En; Yunfei

Patent Applications and Registrations

Patent applications and USPTO patent grants for En; Yunfei.The latest application filed is for "on-chip tddb degradation monitoring and failure early warning circuit for soc".

Company Profile

9.9.10

En; Yunfei - Guangzhou CN
En; Yunfei - Guangdong CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method, device and system for health monitoring of system-on-chip Grant 11,231,702 - Chen , et al. January 25, 2	2022-01-25
Method and device of remaining life prediction for electromigration failure Grant 10,732,216 - Chen , et al.	2020-08-04
ESD failure early warning circuit for integrated circuit Grant 10,598,713 - Chen , et al.	2020-03-24
On-chip TDDB degradation monitoring and failure early warning circuit for SoC Grant 10,503,578 - Chen , et al. Dec	2019-12-10
System and method for health monitoring and early warning for electronic device Grant 10,458,823 - Chen , et al. Oc	2019-10-29
On-chip Tddb Degradation Monitoring And Failure Early Warning Circuit For Soc App 20190205196 - Chen; Yiqiang ; et al.	2019-07-04
System And Method For Health Monitoring And Early Warning For Electronic Device App 20190154475 - Chen; Yiqiang ; et al.	2019-05-23
Esd Failure Early Warning Circuit For Integrated Circuit App 20190079126 - Chen; Yiqiang ; et al.	2019-03-14
Method, Device And System For Health Monitoring Of System-on-chip App 20190064786 - Chen; Yiqiang ; et al.	2019-02-28
Method and system of close-loop analysis to electronic component fault problem Grant 10,191,480 - He , et al. Ja	2019-01-29
Method and Device of Remaining Life Prediction for Electromigration Failure App 20180188316 - Chen; Yiqiang ; et al.	2018-07-05
Method And System Of Close-loop Analysis To Electronic Component Fault Problem App 20180136640 - He; Xiaoqi ; et al.	2018-05-17
Method and device of remaining life prediction for electromigration failure Grant 9,952,275 - Chen , et al. April 24, 2	2018-04-24
Method and system for constructing component fault tree based on physics of failure Grant 9,430,315 - He , et al. August 30, 2	2016-08-30
Prognostic circuit of electromigration failure for integrated circuit Grant 9,329,228 - Chen , et al. May 3, 2	2016-05-03
Method And System For Constructing Component Fault Tree Based On Physics Of Failure App 20150193290 - He; Xiaoqi ; et al.	2015-07-09
Method And System For Performing Components Fault Problem Close Loop Analysis App 20150168271 - He; Xiaoqi ; et al.	2015-06-18
Method and Device of Remaining Life Prediction for Electromigration Failure App 20150051851 - Chen; Yiqiang ; et al.	2015-02-19
Prognostic Circuit of Electromigration Failure for Integrated Circuit App 20140232428 - Chen; Yiqiang ; et al.	2014-08-21

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