U.S. patent application number 14/264997 was filed with the patent office on 2015-10-29 for electroless deposition of continuous nickel layer using complexed ti3+ metal ions as reducing agents.
This patent application is currently assigned to Lam Research Corporation. The applicant listed for this patent is Lam Research Corporation. Invention is credited to Yezdi DORDI, Aldona JAGMINIENE, Aniruddha JOI, Eugenijus NORKUS, Ina STANKEVICIENE, Loreta TAMASAUSKAITE-TAMASIUNAITE.
Application Number | 20150307994 14/264997 |
Document ID | / |
Family ID | 54334199 |
Filed Date | 2015-10-29 |
United States Patent
Application |
20150307994 |
Kind Code |
A1 |
NORKUS; Eugenijus ; et
al. |
October 29, 2015 |
ELECTROLESS DEPOSITION OF CONTINUOUS NICKEL LAYER USING COMPLEXED
Ti3+ METAL IONS AS REDUCING AGENTS
Abstract
A solution for electroless deposition of nickel is provided. A
reducing agent of Ti.sup.3+ ion is provided to the solution.
Ni.sup.2+ ions are provided to the solution.
Inventors: |
NORKUS; Eugenijus; (Vilnius,
LT) ; TAMASAUSKAITE-TAMASIUNAITE; Loreta; (Vilnius,
LT) ; JOI; Aniruddha; (Fremont, CA) ;
JAGMINIENE; Aldona; (Vilnius, LT) ; STANKEVICIENE;
Ina; (Vilnius, LT) ; DORDI; Yezdi; (Palo Alto,
CA) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Lam Research Corporation |
Fremont |
CA |
US |
|
|
Assignee: |
Lam Research Corporation
Fremont
CA
|
Family ID: |
54334199 |
Appl. No.: |
14/264997 |
Filed: |
April 29, 2014 |
Current U.S.
Class: |
427/443.1 ;
106/1.22 |
Current CPC
Class: |
C23C 18/34 20130101 |
International
Class: |
C23C 18/34 20060101
C23C018/34 |
Claims
1. A solution for electroless deposition of nickel, comprising: a
reducing agent of Ti.sup.3+ ions; and Ni.sup.2+ ions.
2. The solution, as recited in claim 1, further comprising amine
ligands.
3. The solution, as recited in claim 2, further comprising at least
one of gluconate or tartrate ions.
4. The solution, as recited in claim 3, wherein the solution has a
pH between 5 and 5.5, inclusive.
5. The solution, as recited in claim 4, further comprising Cl.sup.-
ions.
6. The solution, as recited in claim 5, wherein a ratio of
Ti.sup.3+ to Ni.sup.2+ ion is between 100:1 to 2:1.
7. The method, as recited in claim 6, wherein the solution is
boron, phosphorus, hydrazine, and formaldehyde free.
8. A method for providing an electroless plating of a nickel
containing layer, comprising: providing a Ti.sup.3+ concentrated
stock solution; providing a Ni.sup.2+ concentrated stock solution;
combining a flow from the Ti.sup.3+ concentrated stock solution
with a flow from the Ni.sup.2+ concentrated stock solution and
water to provide a mixed electrolyte for electrolessly depositing
Ni; and exposing a substrate to the mixed electrolyte for
electrolessly depositing Ni.
9. The method, as recited in claim 8, wherein exposing the wafer to
the mixed electrolyte for electrolessly depositing Ni, comprises:
providing a solution temperature between 20.degree. to 25.degree.
C., inclusive; and providing a pH of between 5 and 5.5,
inclusive.
10. The method, as recited in claim 9, further comprising disposing
the mixed electrolyte solution.
11. The method, as recited in claim 10, wherein the nickel
containing layer is 99.9% pure nickel.
12. The method, as recited in claim 9, further comprising
reactivating the mixed electrolyte solution.
13. The method, as recited in claim 8, wherein the Ti.sup.3+
concentrated stock solution comprises a solution comprising
TiCl.sub.3.
