U.S. patent application number 14/351865 was filed with the patent office on 2015-06-18 for method and system for performing components fault problem close loop analysis.
This patent application is currently assigned to Fifth Electronics Research Institute of Ministry of Industry and Information Technology. The applicant listed for this patent is Fifth Electronics Research Institute of Ministry of Industry and Information Technology. Invention is credited to Yuan Chen, Yunfei En, Xiaoqi He, Ping Lai, Yunhui Wang.
Application Number | 20150168271 14/351865 |
Document ID | / |
Family ID | 47969034 |
Filed Date | 2015-06-18 |
United States Patent
Application |
20150168271 |
Kind Code |
A1 |
He; Xiaoqi ; et al. |
June 18, 2015 |
METHOD AND SYSTEM FOR PERFORMING COMPONENTS FAULT PROBLEM CLOSE
LOOP ANALYSIS
Abstract
A method and system for performing component fault problem close
loop analysis are provided. The system establishes a component
failure physics fault tree, converts the failure physics fault tree
into a failure locating fault tree, establishes, a component fault
dictionary with failure mechanism cause corresponding to failure
characteristics and performs fault problem close loop analysis to
the component according to the fault tree and the fault dictionary.
By the method and system of the present disclosure, it is possible
to locate the component fault in the internal physical structure by
the failure locating fault tree, to give a clear failure path, to
quickly identify the failure mechanism corresponding to the
component failure mode by analysis of failure feature vector of the
fault dictionary, and to determine the mechanism factors and
influencing factors of relevant failure mechanism by the failure
physics fault tree. Thus, targeted failure control measures are
proposed to achieve fast and accurate locating and diagnosis to the
electronic component failure.
Inventors: |
He; Xiaoqi; (Guangzhou,
CN) ; Lai; Ping; (Guangzhou, CN) ; En;
Yunfei; (Guangzhou, CN) ; Chen; Yuan;
(Guangzhou, CN) ; Wang; Yunhui; (Guangzhou,
CN) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Fifth Electronics Research Institute of Ministry of Industry and
Information Technology |
Guangzhou |
|
CN |
|
|
Assignee: |
Fifth Electronics Research
Institute of Ministry of Industry and Information
Technology
|
Family ID: |
47969034 |
Appl. No.: |
14/351865 |
Filed: |
October 29, 2013 |
PCT Filed: |
October 29, 2013 |
PCT NO: |
PCT/CN2013/086159 |
371 Date: |
April 14, 2014 |
Current U.S.
Class: |
702/183 |
Current CPC
Class: |
G05B 23/0251 20130101;
G06F 11/0706 20130101; G05B 23/0272 20130101; G05B 23/0248
20130101; G06F 11/079 20130101; G06F 17/18 20130101; G01M 99/008
20130101 |
International
Class: |
G01M 99/00 20060101
G01M099/00 |
Foreign Application Data
Date |
Code |
Application Number |
Nov 30, 2012 |
CN |
201210511020.6 |
Claims
1. A method for performing component fault problem close loop
analysis, comprising: establishing, according to common
characteristics of component failure physics, a component failure
physics fault tree; converting a failure physics event into an
observable node event according to the failure physics fault tree,
and converting the failure physics fault tree into a failure
locating fault tree; establishing, according to the failure
locating fault tree, a component fault dictionary with failure
mechanism cause corresponding to failure characteristics; and
performing fault problem close loop analysis to the component
according to the failure physics fault tree and the component fault
dictionary.
2. The method of claim 1, wherein the common characteristics of
component failure physics comprise: fault object, failure mode,
failure site, failure mechanism, mechanism factor, and influencing
factor.
3. The method of claim 1, wherein the step of converting the
failure physics fault tree into a failure locating fault tree
further comprises: determining an observable node between a failure
mode and a failure mechanism, and representing an immeasurable
event of failure physics by an observable node event; selecting,
according to the structure and performance characteristics of the
component, feature parameters representing each node, the feature
parameters being observable parameters, the observable parameters
including: electrical properties, thermal properties, mechanical
properties, the apparent characteristic, gas confidentiality, and
environmental adaptability; representing a component failure event
by a node failure event, and representing the node failure event by
the observable parameters; and establishing a component failure
locating fault tree, the fault tree having the failure mode as top
event, the observable node as intermediate event, and the failure
mechanism as bottom event.
4. The method of claim 1, wherein the step of establishing,
according to the failure locating fault tree, a component fault
dictionary with failure mechanism cause corresponding to failure
characteristics further comprises: determining, according to the
failure positioning fault tree, a component failure mode set, the
set including multiple subsets of failure mode; determining,
according to the failure positioning fault tree, observable node of
the subset of failure mode in a failure mode; obtaining, according
to the failure positioning fault tree, observed parameters from the
observable node, and obtaining feature value of the observable node
in the failure mode according to the observed parameters;
determining, according to the feature value of the observable node,
feature vector of the component in all failure modes; determining,
according to the failure positioning fault tree, failure mechanism
cause of the component; and establishing, according to the failure
mechanism cause and the feature value of the observable node, a
component fault dictionary with failure mechanism cause
corresponding to failure characteristics.
