U.S. patent application number 11/175750 was filed with the patent office on 2005-11-03 for substrate carrier for processing substrates.
This patent application is currently assigned to Applied Materials, Inc.. Invention is credited to Chinn, Jeffrey D., Guenther, Rolf A., Rattner, Michael B..
Application Number | 20050241771 11/175750 |
Document ID | / |
Family ID | 29552939 |
Filed Date | 2005-11-03 |
United States Patent
Application |
20050241771 |
Kind Code |
A1 |
Rattner, Michael B. ; et
al. |
November 3, 2005 |
Substrate carrier for processing substrates
Abstract
A substrate carrier for carrying one or more substrates
comprises a bottom surface, a top surface opposed to the bottom
surface, one or more recesses formed into the top surface, each of
the one or more recesses having a support surface that defines a
support region for a substrate. The support region is adapted to
contact a bottom of the substrate. The support region may have a
thickness less than a depth of the one or more recesses. The
support region may comprise a porous material to permit thermal
fluid to percolate through the support region.
Inventors: |
Rattner, Michael B.; (Santa
Clara, CA) ; Guenther, Rolf A.; (Monte Sereno,
CA) ; Chinn, Jeffrey D.; (Foster City, CA) |
Correspondence
Address: |
MOSER, PATTERSON & SHERIDAN, LLP
APPLIED MATERIALS INC
595 SHREWSBURY AVE
SUITE 100
SHREWSBURY
NJ
07702
US
|
Assignee: |
Applied Materials, Inc.
|
Family ID: |
29552939 |
Appl. No.: |
11/175750 |
Filed: |
July 6, 2005 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
11175750 |
Jul 6, 2005 |
|
|
|
10267824 |
Oct 8, 2002 |
|
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|
60382557 |
May 22, 2002 |
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Current U.S.
Class: |
156/345.51 |
Current CPC
Class: |
H01L 21/68757 20130101;
H01L 21/67103 20130101; H01L 21/68735 20130101; H01L 21/67109
20130101 |
Class at
Publication: |
156/345.51 |
International
Class: |
C23F 001/00 |
Claims
1. A substrate carrier for carrying one or more substrates
comprising: a bottom surface configured to be separable from a
substrate support of a process chamber via lift pins; a top surface
opposed to the bottom surface; and one or more recesses formed into
the top surface, each of the one or more recesses having a support
surface that defines a support region for a substrate, wherein the
support region comprises is a porous material and is adapted to
contact a bottom of the substrate.
2. The substrate carrier of claim 1, wherein the support region is
between the bottom surface and the support surface, and wherein the
support region has a thickness less than a depth of the one or more
recesses.
3. The substrate carrier of claim 1, wherein the porous material
has an open porosity between about 1 percent and about 20
percent.
4. The substrate carrier of claim 1, wherein the porous material
comprises a material selected from the group consisting of silicon
carbide, silicon nitride, aluminum oxide, a metallic material, and
combinations thereof.
5. The substrate carrier of claim 1 wherein the support region
comprises an indicator for determining when the substrate has been
etched through.
6. The substrate carrier of claim 1 wherein one of the one or more
recesses have a substantially rectangular support surface.
7. The substrate carrier of claim 1, wherein the support region is
more reactive to etchants than the top surface.
8. A substrate carrier for carrying one or more substrates
comprising: a bottom surface configured to sit on an upper surface
of a substrate support of a processing chamber; a top surface
opposed to and substantially parallel to the bottom surface; an
edge surface circumscribing the top surface and the bottom surface;
and one or more recesses formed into the top surface, the one or
more recesses having a porous support surface that defines a
support region for a substrate.
9. The substrate carrier of claim 8 wherein the support region is
between the bottom surface and the support surface, and wherein the
support region has a thickness less than a depth of the one or more
recesses.
10. The substrate carrier of claim 8, wherein the porous material
has an open porosity between about 1 percent and about 20
percent.
11. The substrate carrier of claim 8 wherein the support region has
a thickness between about 0.02 centimeters and about 0.8
centimeters.
12. The substrate carrier of claim 8 wherein the support region
comprises an indicator for determining when the substrate has been
etched through.
13. The substrate carrier of claim 16 further comprising outer
regions bounded by the top surface and the bottom surface and
coupled to the support region, wherein the outer regions comprise a
material having an open porosity less than the open porosity of the
porous material in the support region.