14. The method, as recited in claim 13, wherein the Ni.sup.2+
concentrated stock solution comprises a solution of NiSO.sub.4 and
ammonium hydroxide and sodium gluconate or gluconic acid.
15. The method, as recited in claim 14, wherein the Ni.sup.2+
concentrated stock solution has a shelf life of over a month.
16. The method, as recited in claim 15, wherein the Ti.sup.3+
concentrated stock solution has a shelf life of over a month.
17. The method, as recited in claim 14, wherein the mixed
electrolyte solution is boron, phosphorus, hydrazine, and
formaldehyde free.
18. The method, as recited in claim 8, wherein the mixed
electrolyte solution is boron, phosphorus, hydrazine, and
formaldehyde free.
19. A method for providing an electroless plating of a nickel
layer, comprising: providing a solution for electroless deposition
of nickel, comprising: Ti.sup.3+ ions; and Ni.sup.2+ ions, wherein
a ratio of Ti.sup.3+ ions to Ni.sup.2+ ions is between 100:1 to
2:1; and exposing a substrate to the solution for electroless
deposition of nickel.
20. The method, as recited in claim 19, wherein the providing the
solution, provides the solution at a pH of between 5 and 5.5,
inclusive, and at a temperature between 20.degree. to 25.degree.
C., inclusive.
Description
BACKGROUND OF THE INVENTION
Field of the Invention
[0001] The invention relates to a method of forming semiconductor
devices on a semiconductor wafer. More specifically, the invention
relates to depositing nickel layers to form semiconductor
devices.
[0002] In forming semiconductor devices, thin layers of nickel may
be deposited. Such a deposition may be provided by electroless
plating.
SUMMARY OF THE INVENTION
[0003] To achieve the foregoing and in accordance with the purpose
of the present invention, a solution for electroless deposition of
nickel is provided. A reducing agent of Ti.sup.3+ ion is provided
to the solution. Ni.sup.2+ ions are provided to the solution.
[0004] In another manifestation of the invention, a method for
providing an electroless plating of a nickel containing layer is
provided. A Ti.sup.3+ concentrated stock solution is provided. A
Ni.sup.2+ concentrated stock solution is provided. A flow from the
Ti.sup.3+ concentrated stock solution is combined with a flow from
the Ni.sup.2+ concentrated stock solution and water to provide a
mixed electrolyte for electrolessly depositing Ni. A substrate is
exposed to the mixed electrolyte for electrolessly depositing
Ni.
[0005] In another manifestation of the invention, a method for
providing an electroless plating of a nickel layer is provided. A
solution for electroless deposition of nickel is provided,
comprising Ti.sup.3+ ions and Ni.sup.2+ ions, wherein a ratio of
Ti.sup.3+ ions to Ni.sup.2+ ions is between 100:1 to 2:1. A
substrate is exposed to the solution for electroless deposition of
nickel.
[0006] These and other features of the present invention will be
described in more details below in the detailed description of the
invention and in conjunction with the following figures.
BRIEF DESCRIPTION OF THE DRAWINGS
[0007] The present invention is illustrated by way of example, and
not by way of limitation, in the figures of the accompanying
drawings and in which like reference numerals refer to similar
elements and in which:
[0008] FIG. 1 is a flow chart of an embodiment of the
invention.
[0009] FIG. 2 is a schematic view of a system that may be used in
an embodiment of the invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0010] The present invention will now be described in detail with
reference to a few preferred embodiments thereof as illustrated in
the accompanying drawings. In the following description, numerous
specific details are set forth in order to provide a thorough
understanding of the present invention. It will be apparent,
however, to one skilled in the art, that the present invention may
be practiced without some or all of these specific details. In
other instances, well known process steps and/or structures have
not been described in detail in order to not unnecessarily obscure
the present invention.