5. The method of claim 1, wherein the step of performing fault
problem close loop analysis to the component according to the
failure physics fault tree and the component fault dictionary
further comprises: observing the component according to the node
parameters of the component fault dictionary, and obtaining feature
value of an observed vector; comparing the feature value of the
observed vector and the component fault dictionary, and determining
the failure mechanism cause of the component; looking for,
according to the failure mechanism cause, the mechanism factors and
influencing factors corresponding to the failure mechanism in the
failure physics fault tree, so as to propose measures against the
failure mechanism.
6. A system for performing component fault problem close loop
analysis, comprising: a failure physics fault tree establishing
module, configured to establish, according to common
characteristics of component failure physics, a component failure
physics fault tree; a failure locating fault tree establishing
module, configured to convert a failure physics event into an
observable node event according to the failure physics fault tree,
and to convert the failure physics fault tree into a failure
locating fault tree; a fault dictionary establishing module,
configured to establish, according to the failure locating fault
tree, a component fault dictionary with failure mechanism cause
corresponding to failure characteristics; and a fault problem close
loop analyzing module, configured to perform fault problem close
loop analysis to the component according to the failure physics
fault tree and the component fault dictionary.
7. The system of claim 6, wherein the common characteristics of
component failure physics comprise: fault object, failure mode,
failure site, failure mechanism, mechanism factor, and influencing
factor.
8. The system of claim 6, wherein the failure locating fault tree
establishing module further comprises: an event conversion unit,
configured to determine an observable node between a failure mode
and a failure mechanism, and to represent an immeasurable event of
failure physics by an observable node event; a feature parameters
selecting unit, configured to select, according to the structure
and performance characteristics of the component, feature
parameters representing each node, the feature parameters being
observable parameters, the observable parameters including:
electrical properties, thermal properties, mechanical properties,
the apparent characteristic, gas confidentiality, and environmental
adaptability; a parameter representing unit, configured to
represent a component failure event by a node failure event, and to
represent the node failure event by the observable parameters; and
a fault tree establishing unit, configured to establish a component
failure locating fault tree, the fault tree having the failure mode
as top event, the observable node as intermediate event, and the
failure mechanism as bottom event.
9. The system of claim 6, wherein the fault dictionary establishing
module further comprises: a failure mode set determining unit,
configured to determine, according to the failure positioning fault
tree, a component failure mode set, the set including multiple
subsets of failure mode; an observable node determining module,
configured to determine, according to the failure positioning fault
tree, observable node of the subset of failure mode in a failure
mode; a feature value obtaining unit, configured to obtain,
according to the failure positioning fault tree, observed
parameters from the observable node, and to obtain feature value of
the observable node in the failure mode according to the observed
parameters; a feature vector obtaining unit, configured to
determine, according to the feature value of the observable node,
feature vector of the component in all failure modes; a failure
mechanism determining unit, configured to determine, according to
the failure positioning fault tree, the failure mechanism cause of
the component; and a fault dictionary establishing unit, configured
to establish, according to the failure mechanism cause and the
feature value of the observable node, a component fault dictionary
with failure mechanism cause corresponding to failure
characteristics.
10. The system of claim 6, wherein the fault problem close loop
analyzing module further comprises: an observing unit, configured
to observe the component according to the node parameters of the
component fault dictionary, and to obtain feature value of an
observed vector; a comparing unit, configured to compare the
feature value of the observed vector and the component fault
dictionary, and to determine the failure mechanism cause of the
component; a look-up unit, configured to look for, according to the
failure mechanism cause, the mechanism factors and influencing
factors corresponding to the failure mechanism in the failure
physics fault tree, so as to propose measures against the failure
mechanism.
Description
FIELD OF THE INVENTION
[0001] The present disclosure relates generally to the field of
fault diagnosis, and more particularly to a method and system for
performing component fault problem close loop analysis.
BACKGROUND OF THE INVENTION
[0002] The aim of component fault problem close loop analysis is to
locate failure and determine the failure mechanism by FTA and
failure analysis, to propose improvements according to the cause of
failure, and thus to achieve the fault problem close loop, that is,
meeting the requirements of "accurate locating, clear mechanism,
and effective measures" to the fault. To achieve component fault
problem close loop, a variety of techniques are used. However, most
of the existing techniques of component failure analysis are those
of failure phenomenon observation, which lack of analysis
technology to the failure information, and the resulted fault
problem close loop conclusion are related to one's analysis
experience. Thus, the key to fault problem close loop analysis lies
in the following aspects: performing fault problem close loop
analysis by systematically applying the failure observations and
failure information, accurately giving the failure site and failure
path inside a component, clearly giving the mechanism cause leading
to the failure, and proposing effective measures for improving the
mechanism reasons.