14. The substrate carrier of claim 8 wherein one or more surfaces
selected from the group consisting of the top surface, the edge
surface, the containment surface, and combinations thereof have a
protective coating formed thereon.
15. The substrate carrier of claim 14 wherein the protective
coating comprises a material selected from the list consisting of
alumina, sapphire, a polytetrafluoroethylene material, a
perfluoroalkoxy material, and combinations thereof.
16. The substrate carrier of claim 15, wherein the support region
further comprises: a material disposed on or embedded in the
support region which, when exposed through the substrate during
etching, has a characteristic detectable by an etch endpoint
detection system as indicative of breakthrough of the
substrate.
17. The substrate carrier of claim 8, wherein the support region is
reactive with a fluorinated gas.
18. The substrate carrier of claim 8, wherein the support region is
more reactive to etchants than the top surface.
19. The substrate carrier of claim 18, wherein the support region
further comprises: a material disposed on or embedded in the
support region which, when exposed through the substrate during
etching, has a characteristic detectable by an etch endpoint
detection system as indicative of breakthrough of the
substrate.
20. The substrate carrier of claim 18, wherein the support region
is reactive with a fluorinated gas.
21. A substrate carrier for carrying one or more substrates
comprising: a bottom surface; a top surface opposite the bottom
surface, the top surface comprised of a material substantially
non-reactive to fluorinated etchants; and one or more recesses
formed in the top surface and having a substrate support surface
comprised of a material reactive to fluorinated etchants.
22. The substrate carrier of claim 21, wherein the substrate
support region further comprises: at least one gas passage formed
therethrough.
23. The substrate carrier of claim 21, wherein the top surface is
comprised of a ceramic material.
24. The substrate carrier of claim 21 further comprising: a coating
disposed on the top surface, wherein the coating is at least one of
aluminum oxide, sapphire, a perfluoroalkoxy material or a
polytetrafluoroethylene material.
25. The substrate carrier of claim 21, wherein the top surface is
comprised of an aluminum material.
Description
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application is a continuation of U.S. application Ser.
No. 10/267,824, filed Oct. 8, 2002 which claims benefit of U.S.
Provisional Patent Application Ser. No. 60/382,557, filed May 22,
2002. Each of these applications are herein incorporated by
reference.
BACKGROUND OF THE DISCLOSURE
[0002] 1. Field of the Invention
[0003] The present invention generally relates to chambers for
substrate processing and, more particularly, to a substrate carrier
that facilitates the processing of substrates of various dimensions
in a given chamber.
[0004] 2. Description of the Related Art
[0005] Substrate processing, such as semiconductor wafer
processing, is typically practiced in an industrial setting by
placing a substrate onto a substrate support or chuck, within a
chamber and performing a variety of operations on the substrate.
The substrate and substrate support typically are circular shaped,
and the substrates currently used typically have a diameter of, for
example, about eight inches (200 mm) or about twelve inches (300
mm).
[0006] However, in the past, substrate processing was often
performed on substrates having smaller diameters, and process
equipment of the past included chambers that were designed for
processing these smaller substrates. While these process chambers
of the past are typically no longer used in high production volume,
industrial settings, these older chambers are used, for example, to
produce smaller quantities of certain types of microelectronic
devices. For example, due to budgetary limitations, universities
may purchase older processing equipment that processes, for
example, four inch diameter or six inch diameter substrates.
Furthermore, it may be necessary for the university to sub-divide
the substrate and devices formed thereon into smaller units, for
example, dies, to facilitate various testing and further
experimentation of the devices formed thereon. The types of
material structures and devices that may be formed on these smaller
substrates are diverse and include for example, semiconductor
materials, optoelectronic devices, microelectromechanical systems
and devices (MEMS), among others.
[0007] Once a material structure or device, such as a structure to
be used in a MEMS device, is formed on small substrate or divided
into semiconductor dice, there may be a need for subsequent
processing. In particular, there may be a need to perform this
subsequent processing in a modern, state-of-the-art, semiconductor
processing chamber. Unfortunately, most of such state-of-the-art
chambers are now only designed to process substrates having a
circular cross-section and a diameter of eight inches or twelve
inches.
