U.S. patent application number 16/048622 was filed with the patent office on 2018-12-20 for multi-layer stack with embedded tamper-detect protection.
The applicant listed for this patent is INTERNATIONAL BUSINESS MACHINES CORPORATION. Invention is credited to James A. BUSBY, Phillip Duane ISAACS, William SANTIAGO-FERNANDEZ.
Application Number | 20180365945 16/048622 |
Document ID | / |
Family ID | 59678947 |
Filed Date | 2018-12-20 |
United States Patent
Application |
20180365945 |
Kind Code |
A1 |
BUSBY; James A. ; et
al. |
December 20, 2018 |
MULTI-LAYER STACK WITH EMBEDDED TAMPER-DETECT PROTECTION
Abstract
Tamper-respondent assemblies and methods of fabrication are
provided which include a multi-layer stack having multiple discrete
component layers stacked and electrically connected together via a
plurality of electrical contacts in between the component layers.
Further, the tamper-respondent assembly includes a
tamper-respondent electronic circuit structure embedded within the
multi-layer stack. The tamper-respondent electronic circuit
structure includes at least one tamper-respondent sensor embedded,
at least in part, within at least one component layer of the
multiple discrete component layers of the multi-layer stack. The
tamper-respondent electronic circuit structure defines a secure
volume within the multi-layer stack. For instance, the
tamper-respondent electronic circuit structure may be fully
embedded within the multi-layer stack, with monitor circuitry of
the tamper-respondent electronic circuit structure residing within
the secure volume within the multi-layer stack.
Inventors: |
BUSBY; James A.; (New Paltz,
NY) ; ISAACS; Phillip Duane; (Rochester, MN) ;
SANTIAGO-FERNANDEZ; William; (Poughkeepsie, NY) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
Armonk |
NY |
US |
|
|
Family ID: |
59678947 |
Appl. No.: |
16/048622 |
Filed: |
July 30, 2018 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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15791642 |
Oct 24, 2017 |
10115275 |
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16048622 |
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15053336 |
Feb 25, 2016 |
9916744 |
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15791642 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
G08B 13/128 20130101;
G08B 13/12 20130101 |
International
Class: |
G08B 13/12 20060101
G08B013/12 |
Claims
1. A tamper-respondent assembly comprising: a multi-layer stack
comprising multiple discrete component layers stacked and
electrically connected together via a plurality of electrical
contacts in between the component layers; a tamper-respondent
electronic circuit structure embedded within the multi-layer stack,
the tamper-respondent electronic circuit structure comprising at
least one tamper-respondent sensor embedded, at least in part,
within at least one component layer of the multiple discrete
component layers of the multi-layer stack, the tamper-respondent
electronic circuit structure defining a secure volume within the
multi-layer stack; and wherein the at least one tamper-respondent
sensor embedded, at least in part, within the at least one
component layer comprises multiple stacked tamper-detect circuits
within one component layer of the at least one component layer of
the multi-layer stack.
2. The tamper-respondent assembly of claim 1, wherein the
multi-layer stack comprises a first component layer, at least one
in-between component layer, and a second component layer stacked
together, the at least one in-between component layer being
disposed between the first component layer and the second component
layer in the multi-layer stack, and wherein the tamper-respondent
electronic circuit structure is associated with the first component
layer, the at least one in-between component layer, and the second
component layer, with the secure volume being defined, at least in
part, within the at least one in-between component layer.
3. The tamper-respondent assembly of claim 2, wherein the at least
one tamper-respondent sensor comprises at least one lower
tamper-detect circuit within the first component layer and at least
one upper tamper-detect circuit within the second component
layer.
4. The tamper-respondent assembly of claim 1, wherein the
tamper-respondent electronic circuit structure is embedded within
the multi-layer stack, and the secure volume resides fully within
the multi-layer stack.
5. A method of fabricating a tamper-respondent assembly comprising:
providing a multi-layer stack comprising multiple discrete
component layers stacked and electrically connected together via a
plurality of electrical contacts in between the component layers;
embedding a tamper-respondent electronic circuit structure within
the multi-layer stack, the tamper-respondent electronic circuit
structure comprising at least one tamper-respondent sensor
embedded, at least in part, within at least one component layer of
the multiple discrete component layers of the multi-layer stack,
the tamper-respondent electronic circuit structure defining a
secure volume within the multi-layer stack; and wherein the at
least one tamper-respondent sensor embedded, at least in part,
within the at least one component layer comprises multiple stacked
tamper-detect circuits within one component layer of the at least
one component layer of the multi-layer stack.
6. The method of claim 5, wherein the multi-layer stack comprises a
first component layer, at least one in-between component layer, and
a second component layer stacked together, the at least one
in-between component layer being disposed between the first
component layer and the second component layer in the multi-layer
stack, and wherein embedding the tamper-respondent electronic
circuit structure within the multi-layer stack comprises
associating the tamper-respondent electronic circuit structure with
the first component layer, the at least one in-between component
layer, and the second component layer, with the secure volume being
defined, at least in part, within the at least one in-between
component layer.
7. The method of claim 6, wherein the at least one
tamper-respondent sensor comprises at least one lower tamper-detect
circuit within the first component layer and at least one upper
tamper-detect circuit within the second component layer.
8. The method of claim 7, wherein the at least one
tamper-respondent sensor further comprises at least one peripheral
tamper-detect circuit, the at least one peripheral tamper-detect
circuit defined, at least in part, by a plurality of
through-substrate vias extending through the at least one
in-between component layer, wherein the at least one upper
tamper-detect circuit, the at least one lower tamper-detect
circuit, and the at least one peripheral tamper-detect circuit
electrically connect to monitor circuity of the tamper-respondent
electronic circuit structure and facilitate defining the secure
volume within the multi-layer stack.
9. The method of claim 8, wherein the at least one peripheral
tamper-detect circuit extends between the at least one upper
tamper-detect circuit and the at least one lower tamper-detect
circuit, and is disposed about the periphery of the at least one
in-between component layer.
10. The method of claim 8, wherein the multi-layer structure
resides on a base component layer, the base component layer being a
2.5D interposer.
11. The method of claim 6, wherein the multi-layer stack comprises
multiple in-between component layers disposed between the first
component layer and the second component layer, the at least one
in-between component layer being at least one in-between component
layer of the multiple in-between component layers, and the at least
one tamper-respondent sensor comprises at least one peripheral
tamper-detect circuit, the at least one peripheral tamper-detect
circuit including respective pluralities of through-substrate vias,
each plurality extending through a respective component layer of
the multiple in-between component layers, at least some
through-substrate vias of the respective pluralities of
through-substrate vias being electrically interconnected in the at
least one peripheral tamper-detect circuit by respective electrical
contacts of the plurality of electrical contacts disposed in
between component layers of the multi-layer stack.
12. The method of claim 11, further comprising an under-fill
material disposed between adjacent component layers of the multiple
discrete component layers, the under-fill material surrounding, at
least in part, electrical contacts of the plurality of electrical
contacts in between the component layers.
13. The method of claim 5, wherein the tamper-respondent electronic
circuit structure is embedded within the multi-layer stack, and the
secure volume resides fully within the multi-layer stack.
Description
BACKGROUND
[0001] Many activities require secure electronic communications. To
facilitate secure electronic communications, an
encryption/decryption system may be implemented on an electronic
assembly or printed circuit board assembly that is included in
equipment connected to a communications network. Such an electronic
assembly is an enticing target for malefactors since it may contain
codes or keys to decrypt intercepted messages, or to encode
fraudulent messages. To prevent this, an electronic assembly may be
mounted in an enclosure, which is then wrapped in a security
sensor, and encapsulated with polyurethane resin. A security sensor
may be, in one or more embodiments, a web or sheet of insulating
material with circuit elements, such as closely-spaced, conductive
lines fabricated on it. The circuit elements are disrupted if the
sensor is torn, and the disruption can be sensed in order to
generate an alarm signal. The alarm signal may be conveyed to a
monitor circuit in order to reveal an attack on the integrity of
the assembly. The alarm signal may also trigger an erasure of
encryption/decryption keys stored within the electronic
assembly.
[0002] In the above configuration, the electronic package, or
tamper-proof electronic package, may be difficult to test due to
the presence of the security sensor wrapped fully around the
enclosure. Additionally, in this configuration it is difficult to
recover components from the electronic package, for instance,
should a manufacturing defect in the package be detected.
SUMMARY
[0003] Thus, provided herein, in one or more aspects, is a
tamper-respondent assembly comprising a multi-layer stack including
multiple discrete component layers stacked and electrically
connected together via a plurality of electrical contacts in
between the component layers; and a tamper-respondent electronic
circuit structure embedded within the multi-layer stack, the
tamper-respondent electronic circuit structure comprising at least
one tamper-respondent sensor embedded, at least in part, within at
least one component layer of the multiple discrete component layers
of the multi-layer stack, the tamper-respondent electronic circuit
structure defining a secure volume within the multi-layer stack.
Further, the at least one tamper-respondent sensor embedded, at
least in part, within the at least one component layer includes
multiple stack tamper-detect circuits within one component layer of
the at least one component layer of the multi-layer stack.
[0004] In a further aspect, a method of fabricating a
tamper-respondent assembly is provided which includes: providing a
multi-layer stack comprising multiple discrete component layers
stacked and electrically connected together via a plurality of
electrical contacts in between the component layers; and embedding
a tamper-respondent electronic circuit structure within the
multi-layer stack, the tamper-respondent electronic circuit
structure comprising at least one tamper-respondent sensor
embedded, at least in part, within at least one component layer of
the multiple discrete component layers of the multi-layer stack,
the tamper-respondent electronic circuit structure defining a
secure volume within the multi-layer stack. Further, the at least
one tamper-respondent sensor embedded, at least in part, within the
at least one component layer includes multiple stack tamper-detect
circuits within one component layer of the at least one component
layer of the multi-layer stack.
