U.S. patent application number 12/963919 was filed with the patent office on 2012-08-23 for semiconductor device and method of confining conductive bump material with solder mask patch.
This patent application is currently assigned to STATS ChipPAC, Ltd.. Invention is credited to Rajendra D. Pendse.
Application Number | 20120211882 12/963919 |
Document ID | / |
Family ID | 44081220 |
Filed Date | 2012-08-23 |
United States Patent
Application |
20120211882 |
Kind Code |
A9 |
Pendse; Rajendra D. |
August 23, 2012 |
Semiconductor Device and Method of Confining Conductive Bump
Material with Solder Mask Patch
Abstract
A semiconductor device has a semiconductor die having a
plurality of die bump pad and substrate having a plurality of
conductive trace with an interconnect site. A solder mask patch is
formed interstitially between the die bump pads or interconnect
sites. A conductive bump material is deposited on the interconnect
sites or die bump pads. The semiconductor die is mounted to the
substrate so that the conductive bump material is disposed between
the die bump pads and interconnect sites. The conductive bump
material is reflowed without a solder mask around the die bump pad
or interconnect site to form an interconnect structure between the
semiconductor die and substrate. The solder mask patch confines the
conductive bump material within the die bump pad or interconnect
site. The interconnect structure can include a fusible portion and
non-fusible portion. An encapsulant is deposited between the
semiconductor die and substrate.
Inventors: |
Pendse; Rajendra D.;
(Fremont, CA) |
Assignee: |
STATS ChipPAC, Ltd.
Singapore
SG
|
Prior
Publication: |
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Document Identifier |
Publication Date |
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US 20110133334 A1 |
June 9, 2011 |
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Family ID: |
44081220 |
Appl. No.: |
12/963919 |
Filed: |
December 9, 2010 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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12633531 |
Dec 8, 2009 |
8198186 |
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12963919 |
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61141782 |
Dec 31, 2008 |
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Current U.S.
Class: |
257/737 ;
257/E21.508; 257/E23.068; 438/124 |
Current CPC
Class: |
H01L 2224/16225
20130101; H01L 2224/27013 20130101; H05K 2201/09909 20130101; H01L
2224/10175 20130101; H01L 2224/13082 20130101; H01L 2224/131
20130101; H01L 2224/10145 20130101; H01L 2224/81193 20130101; H01L
2224/81815 20130101; H01L 2224/16235 20130101; H01L 2224/73265
20130101; H01L 21/76885 20130101; H01L 2224/13147 20130101; H01L
23/498 20130101; H01L 2924/1306 20130101; H01L 2224/81097 20130101;
H01L 2924/19043 20130101; H01L 2224/16013 20130101; H01L 2224/81208
20130101; H01L 23/49838 20130101; H01L 2924/0105 20130101; H01L
24/16 20130101; H01L 2224/81192 20130101; H01L 23/3171 20130101;
H01L 2224/73203 20130101; H05K 2201/10674 20130101; Y02P 70/50
20151101; H01L 2224/13111 20130101; H01L 23/3128 20130101; H01L
24/13 20130101; H01L 24/81 20130101; H01L 2924/01079 20130101; H01L
2924/1433 20130101; H01L 2924/181 20130101; H01L 24/97 20130101;
H01L 2224/13155 20130101; H01L 2224/48091 20130101; H01L 2224/48228
20130101; H01L 2924/01015 20130101; H01L 2224/1308 20130101; H05K
3/3452 20130101; H01L 2224/32145 20130101; H01L 2224/4823 20130101;
H01L 24/73 20130101; H01L 2924/01027 20130101; H01L 2224/81191
20130101; H01L 2924/01006 20130101; H01L 2924/014 20130101; H01L
2924/01047 20130101; H01L 2924/00013 20130101; Y02P 70/613
20151101; H01L 2224/48227 20130101; H01L 21/563 20130101; H01L
2224/97 20130101; H01L 2924/00014 20130101; H01L 2924/01029
20130101; H01L 2924/14 20130101; H05K 3/3436 20130101; H01L
2924/12042 20130101; H01L 24/48 20130101; H01L 2924/01078 20130101;
H01L 2924/12041 20130101; H01L 2224/16014 20130101; H01L 2924/19041
20130101; H01L 2224/13116 20130101; H01L 2924/30105 20130101; H01L
2924/19042 20130101; H01L 2224/13144 20130101; H01L 2924/01074
20130101; H01L 2924/01013 20130101; H01L 2224/16105 20130101; H01L
2924/01082 20130101; H01L 2924/01322 20130101; H01L 23/49816
20130101; H01L 2224/81194 20130101; H01L 2924/01049 20130101; H01L
2924/13091 20130101; H01L 2224/97 20130101; H01L 2224/81 20130101;
H01L 2224/48091 20130101; H01L 2924/00014 20130101; H01L 2224/97
20130101; H01L 2224/73265 20130101; H01L 2224/97 20130101; H01L
2224/73203 20130101; H01L 2224/73265 20130101; H01L 2224/32145
20130101; H01L 2224/48227 20130101; H01L 2224/13144 20130101; H01L
2924/00014 20130101; H01L 2224/13147 20130101; H01L 2924/00014
20130101; H01L 2224/13155 20130101; H01L 2924/00014 20130101; H01L
2224/13116 20130101; H01L 2924/00014 20130101; H01L 2224/13111
20130101; H01L 2924/01047 20130101; H01L 2224/13111 20130101; H01L
2924/01047 20130101; H01L 2924/01029 20130101; H01L 2224/13111
20130101; H01L 2924/01047 20130101; H01L 2924/01049 20130101; H01L
2224/13111 20130101; H01L 2924/01029 20130101; H01L 2224/13111
20130101; H01L 2924/01082 20130101; H01L 2224/13116 20130101; H01L
2924/0105 20130101; H01L 2224/131 20130101; H01L 2924/014 20130101;
H01L 2224/1308 20130101; H01L 2224/131 20130101; H01L 2924/014
20130101; H01L 2224/1308 20130101; H01L 2224/13111 20130101; H01L
2224/1308 20130101; H01L 2224/13111 20130101; H01L 2924/01047
20130101; H01L 2224/1308 20130101; H01L 2224/13111 20130101; H01L
2924/01082 20130101; H01L 2224/1308 20130101; H01L 2224/13111
20130101; H01L 2924/01029 20130101; H01L 2224/1308 20130101; H01L
2224/13111 20130101; H01L 2924/01047 20130101; H01L 2924/01029
20130101; H01L 2224/1308 20130101; H01L 2224/13111 20130101; H01L
2924/01047 20130101; H01L 2924/01049 20130101; H01L 2924/00013
20130101; H01L 2224/13099 20130101; H01L 2224/16225 20130101; H01L
2924/13091 20130101; H01L 2224/16225 20130101; H01L 2224/13144
20130101; H01L 2924/00 20130101; H01L 2224/16225 20130101; H01L
2224/13147 20130101; H01L 2924/00 20130101; H01L 2224/16225
20130101; H01L 2224/13111 20130101; H01L 2924/00 20130101; H01L
2224/16225 20130101; H01L 2224/13116 20130101; H01L 2924/00
20130101; H01L 2224/16225 20130101; H01L 2224/13155 20130101; H01L
2924/00 20130101; H01L 2224/73265 20130101; H01L 2224/32145
20130101; H01L 2224/48227 20130101; H01L 2924/00012 20130101; H01L
2924/1306 20130101; H01L 2924/00 20130101; H01L 2924/12042
20130101; H01L 2924/00 20130101; H01L 2224/97 20130101; H01L
2224/73265 20130101; H01L 2224/32145 20130101; H01L 2224/48227
20130101; H01L 2924/00 20130101; H01L 2924/181 20130101; H01L
2924/00012 20130101; H01L 2924/00014 20130101; H01L 2224/45099
20130101; H01L 2924/00014 20130101; H01L 2224/45015 20130101; H01L
2924/207 20130101 |
Class at
Publication: |
257/737 ;
438/124; 257/E21.508; 257/E23.068 |
International
Class: |
H01L 23/498 20060101
H01L023/498; H01L 21/60 20060101 H01L021/60 |
Claims
1. A method of making a semiconductor device, comprising: providing
a semiconductor die having a plurality of die bump pad; providing a
substrate having a plurality of conductive trace with an
interconnect site; forming a solder mask patch interstitially
between the die bump pads or interconnect sites; depositing a
conductive bump material on the interconnect sites or die bump
pads; mounting the semiconductor die to the substrate so that the
conductive bump material is disposed between the die bump pads and
interconnect sites; reflowing the conductive bump material without
a solder mask around the die bump pad or interconnect site to form
an interconnect structure between the semiconductor die and
substrate, wherein the solder mask patch confines the conductive
bump material within the die bump pad or interconnect site; and
depositing an encapsulant between the semiconductor die and
substrate.
2. The method of claim 1, wherein the solder mask patch includes
non-wettable material.
3. The method of claim 1, further including immersing the
conductive bump material in a flux solution to increase
wettability.
4. The method of claim 1, further including selecting a volume of
conductive bump material deposited between the die bump pads and
interconnect sites so that a surface tension maintains confinement
of the conductive bump material substantially within the footprint
of the die bump pads and interconnect sites.
5. The method of claim 1, wherein the interconnect structure covers
a top surface and side surface of the die bump pad or interconnect
site.
6. The method of claim 1, wherein the interconnect structure
includes a fusible portion and non-fusible portion.