[0008] The above problems are compounded for cases in which certain
structures, such as MEMS structures, must be formed on the small
substrate. This is because the processing of MEMS devices often
includes using aggressive etchants to etch deeply into a wafer
substrate or in some cases completely through the wafer substrate
(i.e. etch-through processing). Etch-through processing is prone to
damage the underlying substrate support or chuck, which is a
chamber component that is costly to replace.
[0009] Furthermore, aggressive etch processing results in the
formation of very delicate devices that are highly susceptible to
damage during subsequent processing, such as the singulation of the
wafer substrate into dies. As a result, it is often desirable to
singulate the substrate into dies prior to etch processing to
prevent damage to the delicate devices that would otherwise occur
from singulation after aggressive etch processing. Singulating the
substrate prior to processing however, requires a system capable of
etch processing small dies rather than larger wafer substrates.
[0010] Therefore, a need exists for a substrate carrier that can be
used to convert a conventional semiconductor process chamber into
one capable of processing substrates that are smaller than
conventional eight inch diameter (200 mm) or twelve inch diameter
(300 mm) substrates as well as substrates of varying shapes and
dimensions.
SUMMARY OF THE INVENTION
[0011] The invention is a substrate carrier for carrying one or
more substrates comprising a bottom surface, a top surface opposed
to the bottom surface, one or more recesses formed into the top
surface, each of the one or more recesses having a support surface,
and a support region between the bottom surface and the support
surface. In one embodiment of the invention, the support region has
a thickness less than a depth of the one or more recesses. In one
embodiment of the invention, the support region may comprise a
porous material that may permit thermal fluid (such as helium) to
percolate through the support region. In one embodiment of the
invention, the one or more recesses are substantially circular. In
another embodiment of the invention, the one or more recesses are
substantially rectangular.
[0012] A method of processing one or more substrates in a
processing chamber comprises providing a processing chamber having
a substrate support. A substrate carrier having one or more
substrates disposed within one or more recesses formed within the
substrate carrier is moved into the processing chamber carrier and
disposed on a substrate support. A processing operation is then
performed within the processing chamber. The processing operation
may comprise introducing a process gas into the processing chamber
and etching through the substrate to expose the support surface of
the carrier to a plasma. An alternate method of processing one or
more substrates comprises providing a processing chamber having a
substrate carrier disposed on a substrate support. A substrate is
moved into the processing chamber and placed onto the support
surface of the carrier, and a processing operation is performed
within the processing chamber.
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] So that the manner in which the above recited features of
the present invention are attained and can be understood in detail,
a more particular description of the invention, briefly summarized
above, may be had by reference to the embodiments thereof which are
illustrated in the appended drawings.
[0014] It is to be noted, however, that the appended drawings
illustrate only typical embodiments of this invention and are
therefore not to be considered limiting of its scope, for the
invention may admit to other equally effective embodiments.
[0015] FIG. 1 is a schematic cross-sectional view of a process
chamber that can be used for the practice of embodiments of the
invention described herein;
[0016] FIG. 2 is a schematic close-up, cross-sectional view of a
substrate support having a substrate carrier of the present
invention thereon;
[0017] FIG. 3 is a top view of one embodiment of a substrate
carrier that can be used to practice embodiments of the invention
described herein;
[0018] FIG. 4 is a cross-sectional view of the substrate carrier of
FIG. 3;
[0019] FIG. 5 is a cross-sectional view of the substrate carrier of
FIGS. 3-4, showing additional features thereof;
[0020] FIG. 6 is a top view of an alternate embodiment of a
substrate carrier having a plurality of recesses thereon;
[0021] FIG. 7 is a cross-sectional view of the substrate carrier of
FIG. 6;
[0022] FIG. 8 is schematic top view of a processing system that can
be used for the practice of embodiments of the invention described
herein;
[0023] FIG. 9 depicts cross-sectional views of a substrate during
different stages of an etch-through process sequence;
[0024] FIG. 10A depicts a top plan view of an alternate embodiment
of a substrate carrier of the present invention; and
[0025] FIG. 10B depicts a cross sectional view of the substrate
carrier of FIG. 10A.
