Fifth Electronics Research Institute of Ministry of Industry and Information Technology

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fifth Electronics Research Institute of Ministry of Industry and Information Technology.The latest application filed is for "on-chip tddb degradation monitoring and failure early warning circuit for soc".

Company Profile

12.15.16

Fifth Electronics Research Institute of Ministry of Industry and Information Technology - Guangdong N/A CN
Fifth Electronics Research Institute of Ministry of Industry and Information Technology - Guangzhou N/A CN
Fifth Electronics Research Institute of Ministry of Industry and Information Technology - CN CN
FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY - Guangzhou, Guangdong N/A CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and device of remaining life prediction for electromigration failure Grant 10,732,216 - Chen , et al.	2020-08-04
ESD failure early warning circuit for integrated circuit Grant 10,598,713 - Chen , et al.	2020-03-24
On-chip TDDB degradation monitoring and failure early warning circuit for SoC Grant 10,503,578 - Chen , et al. Dec	2019-12-10
System and method for health monitoring and early warning for electronic device Grant 10,458,823 - Chen , et al. Oc	2019-10-29
On-chip Tddb Degradation Monitoring And Failure Early Warning Circuit For Soc App 20190205196 - Chen; Yiqiang ; et al.	2019-07-04
System And Method For Health Monitoring And Early Warning For Electronic Device App 20190154475 - Chen; Yiqiang ; et al.	2019-05-23
Esd Failure Early Warning Circuit For Integrated Circuit App 20190079126 - Chen; Yiqiang ; et al.	2019-03-14
Method, Device And System For Health Monitoring Of System-on-chip App 20190064786 - Chen; Yiqiang ; et al.	2019-02-28
Method and system of close-loop analysis to electronic component fault problem Grant 10,191,480 - He , et al. Ja	2019-01-29
Method and Device of Remaining Life Prediction for Electromigration Failure App 20180188316 - Chen; Yiqiang ; et al.	2018-07-05
Method And System Of Close-loop Analysis To Electronic Component Fault Problem App 20180136640 - He; Xiaoqi ; et al.	2018-05-17
Method and device of remaining life prediction for electromigration failure Grant 9,952,275 - Chen , et al. April 24, 2	2018-04-24
Method and system for constructing component fault tree based on physics of failure Grant 9,430,315 - He , et al. August 30, 2	2016-08-30
Prognostic circuit of electromigration failure for integrated circuit Grant 9,329,228 - Chen , et al. May 3, 2	2016-05-03
Method And System For Constructing Component Fault Tree Based On Physics Of Failure App 20150193290 - He; Xiaoqi ; et al.	2015-07-09
Method And System For Performing Components Fault Problem Close Loop Analysis App 20150168271 - He; Xiaoqi ; et al.	2015-06-18
Method and Device of Remaining Life Prediction for Electromigration Failure App 20150051851 - Chen; Yiqiang ; et al.	2015-02-19
Prognostic Circuit of Electromigration Failure for Integrated Circuit App 20140232428 - Chen; Yiqiang ; et al.	2014-08-21

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