7. A method of making a semiconductor device, comprising: providing
a first semiconductor structure having a plurality of first
interconnect sites; providing a second semiconductor structure
having a plurality of second interconnect sites; forming a solder
mask patch between the first interconnect sites or second
interconnect sites; depositing a conductive bump material between
the first and second interconnect sites; forming an interconnect
structure from the conductive bump material to bond the first and
second semiconductor structures, wherein the solder mask patch
confines the conductive bump material within the first interconnect
sites or second interconnect sites; and depositing an encapsulant
between the first and second semiconductor structures.
8. The method of claim 7, wherein the solder mask patch includes
non-wettable material.
9. The method of claim 7, further including immersing the
conductive bump material in a flux solution to increase
wettability.
10. The method of claim 7, further including selecting a volume of
conductive bump material deposited between the first and second
interconnect sites so that a surface tension maintains confinement
of the conductive bump material substantially within a footprint of
the first interconnect site or second interconnect site.
11. The method of claim 7, wherein the interconnect structure
covers a top surface and side surface of the first interconnect
site or second interconnect site.
12. The method of claim 7, wherein the interconnect structure
includes a fusible portion and non-fusible portion.
13. The method of claim 7, wherein the interconnect structure
includes a conductive pillar and bump formed over the conductive
pillar.
14. A method of making a semiconductor device, comprising:
providing a first semiconductor structure having a plurality of
first interconnect sites; providing a second semiconductor
structure having a plurality of second interconnect sites; forming
a solder mask patch between the first interconnect sites or second
interconnect sites; and forming an interconnect structure to bond
the first and second semiconductor structures, wherein the solder
mask patch confines the interconnect structure within the first
interconnect sites or second interconnect sites.
15. The method of claim 14, further including depositing an
encapsulant between the first and second semiconductor
structures.
16. The method of claim 14, wherein the solder mask patch includes
non-wettable material.
17. The method of claim 14, further including immersing the
conductive bump material in a flux solution to increase
wettability.
18. The method of claim 14, wherein the interconnect structure
covers a top surface and side surface of the first interconnect
site or second interconnect site.
19. The method of claim 14, wherein the interconnect structure
includes a fusible portion and non-fusible portion.
20. The method of claim 14, wherein the interconnect structure
includes a conductive pillar and bump formed over the conductive
pillar.
21. A semiconductor device, comprising: a first semiconductor
structure having a plurality of first interconnect sites; a second
semiconductor structure having a plurality of second interconnect
sites; a solder mask patch formed between the first interconnect
sites or second interconnect sites; an interconnect structure
bonding the first and second semiconductor structures, wherein the
solder mask patch confines the interconnect structure within the
first interconnect sites or second interconnect sites; and an
encapsulant deposited between the first and second semiconductor
structures.
22. The semiconductor device of claim 21, wherein the solder mask
patch includes non-wettable material.
23. The semiconductor device of claim 21, wherein the interconnect
structure covers a top surface and side surface of the first
interconnect site or second interconnect site.
24. The semiconductor device of claim 21, wherein the interconnect
structure includes a fusible portion and non-fusible portion.
25. The semiconductor device of claim 21, wherein the interconnect
structure includes a conductive pillar and bump formed over the
conductive pillar.
Description
CLAIM TO DOMESTIC PRIORITY
[0001] The present application is a continuation-in-part of U.S.
patent application Ser. No. 12/633,531, filed Dec. 8, 2009, and
claims priority to the foregoing parent application pursuant to 35
U.S.C. .sctn.120.
FIELD OF THE INVENTION
[0002] The present invention relates in general to semiconductor
devices and, more particularly, to a semiconductor device and
method of confining conductive bump material during reflow with
solder mask patch.
BACKGROUND OF THE INVENTION
[0003] Semiconductor devices are commonly found in modern
electronic products. Semiconductor devices vary in the number and
density of electrical components. Discrete semiconductor devices
generally contain one type of electrical component, e.g., light
emitting diode (LED), small signal transistor, resistor, capacitor,
inductor, and power metal oxide semiconductor field effect
transistor (MOSFET). Integrated semiconductor devices typically
contain hundreds to millions of electrical components. Examples of
integrated semiconductor devices include microcontrollers,
microprocessors, charged-coupled devices (CCDs), solar cells, and
digital micro-mirror devices (DMDs).
[0004] Semiconductor devices perform a wide range of functions such
as signal processing, high-speed calculations, transmitting and
receiving electromagnetic signals, controlling electronic devices,
transforming sunlight to electricity, and creating visual
projections for television displays. Semiconductor devices are
found in the fields of entertainment, communications, power
conversion, networks, computers, and consumer products.
Semiconductor devices are also found in military applications,
aviation, automotive, industrial controllers, and office
equipment.
[0005] Semiconductor devices exploit the electrical properties of
semiconductor materials. The atomic structure of semiconductor
material allows its electrical conductivity to be manipulated by
the application of an electric field or base current or through the
process of doping. Doping introduces impurities into the
semiconductor material to manipulate and control the conductivity
of the semiconductor device.
[0006] A semiconductor device contains active and passive
electrical structures. Active structures, including bipolar and
field effect transistors, control the flow of electrical current.
By varying levels of doping and application of an electric field or
base current, the transistor either promotes or restricts the flow
of electrical current. Passive structures, including resistors,
capacitors, and inductors, create a relationship between voltage
and current necessary to perform a variety of electrical functions.
The passive and active structures are electrically connected to
form circuits, which enable the semiconductor device to perform
high-speed calculations and other useful functions.
[0007] Semiconductor devices are generally manufactured using two
complex manufacturing processes, i.e., front-end manufacturing, and
back-end manufacturing, each involving potentially hundreds of
steps. Front-end manufacturing involves the formation of a
plurality of die on the surface of a semiconductor wafer. Each die
is typically identical and contains circuits formed by electrically
connecting active and passive components. Back-end manufacturing
involves singulating individual die from the finished wafer and
packaging the die to provide structural support and environmental
isolation.
[0008] One goal of semiconductor manufacturing is to produce
smaller semiconductor devices. Smaller devices typically consume
less power, have higher performance, and can be produced more
efficiently. In addition, smaller semiconductor devices have a
smaller footprint, which is desirable for smaller end products. A
smaller die size may be achieved by improvements in the front-end
process resulting in die with smaller, higher density active and
passive components. Back-end processes may result in semiconductor
device packages with a smaller footprint by improvements in
electrical interconnection and packaging materials.
[0009] FIGS. 1 and 2 illustrate a cross-sectional view and top view
of a portion of flipchip type semiconductor die 10 and
interconnects or bumps 12 metallurgically and electrically
connected between bump pads 18 as formed on semiconductor die 10
and trace lines 20 and 22 as formed on substrate 30. Trace line 22
is routed between traces lines 20 and bumps 12 on substrate 30.
Trace lines 20 and 22 are electrical signal conductors with
optional bump pads for mating to bumps 12-14. Solder mask 26
overlays trace lines 20 and 22. Solder mask or registration
openings (SRO) 28 are formed over substrate 30 to expose trace
lines 20 and 22. SRO 28 confines the conductive bump material on
the bump pads of trace lines 20 and 22 during reflow and prevents
the molten bump material from leaching onto the trace lines, which
can cause electrical shorts to adjacent structures. SRO 28 is made
larger than the trace line or bump pad. SRO 28 is typically
circular in shape and made as small as possible to reduce the pitch
of trace lines 20 and 22 and increase routing density.
[0010] In typical design rules, the minimum escape pitch of trace
line 30 is defined by P=(1.1D+W)/2+L, where D is bump base
diameter, W is trace line width, and L is the ligament separation
between SRO and adjacent structures. Using a solder registration
design rule of .+-.30 micrometers (.mu.m), D of 100 .mu.m, W of 20
.mu.m, and L of 30 .mu.m, the minimum escape pitch of trace lines
30-34 is (1.1*100+20)/2+30=95 .mu.m. SRO 28 around the bump pads
limits the escape pitch and routing density of the semiconductor
die.
SUMMARY OF THE INVENTION
[0011] A need exists to minimize escape pitch of trace lines for
higher routing density. Accordingly, in one embodiment, the present
invention is a method of making a semiconductor device comprising
the steps of providing a semiconductor die having a plurality of
die bump pad, providing a substrate having a plurality of
conductive trace with an interconnect site, forming a solder mask
patch interstitially between the die bump pads or interconnect
sites, depositing a conductive bump material on the interconnect
sites or die bump pads, mounting the semiconductor die to the
substrate so that the conductive bump material is disposed between
the die bump pads and interconnect sites, reflowing the conductive
bump material without a solder mask around the die bump pad or
interconnect site to form an interconnect structure between the
semiconductor die and substrate, and depositing an encapsulant
between the semiconductor die and substrate. The solder mask patch
confines the conductive bump material within the die bump pad or
interconnect site
[0012] In another embodiment, the present invention is a method of
making a semiconductor device comprising the steps of providing a
first semiconductor structure having a plurality of first
interconnect sites, providing a second semiconductor structure
having a plurality of second interconnect sites, forming a solder
mask patch between the first interconnect sites or second
interconnect sites, depositing a conductive bump material between
the first and second interconnect sites, forming an interconnect
structure from the conductive bump material to bond the first and
second semiconductor structures, and depositing an encapsulant
between the first and second semiconductor structures. The solder
mask patch confines the conductive bump material within the first
interconnect sites or second interconnect sites.
