U.S. patent application number 12/867245 was filed with the patent office on 2011-10-27 for ion source cleaning in semiconductor processing systems.
This patent application is currently assigned to ADVANCED TECHNOLOGY MATERIALS, INC.. Invention is credited to Steven E. Bishop, Oleg Byl, David Eldridge, Lin Feng, Robert Kaim, W. Karl Olander, Steven Sergi, Joseph D. Sweeney, Ying Tang, Sharad N. Yedave.
Application Number | 20110259366 12/867245 |
Document ID | / |
Family ID | 40957467 |
Filed Date | 2011-10-27 |
United States Patent
Application |
20110259366 |
Kind Code |
A1 |
Sweeney; Joseph D. ; et
al. |
October 27, 2011 |
ION SOURCE CLEANING IN SEMICONDUCTOR PROCESSING SYSTEMS
Abstract
Cleaning of an ion implantation system or components thereof,
utilizing a reactive cleaning reagent enabling growth/etching of
the filament in an ion source of the arc chamber, by appropriate
control of temperature in the arc chamber to effect the desired
filament growth or alternative filament etching. Also described is
the use of reactive gases such as XeFx, WFx, AsFx, PFx and TaFx,
wherein x has a stoichioimetrically appropriate value or range of
values, for cleaning regions of ion implanters, or components of
implanters, in in situ or ex situ cleaning arrangements, under
ambient temperature, elevated temperature or plasma conditions.
Among specific reactive cleaning agents, BrF3 is described as
useful for cleaning ion implant systems or component(s) thereof, in
in situ or ex situ cleaning arrangements. Also described is a
method of cleaning the forelines of an ion implant system for at
least partial removal of ionization-related deposit from said
forelines, comprising contacting said forelines with a cleaning gas
wherein said cleaning gas is chemically reactive with said deposit.
Also described is a method of improving the performance and
extending the lifetime of an ion implant system, comprising
contacting the cathode with a gas mixture.
Inventors: |
Sweeney; Joseph D.;
(Winsted, CT) ; Yedave; Sharad N.; (Danbury,
CT) ; Byl; Oleg; (Southbury, CT) ; Kaim;
Robert; (Brookline, MA) ; Eldridge; David;
(Liberty Hill, TX) ; Sergi; Steven; (Woodbury,
CT) ; Feng; Lin; (Danbury, CT) ; Bishop;
Steven E.; (Corrales, NM) ; Olander; W. Karl;
(Indian Shores, FL) ; Tang; Ying; (Danbury,
CT) |
Assignee: |
ADVANCED TECHNOLOGY MATERIALS,
INC.
Danbury
CT
|
Family ID: |
40957467 |
Appl. No.: |
12/867245 |
Filed: |
February 11, 2009 |
PCT Filed: |
February 11, 2009 |
PCT NO: |
PCT/US09/33754 |
371 Date: |
November 10, 2010 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
61027824 |
Feb 11, 2008 |
|
|
|
Current U.S.
Class: |
134/10 ; 134/18;
134/22.1; 134/22.11; 134/22.13; 134/22.19; 134/23 |
Current CPC
Class: |
H01J 37/18 20130101;
C23C 14/564 20130101; H01J 37/3171 20130101; C23C 14/54 20130101;
H01J 37/08 20130101; H01J 37/16 20130101; C23C 14/48 20130101; H01J
2237/22 20130101; H01J 2237/082 20130101 |
Class at
Publication: |
134/10 ;
134/22.1; 134/22.11; 134/22.19; 134/22.13; 134/23; 134/18 |
International
Class: |
B08B 7/00 20060101
B08B007/00; H01L 21/265 20060101 H01L021/265; B08B 5/00 20060101
B08B005/00 |
Claims
1.-49. (canceled)
50. A method of enhancing performance of an ion implantation tool,
comprising periodically cleaning in situ at least one component of
said ion implantation tool selected from the group consisting of
(i) ion implant vacuum system forelines, (ii) ion implant vacuum
system vacuum pumps, (iii) ion source turbo pumps, and (iv) ion
source turbo pump forelines, by periodically contacting said at
least one component with a cleaning composition that is effective
to at least partially remove from said at least one component,
material deposited thereon in ion implantation operation of the ion
implantation tool, wherein periodicity of said contacting is
according to a predetermined time cycle or in response to a
determination of an operational variable indicative of deposition
of material on said at least one component.
51. The method of claim 50, wherein said at least one component of
said ion implantation tool comprises an ion implant vacuum system
foreline.
52. The method of claim 50, wherein said at least one component of
said ion implantation tool comprises an ion implant vacuum system
vacuum pump.
53. The method of claim 50, wherein said at least one component of
said ion implantation tool comprises an ion source turbo pump.
54. The method of claim 50, wherein said at least one component of
said ion implantation tool comprises an ion source turbo pump
foreline.
55. The method of claim 50, wherein the cleaning composition
comprises a cleaning agent selected from the group consisting of
XeF.sub.2, XeF.sub.4, XeF.sub.6, GeF.sub.4, SiF.sub.4, BF.sub.3,
AsF.sub.5, AsF.sub.3, PF.sub.5, PF.sub.3, F.sub.2, TaF.sub.3,
TaF.sub.5, WF.sub.6, WF.sub.5, WF.sub.4, NF.sub.3, IF.sub.5,
IF.sub.7, KrF.sub.2, SF.sub.6, C.sub.2F.sub.6, CF.sub.4, Cl.sub.2,
HCl, ClF.sub.3, ClO.sub.2, N.sub.2F.sub.4, N.sub.2F.sub.2,
N.sub.3F, NFH.sub.2, NH.sub.2F, HOBr, Br.sub.2, BrF.sub.3,
C.sub.3F.sub.8, C.sub.4F.sub.8, C.sub.5F.sub.8, CHF.sub.3,
CH.sub.2F.sub.2, CH.sub.3F, COF.sub.2, HF, C.sub.2HF.sub.5,
C.sub.2H.sub.2F.sub.4, C.sub.2H.sub.3F.sub.3,
C.sub.2H.sub.4F.sub.2, C.sub.2H.sub.5F, C.sub.3F.sub.6, COCl.sub.2,
CCl.sub.4, CHCl.sub.3, CH.sub.2Cl.sub.2, and CH.sub.3Cl.
56. The method of claim 50, wherein the cleaning composition
comprises XeF.sub.2, N.sub.2F.sub.4, F.sub.2, or other fluorinated
species which is reactive with said material deposited in ion
implantation operation of the ion implantation tool.
57. The method of claim 50, wherein the cleaning composition
comprises XeF.sub.2.
58. The method of claim 57, wherein periodicity of said contacting
is according to a predetermined time cycle.
59. The method of claim 58, wherein said contacting is carried out
for a period of from 15 minutes to 30 minutes.
60. The method of claim 57, wherein the XeF.sub.2 is flowed through
the component in the contacting, at a flow rate in a range of from
50 to 100 sccm.
61. The method of claim 57, wherein the component is filled with
XeF.sub.2 to a first predetermined pressure for the contacting.
62. The method of claim 61, wherein pressure in the component
filled with XeF.sub.2 is thereafter monitored until a second
predetermined pressure is reached, whereupon the contacting is
terminated.
63. The method of claim 61, wherein temperature of the component
filled with XeF.sub.2 is thereafter monitored until a predetermined
temperature is reached, whereupon the contacting is terminated.
64. The method of claim 57, wherein the component comprises a
foreline, and said contacting comprises continuous flow of the
XeF.sub.2 through the foreline.
65. The method of claim 57, wherein the component comprises a
foreline, the ion implantation tool further comprises a roughing
pump and an ion source turbo pump, and said contacting comprises
flow of the XeF.sub.2 through the foreline with the turbo pump off
and the roughing pump on.
66. The method of claim 57, wherein the component comprises a
foreline, and said contacting comprises repetitive pulsed flow and
evacuation of the XeF.sub.2.
67. The method of claim 57, wherein said XeF.sub.2 is supplied for
said contacting from a supply vessel positioned in a gas box of the
ion implantation tool.
68. The method of claim 57, wherein a xenon-containing effluent is
produced by said contacting, and the xenon-containing effluent is
processed for recovery of xenon therefrom.
69. The method of claim 57, wherein the cleaning composition
effects exothermic reaction with the deposited material, and the
cleaning is monitored with a temperature detector.
Description
FIELD OF THE INVENTION
[0001] The present invention relates to monitoring, control and
cleaning of material deposition on components of semiconductor
processing systems, in particular to ion implantation systems.
DESCRIPTION OF THE RELATED ART
[0002] Ion implantation is used in integrated circuit fabrication
to accurately introduce controlled amounts of dopant impurities
into semiconductor wafers and is a crucial process in
microelectronic/semiconductor manufacturing. In such implantation
systems, an ion source ionizes a desired dopant element gas and the
ions are extracted from the source in the form of an ion beam of
desired energy. Extraction is achieved by applying a high voltage
across suitably shaped extraction electrodes, which incorporate
apertures for passage of the extracted beam. The ion beam is then
directed at the surface of the workpiece, such as a semiconductor
wafer, in order to implant the workpiece with the dopant element.
The ions of the beam penetrate the surface of the workpiece to form
a region of desired conductivity.
[0003] Several types of ion sources are commonly used in commercial
ion implantation systems, including the Freeman and Bernas types
using thermoelectrodes and powered by an electric arc, a microwave
type using a magnetron, indirectly heated cathode sources, and RF
plasma sources, all of which typically operate in a vacuum. The ion
source generates ions by introducing electrons into a vacuum
chamber filled with the dopant gas (commonly referred to as the
"feedstock gas"). Collisions of the electrons with dopant atoms and
molecules in the gas results in the creation of ionized plasma
consisting of positive and negative dopant ions. An extraction
electrode with a negative or positive bias will respectively allow
the positive or negative ions to pass through the aperture and out
of the ion source as a collimated ion beam, which is accelerated
towards the workpiece. Feedstock gases include, but are not limited
to, BF.sub.3, B.sub.10H.sub.14, B.sub.18H.sub.22, PH.sub.3,
AsH.sub.3, PF.sub.5, AsF.sub.5, H.sub.2Se, N.sub.2, Ar, GeF.sub.4,
SiF.sub.4, O.sub.2, H.sub.2, and GeH.sub.4.