[0003] Fault tree analysis is a logical reasoning method for
analysis of system reliability and security. By analyzing and
determining the logical relations from a variety of possible
factors that may lead to failure, the causes of system failure can
be identified using this method, which has been widely used in the
field of aerospace and electronics systems, etc. In order to meet
the quality problem close loop requirements, starting from the
beginning of this century, fault tree analysis is gradually applied
to electronic components to conduct fault problem close loop
analysis by learning the electronic fault tree analysis. The
current problem to be solved is how to establish the component
fault tree. In this regard, the fault dictionary method is an
effective way to achieve fast fault location in complex electronic
machines. The fault dictionary created should be able to reflect
the relationship between the cause of the fault of the measured
object and the measurable external parameters and characteristics.
The event information of fault tree is usually used to establish
this type of relationship.
[0004] Fault diagnosis and fault problem close loop analysis using
fault tree and fault dictionary method have the above advantages.
Thus, for a general electronic machine, the fault tree and fault
dictionary method are usually used to perform fault diagnosis and
locating. But for electronic components, the general fault
diagnosis and fault problem close loop analysis using fault tree
and fault dictionary method cannot accurately perform fault
locating and diagnosis due to the diversity of the failure modes
and the complexity of the failure mechanism of electronic
components.
SUMMARY OF THE INVENTION
[0005] To address the aforementioned deficiencies and inadequacies,
there is a need to provide a method and system for performing
component fault problem close loop analysis, which can perform fast
and accurate locating and diagnosis to electronic component
failure.
[0006] According to an aspect of the present invention, a method
for performing component fault problem close loop analysis includes
the steps of:
[0007] establishing, according to common characteristics of
component failure physics, a component failure physics fault
tree;
[0008] converting a failure physics event into an observable node
event according to the failure physics fault tree, and converting
the failure physics fault tree into a failure locating fault
tree;
[0009] establishing, according to the failure locating fault tree,
a component fault dictionary with failure mechanism cause
corresponding to failure characteristics;
performing fault problem close loop analysis to the component
according to the failure physics fault tree and the component fault
dictionary.
[0010] In one embodiment, the common characteristics of component
failure physics include: fault object, failure mode, failure site,
failure mechanism, mechanism factor, and influencing factor.
[0011] In one embodiment, the step of converting the failure
physics fault tree into a failure locating fault tree further
includes:
[0012] determining an observable node between a failure mode and a
failure mechanism, and representing an immeasurable event of
failure physics by an observable node event;
[0013] selecting, according to the structure and performance
characteristics of the component, feature parameters representing
each node, the feature parameters being observable parameters, the
observable parameters including: electrical properties, thermal
properties, mechanical properties, the apparent characteristic, gas
confidentiality, and environmental adaptability;
[0014] representing a component failure event by a node failure
event, and representing the node failure event by the observable
parameters; and
[0015] establishing a component failure locating fault tree, the
fault tree having the failure mode as top event, the observable
node as intermediate event, and the failure mechanism as bottom
event.
[0016] In one embodiment, the step of establishing, according to
the failure locating fault tree, a component fault dictionary with
failure mechanism cause corresponding to failure characteristics
further includes:
[0017] determining, according to the failure positioning fault
tree, a component failure mode set, the set including multiple
subsets of failure mode;
[0018] determining, according to the failure positioning fault
tree, observable node of the subset of failure mode in a failure
mode;
[0019] obtaining, according to the failure positioning fault tree,
observed parameters from the observable node, and obtaining feature
value of the observable node in the failure mode according to the
observed parameters;
[0020] determining, according to the feature value of the
observable node, feature vector of the component in all failure
modes;
[0021] determining, according to the failure positioning fault
tree, failure mechanism cause of the component; and establishing,
according to the failure mechanism cause and the feature value of
the observable node, a component fault dictionary with failure
mechanism cause corresponding to failure characteristics.
[0022] In one embodiment, the step of performing fault problem
close loop analysis to the component according to the failure
physics fault tree and the component fault dictionary further
includes:
[0023] observing the component according to the node parameters of
the component fault dictionary, and obtaining feature value of an
observed vector;
[0024] comparing the feature value of the observed vector and the
component fault dictionary, and determining the failure mechanism
cause of the component;
[0025] looking for, according to the failure mechanism cause, the
mechanism factors and influencing factors corresponding to the
failure mechanism in the failure physics fault tree, so as to
propose measures against the failure mechanism.
[0026] According to another aspect of the present invention, a
system for performing component fault problem close loop analysis
includes:
[0027] a failure physics fault tree establishing module, configured
to establish, according to common characteristics of component
failure physics, a component failure physics fault tree;
[0028] a failure locating fault tree establishing module,
configured to convert a failure physics event into an observable
node event according to the failure physics fault tree, and to
convert the failure physics fault tree into a failure locating
fault tree;
[0029] a fault dictionary establishing module, configured to
establish, according to the failure locating fault tree, a
component fault dictionary with failure mechanism cause
corresponding to failure characteristics;
[0030] a fault problem close loop analyzing module, configured to
perform fault problem close loop analysis to the component
according to the failure physics fault tree and the component fault
dictionary.
[0031] In one embodiment, the common characteristics of component
failure physics include: fault object, failure mode, failure site,
failure mechanism, mechanism factor, and influencing factor.
