U.S. patent application number 11/000388 was filed with the patent office on 2006-06-01 for wet cleaning of electrostatic chucks.
Invention is credited to Armen Avoyan, Tuochuan Huang, Brian McMillin, Bruno Morel, Paul Mulgrew, Hong Shih, Catherine Zhou.
Application Number | 20060112969 11/000388 |
Document ID | / |
Family ID | 36462544 |
Filed Date | 2006-06-01 |
United States Patent
Application |
20060112969 |
Kind Code |
A1 |
Shih; Hong ; et al. |
June 1, 2006 |
WET CLEANING OF ELECTROSTATIC CHUCKS
Abstract
A non-destructive and simple method for cleaning a new or used
electrostatic chuck comprises a wet cleaning process, which removes
contaminants deposited on a surface of the electrostatic chuck.
Inventors: |
Shih; Hong; (Walnut, CA)
; Huang; Tuochuan; (Saratoga, CA) ; Zhou;
Catherine; (Fremont, CA) ; Morel; Bruno;
(Santa Clara, CA) ; McMillin; Brian; (Fremont,
CA) ; Mulgrew; Paul; (Mountain View, CA) ;
Avoyan; Armen; (Glendale, CA) |
Correspondence
Address: |
BUCHANAN INGERSOLL PC;(INCLUDING BURNS, DOANE, SWECKER & MATHIS)
POST OFFICE BOX 1404
ALEXANDRIA
VA
22313-1404
US
|
Family ID: |
36462544 |
Appl. No.: |
11/000388 |
Filed: |
December 1, 2004 |
Current U.S.
Class: |
134/1 ; 134/26;
134/27; 134/28; 134/29; 134/30; 134/31; 134/34; 134/35; 134/41;
134/42 |
Current CPC
Class: |
H01L 21/6704 20130101;
H01L 21/6831 20130101; B08B 3/12 20130101 |
Class at
Publication: |
134/001 ;
134/026; 134/027; 134/028; 134/029; 134/030; 134/031; 134/034;
134/035; 134/041; 134/042 |
International
Class: |
B08B 3/12 20060101
B08B003/12; B08B 3/00 20060101 B08B003/00; B08B 5/00 20060101
B08B005/00; B08B 3/10 20060101 B08B003/10; C23G 1/02 20060101
C23G001/02; B08B 7/00 20060101 B08B007/00 |
Claims
1. A method of cleaning an electrostatic chuck useful plasma
etching of a dielectric layer on a semiconductor substrate, the
chuck including a ceramic surface on which the semiconductor
substrate is supported during the etching, the method comprising
the steps of: a) contacting at least the ceramic surface of the
chuck with isopropyl alcohol; b) contacting at least the ceramic
surface of the chuck with a dilute acidic solution comprising a
hydrofluoric acid and nitric acid mixture and/or a dilute acidic
solution comprising a hydrochloric acid and hydrogen peroxide
mixture; c) contacting at least the ceramic surface of the chuck
with basic solution comprising hydrogen peroxide and ammonium
hydroxide; and d) subjecting the chuck to ultrasonic cleaning;
wherein contaminants are removed from the ceramic surface of the
chuck.
2. The method of claim 1, wherein the contaminants are selected
from the group consisting of metallic impurities, organic
impurities, fluoride impurities, electrode impurities, silicon
particles, surface particles, and combinations thereof.
3. The method of claim 2, wherein the chuck is a used chuck
previously used for supporting a semiconductor substrate during
plasma etching of a dielectric layer on the semiconductor
substrate, the used check containing fluoride impurities selected
from the group consisting of aluminum fluoride, titanium fluoride,
and combinations thereof on the ceramic surface, the cleaning
further comprising contacting the ceramic surface of the chuck with
tetramethyl ammonium hydroxide so as to remove fluoride
impurities.
4. The method of claim 2, wherein the chuck is a new or used chuck
previously used for supporting a semiconductor substrate during
plasma etching of a dielectric layer on the semiconductor
substrate, the used check containing organic impurities, the
cleaning removing organic impurities with the isopropyl alcohol
and/or the basic solution.
5. The method of claim 2, wherein the chuck is a new chuck
containing metallic impurities selected form the group consisting
of iron, chromium, nickel, molybdenum, vanadium, and combinations
thereof, the cleaning removing metallic impurities with the basic
solution and/or the dilute acidic solution.
6. The method of claim 2, wherein the chuck is a used chuck
previously used for supporting a semiconductor substrate during
plasma etching of a dielectric layer on the semiconductor
substrate, the used check containing fluoride impurities including
titanium fluoride, the cleaning removing titanium fluoride with the
basic solution.
7. The method of claim 2, wherein the chuck is a used chuck
previously used for supporting a semiconductor substrate during
plasma etching of a dielectric layer on the semiconductor
substrate, the used check containing silicon particles selected
from the group consisting of Si, SiO.sub.2, and combinations
thereof, the cleaning removing silicon particles with the dilute
acidic solution.
8. The method of claim 7, wherein the dilute acidic solution
comprises the hydrofluoric acid and nitric acid mixture, the
cleaning removing silicon particles with the hydrofluoric acid.