DETAILED DESCRIPTION
[0026] FIG. 1 depicts a schematic, cross-sectional view of an etch
processing chamber 100 that can be used for the practice of
embodiments of the invention described herein. The etch processing
chamber 100 includes a vacuum chamber 112 and a vacuum pump 114
coupled to the vacuum chamber 112. The vacuum chamber 112 is
defined by a dome 116 or other form of chamber top, a side wall
118, and a bottom 120. The chamber 112 generally includes a
pedestal assembly 123. The pedestal assembly includes a pedestal
122 and a chuck 124, such as an electrostatic chuck, atop the
pedestal 122. The chuck 124 is a conventional chuck typically
formed to accommodate substrates having a circular cross section
that may be about eight inches (200 mm) or about twelve inches (300
mm) in diameter. A high frequency power source 116 such as a radio
frequency (RF) power source may be coupled to the pedestal 122 in
order to capacitively couple RF power to a substrate (not shown) to
form a negative bias on the substrate that facilitates etching. A
second RF power source 117 may be coupled to at least one antenna
115, to control the plasma density within the chamber 112. An
example of such an etch processing chamber 100 is the Decoupled
Plasma System (DPS I and DPS II) chamber, commercially available
from Applied Materials, Inc., Santa Clara, Calif.
[0027] A substrate carrier 132 useful for adapting the etch
processing chamber 100 for processing substrates of various shapes
and sizes is positioned atop the chuck 124. One or more substrates
(not shown) are placed into one or more recesses 154 formed in the
substrate carrier 132.
[0028] A port 136 may be formed through the pedestal 122 to a top
surface 138 of the chuck 124. A thermal fluid, such as an inert
gas, flows from a backside gas source 140 to the top surface 138 of
the chuck 124. The thermal fluid may be, for example, helium.
[0029] The vacuum pump 114 draws a vacuum inside the chamber 112
and process gases are pumped from one or more gas sources 130 into
the chamber 112. In FIG. 1, three gas sources 126, 127, 128 are
shown by way of example. The process gases may comprise, for
example, a fluorinated gas, such as silicon tetrafluoride
(SiF.sub.6), hydrogen fluoride (HF), nitrogen trifluoride
(NF.sub.3), xenon difluoride (XeF.sub.2), among other fluorinated
gases. The process gases may also comprise non-fluorinated gases,
for example, methanol (CH.sub.3OH), water vapor (H.sub.2O), among
other non-fluorinated gases. The applied RF power ignites one or
more of the process gases into a plasma within the chamber 112 in
order to enhance etching of the one or more substrates and/or
material layers thereon. Process gases introduced into the chamber
112 from the gas sources 130 are directed to one or more substrates
on the substrate carrier 132 where they may etch various materials
on the one or more substrates. In one embodiment of the invention,
at least one of the process gases, such as, for example, one of the
fluorinated gases, is excited into a plasma state in a remote
plasma chamber (not shown) prior to entering the chamber 112 and
thereafter directed towards the one or more substrates.
[0030] Substrate Carrier
[0031] FIG. 2 illustrates a close-up cross-sectional view of a
substrate carrier 132 that may be used to practice embodiments of
the invention described herein. The substrate carrier 132 is
supported by a pedestal assembly 123 that generally comprises the
pedestal 122 and the chuck 124. The chuck 124 sits atop the
pedestal 122, and the pedestal 122 and the chuck 124 may have a
port 136 therethrough for transporting a thermal fluid to the top
surface 138 of the chuck 124. While FIG. 2 depicts one central
port, there may be a plurality of ports 136 configured in various
arrangements so as to transport the thermal fluid to the top
surface 138 of the chuck 124. The pedestal 122 and the chuck 124
may include one or more channels 160 through which lift pins (not
shown) may be elevated in order to facilitate raising and lowering
a substrate within the chamber 112. The channels 160 may optionally
extend through the substrate carrier 132. In one embodiment of the
invention the substrate carrier 132 is secured to the chuck 124 by
electrostatic force as described below. In another embodiment of
the invention, the substrate carrier 132 is secured to the chuck
124 by various means, such as, for example, bolts or other
mechanical fasteners.
[0032] The substrate carrier 132 has a bottom surface 150 that
generally contacts the top surface 138 of the chuck 124. A
plurality of channels or interstitial spaces 152 (exaggerated in
size for clarity) located between the top surface 138 of the chuck
124 and the bottom surface 150 of the substrate carrier 132
transport thermal fluid such that thermal fluid contacts at least a
portion of the bottom surface 150 of the substrate carrier 132. The
substrate carrier 132 has one or more recesses 154 to facilitate
the carrying of one or more substrates (not shown).
