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Patent applications and USPTO patent grants for Basker; Veeraraghavan S..The latest application filed is for "gate-all-around devices with isolated and non-isolated epitaxy regions for strain engineering".
Patent | Date |
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Gate-all-around Devices With Isolated And Non-isolated Epitaxy Regions For Strain Engineering App 20220310602 - Greene; Andrew M. ;   et al. | 2022-09-29 |
Co-integration Of Gate-all-around Fet, Finfet And Passive Devices On Bulk Substrate App 20220310590 - Frougier; Julien ;   et al. | 2022-09-29 |
Formation of trench silicide source or drain contacts without gate damage Grant 11,443,982 - Greene , et al. September 13, 2 | 2022-09-13 |
Replacement Gate Cross-couple For Static Random-access Memory Scaling App 20220246739 - Xie; Ruilong ;   et al. | 2022-08-04 |
Punch through stopper in bulk finFET device Grant 11,404,560 - Basker , et al. August 2, 2 | 2022-08-02 |
Wraparound Contact To A Buried Power Rail App 20220223698 - Xie; Ruilong ;   et al. | 2022-07-14 |
Nanosheet transistor device with bottom isolation Grant 11,387,319 - Xie , et al. July 12, 2 | 2022-07-12 |
Selective removal of semiconductor fins Grant 11,380,589 - Basker , et al. July 5, 2 | 2022-07-05 |
Field effect transistor Grant 11,355,401 - Leobandung , et al. June 7, 2 | 2022-06-07 |
Nanosheet semiconductor devices with sigma shaped inner spacer Grant 11,348,999 - Reznicek , et al. May 31, 2 | 2022-05-31 |
Structure to enable titanium contact liner on pFET source/drain regions Grant 11,349,029 - Basker , et al. May 31, 2 | 2022-05-31 |
Wrap Around Contact Process Margin Improvement With Early Contact Cut App 20220123116 - Xie; Ruilong ;   et al. | 2022-04-21 |
Wrap around contact process margin improvement with early contact cut Grant 11,227,923 - Xie , et al. January 18, 2 | 2022-01-18 |
Structure to enable titanium contact liner on pFET source/drain regions Grant 11,201,242 - Basker , et al. December 14, 2 | 2021-12-14 |
Dual Step Etch-back Inner Spacer Formation App 20210384296 - Greene; Andrew M. ;   et al. | 2021-12-09 |
Transistor having reduced contact resistance Grant 11,189,693 - Basker , et al. November 30, 2 | 2021-11-30 |
Self-aligned isolation for nanosheet transistor Grant 11,152,464 - Pranatharthi Haran , et al. October 19, 2 | 2021-10-19 |
FinFET devices Grant 11,145,551 - Basker , et al. October 12, 2 | 2021-10-12 |
Dual step etch-back inner spacer formation Grant 11,139,372 - Greene , et al. October 5, 2 | 2021-10-05 |
Interface-less contacts to source/drain regions and gate electrode over active portion of device Grant 11,139,385 - Wang , et al. October 5, 2 | 2021-10-05 |
Self-aligned Isolation For Nanosheet Transistor App 20210305361 - Pranatharthi Haran; Balasubramanian S. ;   et al. | 2021-09-30 |
Protective Bilayer Inner Spacer For Nanosheet Devices App 20210305410 - Yao; Yao ;   et al. | 2021-09-30 |
Nanosheet Semiconductor Devices With Sigma Shaped Inner Spacer App 20210288141 - Reznicek; Alexander ;   et al. | 2021-09-16 |
Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Grant 11,121,032 - Basker , et al. September 14, 2 | 2021-09-14 |
Wrap Around Contact Process Margin Improvement With Early Contact Cut App 20210265470 - Xie; Ruilong ;   et al. | 2021-08-26 |
Nanosheet device with tall suspension and tight contacted gate poly-pitch Grant 11,094,803 - Xie , et al. August 17, 2 | 2021-08-17 |
Transistor and method of forming same Grant 11,088,280 - Basker , et al. August 10, 2 | 2021-08-10 |
Protective bilayer inner spacer for nanosheet devices Grant 11,081,568 - Yao , et al. August 3, 2 | 2021-08-03 |
Nanosheet Device With Tall Suspension And Tight Contacted Gate Poly-pitch App 20210234018 - Xie; Ruilong ;   et al. | 2021-07-29 |
Soi FinFET fins with recessed fins and epitaxy in source drain region Grant 11,069,809 - Reznicek , et al. July 20, 2 | 2021-07-20 |
Two-dimensional (2D) self-aligned contact (or via) to enable further device scaling Grant 11,056,386 - Wang , et al. July 6, 2 | 2021-07-06 |
Source and drain EPI protective spacer during single diffusion break formation Grant 11,056,399 - Yao , et al. July 6, 2 | 2021-07-06 |
Electrical fuse and/or resistor structures Grant 11,043,451 - Basker , et al. June 22, 2 | 2021-06-22 |
Composite spacer enabling uniform doping in recessed fin devices Grant 11,038,041 - Basker , et al. June 15, 2 | 2021-06-15 |
Self-aligned wrap-around trench contacts Grant 11,011,422 - Basker May 18, 2 | 2021-05-18 |
Method and structure of metal cut Grant 11,011,417 - Fan , et al. May 18, 2 | 2021-05-18 |
Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Grant 10,998,230 - Basker , et al. May 4, 2 | 2021-05-04 |
Semiconductor device including dual trench epitaxial dual-liner contacts Grant 10,998,242 - Basker , et al. May 4, 2 | 2021-05-04 |
Source/drain contact depth control Grant 10,991,796 - Hu , et al. April 27, 2 | 2021-04-27 |
Replacement metal gate structures Grant 10,971,601 - Basker , et al. April 6, 2 | 2021-04-06 |
Electrical isolation for nanosheet transistor devices Grant 10,957,761 - Yeh , et al. March 23, 2 | 2021-03-23 |
Nanosheet Transistor Device With Bottom Isolation App 20210074809 - Xie; Ruilong ;   et al. | 2021-03-11 |
Replacement metal gate structures Grant 10,930,754 - Basker , et al. February 23, 2 | 2021-02-23 |
Dual Step Etch-back Inner Spacer Formation App 20210043728 - Greene; Andrew M. ;   et al. | 2021-02-11 |
Dual silicide liner flow for enabling low contact resistance Grant 10,916,471 - Adusumilli , et al. February 9, 2 | 2021-02-09 |
Vertical transistor with a body contact for back-biasing Grant 10,916,660 - Basker , et al. February 9, 2 | 2021-02-09 |
Protective Bilayer Inner Spacer For Nanosheet Devices App 20210028297 - Yao; Yao ;   et al. | 2021-01-28 |
Vertical FET with shaped spacer to reduce parasitic capacitance Grant 10,903,338 - Wang , et al. January 26, 2 | 2021-01-26 |
Embedded source/drain structure for tall FinFet and method of formation Grant 10,896,976 - Basker , et al. January 19, 2 | 2021-01-19 |