[0032] In one embodiment, the failure locating fault tree
establishing module further includes:
[0033] an event conversion unit, configured to determine an
observable node between a failure mode and a failure mechanism, and
to represent an immeasurable event of failure physics by an
observable node event;
[0034] a feature parameters selecting unit, configured to select,
according to the structure and performance characteristics of the
component, feature parameters representing each node, the feature
parameters being observable parameters, the observable parameters
including: electrical properties, thermal properties, mechanical
properties, the apparent characteristic, gas confidentiality, and
environmental adaptability;
[0035] a parameter representing unit, configured to represent a
component failure event by a node failure event, and to represent
the node failure event by the observable parameters; and
[0036] a fault tree establishing unit, configured to establish a
component failure locating fault tree, the fault tree having the
failure mode as top event, the observable node as intermediate
event, and the failure mechanism as bottom event.
[0037] In one embodiment, the fault dictionary establishing module
further includes:
[0038] a failure mode set determining unit, configured to
determine, according to the failure positioning fault tree, a
component failure mode set, the set including multiple subsets of
failure mode;
[0039] an observable node determining module, configured to
determine, according to the failure positioning fault tree,
observable node of the subset of failure mode in a failure
mode;
[0040] a feature value obtaining unit, configured to obtain,
according to the failure positioning fault tree, observed
parameters from the observable node, and to obtain feature value of
the observable node in the failure mode according to the observed
parameters;
[0041] a feature vector obtaining unit, configured to determine,
according to the feature value of the observable node, feature
vector of the component in all failure modes;
[0042] a failure mechanism determining unit, configured to
determine, according to the failure positioning fault tree, the
failure mechanism cause of the component;
[0043] a fault dictionary establishing unit, configured to
establish, according to the failure mechanism cause and the feature
value of the observable node, a component fault dictionary with
failure mechanism cause corresponding to failure
characteristics.
[0044] In one embodiment, the fault problem close loop analyzing
module further includes:
[0045] an observing unit, configured to observe the component
according to the node parameters of the component fault dictionary,
and to obtain feature value of an observed vector;
[0046] a comparing unit, configured to compare the feature value of
the observed vector and the component fault dictionary, and to
determine the failure mechanism cause of the component;
[0047] a look-up unit, configured to look for, according to the
failure mechanism cause, the mechanism factors and influencing
factors corresponding to the failure mechanism in the failure
physics fault tree, so as to propose measures against the failure
mechanism.
[0048] By the method and system for performing component fault
problem close loop analysis of the present disclosure, it is
possible to locate the component fault in the internal physical
structure by the failure locating fault tree, to give a clear
failure path, to quickly identify the failure mechanism
corresponding to the component failure mode by analysis of failure
feature vector of the fault dictionary, and to determine the
mechanism factors and influencing factors of relevant failure
mechanism by the failure physics fault tree. Thus, targeted failure
control measures are proposed to achieve fast and accurate locating
and diagnosis to the electronic component failure.
BRIEF DESCRIPTION OF THE DRAWINGS
[0049] FIG. 1 is a flowchart showing a method for performing
component fault problem close loop analysis according to an
embodiment of the disclosure.
[0050] FIG. 2 is a detailed flowchart showing a method for
performing component fault problem close loop analysis according to
an embodiment of the disclosure.
[0051] FIG. 3 is a structural schematic diagram showing a system
for performing component fault problem close loop analysis
according to an embodiment of the disclosure.
[0052] FIG. 4 is a detailed structural schematic diagram showing a
system for performing component fault problem close loop analysis
according to an embodiment of the disclosure.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0053] In the following description of embodiments, reference is
made to the accompanying drawings which form a part hereof, and in
which it is shown by way of illustration specific embodiments of
the disclosure that can be practiced. It is to be understood that
other embodiments can be used and structural changes can be made
without departing from the scope of the disclosed embodiments.
[0054] The basic principle of the method and system for performing
component fault problem close loop analysis of the present
disclosure lies in that, due to the similarity in structure and
process of each type of component, the component failure physics
fault tree can be established in accordance with the common
characteristics of failure physics of such type of component, and
the physical events of the failure physics fault tree can be
described by conversion of observable events. The observable events
can be represented by physical parameters such as electrical
properties, thermal properties, mechanical properties, the apparent
characteristic, and gas confidentiality, etc. Consequently, fault
dictionary with single failure mechanism cause corresponding to
failure characteristics is established. If the collected failure
feature vector is the same as a row vector of the fault dictionary,
then the mechanism cause of the failure mode is determined.
Further, improvements are proposed directed to the mechanism factor
and influencing factor, so as to perform fault problem close loop
analysis with "accurate locating, clear mechanism, and effective
measures".
[0055] As shown in FIGS. 1 and 2, a method for constructing
component fault tree based on failure physics includes the
following steps.
[0056] Step S100: establishing, according to common characteristics
of component failure physics, a component failure physics fault
tree.
[0057] Due to the similarity in structure and process of each type
of component, the component failure physics fault tree can be
established in accordance with the common characteristics of
failure physics of such component.