9. The method of claim 2, wherein the chuck is a new chuck
containing electrode impurities selected from the group consisting
of tungsten, phosphorus, and combinations thereof; and metallic
impurities selected form the group consisting of iron, chromium,
nickel, molybdenum, vanadium, and combinations thereof; the
cleaning removing electrode and metallic impurities with the dilute
acidic solution.
10. The method of claim 9, wherein the dilute acidic solution
comprises the hydrofluoric acid and nitric acid mixture, the
cleaning removing electrode and metallic impurities with the nitric
acid.
11. The method of claim 9, wherein the dilute acidic solution
comprises the hydrochloric acid and hydrogen peroxide mixture, the
cleaning removing electrode and metallic impurities with the
hydrochloric acid and hydrogen peroxide mixture.
12. The method of claim 2, wherein the ultrasonic cleaning removes
surface particles from the ceramic surface and particles trapped
inside lift pin holes and other passages in the chuck.
13. The method of claim 1, further comprising protecting electrical
contacts and exposed bonding material on the chuck by covering the
electrical contacts and bonding material with masking material
and/or chemical resistant tape.
14. The method of claim 1, wherein the cleaning comprises immersing
the chuck in the isopropyl alcohol, the basic solution, and/or
water during the ultrasonic cleaning.
15. The method of claim 1, wherein the chuck is a used chuck
previously used for supporting a semiconductor substrate during
plasma etching of a dielectric layer on the semiconductor
substrate, the used check and the cleaning comprises cleaning the
ceramic surface with a scouring pad.
16. The method of claim 15, wherein the scouring pad removes
polymer buildup on the used chuck.
17. The method of claim 1, further comprising testing performance
of the chuck in a plasma etching chamber before and/or after the
chuck has been cleaned.
18. The method of claim 1, further comprising analyzing the ceramic
surface to determine whether contaminants are found on the ceramic
surface before and/or after the cleaning.
19. The method of claim 1, comprising supporting the chuck in a
fixture with the ceramic surface facing downward while wiping the
ceramic surface with the dilute acidic solution and/or tetramethyl
ammonium hydroxide.
20. The method of claim 1, comprising contacting at least the
ceramic surface of the chuck with a dilute acidic solution
comprising a hydrofluoric acid and nitric acid mixture and a dilute
acidic solution comprising a hydrochloric acid and hydrogen
peroxide mixture.
21. The method of claim 1, wherein step b) follows step a), step c)
follows step b), and step d) follows step c).
22. An electrostatic chuck cleaned according to the method of claim
1.
Description
BACKGROUND
[0001] An electrostatic chuck (ESC), a component of semiconductor
processing equipment such as plasma etch chambers, can be used for
transporting, holding and/or temperature control of a semiconductor
wafer or glass substrate (i.e., flat panel display) during
processing, for example, in a chemical vapor deposition (CVD),
physical vapor deposition (PVD), or etch reactor. ESCs often
exhibit short lifetimes resulting in failures including, for
example, dynamic alignment failure, high leakage of helium cooling
gas between the ESC and the underside of a supported substrate,
increased dechucking time, and sticking of the substrate to the ESC
or dechucking failure. The early failure of ESCs can cause
substrate breakage, impact throughput, lead to particle and defect
issues, and increase ownership costs of plasma processing equipment
incorporating such ESCs.
SUMMARY
[0002] Provided is a method of cleaning a new or used electrostatic
chuck useful for plasma etching of a dielectric layer on a
semiconductor substrate. The chuck includes a ceramic surface on
which the semiconductor substrate is supported during the etching.
The method comprises contacting at least the ceramic surface of the
chuck with (a) isopropyl alcohol; (b) a basic solution that
comprises hydrogen peroxide and ammonium hydroxide; (c) a dilute
acidic solution that comprises a hydrofluoric acid and nitric acid
mixture and/or a dilute acidic solution that comprises a
hydrochloric acid and hydrogen peroxide mixture; and/or (d)
ultrasonic cleaning, whereby contaminants are removed from the
ceramic surface of the chuck. When cleaning a used chuck previously
used for supporting a semiconductor substrate during plasma etching
of a dielectric layer on the semiconductor substrate, the method
preferably further comprises contacting at least the ceramic
surface of the chuck with tetramethyl ammonium hydroxide.
DETAILED DESCRIPTION
[0003] A non-destructive and simple method for cleaning ESCs
comprises a wet cleaning process, which does not require stripping
or at least partial removal and redepositing a ceramic layer on the
ESC. The wet cleaning process comprises cleaning the ESC with
organic solvent, basic solution, optionally tetramethyl ammonium
hydroxide (TMAH), and dilute acidic solution, as well as ultrasonic
cleaning.