Semiconductor device with mitigated local layout effects Grant 10,892,181 - Zhou , et al. January 12, 2 | 2021-01-12 |
Metal-insulator-metal capacitor structure Grant 10,886,363 - Basker , et al. January 5, 2 | 2021-01-05 |
Two-dimensional (2d) Self-aligned Contact (or Via) To Enable Further Device Scaling App 20200411376 - Wang; Junli ;   et al. | 2020-12-31 |
Method And Structure Of Metal Cut App 20200381296 - Fan; Su Chen ;   et al. | 2020-12-03 |
Composite spacer enabling uniform doping in recessed fin devices Grant 10,854,733 - Basker , et al. December 1, 2 | 2020-12-01 |
Source and drain contact cut last process to enable wrap-around-contact Grant 10,840,345 - Greene , et al. November 17, 2 | 2020-11-17 |
Nanosheet device with close source drain proximity Grant 10,840,360 - Basker , et al. November 17, 2 | 2020-11-17 |
Capacitors Grant 10,833,149 - Basker , et al. November 10, 2 | 2020-11-10 |
Self-aligned gate isolation with asymmetric cut placement Grant 10,832,916 - Xie , et al. November 10, 2 | 2020-11-10 |
Substantially defect free relaxed heterogeneous semiconductor fins on bulk substrates Grant 10,833,192 - Basker , et al. November 10, 2 | 2020-11-10 |
Vertical field effect transistor with top and bottom airgap spacers Grant 10,833,155 - Yeh , et al. November 10, 2 | 2020-11-10 |
Sacrificial gate spacer regions for gate contacts formed over the active region of a transistor Grant 10,832,961 - Fan , et al. November 10, 2 | 2020-11-10 |
Metal-insulator-metal capacitor structure Grant 10,833,147 - Basker , et al. November 10, 2 | 2020-11-10 |
Transistor Having Reduced Contact Resistance App 20200350403 - Basker; Veeraraghavan S. ;   et al. | 2020-11-05 |
Metal-insulator-metal capacitor structure Grant 10,825,890 - Basker , et al. November 3, 2 | 2020-11-03 |
Metal-insulator-metal capacitor structure Grant 10,825,891 - Basker , et al. November 3, 2 | 2020-11-03 |
Sacrificial Gate Spacer Regions For Gate Contacts Formed Over The Active Region Of A Transistor App 20200335401 - Fan; Su Chen ;   et al. | 2020-10-22 |
Source And Drain Epi Protective Spacer During Single Diffusion Break Formation App 20200328121 - Yao; Yao ;   et al. | 2020-10-15 |
Finfet Devices App 20200328124 - Basker; Veeraraghavan S. ;   et al. | 2020-10-15 |
Electrical Isolation For Nanosheet Transistor Devices App 20200312956 - Yeh; Chun-chen ;   et al. | 2020-10-01 |
Vertical Field Effect Transistor With Top And Bottom Airgap Spacers App 20200303497 - Yeh; Chun-Chen ;   et al. | 2020-09-24 |
Fin field effect transistor fabrication and devices having inverted T-shaped gate Grant 10,784,365 - Basker , et al. Sept | 2020-09-22 |
Transistor with recessed cross couple for gate contact over active region integration Grant 10,770,388 - Xie , et al. Sep | 2020-09-08 |
Punch Through Stopper In Bulk Finfet Device App 20200259002 - A1 | 2020-08-13 |
Substantially defect free relaxed heterogeneous semiconductor fins on bulk substrates Grant 10,734,518 - Basker , et al. | 2020-08-04 |
Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Grant 10,707,128 - Basker , et al. | 2020-07-07 |
FinFET devices Grant 10,699,962 - Basker , et al. | 2020-06-30 |
Method Of Fin Oxidation By Flowable Oxide Fill And Steam Anneal To Mitigate Local Layout Effects App 20200203214 - Zhou; Huimei ;   et al. | 2020-06-25 |
Source/drain Contact Depth Control App 20200203480 - HU; Lin ;   et al. | 2020-06-25 |
Replacement metal gate structures Grant 10,692,989 - Basker , et al. | 2020-06-23 |
Fin isolation to mitigate local layout effects Grant 10,685,866 - Zhou , et al. | 2020-06-16 |
Electrical fuse and/or resistor structures Grant 10,679,939 - Basker , et al. | 2020-06-09 |
Vertical FET with shaped spacer to reduce parasitic capacitance Grant 10,672,887 - Wang , et al. | 2020-06-02 |
Method of fin oxidation by flowable oxide fill and steam anneal to mitigate local layout effects Grant 10,658,224 - Zhou , et al. | 2020-05-19 |
Formation Of Trench Silicide Source Or Drain Contacts Without Gate Damage App 20200152509 - Greene; Andrew ;   et al. | 2020-05-14 |
Source And Drain Contact Cut Last Process To Enable Wrap-around-contact App 20200152751 - Greene; Andrew ;   et al. | 2020-05-14 |
Source And Drain Contact Cut Last Process To Enable Wrap-around-contact App 20200152756 - GREENE; Andrew ;   et al. | 2020-05-14 |
Forming a fin using double trench epitaxy Grant 10,651,295 - Basker , et al. | 2020-05-12 |
STRUCTURE TO ENABLE TITANIUM CONTACT LINER ON pFET SOURCE/DRAIN REGIONS App 20200127132 - Basker; Veeraraghavan S. ;   et al. | 2020-04-23 |
Punch through stopper in bulk finFET device Grant 10,629,709 - Basker , et al. | 2020-04-21 |
Self-aligned Wrap-around Trench Contacts App 20200118874 - Basker; Veeraraghavan S. | 2020-04-16 |
Structure and method to form defect free high-mobility semiconductor fins on insulator Grant 10,622,379 - Basker , et al. | 2020-04-14 |
Selective removal of semiconductor fins Grant 10,607,890 - Basker , et al. | 2020-03-31 |
Replacement Metal Gate Structures App 20200091314 - BASKER; Veeraraghavan S. ;   et al. | 2020-03-19 |
Replacement metal gate structures Grant 10,593,779 - Basker , et al. | 2020-03-17 |
Electrical fuse and/or resistors structures Grant 10,593,622 - Basker , et al. | 2020-03-17 |
Static random access memory (SRAM) density scaling by using middle of line (MOL) flow Grant 10,593,679 - Basker , et al. | 2020-03-17 |
Fin Isolation To Mitigate Local Layout Effects App 20200083088 - Zhou; Huimei ;   et al. | 2020-03-12 |
Fin Oxidation By Flowable Oxide Fill And Steam Anneal To Mitigate Local Layout Effects App 20200083089 - Zhou; Huimei ;   et al. | 2020-03-12 |
Vertical Fet With Shaped Spacer To Reduce Parasitic Capacitance App 20200083347 - Wang; Junli ;   et al. | 2020-03-12 |
Replacement metal gate structures Grant 10,586,857 - Basker , et al. | 2020-03-10 |
Strained FinFET source drain isloation Grant 10,586,867 - Cheng , et al. | 2020-03-10 |
Replacement metal gate structures Grant 10,580,880 - Basker , et al. | 2020-03-03 |
Dual Silicide Liner Flow For Enabling Low Contact Resistance App 20200066583 - Adusumilli; Praneet ;   et al. | 2020-02-27 |
Replacement metal gate structures Grant 10,573,726 - Basker , et al. Feb | 2020-02-25 |
Selective Removal Of Semiconductor Fins App 20200058554 - Basker; Veeraraghavan S. ;   et al. | 2020-02-20 |
Embedded source/drain structure for tall FinFET and method of formation Grant 10,559,690 - Basker , et al. Feb | 2020-02-11 |
Dual silicide liner flow for enabling low contact resistance Grant 10,546,776 - Adusumilli , et al. Ja | 2020-01-28 |
Replacement Metal Gate Structures App 20200027967 - BASKER; Veeraraghavan S. ;   et al. | 2020-01-23 |
Air-gap top spacer and self-aligned metal gate for vertical fets Grant 10,541,312 - Basker , et al. Ja | 2020-01-21 |
Replacement Metal Gate Structures App 20200020787 - BASKER; Veeraraghavan S. ;   et al. | 2020-01-16 |
Transistor With Recessed Cross Couple For Gate Contact Over Active Region Integration App 20190385946 - Xie; Ruilong ;   et al. | 2019-12-19 |
Semiconductor fins for FinFET devices and sidewall image transfer (SIT) processes for manufacturing the same Grant 10,504,786 - Basker , et al. Dec | 2019-12-10 |
Embedded Source/drain Structure For Tall Finfet And Method Of Formation App 20190371941 - Basker; Veeraraghavan S. ;   et al. | 2019-12-05 |
Interface-less Contacts To Source/drain Regions And Gate Electrode Over Active Portion Of Device App 20190355829 - Wang; Junli ;   et al. | 2019-11-21 |
Metal-insulator-metal Capacitor Structure App 20190348495 - BASKER; Veeraraghavan S. ;   et al. | 2019-11-14 |
Electrical Fuse And/or Resistor Structures App 20190341348 - BASKER; Veeraraghavan S. ;   et al. | 2019-11-07 |
Fabrication Of Self-aligned Gate Contacts And Source/drain Contacts Directly Above Gate Electrodes And Source/drains App 20190341309 - Basker; Veeraraghavan S. ;   et al. | 2019-11-07 |
Nanosheet Device With Close Source Drain Proximity App 20190341467 - Basker; Veeraraghavan S. ;   et al. | 2019-11-07 |
Vertical transport FET devices having air gap top spacer Grant 10,453,934 - Basker , et al. Oc | 2019-10-22 |
Metal-insulator-metal Capacitor Structure App 20190312100 - BASKER; Veeraraghavan S. ;   et al. | 2019-10-10 |
Nanosheet device with close source drain proximity Grant 10,439,049 - Basker , et al. O | 2019-10-08 |
Electrical Fuse And/or Resistor Structures App 20190287901 - BASKER; Veeraraghavan S. ;   et al. | 2019-09-19 |
Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Grant 10,418,280 - Basker , et al. Sept | 2019-09-17 |
Semiconductor Device Including Dual Trench Epitaxial Dual-liner Contacts App 20190273027 - Basker; Veeraraghavan S. ;   et al. | 2019-09-05 |
Gate planarity for FinFET using dummy polish stop Grant 10,403,740 - Basker , et al. Sep | 2019-09-03 |
Approach to fabrication of an on-chip resistor with a field effect transistor Grant 10,396,069 - Basker , et al. A | 2019-08-27 |
Electrical fuse and/or resistor structures Grant 10,396,027 - Basker , et al. A | 2019-08-27 |
Finfet With Reduced Parasitic Capacitance App 20190259852 - Alptekin; Emre ;   et al. | 2019-08-22 |
Semiconductor device including dual trench epitaxial dual-liner contacts Grant 10,388,576 - Basker , et al. A | 2019-08-20 |
Metal-insulator-metal capacitor structure Grant 10,388,718 - Basker , et al. A | 2019-08-20 |
Metal-insulator-metal Capacitor Structure App 20190252490 - BASKER; Veeraraghavan S. ;   et al. | 2019-08-15 |
Embedded Source/drain Structure For Tall Finfet And Method Of Formation App 20190252548 - Basker; Veeraraghavan S. ;   et al. | 2019-08-15 |
Replacement Metal Gate Structures App 20190245059 - BASKER; Veeraraghavan S. ;   et al. | 2019-08-08 |
Integrating metal-insulator-metal capacitors with air gap process flow Grant 10,373,905 - Basker , et al. | 2019-08-06 |
Electrical fuse and/or resistor structures Grant 10,361,155 - Basker , et al. | 2019-07-23 |
Low-drive current FinFET structure for improving circuit density of ratioed logic in SRAM devices Grant 10,361,210 - Basker , et al. | 2019-07-23 |
Contact structure and extension formation for III-V nFET Grant 10,361,307 - Basker , et al. | 2019-07-23 |
SiGe FINS FORMED ON A SUBSTRATE App 20190214254 - Basker; Veeraraghavan S. ;   et al. | 2019-07-11 |
SiGe FINS FORMED ON A SUBSTRATE App 20190214253 - Basker; Veeraraghavan S. ;   et al. | 2019-07-11 |
Capacitors App 20190214456 - BASKER; Veeraraghavan S. ;   et al. | 2019-07-11 |
Split fin field effect transistor enabling back bias on fin type field effect transistors Grant 10,347,765 - Basker , et al. July 9, 2 | 2019-07-09 |
Fabrication Of Self-aligned Gate Contacts And Source/drain Contacts Directly Above Gate Electrodes And Source/drains App 20190198393 - Basker; Veeraraghavan S. ;   et al. | 2019-06-27 |
Fabrication Of Self-aligned Gate Contacts And Source/drain Contacts Directly Above Gate Electrodes And Source/drains App 20190198394 - Basker; Veeraraghavan S. ;   et al. | 2019-06-27 |
Fin pitch scaling for high voltage devices and low voltage devices on the same wafer Grant 10,332,796 - Basker , et al. | 2019-06-25 |
Nanosheet Device With Close Source Drain Proximity App 20190189769 - Basker; Veeraraghavan S. ;   et al. | 2019-06-20 |
Forming A Fin Using Double Trench Epitaxy App 20190189784 - Basker; Veeraraghavan S. ;   et al. | 2019-06-20 |
FinFET with reduced parasitic capacitance Grant 10,326,000 - Alptekin , et al. | 2019-06-18 |
Contact area to trench silicide resistance reduction by high-resistance interface removal Grant 10,325,999 - Basker , et al. | 2019-06-18 |
Finfet Devices App 20190181049 - BASKER; Veeraraghavan S. ;   et al. | 2019-06-13 |
Vertical Fet With Shaped Spacer To Reduce Parasitic Capacitance App 20190181238 - Wang; Junli ;   et al. | 2019-06-13 |
Replacement Metal Gate Structures App 20190181242 - BASKER; Veeraraghavan S. ;   et al. | 2019-06-13 |
Fin field effect transistor fabrication and devices having inverted T-shaped gate Grant 10,319,840 - Basker , et al. | 2019-06-11 |
FinFET devices Grant 10,319,640 - Basker , et al. | 2019-06-11 |
Metal-insulator-metal capacitor structure Grant 10,312,318 - Basker , et al. | 2019-06-04 |
Localized fin width scaling using a hydrogen anneal Grant 10,312,377 - Basker , et al. | 2019-06-04 |
Fin Field Effect Transistor Fabrication And Devices Having Inverted T-shaped Gate App 20190165142 - Basker; Veeraraghavan S. ;   et al. | 2019-05-30 |
Replacement metal gate structures Grant 10,304,941 - Basker , et al. | 2019-05-28 |
SiGe fins formed on a substrate Grant 10,297,448 - Basker , et al. | 2019-05-21 |
Gate top spacer for FinFET Grant 10,297,614 - Basker , et al. | 2019-05-21 |
Precise control of vertical transistor gate length Grant 10,297,689 - Basker , et al. | 2019-05-21 |
Replacement Metal Gate Structures App 20190148554 - BASKER; Veeraraghavan S. ;   et al. | 2019-05-16 |
Substantially Defect Free Relaxed Heterogeneous Semiconductor Fins On Bulk Substrates App 20190148549 - Basker; Veeraraghavan S. ;   et al. | 2019-05-16 |
CMOS compatible fuse or resistor using self-aligned contacts Grant 10,290,633 - Basker , et al. | 2019-05-14 |
Replacement Metal Gate Structures App 20190140098 - BASKER; Veeraraghavan S. ;   et al. | 2019-05-09 |
Fabrication of self-aligned gate contacts and source/drain contacts directly above gate electrodes and source/drains Grant 10,283,406 - Basker , et al. | 2019-05-07 |
Capacitors Grant 10,283,586 - Basker , et al. | 2019-05-07 |
FinFET devices Grant 10,276,658 - Basker , et al. | 2019-04-30 |
Substantially Defect Free Relaxed Heterogeneous Semiconductor Fins On Bulk Substrates App 20190123199 - Basker; Veeraraghavan S. ;   et al. | 2019-04-25 |
Fin pitch scaling for high voltage devices and low voltage devices on the same wafer Grant 10,269,644 - Basker , et al. | 2019-04-23 |
Forming a fin using double trench epitaxy Grant 10,256,327 - Basker , et al. | 2019-04-09 |
Method and structure for forming FinFET CMOS with dual doped STI regions Grant 10,249,537 - Basker , et al. | 2019-04-02 |
Semiconductor fins for FinFET devices and sidewall image transfer (SIT) processes for manufacturing the same Grant 10,249,536 - Basker , et al. | 2019-04-02 |
FinFET CMOS with silicon fin N-channel FET and silicon germanium fin P-channel FET Grant 10,236,293 - Basker , et al. | 2019-03-19 |
Replacement metal gate structures Grant 10,236,359 - Basker , et al. | 2019-03-19 |
Precise control of vertical transistor gate length Grant 10,236,380 - Basker , et al. | 2019-03-19 |
Approach to fabrication of an on-chip resistor with a field effect transistor Grant 10,236,289 - Basker , et al. | 2019-03-19 |
FinFET devices Grant 10,224,247 - Basker , et al. | 2019-03-05 |
Fin field effect transistor fabrication and devices having inverted T-shaped gate Grant 10,224,417 - Basker , et al. | 2019-03-05 |
Punch through stopper in bulk finFET device Grant 10,224,420 - Basker , et al. | 2019-03-05 |
Replacement metal gate structures Grant 10,217,840 - Basker , et al. Feb | 2019-02-26 |
Embedded Source/drain Structure For Tall Finfet And Method Of Formation App 20190051751 - Basker; Veeraraghavan S. ;   et al. | 2019-02-14 |
Selective epitaxy growth for semiconductor devices with fin field-effect transistors (FinFET) Grant 10,204,916 - Basker , et al. Feb | 2019-02-12 |
Electrical Fuse And/or Resistor Structures App 20190019752 - BASKER; Veeraraghavan S. ;   et al. | 2019-01-17 |
Finfet Devices App 20190013247 - BASKER; Veeraraghavan S. ;   et al. | 2019-01-10 |
Replacement metal gate structures Grant 10,177,256 - Basker , et al. J | 2019-01-08 |
Structure and method to prevent EPI short between trenches in FinFET eDRAM Grant 10,177,154 - Aquilino , et al. J | 2019-01-08 |
FinFET with reduced parasitic capacitance Grant 10,170,581 - Alptekin , et al. J | 2019-01-01 |
Capacitors Grant 10,170,540 - Basker , et al. J | 2019-01-01 |
Punch through stopper in bulk finFET device Grant 10,170,594 - Basker , et al. J | 2019-01-01 |
Substantially defect free relaxed heterogeneous semiconductor fins on bulk substrates Grant 10,170,620 - Basker , et al. J | 2019-01-01 |
Finfet Devices App 20180374756 - BASKER; Veeraraghavan S. ;   et al. | 2018-12-27 |
Finfet including improved epitaxial topology Grant 10,164,110 - Basker , et al. Dec | 2018-12-25 |
FinFET devices Grant 10,157,797 - Basker , et al. Dec | 2018-12-18 |
CMOS compatible fuse or resistor using self-aligned contacts Grant 10,157,912 - Basker , et al. Dec | 2018-12-18 |
Punch Through Stopper In Bulk Finfet Device App 20180350959 - Basker; Veeraraghavan S. ;   et al. | 2018-12-06 |
Air-gap Top Spacer And Self-aligned Metal Gate For Vertical Fets App 20180350939 - Basker; Veeraraghavan S. ;   et al. | 2018-12-06 |
Electrical fuse and/or resistor structures Grant 10,147,679 - Basker , et al. De | 2018-12-04 |
FinFET devices Grant 10,141,402 - Basker , et al. Nov | 2018-11-27 |
Vertical Transistor With A Body Contact For Back-biasing App 20180337059 - Basker; Veeraraghavan S. ;   et al. | 2018-11-22 |
Gate top spacer for finFET Grant 10,134,763 - Basker , et al. November 20, 2 | 2018-11-20 |
Nanowire semiconductor device including lateral-etch barrier region Grant 10,134,864 - Basker , et al. November 20, 2 | 2018-11-20 |
Nanowire semiconductor device including lateral-etch barrier region Grant 10,128,335 - Basker , et al. November 13, 2 | 2018-11-13 |
Contact structure and extension formation for III-V nFET Grant 10,121,703 - Basker , et al. November 6, 2 | 2018-11-06 |
Punch through stopper in bulk FinFET device Grant 10,109,723 - Basker , et al. October 23, 2 | 2018-10-23 |
Punch through stopper in bulk finFET device Grant 10,103,251 - Basker , et al. October 16, 2 | 2018-10-16 |
Vertical transistor with a body contact for back-biasing Grant 10,096,484 - Basker , et al. October 9, 2 | 2018-10-09 |
Cmos Compatible Fuse Or Resistor Using Self-aligned Contacts App 20180286856 - Basker; Veeraraghavan S. ;   et al. | 2018-10-04 |
Aggressive tip-to-tip scaling using subtractive integration Grant 10,090,197 - Basker , et al. October 2, 2 | 2018-10-02 |
Air-gap top spacer and self-aligned metal gate for vertical fets Grant 10,090,411 - Basker , et al. October 2, 2 | 2018-10-02 |
Precise Control Of Vertical Transistor Gate Length App 20180277676 - Basker; Veeraraghavan S. ;   et al. | 2018-09-27 |
Hybrid logic and SRAM contacts Grant 10,083,972 - Basker , et al. September 25, 2 | 2018-09-25 |
Punch through stopper in bulk finFET device Grant 10,084,070 - Basker , et al. September 25, 2 | 2018-09-25 |
Replacement Metal Gate Structures App 20180269326 - BASKER; Veeraraghavan S. ;   et al. | 2018-09-20 |
Replacement Metal Gate Structures App 20180269309 - BASKER; Veeraraghavan S. ;   et al. | 2018-09-20 |
FinFET CMOS with silicon fin n-channel FET and silicon germanium fin p-channel FET Grant 10,079,232 - Basker , et al. September 18, 2 | 2018-09-18 |
Forming A Fin Using Double Trench Epitaxy App 20180254333 - Basker; Veeraraghavan S. ;   et al. | 2018-09-06 |
Silicon germanium fins on insulator formed by lateral recrystallization Grant 10,068,920 - Reznicek , et al. September 4, 2 | 2018-09-04 |
Composite Spacer Enabling Uniform Doping In Recessed Fin Devices App 20180248017 - Basker; Veeraraghavan S. ;   et al. | 2018-08-30 |
Fin field-effect transistor (FinFET) with reduced parasitic capacitance Grant 10,062,785 - Basker , et al. August 28, 2 | 2018-08-28 |
Replacement metal gate structures Grant 10,056,489 - Basker , et al. August 21, 2 | 2018-08-21 |
Gate stack integrated metal resistors Grant 10,056,366 - Basker , et al. August 21, 2 | 2018-08-21 |
Gate stack integrated metal resistors Grant 10,056,367 - Basker , et al. August 21, 2 | 2018-08-21 |
Integrating Metal-insulator-metal Capacitors With Air Gap Process Flow App 20180233446 - Basker; Veeraraghavan S. ;   et al. | 2018-08-16 |
Replacement Metal Gate Structures App 20180233581 - BASKER; Veeraraghavan S. ;   et al. | 2018-08-16 |
Contact line having insulating spacer therein and method of forming same Grant 10,049,985 - Basker , et al. August 14, 2 | 2018-08-14 |
Replacement metal gate structures Grant 10,050,121 - Basker , et al. August 14, 2 | 2018-08-14 |
Precise control of vertical transistor gate length Grant 10,050,141 - Basker , et al. August 14, 2 | 2018-08-14 |
Structure And Method To Form Defect Free High-mobility Semiconductor Fins On Insulator App 20180219026 - Basker; Veeraraghavan S. ;   et al. | 2018-08-02 |
Semiconductor fins for finFET devices and sidewall image transfer (SIT) processes for manufacturing the same Grant 10,037,916 - Basker , et al. July 31, 2 | 2018-07-31 |
Fabrication Of Self-aligned Gate Contacts And Source/drain Contacts Directly Above Gate Electrodes And Source/drains App 20180211875 - Basker; Veeraraghavan S. ;   et al. | 2018-07-26 |
Fabrication Of Self-aligned Gate Contacts And Source/drain Contacts Directly Above Gate Electrodes And Source/drains App 20180211874 - Basker; Veeraraghavan S. ;   et al. | 2018-07-26 |
Method and structure to fabricate closely packed hybrid nanowires at scaled pitch Grant 10,032,677 - Basker , et al. July 24, 2 | 2018-07-24 |
Integrating metal-insulator-metal capacitors with air gap process flow Grant 10,032,711 - Basker , et al. July 24, 2 | 2018-07-24 |
Cmos compatible fuse or resistor using self-aligned contacts Grant 10,032,769 - Basker , et al. July 24, 2 | 2018-07-24 |
FinFET with reduced capacitance Grant 10,032,773 - Basker , et al. July 24, 2 | 2018-07-24 |
Approach To Fabrication Of An On-chip Resistor With A Field Effect Transistor App 20180204832 - Basker; Veeraraghavan S. ;   et al. | 2018-07-19 |
Approach To Fabrication Of An On-chip Resistor With A Field Effect Transistor App 20180204834 - Basker; Veeraraghavan S. ;   et al. | 2018-07-19 |
FinFET CMOS WITH SILICON FIN N-CHANNEL FET AND SILICON GERMANIUM FIN P-CHANNEL FET App 20180197860 - Basker; Veeraraghavan S ;   et al. | 2018-07-12 |
Electrical fuse and/or resistor structures Grant 10,020,257 - Basker , et al. July 10, 2 | 2018-07-10 |
Forming a fin using double trench epitaxy Grant 10,020,384 - Basker , et al. July 10, 2 | 2018-07-10 |
FinFET devices Grant 10,014,221 - Basker , et al. July 3, 2 | 2018-07-03 |
Soi Finfet Fins With Recessed Fins And Epitaxy In Source Drain Region App 20180175197 - REZNICEK; Alexander ;   et al. | 2018-06-21 |
Composite spacer enabling uniform doping in recessed fin devices Grant 10,002,945 - Basker , et al. June 19, 2 | 2018-06-19 |
Nanowire semiconductor device including lateral-etch barrier region Grant 10,002,921 - Basker , et al. June 19, 2 | 2018-06-19 |
Contact Structure And Extension Formation For Iii-v Nfet App 20180166561 - Basker; Veeraraghavan S. ;   et al. | 2018-06-14 |
Voidless contact metal structures Grant 9,997,407 - Basker , et al. June 12, 2 | 2018-06-12 |
Low resistance dual liner contacts for fin field-effect transistors (FinFETs) Grant 9,997,416 - Adusumilli , et al. June 12, 2 | 2018-06-12 |
Contact Area To Trench Silicide Resistance Reduction By High-resistance Interface Removal App 20180158923 - Basker; Veeraraghavan S. ;   et al. | 2018-06-07 |
Anchored stress-generating active semiconductor regions for semiconductor-on-insulator FinFET Grant 9,991,366 - Basker , et al. June 5, 2 | 2018-06-05 |
Finfet With Reduced Parasitic Capacitance App 20180151686 - Alptekin; Emre ;   et al. | 2018-05-31 |
FinFET with reduced parasitic capacitance Grant 9,985,109 - Alptekin , et al. May 29, 2 | 2018-05-29 |
Fin field effect transistor structure and method to form defect free merged source and drain epitaxy for low external resistance Grant 9,985,114 - Basker , et al. May 29, 2 | 2018-05-29 |
Selectively degrading current resistance of field effect transistor devices Grant 9,985,032 - Basker , et al. May 29, 2 | 2018-05-29 |
Strained Finfet Source Drain Isolation App 20180145178 - Cheng; Kangguo ;   et al. | 2018-05-24 |
Gate Top Spacer For Finfet App 20180145092 - Basker; Veeraraghavan S. ;   et al. | 2018-05-24 |
High-k Layer Chamfering To Prevent Oxygen Ingress In Replacement Metal Gate (rmg) Process App 20180145150 - Ando; Takashi ;   et al. | 2018-05-24 |
Forming A Fin Using Double Trench Epitaxy App 20180138296 - Basker; Veeraraghavan S. ;   et al. | 2018-05-17 |
Contact area to trench silicide resistance reduction by high-resistance interface removal Grant 9,966,454 - Basker , et al. May 8, 2 | 2018-05-08 |
Fin Field Effect Transistor Fabrication And Devices Having Inverted T-shaped Gate App 20180122923 - Basker; Veeraraghavan S. ;   et al. | 2018-05-03 |
Capacitor strap connection structure and fabrication method Grant 9,960,168 - Basker , et al. May 1, 2 | 2018-05-01 |
Finfet With Reduced Parasitic Capacitance App 20180114846 - Alptekin; Emre ;   et al. | 2018-04-26 |
Finfet With Reduced Parasitic Capacitence App 20180114847 - Alptekin; Emre ;   et al. | 2018-04-26 |
Static Random Access Memory (sram) Density Scaling By Using Middle Of Line (mol) Flow App 20180114792 - Basker; Veeraraghavan S. ;   et al. | 2018-04-26 |
Strained FinFET source drain isolation Grant 9,954,107 - Cheng , et al. April 24, 2 | 2018-04-24 |
Split Fin Field Effect Transistor Enabling Back Bias On Fin Type Field Effect Transistors App 20180108772 - Basker; Veeraraghavan S. ;   et al. | 2018-04-19 |
Tunneling fin type field effect transistor with epitaxial source and drain regions Grant 9,947,586 - Basker , et al. April 17, 2 | 2018-04-17 |
Nanowire semiconductor device including lateral-etch barrier region Grant 9,947,744 - Basker , et al. April 17, 2 | 2018-04-17 |
FinFET with reduced capacitance Grant 9,947,763 - Basker , et al. April 17, 2 | 2018-04-17 |
FinFET CMOS with silicon fin N-channel FET and silicon germanium fin P-channel FET Grant 9,947,663 - Basker , et al. April 17, 2 | 2018-04-17 |
Selective Epitaxy Growth For Semiconductor Devices With Fin Field-effect Transistors (finfet) App 20180102369 - Basker; Veeraraghavan S. ;   et al. | 2018-04-12 |
Structure and method to form defect free high-mobility semiconductor fins on insulator Grant 9,941,302 - Basker , et al. April 10, 2 | 2018-04-10 |
Electrical fuse and/or resistor structures Grant 9,941,205 - Basker , et al. April 10, 2 | 2018-04-10 |
Finfet with reduced capacitance Grant 9,941,385 - Basker , et al. April 10, 2 | 2018-04-10 |
Gate planarity for FinFET using dummy polish stop Grant 9,941,392 - Basker , et al. April 10, 2 | 2018-04-10 |
Air-gap top spacer and self-aligned metal gate for vertical FETs Grant 9,941,378 - Basker , et al. April 10, 2 | 2018-04-10 |
Transistor And Method Of Forming Same App 20180097112 - Basker; Veeraraghavan S. ;   et al. | 2018-04-05 |
Finfet Devices App 20180090567 - BASKER; Veeraraghavan S. ;   et al. | 2018-03-29 |
Selective epitaxy growth for semiconductor devices with fin field-effect transistors (FinFET) Grant 9,929,163 - Basker , et al. March 27, 2 | 2018-03-27 |
Method And Structure For Forming Finfet Cmos With Dual Doped Sti Regions App 20180082904 - Basker; Veeraraghavan S. ;   et al. | 2018-03-22 |
Forming a fin using double trench epitaxy Grant 9,923,084 - Basker , et al. March 20, 2 | 2018-03-20 |
FinFET CMOS WITH SILICON FIN N-CHANNEL FET AND SILICON GERMANIUM FIN P-CHANNEL FET App 20180076200 - Basker; Veeraraghavan S. ;   et al. | 2018-03-15 |
FinFET CMOS WITH SILICON FIN N-CHANNEL FET AND SILICON GERMANIUM FIN P-CHANNEL FET App 20180076202 - Basker; Veeraraghavan S. ;   et al. | 2018-03-15 |
Finfet Devices App 20180076094 - BASKER; Veeraraghavan S. ;   et al. | 2018-03-15 |
Approach to fabrication of an on-chip resistor with a field effect transistor Grant 9,917,082 - Basker , et al. March 13, 2 | 2018-03-13 |
Contact structure and extension formation for III-V nFET Grant 9,917,177 - Basker , et al. March 13, 2 | 2018-03-13 |
Electrical Fuse And/or Resistor Structures App 20180068948 - BASKER; Veeraraghavan S. ;   et al. | 2018-03-08 |
Transistor and method of forming same Grant 9,911,849 - Basker , et al. March 6, 2 | 2018-03-06 |
Composite Spacer Enabling Uniform Doping In Recessed Fin Devices App 20180061966 - Basker; Veeraraghavan S. ;   et al. | 2018-03-01 |
Replacement Metal Gate Structures App 20180061965 - BASKER; Veeraraghavan S. ;   et al. | 2018-03-01 |
Contact Structure And Extension Formation For Iii-v Nfet App 20180061968 - Basker; Veeraraghavan S. ;   et al. | 2018-03-01 |
Method and structure for forming FinFET CMOS with dual doped STI regions Grant 9,905,469 - Basker , et al. February 27, 2 | 2018-02-27 |
SOI FinFET fins with recessed fins and epitaxy in source drain region Grant 9,905,692 - Reznicek , et al. February 27, 2 | 2018-02-27 |
Replacement Metal Gate Structures App 20180053854 - BASKER; Veeraraghavan S. ;   et al. | 2018-02-22 |
Electrical Fuse And/or Resistor Structures App 20180053720 - BASKER; Veeraraghavan S. ;   et al. | 2018-02-22 |
Increased contact area for finFETs Grant 9,899,525 - Basker , et al. February 20, 2 | 2018-02-20 |
Split fin field effect transistor enabling back bias on fin type field effect transistors Grant 9,899,524 - Basker , et al. February 20, 2 | 2018-02-20 |
Replacement Metal Gate Structures App 20180047827 - BASKER; Veeraraghavan S. ;   et al. | 2018-02-15 |
Electrical Fuse And/or Resistor Structures App 20180047671 - BASKER; Veeraraghavan S. ;   et al. | 2018-02-15 |
Gate Top Spacer For Finfet App 20180047754 - Basker; Veeraraghavan S. ;   et al. | 2018-02-15 |
Fin field effect transistor fabrication and devices having inverted T-shaped gate Grant 9,893,171 - Basker , et al. February 13, 2 | 2018-02-13 |
Electrical Fuse And/or Resistor Structures App 20180040557 - BASKER; Veeraraghavan S. ;   et al. | 2018-02-08 |
Static random access memory (SRAM) density scaling by using middle of line (MOL) flow Grant 9,881,926 - Basker , et al. January 30, 2 | 2018-01-30 |
Punch Through Stopper In Bulk Finfet Device App 20180026120 - Basker; Veeraraghavan S. ;   et al. | 2018-01-25 |
Integrating Metal-insulator-metal Capacitors With Air Gap Process Flow App 20180025974 - Basker; Veeraraghavan S. ;   et al. | 2018-01-25 |
CMOS compatible fuse or resistor using self-aligned contacts Grant 9,876,009 - Basker , et al. January 23, 2 | 2018-01-23 |
Electrical fuse and/or resistor structures Grant 9,870,989 - Basker , et al. January 16, 2 | 2018-01-16 |
Replacement metal gate structures Grant 9,871,116 - Basker , et al. January 16, 2 | 2018-01-16 |
High-K layer chamfering to prevent oxygen ingress in replacement metal gate (RMG) process Grant 9,865,703 - Ando , et al. January 9, 2 | 2018-01-09 |
Method and structure to fabricate closely packed hybrid nanowires at scaled pitch Grant 9,865,508 - Basker , et al. January 9, 2 | 2018-01-09 |
Replacement metal gate structures Grant 9,865,739 - Basker , et al. January 9, 2 | 2018-01-09 |