[0011] In electroless deposition (ELD) on difficult to plate
substrates, activation of the substrate using Ni containing
solutions prior to deposition is important. This may be
accomplished by simply dipping the solution in a NiCl.sub.2 aqueous
solution or other soluble salts. Ni.sup.2+ ions adsorb on the
substrate creating an active surface which may or may not have a
uniform Ni surface coverage after reduction. This gives rise to
non-homogeneous nucleation which is undesirable in semiconductor
applications. Hence, ability to deposit a thin, continuous Ni layer
on substrates, prior to plating, is important. Ni can be deposited
by ELD. Electroless deposition of nickel is accomplished using
hydrazine or other hydrogen containing compounds as reducing
agents. In addition to the environmental concerns associated with
these hydrogen containing reducing agents, the oxidation reaction
of these species involves generation of H.sub.2 gas which is
incorporated in the deposit. This impacts the purity of the
deposited film. Additionally, the hydrazine-nickel electrolyte
requires operation at an elevated temperature and high pH. These
are undesirable for application in back end metallization as the
dielectric materials are prone to damage at high pH and
temperature.
[0012] In electroless plating bath containing Ti.sup.3+, the metal
to be deposited, Ni.sup.2+, is reduced from the solution while
Ti.sup.3+ is oxidized to higher, more stable oxidation states.
Ti.sup.3+ has significant benefits over hydrazine and other
hydrogen containing compounds in resolving the issues specified
earlier.
[0013] Replacing hydrazine with Ti.sup.3+ ion reducing agents
eliminates the toxicity and volatility that is inherent to
hydrazine and makes the plating bath more environmentally friendly.
Additionally, no gas evolution (i.e. H.sub.2 and N.sub.2) or side
reaction is observed at the electrode. This results in a smooth,
continuous, pure Ni film. The metal ion containing plating baths
can also be operated over a wide temperature and pH range.
[0014] The inventive metal ion reducing agents containing bath is
operable at room temperature and lower pH. This is not possible
with the hydrazine and other reducing agent containing electrolyte.
The extended window of operation makes this bath attractive for
application in semiconductor applications In addition, this
embodiment allows the formation of a very thin, continuous Ni film
on substrates that can be used as a catalyst layer for subsequent
ELD of different metals such as Cu, Co, etc. In addition, this
embodiment provides an environmentally friendly and `greener`
alternative to hydrazine based electroless Ni electrolytes which
are highly toxic and unstable.
[0015] Gas evolution (mainly hydrogen and/or nitrogen) which is a
byproduct of the hydrazine oxidation reaction is eliminated by the
titanium oxidation reaction. Deposition of a pure, continuous Ni
film is possible.
[0016] The cost and complexity associated with maintaining a high
temperature during plating can also be reduced due to near room
temperature operation of the metal ion reducing agents
electrolyte.
[0017] The table below describes a formulation of the Ti.sup.3+/Ni
electroless plating bath. The deposition was done on Cu substrates
without any activation. Deposition can be extended to non
conductive or poorly conducting substrates such as glass, and 1-2
nm Ru by following proper pre-clean protocols.
TABLE-US-00001 Species Concentration (M) NiSO.sub.4 0.025 NaOH
0.075 Sodium Gluconate 0.025 NH.sub.4OH 0.32 TiCl.sub.3 0.05
Ascorbic Acid 0.29 Temperature 20.degree.-25.degree. C. pH
5-5.5
[0018] The Ti.sup.3+ metal ion reducing agent containing bath, used
in an embodiment of the invention, is operable below room
temperature and with a low pH. This is not possible with the
hydrazine and other reducing agent containing electrolyte.
[0019] Formation of Ni electrodes for memory applications using
plasma etching is difficult. An embodiment of the invention enables
selective patterning of Ni electrodes in semiconductor
manufacturing without using plasma etching. The cost and complexity
associated with maintaining a high temperature during plating can
also be reduced due to near room temperature operation of the
Ti.sup.3+ metal ion reducing agent electrolyte.