[0004] Presently, there are upwards of 10-15 implantation steps in
the fabrication of state of the art devices. Increasing wafer
sizes, decreasing critical dimensions, and growing circuit
complexity are placing greater demands on ion implant tools, with
respect to better process control, the deliverance of high beam
currents at low energies, and a decrease in the mean time between
failures (MTBF).
[0005] The parts of the ion implanter tool that require the most
maintenance include: the ion source, which must be serviced after
approximately 100 to 300 hours of operation, depending on its
operating conditions; the extraction electrodes and the high
voltage insulator, which usually require cleaning after a few
hundred hours of operation; the forelines and vacuum pumps of the
ion implant vacuum system, including the ion source turbo pump and
its associated forelines. Additionally, the filament of the ion
source can require replacement after operation.
[0006] In the ideal case, all feedstock molecules would be ionized
and extracted, but in reality a certain amount of feedstock
decomposition occurs, which results in the deposition on and
contamination of the ion source region. For example, phosphorous
residue (e.g., deriving from use of a feedstock gas such as
phosphine) readily deposits on surfaces in the ion source region.
The residue can form on low voltage insulators in the ion source,
causing electrical short circuits which can interrupt the arc
required to produce thermionic electrons. This phenomenon is
generally known as "source glitching," and it is a major
contributor to ion beam instability, and may eventually cause
premature failure of the source. The residue also forms on the high
voltage components of the ion implanter, such as the source
insulator or the surfaces of the extraction electrodes, causing
energetic high voltage sparking. Such sparks are another
contributor to beam instability, and the energy released by these
sparks can damage sensitive electronic components, leading to
increased equipment failures and poor MTBF.
[0007] Another common problem can occur with antimony (Sb+) implant
using Sb.sub.2O.sub.3 as the solid doping material, which can be
exacerbated by running boron (B) even after only a few hours of Sb+
implantation. The boron beam current can significantly deteriorate
with performance and lifetime of ion source significantly
compromised. The cause of this degradation in performance is due to
the excessive Sb deposited on the source chamber and its
components. Failure of the ion source significantly reduces
implanter productivity as throughput is reduced due to more
frequent preventive maintenance or less beam current. Since Sb
implantation is widely used in analog bipolar devices, and also
used as n-type doping for shallow junction formation for MOS (metal
oxide semicondutor) devices, there is a need in the art to develop
a method which can remove Sb deposited on the source chamber and
components thereof when Sb+ is used as dopant, particularly when
switching to B after Sb implant.
[0008] Furthermore, dopant atoms such as B, Ge, Si, P, and As may
deposit in the ion source turbo pump, and downstream in its
associated vacuum forelines. Over time, these deposits build up and
require cleaning, which, historically, has been done manually. But
some of the deposits (e.g. solid phosphorus) are pyrophoric and can
ignite during the manual maintenance operations. Not only is this a
fire hazard, but toxic compounds also can be liberated. There is
thus a need in the art to develop an improved method which can
desirably clean the deposits in-situ with a gaseous cleaning
agent.
[0009] In another cause of ion source failure, various materials
(e.g. tungsten, W) can accumulate on the cathode during extended
ion implantation processes. Once these reach a critical level, the
cathode power can no longer maintain temperature sufficient to meet
the beam current setpoint. This causes loss of ion beam current
requiring replacement of the ion source. The resultant performance
degradation and short lifespan of the ion source reduces
productivity of the ion implanter system.
[0010] Yet another cause of ion source failure is the erosion (or
sputtering) of cathode material. For example, metallic materials
(e.g. W, Mo etc.) from the cathode are sputtered by ions in the
plasma of the arc chamber. Because sputtering is dominated by the
heaviest ions in the plasma, as ion mass increases the sputtering
effect may worsen. In fact, continued sputtering of material
"thins" the cathode eventually leading to formation of a hole in
the cathode ("cathode punch-through"). Performance and lifetime of
the ion source are greatly reduced as a result. The art thus
continues to seek methods which can maintain a balance between the
accumulation and erosion of material on the cathode to prolong the
ion source life.
[0011] Further residue may result from reaction of the source
material with the components of the ion implantation system,
depending on the conditions within the system. Such reaction may
result in deposition of residue on additional components of the
system.
[0012] Deposits are common on ion source elements such as the
filament and the repeller electrode. Such internal deposits are
generally composed of arc chamber material, and are most commonly
seen when running high plasma power with a fluoride source
feedstock in conjunction with an arc chamber constructed of
tungsten or molybdenum. While the ion source life expectancy for
ion implantation systems using non halide-containing source
materials is generally around 100 to 300 hours, with some
halide-containing materials such as GeF.sub.4, the ion source life
can be as low as 10 to 50 hours due to the detrimental effects of
internal deposits on source operation.
[0013] In addition to the operational difficulties caused by
residues in the ion implanter, there are also significant personnel
safety issues due to the emission of toxic or corrosive vapors when
components are removed for cleaning. The safety issues arise
wherever residues are present, but are of particular concern in the
ion source region because the ion source is the most frequently
maintained component of the ion implanter. To minimize down time,
contaminated ion sources are often removed from the implanter at
temperatures significantly above room temperature, which increases
the emission of vapors and exacerbates the safety issue.
[0014] Prior methods of dealing with the above difficulties have
included attempts to prevent formation of the deposits and cleaning
of the resulting deposits on the extraction electrode and the ion
source (i.e. on the extraction electrode, as discussed in published
U.S. Patent Application 2006/0272776, published U.S. Patent
Application 2006/0272775 and published International Patent
Application WO 2005/059942 A2). However, a need for additional
processes of cleaning of all elements of an ion implantation system
remains.
[0015] It would therefore be desirable in the art of ion
implantation to provide an ex situ cleaning process with a separate
cleaning station whereby contaminated components that have been
removed from the implanter can be cleaned safely without any
mechanical abrasion which might damage delicate components such as
graphite electrodes. It would therefore also be a significant
advance in the art of ion implantation to provide an off-line
cleaning station that could be used to selectively and
non-destructively clean components following removal from the
implant system and with minimal down time.
[0016] It would also be a significant advance in the art of ion
implantation to provide an in situ cleaning process for the
effective, selective removal of unwanted residues deposited
throughout the implanter, particularly in the ion source region,
during implantation. Such in situ cleaning would enhance personnel
safety and contribute to stable, uninterrupted operation of the
implantation equipment.
[0017] An in situ cleaning process is performed without disassembly
of the process chamber. For in situ processes, a gaseous agent is
flowed through the process chamber to remove accumulated films, in
either a continuous, pulsed, or hybrid continuous-pulsed fashion.
Depending on the situation, a plasma may or may not be generated
during such cleaning.
[0018] Plasmaless or dry cleaning processes using chlorine
trifluoride (ClF.sub.3) and other fluorine source materials (e.g.,
CF.sub.4, NF.sub.3, C.sub.2F.sub.6, C.sub.3F.sub.8, SF.sub.6 and
ClF.sub.3) can be used for removing solid residues from
semiconductor processing chambers, e.g., by reacting with solid
residues to form volatile reaction products that are removable from
the processing chamber by vacuum or other removal conditions, and
in such instances these cleaning reagents may require elevated
temperature cleaning conditions. See Y. Saito et al., "Plasmaless
Cleaning Process of Silicon Surface Using Chlorine Trifluoride",
APPLIED PHYSICS LETTERS, vol. 56(8), pp. 1119-1121 (1990); also see
D. E. Ibbotson et al., "Plasmaless Dry Etching of Silicon with
Fluorine-Containing Compounds", JOURNAL OF APPLIED PHYSICS, vol.
56(10), pp. 2939-2942 (1984).
[0019] U.S. Pat. No. 4,498,953 describes an in-situ cleaning method
in which an interhalogen, such as BrF.sub.5, BrF.sub.3, ClF.sub.3,
or IF.sub.5 is continuously flowed through the processing chamber
while maintaining a predetermined pressure within the chamber. At
the end of the treatment, the flow of the interhalogen gas is
terminated. Such processes can produce byproduct containing Cl, Br,
or I, as well as byproduct containing fluorine, thereby yielding
significant amounts of hazardous waste material that require
treatment or other disposition. In addition, such continuous flow
cleaning is performed under very low pressure conditions, at which
cleaning efficiency is substantially reduced.
[0020] In some ion source applications, strategic sequencing of
BF.sub.3, PH.sub.3, and/or AsH.sub.3 has been performed in order to
achieve longer ion source lifetimes.
[0021] Additionally, GeF.sub.4, SiF.sub.4 and/or BF.sub.3 have been
used as cleaning gases, but are always used with the plasma struck
in the source chamber.
[0022] The use of fluorine radicals or fluorine-containing
interhalogens for cleaning of semiconductor processing equipment
has associated deficiencies that have constrained its commercial
viability. Fluorine radicals and fluorine-containing interhalogens,
including CIF.sub.3, are highly corrosive in character. Further,
interhalogen compounds are severe irritants to the human
respiratory tract. For example, the threshold human tolerance
levels of ClF.sub.3 vapor can be as low as 100 ppb, with an LC50 on
the order of 1 hour at 300 ppm.
[0023] The art continues to seek new cleaning reagents and ex situ
and in situ systems and processes, and associated monitoring and
control apparatus and methods.
SUMMARY OF THE INVENTION
[0024] The present invention relates generally to apparatus and
methods for monitoring, control, and cleaning of ion implantation
systems or components thereof, as well as to compositions usefully
employed for such cleaning.