[0058] In one embodiment, the common characteristics of component
include fault object, failure mode, failure site, failure
mechanism, mechanism factor, and influencing factor. Such six
common characteristics can completely and comprehensively cover the
fault feature and failure cause of the components. After finishing
arranging the six common characteristics, a component failure
physics fault tree can be established respectively in six layers of
fault object, failure mode, failure site, failure mechanism,
mechanism factor, and influencing factor.
[0059] In this failure physics fault tree, according to the
relevance of the component failure physics, the relevance of events
between the upper and lower grades of fault object, failure mode,
failure site, and failure mechanism is an "OR" gate. The structural
function of the "OR" gate of the events between the upper and lower
grades is
.PHI. ( X .fwdarw. ) = 1 n x i , ##EQU00001##
wherein .PHI. is the status of the event of upper grade, and x is
the status of the event of lower grade; if the event xi of lower
grade happens, then the value will be 1, otherwise it will be 0.
The structural function describing the occurrence status .PHI. of
the upper event can be
.PHI. ( X .fwdarw. ) = 1 - 1 n ( 1 - x i ) , ##EQU00002##
and if the event happens, then the value will be 1, otherwise it
will be 0. This structural function means that the event of the
upper grade will happen if only an event of lower grade happens.
Meanwhile, the relevance of events between the upper and lower
grades of failure mechanism, mechanism factor and influencing
factor is an "OR" gate or "AND" gate, wherein the structural
function of the "AND" gate is
.PHI. ( X .fwdarw. ) = n 1 x i , ##EQU00003##
and if the event xi of lower grade happens, then the value will be
1, otherwise it will be 0. The structural function describing the
occurrence status .PHI. of the upper event is
.PHI. ( X .fwdarw. ) = 1 n x i , ##EQU00004##
and if the event happens, then the value will be 1, otherwise it
will be 0. This structural function means that the event of the
upper grade will happen only if all events of lower grade happen.
Physical events of each layer from the second to the sixth layer of
the fault tree can be decomposed into events of 1 to 3 grades,
forming component fault tree of n grades and of six physical
layers, and it is easy to understand that the minimum of n is
6.
[0060] Step S200: converting a failure physics event into an
observable node event according to the failure physics fault tree,
and converting the failure physics fault tree into a failure
locating fault tree.
[0061] In one embodiment, Step S200 further includes:
[0062] Step S220: determining an observable node between a failure
mode and a failure mechanism, and representing an immeasurable
event of failure physics by an observable node event;
[0063] Step S240: selecting, according to the structure and
performance characteristics of the component, feature parameters
representing each node, the feature parameters being observable
parameters, the observable parameters including: electrical
properties, thermal properties, mechanical properties, the apparent
characteristic, gas confidentiality, and environmental
adaptability;
[0064] Step S260: representing a component failure event by a node
failure event, and representing the node failure event by the
observable parameters; and
[0065] Step S280: establishing a component failure locating fault
tree, the fault tree having the failure mode as top event, the
observable node as intermediate event, and the failure mechanism as
bottom event.
[0066] Step S300: establishing, according to the failure locating
fault tree, a component fault dictionary with failure mechanism
cause corresponding to failure characteristics.
[0067] In one embodiment, Step S300 further includes:
[0068] Step S310: determining, according to the failure positioning
fault tree, a component failure mode set, the set including
multiple subsets of failure mode;
[0069] Step S320: determining, according to the failure positioning
fault tree, observable node of the subset of failure mode in a
failure mode;
[0070] Step S330: obtaining, according to the failure positioning
fault tree, observed parameters from the observable node, and
obtaining feature value of the observable node in the failure mode
according to the observed parameters;
[0071] Step S340: determining, according to the feature value of
the observable node, feature vector of the component in all failure
modes;
[0072] Step S350: determining, according to the failure positioning
fault tree, failure mechanism cause of the component; and
[0073] Step S360: establishing, according to the failure mechanism
cause and the feature value of the observable node, a component
fault dictionary with failure mechanism cause corresponding to
failure characteristics.
[0074] Step S400: performing fault problem close loop analysis to
the component according to the failure physics fault tree and the
component fault dictionary.
[0075] In one embodiment, Step S400 further includes:
[0076] Step S420: observing the component according to the node
parameters of the component fault dictionary, and obtaining feature
value of an observed vector;
[0077] Step S440: comparing the feature value of the observed
vector and the component fault dictionary, and determining the
failure mechanism cause of the component; and
[0078] Step S460: looking for, according to the failure mechanism
cause, the mechanism factors and influencing factors corresponding
to the failure mechanism in the failure physics fault tree, so as
to propose measures against the failure mechanism.
[0079] By the method for performing component fault problem close
loop analysis of the present disclosure, it is possible to locate
the component fault in the internal physical structure by the
failure locating fault tree, to give a clear failure path, to
quickly identify the failure mechanism corresponding to the
component failure mode by analysis of failure feature vector of the
fault dictionary, and to determine the mechanism factors and
influencing factors of relevant failure mechanism by the failure
physics fault tree. Thus, targeted failure control measures are
proposed to achieve fast and accurate locating and diagnosis to the
electronic component failure.