[0005] Additional features and advantages are realized through the
techniques of the present invention. Other embodiments and aspects
of the invention are described in detail herein and are considered
a part of the claimed invention.
BRIEF DESCRIPTION OF THE DRAWINGS
[0006] One or more aspects of the present invention are
particularly pointed out and distinctly claimed as examples in the
claims at the conclusion of the specification. The foregoing and
other objects, features, and advantages of the invention are
apparent from the following detailed description taken in
conjunction with the accompanying drawings in which:
[0007] FIG. 1 is a partial cut-away of one embodiment of a
tamper-proof electronic package;
[0008] FIG. 2 is a cross-sectional elevational view of one
embodiment of a tamper-proof electronic package comprising an
electronic circuit;
[0009] FIG. 3 depicts one embodiment of a tamper-respondent trace
pattern or circuit which may be employed within a tamper-respondent
sensor, in accordance with one or more aspects of the present
invention;
[0010] FIG. 4A is a cross-sectional elevational view of another
embodiment of a tamper-proof electronic package, which includes a
tamper-respondent sensor embedded within a multilayer circuit
board, in accordance with one or more aspects of the present
invention;
[0011] FIG. 4B is a top plan view of the multilayer circuit board
of FIG. 4A, depicting one embodiment of the secure volume where
defined, in part, within the multilayer circuit board, in
accordance with one or more aspects of the present invention;
[0012] FIG. 5A is a partial cross-sectional elevational view of a
tamper-proof electronic package comprising an electronic circuit
with a multilayer circuit board and embedded tamper-respondent
sensor, in accordance with one or more aspects of the present
invention;
[0013] FIG. 5B is a schematic of a portion of the tamper-proof
electronic package of FIG. 5A, in accordance with one or more
aspects of the present invention;
[0014] FIG. 5C depicts an alternate embodiment of an electronic
circuit comprising a multilayer circuit board and an embedded
tamper-respondent sensor, in accordance with one or more aspects of
the present invention;
[0015] FIG. 6 illustrates one embodiment of a process for
fabricating a multilayer circuit board with an embedded
tamper-respondent sensor, in accordance with one or more aspects of
the present invention;
[0016] FIG. 7 is a plan view of one embodiment of a
tamper-respondent mat layer for a tamper-respondent sensor embedded
within a multilayer circuit board, in accordance with one or more
aspects of the present invention;
[0017] FIG. 8A is a plan view of the tamper-respondent mat layer of
FIG. 7, with conductive vias to an upper layer illustrated for
electrically connecting to the conductive traces of the different
circuit zones of the tamper-respondent mat layer, in accordance
with one or more aspects of the present invention;
[0018] FIG. 8B is a partial plan view of the tamper-respondent mat
layer of FIG. 8A, showing a portion of the conductive traces
provided within two adjacent circuit zones of the tamper-respondent
mat layer, in accordance with one or more aspects of the present
invention;
[0019] FIG. 8C is a plan view of a wiring layer overlying the
tamper-respondent mat layer of FIG. 8A, and illustrating an
offsetting of the conductive vias from the tamper-respondent mat
layer of FIG. 8A to selected locations within the wiring layer,
which also accommodate (in the depicted example) external signal
line vias facilitating communication to and from the secure volume
associated with the multilayer circuit board, in accordance with
one or more aspects of the present invention;
[0020] FIG. 8D depicts a tamper-respondent mat layer above the
wiring layer of FIG. 8C, and illustrates further offsetting of
conductive vias, from one mat layer to the next, to enhance
security of the tamper-respondent sensor, in accordance with one or
more aspects of the present invention;
[0021] FIG. 8E is a plan view of a first tamper-respondent frame
above the tamper-respondent mat layer of FIG. 8D, which facilitates
defining, in part, the secure volume within the multilayer circuit
board, in accordance with one or more aspects of the present
invention;
[0022] FIG. 8F is a partial depiction of conductive traces for a
tamper-respondent frame such as illustrated in FIG. 8E, in
accordance with one or more aspects of the present invention;
[0023] FIG. 8G is a plan view of a second tamper-respondent frame
overlying the first tamper-respondent frame, and further
facilitating defining the secure volume in association with the
multilayer circuit board, in accordance with one or more aspects of
the present invention;
[0024] FIG. 9 is a schematic illustration of one embodiment of
monitor circuitry and electrical interconnection of different
circuit zones of different tamper-respondent layers of the
tamper-respondent sensor within the secure volume associated with
the multilayer circuit board, in accordance with one or more
aspects of the present invention;
[0025] FIG. 10 is an elevational view of one embodiment of a
tamper-respondent assembly comprising a multi-layer stack with an
embedded tamper-respondent electronic circuit structure, in
accordance with one or more aspects of the present invention;
[0026] FIG. 11A is a cross-sectional plan view of one embodiment of
a sensor component layer of the multi-layer stack of FIG. 10, taken
along line 11A-11A of FIG. 11B, and illustrating, in part, a
mat-type, tamper-detect circuit within the sensor component layer,
in accordance with one or more aspects of the present
invention;
[0027] FIG. 11B is a cross-sectional elevational view of the sensor
component layer of FIG. 11A, taken along line 11B-11B thereof, and
depicting multiple mat-type, tamper-respondent circuits within the
sensor component, as well as multiple frame-type, tamper-detect
circuits, in accordance with one or more aspects of the present
invention;
[0028] FIG. 12A depicts a sub-stack of multiple in-between
component layers of a multi-layer stack such as depicted in FIG.
10, and illustrates one embodiment of at least one peripheral
tamper-detect circuit facilitating defining a secure volume within
the sub-stack, in accordance with one or more aspects of the
present invention;
[0029] FIG. 12B is a cross-sectional plan view of the structure of
FIG. 12A, taken along line 12B-12B thereof, and showing one
embodiment of electrical interconnect at the sensor component layer
of the sub-stack, depicting an electrical stitch pattern for
connecting through-substrate vias within the in-between component
layers of the sub-stack into the at least one peripheral
tamper-detect circuit, in accordance with one or more aspects of
the present invention; and
[0030] FIG. 13 depicts an alternate embodiment of a
tamper-respondent assembly comprising a multi-layer stack and an
embedded tamper-respondent electronic circuit structure, in
accordance with one or more aspects of the present invention.
DETAILED DESCRIPTION
[0031] Aspects of the present invention and certain features,
advantages, and details thereof, are explained more fully below
with reference to the non-limiting example(s) illustrated in the
accompanying drawings. Descriptions of well-known materials,
fabrication tools, processing techniques, etc., are omitted so as
not to unnecessarily obscure the invention in detail. It should be
understood, however, that the detailed description and the specific
example(s), while indicating aspects of the invention, are given by
way of illustration only, and are not by way of limitation. Various
substitutions, modifications, additions, and/or arrangements,
within the spirit and/or scope of the underlying inventive concepts
will be apparent to those skilled in the art for this disclosure.
Note further that reference is made below to the drawings, which
are not drawn to scale for ease of understanding, wherein the same
reference numbers used throughout different figures designate the
same or similar components. Also, note that numerous inventive
aspects and features are disclosed herein, and unless otherwise
inconsistent, each disclosed aspect or feature is combinable with
any other disclosed aspect or feature as desired for a particular
application, for establishing a secure volume for an electronic
component or electronic circuit to be protected.
[0032] Reference is first made to FIG. 1 of the drawings, which
illustrates one embodiment of an electronic assembly package 100
configured as a tamper-proof electronic assembly package for
purposes of discussion. In the depicted embodiment, an electronic
assembly enclosure 110 is provided containing, for instance, an
electronic assembly, which in one embodiment may include a
plurality of electronic components, such as an encryption and/or
decryption module and associated memory. The encryption and/or
decryption module may comprise security-sensitive information with,
for instance, access to the information stored in the module
requiring use of a variable key, and with the nature of the key
being stored in the associated memory within the enclosure.
[0033] In one or more implementations, a tamper-proof electronic
package such as depicted is configured or arranged to detect
attempts to tamper-with or penetrate into electronic assembly
enclosure 110. Accordingly, electronic assembly enclosure 110 also
includes, for instance, a monitor circuit which, if tampering is
detected, activates an erase circuit to erase information stored
within the associated memory, as well as the encryption and/or
decryption module within the communications card. These components
may be mounted on, and interconnected by, a multi-layer circuit
board, such as a printed circuit board or other multi-layer
substrate, and be internally or externally powered via a power
supply provided within the electronic assembly enclosure.
[0034] In the embodiment illustrated, and as one example only,
electronic assembly enclosure 110 may be surrounded by a
tamper-respondent sensor 120, an encapsulant 130, and an outer,
thermally conductive enclosure 140. In one or more implementations,
tamper-respondent sensor 120 may include a tamper-respondent
laminate that is folded around electronic assembly enclosure 110,
and encapsulant 130 may be provided in the form of a molding.
Tamper-respondent sensor 120 may include various detection layers,
which are monitored through, for instance, a ribbon cable by the
enclosure monitor, against sudden violent attempts to penetrate
enclosure 110 and damage the enclosure monitor or erase circuit,
before information can be erased from the encryption module. The
tamper-respondent sensor may be, for example, any such article
commercially available or described in various publications and
issued patents, or any enhanced article such as disclosed
herein.
[0035] By way of example, tamper-respondent sensor 120 may be
formed as a tamper-respondent laminate comprising a number of
separate layers with, for instance, an outermost
lamination-respondent layer including a matrix of, for example,
diagonally-extending or sinusoidally-extending, conductive or
semi-conductive lines printed onto a regular, thin insulating film.
