Socket for an electronic device testing apparatus

Okushi , et al. June 6, 2

Patent Grant D788722

U.S. patent number D788,722 [Application Number D/509,962] was granted by the patent office on 2017-06-06 for socket for an electronic device testing apparatus. This patent grant is currently assigned to ADVANTEST CORPORATION. The grantee listed for this patent is ADVANTEST CORPORATION. Invention is credited to Mitsunori Aizawa, Takashi Kawashima, Masanori Nagashima, Takeshi Okushi.


United States Patent D788,722
Okushi ,   et al. June 6, 2017

Socket for an electronic device testing apparatus

Claims

CLAIM The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
Inventors: Okushi; Takeshi (Tokyo, JP), Aizawa; Mitsunori (Tokyo, JP), Nagashima; Masanori (Tokyo, JP), Kawashima; Takashi (Tokyo, JP)
Applicant:
Name City State Country Type

ADVANTEST CORPORATION

Tokyo

N/A

JP
Assignee: ADVANTEST CORPORATION (Tokyo, JP)
Appl. No.: D/509,962
Filed: November 24, 2014

Foreign Application Priority Data

Jul 17, 2014 [KR] 30-2014-0035153
Jul 17, 2014 [KR] 30-2014-0035155
Current U.S. Class: D13/182
Current International Class: 1303
Field of Search: ;D13/182

References Cited [Referenced By]

U.S. Patent Documents
D358806 May 1995 Siegel
D359028 June 1995 Siegel
D522977 June 2006 Sato
D633877 March 2011 Heng
D633878 March 2011 Heng
D633879 March 2011 Heng
D633880 March 2011 Heng
D645426 September 2011 Heng
D648688 November 2011 Heng
D661667 June 2012 Heng
2003/0032322 February 2003 Nakamura
2004/0063241 April 2004 Nakano
2004/0212382 October 2004 Cram
2005/0136721 June 2005 Sato
2005/0231919 October 2005 Ujike
2005/0250363 November 2005 Suzuki
2005/0287837 December 2005 Trobough
2007/0173081 July 2007 Yu
2010/0062623 March 2010 Chen

Other References

Office Action issued in Taiwan Counterpart Patent Appl. No. 10420942510, dated Jul. 20, 2015. cited by applicant .
Office Action issued in Taiwan Counterpart Patent Appl. No. 103306664, dated Jul. 20, 2015. cited by applicant.

Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Greenblum & Bernstein, P.L.C.

Description



FIG. 1 is a front view of a socket for an electronic device testing apparatus showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a top perspective view thereof;

FIG. 8 is a bottom perspective view thereof;

FIG. 9 is a cross-sectional view taken along line 9-9 of FIG. 3;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 3;

FIG. 11 is an enlarged view of part 11-11 of FIGS. 9; and,

FIG. 12 is an enlarged view of part 12-12 of FIG. 10.

The part represented by solid lines is a part of the claimed design. The dot-dash broken lines (the alternate long and short dash lines) represent only a border between the part of the claimed design and other part. The dashed broken lines (the broken lines) are for illustrative purposes only and form no part of the claimed design.

The broken lines connecting the arrows in FIG. 3 which show the cut of the plane for FIGS. 9 and 10 form no part of the claimed design.

* * * * *


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