[0025] In one aspect the invention provides a method of monitoring
the condition of the filament of an ion implantation system during
operation of the system comprising: (a) energizing a filament in an
arc chamber of an ion source with an initial current sufficient to
generate a plasma in said arc chamber; (b) measuring current input
to the filament to maintain the plasma in the arc chamber at a
predetermined time of continued plasma generation; (c) comparing
the current input measured at the predetermined time to the initial
current, and (d) determining from such comparing whether material
has been deposited on the filament or whether etching of the
filament has occurred, wherein a larger current at the
predetermined time, in relation to the initial current, is
indicative of deposition of material on the filament, and a smaller
current at the predetennined time, in relation to the initial
current, is indicative of etching of the filament.
[0026] In another aspect the invention provides a method of
controlling condition of a filament of an ion implantation system
during operation of the system comprising: (a) energizing a
filament in an arc chamber of an ion source with an initial current
sufficient to generate a plasma in said arc chamber; (b) measuring
current input to the filament to maintain the plasma in the arc
chamber at a predetermined time of continued plasma generation; (c)
comparing the current input measured at the predetermined time to
the initial current, (d) determining from such comparing whether
material has been deposited on the filament or whether etching of
the filament has occurred, wherein a larger current at the
predetermined time, in relation to the initial current, is
indicative of deposition of material on the filament, and a smaller
current at the predetermined time, in relation to the initial
current, is indicative of etching of the filament, and (e) in
response to the determining, removing deposited material from the
filament or depositing additional material on the filament, to an
extent reestablishing the initial current input or a current input
within a predetermined range of said initial current input.
[0027] In still another aspect the invention provides a method of
operating an ion implantation system including a filament in an arc
chamber of an ion source, to maintain operating efficiency of the
ion source, said method comprising contacting the filament with a
tungsten reagent under conditions selected from the group
consisting of:
[0028] (a) conditions effecting deposition of tungsten on the
filament; and
[0029] (b) conditions effecting etching of deposited material from
the filament.
[0030] The invention in a further aspect relates to a method of
cleaning one or more components of an ion implantation system for
at least partial removal of ionization-related deposits from said
one or more components, said method comprising flowing a cleaning
gas through the system, under conditions selected from the group
consisting of:
[0031] (a) conditions effecting deposition of material on the
filament; and
[0032] (b) conditions effecting etching of deposited material from
the filament.
[0033] A further aspect of the invention relates to a method of
maintaining a predetermined electrical resistance of a filament of
an ion source in an arc chamber, comprising contacting the filament
with a reagent effective to deposit material on the filament or to
etch material from the filament depending on temperature in the arc
chamber, and controlling temperature in the arc chamber to effect
deposition or etching of material at the filament, so as to
maintain said predetermined electrical resistance.
[0034] In another aspect, the invention relates to a method of
cleaning an ion implantation system or one or more components
thereof, to remove ionization-related deposits therefrom,
comprising contacting the ion implantation system or one or more
components thereof with BrF.sub.3 under conditions in which said
BrF.sub.3 is chemically reactive with the deposits to effect at
least partial removal thereof.
[0035] In another aspect, the invention relates to a method of
cleaning a foreline of an ion implant system to remove an
ionization-related deposit therefrom comprising contacting the
foreline of an ion implantation system with a cleaning gas under
conditions in which said cleaning gas is chemically reactive with
the deposit to at least partially removal same. Such method can
improve the performance and extend the lifetime of an ion implant
system.
[0036] In another aspect, the invention relates to a method of
improving the performance and extending the lifetime of an ion
implant system, comprising contacting the cathode with a gas
mixture comprising at least one cleaning gas and at least one
deposition gas wherein said gas mixture balances the deposition of
material on the cathode and erosion of the same or other material
from the cathode.
[0037] Other aspects, features and embodiments of the invention
will be more fully apparent from the ensuing disclosure and
appended claims.
BRIEF DESCRIPTION OF THE DRAWINGS
[0038] FIG. 1 is a graph of source lifetime data before and after
introduction of in situ cleaning processes, showing the increase in
lifetime due to the process.
[0039] FIG. 2 is a graph showing effect of XeF.sub.2 on the
suppressor leakage current, as detailed in Example 1.
[0040] FIGS. 3A and 3B are photographs showing evidence of the
cleaning effects in situ cleaning, as detailed in Example 1.
[0041] FIGS. 4A and 4B show cleaning effects in situ cleaning, as
detailed in Example 5.
[0042] FIGS. 5A and 5B are graphs of the increasing filament weight
(FIG. 5A) and filament current (FIG. 5B) over an elapsed time
period with XeF.sub.2 flow.
[0043] FIG. 6 is a graph of the filament weight change as a
function of filament current, with regard to tungsten transport
within the system with XeF.sub.2 flow.
DETAILED DESCRIPTION OF THE INVENTION
[0044] The present invention relates to apparatus and methods for
monitoring, control and cleaning of semiconductor processing
systems and/or components thereof, and to compositions for such
cleaning.
[0045] In one aspect the invention relates to removal of deposits
from semiconductor processing systems or components of
semiconductor processing systems, in which the system or system
component is contacted with a cleaning composition including a
gas-phase reactive material.
[0046] As used herein, the term "gas-phase reactive material" is
intended to be broadly construed as meaning material comprising
halide compound(s) and/or complex(es), in gaseous or vapor form,
ionic and plasma forms of such compound(s) and/or complex(es), and
elements and ions derived from such compound(s), complex(es) and
ionic and plasma forms. A gas-phase reactive material as utilized
in the broad practice of the present invention may also be
variously referred to, without limitation, as a "gas-phase reactive
composition," a "cleaning agent," a "cleaning gas," an "etchant
gas," a "gaseous halide," a "gaseous cleaning agent," a "reactive
halide," a "cleaning compound," a "cleaning composition," a
"cleaning vapor," an "etchant vapor" or any combination of such
terms.
[0047] As used herein, "ion source region" in reference to an ion
implanter, includes the vacuum chamber, the source arc chamber, the
source insulators, the extraction electrodes, the suppression
electrodes, the high voltage insulators, the source bushing, the
filament and the repeller electrode.
[0048] The invention contemplates the cleaning of semiconductor
processing systems and components thereof, as well as other
substrates and apparatus that are susceptible to formation of
deposits thereon during their normal processing operation.
[0049] The present invention in various aspects provides an ion
implantation system with the capability to grow/etch the filament
in the ion source of the arc chamber, by appropriate control of
temperature in the arc chamber to effect the desired filament
growth or alternative filament etching.
[0050] Additional aspects of the invention relate to use of
reactive gases such as WF.sub.x, AsF.sub.x, PF.sub.x and TaF.sub.x,
wherein x has a stoichioimetrically appropriate value or range of
values, for cleaning regions of ion implanters, or components of
implanters in in situ or ex situ cleaning arrangements, under
plasma or elevated temperature conditions.
[0051] A still further aspect of the invention relates to use of
BrF.sub.3 for cleaning of ion implant systems or component(s)
thereof, in in situ or ex situ cleaning arrangements, under ambient
temperature, elevated temperature, or plasma conditions.
[0052] The operation of an ion implantation system results in
deposition of ionization-related materials in the system and its
components. The invention contemplates monitoring, controlling
and/or cleaning of the ion implantation system or one or more
components thereof, for at least partial removal of such
ionization-related deposits from the system and/or components
thereof. The cleaning method involves contacting the system and/or
components thereof with a cleaning composition comprising a
gas-phase reactive material, under conditions enabling reaction of
the gas-phase reactive material with the deposits to effect their
at least partial removal.
[0053] In addition to the ionization-related deposits resulting
from feedstock gases per se, it has also been found that deposits
or residue formed within an ion implantation system may result from
reactivity of feedstock gases with materials from which the system
components are constructed. For example, the vacuum chamber of an
ion implantation system may be constructed utilizing stainless
steel or aluminum. System components within the vacuum chamber may
be constructed utilizing graphite (e.g., standard or vitreous),
insulator materials (e.g., boron nitride) and/or sealant materials
such as Teflon.RTM., Kel-F.TM., PEEK.TM., Delrin.TM., Vespel.TM.,
Viton.TM., Buna-N, silicon, etc. Other materials that can be
present in the ion implantation system, and susceptible to
deposit-producing chemical reactions therein, include, without
limitation, ceramics, epoxy compositions containing lead oxide,
aluminum nitride, aluminum oxide, silicon dioxide, and boron
nitride.
[0054] The ion source itself can be constructed of tungsten,
graphite, molybdenum or tantalum, sometimes with minor amounts of
copper and silver. The ion source arc chamber is usually
constructed of tungsten or molybdenum, or with a graphite body
lined with tungsten or molybdenum. In such circumstance, a fluoride
source feed material, e.g., BF.sub.3, GeF.sub.4, SiF.sub.4,
AsF.sub.5, AsF.sub.3, PF.sub.5, and/or PF.sub.3, reacts at
operating temperatures with the material of the arc chamber, e.g.,
tungsten or molybdenum from the chamber or the lining of the
chamber, to form an intermediate byproduct that in turn can migrate
in the system and decompose to deposit tungsten or molybdenum and
liberate fluorine.
[0055] For example, a feedstock gas such as GeF.sub.4 will
dissociate in the ion source chamber and the resulting free
fluoride will attack the material of the arc chamber, such as
tungsten. This reaction will occur with tungsten on a colder
surface, so if the plasma is struck and the filament is therefore
hot, the fluoride will react with the tungsten on the walls of the
arc chamber, etching the walls and forming WF.sub.6 gas. The
WF.sub.6 will then deposit tungsten on the hot filament, causing it
to grow in size.
[0056] While GeF.sub.4 produces large amounts of free fluorine,
feedstock gases such as BF.sub.3 or SiF.sub.4 produce lesser
amounts of free fluorine and correspondingly lower levels of
tungsten deposition on the filament, which although lower, are
still significant.
[0057] Non-fluorine-containing feedstock gases, such as PH.sub.3
and AsH.sub.3, can be problematic in causing metal from the
filament to deposit onto walls of the arc chamber, with resultant
thinning of the filament.
[0058] The present invention therefore contemplates cleaning of an
ion implantation system or component(s) thereof, for at least
partial removal of ionization-related deposits that are the same as
the material of the arc chamber.
