Electron microscope

Description

FIG. 1 is a front, top and right side perspective view of an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

The broken lines shown are for illustrative purpose and form no part of the claimed design.

Claims

CLAIM We claim the ornamental design for an electron microscope, as shown and described.

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Inventors:	Oonuma; Mitsuru (Tokyo, JP), Omachi; Akira (Komae, JP), Katane; Junichi (Naka, JP), Akatsu; Mitsuo (Hitachinaka, JP), Komuro; Hiroyuki (Hitachinaka, JP), Hirashima; Tomoyasu (Yokohama, JP)
Applicant:	Name City State Country Type Oonuma; Mitsuru Omachi; Akira Katane; Junichi Akatsu; Mitsuo Komuro; Hiroyuki Hirashima; Tomoyasu Tokyo Komae Naka Hitachinaka Hitachinaka Yokohama N/A N/A N/A N/A N/A N/A JP JP JP JP JP JP
Assignee:	Hitachi High-Technologies Corporation (Tokyo, JP)
Appl. No.:	D/431,888
Filed:	September 12, 2012

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Foreign Application Priority Data

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May 10, 2012 [JP]			2012-010805

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D16/130,131 ;250/311,440.11 ;359/363,368,372,378,388,389,385,390,386,801,821,824 ;D10/81

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References Cited [Referenced By]

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U.S. Patent Documents

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Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.