U.S. patent number D819,581 [Application Number D/601,371] was granted by the patent office on 2018-06-05 for socket for electronic device testing apparatus.
This patent grant is currently assigned to ADVANTEST CORPORATION. The grantee listed for this patent is ADVANTEST CORPORATION. Invention is credited to Mitsunori Aizawa, Takashi Kawashima, Masanori Nagashima, Takeshi Okushi.
United States Patent |
D819,581 |
Okushi , et al. |
June 5, 2018 |
Socket for electronic device testing apparatus
Claims
CLAIM The ornamental design for a socket for an electronic device
testing apparatus, as shown and described.
Inventors: |
Okushi; Takeshi (Tokyo,
JP), Aizawa; Mitsunori (Tokyo, JP),
Nagashima; Masanori (Saitama, JP), Kawashima;
Takashi (Tokyo, JP) |
Applicant: |
Name |
City |
State |
Country |
Type |
ADVANTEST CORPORATION |
Tokyo |
N/A |
JP |
|
|
Assignee: |
ADVANTEST CORPORATION (Tokyo,
JP)
|
Appl.
No.: |
D/601,371 |
Filed: |
April 21, 2017 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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29509962 |
Nov 24, 2014 |
D788722 |
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Foreign Application Priority Data
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Jul 17, 2014 [KR] |
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30-2014-0035153 |
Jul 17, 2014 [KR] |
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30-2014-0035155 |
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Current U.S.
Class: |
D13/182 |
Current International
Class: |
1303 |
Field of
Search: |
;D13/182 |
References Cited
[Referenced By]
U.S. Patent Documents
Other References
Office Action issued in Taiwan Counterpart Patent Appl. No.
10420942510, dated Jul. 20, 2015. cited by applicant .
Office Action issued in Taiwan Counterpart Patent Appl. No.
103306664, dated Jul. 20, 2015. cited by applicant.
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Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Greenblum & Bernstein,
P.L.C.
Description
FIG. 1 is a front view of a socket for electronic testing apparatus
showing our new design;
FIG. 2 is a rear view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a left side view thereof;
FIG. 7 is a top perspective view thereof;
FIG. 8 is a bottom perspective view thereof;
FIG. 9 is a cross-sectional view taken along line 9-9 of FIG.
3;
FIG. 10 is a cross-sectional view taken along line 10-10 of FIG.
3;
FIG. 11 is an enlarged portion view taken along line 11-11 of FIG.
9; and,
FIG. 12 is an enlarged portion view taken along line 12-12 of FIG.
10.
The even dashed broken lines shown in the drawings represent
portions of the socket for an electronic testing apparatus, that
form no part of the claimed design.
The dashed-dot line shown on the top and bottom of the socket for
an electronic testing apparatus represents the boundary line
between the claimed and unclaimed surface areas.
The outer boarder of the center broken line circles in FIG. 8 that
form no part of the claimed design, show the step in FIGS. 11 and
12.
* * * * *