[0059] Cleaning in accordance with the invention can be carried out
in ion implantation systems in which multiple feedstock gases are
concurrently introduced to the system. Feedstock gases can also be
used concurrently with one or more gas-phase reactive materials, or
can be pulsed alternately with one or more gas-phase reactive
materials into the system.
[0060] The ionization-related deposits to which the cleaning
methods of the invention are directed, include a variety of
materials that may interfere with normal operation of the ion
implantation system, such as by forming and accumulating in the ion
source or other ionization process equipment. The deposited
material can variously comprise, consist, or consist essentially
of, silicon, boron, phosphorous, germanium, arsenic, tungsten,
molybdenum, selenium, antimony, indium, carbon, aluminum and/or
tantalum.
[0061] Ionization-related deposits in the ion source arc chamber
and on extraction electrodes can flake and form small particles.
These particles, once formed, can be transported in an ion beam,
e.g., a beam of dopant ions being implanted into a wafer. If such
transported particles reach the wafer, the resulting particle
contamination on the wafer can severely reduce the yield of useful
devices that can be manufactured on the wafer. The cleaning
processes of the present invention remove such ionization-related
deposits before they are able to form flakes and particles, and
thereby achieve reduction of particles on product wafers and
increased yield of semiconductor devices.
[0062] The gas-phase reactive material, or cleaning gas, used for
cleaning in accordance with the invention can include any material
that is effective to at least partially remove the
ionization-related deposits in the ion implantation system.
[0063] The invention also contemplates the use of gas-phase
reactive materials to remove ionization-related deposits from
undesired locations, and/or to deposit material in desired
locations, by appropriate control of the reaction. In specific
embodiments of the invention, tungsten constitutes the material
being removed as an undesired deposit, and in other embodiments,
tungsten is desirably deposited on surfaces benefiting from its
presence. Accordingly, a gas that is reactive to form a tungsten
fluoride intermediate product, such as XeF.sub.2, GeF.sub.4,
SiF.sub.4, BF.sub.3, AsF.sub.5, AsF.sub.3, PF.sub.5, and/or
PF.sub.3, can be used in the controlling and cleaning methods of
the invention. Additionally, tungsten fluoride gases such as
WF.sub.6, WF.sub.5, and/or WF.sub.4 may be utilized directly in the
controlling and cleaning methods of the invention. As such,
gas-phase reactive materials of the invention include, but are not
limited to, XeF.sub.2, GeF.sub.4, SiF.sub.4, BF.sub.3, AsF.sub.5,
AsF.sub.3, PF.sub.5, PF.sub.3, F.sub.2, TaF.sub.3, TaF.sub.5,
WF.sub.6, WF.sub.5, and/or WF.sub.4.
[0064] In various specific embodiments, the gas-phase reactive
material can be co-administered with a "cleaning enhancement agent"
or "co-reactant" that will increase the volatility of the gas-phase
reactive material, resulting in removal of more deposits than with
the gas-phase reactive material without the cleaning enhancement
agent or co-reactant. For example, removal of iridium deposits by
XeF.sub.2 can be enhanced by co-administration of Lewis bases and
electron back-bonding species. In specific applications, carbon
monoxide, trifluorophosphine, and trialkylphosphines can be
employed.
[0065] As a further example, in an ion implantation system in which
feed gases are ionized in plasma sustained in an arc chamber having
tungsten walls on which a filament on one side and a repeller on
the other side are mounted and separated from the walls by ceramic
insulators, the components of the arc chamber may become
contaminated with decomposition products of feed gases, elements of
the arc chamber, and carbon.
[0066] In such circumstance, a cleaning agent useful for removal of
metal contaminants such as tungsten that form volatile fluorides,
such as XeF.sub.2, can be combined with an oxygen-containing
additive that is effective for removing contaminant carbon by
converting it to CO, CO.sub.2, and/or COF.sub.2. Oxygen-containing
additive components useful for such purpose, in specific
embodiments of the invention, include, without limitation, NO,
N.sub.2O, NO.sub.2, CO.sub.2 and/or O.sub.2.
[0067] The invention therefore contemplates cleaning compositions
including both a cleaning agent effective for removing a metal
contaminant by reaction forming a volatile (gaseous) fluoride
compound of such metal, and a cleaning agent effective for removing
carbon contaminant by forming a volatile oxide or oxyfluoride
therefrom. These cleaning reagents can be flowed into the arc
chamber concurrently or sequentially.
[0068] In one embodiment, these reagents are concurrently flowed
into the arc chamber under ionization conditions so that both
cleaning agents are ionized to convert metal and carbon
contaminants into volatile compounds that are easily removed from
the chamber by mechanical pumping thereof.
[0069] The conditions enabling reaction of the gas-phase reactive
material and the deposits may include any suitable conditions of
temperature, pressure, flow rate, composition, etc. under which the
gas-phase reactive material contacts and chemically interacts with
the contaminant so as to remove such material from the substrate,
e.g., the surface of the implanter equipment contaminated with
deposited material.
[0070] Examples of various conditions that may be employed include,
without limitation, ambient temperatures, temperatures in excess of
ambient temperature, presence of plasma, absence of plasma,
sub-atmospheric pressure, atmospheric pressure, and
superatmospheric pressure.
[0071] Specific temperatures for gas-phase reactive material
contacting to remove deposits in various embodiments can range from
about 0.degree. C. to about 1000.degree. C. Contacting can involve
delivery of the gas-phase reactive material in a carrier gas, or in
a neat form, or in admixture with a further cleaning agent, dopant,
etc. The gas-phase reactive material can be heated for chemical
reaction with deposits that are at ambient temperature, in order to
increase the kinetics of the reaction.
[0072] Reaction between the gas-phase reactive material and
contaminant deposits can be monitored and/or regulated, based on
varying characteristics of the reaction between the cleaning agent
and the contaminant. Such reaction characteristics can include
pressure, time, temperature, concentration, presence of a
particular species, rate of pressure change, rate of concentration
change (of a particular species), change of current, etc.
Accordingly, the introduction of the gas-phase reactive material to
the system can be terminated based on attainment of a predetermined
characteristic of the reaction, such as a predetermined pressure in
the vacuum chamber, passage of a predetermined amount of time, or a
predetermined temperature, concentration of a specific element in
the system, presence of a particular by-product, reaction product
or other species in the system, or realization of a predetermined
current condition in the monitoring operation.
[0073] Tungsten deposits can result from reaction of feed gases
with the arc chamber of an implanter system. The method used in
cleaning such deposits may be dependent on the temperature gradient
of the system and/or the current flowing to and through the
filament, and/or any other characteristics that are usefully
determined and able to be monitored.
[0074] For example, fluorine from the feed material may react with
the arc chamber at a first temperature to form WF.sub.6 by
reactions (1) or (2):
3F.sub.2(g)+W(s).fwdarw.WF.sub.6(g) (1)
6F(g)+W(s).fwdarw.WF.sub.6(g) (2)
There may also be reaction between the cleaning gas and tungsten
material of the arc chamber, such as:
3XeF.sub.2+W.fwdarw.3Xe+WF.sub.6 (3)
Alternatively, WF.sub.6 (or WF.sub.5 or WF.sub.4) may be provided
directly to the system.
[0075] The tungsten fluoride once formed or otherwise present in
the system can then migrate to another location in the system.
Depending on the temperature of that other location, the tungsten
fluoride will etch or deposit tungsten at that location. At the
filament, the temperature will primarily depend on the actual
current flux passing through it. Temperatures at other locations in
the arc chamber may vary depending on the specific location and
design of the arc chamber, the filament current, as well as other
non-filament electrical currents.
[0076] If the second location is at high temperature, the tungsten
fluoride is decomposed, tungsten is deposited and fluorine is
released, with the tungsten deposit growing in size as long as
tungsten fluoride continues to be present. Deposition reactions can
include the following reactions (4), (5) and/or (6):
WF.sub.6.fwdarw.W+3F.sub.2 (4)
2WF.sub.5.fwdarw.2W+5F.sub.2 (5)
WF.sub.4.fwdarw.W+2F.sub.2 (6)
[0077] Contrarily, if the second location is at moderate
temperature, the tungsten fluoride can etch that location, removing
tungsten and retaining fluorine in the reaction product, so that
the etched location shrinks as etching continues. Such etching
reactions can include the following reactions (7), (8) and/or
(9):
WF.sub.6(g)+2W(s).fwdarw.3WF.sub.2(g) (7)
2WF.sub.6(g)+W(s).fwdarw.3WF.sub.4(g) (8)
5WF.sub.6(g)+W(s).fwdarw.6WF.sub.5(g) (9)
[0078] Therefore, for removal of tungsten deposits, the temperature
of the components bearing the deposits can be selected to maximize
the rate and extent of removal.
[0079] In other embodiments of the invention, boron and/or
molybdenum deposits in the arc chamber are removed in a
corresponding manner.
[0080] The contacting of the cleaning agent with the process
equipment in the process of the invention can be carried out with
monitoring of the pressure change during the contacting, with the
contacting being terminated when the pressure change goes to
zero.
[0081] Alternatively the contacting may be conducted with
monitoring of partial pressure of the gas-phase reactive material,
or reactants deriving therefrom, or reaction products produced in
the contacting, with the contacting being terminated when the
partial pressure reaches a predetermined value, i.e., an end point.
Such end point monitoring can for example be carried out with a
suitable end point monitor, e.g., an end point monitor of a type as
more fully described in U.S. Pat. No. 6,534,007 and U.S. patent
application Ser. Nos. 10/273,036; 10/784,606; 10/784,750; and
10/758,825, or a thermopile infrared (TPIR) or other infrared
detector.
[0082] In another embodiment, the contacting may be conducted by
controlled flow of the gas-phase reactive material using components
of the process equipment system that allow regulation of the
partial pressure of gas-phase reactive material and therefore
control of the reaction rate.
[0083] In still another embodiment, a continuous flow of the
gas-reactive material, at a pre-determined flow rate, is employed
to carry out the cleaning operation.