[0033] FIG. 3 depicts a top view of one embodiment of the substrate
carrier 132, and FIG. 4 depicts a cross-sectional view of the
substrate carrier 132 of FIG. 3 with the cross-section taken along
line 4-4 of FIG. 3. In general, the substrate carrier 132 has a
size and shape that enables a conventional substrate handling robot
to carry the substrate carrier 132 and substrate(s) disposed
therein, in and out of the chamber 112. The substrate carrier 132
includes a bottom surface 350 that is generally formed to fit on a
conventional substrate support such as the substrate support 123 of
FIG. 2. The bottom surface 350 may be substantially circular with a
diameter 352. The substrate carrier 132 includes a recess 354 that
is defined by a support surface 356 and a containment surface 360.
Referring to FIG. 3, the support surface 356 is substantially
circular. The support surface 356 may have a diameter 358 of about,
for example, 4 inches or about 6 inches and may thereby accommodate
substrates having a similar diameter. Rays parallel to the
containment surface 360 and the support surface 356 generally
define an angle 370 that may be about 90 degrees or greater. i.e.,
the containment surface 360 is sloped. In one embodiment of the
invention, the angle 370 is about 135 degrees to facilitate
placement of a substrate 380 (shown in phantom) having a thickness
330 within the recess 354 of the substrate carrier 132.
[0034] The substrate carrier 132 includes a support region 382 that
has a cross-section bounded by the support surface 356, a portion
384 of the bottom surface 350, and boundary surfaces 306 (shown in
phantom). The support region 382 has a thickness 386 that is
generally small enough to promote rapid heat transfer from the
pedestal 122 and the chuck 124 to the substrate 380. The thickness
386 of support region 382 may be less than a depth 390 of the
recess 354. The thickness 386 of the support region 382 may be less
than the thickness 330 of the substrate 380 placed within the
recess 354. The thickness 386 of the support region 382 is
generally small enough to promote rapid thermal transfer across the
thickness 386. Similarly, the thickness 386 of the support region
382 is generally large enough to provide mechanical support for the
substrate 380 and to allow the substrate carrier 132 to withstand
the stresses of both processing and handling of the substrate
carrier 132 without cracking or otherwise being damaged. In one
embodiment of the invention, the thickness 386 of the support
region 382 is in the range of about 0.025 centimeters to about 0.13
centimeters.
[0035] The substrate carrier 132 also includes outer regions 388
adjacent to the support region 382. The outer regions 388 are
generally bounded by a top surface 392 that may be substantially
parallel to the bottom surface 350, an edge surface 320, the
containment surface 360, a portion 322 of the bottom surface 350,
and the boundary surfaces 306. The top surface 392 may have a flat
portion 362, as shown in FIG. 3 such that the substrate carrier 132
has a periphery that matches a flatted wafer substrate.
Alternatively, the periphery may have a notch to match the
periphery of a notched wafer substrate. The outer regions 388
typically have a thickness 394 that is sufficiently large such that
the substrate 380 does not extend above the top surface 392. The
outer regions 388 typically have a thickness 394 that is
sufficiently small such that the substrate carrier 132 does not
interfere with the function of other components within the chamber
112, e.g. slit valve, robot arm, lift mechanism and the like. The
thickness 394 of the outer regions 388 may be, for example, in the
range of about 0.25 centimeters to about 0.65 centimeters.
[0036] The support region 382 generally comprises a material that
is resistant to degradation when exposed to various environmental
conditions within the chamber 112. These environmental conditions
may be, for example, temperatures in excess of about 200 degrees
Celsius, exposure to high frequency power of up to about 7 watts
per square centimeters, and damage from contact with corrosive
gases such as fluorinated gases, including hydrogen fluoride (HF).
The support region 382 generally comprises a dielectric material
that is capable of maintaining an electrostatic charge on the
support surface 356. In this manner, the substrate carrier 132 and
the substrate 380 may be held in place on the underlying
electrostatic chuck 124. The support region 382 may comprise a
material with high thermal conductivity.