[0004] Scanning Electron Microscopy (SEM) and Energy Dispersive
Spectroscopy (EDS) analysis of used ESCs reveals deposition of
contaminants on ceramic ESC surfaces following etching. The
contaminants change the surface characteristics of the ESCs and
cause early failure, as ESC performance greatly depends on the
cleanliness of ESC surfaces. Among the contaminants deposited on
ESC surfaces during manufacturing of new chucks or when used for
dielectric plasma etching are organic impurities, metallic
impurities, fluoride impurities, electrode impurities, silicon
particles, surface particles, and combinations thereof. More
specifically, examples of fluoride impurities include, for example,
aluminum fluoride, titanium fluoride, and combinations thereof;
examples of metallic impurities include iron, chromium, nickel,
molybdenum, vanadium, and combinations thereof; examples of
electrode impurities include, tungsten, phosphorus, and
combinations thereof; examples of silicon particles include, for
example, Si, SiO.sub.2, and combinations thereof. It has been
surprisingly discovered that new ESCs can be preconditioned and
used ESCs can be recovered by cleaning the contaminants resulting
from manufacturing or deposited on the ESCs during etching to
refresh the ceramic surface by means of a wet cleaning process.
[0005] As used herein, dielectric ESCs refer to ESCs used in
dielectric etch processes such as plasma etching silicon oxide and
low-k materials. An exemplary dielectric ESC can comprise a metal
base (e.g., anodized or non-anodized aluminum alloy) with a ceramic
surface on which a semiconductor or substrate such as a wafer is
supported. As an example, the ceramic surface may comprise a
sintered laminate comprising a patterned refractory (e.g., tungsten
or molybdenum) electrode between two ceramic layers (e.g., thin
ceramic layers approximately 20 mils thick). The laminate may be
bonded to the metal base with a bonding material such as a silicone
based material containing conductive powders (e.g., aluminum,
silicon, or the like). The metal base, approximately 1.5 inches
thick, typically includes RF and DC power feeds, through holes for
lift pins, helium gas passages, channels for temperature controlled
fluid circulation, temperature sensing arrangements, and the
like.
[0006] ESCs are typically either Coulombic or Johnsen-Rahbek type.
Coulombic type ESCs use a dielectric surface layer having a higher
electrical resistance to generate coulombic electrostatic forces.
Johnsen-Rahbek type ESCs, which often provide higher electrostatic
clamping forces for a lower applied voltage, utilize lower
resistance dielectric surface layers such as Al.sub.2O.sub.3 doped
with, for example, TiO.sub.2.
[0007] According to an embodiment, the ceramic dielectric layer of
a Johnsen-Rahbek type ESC may comprise 94% Al.sub.2O.sub.3, 4%
SiO.sub.2, 1% TiO.sub.2, and 1% CaO, as well as trace amounts of
MgO, Si, Ti, Ca, and Mg. According to another embodiment, for a
Coulombic type ESC, the ceramic dielectric layer may comprise
greater than or equal to 99% Al.sub.2O.sub.3. Thus, depending on
the composition of the ceramic layer, elements such as Ti, Si, Mg,
and Ca may not be considered contaminants to be removed by the wet
cleaning process. In contrast, contaminants such as metal particles
and electrode particles (e.g., tungsten or molybdenum) are
preferably removed from the surface of the ESC by the wet cleaning
process.
[0008] Contaminants such as, for example, organic impurities,
metallic impurities, and electrode impurities may be found on new
ESCs while contaminants such as, for example, organic impurities,
fluoride impurities, and silicon particles, may be deposited on the
ceramic surface of used ESCs during dielectric etching. The
components of the wet cleaning process, i.e., organic solvent,
basic solution, optional TMAH, dilute acidic solutions, and
ultrasonic cleaning, serve to remove specific contaminants that may
be found on ceramic ESC surfaces.
[0009] For example, the isopropyl alcohol (IPA, 100%, conforming to
SEMI Specification C41-1101A, Grade 1 or better) serves to remove
organic impurities. While it is contemplated that other organic
solvents may be used, acetone is preferably avoided, as acetone may
attack the ESC bonding material.
[0010] The basic solution serves to remove organic impurities,
metallic impurities, and titanium fluoride. An exemplary basic
solution for use in the wet cleaning process may comprise hydrogen
peroxide (H.sub.2O.sub.2) (30%, semiconductor grade, conforming to
SEMI Specification C30-1101, Grade 1 or better) and ammonium
hydroxide (NH.sub.4OH) (29%, semiconductor grade, conforming to
SEMI Specification C21-0301, Grade 1 or better). Hydrogen peroxide
is a strong oxidizer with a high standard reduction potential. The
hydrogen peroxide can react with metal to form metal ions in the
weak basic solution of ammonium hydroxide and hydrogen peroxide,
which is stable at least up to 70.degree. C. The standard reduction
potential of hydrogen peroxide is:
H.sub.2O.sub.2+2H.sup.++2e.sup.-=2H.sub.2O E.degree.=1.776V (versus
standard hydrogen electrode (SHE)) and the standard reduction
potential of hydrogen peroxide in weak basic solution is:
HO.sub.2.sup.-+H.sub.2O+2e.sup.-=3OH.sup.- E.degree.=0.878V (versus
SHE). The ammonium hydroxide can form complex ions, such as
Cu(NH.sub.3).sub.4.sup.2+ and Ni(NH.sub.3).sub.4.sup.2+, with
metallic impurities. Since the use of hydrogen peroxide increases
the surface potential of ESC ceramic surfaces, it can reduce the
redeposition or surface absorption of metals after previous
chemical cleaning of ESC ceramic surfaces. For example, the
standard reduction potential of copper is: Cu.sup.2++2e.sup.-=Cu
E.degree.=0.337V (versus SHE) and the reduction potential of
silicon is: Si+2H.sub.2O+2H.sup.++2e.sup.-=2H.sub.2O
E.degree.=-0.857V (versus SHE). Thus, silicon can provide electrons
to Cu.sup.2+ to form copper metal, which can be absorbed on the ESC
ceramic surface. Hydrogen peroxide can remove electrons from
silicon, allowing copper to form Cu(NH.sub.3).sub.4.sup.2+, which
can be removed.