[0020] FIG. 1 is a high level flow chart of an embodiment of the
invention. In this embodiment, a Ti.sup.3+ concentrated stock
solution is provided (step 104). A Ni.sup.2+ concentrated stock
solution is provided (step 108). A flow from the Ti.sup.3+
concentrated stock solution is combined with a flow from the
Ni.sup.2+ concentrated stock solution and water to provide a mixed
electrolyte solution of the Ti.sup.3+ concentrated stock solution
and the Ni.sup.2+ concentrated stock solution (step 112). A wafer
is exposed to the mixed electrolyte solution of the Ti.sup.3+
concentrated stock solution and the Ni.sup.2+ concentrated stock
solution (step 116). The mixed electrolyte solution is collected
and may be reactivated for future use or disposed (step 120).
[0021] In an example, a Ti.sup.3+ concentrated stock solution is
provided in a Ti.sup.3+ concentrated stock solution source (step
104). A Ni.sup.2+ concentrated stock solution is provided in a
Ni.sup.2+ concentrated stock solution source (step 108). FIG. 2 is
a schematic view of a system 200 that may be used in an embodiment
of the invention. The system comprises a Ti.sup.3+ concentrated
stock solution source 208 containing a Ti.sup.3+ concentrated stock
solution, a Ni.sup.2+ concentrated stock solution source 212
containing a Ni.sup.2+ concentrated stock solution, and a deionized
water (DI) source 216 containing DI. A flow 220 from the Ti.sup.3+
concentrated stock solution source 208 is combined with a flow 224
from the Ni.sup.2+ concentrated stock solution source 212 and a
flow 228 from the DI water source 216 to provide a mixed
electrolyte solution 232 of the Ti.sup.3+ concentrated stock
solution and the Ni.sup.2+ concentrated stock solution (step 112).
A wafer 236 is exposed to the mixed electrolyte solution 232 of the
Ti.sup.3+ concentrated stock solution and the Ni.sup.2+
concentrated stock solution (step 116). The mixed electrolyte
solution 232 is collected (step 120). A disposal system 240 may be
used to dispose the mixed electrolyte solution 232. An alternative
embodiment provides the collection of the mixed electrolyte
solution 232, which is reactivated.
[0022] In this example, the Ti.sup.3+ concentrated stock solution
comprises a TiCl.sub.3 solution with ascorbic acid. The Ni.sup.2+
concentrated stock solution comprises NiSO.sub.4, sodium gluconate,
and ammonium hydroxide.
[0023] In one embodiment, the flow 220 of the Ti.sup.3+
concentrated stock solution is combined with the flow 224 of the
Ni.sup.2+ concentrated stock solution and the flow 228 of DI water,
to form a mixed electrolyte solution of 0.05M TiCl.sub.3, 0.32M
NH.sub.4OH, 0.004M NiSO.sub.4, 0.075M NaOH, 0.29M ascorbic acid,
and 0.025M Sodium Gluconate. The mixed electrolyte solution has a
pH of between 5-5.5 and a temperature of about
20.degree.-25.degree. C.
[0024] The Ti.sup.3++ concentrated stock solution provides a stable
Ti.sup.3+ solution that has a shelf life of several months without
degrading. The high concentration allows the Ti.sup.3+ concentrated
stock solution to be stored in a smaller volume. In addition, the
Ni.sup.2+ concentrated stock solution provides a stable Ni.sup.2+
solution that has a shelf life of several months without degrading.
The high concentration allows the Ni.sup.2+ concentrated stock
solution to be stored in a smaller volume. The solutions are
combined and diluted just prior to exposing the wafer to the mixed
electrolyte solution, since the mixed electrolyte solution does not
have as long a shelf life as the concentrated stock solutions.
[0025] This embodiment of the invention provides a nickel
containing layer with a thickness of between 1 nm and 30 nm.