The matrix of lines forms a number of continuous conductors which
would be broken if attempts are made to penetrate the film. The
lines may be formed, for instance, by printing carbon-loaded
Polymer Thick Film (PTF) ink onto the film and selectively
connecting the lines on each side, by conductive vias, near the
edges of the film. Connections between the lines and an enclosure
monitor of the communications card may be provided via, for
instance, one or more ribbon cables. The ribbon cable itself may be
formed of lines of conductive ink printed onto an extension of the
film, if desired. Connections between the matrix and the ribbon
cable may be made via connectors formed on one edge of the film. As
noted, the laminate may be wrapped around the electronic assembly
enclosure to define the tamper-respondent sensor 120 surrounding
enclosure 110.
[0036] In one or more implementations, the various elements of the
laminate may be adhered together and wrapped around enclosure 110,
in a similar manner to gift-wrapping a parcel, to define the
tamper-respondent sensor shape 120. The assembly may be placed in a
mold which is then filled with, for instance, cold-pour
polyurethane, and the polyurethane may be cured and hardened to
form an encapsulant 130. The encapsulant may, in one or more
embodiments, completely surround the tamper-respondent sensor 120
and enclosure 110, and thus form a complete environmental seal,
protecting the interior of the enclosure. The hardened polyurethane
is resilient and increases robustness of the electronic package in
normal use. Outer, thermally conductive enclosure 140 may
optionally be provided over encapsulant 130 to, for instance,
provide further structural rigidity to the electronic package.
[0037] FIG. 2 depicts in detail one embodiment of a tamper-proof
electronic package 200. Electronic package 200 is defined by, for
instance, a base metal shell 202 and a top metal shell 204. Outer
surfaces of base metal shell 202 and top metal shell 204 may be
provided with standoffs 206, with an electronic assembly 208
resting on standoffs 206 defined in base metal shell 202.
Electronic assembly 208 may include, for instance, a printed
circuit board 210 with electronic components 212 that are
electrically connected via conductors (not shown) defined within or
on printed circuit board 210.
[0038] Hollow spacers 213 may be placed below dimples 206 in top
metal shell 204, and rivets 214 provided, extending through
openings in dimples 206, through hollow spacers 213 and through
openings in printed circuit board 210 to base metal shell 202 in
order to fixedly secure electronic assembly 208 within the
enclosure formed by base and top metal shells 202, 204. A security
mesh or tamper-respondent sensor 216 is wrapped around the top,
base, and four sides of the enclosure formed by base and top metal
shells 202, 204. As illustrated, in one or more embodiments, top
metal shell 204 may have an opening through which a bus 220
extends. One end of bus 220 may be connected to conductors (not
shown) on printed circuit board 210, and the other end may be
connected to conductors (not shown) on a printed circuit board 222.
As bus 220 passes through the opening, the bus extends between an
inner edge region 223 of the security mesh 216 and an overlapping,
outer edge region 224 of the security mesh 216. A group of wires
226 connect, in one embodiment, security mesh 216 to conductors on
printed circuit board 210. Circuitry on printed circuit board 210
is responsive to a break or discontinuity in security sensor array
216, in which case, an alarm signal may be emitted on bus 220, and
also encryption/decryption keys stored within electronic assembly
208 may be erased.
[0039] In one or more implementations, liquid polyurethane resin
may be applied to security mesh 216 and cured. An outer, thermally
conductive enclosure 228, such as a copper enclosure, may be filled
with liquid polyurethane resin with the electronic assembly and
inner enclosure and security mesh suspended within it. Upon curing
the resin, the electronic assembly and inner enclosure and security
mesh become embedded in a polyurethane block or encapsulant 230, as
shown. The enclosure 228 is mounted on the printed circuit board
222, which can be accomplished using, for instance, legs 240 which
extend through slots in printed circuit board 222 and terminate in
flanges 242, which are then bent out of alignment with the slots.
Bus 220 may be connected, by way of printed circuit board 222 to
connectors 244 located along, for instance, one edge of printed
circuit board 222.
[0040] When considering tamper-proof packaging, the electronic
package needs to maintain defined tamper-proof requirements, such
as those set forth in the National Institutes of Standards and
Technology (NIST) Publication FIPS 140-2, which is a U.S.
Government Computer Security Standard, used to accredit
cryptographic modules. The NIST FIPS 140-2 defines four levels of
security, named Level 1 to Level 4, with Security Level 1 providing
the lowest level of security, and Security Level 4 providing the
highest level of security. At Security Level 4, physical security
mechanisms are provided to establish a complete envelope of
protection around the cryptographic module, with the intent of
detecting and responding to any unauthorized attempt at physical
access. Penetration of the cryptographic module enclosure from any
direction has a very high probability of being detected, resulting
in the immediate zeroization of all plain text critical security
parameters (CSPs). Security Level 4 cryptographic modules are
useful for operation in physically unprotected environments.
Security Level 4 also protects a cryptographic module against a
security compromise due to environmental conditions or fluctuations
outside of the module's normal operating ranges for voltages and
temperature. Intentional excursions beyond the normal operating
ranges may be used by an attacker to thwart the cryptographic
module's defenses. The cryptographic module is required to either
include specialized environmental protection features designed to
detect fluctuations and zeroize critical security parameters, or to
undergo rigorous environmental failure testing to provide
reasonable assurance that the module will not be affected by
fluctuations outside of the normal operating range in a manner that
can compromise the security of the module.
[0041] To address the demands of ever-improving anti-intrusion
technology, and the higher-performance encryption/decryption
functions being provided, enhancements to the tamper-proof,
tamper-evident packaging for the electronic components or circuits
at issue are desired. Various enhancements are described
hereinbelow to, for instance, tamper-respondent assemblies and
tamper-respondent sensors. Note that the numerous inventive aspects
described herein may be used singly, or in any desired combination.
Additionally, in one or more implementations, the enhancements to
tamper-proof electronic packaging described herein may be provided
to work within defined space limitations for existing packages. For
instance, one or more of the concepts described may be configured
to work with peripheral component interconnect express (PCIe) size
limits, and the limitations resulting from being capsulated in, for
instance, an insulating encapsulant.
[0042] Thus, disclosed hereinbelow with reference to FIGS. 3-13 are
various approaches and/or enhancements to creating a secure volume
for accommodating one or more electronic components, such as one or
more encryption and/or decryption modules or circuits and
associated components of a communications card or other electronic
assembly.
[0043] FIG. 3 depicts a portion of one embodiment of a
tamper-respondent layer 305 (or laser and pierce-respondent layer)
of a tamper-respondent sensor 300 or security sensor, such as
discussed herein. In FIG. 3, the tamper-respondent layer 305
includes circuit lines or traces 301 provided on one or both
opposite sides of a flexible layer 302, which in one or more
embodiments, may be a flexible insulating layer or film. FIG. 3
illustrates circuit lines 301 on, for instance, one side of
flexible layer 302, with the traces on the opposite side of the
film being, for instance, the same pattern, but (in one or more
embodiments) offset to lie directly below spaces 303, between
circuit lines 301. As described below, the circuit lines on one
side of the flexible layer may be of a line width W and have a
pitch or line-to-line spacing W.sub.s such that piercing of the
layer 305 at any point results in damage to at least one of the
circuit lines traces 301. In one or more implementations, the
circuit lines may be electrically connected in-series or parallel
to define one or more conductors which may be electrically
connected in a network to an enclosure monitor, which monitors the
resistance of the lines, as described herein. Detection of an
increase, or other change, in resistance, caused by cutting or
damaging one of the traces, will cause information within the
encryption and/or decryption module to be erased. Providing
conductive lines 301 in a pattern, such as a sinusoidal pattern,
may advantageously make it more difficult to breach
tamper-respondent layer 305 without detection. Note, in this
regard, that conductive lines 301 could be provided in any desired
pattern. For instance, in an alternate implementation, conductive
lines 301 could be provided as parallel, straight conductive lines,
if desired, and the pattern or orientation of the pattern may vary
between sides of a layer, and/or between layers.
[0044] As noted, as intrusion technology continues to evolve,
anti-intrusion technology needs to continue to improve to stay
ahead. In one or more implementations, the above-summarized
tamper-respondent sensor 300 of FIG. 3 may be disposed over an
outer surface of an electronic enclosure, such as an electronic
enclosure described above in connection with FIGS. 1 & 2.
Alternatively, as described further herein, the tamper-respondent
sensor may cover or line an inner surface of an electronic
enclosure to provide a secure volume about at least one electronic
component to be protected. Still further, the tamper-respondent
sensor, or more particularly, the tamper-detect circuit(s) of the
sensor, could be embedded within a multi-layer stack, such as a
multi-die stack, as described below. Numerous enhancements to the
tamper-respondent sensor itself are described below.
[0045] In one or more aspects, disclosed herein is a
tamper-respondent sensor 300 with circuit lines 301 having reduced
line widths W.sub.1 of, for instance, 200 .mu.m, or less, such as
less than or equal to 100 .mu.m, or even more particularly, in the
range of 30-70 .mu.m. This is contrasted with conventional trace
widths, which are typically on the order of 350 .mu.m or larger.
Commensurate with reducing the circuit line width W.sub.1,
line-to-line spacing width W.sub.s 303 is also reduced to less than
or equal to 200 .mu.m, such as less than or equal to 100 .mu.m, or
for instance, in a range of 30-70 .mu.m. Advantageously, by
reducing the line width W.sub.1 and line-to-line spacing W.sub.s of
circuit lines 301 within tamper-respondent sensor 300, the circuit
line width and pitch is on the same order of magnitude as the
smallest intrusion instruments currently available, and therefore,
any intrusion attempt will necessarily remove a sufficient amount
of a circuit line(s) to cause resistance to change, and thereby the
tamper intrusion to be detected. Note that, by making the circuit
line width of the smaller dimensions disclosed herein, any cutting
or damage to the smaller-dimensioned circuit line will also be more
likely to be detected, that is, due to a greater change in
resistance. For instance, if an intrusion attempt cuts a 100 .mu.m
width line, it is more likely to reduce the line width sufficiently
to detect the intrusion by a change in resistance. A change in a
narrower line width is more likely to result in a detectable change
in resistance, compared with, for instance, a 50% reduction in a
more conventional line width of 350 .mu.m to, for instance, 175
.mu.m. The smaller the conductive circuit line width becomes, the
more likely that a tampering of that line will be detected.