[0011] The optional TMAH (e.g., 2.38 weight %, CC-238S non-ionic
developer from Cyantek, Corp., Fremont, Calif.) serves to remove
aluminum fluoride, a contaminant that may be found on used ESCs.
Thus, used ESCs are preferably cleaned with TMAH.
[0012] An exemplary acidic solution for use in the wet cleaning
process may comprise hydrofluoric acid (HF) (49%, semiconductor
grade, conforming to SEMI Specification C28-0301, Grade 1 or
better) and nitric acid (HNO.sub.3) (67%, semiconductor grade,
conforming to SEMI Specification C35-0301, Grade 1 or better). The
nitric acid serves to remove metal particles and electrode
impurities and the hydrofluoric acid serves to remove silicon
particles, such as SiO.sub.2. The reaction of hydrofluoric acid
with SiO.sub.2 is as follows: 4HF+SiO.sub.2=SiF.sub.4+2H.sub.2O
6HF+SiO.sub.2=H.sub.2SiF.sub.6+2H.sub.2O There is a low
concentration of H.sup.+ and F.sup.- ions in a solution of
hydrofluoric acid due to a low reaction constant of
k.sub.1=1.3.times.10.sup.-3 mol/liter. The presence of nitric acid,
with common H.sup.+ ions, should result in an even lower
concentration of F.sup.- ions. As hydrofluoric acid may attack
ceramic surfaces at their grain boundaries, special care is
preferably taken in applying hydrofluoric acid to ceramic surfaces.
While not wishing to be bound by theory, it is believed that the
addition of nitric acid is effective for metal and metal ion
decontamination. As nitric acid is a strong oxidizer, it can react
with active metals such as iron, nickel, aluminum, zinc, as well as
inactive metals such as copper. The standard reduction potential of
nitric acid is: NO.sub.3.sup.-+4H.sup.++3e.sup.-=NO+2H.sub.2O
E.degree.=0.957V (versus SHE)
[0013] Another exemplary acidic solution for use in the wet
cleaning process may comprise hydrochloric acid (HCl) (conforming
to SEMI Specification C28-0301, Grade 2 or better) and hydrogen
peroxide. This acidic solution serves to remove metallic impurities
and electrode impurities. Metal contaminants on ceramic surfaces
may include, for example, copper, iron, nickel, titanium, aluminum,
and other metal particles. According to Pourbaix Diagrams (E versus
pH), in order to remove copper contaminants from ESC ceramic
surfaces, the pH of the cleaning solution should be maintained at
less than or equal to 6.0 for Cu.sup.2+ or greater than or equal to
12.5 for Cu(OH).sub.hu 2- and the reaction potential on ESC ceramic
surfaces should be controlled at 0.50 volts or higher versus SHE.
Using nitric acid and hydrogen peroxide in an acidic solution will
provide an appropriate ceramic surface potential to achieve an
efficient removal of copper. While hydrofluoric acid alone would
not be expected to remove copper contamination from an ESC ceramic
surface, a solution of nitric acid with hydrofluoric acid and/or
hydrogen peroxide with ammonium hydroxide should provide more
effective copper decontamination of ESC ceramic surfaces. Metal
particles such as iron, nickel, titanium, etc., can be effectively
removed by a solution of hydrochloric acid and hydrogen peroxide,
as iron and nickel can dissolve in hydrochloric acid and titanium
can be oxidized by hydrogen peroxide and then dissolve in a
solution of hydrochloric acid. The acidic solution comprising
hydrochloric acid and hydrogen peroxide has demonstrated effective
decontamination of metal and metal ions, such as aluminum, iron,
nickel, and copper.
[0014] The acidic solution for use in the wet cleaning process may
comprise a mixture of hydrofluoric acid and nitric acid and/or a
mixture of hydrochloric acid and hydrogen peroxide. The acidic
solution or solutions used may be based on the type of ESC and the
conditions to which it is subjected during dielectric etching. For
example, to prevent damage to the ceramic surface of a
Johnsen-Rahbek type ESC operated at high power (e.g., 3000-6000 W),
such an ESC preferably is not cleaned with hydrofluoric acid and
nitric acid.
[0015] The ceramic surface of the ESC is preferably contacted with
the acidic solution and TMAH by wiping while the ESC is on a
fixture, with the ceramic surface facing downward. Use of the
fixture allows cleaning with the acidic solution or TMAH without
causing the cleaning solution to become trapped in passages of the
ESC and damaging the bonding layer.
