name:-0.0013179779052734
name:-0.1753249168396
name:-0.00059819221496582
Nihon Denshi Kabushiki Kaisha Patent Filings

Nihon Denshi Kabushiki Kaisha

Patent Applications and Registrations

Patent applications and USPTO patent grants for Nihon Denshi Kabushiki Kaisha.The latest application filed is for "specimen observation apparatus including an optical microscope and a scanning electron microscope".

Company Profile
0.42.0
  • Nihon Denshi Kabushiki Kaisha - Tokyo JP
  • Nihon Denshi Kabushiki Kaisha - BOTH OF JA
  • Nihon Denshi Kabushiki Kaisha - Akishima JA
  • Nihon Denshi Kabushiki Kaisha - Akishima-shi Tokyo JA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Specimen observation apparatus including an optical microscope and a scanning electron microscope
Grant 4,349,242 - Ogura September 14, 1
1982-09-14
Method and apparatus for automatically focusing an electron beam in a scanning beam device
Grant 4,199,681 - Namae April 22, 1
1980-04-22
Cold trap for electron microscope
Grant 4,179,605 - Watanabe , et al. December 18, 1
1979-12-18
Automatic chemical analyzer
Grant 4,155,978 - Naono , et al. May 22, 1
1979-05-22
Electron beam exposure method
Grant 4,151,422 - Goto , et al. April 24, 1
1979-04-24
Apparatus for obtaining an X-ray image
Grant 4,135,095 - Watanabe January 16, 1
1979-01-16
Electron beam exposure system
Grant 4,119,854 - Tanaka , et al. October 10, 1
1978-10-10
Electron beam exposure system
Grant 4,117,340 - Goto , et al. September 26, 1
1978-09-26
Automatic analyzing apparatus
Grant 4,090,848 - Naono May 23, 1
1978-05-23
Scanning electron device
Grant 4,071,759 - Namae January 31, 1
1978-01-31
Insulated elastic support and clamping means for resistance heaters and emitter tip of electron gun
Grant 4,068,145 - Nakagawa , et al. January 10, 1
1978-01-10
Scanning electron microscope
Grant 4,068,123 - Kokubo January 10, 1
1978-01-10
Mass spectrometer with superimposed electric and magnetic fields
Grant 4,054,796 - Naito October 18, 1
1977-10-18
Nuclear magnetic resonance apparatus
Grant 4,051,429 - Imanari , et al. September 27, 1
1977-09-27
Apparatus for tomography comprising a pin hole for forming a microbeam of X-rays
Grant 4,045,672 - Watanabe August 30, 1
1977-08-30
Method and apparatus for analyzing fine grained substances
Grant 4,037,101 - Okumura , et al. July 19, 1
1977-07-19
Single lens, multi-beam system and method for high resolution recording of information on a moving recording medium and article
Grant 4,001,493 - Cone January 4, 1
1977-01-04
Mass spectrometer with superimposed electric and magnetic fields
Grant 3,984,682 - Matsuda October 5, 1
1976-10-05
Contacting pickup optical reproduction system
Grant 3,980,811 - Schaefer , et al. September 14, 1
1976-09-14
Electron lens
Grant 3,952,198 - Harada , et al. April 20, 1
1976-04-20
Breakdown protection for field emission electron gun
Grant 3,921,078 - Aihara , et al. * November 18, 1
1975-11-18
Electron detector
Grant 3,914,606 - Hashimoto , et al. October 21, 1
1975-10-21
Apparatus for displaying the energy distribution of a charged particle beam
Grant 3,909,610 - Kokubo September 30, 1
1975-09-30
Method and apparatus for the sterilization of ampoules with pharmaceutical liquid therein
Grant 3,885,915 - Utsumi , et al. May 27, 1
1975-05-27
Multiple ion beam type double focusing mass spectrometer
Grant 3,886,357 - Naito May 27, 1
1975-05-27
Method and apparatus for detecting dangerous articles and/or precious metals
Grant 3,884,816 - Takahashi May 20, 1
1975-05-20
Automatic analyzing device
Grant 3,881,872 - Naono May 6, 1
1975-05-06
Apparatus for sterilizing ampoules and reject control system therefor
Grant 3,880,586 - Murayama , et al. April 29, 1
1975-04-29
Control Circuitry For Preventing Damage To The Target Of A Scanning X-ray Generator
Grant 3,852,605 - Watanabe , et al. December 3, 1
1974-12-03
Scanning Electron Microscope With Improved Means For Focusing
Grant 3,833,811 - Koike , et al. September 3, 1
1974-09-03
Constant Current Field Emission Electron Gun
Grant 3,825,839 - Someya , et al. July 23, 1
1974-07-23
Apparatus For Analyzing Electron Energy
Grant 3,822,382 - Koike July 2, 1
1974-07-02
Field Emission Type Electron Gun
Grant 3,810,025 - Aihara , et al. May 7, 1
1974-05-07
Scanning Electron Microscope With Means To Remove Low Energy Electrons From The Primary Electron Beam
Grant 3,792,263 - Hashimoto , et al. February 12, 1
1974-02-12
Specimen Tilting Device For An Electron Optical Device
Grant 3,778,621 - Mikajiri December 11, 1
1973-12-11
Method And Apparatus For Observing Biological Specimens Using A Scanning Electron Microscope
Grant 3,761,709 - Hasegawa , et al. September 25, 1
1973-09-25
Electron Beam Device
Grant 3,749,964 - Hirata July 31, 1
1973-07-31
Recording Device With Automatic Gain Range Changer And D.c. Correction Means
Grant 3,699,948 - Ota , et al. October 24, 1
1972-10-24
Apparatus For Automatically Recording The Hedepolarization Ratios Of Raman Bands
Grant 3,697,180 - Mori , et al. October 10, 1
1972-10-10
Liquid Chromatograph For Identifying Chemical Components By Means Of Spectrometer
Grant 3,637,310 - Naono January 25, 1
1972-01-25
Ion Beam Intensity Control With Pulsed Beam Deflection And Synchronized Ion Source Blanking
Grant 3,600,573 - Watanabe August 17, 1
1971-08-17
Stereo-scanning Electron Microscope
Grant 3,585,382 - Suganuma June 15, 1
1971-06-15

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed