Mass microscope

Description

FIG. 1 is a perspective view of a mass microscope showing my new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a top view thereof; and,

FIG. 7 is a bottom view thereof.

The broken line portions of the mass microscope present unclaimed portions of the claimed design and form no part thereof.

Claims

CLAIM The ornamental design for a mass microscope, as shown and described.

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Inventors:	Kawai; Jun (Kyoto, JP)
Applicant:	Name City State Country Type Shimadzu Corporation Kyoto N/A JP
Assignee:	Shimadzu Corporation (Kyoto, JP)
Appl. No.:	D/453,477
Filed:	April 30, 2013

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Foreign Application Priority Data

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Feb 22, 2013 [JP]			2013-003667

Current U.S. Class:	D16/131
Current International Class:	1606
Field of Search:	;D16/130,131 ;D24/172,232,216,107 ;D15/85,86,87,89 ;D6/641,653.1,653.23 ;D10/81 ;D99/41,43,34,35 ;312/405,116,407.1,409 ;D18/4.4 ;250/311 ;359/368,390

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References Cited [Referenced By]

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U.S. Patent Documents

D141832	July 1945	Holley
D228454	September 1973	Amar
D244355	May 1977	Mazie et al.
D277979	March 1985	Brown et al.
D319307	August 1991	Sakagami et al.
D320073	September 1991	Sakagami et al.
D332616	January 1993	Hashimoto et al.
D354354	January 1995	Yamashita et al.
D377455	January 1997	Burchard et al.
D418596	January 2000	Doms et al.
D445509	July 2001	Berndt et al.
D571385	June 2008	Onuma et al.
D571480	June 2008	Beck et al.
D591864	May 2009	Schmidt
D599688	September 2009	Ito
D623211	September 2010	Oonuma et al.
D626579	November 2010	Oonuma et al.
D632323	February 2011	Oonuma et al.
D633537	March 2011	Oonuma et al.
D633538	March 2011	Oonuma et al.
D636005	April 2011	Oonuma et al.
D656978	April 2012	Stoiakine
D669189	October 2012	Liu et al.
D674830	January 2013	Stoiakine
D708245	July 2014	Matoba et al.

Primary Examiner: Greene; Paula
Attorney, Agent or Firm: Jianq Chyun IP Office