[0016] In addition to contacting the ceramic surface of the ESC
with the above-described components of the wet cleaning process,
cleaning of local stains may be assisted by careful use of a
scouring pad, such as a 3M.TM. white Scotch Brite. The scouring
helps to remove deposition and contamination (e.g., polymer
buildup) on the ceramic surface of the ESC.
[0017] The ultrasonic cleaning serves to remove surface particles,
as well as particles trapped inside passages in the ESC, for
example, water channels, temperature sensor holes, lift pin holes,
and through holes, such as helium supply holes and associated
microchannels. A particle density on the ESC ceramic surface of
less than 0.17 particles/cm.sup.2 is desired following ultrasonic
cleaning.
[0018] Chemical attack of the bonding area of an ESC during the wet
cleaning process is undesirable. Thus, the corrosion resistance of
a ESC bond was systematically studied by exposing the bond to
different chemicals, with the results indicated in Table I.
TABLE-US-00001 TABLE I Temperature Chemical Weight % 25.degree. C.
40.degree. C. 66.degree. C. 90.degree. C. H.sub.2SO.sub.4 <20 X
20-70 X 70-75 X >75 X HNO.sub.3 <10 * X >10 X HF * * X
Acetic Acid X HCl >20 * 20-37 * * NH.sub.4OH .sup. 0-10 10-20 X
20-30 X X H.sub.2O.sub.2 <10 * * X 10-30 * X CO.sub.2 * IPA
Acetone .largecircle. .largecircle. X Excellent corrosion
resistance or very light corrosion * Depends on the type of bond
material used .largecircle. May be used, but with considerable
corrosion or damage X Severe corrosion or damage (cannot be
used)
Coating the bonding area with MicroShield.TM. Masking Aid
(Structure Probe, Inc., West Chester, Pa.), drying for 30 minutes,
and covering with chemical resistant tape (e.g., Kapton.TM. tape or
3M.TM. Electroplating Tape #470, 484, or 854) was found to be an
effective means of protecting the bonding area.
[0019] Similarly, contact with water, aqueous chemicals, or
acetone, but not IPA, can adversely affect electrical contacts,
including contacts with plastic insulators and silver coated
contacts, on the backside of the ESC. Accordingly, electrical
contacts and exposed bonding material on the ESC are preferably
protected by covering with masking material and/or chemical
resistant tape
[0020] As noted above, ESC surfaces such as the wafer-contacting
ceramic surface can be analyzed prior to subjecting the ESC to the
wet cleaning process to determine whether contaminants are found on
a surface of the ESC. Additionally, ESC surfaces can be analyzed
after subjecting the ESC to the wet cleaning process to determine
whether contaminants are found on a surface of the ESC. Further,
plasma etch chamber performance of the ESC can be tested, prior to
subjecting the ESC to the wet cleaning process, and preferably
after subjecting the ESC to the wet cleaning process.
[0021] Plasma etching chamber performance tests include dechucking
performance, such as, for example, time to dechuck for different
wafer types, time to dechuck versus reverse polarity voltage (RPV),
time to dechuck versus holding voltage, and time to reach helium
threshold (helium rise time) versus holding voltage. Further
chamber performance tests include, for example, wafer temperature
measurements, dynamic alignment measurements, I-V curve
measurements such as pole-pole versus current, and determining
reverse polarity optimization.
[0022] Plasma etching chamber performance tests indicated that
after wet cleaning a used ESC: (1) the ESC current during the I-V
measurement was lower, (2) the optimum RPV shifts to a lower
voltage, and (3) the helium rise time results improved. Thus,
dechucking times would be lower after the clean, a wafer can be
dechucked over an extended holding voltage range, and the window
for optimal RPV is wider after the cleaning.
[0023] ESC measurements carried out prior to and/or after
subjecting the ESC to the wet cleaning process include surface
roughness (21 points), surface color uniformity, ceramic dielectric
thickness, ceramic dielectric layer volume resistivity, electric
resistivity, dielectric resistance and pole-to-baseplate
resistance, surface pattern observation (White Light Interferometer
(Zygo.RTM., Middlefield, Conn.)), SEM and EDS analysis for surface
morphology and composition analysis, and Inductively Coupled Plasma
Mass Spectrometry (ICPMS) of the ESC ceramic surface.
EXAMPLES
[0024] The following wet cleaning processes, which can be used to
clean new and used ESCs, are provided to be illustrative, but not
limiting.
Example 1
[0025] Protect electrical contacts on the backside of a used
dielectric ESC, including contacts with plastic insulators and
silver coated contacts, with chemical resistant tape. Protect
exposed bonding material at the edge of the ESC, immediately below
the ceramic surface layer, by coating the bonding material with
MicroShield.TM. Masking Aid, drying for 30 minutes, and covering
with chemical resistant tape.
[0026] Rinse the ESC with ultrapure deionized water (UPW,
resistivity .gtoreq.18 Mohm-cm at 25.degree. C.) for 5 minutes,
blow off excess water with filtered (0. 05 to 0.1 .mu.m) nitrogen,
soak (immerse) the ESC in IPA for 20 minutes, and wipe the ESC with
a lint-free cleanroom wipe.