[0046] Note also that a variety of materials may advantageously be
employed to form the circuit lines. For instance, the circuit lines
may be formed of a conductive ink (such as a carbon-loaded
conductive ink) printed onto one or both opposite sides of one or
more of the flexible layers 302 in a stack of such layers.
Alternatively, a metal or metal alloy could be used to form the
circuit lines, such as copper, silver, intrinsically conductive
polymers, carbon ink, or nickel-phosphorus (NiP), or
Omega-Ply.RTM., offered by Omega Technologies, Inc. of Culver City,
Calif. (USA), or Ticer.TM. offered by Ticer Technologies, Chandler,
Ariz. (USA). Note that the process employed to form the fine
circuit lines or traces on the order described herein is dependent,
in part, on the choice of material used for the circuit lines. For
instance, if copper circuit lines are being fabricated, then
additive processing, such as plating up copper traces, or
subtractive processing, such as etching away unwanted copper
between trace lines, may be employed. By way of further example, if
conductive ink is employed as the circuit line material, fine
circuit lines on the order disclosed herein can be achieved by
focusing on the rheological properties of the conductive ink
formulation. Further, rather than simple pneumatics of pushing
conductive ink through an aperture in a stencil with a squeegee,
the screen emulsion may be characterized as very thin (for
instance, 150 to 200 .mu.m), and a squeegee angle may be used such
that the ink is sheared to achieve conductive ink breakaway rather
than pumping the conductive ink through the screen apertures. Note
that the screen for fine line width printing such as described
herein may have the following characteristics in one specific
embodiment: a fine polyester thread for both warp and weave on the
order of 75 micrometers; a thread count between 250-320 threads per
inch; a mesh thickness of, for instance, 150 micrometers; an open
area between threads that is at least 1.5.times. to 2.0.times. the
conductive ink particle size; and to maintain dimensional stability
of the print, the screen snap-off is kept to a minimum due the
screen strain during squeegee passage.
[0047] In one or more implementations, circuit lines 301 of
tamper-respondent sensor 300 are electrically connected to define
one or more resistive networks. Further, the circuit lines may
include one or more resistive circuit lines by selecting the line
material, line width W.sub.1 and line length L.sub.1, to provide a
desired resistance per line. As one example, a "resistive circuit
line" as used herein may comprise a line with 1000 ohms resistance
or greater, end-to-end. In one specific example, a circuit line
width of 50 .mu.m, with a circuit line thickness of 10 .mu.m may be
used, with the line length L.sub.1 and material selected to achieve
the desired resistance. At the dimensions described, good
electrical conductors such as copper or silver may also be employed
and still form a resistive network due to the fine dimensions
noted. Alternatively, materials such as conductive ink or the
above-noted Omega-Ply.RTM. or Ticer.TM. may be used to define
resistive circuit lines.
[0048] In a further aspect, the flexible layer 302 itself may be
further reduced in thickness from a typical polyester layer by
selecting a crystalline polymer to form the flexible layer or
substrate. By way of example, the crystalline polymer could
comprise polyvinylidene difluoride (PVDF), or Kapton, or other
crystalline polymer material. Advantageously, use of a crystalline
polymer as the substrate film may reduce thickness of the flexible
layer 302 to, for instance, 2 mils thick from a more conventional
amorphous polyester layer of, for instance, 5-6 mils. A crystalline
polymer can be made much thinner, while still maintaining
structural integrity of the flexible substrate, which
advantageously allows for far more folding, and greater reliability
of the sensor after folding. Note that the radius of any fold or
curvature of the sensor is necessarily constrained by the thickness
of the layers comprising the sensor. Thus, by reducing the flexible
layer thickness to, for instance, 2 mils, then in a four
tamper-respondent layer stack, the stack thickness can be reduced
from, for instance, 20 mils in the case of a typical polyester
film, to 10 mils or less with the use of crystalline polymer
films.
[0049] One or more aspects of the above-discussed tamper-respondent
sensor of FIG. 3 may be employed in the various tamper-respondent
assemblies described herein. By way of example, FIGS. 4A-9 depict
an alternate approach to creating a secure volume which utilizes
one or more tamper-respondent sensors on an inner surface of an
enclosure. Further, FIGS. 10-13 depict various embodiments of a
multi-layer stack with an embedded tamper-respondent electronic
circuit structure comprising one or more tamper-respondent sensors
embedded within the discrete component layers of the stack. The
tamper-detect circuits of the one or more tamper-respondent sensors
of the tamper-respondent assemblies of FIGS. 10-13 may have one or
more similar attributes to those described above in connection with
FIG. 3, or described below with reference to FIGS. 4A-9.
[0050] As noted, FIGS. 4A & 4B depict one embodiment of an
electronic package, or tamper-proof electronic package 400,
comprising an electronic circuit 415, in accordance with one or
more aspects of the present invention.
[0051] Referring collectively to FIGS. 4A & 4B, electronic
circuit 415 includes a multilayer circuit board 410 which has a
tamper-respondent sensor 411 embedded therein that facilitates
defining, in part, a secure volume 401 associated with multilayer
circuit board 410 that extends into multilayer circuit board 410.
In particular, in the embodiment of FIGS. 4A & 4B, secure
volume 401 exists partially within multilayer circuit board 410,
and partially above multilayer circuit board 410. One or more
electronic components 402 are mounted to multilayer circuit board
410 within secure volume 401 and may comprise, for instance, one or
more encryption modules and/or decryption modules, and associated
components, with the tamper-proof electronic package comprising, in
one or more embodiments, a communications card of a computer
system.
[0052] Tamper-proof electronic package 400 further includes an
enclosure 420, such as a pedestal-type enclosure, mounted to
multilayer circuit board 410 within, for instance, a continuous
groove (or trench) 412 formed within an upper surface of multilayer
circuit board 410. In one or more embodiments, enclosure 420 may
comprise a thermally conductive material and operate as a heat sink
for facilitating cooling of the one or more electronic components
402 within the secure volume. A security mesh 421, such as the
above-described security meshes, may be associated with enclosure
420, for example, wrapping around the inner surface of enclosure
420 to facilitate defining, in combination with tamper-respondent
sensor 411 embedded within multilayer circuit board 410, secure
volume 401. In one or more implementations, security mesh 421
extends down into continuous groove 412 in multilayer circuit board
410 and may, for instance, even wrap partially or fully around the
lower edge of enclosure 420 within continuous groove 412 to provide
enhanced tamper detection where enclosure 420 couples to multilayer
circuit board 410. In one or more implementations, enclosure 420
may be securely affixed to multilayer circuit board 410 using, for
instance, a bonding material such as an epoxy or other
adhesive.
[0053] As depicted in FIG. 4B, one or more external circuit
connection vias 413 may be provided within multilayer circuit board
410 for electrically connecting to the one or more electronic
components 402 (FIG. 4A) within secure volume 401. These one or
more external circuit connection vias 413 may electrically connect
to one or more external signal lines or planes (not shown) embedded
within multilayer circuit board 410 and extending, for instance,
into a secure base region of (or below) secure volume 401, as
explained further below. Electrical connections to and from secure
volume 401 may be provided by coupling to such external signal
lines or planes within the multilayer circuit board 410.
[0054] As noted with reference to FIGS. 4A & 4B, secure volume
401 defined in association with multilayer circuit board 410 may be
sized to house electronic components 402 to be protected, and be
constructed to extend into multilayer circuit board 410. In one or
more implementations, multilayer circuit board 410 includes
electrical interconnect within the secure volume 401 defined in the
board, for instance, for electrically connecting the multiple
tamper-respondent layers of the embedded tamper-respondent sensor
411 to associated monitor circuitry also disposed within secure
volume 401.
[0055] Note that the embodiment depicted in FIGS. 4A & 4B is
presented by way of example only. In one or more other
implementations, the electronic circuit may comprise multiple
multilayer circuit boards, each with a tamper-respondent sensor
embedded within the multilayer circuit board with an appropriate
connector, located within a secure volume defined between two
adjacent multilayer circuit boards, interconnecting selected wiring
of the multilayer circuit boards. In such an implementation, the
overlying multilayer circuit board could be hollowed out to
accommodate, for instance, the connector and/or one or more other
electronic components between the multilayer circuit boards. In
addition, other configurations of enclosure 420, and/or other
approaches to coupling enclosure 420 and multilayer circuit board
410 may be employed.
[0056] By way of further example, FIG. 5A depicts a partial
cross-sectional elevational view of one embodiment of multilayer
circuit board 410 and enclosure 420. In this configuration, the
embedded tamper-respondent sensor includes multiple
tamper-respondent layers including, by way of example, at least one
tamper-respondent mat (or base) layer 500, and at least one
tamper-respondent frame 501. In the example depicted, two
tamper-respondent mat layers 500 and two tamper-respondent frame
501 are illustrated, by way of example only. The lower-most
tamper-respondent mat layer 500 may be a continuous sense or detect
layer extending completely below the secure volume being defined
within multilayer circuit board 410. One or both tamper-respondent
mat layers 500 below secure volume 401 may be partitioned into
multiple circuit zones, as discussed further below. Within each
tamper-respondent mat layer, or more particularly, within each
circuit zone of each tamper-respondent mat layer, multiple circuits
or conductive traces are provided in any desired configuration,
such as the configuration described above in connection with FIG.