[0084] As discussed hereinabove with reference to reactions
(1)-(9), ionization-related deposits of tungsten can be deposited
at very high temperatures and etched at low to moderate
temperatures. Where the location of the deposition or etching is
the filament of the implanter system, the temperature and current
flux are directly related to one another. When the filament is
being etched, the filament becomes thinner and the resistance to
electrical current will increase as the cross-section of the
filament decreases, so that current flow through the filament is
reduced. If the conditions at the filament promote deposition
thereon, the resistance to electrical current will decrease with
continued deposition, as the cross-section of the filament
increases and the filament becomes thicker, with correspondingly
increased current flow therethrough.
[0085] In another aspect, the invention relates to a method of
monitoring the deposition on the source filament and resulting
growth of the filament, involving monitoring of the current flow
through the filament. As the filament cross-section increases due
to deposition, the resistance to the electrical current will
decrease and the current will increase in order to maintain the
filament at the temperature required to support the plasma in the
arc chamber. A monitored increase in current can therefore be used
to indicate a need for filament cleaning.
[0086] In a further aspect, the invention relates to a method of
monitoring etching or cleaning of the filament, by monitoring
current flow through the filament. As the filament cross-section
decreases due to etching, sputtering or evaporation, the resistance
to the electrical current will increase and the current will
decrease in order to maintain the filament at the temperature
required to support the plasma in the arc chamber. A monitored
decrease in such current can therefore be used to indicate a need
for deposition of additional material to an etched filament, or for
termination of a cleaning or ionization process.
[0087] Another implementation of the invention comprises a method
of controlling the condition of the filament, based on monitoring
of current flowed through the filament as detailed above.
[0088] In one embodiment, a decrease in the monitored filament
current provides an indication that the filament is close to
breaking, in response to which a gas-phase reactive material is
flowed into the system, e.g., while the plasma is struck, or
alternatively with the plasma off but the filament still hot (for
example, .about.200.degree. C.), to induce reaction producing
deposition of metal on the filament, e.g., tungsten from the arc
chamber walls. Such reaction may be allowed to proceed until the
current is within a predetermined range for effective operation of
the ion implantation system, indicating that the filament has been
"regrown" to a satisfactory extent.
[0089] In another embodiment, an increase in the monitored filament
current provides an indication that the filament is growing, due to
material deposition. In response, a gas-phase reactive material is
flowed into the system after allowing the filament to cool for a
predetermined period of time, or to a predetermined temperature
(which may for example be in a range of from room temperature up to
about 1200.degree. C.) so that the filament is cooled sufficiently
to allow etching of the filament. The subsequent etching reaction
mediated by the gas-phase reactive material may thereafter be
allowed to proceed until the current is within a predetermined
range for effective operation of the ion implantation system,
indicating that the filament has been thinned to an appropriate
level.
[0090] The method of the invention can therefore be used for
removing from a substrate a deposit including at least one of
boron, silicon, arsenic, phosphorus, germanium, tungsten,
molybdenum, selenium, antimony, indium, tantalum and carbon, by
contacting the substrate with a gas-phase reactive material for
sufficient time to at least partially remove the deposit from the
substrate. The gas-phase reactive material for such purpose may
include one or more of XeF.sub.2, XeF.sub.4, XeF.sub.6, GeF.sub.4,
SiF.sub.4, BF.sub.3, AsF.sub.5, AsF.sub.3, PF.sub.5, PF.sub.3, F2,
TaF3, TaF5, WF.sub.6, WF.sub.5, WF.sub.4, NF.sub.3, IF.sub.5,
IF.sub.7, KrF.sub.2, SF.sub.6, C.sub.2F.sub.6, CF.sub.4, Cl.sub.2,
HCl, ClF.sub.3, ClO.sub.2, N.sub.2F.sub.4, N.sub.2F.sub.2,
N.sub.3F, NFH.sub.2, NH.sub.2F, HOBr, Br.sub.2, BrF.sub.3,
C.sub.3F.sub.8, C.sub.4F.sub.8, C.sub.5F.sub.8, CHF.sub.3,
CH.sub.2F.sub.2, CH.sub.3F, COF.sub.2, HF, C.sub.2HF.sub.5,
C.sub.2H.sub.2F.sub.4, C.sub.2H.sub.3F.sub.3,
C.sub.2H.sub.4F.sub.2, C.sub.2H.sub.5F, C.sub.3F.sub.6, COCl.sub.2,
CCl.sub.4, CHCl.sub.3, CH.sub.2Cl.sub.2, and CH.sub.3Cl.
[0091] Fluorinated xenon compounds can be employed as cleaning
agents and plasma source reagents in the practice of the invention,
and can include any suitable number of fluorine atoms. A higher
ratio of F to Xe enables relatively faster and more efficient
cleaning, in relation to lower F/Xe compounds. Higher vapor
pressures increase delivery rates of the cleaning agent and enable
delivery of more material.
[0092] In one embodiment of the invention, xenon hexafluoride is
employed as a cleaning agent or plasma source reagent. Although
XeF.sub.6 vapor pressure at room temperature is approximately seven
times higher than that of XeF.sub.2, XeF.sub.6, as well as
XeF.sub.4, is very reactive with water. XeF.sub.6 is most
advantageously employed in cleaning environments not involving the
presence or generation of water, hydrocarbons, hydrogen or reducing
agents. However, when cleaning compounds with a lower vapor
pressure are used, adjustments to the flow circuitry may be
required in order to avoid undue pressure drops in the flow path
and maintain suitably high delivery rates of the cleaning
agent.
[0093] Apparatus to effectuate the methods of the invention may be
constructed and arranged in any suitable manner to accommodate the
cleaning with the gas-phase reactive material.
[0094] In one embodiment, the invention provides an ion
implantation and cleaning assembly, comprising (i) an ion
implantation system including one or more components accumulating
ionization-related deposits thereon during ion implantation
processing in the system, (ii) a cleaning assembly including a
cleaning composition source containing a cleaning composition
including a gas-phase reactive material, e.g., a halide compound
that is reactive with the deposits to effect at least partial
removal thereof from the one or more components under cleaning
conditions involving contact of the cleaning composition with the
deposits, (iii) flow circuitry adapted to transport the cleaning
composition from the cleaning composition source to the one or more
components for contacting therewith under the cleaning conditions,
and (iv) flow componentry adapted to control flow of the cleaning
composition through the flow circuitry during the cleaning
conditions to effect the at least partial removal of the deposits
from the one or more components.
[0095] The flow componentry in the above-described assembly can be
of any suitable type, including for example valves, valve
actuators, flow restrictors, regulators, pumps, mass flow
controllers, pressure gauges, residual gas analyzers, central
processing units, membranes, etc. Such flow componentry is suitably
adapted to operate under the specific cleaning conditions
employed.
[0096] The one or more components in the implanter apparatus that
accumulate ionization-related deposits thereon during ion
implantation processing in the system, can be of any suitable type,
e.g., vacuum chambers, arc chambers, electrodes, filaments, high
voltage bushings, magnet waveguides, wafer handling components,
clamp rings, wheels, discs, etc. In one embodiment, the component
is a vacuum chamber or a component contained therein.
[0097] The cleaning composition source may comprise a material
storage and dispensing package containing the cleaning composition.
The material storage and dispensing package includes a vessel that
may, for example, be of generally cylindrical shape, defining an
interior volume therein. In a specific embodiment, the cleaning
composition may be a solid at ambient temperature conditions and
such cleaning composition may be supported on an enhanced surface
area within the vessel. Such enhanced surface area may include
structures therein, such as trays, as described in U.S. Pat. No.
6,921,062, or porous inert foam, e.g., of anodized aluminum,
stainless steel, nickel, bronze, etc., to provide a consistent rate
of evaporation of the cleaning material and in turn provide
sufficient vapor pressure for dispensing and ionizing steps of the
associated cleaning process. Where trays are utilized, the cleaning
composition may be supported on surfaces of trays having flow
passage conduits associated therewith, for flow of vapor upwardly
in the vessel to a dispensing port thereof, in dispensing
operation.
[0098] The flow circuitry in the above-described equipment
arrangement is adapted to transport the cleaning composition from
the cleaning composition source to the arc chamber under cleaning
conditions. Such adaptation may be based on various properties of
the cleaning composition. For example, high conductance may be used
to avoid unnecessary pressure drops in the flow path when the
cleaning composition has a low vapor pressure. Methods of
maximizing flow conductance and minimizing flow constriction are
well known in the art.
[0099] In all cleaning methods of the invention, the cleaning may
optionally be utilized with additional methods and apparatus for
extending the lifetime of the ion implantation system, in
particular the ion source. Such lifetime-extending approaches may
include modification of an ion implantation system to accommodate
specific substrate, deposited materials and/or gas-phase reactive
materials. System apparatus modifications may include, without
limitation, the provision of: extraction electrodes with active
thermal control systems, actively heated extraction electrodes that
reduce the frequency/occurrence of electrical discharges,
extraction electrodes comprising metals, preferably aluminum,
molybdenum or alumina (Al.sub.2O.sub.3), remote plasma sources,
association of extraction electrodes with heaters, association of
extraction electrodes with cooling devices, smooth, featureless
extraction electrodes, plasma chambers arranged to receive source
gases capable of being disassociated by plasma to produce flows of
reactive gas through chamber outlets and conduits for transporting
reactive gases to the ionization chamber, temperature detectors
designed to detect substantial termination of exothermic reactions
of the reactive gas with contamination on surfaces in process
systems, protection of components in the process equipment that are
susceptible to harm by gas-phase reactive materials (e.g.,
provision of shields against gas-phase reactive materials, around
components that are sensitive to such materials), and/or use of
system components comprising aluminum or alumina.