[0027] Soak the ESC in 30% H.sub.2O.sub.2 solution for 20 minutes
and wipe the ceramic surface with a lint-free cleanroom wipe. If
necessary, remove local stains by carefully a 3M.TM. white Scotch
Brite. Rinse the ESC with UPW for 5 minutes and blow off excess
water with filtered nitrogen.
[0028] Wipe the ESC with IPA using a lint-free cleanroom wipe,
rinse the ESC with UPW for 5 minutes, and blow off excess water
with filtered nitrogen.
[0029] Place the ESC on a fixture, with the ceramic surface facing
downward. Wipe the ceramic surface with a lint-free cleanroom wipe
and a solution of HF:HNO.sub.3:H.sub.2O (in a ratio of 1:5:50) for
a maximum of 30 seconds. A 3M.TM. white Scotch Brite can be used
with the solution. Rinse the ESC, including all of the helium holes
and channels, with UPW for 10 minutes and blow off excess water
with filtered nitrogen.
[0030] With the ESC facing downward on the fixture, wipe the
ceramic surface with a lint-free cleanroom wipe and solution of
HCl:H.sub.2O.sub.2:H.sub.2O (in a ratio of 1:2:10) for a maximum of
3 minutes. A .sub.3M.TM. white Scotch Brite can be used with the
solution. Rinse the ESC, including all of the helium holes and
channels, with UPW for 10 minutes and blow off excess water with
filtered nitrogen.
[0031] With the ESC facing downward on the fixture, wipe the
ceramic surface with a lint-free cleanroom wipe and a solution of
2.38% TMAH for 5-10 minutes, depending on the degree of fluoride
deposition, avoiding contact of the metal base with the solution. A
3M.TM. white Scotch Brite can be used with the solution. Rinse the
ESC with UPW for 5 minutes and blow off excess water with filtered
nitrogen.
[0032] Remove the ESC from the fixture and soak the ESC in a
solution of H.sub.2O.sub.2:NH.sub.4OH:H.sub.2O (in a ratio of
1:1:2) for 20 minutes, wipe the ESC with a lint-free cleanroom wipe
or 3M.TM. white Scotch Brite, rinse the ESC with UPW for 5 minutes,
and blow off excess water with filtered nitrogen.
[0033] Place the ESC facing downward on the fixture, with the
ceramic surface facing downward. Wipe the ceramic surface with a
lint-free cleanroom wipe and a solution of
HCl:H.sub.2O.sub.2:H.sub.2O (in a ratio of 1:2:10) for a maximum of
30 seconds. A .sub.3M.TM. white Scotch Brite can be used with the
solution. Rinse the ESC, including all of the helium holes and
channels, with UPW for 10 minutes and blow off excess water with
filtered nitrogen.
[0034] Remove the MicroShield.TM. Masking Aid from the edge of the
ESC using acetone and cotton swabs. Move the ESC to a Class 1000
Cleanroom and measure the roughness of the ceramic surface with a
surface roughness tester, such as a Fowler Pocket Surf (Fred V.
Fowler Co., Inc., Newton, Mass.). Mount (immerse) the ESC in an
ultrasonic tank filled with UPW at room temperature and clean the
ESC for 60 minutes. Orient the ESC in the ultrasonic tank with the
ceramic surface facing downward, but supported above the bottom of
the tank. The ceramic surface should not come into contact with the
tank during the ultrasonic cleaning. Remove the chemical resistant
tape from the backside of the ESC, wipe the ESC with IPA, and rinse
helium holes and channels on the backside of the ESC with IPA. Blow
dry the ESC, including the helium holes and channels, with nitrogen
supplied through a hose or soft-tipped nozzle.
[0035] Move the ESC to a Class 100 Cleanroom and place it under a
heating lamp or bake it in an oven at 120.degree. C. for 90 minutes
and allow the ESC to cool to 50-60.degree. C. Measure surface
particles on the ceramic surface, for example, with a
QIII.RTM.+Surface Particle Detector (Pentagon Technologies,
Livermore, Calif.).
Example 2
[0036] The procedure of Example 2 is similar to the procedure of
Example 1. However, cleaning times and cleaning components may
vary, as indicated by Example 2. Protect electrical contacts on the
backside of the ESC and wipe the ESC with IPA.
[0037] Soak the ESC in 30% H.sub.2O.sub.2 solution for 20 minutes
and wipe the ceramic surface with a lint-free cleanroom wipe. If
necessary, remove local stains by carefully using a 3M.TM. white
Scotch Brite or a fine pad (sand paper) can be used. Rinse the ESC
with UPW for 5 minutes and blow off excess water with filtered
nitrogen.
[0038] Soak the ESC in IPA for 20 minutes, wipe the ESC using a
lint-free cleanroom wipe, rinse the ESC with UPW for 5 minutes, and
blow off excess water with filtered nitrogen.