3. Further, the conductive traces within the tamper-respondent
layers may be implemented as, for instance, a resistive layer which
is difficult to attach shunt circuits to, as explained further
below.
[0057] As illustrated, one or more external signal lines or planes
505 enter secure volume 401 between, in this embodiment, two
tamper-respondent mat layers 500, and then electrically connect
upwards into the secure volume 401 through one or more conductive
vias, arranged in any desired location and pattern. In the
configuration depicted, the one or more tamper-respondent frames
501 are disposed at least inside of the area defined by continuous
groove 412 accommodating the base of enclosure 420. Together with
security mesh 421 associated with enclosure 420, tamper-respondent
frames 501 define secure volume 401 where extending, in part, into
multilayer circuit board 410. With secure volume 401 defined, at
least in part, within multilayer circuit board 410, the external
signal line(s) 505 may be securely electrically connected to, for
instance, the one or more electronic components 402 (FIG. 4A)
mounted to multilayer circuit board 410 within secure volume 401.
In addition, the secure volume 401 may accommodate electrical
interconnection of the conductive traces of the multiple
tamper-respondent layers, for instance, via appropriate monitor
circuitry.
[0058] As illustrated by the schematic of FIG. 5B, added security
may be provided by extending tamper-respondent mat layers 500 (and
if desired, tamper-respondent frames 501) outward past continuous
groove 412 accommodating enclosure 420. In this manner, a line of
attack 510 may be made more difficult at the interface between
enclosure 420 and multilayer circuit board 410 since the attack 510
would need to clear tamper-respondent mat layers 500, the bottom
edge of security mesh 421 associated with enclosure 420, as well as
the tamper-respondent frames 501 of the embedded tamper-respondent
sensor.
[0059] FIG. 5C depicts a variation on the multilayer circuit board
410 of FIG. 5A. In this embodiment, the embedded tamper-respondent
sensor again includes multiple tamper-respondent mat layers 500 and
multiple tamper-respondent frames 501, such as described above.
Additionally, a tri-plate structure is provided comprising one or
more external signal lines or layers 505 sandwiched between an
upper ground plane 506 and a lower ground plane 507. In this
configuration, high-speed transfer of signals to and from the
secure volume, and in particular, to and from the one or more
electronic components resident within the secure volume, are
facilitated.
[0060] Note also that, in this implementation, once within the
secure volume is defined within multilayer circuit board 410,
conductive vias within the secure volume between layers of
multilayer circuit board 410 may be either aligned, or offset, as
desired, dependent upon the implementation. Alignment of conductive
vias may facilitate, for instance, providing a shortest connection
path, while offsetting conductive vias between layers may further
enhance security of the tamper-proof electronic package by making
an attack into the secure volume through or around one or more
tamper-respondent layers of the multiple tamper-respondent layers
more difficult.
[0061] Each tamper-respondent layer of the embedded
tamper-respondent sensor formed within the multilayer circuit board
of the electronic circuit or electronic package may include
multiple conductive traces or lines formed between, for instance,
respective sets of input and output contacts or vias at the trace
termination points. Any number of conductive traces or circuits may
be employed in defining a tamper-respondent layer or a
tamper-respondent circuit zone within a tamper-respondent layer.
For instance, 4, 6, 8, etc., conductive traces may be formed in
parallel (or otherwise) within a given tamper-respondent layer or
circuit zone between the respective sets of input and output
contacts to those conductive traces.
[0062] In one or more implementations, the multilayer circuit board
may be a multilayer wiring board or printed circuit board formed,
for instance, by building up the multiple layers of the board. FIG.
6 illustrates one embodiment for forming and patterning a
tamper-respondent layer within such a multilayer circuit board.
[0063] As illustrated in FIG. 6, in one or more implementations, a
tamper-respondent layer, such as a tamper-respondent mat layer or a
tamper-respondent frame disclosed herein, may be formed by
providing a material stack comprising, at least in part, a
structural layer 601, such as a pre-preg (or pre-impregnated)
material layer, a trace material layer 602 for use in defining the
desired trace patterns, and an overlying conductive material layer
603, to be patterned to define conductive contacts or vias
electrically connecting to the pattern of traces being formed
within the trace material layer 602, for instance, at trace
terminal points. In one or more implementations, the trace material
layer 602 may comprise nickel phosphorous (NiP), and the overlying
conductive layer 603 may comprise copper. Note that these materials
are identified by way of example only, and that other trace and/or
conductive materials may be used within the build-up layer or stack
600.
[0064] A first photoresist 604 is provided over stack 600, and
patterned with one or more openings 605, through which the
overlying conductive layer 603 may be etched. Depending on the
materials employed, and the etch processes used, a second etch
process may be desired to remove portions of trace material layer
602 to define the conductive traces of the subject
tamper-respondent layer. First photoresist 604 may then be removed,
and a second photoresist 604' is provided over the conductive layer
603 features to remain, such as the input and output contacts.
Exposed portions of conductive layer 603 are then etched, and the
second photoresist 604' may be removed, with any opening in the
layer being filled, for instance, with an adhesive (or pre-preg)
and a next build-up layer is provided, as shown. Note that in this
implementation, most of overlying conductive layer 603 is etched
away, with only the conductive contacts or vias remaining where
desired, for instance, at the terminal points of the traces formed
within the layer by the patterning of the trace material layer 602.
Note that any of a variety of materials may be employed to form the
conductive lines or traces within a tamper-respondent layer.
Nickel-phosphorous (NiP) is particularly advantageous as a material
since it is resistant to contact by solder, or use of a conductive
adhesive to bond to it, making it harder to bridge from one circuit
or trace to the next during an attempt to penetrate into the
protected secure volume of the electronic circuit. Other materials
which could be employed include OhmegaPly.RTM., offered by Ohmega
Technologies, Inc., of Culver City, Calif. (USA), or Ticer.TM.,
offered by Ticer Technologies of Chandler, Ariz. (USA).
[0065] By way of example, FIG. 7 is a partial plan view of one
embodiment of a tamper-respondent mat layer 500 of an embedded
tamper-respondent sensor within a multilayer circuit board, in
accordance with one or more aspects of the present invention. In
this implementation, tamper-respondent mat layer 500 is divided
into multiple tamper-respondent circuit zones 701, 702, 703, 704,
705, of varying sizes. Within each tamper-respondent circuit zone
701, 702, 703, 704, 705, conductive traces of the same or different
wiring patterns may be provided with, for instance, the larger
circuit zones 701, 703, 705, having a same number of traces and
similar resistance per trace, per zone. Note that other
configurations of tamper-respondent sense zones may be employed,
including, for instance, equal or standard-sized circuit zones
within a common tamper-respondent layer.
[0066] FIGS. 8A-8G depict, by way of example, one embodiment of
multiple tamper-respondent layers, and the electrical interconnect
associated with the tamper-respondent layers, such as for, for
instance, the embedded tamper-respondent sensor depicted in FIG.
5A.
[0067] As illustrated in FIG. 8A, blind contact vias 710, 711 are
provided, by way of example, at the edge or boundary of each
tamper-respondent circuit zone 701, 702, 703, 704, 705 within a
lowermost tamper-respondent mat layer 500. Contact vias 710, 711
facilitate electrical connection from the ends of the conductive
traces (not shown) of the depicted tamper-respondent layer upwards
into the secure volume for connection to appropriate monitor
circuitry in any desired configuration. Note with respect to FIG.
8A, that there are no penetrations through the lowermost
tamper-respondent mat layer 500. As explained further below, in one
or more implementations, electrical interconnect may be provided
above the lowermost tamper-respondent mat layer to shift the
overlying contact vias to, for instance, the centers of
tamper-respondent circuit zones 702, 704, for instance, to prevent
direct penetration of one tamper-respondent layer from passing
through other tamper-respondent layers. As noted, any desired
number and size of circuit zones of traces may be defined within a
tamper-respondent layer. In one or more implementations, a
tamper-respondent mat layer may include, for instance, 20, 30, 40,
or more, tamper-respondent circuit zones within the layer, each
with a same number of traces.
[0068] FIG. 8B is a partial enlarged depiction of tamper-respondent
mat layer 500 of FIG. 8A, showing a partial boundary between two
tamper-respondent circuit zones 701, 702, with input contacts or
vias 710 depicted. In this example, an 8-band trace pattern of
conductive traces or lines 800 is partially shown within circuit
zones 701, 702. As noted, the pattern of conductive traces 800 may
be provided in any desired configuration and include, for instance,
saw-tooth or sinusoidal line portions within the respective circuit
zones 701, 702. FIG. 8B depicts an example of the start of a
pattern of the conductive traces 800 where connected to input
contacts or vias 710. Configuring conductive traces 800 as
illustrated further enhances security by making it harder to reach
multiple vias to jump over or shut sections of circuitry within a
particular tamper-respondent layer of the embedded
tamper-respondent sensor. In one or more implementations the trace
fill pattern is dense. Further, line-to-line or trace-to-trace
spacing between the different circuit zones of a particular
tamper-respondent layer may be the same as that employed within a
particular tamper-respondent circuit zone.
[0069] FIG. 8C depicts an electrical interconnect layer over
tamper-respondent mat layer 500 of FIG. 8A, with wiring illustrated
to shift the conductive contacts to offset the vias to, by way of
example, the middle of tamper-respondent circuit zones 702, 704.
Additionally, this interconnect layer may comprise the external
signal lines and contacts for connecting to and from the secure
volume to external the secure volume, including, if desired, the
provision of one or more high-speed interconnect circuits
sandwiched between, for instance, respective ground planes, such as
noted above with reference to the exemplary embodiment of FIG. 5C.