[0037] In one embodiment of the invention, the support region 382
comprises a ceramic material, such as, for example, silicon
carbide, aluminum oxide, silicon nitride, or combinations thereof.
The ceramic material may be formed by various methods, such as, for
example, hot isostatic pressing, dry-pressing, among other methods
known to the art of ceramics processing. In one embodiment of the
invention, the ceramic material is formed by fabricating a porous,
graphite-based material and partially or completely reacting the
graphite-based material to form a silicon carbide material.
Products made by this process are available from Poco Graphite
Inc., of Decatur, Tex.
[0038] In another embodiment of the invention, the support region
382 comprises a metallic material having a dielectric coating 387
formed on the support surface 356. The dielectric coating 387 may
comprise, for example, an oxide, a nitride, or other dielectric
material. The support region 382 and the outer regions 388 may be
formed by pressing a single piece of ceramic material into a
desired shape. Alternatively, the support region 382 and the outer
regions 388 may be formed as separate units and later joined
together by sintering the separate units together or other joining
methods known to the art of ceramics or metals processing, such as
welding, diffusion bonding, among other joining methods.
[0039] FIG. 5 depicts the cross-sectional view of the substrate
carrier 132 of FIG. 4, showing additional features thereof. The
support region 382 may comprise a porous material having pores 302
(exaggerated in size for clarity). The porous material may have
open porosity, i.e. porosity that is open to an outer surface such
as the support surface 356 or the bottom surface 350. In one
embodiment of the invention, the support region 382 comprises a
material with an open porosity in the range of about 1% to about
20% by volume. The porosity of the support region 382 may be such
that a thermal fluid or gas may percolate from the bottom surface
350, through the pores 302 in the support region 382, to the
support surface 356. The thermal fluid is retained beneath the
substrate 380 and in the pores 302 to enhance thermal conductivity
to and from the substrate 380.
[0040] Typically the porosity within the support region 382 is such
that no direct line-of-sight path exists between the support
surface 356 and the bottom surface 384. In other words, the pores
302 are sufficiently tortuous and windy such that the length of the
pores 302 are considerably greater than the thickness 386 of the
support region 382. This property of the pores 302 is particularly
beneficial for the case in which a plurality of holes must be
etched through the substrate 380. Because some holes may be etched
through areas of the substrate 380 prior to other holes, an etch
process may be intentionally designed to "over-etch" the substrate
380. Once the substrate 380 is etched through, aggressive etchant
gas that may be traveling, for example, perpendicular to the
substrate 380 would be available to travel through the pores 302 to
react with, and perhaps damage, the underlying chuck 124. By having
tortuous and windy pores 302 with no line-of-sight distance between
the bottom surface 350 and the support surface 356, the likelihood
of the etchant gas reaching the chuck 124 is reduced or
eliminated.
[0041] In another embodiment of the invention shown in a top plan
view in FIG. 10A and a cross-section view in FIG. 10B, the entire
carrier 1000 or only the support region 382 may be fabricated of
aluminum. The aluminum is generally anodized. The support region
382 comprises a plurality of channels 1002 drilled through the
support region 382 on an angle. The angle 1004 is defined by the
thickness of the support region 382 and the need to ensure that the
channels do not provide a line of site path through the support
region. As such, the top of the angled channel is offset from the
bottom of the angled channel such that a vertical path
(perpendicular to the surface of the support region) is not
possible. Such an angle prevents etchant gases, that generally
travel in a path that is perpendicular to the wafer surface, from
impacting the surface of the underlying chuck. The channels are
sized to enable backside cooling gas (typically helium) to flow
from the chuck surface to the backside surface of the substrate.
The channel diameter is exaggerated in FIGS. 10A and 10B for
clarity.
[0042] The support region 382 of any of the forgoing embodiments of
the carrier may comprise an indicator 393 for determining when the
substrate 380 within the recess 354 has been etched through. The
indicator 393 may be a chemical or material that is embedded within
the support region 382 or deposited on the support surface 356. For
those embodiments of the invention in which the dielectric coating
387 is formed on the support surface 356, the indicator 393 may be
deposited on the dielectric coating 387. The indicator 393 reacts
with, for example, an etchant gas to form a product such as a
gaseous product. The product may be detected by an endpoint
detection system (not shown) that may include, for example, optical
or chemical sensors for detecting the presence of the product
generated by the indicator 393 and the etchant gas, thereby
determining the point of completion of the etch-through
process.
