Nihon Denshi Kabushiki Kaisha
USPTO Trademark & Patent Filings
Trademark applications and grants for Nihon Denshi Kabushiki Kaisha. Nihon Denshi Kabushiki Kaisha has 1 trademark applications. The latest application filed is for "JEOL"
- Company Aliases
- Nihon Denshi Kabushiki Kaisha
- kaisha kabushiki denshi nihon
- Nihon Denshi Kabushiki Kaisha - Tokyo JP
Trademarks Patents
| Patent Application | Date |
|---|---|
| Specimen observation apparatus including an optical microscope and a scanning electron microscope 4,349,242 - 06/234,175 Ogura September 14, 1 | 1982-09-14 |
| Method and apparatus for automatically focusing an electron beam in a scanning beam device 4,199,681 - 05/949,430 Namae April 22, 1 | 1980-04-22 |
| Cold trap for electron microscope 4,179,605 - 05/917,288 Watanabe , et al. December 18, 1 | 1979-12-18 |
| Automatic chemical analyzer 4,155,978 - 05/898,858 Naono , et al. May 22, 1 | 1979-05-22 |
| Electron beam exposure method 4,151,422 - 05/913,397 Goto , et al. April 24, 1 | 1979-04-24 |
Mark Image Registration | Serial | Trademark Application Date |
|---|---|
"JEOL" 1148218 73194929 |
JEOL 1978-11-29 |
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