[0013] In another embodiment, the present invention is a method of
making a semiconductor device comprising the steps of providing a
first semiconductor structure having a plurality of first
interconnect sites, providing a second semiconductor structure
having a plurality of second interconnect sites, forming a solder
mask patch between the first interconnect sites or second
interconnect sites, and forming an interconnect structure to bond
the first and second semiconductor structures. The solder mask
patch confines the interconnect structure within the first
interconnect sites or second interconnect sites.
[0014] In another embodiment, the present invention is a
semiconductor device comprising a first semiconductor structure
having a plurality of first interconnect sites and second
semiconductor structure having a plurality of second interconnect
sites. A solder mask patch is formed between the first interconnect
sites or second interconnect sites. An interconnect structure
bonding the first and second semiconductor structures. The solder
mask patch confines the interconnect structure within the first
interconnect sites or second interconnect sites. An encapsulant is
deposited between the first and second semiconductor
structures.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015] FIG. 1 illustrates a cross-sectional view of conventional
interconnects formed between a semiconductor die and trace lines on
a substrate;
[0016] FIG. 2 illustrates a top view of conventional interconnects
formed over the trace lines through solder mask openings;
[0017] FIG. 3 illustrates a PCB with different types of packages
mounted to its surface;
[0018] FIGS. 4a-4d illustrate further detail of the representative
semiconductor packages mounted to the PCB;
[0019] FIG. 5 illustrates interconnects formed between a
semiconductor die and trace lines on a substrate;
[0020] FIGS. 6a-6c illustrate integrated bump pads along the trace
lines;
[0021] FIG. 7 illustrates a solder mask patch formed interstitially
within the array of integrated bump pads on the substrate;
[0022] FIG. 8 illustrates bumps formed on the integrated bump pads
with bump material confined by the solder mask patch during
reflow;
[0023] FIGS. 9a-9h illustrate various interconnect structures
formed over a semiconductor die for bonding to conductive traces on
a substrate;
[0024] FIGS. 10a-10g illustrate the semiconductor die and
interconnect structure bonded to the conductive traces;
[0025] FIGS. 11a-11d illustrate the semiconductor die with a
wedge-shaped interconnect structure bonded to the conductive
traces;
[0026] FIGS. 12a-12d illustrate another embodiment of the
semiconductor die and interconnect structure bonded to the
conductive traces;
[0027] FIGS. 13a-13c illustrate stepped bump and stud bump
interconnect structures bonded to the conductive traces;
[0028] FIGS. 14a-14b illustrate conductive traces with conductive
vias;
[0029] FIGS. 15a-15c illustrate mold underfill between the
semiconductor die and substrate;
[0030] FIG. 16 illustrates another mold underfill between the
semiconductor die and substrate;
[0031] FIG. 17 illustrates the semiconductor die and substrate
after mold underfill;
[0032] FIGS. 18a-18c illustrate various arrangements of the
conductive traces with open solder registration; and
[0033] FIG. 19 illustrates a POP with masking layer dam to restrain
the encapsulant during mold underfill.
DETAILED DESCRIPTION OF THE DRAWINGS
[0034] The present invention is described in one or more
embodiments in the following description with reference to the
figures, in which like numerals represent the same or similar
elements. While the invention is described in terms of the best
mode for achieving the invention's objectives, it will be
appreciated by those skilled in the art that it is intended to
cover alternatives, modifications, and equivalents as may be
included within the spirit and scope of the invention as defined by
the appended claims and their equivalents as supported by the
following disclosure and drawings.
[0035] Semiconductor devices are generally manufactured using two
complex manufacturing processes: front-end manufacturing and
back-end manufacturing. Front-end manufacturing involves the
formation of a plurality of die on the surface of a semiconductor
wafer. Each die on the wafer contains active and passive electrical
components, which are electrically connected to form functional
electrical circuits. Active electrical components, such as
transistors and diodes, have the ability to control the flow of
electrical current. Passive electrical components, such as
capacitors, inductors, resistors, and transformers, create a
relationship between voltage and current necessary to perform
electrical circuit functions.
[0036] Passive and active components are formed over the surface of
the semiconductor wafer by a series of process steps including
doping, deposition, photolithography, etching, and planarization.
Doping introduces impurities into the semiconductor material by
techniques such as ion implantation or thermal diffusion. The
doping process modifies the electrical conductivity of
semiconductor material in active devices, transforming the
semiconductor material into an insulator, conductor, or dynamically
changing the semiconductor material conductivity in response to an
electric field or base current. Transistors contain regions of
varying types and degrees of doping arranged as necessary to enable
the transistor to promote or restrict the flow of electrical
current upon the application of the electric field or base
current.
[0037] Active and passive components are formed by layers of
materials with different electrical properties. The layers can be
formed by a variety of deposition techniques determined in part by
the type of material being deposited. For example, thin film
deposition may involve chemical vapor deposition (CVD), physical
vapor deposition (PVD), electrolytic plating, and electroless
plating processes. Each layer is generally patterned to form
portions of active components, passive components, or electrical
connections between components.
[0038] The layers can be patterned using photolithography, which
involves the deposition of light sensitive material, e.g.,
photoresist, over the layer to be patterned. A pattern is
transferred from a photomask to the photoresist using light. The
portion of the photoresist pattern subjected to light is removed
using a solvent, exposing portions of the underlying layer to be
patterned. The remainder of the photoresist is removed, leaving
behind a patterned layer. Alternatively, some types of materials
are patterned by directly depositing the material into the areas or
voids formed by a previous deposition/etch process using techniques
such as electroless and electrolytic plating.
[0039] Depositing a thin film of material over an existing pattern
can exaggerate the underlying pattern and create a non-uniformly
flat surface. A uniformly flat surface is required to produce
smaller and more densely packed active and passive components.
Planarization can be used to remove material from the surface of
the wafer and produce a uniformly flat surface. Planarization
involves polishing the surface of the wafer with a polishing pad.
An abrasive material and corrosive chemical are added to the
surface of the wafer during polishing. The combined mechanical
action of the abrasive and corrosive action of the chemical removes
any irregular topography, resulting in a uniformly flat
surface.
[0040] Back-end manufacturing refers to cutting or singulating the
finished wafer into the individual die and then packaging the die
for structural support and environmental isolation. To singulate
the die, the wafer is scored and broken along non-functional
regions of the wafer called saw streets or scribes. The wafer is
singulated using a laser cutting tool or saw blade. After
singulation, the individual die are mounted to a package substrate
that includes pins or contact pads for interconnection with other
system components. Contact pads formed over the semiconductor die
are then connected to contact pads within the package. The
electrical connections can be made with solder bumps, stud bumps,
conductive paste, or wirebonds. An encapsulant or other molding
material is deposited over the package to provide physical support
and electrical isolation. The finished package is then inserted
into an electrical system and the functionality of the
semiconductor device is made available to the other system
components.
[0041] FIG. 3 illustrates electronic device 50 having a chip
carrier substrate or printed circuit board (PCB) 52 with a
plurality of semiconductor packages mounted on its surface.
Electronic device 50 may have one type of semiconductor package, or
multiple types of semiconductor packages, depending on the
application. The different types of semiconductor packages are
shown in FIG. 3 for purposes of illustration.
[0042] Electronic device 50 may be a stand-alone system that uses
the semiconductor packages to perform one or more electrical
functions. Alternatively, electronic device 50 may be a
subcomponent of a larger system. For example, electronic device 50
may be part of a cellular phone, personal digital assistant (PDA),
digital video camera (DVC), or other electronic communication
device. Alternatively, electronic device 50 can be a graphics card,
network interface card, or other signal processing card that can be
inserted into a computer. The semiconductor package can include
microprocessors, memories, application specific integrated circuits
(ASIC), logic circuits, analog circuits, RF circuits, discrete
devices, or other semiconductor die or electrical components. The
miniaturization and the weight reduction are essential for these
products to be accepted by the market. The distance between
semiconductor devices must be decreased to achieve higher
density.
[0043] In FIG. 3, PCB 52 provides a general substrate for
structural support and electrical interconnect of the semiconductor
packages mounted on the PCB. Conductive signal traces 54 are formed
over a surface or within layers of PCB 52 using evaporation,
electrolytic plating, electroless plating, screen printing, or
other suitable metal deposition process. Signal traces 54 provide
for electrical communication between each of the semiconductor
packages, mounted components, and other external system components.
Traces 54 also provide power and ground connections to each of the
semiconductor packages.
[0044] In some embodiments, a semiconductor device has two
packaging levels. First level packaging is a technique for
mechanically and electrically attaching the semiconductor die to an
intermediate carrier. Second level packaging involves mechanically
and electrically attaching the intermediate carrier to the PCB. In
other embodiments, a semiconductor device may only have the first
level packaging where the die is mechanically and electrically
mounted directly to the PCB.
[0045] For the purpose of illustration, several types of first
level packaging, including wire bond package 56 and flip chip 58,
are shown on PCB 52. Additionally, several types of second level
packaging, including ball grid array (BGA) 60, bump chip carrier
(BCC) 62, dual in-line package (DIP) 64, land grid array (LGA) 66,
multi-chip module (MCM) 68, quad flat non-leaded package (QFN) 70,
and quad flat package 72, are shown mounted on PCB 52. Depending
upon the system requirements, any combination of semiconductor
packages, configured with any combination of first and second level
packaging styles, as well as other electronic components, can be
connected to PCB 52. In some embodiments, electronic device 50
includes a single attached semiconductor package, while other
embodiments call for multiple interconnected packages. By combining
one or more semiconductor packages over a single substrate,
manufacturers can incorporate pre-made components into electronic
devices and systems. Because the semiconductor packages include
sophisticated functionality, electronic devices can be manufactured
using cheaper components and a streamlined manufacturing process.
