Semiconductor device

Description

FIG. 1 is a front, top and right side perspective view of a semiconductor device, showing our new design;

FIG. 2 is a front, bottom and right side perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a right side elevational view thereof; the left side elevational view is omitted as that is symmetrical to the right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a cross-sectional view thereof, taken along line 8--8 of FIG. 5, with the internal system omitted.

Claims

The ornamental design for a semiconductor device, as shown and described.

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Inventors:	Fukumoto; Takakazu (Tokyo, JP), Tokunaga; Muneharu (Tokyo, JP), Matsuura; Tetsuya (Tokyo, JP)
Assignee:	Mitsubishi Denki Kabushiki Kaisha (Tokyo, JP)
Appl. No.:	D/144,816
Filed:	July 11, 2001

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Foreign Application Priority Data

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Feb 15, 2001 [JP]			2001-003335

Current U.S. Class:	D13/182
Current International Class:	1303
Field of Search:	;D13/182 ;D14/114 ;174/52.1,52.2,52.4,52.5,16.3 ;206/710,719 ;257/254,659,697,730,738 ;324/755,765 ;361/752,798,820,718,730

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References Cited [Referenced By]

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U.S. Patent Documents

3706840	December 1972	Moyle et al.
4748538	May 1988	Tsuji
4843695	July 1989	Doe et al.
5237201	August 1993	Tanaki et al.
D345731	April 1994	Owens et al.
5464054	November 1995	Hinshaw et al.
D416872	November 1999	Burke
6020625	February 2000	Qin et al.
D421969	March 2000	Kawafuji et al.
6093957	July 2000	Kwon
D432096	October 2000	Jeon et al.
D432097	October 2000	Song et al.
D448740	October 2001	Iwasaki et al.
6300685	October 2001	Hasegawa et al.

Foreign Patent Documents

	63-73694		Apr 1988		JP
	63-114245		May 1988		JP
	2-134890		May 1990		JP
	4-276649		Oct 1992		JP
	6-177501		Jun 1994		JP
	6-314885		Nov 1994		JP
	6-334294		Dec 1994		JP
	7-22727		Jan 1995		JP
	10-173122		Jun 1998		JP

Primary Examiner: Shooman; Ted
Assistant Examiner: Sikder; Selina
Attorney, Agent or Firm: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.