[0100] Methods to extend the lifetime of the process equipment may
include, without limitation: actively heating extraction electrodes
to reduce the frequency and occurrence of electrical discharges,
heating extraction electrodes above the condensation temperature of
source materials that are delivered to the ion source, actively
controlling temperature of extraction electrodes adapted to the
specific type of ion source employed (e.g., heating or cooling the
electrode, in combination with a heated or cooled ion source),
and/or maintenance of extraction electrodes at elevated temperature
during extraction. Such additional apparatus modifications and
methods are more fully described in U.S. Patent Application
Publication Nos. 2006/0272776 and 2006/0272775 and International
Patent Publication No. WO05/059942, hereby incorporated by
reference in their entirety.
[0101] The ion implantation system in a specific embodiment
includes an arc chamber and a dopant source, in which the dopant
source may for example comprise BF.sub.3, XeF.sub.2, AsH.sub.3,
PH.sub.3, GeF.sub.4, SiF.sub.4, H.sub.2Se, AsF.sub.5, AsF.sub.3,
PF.sub.5, PF.sub.3 or other boron, silicon, arsenic, phosphorus or
germanium-containing dopant sources.
[0102] In another implementation, the invention relates to an ion
implantation method, involving plasma generation in an arc chamber
of an ion implantation system from a dopant source gas flowed
through the arc chamber to form dopant source ions for
implantation, wherein during at least part of the time during which
the dopant source gas is flowed through the arc chamber, gas-phase
reactive material is flowed through the arc chamber concurrently
with the dopant source gas, to effect cleaning in the ion
implantation system.
[0103] In general, although concurrent flow of the dopant source
gas and gas-phase reactive material may be effected to achieve in
situ cleaning, it typically is preferred to effect the cleaning
operation in a sequential manner, e.g., when the ion source is
generating a first plasma from a first dopant source, and
subsequently the ion source is generating a second plasma from a
second dopant source, an intervening cleaning step is employed, in
which gas-phase reactive material is flowed through the ion source,
with or without plasma generation.
[0104] In one embodiment, the invention provides a method of
forming a doped silicon substrate, comprising implanting Xe.sup.+
ions in a silicon substrate, and thereafter implanting dopant ions
in the silicon substrate. In such process, implanting of the
Xe.sup.+ ions serves to amorphize the crystal structure of the
substrate.
[0105] In the generation of a fluorinated xenon plasma, e.g., an
XeF.sub.2 plasma, for cleaning, Xe.sup.+ ions may do some low
energy sputter cleaning of the source itself. After extraction, the
Xe.sup.+ ions may do some high energy sputtering of components
downstream of the ion source, such as vacuum walls, ion optical
components, wafer discs and wafer holders.
[0106] Similarly, where tungsten fluoride species such as WF.sub.6,
WF.sub.5, and/or WF.sub.4 are utilized, free fluoride may sputter
clean various components of the ion source and/or tungsten may be
deposited on various components of the ion source. The action that
occurs, as between cleaning and deposition, is dependent on the
temperature of the individual components in the system.
[0107] The present invention in various aspects relates to a method
and apparatus for cleaning the ion source region of an ion
implantation system used in the fabrication of a microelectronic
device. The ion source region may for example include an indirectly
heated cathode source, a Freeman source or a Bernas source.
[0108] The present invention in one embodiment relates to in situ
removal of residue from the vacuum chamber of the ion implanter and
components contained therein by contacting the vacuum chamber
and/or components with a gas-phase reactive halide composition for
sufficient time and under sufficient conditions to at least
partially remove the residue from the vacuum chamber and/or
components, and to do so in such a manner that when the residue and
the material from which the vacuum chamber and/or components are
constructed is different, the gas-phase reactive material is
selectively reactive with the residue and minimally reactive (e.g.
substantially non-reactive, and preferably completely non-reactive)
with the materials from which the vacuum chamber and/or components
of the ion implanter are constructed; and when the residue and the
material from which the vacuum chamber and/or components are
constructed is the same, then the gas-phase reactive material may
be reactive with both the residue and the vacuum chamber and/or
components.
[0109] As used herein, the term "selectively," as applied to the
reactivity of the gas-phase reactive halide with a residue, is used
to describe a preferential reaction between the gas-phase reactive
halide and a residue. While remaining essentially non-reactive with
the materials from which the vacuum chamber and/or components of
the ion implanter are constructed, the gas-phase reactive halide
may react with some with the materials from which the vacuum
chamber and/or components of the ion implanter are constructed if
the vacuum chamber and/or components comprise elements that are the
same as or similar to those of the residue itself. For example,
while being selectively reactive and removing tungsten deposits
from a component, the gas-phase reactive material might also react
with tungsten in the component itself. The residue and the
components do not have to be exactly the same material for such
co-reaction to occur, but will comprise some materials in
common.
[0110] In another embodiment, the ion implanter components are
cleaned ex situ, in a separate dedicated chamber to which the
components are removed from an ion implanter.
[0111] Considering in situ cleaning in further detail, such
cleaning is primarily dependent on three factors: the reactive
nature of the cleaning precursor, the volatility of the cleaning
reaction by-products, and the reaction conditions employed in the
chemical cleaning. The cleaning composition must remove unwanted
residue while minimizing wear of the materials of construction of
the implanter. The byproducts generated by the cleaning reaction
must be volatile enough to facilitate their removal by the vacuum
system of the ion implanter or other pumping apparatus.
[0112] The cleaning of residue formed from the same material as the
component(s) of the implanter does result in some wear of the
component itself. Specifically, use of XeF.sub.2 as a cleaning
agent to remove tungsten deposits from a system utilizing a
tungsten arc chamber will result in removal of some tungsten from
the interior of the arc chamber. However, in the interest of
maximizing system efficiency, loss of some of the interior material
of the arc chamber is not significant when viewed in light of the
decreased system performance if the system is not cleaned and the
tungsten deposits are allowed to accumulate in the system.
[0113] The gas-phase reactive material may for example include a
fluorinated xenon compound vapor, such as XeF.sub.2 vapor.
XeF.sub.2 is a preferred reactive halide gas, and will sublime at
room temperature, but may be heated using a heater to increase the
rate of sublimation. XeF.sub.2 is known to be an effective silicon
etchant and has been used as a silicon selective etchant in Micro
Electro Mechanical System (MEMS) device processing. Specifically,
XeF.sub.2 reacts with silicon according to the following
reaction.
2XeF.sub.2(g)+Si(s).fwdarw.2Xe(g)+SiF.sub.4(g) (10)
The silicon/XeF.sub.2 reaction can occur without activation, i.e.,
without plasma or thermal heating. The reaction rate of XeF.sub.2
with Si is much greater than the reaction rate of XeF.sub.2 with
SiO.sub.2, making XeF.sub.2 selective for reaction with Si.
[0114] XeF.sub.2 or other fluorinated xenon compound is usefully
employed in the practice of the invention as an etchant for
metallic boron. Although not wishing to be bound by theory, it is
thought that the boron is etched according to the following
reaction (11):
3XeF.sub.2(g)+2B(s).fwdarw.3Xe(g)+2BF.sub.3(g) (11)
[0115] The use of XeF.sub.2 as an etchant for arsenic, phosphorus
and germanium is contemplated by the invention, and may involve the
following reactions:
5XeF.sub.2(g)+2As(s).fwdarw.5Xe(g)+2AsF.sub.5(g) (12)
5XeF.sub.2(g)+2P(s).fwdarw.5Xe(g)+2PF.sub.5(g) (13)
2XeF.sub.2(g)+Ge(s).fwdarw.2Xe(g)+GeF.sub.4(g) (14)
Such reactions may be carried out with or without energetic
activation.
[0116] The method and apparatus of the invention are useful to at
least partially remove residue from the components of the ion
implanter, e.g., with removal of at least 25%, more preferably at
least 50% and most preferably at least 75% of such residue, and to
do so in such a manner that residue is removed selectively with
respect to the materials from which the components of the ion
implanter are constructed, e.g., aluminum, tungsten, molybdenum,
graphite, insulator materials, sealant materials, etc., when the
residue material differs from those materials.
[0117] When the residue and the component material of construction
are the same material, similar levels of residue removal are
desired, while maintaining removal of material from the component
at low levels, such as in the range of microns or tens of microns,
so as not to significantly affect the performance of the component.
Further, since deposits generally do not have a uniform thickness
or deposition, they may be more reactive than the material of the
component itself in the cleaning process, so that the gas-phase
reactive material composition is more selective to reaction with
the residue than to reaction with the component part.
[0118] Several modes of delivery of the gas-phase reactive material
composition to the ion source region for in situ cleaning may be
employed, including a stagnant mode, a continuous mode, and a
direct introduction mode. Such modes of cleaning are more fully
described in International Publication WO07/127865, together with
apparatus and methodology that are usefully employed in the
practice of the present invention. The disclosure of International
Publication WO07/127865 is hereby incorporated herein by reference,
in its entirety. Although use of XeF.sub.2 as a cleaning
composition is described herein in connection with various
embodiments of the invention, it will be understood that other
fluorinated compounds, such as WF.sub.6, WF.sub.5, and/or WF.sub.4,
may be used, alternatively to or in combination with XeF.sub.2, or
other and additional fluorinated compounds can be employed. For
example, BrF.sub.3 can be used to etch tungsten without a plasma.
In another aspect, the invention relates to a method of improving
the performance and extending the lifetime of an ion implant system
that employs solid doping material which comprises using XeF.sub.2
or N.sub.2F.sub.4 as a carrier gas for said solid doping material.
The solid doping material includes, but is not limited to,
Sb.sub.2O.sub.3 and InCl.sub.3. As contemplated by the present
invention, the use of XeF.sub.2 or N.sub.2F.sub.4 as a carrier gas
for Sb.sub.2O.sub.3, InCl.sub.3 or other solid doping material,
removes Sb, In and other dopants deposited on the source chamber
and components thereof. The instant method has utility even if a
switch over to boron is made after Sb implanting. Advantages gained
by the method of the invention are at least two-fold: first, it
provides real time source cleaning to prevent or reduce dopant
accumulation on the ion source chamber and components thereof, thus
improving ion source performance with prolongation of ion source
life; second, it enhances and/or stabilizes the plasma and/or beam
current.