The resulting devices are less likely to fail and less expensive to
manufacture resulting in a lower cost for consumers.
[0046] FIGS. 4a-4c show exemplary semiconductor packages. FIG. 4a
illustrates further detail of DIP 64 mounted on PCB 52.
Semiconductor die 74 includes an active region containing analog or
digital circuits implemented as active devices, passive devices,
conductive layers, and dielectric layers formed within the die and
are electrically interconnected according to the electrical design
of the die. For example, the circuit may include one or more
transistors, diodes, inductors, capacitors, resistors, and other
circuit elements formed within the active region of semiconductor
die 74. Contact pads 76 are one or more layers of conductive
material, such as aluminum (Al), copper (Cu), tin (Sn), nickel
(Ni), gold (Au), or silver (Ag), and are electrically connected to
the circuit elements formed within semiconductor die 74. During
assembly of DIP 64, semiconductor die 74 is mounted to an
intermediate carrier 78 using a gold-silicon eutectic layer or
adhesive material such as thermal epoxy or epoxy resin. The package
body includes an insulative packaging material such as polymer or
ceramic. Conductor leads 80 and wire bonds 82 provide electrical
interconnect between semiconductor die 74 and PCB 52. Encapsulant
84 is deposited over the package for environmental protection by
preventing moisture and particles from entering the package and
contaminating die 74 or wire bonds 82.
[0047] FIG. 4b illustrates further detail of BCC 62 mounted on PCB
52. Semiconductor die 88 is mounted over carrier 90 using an
underfill or epoxy-resin adhesive material 92. Wire bonds 94
provide first level packaging interconnect between contact pads 96
and 98. Molding compound or encapsulant 100 is deposited over
semiconductor die 88 and wire bonds 94 to provide physical support
and electrical isolation for the device. Contact pads 102 are
formed over a surface of PCB 52 using a suitable metal deposition
process such as electrolytic plating or electroless plating to
prevent oxidation. Contact pads 102 are electrically connected to
one or more conductive signal traces 54 in PCB 52. Bumps 104 are
formed between contact pads 98 of BCC 62 and contact pads 102 of
PCB 52.
[0048] In FIG. 4c, semiconductor die 58 is mounted face down to
intermediate carrier 106 with a flip chip style first level
packaging. Active region 108 of semiconductor die 58 contains
analog or digital circuits implemented as active devices, passive
devices, conductive layers, and dielectric layers formed according
to the electrical design of the die. For example, the circuit may
include one or more transistors, diodes, inductors, capacitors,
resistors, and other circuit elements within active region 108.
Semiconductor die 58 is electrically and mechanically connected to
carrier 106 through bumps 110.
[0049] BGA 60 is electrically and mechanically connected to PCB 52
with a BGA style second level packaging using bumps 112.
Semiconductor die 58 is electrically connected to conductive signal
traces 54 in PCB 52 through bumps 110, signal lines 114, and bumps
112. A molding compound or encapsulant 116 is deposited over
semiconductor die 58 and carrier 106 to provide physical support
and electrical isolation for the device. The flip chip
semiconductor device provides a short electrical conduction path
from the active devices on semiconductor die 58 to conduction
tracks on PCB 52 in order to reduce signal propagation distance,
lower capacitance, and improve overall circuit performance. In
another embodiment, the semiconductor die 58 can be mechanically
and electrically connected directly to PCB 52 using flip chip style
first level packaging without intermediate carrier 106.
[0050] In another embodiment, active area 108 of semiconductor die
58 is directly mounted facedown to PCB 115, i.e., without an
intermediate carrier, as shown in FIG. 4d. Bump pads 111 are formed
on active area 108 using an evaporation, electrolytic plating,
electroless plating, screen printing, or other suitable metal
deposition process. Bump pads 111 connect to the active and passive
circuits by conduction tracks in active area 108. Bump pads 111 can
be Al, Sn, Ni, Au, Ag, or Cu. An electrically conductive bump
material is deposited over bump pads 111 or conduction tracks 118
in PCB 115 using an evaporation, electrolytic plating, electroless
plating, ball drop, or screen printing process. The bump material
can be Al, Sn, Ni, Au, Ag, lead (Pb), Bi, Cu, solder, and
combinations thereof, with an optional flux material. For example,
the bump material can be eutectic Sn/Pb, high-lead solder, or
lead-free solder. The bump material is bonded between die bump pads
111 and conduction tracks 118 on PCB 115 using a suitable
attachment or bonding process. In one embodiment, the bump material
is reflowed by heating the material above its melting point to form
spherical balls or bumps 117. The flip chip semiconductor device
provides a short electrical conduction path from the active devices
on semiconductor die 58 to conduction tracks 118 on PCB 115 in
order to reduce signal propagation, lower capacitance, and achieve
overall better circuit performance.
[0051] FIG. 5 illustrates a cross-sectional view of a portion of
flipchip type semiconductor die 120 with bump pads 122. Trace lines
130 and 132 are formed on substrate 136. Trace lines 130 and 132
are straight electrical conductors with integrated bump pads 138,
as shown in FIG. 6a. The integrated bump pads 138 are co-linear
with trace lines 130 and 132. Alternatively, trace lines 130 and
132 can have round integrated bump pads 139, as shown in FIG. 6b,
or rectangular integrated bump pads 140, as shown in FIG. 6c. The
integrated bump pads are typically arranged in an array for maximum
interconnect density and capacity.
[0052] In FIG. 7, solder mask 142 is deposited over a portion of
trace lines 130 and 132. However, solder mask 142 is not formed
over integrated bump pads 138. Consequently, there is no SRO for
each bump pad on the substrate, as found in prior art FIG. 2. A
non-wettable solder mask patch 144 is formed on substrate 136
interstitially within the array of integrated bump pads 138, i.e.,
between adjacent bump pads. The solder mask patch can also be
formed on semiconductor die 10 interstitially within the array of
die bump pads 122. More generally, the solder mask patch is formed
in close proximity to the integrated bump pads in any arrangement
to prevent run-out to less wettable areas. FIG. 8 shows bumps 150
and 152 formed over integrated bump pads 138 and confined by solder
mask patch 144.
[0053] An electrically conductive bump material is deposited over
die bump pads 122 or integrated bump pads 138 using an evaporation,
electrolytic plating, electroless plating, ball drop, or screen
printing process. The bump material can be Al, Sn, Ni, Au, Ag, Pb,
Bi, Cu, solder, and combinations thereof, with an optional flux
solution. For example, the bump material can be eutectic Sn/Pb,
high-lead solder, or lead-free solder. The bump material is bonded
to integrated bump pads 138 using a suitable attachment or bonding
process. In one embodiment, the bump material is reflowed by
heating the material above its melting point to form spherical
balls or bumps 150 and 152. In some applications, bumps 150 and 152
are reflowed a second time to improve electrical contact to die
bump pads 122 and integrated bump pads 138. The bumps can also be
compression bonded to die bump pads 122 and integrated bump pads
138. Bumps 150 and 152 represent one type of interconnect structure
that can be formed over integrated bump pads 138. The interconnect
structure can also use stud bump, micro bump, or other electrical
interconnect.
[0054] In high routing density applications, it is desirable to
minimize escape pitch. In order to reduce the pitch between trace
lines 130 and 132, the bump material is reflowed without a solder
mask around integrated bump pads 138. The escape pitch between
trace lines 130 and 132 can be reduced by eliminating the solder
mask and associated SROs around the integrated bump pads for solder
reflow containment, i.e., by reflowing the bump material without a
solder mask. Solder mask 142 may be formed over a portion of trace
lines 130 and 132 and substrate 136 away from integrated bump pads
138, as shown in FIG. 7. However, solder mask 142 is not formed
over integrated bump pads 138. That is, the portion of trace lines
130 and 132 designed to mate with the bump material is devoid of an
SRO formed in solder mask 142.
[0055] In addition, solder mask patch 144 is formed on substrate
136 interstitially within the array of integrated bump pads 138.
Solder mask patch 144 is non-wettable material. Solder mask patch
144 can be the same material as solder mask 142 and applied during
the same processing step, or a different material during a
different processing step. Solder mask patch 144 can be formed by
selective oxidation, plating, or other treatment of the portion of
the trace or pad within the array of integrated bump pads 138.
Solder mask patch 144 confines solder flow to integrated bump pads
138 and prevents leaching of conductive bump material to adjacent
structures.
[0056] When the bump material is reflowed with solder mask patch
144 interstitially disposed within the array of integrated bump
pads 138, the wetting and surface tension causes the bump material
to be confined and retained within the space between die bump pads
122 and integrated bump pads 138 and portion of substrate 136
immediately adjacent to trace lines 130 and 132 and substantially
within the footprint of the integrated bump pads 138.
[0057] To achieve the desired confinement property, the bump
material can be immersed in a flux solution prior to placement on
die bump pad 122 or integrated bump pads 138 to selectively render
the region contacted by the bump material more wettable than the
surrounding area of trace lines 130 and 132. The molten bump
material remains confined substantially within the area defined by
the bump pads due to the wettable properties of the flux solution.
The bump material does not run-out to the less wettable areas. A
thin oxide layer or other insulating layer can be formed over areas
where bump material is not intended to make the area less wettable.
Hence, solder mask 142 is not needed around die bump pads 122 or
integrated bump pads 138.