Aggressive Tip-to-tip Scaling Using Subtractive Integration App 20180005884 - Basker; Veeraraghavan S. ;   et al. | 2018-01-04 |
Semiconductor Device Including Dual Trench Epitaxial Dual-liner Contacts App 20180005903 - Basker; Veeraraghavan S. ;   et al. | 2018-01-04 |
Low-drive current FinFET structure for improving circuit density of ratioed logic in SRAM devices Grant 9,859,286 - Basker , et al. January 2, 2 | 2018-01-02 |
Selectively degrading current resistance of field effect transistor devices Grant 9,859,280 - Basker , et al. January 2, 2 | 2018-01-02 |
Voidless contact metal structures Grant 9,859,216 - Basker , et al. January 2, 2 | 2018-01-02 |
Fin Pitch Scaling For High Voltage Devices And Low Voltage Devices On The Same Wafer App 20170372968 - Basker; Veeraraghavan S. ;   et al. | 2017-12-28 |
Contact Line Having Insulating Spacer Therein And Method Of Forming Same App 20170373007 - Basker; Veeraraghavan S. ;   et al. | 2017-12-28 |
Self aligned epitaxial based punch through control Grant 9,853,159 - Basker , et al. December 26, 2 | 2017-12-26 |
Method and structure for multigate FinFet device epi-extension junction control by hydrogen treatment Grant 9,853,158 - Basker , et al. December 26, 2 | 2017-12-26 |
MIM capacitor formation in RMG module Grant 9,853,022 - Basker , et al. December 26, 2 | 2017-12-26 |
Structure And Method To Prevent Epi Short Between Trenches In Finfet Edram App 20170365606 - Aquilino; Michael V. ;   et al. | 2017-12-21 |
Precise Control Of Vertical Transistor Gate Length App 20170358675 - Basker; Veeraraghavan S. ;   et al. | 2017-12-14 |
Fin Field Effect Transistor Fabrication And Devices Having Inverted T-shaped Gate App 20170352744 - Basker; Veeraraghavan S. ;   et al. | 2017-12-07 |
LOW RESISTANCE DUAL LINER CONTACTS FOR FIN FIELD-EFFECT TRANSISTORS (FinFETs) App 20170352597 - Adusumilli; Praneet ;   et al. | 2017-12-07 |
Fin Field Effect Transistor Fabrication And Devices Having Inverted T-shaped Gate App 20170352659 - Basker; Veeraraghavan S. ;   et al. | 2017-12-07 |
Soi Finfet Fins With Recessed Fins And Epitaxy In Source Drain Region App 20170338345 - REZNICEK; Alexander ;   et al. | 2017-11-23 |
Substantially Defect Free Relaxed Heterogeneous Semiconductor Fins On Bulk Substrates App 20170338344 - Basker; Veeraraghavan S. ;   et al. | 2017-11-23 |
Contact Line Having Insulating Spacer Therein And Method Of Forming Same App 20170330834 - Basker; Veeraraghavan S. ;   et al. | 2017-11-16 |
Cmos Compatible Fuse Or Resistor Using Self-aligned Contacts App 20170330875 - Basker; Veeraraghavan S. ;   et al. | 2017-11-16 |
Air-gap Top Spacer And Self-aligned Metal Gate For Vertical Fets App 20170330965 - Basker; Veeraraghavan S. ;   et al. | 2017-11-16 |
Air-gap Top Spacer And Self-aligned Metal Gate For Vertical Fets App 20170330951 - Basker; Veeraraghavan S. ;   et al. | 2017-11-16 |
Structure and method to prevent EPI short between trenches in FINFET eDRAM Grant 9,818,741 - Aquilino , et al. November 14, 2 | 2017-11-14 |
Embedded source/drain structure for tall finFET and method of formation Grant 9,818,877 - Basker , et al. November 14, 2 | 2017-11-14 |
Punch Through Stopper In Bulk Finfet Device App 20170323956 - Basker; Veeraraghavan S. ;   et al. | 2017-11-09 |
Split Fin Field Effect Transistor Enabling Back Bias On Fin Type Field Effect Transistors App 20170323944 - Basker; Veeraraghavan S. ;   et al. | 2017-11-09 |
Precise Control Of Vertical Transistor Gate Length App 20170323967 - Basker; Veeraraghavan S. ;   et al. | 2017-11-09 |
Vertical Transistor With A Body Contact For Back-biasing App 20170323948 - Basker; Veeraraghavan S. ;   et al. | 2017-11-09 |
Split Fin Field Effect Transistor Enabling Back Bias On Fin Type Field Effect Transistors App 20170323964 - Basker; Veeraraghavan S. ;   et al. | 2017-11-09 |
Precise Control Of Vertical Transistor Gate Length App 20170323968 - Basker; Veeraraghavan S. ;   et al. | 2017-11-09 |
Precise control of vertical transistor gate length Grant 9,812,567 - Basker , et al. November 7, 2 | 2017-11-07 |
Contact line having insulating spacer therein and method of forming same Grant 9,812,400 - Basker , et al. November 7, 2 | 2017-11-07 |
Structure And Method To Form Defect Free High-mobility Semiconductor Fins On Insulator App 20170309647 - Basker; Veeraraghavan S. ;   et al. | 2017-10-26 |
Gate Planarity For Finfet Using Dummy Polish Stop App 20170309729 - Basker; Veeraraghavan S. ;   et al. | 2017-10-26 |
Silicon Germanium Fins On Insulator Formed By Lateral Recrystallization App 20170301697 - Reznicek; Alexander ;   et al. | 2017-10-19 |
Fin Pitch Scaling For High Voltage Devices And Low Voltage Devices On The Same Wafer App 20170301671 - Basker; Veeraraghavan S. ;   et al. | 2017-10-19 |
Self Aligned Epitaxial Based Punch Through Control App 20170301786 - Basker; Veeraraghavan S. ;   et al. | 2017-10-19 |
Increased Contact Area For Finfets App 20170250285 - Basker; Veeraraghavan S. ;   et al. | 2017-08-31 |
Replacement Metal Gate Structures App 20170236938 - BASKER; Veeraraghavan S. ;   et al. | 2017-08-17 |
Replacement Metal Gate Structures App 20170236918 - BASKER; Veeraraghavan S. ;   et al. | 2017-08-17 |
Tunneling Fin Type Field Effect Transistor With Epitaxial Source And Drain Regions App 20170236755 - Basker; Veeraraghavan S. ;   et al. | 2017-08-17 |
FIN FIELD-EFFECT TRANSISTOR (FinFET) WITH REDUCED PARASITIC CAPACITANCE App 20170236933 - Basker; Veeraraghavan S. ;   et al. | 2017-08-17 |
Nanowire Semiconductor Device Including Lateral-etch Barrier Region App 20170229553 - Basker; Veeraraghavan S. ;   et al. | 2017-08-10 |
Nanowire Semiconductor Device Including Lateral-etch Barrier Region App 20170221991 - Basker; Veeraraghavan S. ;   et al. | 2017-08-03 |
Electrical Fuse And/or Resistor Structures App 20170221822 - BASKER; Veeraraghavan S. ;   et al. | 2017-08-03 |
Forming A Fin Using Double Trench Epitaxy App 20170207323 - Basker; Veeraraghavan S. ;   et al. | 2017-07-20 |
Gate Planarity For Finfet Using Dummy Polish Stop App 20170200714 - Basker; Veeraraghavan S. ;   et al. | 2017-07-13 |