[0119] In another aspect, the invention relates to a method of
improving the performance and extending the lifetime of an ion
implant system that employs gaseous doping material which comprises
using XeF.sub.2 or N.sub.2F.sub.4 as a co-flow gas with said
gaseous doping material. The gaseous doping material includes, but
is not limited to, GeH.sub.4. As contemplated by the present
invention, the use of XeF.sub.2 or N.sub.2F.sub.4 as a co-flow gas
with GeH.sub.4 or other gaseous doping material, removes Ge or
other dopants deposited on the source chamber and components
thereof. Advantages obtained by this practice of the invention are
at least two-fold: first, it provides real time source cleaning to
prevent or reduce dopant accumulation on the ion source chamber and
components thereof, thereby improving ion source performance and
prolonging ion source life; second, it enhances and/or stabilizes
the plasma and/or beam current.
[0120] In another aspect, the invention relates to a method of
cleaning a foreline of an ion implant system to remove an
ionization-related deposit therefrom comprising contacting the
foreline of an ion implantation system with a cleaning gas under
conditions in which said cleaning gas is chemically reactive with
the deposit to effect at least partial removal thereof. Deposits
include, but are not limited to those comprising B, Ge, Si, P, and
As, or mixtures of same. The cleaning gas includes, but is not
limited to XeF.sub.2, N.sub.2F.sub.4, F.sub.2, and other
fluorinated species which are reactive with a deposit as
constituted aforesaid. As appreciated by those in the art the
amount of cleaning gas needed is dependent on the amount of deposit
present. Similarly, the amount of heat given off during the
reaction of the cleaning gas and the deposit is dependent on the
flow rate of the cleaning gas. The identity and concentration of
byproduct species that result from the cleaning process depends on
cleaning gas flow rate, the compositional make-up of the deposits,
and the pump purge flow rate. For non-limiting illustrative
purposes only, an example of using XeF.sub.2 to clean phosphorus
from a foreline is described below:
[0121] The chemical reaction used to determine the quantity of
XeF.sub.2 required in the cleaning process is:
5XeF.sub.2(g)+2P(s).fwdarw.5Xe(g)+2PF.sub.5(g). The enthalpies of
formation (in kJ/mol) are taken from Lange's Handbook of Chemistry
(14.sup.th ed) and are listed here for the determination of the
heat liberated during the reaction: XeF.sub.2 (-164); Xe (0); P
(0); and PF.sub.5 (-1594.4). The flow rate of XeF.sub.2 determines
the length of time required for the cleaning process as well as the
heat liberated. Without providing a means of heating the XeF.sub.2
cylinder, the maximum sustained flow rate is approximately 50 sccm,
assuming adequate delivery tubing conductance. This flow rate can
be increased to 100 sccm or greater if the cylinder is maintained
at room temperature by using a heating jacket. The amount of
XeF.sub.2 needed to clean the phosphorus deposit is shown in Table
1, and the amount of heat given off during the cleaning reaction is
shown in Table 2.
TABLE-US-00001 TABLE 1 Mass of Mass of Phosphorus Deposits (g) XeF2
Required (g) 10 137 100 1367 1000 13,666
TABLE-US-00002 TABLE 2 Flow Rate of Rate of XeF2 (sccm) Heat
Generation (watts) 50 17.6 100 35 200 70
[0122] The maximum production rate of various byproducts from the
above-described cleaning reaction is shown in Table 3.
TABLE-US-00003 Flow Rate of XeF2 (sccm) AsF3 PF3 BF3 GeF4 SiF4 50
0.20 g/min 0.13 g/min 0.10 g/min 0.17 g/min 0.12 g/min (33.3 (33.3
sccm) (33.3 sccm) (25 sccm) (25 sccm) sccm)
[0123] As appreciated by those in the art, because the composition
of the residues may vary, the data shown in Table 3 is based upon
the assumption that the byproduct quantities are determined for
each element assuming 100% compositional make-up of that element.
Furthermore, the maximum concentrations of these species are
dependent upon the dilution flow rates in the exhaust systems. For
example, just downstream of the roughing pump, the maximum steady
state concentration of PF.sub.3 is 3330 ppm if the pump has a
nitrogen purge of 10 slpm. This value can increase if the flow rate
of XeF.sub.2 is higher than 50 sccm.
[0124] In one embodiment of the above-described method, the
cleaning gas flows into the implant source chamber, with the turbo
pump off, but the roughing pump on. This practice improves the flow
rate of the cleaning gas over foreline deposits thus providing a
faster cleaning process. Cleaning gas flow rate can be further
improved by heating the gas cylinder wherein the cleaning gas is
stored to up to room temperature or above. Preferably, in this
practice, the delivery lines from the gas cylinder to the ion
implanter are similarly heated.
[0125] In another embodiment of the above-described method, the
cleaning gas flows into the implant source chamber in a pulsed flow
in which the implant source chamber, the pump and the forelines are
filled to a certain pressure and then pumped to lower pressure.
This process is repeated until the deposit on the foreline of the
ion implant system is removed. This practice preferably employs an
isolation valve on the inlet of the roughing pump.
[0126] In a preferred practice, the above-described embodiment
further comprises heating the gas cylinder wherein the cleaning gas
is stored to room temperature or above.
[0127] For all embodiments, the method preferably further comprises
a scrubber at the roughing pump outlet to remove the volatile
byproducts produced from the cleaning process.
[0128] Each embodiment preferably further comprises a Xe recovery
system as commercially available from Air Products and Chemicals,
Inc. (PA, USA), and is described in
http://www.fabtech.org/product_briefings/_a/new_product_air_products_offe-
rs_on_site_xenon_recovery., incorporated herein.
[0129] Another embodiment of the method of cleaning a foreline of
an ion implant system comprises providing the cleaning gas
downstream of a turbo pump and flowing said cleaning gas
continuously to the foreline of the ion implant system. This
practice preferably cleans the deposits on the foreline even when
the implant processes are running, thereby reducing the disruption
of the operation of ion implanting.
[0130] In the above-described embodiment, the cleaning gas is
preferably stored in a gas cylinder; the method preferably further
comprises heating the gas cylinder wherein the cleaning gas is
stored at room temperature or above.
[0131] The above-described embodiment preferably further comprises
providing a scrubber at the roughing pump outlet to remove the
volatile byproducts produced from the cleaning process.
[0132] The above-described embodiment further comprises providing a
Xe recovery system as commercially available from Air Products and
Chemicals, Inc. (PA, USA), and is described in
http://www.fabtech.org/product_briefings/_a/new_product_air_products_offe-
rs_on_site_xenon_recovery., incorporated herein.
[0133] In another aspect, the invention relates to a method of
improving the performance and extending the lifetime of an ion
implant system having a cathode comprising contacting the cathode
with a gas mixture comprised of at least one cleaning gas and at
least one deposition gas wherein said gas mixture balances the
deposition of material on the cathode and the stripping off of the
same or other material from the cathode. The cleaning gas of the
gas mixture removes dopant deposited on the cathode and the
material of the cathode, whereas the deposition gas of the gas
mixture directly or indirectly causes depositing dopant onto the
cathode. Such a gas mixture maintains a balance between the
accumulation of dopant material and stripping off of the same or
other material on the cathode, and therefore prolongs the ion
source life. Storage and dispensing of the gas mixture into ion
source implanter may be accomplished by using an
adsorption-desorption apparatus (referred to as SDS--safe delivery
source) described in U.S. Pat. No. 5,518,528, and the contents of
which are incorporated herein by reference; a fluid storage and
dispensing system comprising a vessel for holding a fluid at a
desired pressure (referred to as VAC Vacuum Actuated Cylinder)
described in U.S. Pat. No. 6,101,816, and the contents of which are
incorporated herein by reference; or a hybrid fluid storage and
dispensing system of SDS and VAC (referred to as VAC-Sorb)
described in U.S. Pat. No. 6,089,027, and the contents of which are
incorporated herein by reference. These fluid storage and
dispensing systems provide sub-atmospheric pressure delivery of the
gases, and thereby are safer and more efficient than the high
pressure fluid storage and dispensing systems. Moreover, some of
the gases of the gas mixture, which are not compatible to co-exist
under high pressure fluid storage and dispensing system, can be
stored and dispensed together under the SDS, VAC or VAC-Sorb
systems.
[0134] In one embodiment of the above-described method, gases of
the gas mixture flow simultaneously to contact the cathode.
[0135] In another embodiment of the above-described method, gases
of the gas mixture flow sequentially to contact the cathode.
[0136] In another embodiment of the above-described method, the gas
mixture comprising a combination of at least one
hydrogen-containing gas and at least one fluorine-containing gas
wherein the hydrogen-containing gas functions as the cleaning gas,
and the fluorine-containing gas functions as the deposition
gas.
[0137] In another embodiment of the above-described method, the gas
mixture comprises a combination of at least one non-dopant gas,
i.e., gas does not contain As, P, Ge, B, Si, or C, and at least one
dopant gas wherein the non-dopant gas functions as the cleaning
gas, and the dopant gas functions as the deposition gas.
[0138] Examples of cleaning gas are, but not limited to,
Xe/H.sub.2, Ar/H.sub.2, Ne/H.sub.2, Xe/NH.sub.3, Ar/NH.sub.3,
Ne/NH.sub.3, Ar/Xe, and Ar/Xe/H.sub.2.
[0139] Examples of deposition gas are, but not limited to, F.sub.2,
N.sub.2F.sub.4, ClF.sub.3, WF.sub.6, MoF.sub.6, and NF.sub.3.
[0140] Examples of the gas mixture are, but not limited to,
AsH.sub.3/AsF.sub.3, AsH.sub.3/AsF.sub.5, PH.sub.3/PF.sub.3,
PH.sub.3/PF.sub.5, SiH.sub.4/SiF.sub.4, H.sub.2/Xe/SiF.sub.4,
GeH.sub.4/GeF.sub.4, H.sub.2/Xe/GeF.sub.4, H.sub.2/GeF.sub.4,
B.sub.2H.sub.6/BF.sub.3, H.sub.2/BF.sub.3, F.sub.2/BF.sub.3,
CO.sub.2/F.sub.2, CO.sub.2/CF.sub.4, CO/F.sub.2, CO/CF.sub.4,
COF.sub.2/F.sub.2, COF.sub.2/CH.sub.4, COF.sub.2/H.sub.2.