[0080] To better illustrate the method for performing component
fault problem close loop analysis of the disclosure, an example of
fault problem close loop analysis of "electrical parameter drift"
of hybrid integrated circuit will be further described to
illustrate the technical solution and the beneficial effect
brought.
[0081] Step 1, establishing a failure physics fault tree of hybrid
integrated circuit.
[0082] Establish a failure physics fault tree of a failure mode
according to the characteristics of "electrical parameter drift"
failure physics of hybrid integrated circuit.
[0083] Establish a failure physics fault tree of hybrid integrated
circuit in six layers of fault object, failure mode, failure site,
failure mechanism, mechanism factor, and influencing factor. In
this fault object, logical relation between events of the first,
second, third and fourth layers are "OR" gate, and logical relation
between events of the fourth, fifth and sixth layers are "AND"
gate. The failure physics fault tree has sixth layers of failure
physics and events of eight grades in total.
[0084] Step 2, converting the failure physics fault tree into a
failure locating fault tree.
[0085] Convert the failure physics fault tree established in Step 1
into a failure locating fault tree having failure mechanism as the
bottom event.
[0086] Firstly, regarding the established failure physics fault
tree of hybrid integrated circuit, between the failure object top
events and the failure mechanism events, converting the failure
physics events that cannot be measured directly including
immeasurable degradation of component welding/soldering, and
degradation of wire bonding point into one or more measurable and
observable node events including: thermal resistance of the
component is too high, wire bonding strength fails to reach the
standard, clear IMC on the interface, etc., which are the
intermediate events of the failure locating fault tree.
[0087] The node failure events are represented by feature
parameters including junction temperature Tj, bonding strength, the
interface IMC, moisture content, etc.
[0088] The converted failure locating fault tree of "electrical
parameter drift" of hybrid integrated circuit is a failure locating
fault tree containing 15 failure mechanism causes and 8 grades of
events.
[0089] Step 3, establishing a component fault dictionary of
electrical parameter drift of hybrid integrated circuit.
[0090] Establish a component fault dictionary with single failure
mechanism cause corresponding to failure characteristics according
to the failure locating fault tree established in Step 2.
[0091] Determine 23 observable nodes and their feature parameters
in the electrical parameter drift failure mode F.sub.1. The node
feature parameters representing that internal component failure
causes HIC parameters drift includes: component parameter drift,
component microcrack, ESD damage, and surface contamination and
leakage, etc. The node feature parameters representing that
assembly failure causes HIC parameter drift includes: component
welding/soldering thermal resistance, bonding interface IMC and
bonding point corrosion, etc. The node feature parameters
representing that insulation degradation causes HIC parameter drift
includes: insulation resistance between pin/housing, and insulation
resistance between joints, etc. The node failure feature parameter
is X.sub.1={X.sub.1,1, X.sub.1,2, . . . , X.sub.1,23}.
[0092] Based on the node failure feature parameter of
X.sub.1={X.sub.1,1, X.sub.1,2, . . . , X.sub.1,23}, the
corresponding feature value F.sub.1,j is obtained by the following
equation according to the range of X.sub.1, so as to obtain the
feature vector, F.sub.i,1={F.sub.1,1, F.sub.1,2, . . . ,
F.sub.1,23}. The range of sp refers to the qualified criteria of
relevant standards of hybrid integrated circuit and the components,
namely the observed range of each node.
F i , j = { 1 X i , j sp 0 X i , j .di-elect cons. sp
##EQU00005##
[0093] There are 15 failure mechanism causes for electrical
parameter drift of hybrid integrated circuit, and mechanism cause
set is M.sub.1,j={M.sub.1,1, M.sub.1,2, . . . , M.sub.i,15}.
According to the logical relationship between the node events of
the failure locating fault tree of electrical parameter drift,
corresponding relationships between each observed node failure
feature and failure mechanism cause are given in the following
list.
[0094] A fault code dictionary of the electrical parameter drift
mode of hybrid integrated circuit is established based on the
corresponding relationships between each observed node failure
feature and failure mechanism cause. See Table 1: Failure code
fault dictionary of HIC "electrical parameter drift".
