.5 100 0 10000 5000 15200 0.01
.smallcircle. .smallcircle. .smallcircle. .smallcircle.
.smallcircle- . Comp. Ex. 3.5 0.5 0 100 100 100 300 0.50 x x
.smallcircle. .smallcircle. x V-F1 Comp. Ex. 3.5 0.5 40 0 0 0 80 --
.smallcircle. x .smallcircle. .smallcircl- e. x V-F2 Comp. Ex. 3.5
0.5 40 20 0 0 100 -- x x .smallcircle. .smallcircle. x V-F3 Comp.
Ex. 3.5 0.5 40 0 20 0 100 -- x x .smallcircle. .smallcircle. x V-F4
Comp. Ex. 3.5 0.5 10 0 0 20 100 -- x x .smallcircle. .smallcircle.
x V-F5 Comp. Ex. 3.5 0.5 10 20 0 0 40 -- x x .smallcircle.
.smallcircle. x V-F6 Comp. Ex. 3.5 0.5 10 0 20 0 40 1.00 x x
.smallcircle. .smallcircle. x V-F7 Comp. Ex. 3.5 0.5 20 0 0 20 40
2.00 x x .smallcircle. .smallcircle. x V-F8 Comp. Ex. 3.5 0.5 20 20
0 0 60 -- x x .smallcircle. .smallcircle. x V-F9 Comp. Ex. 3.5 0.5
20 0 20 0 60 2.00 x x .smallcircle. .smallcircle. x V-F10 Comp. Ex.
3.5 0.5 25 0 0 20 60 2.50 x x .smallcircle. .smallcircle. x V-F11
Comp. Ex. 3.5 0.5 25 20 0 0 70 -- x x .smallcircle. .smallcircle. x
V-F12 Comp. Ex. 3.5 0.5 25 0 20 0 70 2.50 x x .smallcircle.
.smallcircle. x V-F13 Comp. Ex. 3.5 0.5 25 0 0 20 70 2.50 x x
.smallcircle. .smallcircle. x V-F14 Comp. Ex. 3.5 0.5 300 500 50 50
1200 11.00 .smallcircle. .smallcircle. .smallcircle. x x V-F15
Comp. Ex. 3.5 0.5 350 1150 25 25 1900 37.00 .smallcircle.
.smallcircle. .smallcircle. x x V-F16 Comp. Ex. 3.5 0.5 800 800 100
100 2600 12.00 .smallcircle. .smallcircle. .smallcircle. x x V-F17
Comp. Ex. 3.5 0.5 800 3500 100 100 5300 25.50 .smallcircle.
.smallcircle. .smallcircle. x x V-F18 Comp. Ex. 3.5 0.5 100 10000 1
0 10201 10200.00 .smallcircle. .smallcircle.- .smallcircle. x x
V-F19 Comp. Ex. 3.5 0.5 100 100 50000 0 50300 0.01 .smallcircle.
.smallcircle. x .smallcircle. x V-F20 Comp. Ex. 3.5 0.5 100 100 0
50000 50300 0.01 .smallcircle. .smallcircle. x .smallcircle. x
V-F21 Comp. Ex. 3.5 0.5 300 3000 0 0 3600 -- .smallcircle.
.smallcircle. .smallc- ircle. x x V-F22 Comp. Ex. 3.5 0.5 250 5100
0 0 5600 -- .smallcircle. .smallcircle. .smallc- ircle. x x V-F23
Comp. Ex. 3.5 0.5 100 0 100 25000 25300 0.01 .smallcircle.
.smallcircle. x .smallcircle. x V-F24
INDUSTRIAL APPLICABILITY
A solder material of the present invention is free from color
change and is excellent in solder wettability and reliability in
cycle characteristics and the like, and hence it can be used in
various applications. In particular, since viscosity increase with
time when in the form of a solder paste is small, the solder
material can be suitably used as a solder material for a solder
paste.
* * * * *
References