[0043] The outer regions 388 may comprise a ceramic material. In
one embodiment of the invention, the outer regions 388 comprise a
porous material as described above with reference to support region
382. In this embodiment of the invention, the outer regions 388 may
have a coating 395 formed on the top surface 392 as well as on the
containment surface 360. The composition of the coating 395 may
comprise a material that is chemically resistant to process gases
that are introduced into the chamber 112. For example, for
embodiments of the invention in which a fluorinated gas, such as
hydrogen fluoride (HF), is introduced into the chamber 112, the
coating 395 may comprise, for example, aluminum oxide
(Al.sub.2O.sub.3), sapphire, a perfluoroalkoxy material, a
polytetrafluoroethylene material (e.g. Teflon.RTM. available from
E.I. du Pont de Nemours and Company of Wilmington, Del.), among
other materials. The coating 395 generally improves the durability
of the outer regions 388 by, for example, protecting the outer
regions 388 from degradation from process gases. In an alternate
embodiment of the invention, the outer regions 388 may comprise a
densified material with less open porosity than the support region
382.
[0044] In one embodiment of the invention, the substrate carrier
132 includes optional channels 398 formed through the support
region 382. The optional channels 398 allow lift pins (not shown)
to move through the substrate carrier 132 to facilitate the raising
and lowering of the substrate 380 within the chamber 112.
[0045] FIGS. 3-5 depict a substrate carrier 132 having the recess
354 that is designed to accommodate a single,
substantially-circularly shaped substrate. Alternatively, a
substrate carrier may have multiple recesses or non-circular
recesses (e.g. rectangular or square recesses). FIG. 6 depicts a
top view of one embodiment of the substrate carrier 532, and FIG. 7
depicts a cross-sectional view of the substrate carrier 532 of FIG.
6 with the cross-section taken along line 7-7 of FIG. 6. The
substrate carrier 532 has a plurality of square recesses 554 (a
specific type of rectangular recess). The square recesses 554 are
generally defined by a bottom surface 556 and containment surfaces
560.
[0046] Each of the square recesses 554 has a length 558. The length
558 may be the same for all of the square recesses 554, or the
length 558 may vary amongst the various square recesses 554 on the
substrate carrier 532. The length 558 may be in the range of, for
example, about 10 millimeters to about 20 millimeters. The square
recesses 554 generally have a depth 562 that is greater than a
thickness 586 of a support region 586. The depth 562 may be, for
example, about 0.025 centimeters to about 0.13 centimeters. Rays
parallel to the containment surface 560 and the bottom surface 556
generally define an angle 570 that may be, for example, at least
about 100 degrees. The square recesses 554 each accommodate a
substrate (such as substrate 580 shown in phantom in FIG. 7) that
are generally square when viewed from the top. The substrate 580
may be, for example, a semiconductor die.
[0047] The substrate carrier 532 generally includes support regions
582 and the outer regions 588. The composition, porosity, and other
properties of the support regions 582 and the outer regions 588 may
be similar to those of the corresponding support regions 382 and
the outer regions 388 of the substrate carrier 132 detailed in FIG.
5. One or more surfaces, such as a top surface 592, an edge surface
520, and containment surfaces 560 may have a protective coating
(such as the coating 395 shown in FIG. 5) formed thereon to protect
the surfaces from, for example, process gases that may otherwise
come into contact with said surfaces.
[0048] Method of Using the Substrate Carrier
[0049] The substrate carrier of the present invention may be used
to facilitate the processing of one or more substrates of varying
dimensions and shapes in a processing chamber that is designed to
process conventional larger wafer substrates. The conventional
wafer substrates may be semiconductor wafers, having a
substantially circular shape and a diameter that may be about eight
inches (200 millimeters) or about twelve inches (300
millimeters).
[0050] FIG. 8 depicts a processing system 20 in which substrates
are processed. Processing system 20 includes a plurality of process
chambers 38 and a central transfer chamber 36. Inside each of the
process chambers 38, substrates may be subjected to a variety of
processing operations such as, for example, thin film deposition
processing, etching and etch-through processing, oxidation, thermal
processing, lithographic processing, among other processing
operations.
