Semiconductor device

Description

FIG. 1 is a front, top and right side perspective view of a semiconductor device, showing our new design;

FIG. 2 is a front, bottom and right side perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a right side elevational view thereof;

FIG. 8 is a left side elevational view thereof;

FIG. 9 is a cross-sectional view thereof, taken along line 9--9 of FIG. 5, with the internal system omitted;

FIG. 10 is a cross-sectional view thereof, taken along line 10--10 of FIG. 5, with the internal system omitted;

FIG. 11 is a front, top and right side perspective view of a second embodiment of the semiconductor device, showing our new design;

FIG. 12 is a front, bottom and right side perspective view thereof;

FIG. 13 is a front elevational view thereof;

FIG. 14 is a rear elevational view thereof;

FIG. 15 is a top plan view thereof;

FIG. 16 is a bottom plan view thereof;

FIG. 17 is a right side elevational view thereof;

FIG. 18 is a left side elevational view thereof;

FIG. 19 is a cross-sectional view thereof, taken along line 19--19 of FIG. 15, with the internal system omitted; and,

FIG. 20 is a cross-sectional view thereof, taken along line 20--20 of FIG. 15, with the internal system omitted.

Claims

The ornamental design for a semiconductor device, as shown and described.

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Inventors:	Iwasaki; Mitsutaka (Tokyo, JP), Iwagami; Toru (Tokyo, JP), Kawafuji; Hisashi (Fukuoka, JP)
Assignee:	Mitsubishi Denki Kabushiki Kaisha (Tokyo, JP)
Appl. No.:	D/159,531
Filed:	April 24, 2002

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Foreign Application Priority Data

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Dec 28, 2001 [JP]			2001-038794
Dec 28, 2001 [JP]			2001-038795

Current U.S. Class:	D13/182
Current International Class:	1303
Field of Search:	;D13/182 ;174/16.3,52.1,52.2,52.4 ;257/670,672,676,686,688,690-696,703,787 ;361/736,742,748,752,760,761,774,783,784,785,798,813,820

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References Cited [Referenced By]

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U.S. Patent Documents

5221859	June 1993	Kobayashi et al.
D357462	April 1995	Terasawa et al.
D357671	April 1995	Terasawa et al.
D360619	July 1995	Terasawa et al.
D394244	May 1998	Majumdar et al.
5757070	May 1998	Fritz
D401912	December 1998	Majumdar et al.
5877548	March 1999	Washida et al.
D421969	March 2000	Kawafuji et al.
D448739	October 2001	Iwasaki et al.
D459705	July 2002	Yokota et al.

Primary Examiner: Shooman; Ted
Assistant Examiner: Sikder; Selina
Attorney, Agent or Firm: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.