[0058] Since no SRO is formed around die bump pads 122 or
integrated bump pads 138, trace lines 130 and 132 can be formed
with a finer pitch, i.e., trace lines 130 and 132 can be disposed
closer to adjacent structures without making contact and forming
electrical shorts. Assuming the same solder registration design
rule, the pitch between trace lines 130 and 132 is given as
P=(1.1D+W)/2, where D is the base diameter of bump 150-152 and W is
the width of the trace lines 130 and 132. In one embodiment, given
a bump diameter of 100 .mu.m and trace line width of 20 .mu.m, the
minimum escape pitch of trace lines 130 and 132 is 65 .mu.m. The
bump formation eliminates the need to account for the ligament
spacing of solder mask material between adjacent openings and
minimum resolvable SRO, as found in the prior art.
[0059] FIGS. 9-14 describe other embodiments with various
interconnect structures applicable to the interconnect structure
formed with the solder mask patch, as described in FIGS. 5-8. FIG.
9a shows a semiconductor wafer 220 with a base substrate material
222, such as silicon, germanium, gallium arsenide, indium
phosphide, or silicon carbide, for structural support. A plurality
of semiconductor die or components 224 is formed on wafer 220
separated by saw streets 226 as described above.
[0060] FIG. 9b shows a cross-sectional view of a portion of
semiconductor wafer 220. Each semiconductor die 224 has a back
surface 228 and active surface 230 containing analog or digital
circuits implemented as active devices, passive devices, conductive
layers, and dielectric layers formed within the die and
electrically interconnected according to the electrical design and
function of the die. For example, the circuit may include one or
more transistors, diodes, and other circuit elements formed within
active surface 230 to implement analog circuits or digital
circuits, such as digital signal processor (DSP), ASIC, memory, or
other signal processing circuit. Semiconductor die 224 may also
contain integrated passive devices (IPDs), such as inductors,
capacitors, and resistors, for RF signal processing. In one
embodiment, semiconductor die 224 is a flipchip type semiconductor
die.
[0061] An electrically conductive layer 232 is formed over active
surface 230 using PVD, CVD, electrolytic plating, electroless
plating process, or other suitable metal deposition process.
Conductive layer 232 can be one or more layers of Al, Cu, Sn, Ni,
Au, Ag, or other suitable electrically conductive material.
Conductive layer 232 operates as contact pads or die bumps pads
electrically connected to the circuits on active surface 230.
[0062] FIG. 9c shows a portion of semiconductor wafer 220 with an
interconnect structure formed over contact pads 232. An
electrically conductive bump material 234 is deposited over contact
pads 232 using an evaporation, electrolytic plating, electroless
plating, ball drop, or screen printing process. Bump material 234
can be Al, Sn, Ni, Au, Ag, Pb, Bi, Cu, solder, and combinations
thereof, with an optional flux solution. For example, bump material
234 can be eutectic Sn/Pb, high-lead solder, or lead-free solder.
Bump material 234 is generally compliant and undergoes plastic
deformation greater than about 25 .mu.m under a force equivalent to
a vertical load of about 200 grams. Bump material 234 is bonded to
contact pad 232 using a suitable attachment or bonding process. For
example, bump material 234 can be compression bonded to contact pad
232. Bump material 234 can also be reflowed by heating the material
above its melting point to form spherical balls or bumps 236, as
shown in FIG. 9d. In some applications, bumps 236 are reflowed a
second time to improve electrical connection to contact pad 232.
Bumps 236 represent one type of interconnect structure that can be
formed over contact pad 232. The interconnect structure can also
use stud bump, micro bump, or other electrical interconnect.
[0063] FIG. 9e shows another embodiment of the interconnect
structure formed over contact pads 232 as composite bumps 238
including a non-fusible or non-collapsible portion 240 and fusible
or collapsible portion 242. The fusible or collapsible and
non-fusible or non-collapsible attributes are defined for bumps 238
with respect to reflow conditions. The non-fusible portion 240 can
be Au, Cu, Ni, high-lead solder, or lead-tin alloy. The fusible
portion 242 can be Sn, lead-free alloy, Sn--Ag alloy, Sn--Ag--Cu
alloy, Sn--Ag-indium (In) alloy, eutectic solder, tin alloys with
Ag, Cu, or Pb, or other relatively low temperature melt solder. In
one embodiment, given a contact pad 232 width or diameter of 100
.mu.m, the non-fusible portion 240 is about 45 .mu.m in height and
fusible portion 242 is about 35 .mu.m in height.
[0064] FIG. 9f shows another embodiment of the interconnect
structure formed over contact pads 232 as bump 244 over conductive
pillar 246. Bump 244 is fusible or collapsible and conductive
pillar 246 is non-fusible or non-collapsible. The fusible or
collapsible and non-fusible or non-collapsible attributes are
defined with respect to reflow conditions. Bump 244 can be Sn,
lead-free alloy, Sn--Ag alloy, Sn--Ag--Cu alloy, Sn--Ag--In alloy,
eutectic solder, tin alloys with Ag, Cu, or Pb, or other relatively
low temperature melt solder. Conductive pillar 246 can be Au, Cu,
Ni, high-lead solder, or lead-tin alloy. In one embodiment,
conductive pillar 246 is a Cu pillar and bump 244 is a solder cap.
Given a contact pad 232 width or diameter of 100 .mu.m, conductive
pillar 246 is about 45 .mu.m in height and bump 244 is about 35
.mu.m in height.
[0065] FIG. 9g shows another embodiment of the interconnect
structure formed over contact pads 232 as bump material 248 with
asperities 250. Bump material 248 is soft and deformable under
reflow conditions with a low yield strength and high elongation to
failure, similar to bump material 234. Asperities 250 are formed
with a plated surface finish and are shown exaggerated in the
figures for purposes of illustration. The scale of asperities 250
is generally in the order about 1-25 .mu.m. The asperities can also
be formed on bump 236, composite bump 238, and bump 244.
[0066] In FIG. 9h, semiconductor wafer 220 is singulated through
saw street 226 using a saw blade or laser cutting tool 252 into
individual semiconductor die 224.
[0067] FIG. 10a shows a substrate or PCB 254 with conductive trace
256. Substrate 254 can be a single-sided FR5 laminate or 2-sided
BT-resin laminate. Semiconductor die 224 is positioned so that bump
material 234 is aligned with an interconnect site on conductive
trace 256, see FIGS. 6a-6c, 7-8, and 18a-18c. Alternatively, bump
material 234 can be aligned with a conductive pad or other
interconnect site formed on substrate 254. Bump material 234 is
wider than conductive trace 256. In one embodiment, bump material
234 has a width of less than 100 .mu.m and conductive trace or pad
256 has a width of 35 .mu.m for a bump pitch of 150 .mu.m.
Conductive traces 256 is applicable to the interconnect structure
formed with the solder mask patch, as described in FIGS. 5-8.
[0068] A pressure or force F is applied to back surface 228 of
semiconductor die 224 to press bump material 234 onto conductive
trace 256. The force F can be applied with an elevated temperature.
Due to the compliant nature of bump material 234, the bump material
deforms or extrudes around the top surface and side surfaces of
conductive trace 256, referred to as BOL. In particular, the
application of pressure causes bump material 234 to undergo a
plastic deformation greater than about 25 .mu.m under force F
equivalent to a vertical load of about 200 grams and cover the top
surface and side surfaces of the conductive trace, as shown in FIG.
10b. Bump material 234 can also be metallurgically connected to
conductive trace 256 by bringing the bump material in physical
contact with the conductive trace and then reflowing the bump
material under a reflow temperature.
[0069] By making conductive trace 256 narrower than bump material
234, the conductive trace pitch can be reduced to increase routing
density and I/O count. The narrower conductive trace 256 reduces
the force F needed to deform bump material 234 around the
conductive trace. For example, the requisite force F may be 30-50%
of the force needed to deform bump material against a conductive
trace or pad that is wider than the bump material. The lower
compressive force F is useful for fine pitch interconnect and small
die to maintain coplanarity with a specified tolerance and achieve
uniform z-direction deformation and high reliability interconnect
union. In addition, deforming bump material 234 around conductive
trace 256 mechanically locks the bump to the trace to prevent die
shifting or die floating during reflow.
[0070] FIG. 10c shows bump 236 formed over contact pad 232 of
semiconductor die 224. Semiconductor die 224 is positioned so that
bump 236 is aligned with an interconnect site on conductive trace
256. Alternatively, bump 236 can be aligned with a conductive pad
or other interconnect site formed on substrate 254. Bump 236 is
wider than conductive trace 256. Conductive traces 256 is
applicable to the interconnect structure formed with the solder
mask patch, as described in FIGS. 5-8.
[0071] A pressure or force F is applied to back surface 228 of
semiconductor die 224 to press bump 236 onto conductive trace 256.
The force F can be applied with an elevated temperature. Due to the
compliant nature of bump 236, the bump deforms or extrudes around
the top surface and side surfaces of conductive trace 256. In
particular, the application of pressure causes bump material 236 to
undergo a plastic deformation and cover the top surface and side
surfaces of conductive trace 256. Bump 236 can also be
metallurgically connected to conductive trace 256 by bringing the
bump in physical contact with the conductive trace under reflow
temperature.