As illustrated, conductive lines 811 may be provided in this layer
electrically connecting contacts 710, 711 of the respective
tamper-respondent circuit zones to offset vias 812, 813 disposed,
for instance, in alignment 810 over tamper-respondent circuit zones
702, 704. In addition, one or more external signal line contacts
815 may also be provided in this electrical interconnect layer for
facilitating electrical connection of the external signal lines
into the secure volume.
[0070] FIG. 8D depicts a second tamper-respondent mat layer 500,
which in this example, is disposed above tamper-respondent mat
layer 500 discussed above in connection with FIGS. 8A & 8B.
This second tamper-respondent mat layer 500 is similar to the first
except, in the depicted embodiment, the sizes of the
tamper-respondent circuit zones 721, 722, 723, 724, 725, are
different from the tamper-respondent circuit zones 701, 702, 703,
704, 705, of the tamper-respondent mat layer 500 of FIGS. 8A &
8B. Thus, the boundaries between the tamper-respondent circuit
zones between the different layers are offset. This advantageously
reduces the opportunity to penetrate both tamper-respondent mat
layers along a zone boundary or seam. Depending upon the
implementation, electrical contacts to the depicted circuit vias or
contacts in the tamper-respondent circuit zones depicted may extend
directly upwards into the secure volume. Alternatively, contact
vias may be further offset into, for instance, the center lines of
tamper-respondent circuit zones 722, 724, in a manner similar to
that described above in connection with FIG. 8C. As described
above, within each tamper-respondent circuit zone 721-725, a
pattern of conductive traces (not shown) is provided. In one or
more implementations, tamper-respondent mat layer 500 depicted in
FIG. 8D may again comprise any desired number of circuit zones,
such as 20, 30, 40, or more, circuit zones, each of which
electrically connects within the secure volume in any desired
monitor circuitry configuration. Note also that, in one or more
embodiments, contacts or vias from the signal layer(s) and/or the
lowermost tamper-respondent may layer, may extend through this
second tamper-respondent mat layer.
[0071] FIG. 8E depicts an exemplary embodiment of a
tamper-respondent frame 501 of a tamper-respondent sensor, in
accordance with one or more aspects of the present invention.
Tamper-respondent frame 501 resides over the tamper-respondent mat
layers 500 described above in connection with FIGS. 8A-8D, and is
in one or more embodiments, a picture frame-type layer which
completely encircles, and thus serves to define, the secure volume
401 (FIGS. 4A & 5A) within the multilayer circuit board. The
tamper-respondent frame illustrated may be a first
tamper-respondent frame 501, which provides protective sense wiring
or traces, either on the inside or the outside of the enclosure 420
(see FIGS. 4A & 5A), where coupled to the continuous groove or
trench within the multilayer circuit board.
[0072] FIG. 8F depicts an exemplary embodiment of conductive
contacts or vias 710, 711 for tamper-respondent frame 501 of FIG.
8E, with four trace lines being depicted, by way of example only.
As illustrated, the input contacts 710 and output contacts 711 at
the trace terminal points in a particular zone may be disposed in
close proximity with the trace lines 801 of tamper-respondent frame
501, and overlap or double back at the seam to minimize possibility
of a successful attack through tamper-respondent frame 501 at the
seam.
[0073] FIG. 8G depicts a second tamper-respondent frame 501, which
in one or more embodiments, overlies the first tamper-respondent
frame 501 of FIG. 8E (in the example of FIG. 5A), and which may be
identical to the first tamper-respondent frame, except rotated
180.degree. so that the wiring contacts 710, 711 are separated from
the layer below, as illustrated. As with the tamper-respondent mat
layers 500, tamper-respondent frames 501 may be divided into
distinct circuit zones to, for instance, further enhance security.
For instance, 2, 4, 6, or more, circuit zones may be defined within
a particular tamper-respondent frame 501, each with a plurality of
conductive traces defined between input contacts 710 and output
contacts 711 at the trace terminal points.
[0074] The trace lines or circuits within all of the
tamper-respondent layers, and in particular, the tamper-respondent
circuit zones, of the embedded tamper-respondent sensor are
electrically connected into monitor or compare circuitry 900
provided, for instance, within secure volume 401 of multilayer
circuit board 410, as illustrated in FIG. 9. Monitor circuitry 900
may include various bridge or compare circuits, and conventional
printed wiring board electrical interconnect inside the secure
volume 401, for instance, located within the secure volume defined
by the tamper-respondent frames 501 (FIG. 5A), and the
tamper-respondent mat layers.
[0075] Note that advantageously, different tamper-respondent
circuit zones on different tamper-respondent layers may be
electrically interconnected into, for instance, the same comparator
circuit or Wheatstone bridge of the monitor circuitry. Thus, any of
a large number of interconnect configurations may be possible. For
instance, if each tamper-respondent mat layer contains 30
tamper-respondent circuit zones, and each tamper-respondent frame
contains four tamper-respondent circuit zones, then, for instance,
the resultant sixty-eight tamper-respondent circuit zones may be
connected in any configuration within the secure volume to create
the desired arrangement of circuit networks within the secure
volume being monitored for changes in resistance or tampering. Note
in this regard, that the power supply or battery for the
tamper-respondent sensor may be located external to the secure
volume, with the sensor being configured to trip and destroy any
protected or critical data if the power supply or battery is
tampered with.
[0076] By way of further enhancement, FIGS. 10-13 depict various
further embodiments of a tamper-respondent assembly or tamper-proof
electronic package, in accordance with one or more aspects of the
present invention. In these configurations, rather than overlying
or surrounding the electronic component(s) or assembly to be
protected, the sensor array or circuitry of the tamper-respondent
electronic circuit structure is embedded directly within a 2.5D or
3-D multi-layer stack comprising one or more electronic components
or circuits to be protected. Note that as used herein, a "component
layer" of the multi-layer stack refers to, for instance, a die, an
integrated circuit chip, a wafer, an integrated circuit layer,
etc., comprising one or more electronic circuits. By way of
specific example, one or more electronic circuits to be protected
within the secure volume may comprise an encryption module and/or
decryption module with associated circuits, such as memory, cache,
etc.
[0077] In general, a tamper-respondent assembly in this embodiment
includes a multi-layer stack comprising multiple discrete component
layers stacked and electrically connected together via a plurality
of electrical contacts in between the component layers; and a
tamper-respondent electronic circuit structure embedded within the
multi-layer stack. The tamper-respondent electronic circuit
structure includes at least one tamper-respondent sensor embedded,
at least in part, within at least one component layer of the
multiple discrete component layers of the multi-layer stack. The
tamper-respondent electronic circuit structure defines a secure
volume within the multi-layer stack. As noted, in one or more
implementations, there may be two or more component layers (e.g.,
two or more die, chips, wafers, or other substrates with electronic
circuitry, etc.) in the multi-layer stack.
[0078] In one or more implementations, the multi-layer stack
includes a first component layer, at least one in-between component
layer, and a second component layer, stacked together. The at least
one in-between component layer is disposed in between the first
component layer and the second component layer in the multi-layer
stack, and the tamper-respondent electronic circuit structure is
associated with, for instance, embedded at least in part within,
the first component layer, the at least one in-between component
layer, and the second component layer, with the secure volume
being, at least in part, defined within the at least one in-between
component layer.
[0079] By way of example, the at least one tamper-respondent sensor
may include at least one lower tamper-detect circuit within the
first component layer, and at least one upper tamper-detect circuit
within the second component layer. Further, the at least one
tamper-respondent sensor may include at least one peripheral
tamper-detect circuit defined, at least in part, by a plurality of
through-substrate vias extending through the at least one
in-between component layer. The at least one upper tamper-detect
circuit, the at least one lower tamper-detect circuit, and the at
least one peripheral tamper-detect circuit electrically connect to
monitor circuitry of the tamper-respondent electronic circuit
structure, and facilitate defining the secure volume within the
multi-layer stack. The monitor circuitry itself may be disposed
within the secure volume defined within the multi-layer stack.
[0080] In one or more examples, the at least one peripheral
tamper-detect circuit may extend between the at least one upper
tamper-detect circuit and the at least one lower tamper-detect
circuit, and be disposed about the periphery of the at least one
in-between component layer. In one or more embodiments, the
multi-layer stack may further include or reside on a base component
layer, with the base component layer being (for example) a 2.5D
interposer. In one or more other implementations, the base
component layer may be a more typical chip substrate layer, such as
interconnect fan-out substrate to which a chip or a chip stack is
mounted. Still further, in one or more embodiments, the multi-layer
stack could mount directly to a circuit board, without an
intervening base component layer.
[0081] In one or more implementations, the multi-layer stack may
include multiple in-between component layers disposed between the
first component and the second component layer. Further, the at
least one tamper-respondent sensor may include at least one
peripheral tamper-detect circuit which includes, or is defined by,
respective pluralities of through-substrate vias, each plurality of
through-substrate vias extending through a respective component
layer of the multiple in-between component layers. At least some
through-substrate vias of the respective pluralities of
through-substrate vias are aligned, and are electrically
interconnected in the at least one peripheral tamper-detect circuit
by respective electrical contacts of the plurality of electrical
contacts disposed in between component layers of the multi-layer
stack. Further, a conventional under-fill material may be disposed
between adjacent component layers of the multiple discrete
component layers. The under-fill material may surround, at least in
part, electrical contacts of the plurality of electrical contacts
in between the component layers, including electrical contacts
forming part of the at least one peripheral tamper-detect
circuit.
[0082] In one or more implementations, the at least one
tamper-respondent sensor embedded, at least partially, within the
at least one component layer, may comprise multiple aligned or
stacked tamper-detect circuits within the one component layer of
the at least one component layer of the multi-layer stack. For
instance, multiple mat-type, tamper-detect circuits may be disposed
in a first, lower component layer and/or a second, upper component
layer of the multi-layer stack. As a specific example, one or more
mat-type, tamper-detect circuits may be disposed adjacent to each
main surface of the two opposing main surfaces of the component
layer, for instance, in a lower component layer or upper component
layer of the multi-layer stack facilitating defining the secure
volume therein. In one or more embodiments, the tamper-respondent
electronic circuit structure is fully embedded within the
multi-layer stack, and the secure volume resides fully within the
multi-layer stack.