[0039] Place the ESC on a fixture, with the ceramic surface facing
downward. Wipe the ceramic surface with a lint-free cleanroom wipe
and a solution of HF:HNO.sub.3:H.sub.2O (in a ratio of 1:5:50) for
a maximum of 30 seconds. A 3M.TM. white Scotch Brite or fine pad
can be used with the solution. Rinse the ESC, including all of the
lift pin holes and helium supply holes and channels, with UPW for
10 minutes and blow off excess water with filtered nitrogen.
[0040] With the ESC facing downward on the fixture, wipe the
ceramic surface with a lint-free cleanroom wipe and a solution of
2.38% TMAH at room temperature for 5-10 minutes, depending on the
degree of fluoride deposition on the ESC ceramic surface, avoiding
contact of the metal base with the solution. Rinse the ESC with UPW
for 5 minutes and blow off excess water with filtered nitrogen.
[0041] Remove the ESC from the fixture and soak the ESC in a
solution of NH.sub.4OH:H.sub.2O.sub.2:H.sub.2O (in a ratio of
1:7:8) for 20 minutes, wipe the ESC with a lint-free cleanroom wipe
or 3M.TM. white Scotch Brite, rinse the ESC with UPW for 5 minutes,
and blow off excess water with filtered nitrogen.
[0042] Place the ESC facing downward on the fixture, wipe the
ceramic surface with a lint-free cleanroom wipe and solution of
HCl:H.sub.2O.sub.2:H.sub.2O (in a ratio of 1:2:10) for a maximum of
3 minutes. A 3M.TM. white Scotch Brite can be used with the
solution. Rinse the ESC, including all of the helium holes and
channels, with UPW for 10 minutes and blow off excess water with
filtered nitrogen.
[0043] Mount the ESC in an ultrasonic tank filled with UPW at room
temperature and clean the ESC for 60 minutes. Rinse the ESC with
UPW for 5 minutes and blow off excess water with filtered nitrogen.
Remove the chemical resistant tape from the backside of the ESC,
wipe the ESC with IPA, and rinse helium holes and channels on the
backside of the ESC with IPA. Blow dry the ESC, including the
helium holes and channels.
[0044] Move the ESC to a Class 100 Cleanroom and place it under a
heating lamp or bake it in an oven at 120.degree. C. for 90 minutes
and allow the ESC to cool. Measure surface particles and surface
roughness on the ceramic surface.
Example 3
[0045] Table II provides EDS elemental surface compositions
analysis results for a used ESC both prior to and after the wet
cleaning process. "Average" refers to a relatively large area of
the ESC ceramic surface, e.g., magnification of 200 times.
Accordingly, some contaminants may not be detected in the
"average." In contrast, "particle" refers to individual particles
or impurities on the ceramic surface of the ESC, including metal
particles or electrode particles. TABLE-US-00002 TABLE II Average
Particle Element Pre-Cleaning Post-Cleaning Pre-Cleaning
Post-Cleaning O 52.82% 62.85% 44.59% 66.50% F 12.77% 1.85% 14.07%
-- Mg 1.33% 0.84% 0.95% 0.40% Al 32.07% 34.02% 28.87% 29.15% P --
-- 3.29% -- Ca 0.23% -- 0.51% -- Ti 0.63% 0.45% 2.59% 4.39% Fe --
-- 4.61% -- W -- -- 0.52% -- Si 0.14% -- -- --
Example 4
[0046] Table III provides ICPMS elemental surface concentrations
(.times.10.sup.10 atoms/cm.sup.2) for a used ESC both prior to and
after the wet cleaning process. "Extraction" refers to a process
wherein a chemical etching solution is applied to the ceramic
surface of the ESC in order to dissolve surface contaminants into
the solution. The solution is then collected for ICPMS analysis.
Thus, the initial surface contamination level may be determined, as
well as the level of contamination after the wet cleaning process
and the efficiency of the wet cleaning process. By repeating the
extraction process several times, the endpoint of the wet cleaning
process may be determined. As the backside of process wafers will
contact the surface of the ESC, the surface cleanliness of the ESC
is desirable in wafer manufacturing processes. TABLE-US-00003 TABLE