[0072] By making conductive trace 256 narrower than bump 236, the
conductive trace pitch can be reduced to increase routing density
and I/O count. The narrower conductive trace 256 reduces the force
F needed to deform bump 236 around the conductive trace. For
example, the requisite force F may be 30-50% of the force needed to
deform a bump against a conductive trace or pad that is wider than
the bump. The lower compressive force F is useful for fine pitch
interconnect and small die to maintain coplanarity within a
specified tolerance and achieve uniform z-direction deformation and
high reliability interconnect union. In addition, deforming bump
236 around conductive trace 256 mechanically locks the bump to the
trace to prevent die shifting or die floating during reflow.
[0073] FIG. 10d shows composite bump 238 formed over contact pad
232 of semiconductor die 224. Semiconductor die 224 is positioned
so that composite bump 238 is aligned with an interconnect site on
conductive trace 256. Alternatively, composite bump 238 can be
aligned with a conductive pad or other interconnect site formed on
substrate 254. Composite bump 238 is wider than conductive trace
256. Conductive traces 256 is applicable to the interconnect
structure formed with the solder mask patch, as described in FIGS.
5-8.
[0074] A pressure or force F is applied to back surface 228 of
semiconductor die 224 to press fusible portion 242 onto conductive
trace 256. The force F can be applied with an elevated temperature.
Due to the compliant nature of fusible portion 242, the fusible
portion deforms or extrudes around the top surface and side
surfaces of conductive trace 256. In particular, the application of
pressure causes fusible portion 242 to undergo a plastic
deformation and cover the top surface and side surfaces of
conductive trace 256. Composite bump 238 can also be
metallurgically connected to conductive trace 256 by bringing
fusible portion 242 in physical contact with the conductive trace
under reflow temperature. The non-fusible portion 240 does not melt
or deform during the application of pressure or temperature and
retains its height and shape as a vertical standoff between
semiconductor die 224 and substrate 254. The additional
displacement between semiconductor die 224 and substrate 254
provides greater coplanarity tolerance between the mating
surfaces.
[0075] The height or volume of fusible bump material in relation to
the non-fusible base material is selected to ensure confinement by
virtue of surface tension forces. During reflow, the fusible base
material is confined around the non-fusible base material due to
the solder mask patch. The fusible bump material around the
non-fusible base also maintains die placement during reflow. In
general the height of the composite interconnect is the same or
less than the diameter of the bump. In some cases, the height of
the composite interconnect is greater than the diameter of the
interconnect. In one embodiment, given a bump base diameter of 100
.mu.m, the non-fusible base is about 45 .mu.m in height and the
fusible cap is about 35 .mu.m in height. The molten bump material
remains confined substantially within the area defined by the bump
pads due to the solder mask patch and because the volume of bump
material deposited to form the composite bump, including
non-fusible base and fusible cap, is selected so that the resulting
surface tension is sufficient to retain the bump material
substantially within the footprint of the bump pads and prevent
run-out to unintended adjacent or nearby areas. Hence, the solder
mask patch formed interstitially with the array of bump pads
reduces trace line pitch and increases routing density.
[0076] During a reflow process, a large number (e.g., thousands) of
composite bumps 238 on semiconductor die 224 are attached to
interconnect sites on conductive trace 256 of substrate 254. Some
of the bumps 238 may fail to properly connect to conductive trace
256, particularly if die 224 is warped. Recall that composite bump
238 is wider than conductive trace 256. With a proper force
applied, the fusible portion 242 deforms or extrudes around the top
surface and side surfaces of conductive trace 256 and mechanically
locks composite bump 238 to the conductive trace. The mechanical
interlock is formed by nature of the fusible portion 242 being
softer and more compliant than conductive trace 256 and therefore
deforming over the top surface and around the side surfaces of the
conductive trace for greater contact surface area. The mechanical
interlock between composite bump 238 and conductive trace 256 holds
the bump to the conductive trace during reflow, i.e., the bump and
conductive trace do not lose contact. Accordingly, composite bump
238 mating to conductive trace 256 reduces bump interconnect
failures.
[0077] FIG. 10e shows conductive pillar 246 and bump 244 formed
over contact pad 232 of semiconductor die 224. Semiconductor die
224 is positioned so that bump 244 is aligned with an interconnect
site on conductive trace 256. Alternatively, bump 244 can be
aligned with a conductive pad or other interconnect site formed on
substrate 254. Bump 244 is wider than conductive trace 256.
Conductive traces 256 is applicable to the interconnect structure
formed with the solder mask patch, as described in FIGS. 5-8.
[0078] A pressure or force F is applied to back surface 228 of
semiconductor die 224 to press bump 244 onto conductive trace 256.
The force F can be applied with an elevated temperature. Due to the
compliant nature of bump 244, the bump deforms or extrudes around
the top surface and side surfaces of conductive trace 256. In
particular, the application of pressure causes bump 244 to undergo
a plastic deformation and cover the top surface and side surfaces
of conductive trace 256. Conductive pillar 246 and bump 244 can
also be metallurgically connected to conductive trace 256 by
bringing the bump in physical contact with the conductive trace
under reflow temperature. Conductive pillar 246 does not melt or
deform during the application of pressure or temperature and
retains its height and shape as a vertical standoff between
semiconductor die 224 and substrate 254. The additional
displacement between semiconductor die 224 and substrate 254
provides greater coplanarity tolerance between the mating surfaces.
The wider bump 244 and narrower conductive trace 256 have similar
low requisite compressive force and mechanical locking features and
advantages described above for bump material 234 and bump 236.
[0079] FIG. 10f shows bump material 248 with asperities 250 formed
over contact pad 232 of semiconductor die 224. Semiconductor die
224 is positioned so that bump material 248 is aligned with an
interconnect site on conductive trace 256. Alternatively, bump
material 248 can be aligned with a conductive pad or other
interconnect site formed on substrate 254. Bump material 248 is
wider than conductive trace 256. A pressure or force F is applied
to back surface 228 of semiconductor die 224 to press bump material
248 onto conductive trace 256. The force F can be applied with an
elevated temperature. Due to the compliant nature of bump material
248, the bump deforms or extrudes around the top surface and side
surfaces of conductive trace 256. In particular, the application of
pressure causes bump material 248 to undergo a plastic deformation
and cover the top surface and side surfaces of conductive trace
256. In addition, asperities 250 are metallurgically connected to
conductive trace 256. Asperities 250 are sized on the order about
1-25 .mu.m.
[0080] FIG. 10g shows a substrate or PCB 258 with trapezoidal
conductive trace 260 having angled or sloped sides. Bump material
261 is formed over contact pad 232 of semiconductor die 224.
Semiconductor die 224 is positioned so that bump material 261 is
aligned with an interconnect site on conductive trace 260.
Alternatively, bump material 261 can be aligned with a conductive
pad or other interconnect site formed on substrate 258. Bump
material 261 is wider than conductive trace 260. Conductive traces
260 is applicable to the interconnect structure formed with the
solder mask patch, as described in FIGS. 5-8.
[0081] A pressure or force F is applied to back surface 228 of
semiconductor die 224 to press bump material 261 onto conductive
trace 260. The force F can be applied with an elevated temperature.
Due to the compliant nature of bump material 261, the bump material
deforms or extrudes around the top surface and side surfaces of
conductive trace 260. In particular, the application of pressure
causes bump material 261 to undergo a plastic deformation under
force F to cover the top surface and the angled side surfaces of
conductive trace 260. Bump material 261 can also be metallurgically
connected to conductive trace 260 by bringing the bump material in
physical contact with the conductive trace and then reflowing the
bump material under a reflow temperature.
[0082] FIGS. 11a-11d show a BOL embodiment of semiconductor die 224
and elongated composite bump 262 having a non-fusible or
non-collapsible portion 264 and fusible or collapsible portion 266.
The non-fusible portion 264 can be Au, Cu, Ni, high-lead solder, or
lead-tin alloy. The fusible portion 266 can be Sn, lead-free alloy,
Sn--Ag alloy, Sn--Ag--Cu alloy, Sn--Ag--In alloy, eutectic solder,
tin alloys with Ag, Cu, or Pb, or other relatively low temperature
melt solder. The non-fusible portion 264 makes up a larger part of
composite bump 262 than the fusible portion 266. The non-fusible
portion 264 is fixed to contact pad 232 of semiconductor die
224.
[0083] Semiconductor die 224 is positioned so that composite bump
262 is aligned with an interconnect site on conductive trace 268
formed on substrate 270, as shown in FIG. 11a. Composite bump 262
is tapered along conductive trace 268, i.e., the composite bump has
a wedge shape, longer along a length of conductive trace 268 and
narrower across the conductive trace. The tapered aspect of
composite bump 262 occurs along the length of conductive trace 268.
The view in FIG. 11a shows the shorter aspect or narrowing taper
co-linear with conductive trace 268. The view in FIG. 11b, normal
to FIG. 11a, shows the longer aspect of the wedge-shaped composite
bump 262. The shorter aspect of composite bump 262 is wider than
conductive trace 268. The fusible portion 266 collapses around
conductive trace 268 upon application of pressure and/or reflow
with heat, as shown in FIGS. 11c and 11d. The non-fusible portion
264 does not melt or deform during reflow and retains its form and
shape. The non-fusible portion 264 can be dimensioned to provide a
standoff distance between semiconductor die 224 and substrate 270.
A finish such as Cu OSP can be applied to substrate 270. Conductive
traces 268 is applicable to the interconnect structure formed with
the solder mask patch, as described in FIGS. 5-8.