[0083] An anti-tamper, anti-intrusion, tamper-respondent assembly
such as summarized above, with a multi-layer stack and an embedded
tamper-respondent electronic circuit structure, may be implemented
in various configurations, several examples of which are described
below with reference to FIGS. 10-13. In general, the
tamper-respondent assembly may include one or more of: input/output
electrical contacts or bumps to communicate with circuitry outside
the multi-layer stack, for instance, for facilitating
encrypting/decrypting of secure information within the multi-layer
stack; power and ground contacts or bumps to power the function(s)
of the tamper-respondent assembly; upper and/or lower sensor
components; peripheral tamper-detect circuitry comprising, for
instance, one or more layers of through-silicon vias, through-glass
vias, through-encapsulant vias, or other similar structure
(generally referred to herein as through-substrate vias), to
function as an edge-tamper-detect circuit; monitor or compare
circuitry to detect any attempt at intrusion into the
tamper-respondent assembly; an optional encryption/decryption
engine (or other electronic circuit to be protected); and/or other
processes as needed for the tamper-respondent assembly to function
for an intended purpose. Further, note that the tamper-respondent
assembly may include a variety of circuit configurations and
functions within the secure volume. For instance, one or more
integrated fiber optic circuits may be provided within the
tamper-respondent assembly for communicating with other components
or entities external to the assembly for faster and more secure
communications.
[0084] FIG. 10 depicts one embodiment of a tamper-respondent
assembly, generally denoted 1000, in accordance with one or more
aspects of the present invention. In this embodiment,
tamper-respondent assembly 1000 includes a multi-layer stack 1010
which includes, or resides on, by way of example, a base component
layer 1011 comprising (for instance) a 2.5D interposer, or
alternatively any typical chip substrtate (such as a substrate with
electrical interconnect fan-out). Base component layer 1011 may
couple to (for instance) a multilayer circuit board 1001, such as a
printed circuit board or motherboard. Note that in alternate
configurations, the multi-layer stack 1010 could couple directly to
multilayer circuit board 1001, without an intervening base
component layer, such as a substrate interposer. In the depicted
example, a thermally conductive cap 1020 resides over multi-layer
stack 1010 and is sealed to or in contact with the base component
layer 1011, again by way of example only. Additionally, a thermal
interface material 1021 may be provided between, for instance, an
upper surface of multi-layer stack 1010 and cap 1020. A heat sink
1025, such as an air-cooled heat sink, or a liquid-cooled heat
sink, may be coupled to cap 1020, or alternatively, may be coupled
to multi-layer stack 1010 directly in the absence of cap 1020.
[0085] A tamper-respondent electronic circuit structure 1030 is
embedded within multi-layer stack 1010, and includes at least one
tamper-respondent sensor (e.g., 1032, 1033, 1034) embedded, at
least in part, within at least one component layer 1012, 1013, 1015
of the multiple discrete component layers of multi-layer stack
1010, and includes monitor circuitry 1031 for monitoring the at
least one tamper-respondent sensor for a tamper event. Monitor
circuitry 1031 is configured and connected to monitor for a tamper
event similar to the monitor or compare circuitry described above
in connection with the tamper-proof electronic packages of FIGS.
1-9. Advantageously, monitor circuitry 1031 may be disposed within
one or more of the component layers 1012, 1013, 1015 in the
multi-layer stack 1010, and in particular, within the secure volume
1040 defined by the sensor array within the multi-layer stack
1010.
[0086] In one or more implementations, the at least one
tamper-respondent sensor includes at least one lower tamper-detect
circuit 1032, at least one upper tamper-detect circuit 1033, and at
least one peripheral tamper-detect circuit 1034. Advantageously,
these tamper-detect circuits are formed within the component layers
themselves using, for instance, conventional integrated circuit
processes, such as back-end-of-line (BEOL) processes and
conventional through-substrate via formation processes. Together,
the tamper-detect circuits are configured and electrically
connected to the monitor circuitry to define secure volume 1040 in
three dimensions, fully embedded within the multi-layer stack 1010,
and sized to accommodate any number of electronic devices,
components, modules, circuits, etc., to be protected within the
stack. As one example, the secure volume may be sized and
configured to accommodate an encryption and/or decryption
processor, as well as encryption and/or decryption keys.
[0087] In one or more implementations, sensor component layers
1012, 1013 may comprise similarly configured tamper-detect
circuits. By way of example, FIGS. 11A & 11B depict a partial
implementation of sensor component layer 1012. As noted, sensor
component layer 1013 may be similarly configured, at least in terms
of the tamper-detect circuits employed (in one example), however,
possibly inverted in orientation within multi-layer stack 1010 of
FIG. 10. Alternatively, those skilled in the art will note that
sensor component layer 1013 could be differently configured,
provided that the desired at least one upper tamper-detect circuit
is provided within that sensor component layer in order to
facilitate defining the sensor array comprising the secure volume
within the multi-layer stack.
[0088] Referring to FIG. 11A, sensor component layer 1012 may
comprise a substrate 1100 with, for instance, at least one lower
tamper-detect circuit 1032 formed in association with substrate
1100 and extending outward to a periphery 1101 substantially
aligned to the edge of the main opposing surfaces of the component
layer. Depending on the implementation, substrate 1100 may have or
be a substantially crystalline substrate material (e.g., bulk
silicon), whereas in other embodiments, substrate 1100 may be
formed on the basis of a silicon-on-insulator (SOI) architecture,
in which a buried insulating layer may be provided below a circuit
or interconnect layer. Other types of substrates 1100 may be used,
including, for instance, n-type or p-type doped substrates,
silicon-germanium substrates, or may include or be a
non-semiconductor material.
[0089] As illustrated in FIG. 11B, the at least one lower
tamper-detect circuit 1032 may include multiple mat-type,
tamper-detect circuits 1110 (or circuit layers) and one or more
frame-type, tamper-detect circuits 1111 (or circuit layers). By way
of example, the tamper-detect circuits of the at least one lower
tamper-detect circuit 1032 may be formed as front-end-of-line
(FEOL) layers/structures and/or back-end-of-line (BEOL)
layers/structures, depending on the desired implementation. For
instance, existing processes for forming integrated circuits may be
employed to form tamper-respondent sensors of the patterns
described herein and depicted, by way of example, in FIGS. 3 and/or
5A-8G. These tamper-respondent detect circuits may be embedded or
formed, for instance, above an active layer of substrate 1100
and/or at a back surface of substrate 1100, and may be electrically
connected, via one or more electrical contacts in between component
layers of the multi-layer stack to the monitor circuitry 1031 (FIG.
10) disposed, for instance, within the secure volume of the
tamper-respondent assembly. By way of example, BEOL
layers/structures may conventionally include a plurality of
interleaved BEOL dielectric layers and BEOL metallization layers.
Thus, forming the at least one lower tamper-detect circuit 1032 on
or within substrate 1100 may comprise employing conventional BEOL
processes to form the desired tamper-detect circuit patterns
stacked one over the other, for instance, in different metal levels
using conventional back-end-of-line (BEOL) processing
techniques.
[0090] By way of further explanation, the tamper-detect circuits
may comprise conductive lines, for instance, formed of a metal such
as copper or a copper alloy, spaced apart by a dielectric material,
and configured as a continuous protective or sense layer across or
parallel to either or both of the opposite main surfaces of
substrate 1100. In one or more other implementations, separate
zones may be formed within the individual tamper-detect circuits of
the at least one lower tamper-detect circuit 1032 in a manner
analogous to that described above in connection with FIGS. 8A-8G.
As noted, the multi-layer stack 1010 of FIG. 10 will include
input/output lines extending, in one or more embodiments, through
sensor component layer 1012, to electrical contacts, such as
conductive bumps, between and electrically connecting sensor
component layer 1012 to, for instance, 2.5D interposer 1011 (FIG.
10), and thus to external circuitry.
[0091] Additionally, power and ground planes (not shown) for the
multi-layer stack could be provided through sensor component layer
1012. These lines would extend through or around or in between the
mat-type, tamper-detect circuit layers 1110 (FIG. 11B) of the at
least one lower tamper-detect circuit 1032 depicted in FIGS. 11A
& 11B. Note that inclusion of one or more frame-type
tamper-detect circuits 1111 within or as part of the at least one
lower tamper-detect circuit 1032 facilitates extending the secure
volume of the multi-layer stack into sensor component layer 1012.
Advantageously, by extending the secure volume into sensor
component layer 1012, and by analogy, into sensor component layer
1013, then in the embodiment of FIG. 10, additional circuitry may
be protected in the secure volume, including for instance, the
below-discussed peripheral interconnect lines or stitching for the
at least one peripheral tamper-detect circuit 1034 (FIG. 10), which
may be disposed on the sensor component layers 1012, 1013.
[0092] FIGS. 12A & 12B depict in greater detail a sub-stack
1200 of multi-layer stack 1010 of FIG. 10. In FIG. 12A, sub-stack
1200 is shown to include multiple in-between component layers 1015,
each of which may include active circuitry, such as encrypt/decrypt
circuitry, memory circuitry, cache circuitry, etc., as well as
monitor circuitry 1031 of the tamper-respondent electronic circuit
structure embedded within the multi-layer stack. Note that the
three in-between component layer example of FIGS. 10 & 12A is
presented by way of example only. For instance, discussed below
with reference to FIG. 13 is an alternate example, wherein there is
a single in-between component layer.