III Post-Cleaning Pre- First Second Third Fourth Element Cleaning
Extraction Extraction Extraction Extraction Aluminum (Al) 540,000
260,000 82,000 85,000 82,000 Antimony (Sb) 58 18 0.58 0.66 0.55
Arsenic (As) <5 5.7 <5 <5 <5 Barium (Ba) 61 140 38 48
39 Beryllium (Be) <20 <20 <20 <20 <20 Bismuth (Bi)
<0.5 <0.5 <0.5 <0.5 <0.5 Boron (B) 9,500 5,500 1,700
2,400 2,200 Cadmium (Cd) 4.0 1.9 1.3 <1 <1 Calcium (Ca)
100,000 45,000 22,000 31,000 29,000 Chromium (Cr) 32 <20 <20
<20 <20 Cobalt (Co) 38 13 <5 9.8 8.9 Copper (Cu) 330 160
23 <10 <10 Gallium (Ga) 63 41 9.9 16 15 Germanium (Ge) <2
96 190 210 64 Iron (Fe) 4,000 4,500 830 1,200 1,100 Lead (Pb) 42
7.1 0.80 0.89 0.71 Lithium (Li) 230 170 56 70 74 Magnesium (Mg)
120,000 92,000 37,000 40,000 38,000 Manganese (Mn) 65 29 <5 15
14 Molybdenum (Mo) 13 54 15 22 21 Nickel (Ni) 200 140 42 <10 11
Potassium (K) 4,100 700 170 290 300 Sodium (Na) 17,000 6,700 2,300
3,200 3,000 Strontium (Sr) 51 37 17 21 18 Tin (Sn) 68 6.5 <5
<5 <5 Titanium (Ti) 43,000 46,000 11,000 13,000 13,000
Tungsten (W) 300 1,100 270 380 380 Vanadium (V) 9.2 <5 <5
<5 <5 Zinc (Zn) 1,900 1,700 72 30 32 Zirconium (Zr) 470 2,000
110 150 140
Examples 5-7
[0047] Tables IV-VI provide ICPMS elemental surface concentrations
(.times.10.sup.10 atoms/cm.sup.2) for three different used ESCs
both prior to and after the wet cleaning process. TABLE-US-00004
TABLE IV Element Pre-Cleaning Post-Cleaning Aluminum (Al) 560,000
7,600 Antimony (Sb) 270 1.0 Arsenic (As) <5 <5 Barium (Ba) 99
41 Beryllium (Be) 99 <20 Bismuth (Bi) <0.5 <0.5 Boron (B)
3,500 <200 Cadmium (Cd) 6.1 <1 Calcium (Ca) 56,000 450
Chromium (Cr) 85 <20 Cobalt (Co) 540 <5 Copper (Cu) 200 19
Gallium (Ga) 11 <1 Germanium (Ge) <2 <2 Iron (Fe) 40,000
140 Lead (Pb) 28 3.8 Lithium (Li) 110 <20 Magnesium (Mg) 35,000
360 Manganese (Mn) 100 <5 Molybdenum (Mo) 21 <2 Nickel (Ni)
640 <10 Potassium (K) 27,000 <50 Sodium (Na) 63,000 260
Strontium (Sr) 32 <2 Tin (Sn) 76 <5 Titanium (Ti) 13,000 240
Tungsten (W) 96 <2 Vanadium (V) 34 <5 Zinc (Zn) 3,100 120
Zirconium (Zr) 84 1.5
[0048] TABLE-US-00005 TABLE V Element Pre-Cleaning Post-Cleaning
Aluminum (Al) 860,000 15,000 Antimony (Sb) 1.2 4.9 Arsenic (As)
<5 <5 Barium (Ba) 3,000 180 Beryllium (Be) <20 <20
Bismuth (Bi) 1.5 <0.5 Boron (B) 1,300 3,600 Cadmium (Cd) <1
<1 Calcium (Ca) 1,100,000 2,200 Chromium (Cr) 1,200 130 Cobalt
(Co) 46 <5 Copper (Cu) 38 50 Gallium (Ga) 17 10 Germanium (Ge)
<2 <2 Iron (Fe) 7,900 510 Lead (Pb) 3.7 19 Lithium (Li) 82
<20 Magnesium (Mg) 38,000 2,400 Manganese (Mn) <5 <5
Molybdenum (Mo) <2 <2 Nickel (Ni) 87 <10 Potassium (K) 790
64 Sodium (Na) 4,300 700 Strontium (Sr) 630 6.5 Tin (Sn) <5
<5 Titanium (Ti) 5,300 1,200 Tungsten (W) 260 26 Vanadium (V)
<5 <5 Zinc (Zn) 97 560 Zirconium (Zr) 180 17
[0049] TABLE-US-00006 TABLE VI Element Pre-Cleaning Post-Cleaning
Aluminum (Al) 51,000 51,000 Antimony (Sb) 1.5 2.8 Arsenic (As) 17
6.5 Barium (Ba) 15 35 Beryllium (Be) <20 <20 Bismuth (Bi)
<0.5 <0.5 Boron (B) 1,300 1,300 Cadmium (Cd) <1 <1
Calcium (Ca) 2,800 1,800 Chromium (Cr) 700 280 Cobalt (Co) <5
<5 Copper (Cu) 90 36 Gallium (Ga) 8.8 9.6 Germanium (Ge) <2
<2 Iron (Fe) 580 490 Lead (Pb) 6.4 15 Lithium (Li) 39 <20
Magnesium (Mg) 2,400 2,500 Manganese (Mn) <5 <5 Molybdenum
(Mo) <2 2.0 Nickel (Ni) 33 <10 Potassium (K) 190 110 Sodium
(Na) 1,500 700 Strontium (Sr) 7.5 3.7 Tin (Sn) <5 <5 Titanium
(Ti) 1,800 1,600 Tungsten (W) 43 78 Vanadium (V) <5 <5 Zinc
(Zn) 380 140 Zirconium (Zr) 19 35
The ceramic surface layer of the ESC cleaned according to Table IV
was titanium doped.
[0050] While various embodiments have been described, it is to be
understood that variations and modifications may be resorted to as
will be apparent to those skilled in the art. Such variations and
modifications are to be considered within the purview and scope of
the claims appended hereto.
* * * * *