[0084] During a reflow process, a large number (e.g., thousands) of
composite bumps 262 on semiconductor die 224 are attached to
interconnect sites on conductive trace 268 of substrate 270. Some
of the bumps 262 may fail to properly connect to conductive trace
268, particularly if semiconductor die 224 is warped. Recall that
composite bump 262 is wider than conductive trace 268. With a
proper force applied, the fusible portion 266 deforms or extrudes
around the top surface and side surfaces of conductive trace 268
and mechanically locks composite bump 262 to the conductive trace.
The mechanical interlock is formed by nature of the fusible portion
266 being softer and more compliant than conductive trace 268 and
therefore deforming around the top surface and side surfaces of the
conductive trace for greater contact area. The wedge-shape of
composite bump 262 increases contact area between the bump and
conductive trace, e.g., along the longer aspect of FIGS. 11b and
11d, without sacrificing pitch along the shorter aspect of FIGS.
11a and 11c. The mechanical interlock between composite bump 262
and conductive trace 268 holds the bump to the conductive trace
during reflow, i.e., the bump and conductive trace do not lose
contact. Accordingly, composite bump 262 mating to conductive trace
268 reduces bump interconnect failures.
[0085] FIGS. 12a-12d show a BOL embodiment of semiconductor die 224
with bump material 274 formed over contact pads 232, similar to
FIG. 9c. In FIG. 12a, bump material 274 is generally compliant and
undergoes plastic deformation greater than about 25 .mu.m under a
force equivalent to a vertical load of about 200 grams. Bump
material 274 is wider than conductive trace 276 on substrate 278. A
plurality of asperities 280 is formed on conductive trace 276 with
a height on the order about 1-25 .mu.m.
[0086] Semiconductor die 224 is positioned so that bump material
274 is aligned with an interconnect site on conductive trace 276.
Alternatively, bump material 274 can be aligned with a conductive
pad or other interconnect site formed on substrate 278. A pressure
or force F is applied to back surface 228 of semiconductor die 224
to press bump material 274 onto conductive trace 276 and asperities
280, as shown in FIG. 12b. The force F can be applied with an
elevated temperature. Due to the compliant nature of bump material
274, the bump material deforms or extrudes around the top surface
and side surfaces of conductive trace 276 and asperities 280. In
particular, the application of pressure causes bump material 274 to
undergo a plastic deformation and cover the top surface and side
surfaces of conductive trace 276 and asperities 280. The plastic
flow of bump material 274 creates macroscopic mechanical
interlocking points between the bump material and the top surface
and side surfaces of conductive trace 276 and asperities 280. The
plastic flow of bump material 274 occurs around the top surface and
side surfaces of conductive trace 276 and asperities 280, but does
not extend excessively onto substrate 278, which could cause
electrical shorting and other defects. The mechanical interlock
between the bump material and the top surface and side surfaces of
conductive trace 276 and asperities 280 provides a robust
connection with greater contact area between the respective
surfaces, without significantly increasing the bonding force. The
mechanical interlock between the bump material and the top surface
and side surfaces of conductive trace 276 and asperities 280 also
reduces lateral die shifting during subsequent manufacturing
processes, such as encapsulation.
[0087] FIG. 12c shows another BOL embodiment with bump material 274
narrower than conductive trace 276. A pressure or force F is
applied to back surface 228 of semiconductor die 224 to press bump
material 274 onto conductive trace 276 and asperities 280. The
force F can be applied with an elevated temperature. Due to the
compliant nature of bump material 274, the bump material deforms or
extrudes over the top surface of conductive trace 276 and
asperities 280. In particular, the application of pressure causes
bump material 274 to undergo a plastic deformation and cover the
top surface of conductive trace 276 and asperities 280. The plastic
flow of bump material 274 creates macroscopic mechanical
interlocking points between the bump material and the top surface
of conductive trace 276 and asperities 280. The mechanical
interlock between the bump material and the top surface of
conductive trace 276 and asperities 280 provides a robust
connection with greater contact area between the respective
surfaces, without significantly increasing the bonding force. The
mechanical interlock between the bump material and the top surface
of conductive trace 276 and asperities 280 also reduces lateral die
shifting during subsequent manufacturing processes, such as
encapsulation.
[0088] FIG. 12d shows another BOL embodiment with bump material 274
formed over an edge of conductive trace 276, i.e., part of the bump
material is over the conductive trace and part of the bump material
is not over the conductive trace. A pressure or force F is applied
to back surface 228 of semiconductor die 224 to press bump material
274 onto conductive trace 276 and asperities 280. The force F can
be applied with an elevated temperature. Due to the compliant
nature of bump material 274, the bump material deforms or extrudes
over the top surface and side surfaces of conductive trace 276 and
asperities 280. In particular, the application of pressure causes
bump material 274 to undergo a plastic deformation and cover the
top surface and side surfaces of conductive trace 276 and
asperities 280. The plastic flow of bump material 274 creates
macroscopic mechanical interlocking between the bump material and
the top surface and side surfaces of conductive trace 276 and
asperities 280. The mechanical interlock between the bump material
and the top surface and side surfaces of conductive trace 276 and
asperities 280 provides a robust connection with greater contact
area between the respective surfaces, without significantly
increasing the bonding force. The mechanical interlock between the
bump material and the top surface and side surfaces of conductive
trace 276 and asperities 280 also reduces lateral die shifting
during subsequent manufacturing processes, such as
encapsulation.
[0089] FIGS. 13a-13c show a BOL embodiment of semiconductor die 224
with bump material 284 formed over contact pads 232, similar to
FIG. 9c. A tip 286 extends from the body of bump material 284 as a
stepped bump with tip 286 narrower than the body of bump material
284, as shown in FIG. 13a. Semiconductor die 224 is positioned so
that bump material 284 is aligned with an interconnect site on
conductive trace 288 on substrate 290. More specifically, tip 286
is centered over an interconnect site on conductive trace 288.
Alternatively, bump material 284 and tip 286 can be aligned with a
conductive pad or other interconnect site formed on substrate 290.
Bump material 284 is wider than conductive trace 288 on substrate
290.
[0090] Conductive trace 288 is generally compliant and undergoes
plastic deformation greater than about 25 .mu.m under a force
equivalent to a vertical load of about 200 grams. A pressure or
force F is applied to back surface 228 of semiconductor die 224 to
press tip 284 onto conductive trace 288. The force F can be applied
with an elevated temperature. Due to the compliant nature of
conductive trace 288, the conductive trace deforms around tip 286,
as shown in FIG. 13b. In particular, the application of pressure
causes conductive trace 288 to undergo a plastic deformation and
cover the top surface and side surfaces of tip 286.
[0091] FIG. 13c shows another BOL embodiment with rounded bump
material 294 formed over contact pads 232. A tip 296 extends from
the body of bump material 294 to form a stud bump with the tip
narrower than the body of bump material 294. Semiconductor die 224
is positioned so that bump material 294 is aligned with an
interconnect site on conductive trace 298 on substrate 300. More
specifically, tip 296 is centered over an interconnect site on
conductive trace 298. Alternatively, bump material 294 and tip 296
can be aligned with a conductive pad or other interconnect site
formed on substrate 300. Bump material 294 is wider than conductive
trace 298 on substrate 300.
[0092] Conductive trace 298 is generally compliant and undergoes
plastic deformation greater than about 25 .mu.m under a force
equivalent to a vertical load of about 200 grams. A pressure or
force F is applied to back surface 228 of semiconductor die 224 to
press tip 296 onto conductive trace 298. The force F can be applied
with an elevated temperature. Due to the compliant nature of
conductive trace 298, the conductive trace deforms around tip 296.
In particular, the application of pressure causes conductive trace
298 to undergo a plastic deformation and cover the top surface and
side surfaces of tip 296.
[0093] The conductive traces described in FIGS. 10a-10g, 11a-11d,
and 12a-12d can also be compliant material as described in FIGS.
13a-13c.
[0094] FIGS. 14a-14b show a BOL embodiment of semiconductor die 224
with bump material 304 formed over contact pads 232, similar to
FIG. 9c. Bump material 304 is generally compliant and undergoes
plastic deformation greater than about 25 .mu.m under a force
equivalent to a vertical load of about 200 grams. Bump material 304
is wider than conductive trace 306 on substrate 308. A conductive
via 310 is formed through conductive trace 306 with an opening 312
and conductive sidewalls 314, as shown in FIG. 14a. Conductive
traces 306 is applicable to the interconnect structure formed with
the solder mask patch, as described in FIGS. 5-8.
[0095] Semiconductor die 224 is positioned so that bump material
304 is aligned with an interconnect site on conductive trace 306,
see FIGS. 6a-6c, 7-8, and 18a-18c. Alternatively, bump material 304
can be aligned with a conductive pad or other interconnect site
formed on substrate 308. A pressure or force F is applied to back
surface 228 of semiconductor die 224 to press bump material 304
onto conductive trace 306 and into opening 312 of conductive via
310. The force F can be applied with an elevated temperature. Due
to the compliant nature of bump material 304, the bump material
deforms or extrudes around the top surface and side surfaces of
conductive trace 306 and into opening 312 of conductive vias 310,
as shown in FIG. 14b. In particular, the application of pressure
causes bump material 304 to undergo a plastic deformation and cover
the top surface and side surfaces of conductive trace 306 and into
opening 312 of conductive via 310. Bump material 304 is thus
electrically connected to conductive trace 306 and conductive
sidewalls 314 for z-direction vertical interconnect through
substrate 308. The plastic flow of bump material 304 creates a
mechanical interlock between the bump material and the top surface
and side surfaces of conductive trace 306 and opening 312 of
conductive via 310. The mechanical interlock between the bump
material and the top surface and side surfaces of conductive trace
306 and opening 312 of conductive via 310 provides a robust
connection with greater contact area between the respective
surfaces, without significantly increasing the bonding force. The
mechanical interlock between the bump material and the top surface
and side surfaces of conductive trace 306 and opening 312 of
conductive via 310 also reduces lateral die shifting during
subsequent manufacturing processes, such as encapsulation. Since
conductive via 310 is formed within the interconnect site with bump
material 304, the total substrate interconnect area is reduced.