[0051] In general one or more substrates are provided to a transfer
chamber 36 from a load lock chamber 34. In one embodiment, a
substrate carrier, such as the substrate carrier 132 or the
substrate carrier 532, having one or more substrates placed within
recesses therein, is provided to a substrate handling robot 39. The
substrate handling robot 39 moves the substrate carrier between the
load lock chamber 34 and the processing chamber 38. Referring to
FIGS. 1 and 8, within the processing chamber, lift pins may be
raised through the channels 160 within the pedestal 122 and the
chuck 124. The substrate carrier is transferred onto the lift pins
from the substrate handling robot, and the pedestal assembly 123 is
raised such that the substrate carrier is directed onto the chuck
124. The substrate carrier may thereafter be secured onto the chuck
by an electrostatic chucking force. The backside gas (thermal
fluid) is then applied to the bottom surface 350 of the substrate
carrier 132. The thermal fluid percolates to the support surface
356 of the recess 354 to insure thermal conductivity between the
substrate 380 and the chuck 124. One or more processing operations,
such as, for example, etch-through operations, may be performed on
the substrate or material layers thereon. In this embodiment of the
invention, a substrate carrier without channels such as the
optional channels 398 formed through the support region 382 may be
used. After performing the one or more processing operations within
the processing chamber 38, the substrate carrier and one or more
substrates thereon are removed from the processing chamber 38 by
the substrate handling robot 39.
[0052] In an alternate embodiment of the invention, a substrate is
provided to the substrate handling robot 39. The substrate handling
robot 39 moves the substrate between the load lock chamber 34 and
the processing chamber 38. The processing chamber 38 may be, for
example, an etch processing chamber, such as the chamber 112 of
FIG. 1. Within the processing chamber 38, lift pins (not shown) may
be raised through the channels 160 within the pedestal 122, the
chuck 124, and the substrate carrier 132. The substrate is
transferred onto the lift pins from the substrate handling robot
39, and the substrate is directed into one or more recesses such as
the recess 354 shown in FIG. 4 or the recesses 554 shown in FIG. 6
in the substrate carrier. The substrate may be held in position by
providing, for example, an electrostatic chucking force. One or
more processing operations, such as, for example, etch-through
operations, may be performed on the substrate or material layers
thereon. After performing the one or more processing operations,
the substrate is removed from the processing chamber 39 by the
substrate handling robot 39.
[0053] In one embodiment of the invention, as depicted in FIG. 9, a
process gas such as, for example, silicon hexafluoride (SiF.sub.6),
hydrogen fluoride (HF), nitrogen trifluoride (NF.sub.3), xenon
difluoride (XeF.sub.2), is provided to a processing chamber such as
chamber 112 of FIG. 1. The process chamber includes a substrate
support 924. The substrate support 924 may comprise, for example a
pedestal, such as the pedestal 122 and a chuck such as the chuck
124. A substrate carrier 932 and a substrate 900 rests on a support
surface 956 of substrate carrier 932, as shown in FIG. 9a. The
substrate 900 may be, for example, a silicon die or a silicon
wafer. A material layer 902, such as an oxide may be provided atop
the substrate 900. An etch resist 906 is formed and patterned on
the material layer 902 using conventional photoresist processing
methods. The process gas etches portions of the material layer 902
and portions of the substrate 900 that are not protected by the
etch resist 906. The etching continues until an endpoint, as
indicated in FIG. 9b, a time at which the process gas etches
through the material layer 902 and the substrate 900 creating two
substrate regions 900a and 900b as well as two material layer
regions 902a and 902b. An opening 904 thus formed uncovers a
portion 956b of the support surface 956. The substrate carrier 932
protects the substrate support 924 from being etched by the process
gas.
[0054] The endpoint may be determined by using, for example, an
endpoint detection system that includes, for example, optical
and/or chemical sensors to determine whether the portion 956b of
the support surface 956 has been uncovered and no further etching
is desired. In one embodiment of the invention, an indicator 993
(shown in phantom) located within or deposited on a support region
956 reacts with the process gas and produces a product that may be
detected by the endpoint detection system.
[0055] While the foregoing is directed to the preferred embodiment
of the present invention, other and further embodiments of the
invention may be devised without departing from the basic scope
thereof, and the scope thereof is determined by the claims that
follow.
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