Preferably, the nickel containing layer is pure nickel. Because the
nickel containing layer is relatively thin, a dilute bath is
sufficient. In one embodiment, the wafer is exposed to a continuous
flow of the mixed electrolyte solution. In another embodiment, the
wafer is placed in a still bath of the mixed electrolyte solution
for a period of time. Since the concentration of nickel and
titanium is very low in the mixed electrolyte solution, in one
embodiment, the mixed electrolyte solution may be disposed (step
120) after being exposed to the wafer, since the low concentration
means that only a small amount of nickel and titanium is discarded.
In another embodiment, the mixed electrolyte solution is recycled
after being exposed to the wafer. The recycling may be accomplished
through reactivation of the mixed electrolyte solution.
[0026] Generally the solution mixture used for plating has
Ti.sup.3+ and Ni.sup.2+ ions at a Ti.sup.3+ to Ni.sup.2+ ion ratio
between 100:1 and 2:1. More preferably, the solution mixture used
for plating has Ti.sup.3+ and Ni.sup.2+ ions at a Ti.sup.3+ to
Ni.sup.2+ ion ratio between 50:1 and 3:1. Preferably, the solution
mixture has a ratio of amine ligands to Ti.sup.3+ is between 12:1
and 3:1. In addition, the solution mixture has Gluconate from
Sodium Gluconate or Gluconic acid. In addition, the Ni.sup.2+ ions
come from NiCl.sub.2 or NiSO.sub.4. The NH.sub.4.sup.+ ions, which
provide the amine ligands, come from NH.sub.4OH. Without being
limited by theory, it is believed that amine ligands help to
provide a lower temperature and lower pH nickel deposition.
[0027] Generally, a wafer or other plating surface is exposed to
the solution mixture at a temperature between 20.degree.-25.degree.
C. A plating surface is a surface on which the nickel containing
layer is selectively deposited. Such selective deposition may use a
mask to protect surfaces where deposition is not desired.
Preferably, the solution mixture has a pH from 5 to 5.5.
Preferably, the solution mixture provides Ti.sup.3+ with a
concentration between 0.001-0.500 M. More preferably, the solution
mixture provides Ti.sup.3+ with a concentration between 0.010 to
0.100 M. Most preferably, the solution mixture provides Ti.sup.3+
with a concentration between 0.020-0.060 M. The lower temperature
and lower pH provide a deposition with less damage to layers
provided by the semiconductor fabrication process. In addition,
such a process does not require any activation step that might
attack and damage the copper substrate. In addition, such a process
does not create a gas byproduct.
[0028] Preferably, the solution mixture is boron free. Preferably,
the solution mixture is phosphorus free. Preferably, the solution
mixture is hydrazine free. Preferably, the solution mixture is
formaldehyde free. It has been found that providing a solution
mixture that is boron, phosphorus, hydrazine, and formaldehyde free
allows for a more pure plating that does not have impurities
provided by using boron-containing reducing agents,
phosphorus-containing reducing agents, hydrazine, or formaldehyde.
In addition, avoiding using hydrazine provides a safer and more
environmentally friendlier process.
[0029] In other embodiments, the source of Ti.sup.3+ is
Ti.sub.2(SO.sub.4).sub.3 or other soluble salts of Ti.sup.3+.
Ascorbic acid can be displaced by tartaric acid, sodium salts of
the isomers of sodium citrate or citric acid. Sodium gluconate or
gluconic acid can be replaced with methoxyacetic acid or other
carboxylic acid ligands.
[0030] In one embodiment, the deposited nickel containing layer is
at least 99.9% pure nickel. More preferably, the deposited nickel
containing layer is pure nickel.
[0031] While this invention has been described in terms of several
preferred embodiments, there are alterations, permutations, and
various substitute equivalents, which fall within the scope of this
invention. It should also be noted that there are many alternative
ways of implementing the methods and apparatuses of the present
invention. It is therefore intended that the following appended
claims be interpreted as including all such alterations,
permutations, and various substitute equivalents as fall within the
true spirit and scope of the present invention.
* * * * *