U.S. patent number D459,316 [Application Number D/144,819] was granted by the patent office on 2002-06-25 for semiconductor device.
This patent grant is currently assigned to Mitsubishi Denki Kabushiki Kaisha. Invention is credited to Takakazu Fukumoto, Tetsuya Matsuura, Muneharu Tokunaga.
United States Patent |
D459,316 |
Fukumoto , et al. |
June 25, 2002 |
Semiconductor device
Claims
The ornamental design for a semiconductor device, as shown and
described.
Inventors: |
Fukumoto; Takakazu (Tokyo,
JP), Tokunaga; Muneharu (Tokyo, JP),
Matsuura; Tetsuya (Tokyo, JP) |
Assignee: |
Mitsubishi Denki Kabushiki
Kaisha (Tokyo, JP)
|
Appl.
No.: |
D/144,819 |
Filed: |
July 12, 2001 |
Foreign Application Priority Data
|
|
|
|
|
Feb 15, 2001 [JP] |
|
|
2001-003331 |
|
Current U.S.
Class: |
D13/182 |
Current International
Class: |
1303 |
Field of
Search: |
;D13/182,110
;174/52.2,52.4,16.3
;257/787,668,667,670,676,679,686,688,690-692,696,703,778
;361/760,783,813,752,798,820 ;365/226 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
|
|
|
|
|
|
|
63-73694 |
|
Apr 1988 |
|
JP |
|
63-114245 |
|
May 1988 |
|
JP |
|
2-134890 |
|
May 1990 |
|
JP |
|
4-276649 |
|
Oct 1992 |
|
JP |
|
6-177501 |
|
Jun 1994 |
|
JP |
|
6-314885 |
|
Nov 1994 |
|
JP |
|
6-334294 |
|
Dec 1994 |
|
JP |
|
7-22727 |
|
Jan 1995 |
|
JP |
|
10-173122 |
|
Jun 1998 |
|
JP |
|
Primary Examiner: Shooman; Ted
Assistant Examiner: Sikder; Selin
Attorney, Agent or Firm: Oblon, Spivak, McClelland, Maier
& Neustadt, P.C.
Description
FIG. 1 is a front, top and right side perspective view of a
semiconductor device, showing our new design;
FIG. 2 is a front, bottom and right side perspective view
thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a right side elevational view thereof; the left side
elevational view is omitted as that is symmetrical to the right
side elevational view thereof;
FIG. 6 is a top plan view thereof;
FIG. 7 is a bottom plan view thereof; and,
FIG. 8 is a cross-sectional view thereof, taken along line 8--8 of
FIG. 5, with the internal system omitted.
* * * * *