TABLE-US-00001 FIG. 1 mechanism Failure Feature cause F.sub.1, 1
F.sub.1, 2 F.sub.1, 3 F.sub.1, 4 F.sub.1, 5 F.sub.1, 6 F.sub.1, 7
F.sub.1, 8 F.sub.1, 9 F.sub.1, 10 F.sub.1, 11 F.sub.1, 12 M.sub.1,
1 1 1 1 0 0 0 0 0 0 0 0 0 M.sub.1, 2 1 1 0 1 0 0 0 0 0 0 0 0
M.sub.1, 3 1 1 0 0 1 0 0 0 0 0 0 0 M.sub.1, 4 1 1 0 0 0 1 0 0 0 0 1
0 M.sub.1, 5 1 1 0 0 0 1 0 0 0 0 0 1 M.sub.1, 6 1 1 0 0 0 0 1 0 0 0
0 0 M.sub.1, 7 1 1 0 0 0 0 1 0 0 0 0 0 M.sub.1, 8 1 1 0 0 0 0 1 0 0
0 0 0 M.sub.1, 9 1 1 0 0 0 0 1 0 0 0 0 0 M.sub.1, 10 1 1 0 0 0 0 0
0 0 0 0 0 M.sub.1, 11 1 1 0 0 0 0 0 0 0 0 0 0 M.sub.1, 12 1 1 0 0 0
0 0 0 0 0 0 0 M.sub.1, 13 1 1 0 0 0 0 0 1 0 0 0 0 M.sub.1, 14 1 1 0
0 0 0 0 0 1 0 0 0 M.sub.1, 15 1 1 0 0 0 0 0 0 0 1 0 0 mechanism
Failure Feature cause F.sub.1, 13 F.sub.1, 14 F.sub.1, 15 F.sub.1,
16 F.sub.1, 17 F.sub.1, 18 F.sub.1, 19 F.sub.1, 20 F.sub.1, 21
F.sub.1, 22 F.sub.1, 23 M.sub.1, 1 0 0 0 0 0 0 0 0 0 0 0 M.sub.1, 2
0 0 0 0 0 0 0 0 0 0 0 M.sub.1, 3 0 0 0 0 0 0 0 0 0 0 0 M.sub.1, 4 0
0 0 0 0 0 0 0 0 0 0 M.sub.1, 5 0 0 0 0 0 0 0 0 0 0 0 M.sub.1, 6 1 0
0 0 0 0 0 0 0 0 0 M.sub.1, 7 0 1 0 0 0 0 0 0 0 0 0 M.sub.1, 8 0 0 1
0 0 0 0 0 0 1 0 M.sub.1, 9 0 0 0 1 0 0 0 0 0 1 0 M.sub.1, 10 0 0 0
0 1 0 0 0 0 0 1 M.sub.1, 11 0 0 0 0 0 1 0 0 0 0 1 M.sub.1, 12 0 0 0
0 0 1 0 0 0 0 1 M.sub.1, 13 0 0 0 0 0 0 1 0 0 0 0 M.sub.1, 14 0 0 0
0 0 0 0 1 0 0 0 M.sub.1, 15 0 0 0 0 0 0 0 0 1 0 0
[0095] Step 4, performing fault problem close loop analysis to the
electrical parameter drift according to the fault tree and fault
dictionary.
[0096] Perform fault problem close loop analysis to the electrical
parameter drift of hybrid integrated circuit according to the fault
dictionary established in Step 3 and the failure physics fault tree
established in Step 1.
[0097] According to the node parameters of the fault dictionary,
the hybrid integrated circuit is observed, and the feature value of
the measured observation vector F.sub.i,1={F.sub.1,1, F.sub.1,2, .
. . , F.sub.1,23} is compared with the fault dictionary. If the
feature value is the same to a row vector of the fault dictionary,
then it can be determined that a failure of corresponding single
mechanism (M.sub.i,j) cause has happened to the component. After
determining the failure mechanism cause, the mechanism factors and
influencing factors of corresponding failure mechanism (M.sub.i,j)
is looked up in the failure physics fault tree, so as to propose
control measures to the failure mechanism.
[0098] A fault problem close loop analysis is conducted by applying
the above fault tree of electrical parameter drift of hybrid
integrated circuit and the fault dictionary.
[0099] After a high temperature steady life test, the output
voltage of a linear power hybrid integrated circuit is out of
tolerance. Thus, the fault tree and fault dictionary method is used
to conduct fault problem close loop analysis to the circuit to find
the failure mechanism cause and determine the failure path, so as
to propose control measures.
[0100] Upon analysis and observation of the circuit, the feature
value of the measured observation vector F.sub.i,1={F.sub.1,1,
F.sub.1,2, . . . , F.sub.1,23} is compared with the fault
dictionary of electrical parameter drift failure of Table 1.
Considering that the vector result of the feature parameter of a
chip is the same to the vector of mechanism M.sub.1,1 of the first
row, the failure mechanism M.sub.1,1 is determined as: electrical
parameter drift caused by component degradation or overload usage
is the cause of out-of-tolerance output voltage. Based on the
failure physics fault tree, and considering the high test
temperature heat and the allowable junction temperature limit
T.sub.Mj of the chip, it is determined that the out-of-tolerance
output voltage is caused by the electrical parameter drift of the
chip due to overrun use of chip junction temperature. Therefore,
the failure control measures are to select a chip with higher level
of junction temperature limit T.sub.Mj, and to design and use it in
a thermal derating way.