[0093] Continuing with FIG. 12A, sub-stack 1200 is shown to include
the at least one peripheral tamper-detect circuit 1034 of the at
least one tamper-respondent sensor embedded, in part, within one or
more component layers 1015 of the multiple discrete component
layers of the multi-layer stack. In particular, in this example,
the at least one peripheral tamper-detect circuit 1034 includes
respective pluralities of through-substrate vias 1201 extending
through and disposed around the peripheries of respective component
layers 1015 of sub-stack 1200. As depicted, respective electrical
contacts 1202 are disposed in between aligned through-substrate
vias 1201 in adjacent component layers 1015 of sub-stack 1200, and
together with interconnect lines or stitching 1210 on upper and
lower sensor component layers 1012, 1013, one or more peripheral
tamper-detect circuits 1034 are formed extending, for example, in a
vertically-oriented, continuous sinusoidal manner about the
periphery of sub-stack 1200.
[0094] In one or more examples, the in-between component layers
1015 may comprise respective substrates that include a
semiconductor material, such as a crystalline material. For
instance, the substrates may include silicon. Other types of
semiconductor materials, such as silicon-germanium (SiGe),
germanium (Ge), gallium-arsenic (GaAs), or any other suitable
semiconductor materials, including subsequently developed
materials, may also be used as or in association with the
substrate. The initial thickness of the substrates may be, for
instance, about 500-800 .mu.m, and the substrates may be processed
to have a final thickness of, for example, about 50-100 .mu.m. Note
that the substrate thicknesses may vary depending upon component
layer and application, or the integrated circuits formed within,
for instance, the active region of the respective component layer.
Further, note that the initial and final thicknesses may vary
depending on the methodology used and the depth of the
through-substrate vias 1201 which are formed. By way of example,
each through-substrate via (or through-substrate via conductor) may
include, for instance, a conductive material such as copper or a
copper alloy. Other types of conductive materials, such as
aluminum, tungsten, gold, silver, tin, other metals, or alloys
thereof, may also be used to form the through-substrate vias 1201.
The diameter of the through-substrate vias may range from, for
instance, 10-25 .mu.m, and the depth of the through-substrate vias
may range, for instance, from about 20-100 .mu.m. Other diameters
and depths of through-substrate vias may also be useful. In one
specific embodiment, the size of the through-substrate via is about
25 .mu.m (diameter) by 50-60 .mu.m (depth).
[0095] Further, note that the plurality of electrical contacts 1202
electrically connecting aligned through-substrate vias 1201 of
adjacent in-between component layers 1015 may comprise micro-sized
electrical contacts, such as, micro-C4 bumps, such as micro-C4
solder bumps. By way of specific example, the micro-C4 bumps may be
about 25-30 .mu.m in diameter, by about 30 .mu.m high. Note in this
regard, that the plurality of through-substrate vias 1201 in each
respective component layer 1015 are disposed to form closely
spaced, vertical tamper-detect lines of the at least one peripheral
tamper-detect circuit 1034. In one or more implementations, the
through-substrate vias 1201 may be spaced, for instance, 20-30
.mu.m apart, such as about 25 .mu.m apart. Those skilled in the art
will understand that the spacing distance depends, in part, on the
integrated circuit process technology employed to form the
tamper-respondent sensor(s) of the tamper-respondent electronic
circuit structure in the three-dimensional configuration of FIGS.
10-13.
[0096] As illustrated in FIG. 12B, and the cross-sectional view of
FIG. 10, multiple continuous rows of through-substrate vias 1201
may be formed within the in-between component layers 1015 of the
multi-layer stack, with three rows from the edge of each component
layer inward being depicted, by way of example only. A single row,
or two rows, or any number of rows, could be formed, depending on
the tamper-detect application. Note also, that in this example, the
aligned through-substrate vias 1201 are electrically connected
in-series vertically by aligned interconnecting electrical contacts
1202 in between the component layers.
[0097] As noted, FIG. 12B is by way of example a cross-sectional
plan view of one embodiment of the sub-stack 1200 of FIG. 12A at
upper sensor component layer 1013 of multi-layer stack 1010. As
illustrated, in one or more embodiments, the plurality of
electrical contacts 1202 disposed over respective aligned columns
of through-substrate vias 1201 (FIG. 12A) extending through
in-between component layers 1015 are electrically connected via
respective electrical interconnect lines or stitching 1210. These
interconnect lines 1210 (or stitch connections) are shown to
alternate, with a similar but offset pattern of interconnect lines
being provided on lower sensor component 1012 (FIG. 12A) such that
the vertically-oriented, sinusoidal configuration of FIG. 12A is
obtained for the at least one peripheral tamper-detect circuit 1034
(FIG. 12A). Note that various conductive materials and line widths
may be employed to interconnect the adjacent electrical contacts
1202 in the patterns depicted in FIG. 12B. By way of example,
copper conductors could be employed at or near a surface of upper
sensor component layer 1013 using back-end-of-line (BEOL)
processing. The conductive lines could be, in one or more
implementations, 5-15 .mu.m wide, such as 10 .mu.m wide. Note that
the pattern depicted in FIG. 12B is continuous and facilitates
defining, in combination with the respective pluralities of
through-substrate vias 1201 (FIG. 12A) and in-between electrical
contacts 1202, the vertically-extending, peripheral tamper-detect
circuit(s) of the tamper-respondent sensor. Note also that the
particular wiring configuration being monitored by monitor
circuitry 1031 within the secure volume may vary from
implementation to implementation. In one implementation, the rows
of peripheral tamper-detect circuitry may be connected in a single
tamper-detect circuit, while in other configurations, separate
tamper-detect circuits may be connected to the monitor circuitry
within the secure volume, as desired. Further, note that the rows
of through-substrate vias could be connected in any desired
configuration of tamper-detect circuits, with the
vertically-oriented, sinusoidal configuration depicted being
provided as one example only. For instance, increased security may
be provided by electrically interconnecting the through-substrate
vias in a more random configuration.
[0098] By way of further example, FIG. 13 depicts an alternate
embodiment of a tamper-respondent assembly 1000' in connection with
one or more aspects of the present invention. In this embodiment, a
multi-layer stack 1300 is provided, which includes a lower
component layer 1310, an upper component layer 1320, and one or
more in-between component layer(s) 1015. The in-between component
layer 1015 may be configured and characterized, in one or more
implementations, as described above in connection with FIGS.
10-12B. In this implementation, the secure volume 1301 defined
within multi-layer stack 1300 extends, by way of example, into
upper and lower sensor component layers 1310, 1320, such that (for
instance) active layers of upper and lower sensor component layers
1310, 1320 may be included within the secure volume, thereby
increasing the amount of integrated circuitry or electronic
components provided within the stack, notwithstanding a reduced
number of component layers in the stack. This can be accomplished,
in one embodiment, by moving the lower and upper tamper-detect
circuits 1032, 1033 to, for instance, the outer-most surfaces of
the lower and upper component layers 1310, 1320, respectively. As
in the example described above, back-end-of-line (BEOL) processing
could be employed to define one or more mat-type, tamper-detect
circuits to protect the opposite main surfaces of the multi-layer
stack 1300. Further, in this configuration, through-substrate vias
1201' may be provided within the lower and upper sensor component
layers 1310, 1320 aligned with respective through-substrate vias
1201 about the periphery or circumference of in-between component
layer 1015 to form the one or more peripheral tamper-detect
circuits 1034' of the tamper-respondent sensor. Monitor circuitry
1031 of the tamper-respondent electronic circuit structure may be
disposed, for instance, in the active layer of any one or more of
the component layers in the multi-layer stack, with monitor
circuitry 1031 being illustrated in lower sensor component layer
1013, by way of example only. Dimensions and operation of the
tamper-respondent sensor, and more generally, the tamper-respondent
electronic circuit structure, would be similar to those described
above. Note in this regard, that the interconnect lines (or stitch
connections) 1210 may be formed near the opposite main surfaces of
the multi-layer stack 1300 below, in one or more implementations,
one or more mat-type, tamper-detect circuits (or circuit layers) of
the respective upper and lower tamper-detect circuits 1033,
1032.
[0099] The terminology used herein is for the purpose of describing
particular embodiments only and is not intended to be limiting of
the invention. As used herein, the singular forms "a", "an" and
"the" are intended to include the plural forms as well, unless the
context clearly indicates otherwise. It will be further understood
that the terms "comprise" (and any form of comprise, such as
"comprises" and "comprising"), "have" (and any form of have, such
as "has" and "having"), "include" (and any form of include, such as
"includes" and "including"), and "contain" (and any form contain,
such as "contains" and "containing") are open-ended linking verbs.
As a result, a method or device that "comprises", "has", "includes"
or "contains" one or more steps or elements possesses those one or
more steps or elements, but is not limited to possessing only those
one or more steps or elements. Likewise, a step of a method or an
element of a device that "comprises", "has", "includes" or
"contains" one or more features possesses those one or more
features, but is not limited to possessing only those one or more
features. Furthermore, a device or structure that is configured in
a certain way is configured in at least that way, but may also be
configured in ways that are not listed.
[0100] The corresponding structures, materials, acts, and
equivalents of all means or step plus function elements in the
claims below, if any, are intended to include any structure,
material, or act for performing the function in combination with
other claimed elements as specifically claimed. The description of
the present invention has been presented for purposes of
illustration and description, but is not intended to be exhaustive
or limited to the invention in the form disclosed. Many
modifications and variations will be apparent to those of ordinary
skill in the art without departing from the scope and spirit of the
invention. The embodiment was chosen and described in order to best
explain the principles of one or more aspects of the invention and
the practical application, and to enable others of ordinary skill
in the art to understand one or more aspects of the invention for
various embodiments with various modifications as are suited to the
particular use contemplated.
* * * * *