Fin Field-effect Transistor (finfet) With Reduced Parasitic Capacitance App 20170194436 - Basker; Veeraraghavan S. ;   et al. | 2017-07-06 |
Semiconductor Fins For Finfet Devices And Sidewall Image Transfer (sit) Processes For Manufacturing The Same App 20170194462 - Basker; Veeraraghavan S. ;   et al. | 2017-07-06 |
Semiconductor Fins For Finfet Devices And Sidewall Image Transfer (sit) Processes For Manufacturing The Same App 20170194207 - Basker; Veeraraghavan S. ;   et al. | 2017-07-06 |
Semiconductor Fins For Finfet Devices And Sidewall Image Transfer (sit) Processes For Manufacturing The Same App 20170194358 - Basker; Veeraraghavan S. ;   et al. | 2017-07-06 |
Electrical Fuse And/or Resistor Structures App 20170194251 - BASKER; Veeraraghavan S. ;   et al. | 2017-07-06 |
High-k Layer Chamfering To Prevent Oxygen Ingress In Replacement Metal Gate (rmg) Process App 20170194459 - Ando; Takashi ;   et al. | 2017-07-06 |
Selective Removal Of Semiconductor Fins App 20170178960 - Basker; Veeraraghavan S. ;   et al. | 2017-06-22 |
Cmos Compatible Fuse Or Resistor Using Self-aligned Contacts App 20170170169 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Forming Metal-insulator-metal Capacitor App 20170170168 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Voidless Contact Metal Structures App 20170170119 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Contact Area To Trench Silicide Resistance Reduction By High-resistance Interface Removal App 20170170290 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Localized Elastic Strain Relaxed Buffer App 20170170014 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Voidless Contact Metal Structures App 20170170064 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Method and Structure to Fabricate Closely Packed Hybrid Nanowires at Scaled Pitch App 20170170073 - Basker; Veeraraghavan S. ;   et al. | 2017-06-15 |
Fin Field Effect Transistor Structure And Method To Form Defect Free Merged Source And Drain Epitaxy For Low External Resistance App 20170162671 - Basker; Veeraraghavan S. ;   et al. | 2017-06-08 |
Transistor And Method Of Forming Same App 20170162694 - Basker; Veeraraghavan S. ;   et al. | 2017-06-08 |
SiGe FINS FORMED ON A SUBSTRATE App 20170154788 - Basker; Veeraraghavan S. ;   et al. | 2017-06-01 |
Three-dimensional Metal Resistor Formation App 20170154950 - Basker; Veeraraghavan S. ;   et al. | 2017-06-01 |
Fin Pitch Scaling For High Voltage Devices And Low Voltage Devices On The Same Wafer App 20170148681 - Basker; Veeraraghavan S. ;   et al. | 2017-05-25 |
Fin Pitch Scaling For High Voltage Devices And Low Voltage Devices On The Same Wafer App 20170148788 - Basker; Veeraraghavan S. ;   et al. | 2017-05-25 |
Finfet With Post-rmg Gate Cut App 20170148682 - Basker; Veeraraghavan S. ;   et al. | 2017-05-25 |
Selective Epitaxy Growth For Semiconductor Devices With Fin Field-effect Transistors (finfet) App 20170148796 - Basker; Veeraraghavan S. ;   et al. | 2017-05-25 |
Hybrid Logic And Sram Contacts App 20170148799 - Basker; Veeraraghavan S. ;   et al. | 2017-05-25 |
Selective Epitaxy Growth For Semiconductor Devices With Fin Fieldeffect Transistors (finfet) App 20170148798 - Basker; Veeraraghavan S. ;   et al. | 2017-05-25 |
Capacitors App 20170141184 - BASKER; Veeraraghavan S. ;   et al. | 2017-05-18 |
Gate Stack Integrated Metal Resistors App 20170140993 - Basker; Veeraraghavan S. ;   et al. | 2017-05-18 |
Finfet Devices App 20170140995 - BASKER; Veeraraghavan S. ;   et al. | 2017-05-18 |
Gate Stack Integrated Metal Resistors App 20170141102 - Basker; Veeraraghavan S. ;   et al. | 2017-05-18 |
Dual Silicide Liner Flow For Enabling Low Contact Resistance App 20170125289 - Adusumilli; Praneet ;   et al. | 2017-05-04 |
Mim Capacitor Formation In Rmg Module App 20170125511 - Basker; Veeraraghavan S. ;   et al. | 2017-05-04 |
Dual Silicide Liner Flow For Enabling Low Contact Resistance App 20170125338 - Adusumilli; Praneet ;   et al. | 2017-05-04 |
Dual Silicide Liner Flow For Enabling Low Contact Resistance App 20170125306 - Adusumilli; Praneet ;   et al. | 2017-05-04 |
Methods For Contact Formation For 10 Nanometers And Beyond With Minimal Mask Counts App 20170092539 - Basker; Veeraraghavan S. | 2017-03-30 |
Metal-insulator-metal Capacitor Structure App 20170084681 - BASKER; Veeraraghavan S. ;   et al. | 2017-03-23 |
Metal-insulator-metal Capacitor Structure App 20170084683 - BASKER; Veeraraghavan S. ;   et al. | 2017-03-23 |
Gate Planarity For Finfet Using Dummy Polish Stop App 20170084612 - Basker; Veeraraghavan S. ;   et al. | 2017-03-23 |
Metal-insulator-metal Capacitor Structure App 20170084684 - BASKER; Veeraraghavan S. ;   et al. | 2017-03-23 |
Gate Planarity For Finfet Using Dummy Polish Stop App 20170084724 - Basker; Veeraraghavan S. ;   et al. | 2017-03-23 |
Method And Structure To Fabricate Closely Packed Hybrid Nanowires At Scaled Pitch App 20170076990 - Basker; Veeraraghavan S. ;   et al. | 2017-03-16 |
Method and Structure to Fabricate Closely Packed Hybrid Nanowires at Scaled Pitch App 20170077264 - Basker; Veeraraghavan S. ;   et al. | 2017-03-16 |
Punch Through Stopper In Bulk Finfet Device App 20170077268 - Basker; Veeraraghavan S. ;   et al. | 2017-03-16 |
Method And Structure For Forming Finfet Cmos With Dual Doped Sti Regions App 20170069631 - Basker; Veeraraghavan S. ;   et al. | 2017-03-09 |
Method And Structure For Forming Finfet Cmos With Dual Doped Sti Regions App 20170069541 - Basker; Veeraraghavan S. ;   et al. | 2017-03-09 |
Semiconductor Device Including Dual Spacer And Uniform Epitaxial Buffer Interface Of Embedded Sige Source/drain App 20170062614 - Basker; Veeraraghavan S. ;   et al. | 2017-03-02 |
Finfet Devices Having Silicon Germanium Channel Fin Structures With Uniform Thickness App 20160380058A1 - | 2016-12-29 |
Finfet Devices App 20160379892A1 - | 2016-12-29 |
Nanowire Semiconductor Device Including Lateral-etch Barrier Region App 20160380054A1 - | 2016-12-29 |
Finfet Devices App 20160379887A1 - | 2016-12-29 |
Integrated Circuit Structure Manufacturing Methods Using Hard Mask And Photoresist Combination App 20100330756A1 - | 2010-12-30 |
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