[0141] The features and advantages of the invention are more fully
shown by the following non-limiting examples.
EXAMPLE 1
[0142] This example shows the improvement in ion source lifetime
and implanter utilization that is achievable by use of a chemical
cleaning agent to remove deposits. Preferably, the deposits are
removed at regular intervals to prevent buildup of contaminant
flakes and conductive films in the implanter.
[0143] In-situ cleaning was carried out by introducing XeF.sub.2 at
regular intervals from a supply vessel thereof positioned in the
gas box of the ion implanter, with XeF.sub.2 cleaning vapor
introduced into the ion source for 10-15 minutes twice a day. A
high current implanter was utilized for testing to assess flow
dynamics of the cleaning reagent. XeF.sub.2 cleaning properties
were determined and it was verified that the cleaning agent had no
adverse effect on the implanter's beamline components. The cleaning
process using the XeF.sub.2 reagent then was qualified for use with
a medium current implanter apparatus.
[0144] FIG. 1 is a graph of compiled source lifetime data from such
medium current implanter, prior and subsequent to implementation of
the in-situ cleaning process. The data were developed for a dopant
composition including arsine and phosphine. Before cleaning, the
ion source had an average operating life of approximately 250.+-.90
hours, limited by two common failure modes.
[0145] The predominant mode of failure was excessive leakage from a
suppressor voltage supply. For successful extraction of a stable
ion beam, suppressor voltage is applied to an electrode positioned
outside of the arc chamber. The electrode is electrically isolated
by a number of small insulators, and buildup of a conductive film
on one or more of these insulators can cause excessive suppressor
leakage.
[0146] A secondary mode of failure was shorting out of components
in the arc chamber attributable to flakes of deposited
material.
[0147] These failure modes were found to be minimized by the
in-situ chemical cleaning process. Regular twice-daily cleaning
increased source lifetime on the production.
[0148] The effect of XeF.sub.2 on the suppressor leakage current is
further shown in FIG. 2, which is a graph of the leakage current
for the medium current tool before and after introduction of
in-situ cleaning. Each data point represents an average suppressor
current during the time required to implant a wafer lot, and points
have been plotted over the lifetime of several ion sources. The
magnitude of the leakage depends on the elapsed time since
replacement of insulators at the last preventive maintenance. The
data show that regular in-situ cleaning greatly reduced leakage
current so that it never reached the upper control limit of 1.5 mA
at which an unscheduled source maintenance is required.
[0149] In-situ cleaning effects were also evaluated, using an
implant dopant mix including BF.sub.3 and PH.sub.3. The source ran
for 497 hours under these conditions and failed for an arc limited
condition involving tungsten deposits on the filament, attributable
to the BF.sub.3 chemistry. The single source life of 497 hours on
the test system compares favorably with the long term historical
average of 299 hours on the same system. This is a single data
point, but it fits the established pattern. The source life
improvement in this case appears to be due to etching by XeF.sub.2
of tungsten deposits in the source arc chamber.
[0150] The FIGS. 3A and 3B photographs provide additional evidence
of the effect of the cleaning agent. In both photographs the
appearance of the ion source housing after removal of the ion
source assembly for periodic preventive maintenance is shown, after
about 98 days of production in each instance. For the photograph in
FIG. 3A, in situ cleaning was conducted twice daily, while for the
photograph in FIG. 3B no cleaning had been performed.
[0151] In the absence of cleaning, substantial quantities of
deposited material were present, some of which had begun to
delaminate and flake. During regular maintenance activity, manual
scrubbing was used to remove deposited material from internal
surfaces of the housing. The housing appeared much cleaner with in
situ cleaning, with little or no time being spent on manual
cleaning. Deposits were removed by unreacted XeF.sub.2 flowing out
of the arc chamber, and passing to the vacuum chamber walls, dopant
and other deposits were removed by chemical reaction.
[0152] Deposits in and around the ion source give rise to the
so-called "implanter memory effect." When changing from one dopant
source gas to another, ions from elements of the first dopant
continue to be extracted from the ion source plasma long after flow
of the first dopant gas has been terminated. This effect in some
instances causes severe contamination of the desired ion beam and
resulting degradation of the implant process.
[0153] One example of the implanter memory effect is P
contamination in a BF.sub.2 implant. The consequences of this
contamination to yield of the process are so severe that many
semiconductor manufacturing facilities avoid scheduling phosphorus
and boron implants on the same tool. This is a substantial
impediment in scheduling implant operations. P/BF.sub.2
contamination results from phosphorus deposits in the source from
implantation with PH.sub.3. Upon change-over to BF.sub.3 gas for
BF.sub.2.sup.+ implantation, some of the fluorine reacts to form
.sup.31P.sup.19F.sup.+. The mass of .sup.31P.sup.19F.sup.+ is 50.
This is sufficiently close enough to the desired mass for
.sup.11B.sup.19F.sub.2 of 49, so that PF.sup.+ is co-implanted with
the BF.sub.2.sup.+ ions. As a result, BF.sub.2.sup.+ implantation
is restricted on some high current systems with marginal mass
resolution capability at specific mass-energy ranges.
[0154] XeF.sub.2 cleaning was assessed to determine its affect on
the implanter memory effect, using a high current implanter
operated for approximately 200 hours in simulated production with a
P.sup.+ ion beam from PH.sub.3 dopant gas. The system was switched
to BF.sub.3 gas and immediate implantation of a bare silicon
monitor wafer was carried out using a high dose (5.times.10.sup.15
ions/cm.sup.2) of BF2.sup.+. During BF.sub.2.sup.+ implantation,
the resolving aperture of the system's analyzing magnet was opened
more than usual to ensure that the contamination effect would be
sufficiently large for convenient measurement using secondary ion
mass spectrometry (SIMS) analysis.
[0155] Cleaning effects of BF.sub.3, argon and XeF.sub.2 were
compared by running each of the 3 gases and then periodically
monitoring the amount of remaining contamination by implanting
monitor wafers with BF.sub.2.sup.+. The amount of P co-implanted
with the BF.sub.2 was measured by SIMS. A typical SIMS spectrum of
implanted phosphorus is shown in FIG. 4A, in which the peak in the
phosphorus spectrum corresponds to the implanted depth of PF.sup.30
ions extracted from the ion source, and the dose corresponds to a
contamination level of about 3% PF in BF.sub.2.
[0156] FIG. 4B is a plot of the contamination level as a function
of cleaning time with either BF.sub.3 or XeF.sub.2, in which the
plot is normalized to the contamination level immediately after
change-over from PH.sub.3 to BF.sub.3. There was little effect on
the PF contamination even after 2 hours when running BF.sub.3
plasma. Similar results (not shown) obtained when argon plasma was
used. By contrast, PF contamination was reduced by a factor of two
after only 15 minutes of in-situ cleaning with XeF.sub.2, and by a
factor of almost five after 30 minutes of in-situ cleaning with
XeF.sub.2.
[0157] Prior to use of in-situ cleaning, the medium current
implanter unit averaged 3.3 source changes per tool per month, with
average source change-over and subsequent qualification testing
requiring approximately 5 hours, equivalent to nearly 200 hours
annually of lost production time per tool. The source life was
effectively doubled by in-situ cleaning, yielding about 100 hours
of additional production time for each medium current tool. The
resulting savings of test wafers, as well as savings in fabrication
time and metrology tools needed for post processing of
qualification wafers (with up to 40 qualifications annually being
carried out for each medium current implanter), demonstrated the
effectiveness of the in-situ cleaning.
EXAMPLE 2
[0158] This example demonstrates the control of filament growth, in
an ion source of an illustrative ion implanter system.
[0159] FIG. 5A is a graph showing the effects of XeF.sub.2 flow and
arc power variation, with respect to increased filament current and
weight. The graph shows filament weight in grams, as a function of
elapsed time, in hours, of operation of the implanter system. The
upper line in the graph represented operation at an XeF.sub.2 flow
of 2.2 standard cubic centimeters per minute (sccm) and arc power
of 100 volts/0.05 amps, for which a filament weight gain of 319
milligrams/hour was determined after 3 hours of operation. The
lower line in the graph reflected an XeF.sub.2 flow of 0.5 seem and
arc power of 40 volts/0.05 amps, which produced a filament weight
gain of 63 milligrams/hour for the 3 hour duration of
operation.
[0160] FIG. 5B is a graph showing the effects of XeF.sub.2 flow and
arc power variation, with respect to filament current. The graph
shows filament current in amperes, as a function of time of
operation of the implanter system. The upper line in the graph
represented operation at an XeF.sub.2 flow of 2.2 standard cubic
centimeters per minute (seem) and arc power of 100 volts/0.05 amps,
for which a filament current rise of 16 amps/hour was determined.
The lower line in the graph reflected an XeF.sub.2 flow of 0.5 seem
and arc power of 40 volts/0.05 amps, which produced a filament
current rise of 2.3 amps/hour for the 3 hour duration of
operation.
[0161] FIG. 6 is a graph of filament weight change, in milligrams
per hour, as a function of average filament current, in amperes.
The graph shows the effect of hot flow (no plasma) and plasma
conditions for tungsten transport, with data for low flow and high
flow hot filament conditions, and for low flow and high flow plasma
conditions. These data show that the transport of tungsten in the
system can be selectively adjusted by selection of appropriate
process conditions to effect deposition, or alternatively etching,
of material at the filament.
[0162] While the invention has been described herein with reference
to various specific embodiments, it will be appreciated that the
invention is not thus limited, and extends to and encompasses
various other modifications and embodiments, as will be appreciated
by those ordinarily skilled in the art. Accordingly, the invention
is intended to be broadly construed and interpreted, in accordance
with the ensuing claims.
* * * * *
References