[0101] As shown in FIG. 3, a system for performing component
failure fault problem close loop analysis includes:
[0102] a failure physics fault tree establishing module 100,
configured to establish, according to common characteristics of
component failure physics, a component failure physics fault
tree;
[0103] a failure locating fault tree establishing module 200,
configured to convert a failure physics event into an observable
node event according to the failure physics fault tree, and to
convert the failure physics fault tree into a failure locating
fault tree;
[0104] a fault dictionary establishing module 300, configured to
establish, according to the failure locating fault tree, a
component fault dictionary with failure mechanism cause
corresponding to failure characteristics; and
[0105] a failure fault problem close loop analyzing module 400,
configured to perform fault problem close loop analysis to the
component according to the failure physics fault tree and the
component fault dictionary.
[0106] By the system for performing component fault problem close
loop analysis of the present disclosure, it is possible to locate
the component fault in the internal physical structure by the
failure locating fault tree, to give a clear failure path, to
quickly identify the failure mechanism corresponding to the
component failure mode by analysis of failure feature vector of the
fault dictionary, and to determine the mechanism factors and
influencing factors of relevant failure mechanism by the failure
physics fault tree. Thus, targeted failure control measures are
proposed to achieve fast and accurate locating and diagnosis to the
electronic component failure.
[0107] In one embodiment, the common characteristics of component
failure physics include: fault object, failure mode, failure site,
failure mechanism, mechanism factor, and influencing factor.
[0108] Thus, using the six common characteristics, it is possible
to completely and comprehensively conduct fault diagnosis and
locating of the component. After finishing arranging the six common
characteristics, a component failure physics fault tree can be
established respectively in six layers of fault object, failure
mode, failure site, failure mechanism, mechanism factor, and
influencing factor.
[0109] As shown in FIG. 4, the failure locating fault tree
establishing module 200 further includes:
[0110] an event conversion unit 220, configured to determine an
observable node between a failure mode and a failure mechanism, and
to represent an immeasurable event of failure physics by an
observable node event;
[0111] a feature parameters selecting unit 240, configured to
select, according to the structure and performance characteristics
of the component, feature parameters representing each node, the
feature parameters being observable parameters, the observable
parameters including: electrical properties, thermal properties,
mechanical properties, the apparent characteristic, gas
confidentiality, and environmental adaptability;
[0112] a parameter representing unit 260, configured to represent a
component failure event by a node failure event, and to represent
the node failure event by the observable parameters; and a fault
tree establishing unit 280, configured to establish a component
failure locating fault tree, the fault tree having the failure mode
as top event, the observable node as intermediate event, and the
failure mechanism as bottom event.
[0113] As shown in FIG. 4, the fault dictionary establishing module
300 further includes:
[0114] a failure mode set determining unit 310, configured to
determine, according to the failure positioning fault tree, a
component failure mode set, the set including multiple subsets of
failure mode;
[0115] an observable node determining module 320, configured to
determine, according to the failure positioning fault tree,
observable node of the subset of failure mode in a failure
mode;
[0116] a feature value obtaining unit 330, configured to obtain,
according to the failure positioning fault tree, observed
parameters from the observable node, and to obtain feature value of
the observable node in the failure mode according to the observed
parameters;
[0117] a feature vector obtaining unit 340, configured to
determine, according to the feature value of the observable node,
feature vector of the component in all failure modes;
[0118] a failure mechanism determining unit 350, configured to
determine, according to the failure positioning fault tree, the
failure mechanism cause of the component; and
[0119] a fault dictionary establishing unit 360, configured to
establish, according to the failure mechanism cause and the feature
value of the observable node, a component fault dictionary with
failure mechanism cause corresponding to failure
characteristics.
[0120] As shown in FIG. 4, the fault problem close loop analyzing
module 400 further includes:
[0121] an observing unit 420, configured to observe the component
according to the node parameters of the component fault dictionary,
and to obtain feature value of an observed vector;
[0122] a comparing unit 440, configured to compare the feature
value of the observed vector and the component fault dictionary,
and to determine the failure mechanism cause of the component;
and
[0123] a look-up unit 460, configured to look for, according to the
failure mechanism cause, the mechanism factors and influencing
factors corresponding to the failure mechanism in the failure
physics fault tree, so as to propose measures against the failure
mechanism.
[0124] Based on the above, by the method and system for performing
component fault problem close loop analysis of the present
disclosure, it is possible to locate the component fault in the
internal physical structure by the failure locating fault tree, to
give a clear failure path, to quickly identify the failure
mechanism corresponding to the component failure mode by analysis
of failure feature vector of the fault dictionary, and to determine
the mechanism factors and influencing factors of relevant failure
mechanism by the failure physics fault tree. Thus, targeted failure
control measures can be proposed to achieve fast and accurate
locating and diagnosis to the electronic component failure, meeting
the requirements of "accurate locating, clear mechanism, and
effective measures".
[0125] The embodiments are chosen and described in order to explain
the principles of the disclosure and their practical application so
as to allow others skilled in the art to utilize the disclosure and
various embodiments and with various modifications as are suited to
the particular use contemplated. Alternative embodiments will
become apparent to those skilled in the art to which the present
disclosure pertains without departing from its spirit and scope.
Accordingly, the scope of the present disclosure is defined by the
appended claims rather than the foregoing description and the
exemplary embodiments described therein.
* * * * *