Socket for electronic device testing apparatus

Okushi , et al. June 5, 2

Patent Grant D819581

U.S. patent number D819,581 [Application Number D/601,371] was granted by the patent office on 2018-06-05 for socket for electronic device testing apparatus. This patent grant is currently assigned to ADVANTEST CORPORATION. The grantee listed for this patent is ADVANTEST CORPORATION. Invention is credited to Mitsunori Aizawa, Takashi Kawashima, Masanori Nagashima, Takeshi Okushi.


United States Patent D819,581
Okushi ,   et al. June 5, 2018

Socket for electronic device testing apparatus

Claims

CLAIM The ornamental design for a socket for an electronic device testing apparatus, as shown and described.
Inventors: Okushi; Takeshi (Tokyo, JP), Aizawa; Mitsunori (Tokyo, JP), Nagashima; Masanori (Saitama, JP), Kawashima; Takashi (Tokyo, JP)
Applicant:
Name City State Country Type

ADVANTEST CORPORATION

Tokyo

N/A

JP
Assignee: ADVANTEST CORPORATION (Tokyo, JP)
Appl. No.: D/601,371
Filed: April 21, 2017

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
29509962 Nov 24, 2014 D788722

Foreign Application Priority Data

Jul 17, 2014 [KR] 30-2014-0035153
Jul 17, 2014 [KR] 30-2014-0035155
Current U.S. Class: D13/182
Current International Class: 1303
Field of Search: ;D13/182

References Cited [Referenced By]

U.S. Patent Documents
D358806 May 1995 Siegel
D359028 June 1995 Siegel
D522977 June 2006 Sato
7230830 June 2007 Ujike
7335030 February 2008 Kunioka
7568918 August 2009 Uratsuji
7819686 October 2010 Chen
7887355 February 2011 Watanabe
D633877 March 2011 Heng
D633878 March 2011 Heng
D633879 March 2011 Heng
D633880 March 2011 Heng
D645426 September 2011 Heng
D648688 November 2011 Heng
D661667 June 2012 Heng
D788722 June 2017 Okushi
9755387 September 2017 Hachuda
2003/0032322 February 2003 Nakamura
2004/0063241 April 2004 Nakano
2004/0212382 October 2004 Cram
2004/0248435 December 2004 Sato
2005/0136721 June 2005 Sato
2005/0231919 October 2005 Ujiki
2005/0250363 November 2005 Suzuki
2005/0287837 December 2005 Trobough
2007/0173081 July 2007 Yu
2010/0062623 March 2010 Chen

Other References

Office Action issued in Taiwan Counterpart Patent Appl. No. 10420942510, dated Jul. 20, 2015. cited by applicant .
Office Action issued in Taiwan Counterpart Patent Appl. No. 103306664, dated Jul. 20, 2015. cited by applicant.

Primary Examiner: Oswecki; Elizabeth J
Attorney, Agent or Firm: Greenblum & Bernstein, P.L.C.

Description



FIG. 1 is a front view of a socket for electronic testing apparatus showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a top perspective view thereof;

FIG. 8 is a bottom perspective view thereof;

FIG. 9 is a cross-sectional view taken along line 9-9 of FIG. 3;

FIG. 10 is a cross-sectional view taken along line 10-10 of FIG. 3;

FIG. 11 is an enlarged portion view taken along line 11-11 of FIG. 9; and,

FIG. 12 is an enlarged portion view taken along line 12-12 of FIG. 10.

The even dashed broken lines shown in the drawings represent portions of the socket for an electronic testing apparatus, that form no part of the claimed design.

The dashed-dot line shown on the top and bottom of the socket for an electronic testing apparatus represents the boundary line between the claimed and unclaimed surface areas.

The outer boarder of the center broken line circles in FIG. 8 that form no part of the claimed design, show the step in FIGS. 11 and 12.

* * * * *


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