[0096] In the BOL embodiments of FIGS. 10a-10g, 11a-11d, 12a-12d,
13a-13c, and 14a-14b, by making the conductive trace narrower than
the interconnect structure, the conductive trace pitch can be
reduced to increase routing density and I/O count. The narrower
conductive trace reduces the force F needed to deform the
interconnect structure around the conductive trace. For example,
the requisite force F may be 30-50% of the force needed to deform a
bump against a conductive trace or pad that is wider than the bump.
The lower compressive force F is useful for fine pitch interconnect
and small die to maintain coplanarity within a specified tolerance
and achieve uniform z-direction deformation and high reliability
interconnect union. In addition, deforming the interconnect
structure around the conductive trace mechanically locks the bump
to the trace to prevent die shifting or die floating during
reflow.
[0097] FIGS. 15a-15c show a mold underfill (MUF) process to deposit
encapsulant around the bumps between the semiconductor die and
substrate. FIG. 15a shows semiconductor die 224 mounted to
substrate 254 using bump material 234 from FIG. 10b and placed
between upper mold support 316 and lower mold support 318 of chase
mold 320. The other semiconductor die and substrate combinations
from FIGS. 10a-10g, 11a-11d, 12a-12d, 13a-13c, and 14a-14b can be
placed between upper mold support 316 and lower mold support 318 of
chase mold 320. The upper mold support 316 includes compressible
releasing film 322.
[0098] In FIG. 15b, upper mold support 316 and lower mold support
318 are brought together to enclose semiconductor die 224 and
substrate 254 with an open space over the substrate and between the
semiconductor die and substrate. Compressible releasing film 322
conforms to back surface 228 and side surfaces of semiconductor die
224 to block formation of encapsulant on these surfaces. An
encapsulant 324 in a liquid state is injected into one side of
chase mold 320 with nozzle 326 while an optional vacuum assist 328
draws pressure from the opposite side to uniformly fill the open
space over substrate 254 and the open space between semiconductor
die 224 and substrate 254 with the encapsulant. Encapsulant 324 can
be polymer composite material, such as epoxy resin with filler,
epoxy acrylate with filler, or polymer with proper filler.
Encapsulant 324 is non-conductive and environmentally protects the
semiconductor device from external elements and contaminants.
Compressible material 322 prevents encapsulant 324 from flowing
over back surface 228 and around the side surfaces of semiconductor
die 224. Encapsulant 324 is cured. The back surface 228 and side
surfaces of semiconductor die 224 remain exposed from encapsulant
324.
[0099] FIG. 15c shows an embodiment of MUF and mold overfill (MOF),
i.e., without compressible material 322. Semiconductor die 224 and
substrate 254 are placed between upper mold support 316 and lower
mold support 318 of chase mold 320. The upper mold support 316 and
lower mold support 318 are brought together to enclose
semiconductor die 224 and substrate 254 with an open space over the
substrate, around the semiconductor die, and between the
semiconductor die and substrate. Encapsulant 324 in a liquid state
is injected into one side of chase mold 320 with nozzle 326 while
an optional vacuum assist 328 draws pressure from the opposite side
to uniformly fill the open space around semiconductor die 224 and
over substrate 254 and the open space between semiconductor die 224
and substrate 254 with the encapsulant. Encapsulant 324 is
cured.
[0100] FIG. 16 shows another embodiment of depositing encapsulant
around semiconductor die 224 and in the gap between semiconductor
die 224 and substrate 254. Semiconductor die 224 and substrate 254
are enclosed by dam 330. Encapsulant 332 is dispensed from nozzles
334 in a liquid state into dam 330 to fill the open space over
substrate 254 and the open space between semiconductor die 224 and
substrate 254. The volume of encapsulant 332 dispensed from nozzles
334 is controlled to fill dam 330 without covering back surface 228
or the side surfaces of semiconductor die 224. Encapsulant 332 is
cured.
[0101] FIG. 17 shows semiconductor die 224 and substrate 254 after
the MUF process from FIGS. 16a, 16c, and 17. Encapsulant 324 is
uniformly distributed over substrate 254 and around bump material
234 between semiconductor die 224 and substrate 254.
[0102] FIGS. 18a-18c show top views of various conductive trace
layouts on substrate or PCB 340. In FIG. 18a, conductive trace 342
is a straight conductor with integrated bump pad or interconnect
site 344 formed on substrate 340. The sides of substrate bump pad
344 can be co-linear with conductive trace 342. In the prior art,
SRO is typically formed over the interconnect site to contain the
bump material during reflow. The SRO increases interconnect pitch
and reduces I/O count. In contrast, masking layer 346 can be formed
over a portion of substrate 340; however, the masking layer is not
formed around substrate bump pad 344 of conductive trace 342. That
is, the portion of conductive trace 342 designed to mate with the
bump material is devoid of any SRO of masking layer 346 that would
have been used for bump containment during reflow.
[0103] Semiconductor die 224 is placed over substrate 340 and the
bump material is aligned with substrate bump pads 344. The bump
material is electrically and metallurgically connected to substrate
bump pads 344 by bringing the bump material in physical contact
with the bump pad and then reflowing the bump material under a
reflow temperature.
[0104] In another embodiment, an electrically conductive bump
material is deposited over substrate bump pad 344 using an
evaporation, electrolytic plating, electroless plating, ball drop,
or screen printing process. The bump material can be Al, Sn, Ni,
Au, Ag, Pb, Bi, Cu, solder, and combinations thereof, with an
optional flux solution. For example, the bump material can be
eutectic Sn/Pb, high-lead solder, or lead-free solder. The bump
material is bonded to substrate bump pad 344 using a suitable
attachment or bonding process. In one embodiment, the bump material
is reflowed by heating the material above its melting point to form
bump or interconnect 348, as shown in FIG. 18b. In some
applications, bump 348 is reflowed a second time to improve
electrical contact to substrate bump pad 344. The bump material
around the narrow substrate bump pad 344 maintains die placement
during reflow.
[0105] In high routing density applications, it is desirable to
minimize escape pitch of conductive traces 342. The escape pitch
between conductive traces 342 can be reduced by eliminating the
masking layer for the purpose of reflow containment, i.e., by
reflowing the bump material without a masking layer. Since no SRO
is formed around die bump pad 232 or substrate bump pad 344,
conductive traces 342 can be formed with a finer pitch, i.e.,
conductive trace 342 can be disposed closer together or to nearby
structures. With no SRO around substrate bump pad 344, the pitch
between conductive traces 342 is given as P=D+PLT+W/2, wherein D is
the base diameter of bump 348, PLT is die placement tolerance, and
W is the width of conductive trace 342. In one embodiment, given a
bump base diameter of 100 .mu.m, PLT of 10 .mu.m, and trace line
width of 30 .mu.m, the minimum escape pitch of conductive trace 342
is 125 .mu.m . The mask-less bump formation eliminates the need to
account for the ligament spacing of masking material between
adjacent openings, solder mask registration tolerance (SRT), and
minimum resolvable SRO, as found in the prior art.
[0106] When the bump material is reflowed without a masking layer
to metallurgically and electrically connect die bump pad 232 to
substrate bump pad 344, the wetting and surface tension causes the
bump material to maintain self-confinement and be retained within
the space between die bump pad 232 and substrate bump pad 344 and
portion of substrate 340 immediately adjacent to conductive trace
342 substantially within the footprint of the bump pads.
[0107] To achieve the desired self-confinement property, the bump
material can be immersed in a flux solution prior to placement on
die bump pad 232 or substrate bump pad 344 to selectively render
the region contacted by the bump material more wettable than the
surrounding area of conductive traces 342. The molten bump material
remains confined substantially within the area defined by the bump
pads due to the wettable properties of the flux solution. The bump
material does not run-out to the less wettable areas. A thin oxide
layer or other insulating layer can be formed over areas where bump
material is not intended to make the area less wettable. Hence,
masking layer 340 is not needed around die bump pad 232 or
substrate bump pad 344.
[0108] FIG. 18c shows another embodiment of parallel conductive
traces 352 as a straight conductor with integrated rectangular bump
pad or interconnect site 354 formed on substrate 350. In this case,
substrate bump pad 354 is wider than conductive trace 352, but less
than the width of the mating bump. The sides of substrate bump pad
354 can be parallel to conductive trace 352. Masking layer 356 can
be formed over a portion of substrate 350; however, the masking
layer is not formed around substrate bump pad 354 of conductive
trace 352. That is, the portion of conductive trace 352 designed to
mate with the bump material is devoid of any SRO of masking layer
356 that would have been used for bump containment during
reflow.
[0109] FIG. 19 shows package-on-package (PoP) 405 with
semiconductor die 406 stacked over semiconductor die 408 using die
attach adhesive 410. Semiconductor die 406 and 408 each have an
active surface containing analog or digital circuits implemented as
active devices, passive devices, conductive layers, and dielectric
layers formed within the die and electrically interconnected
according to the electrical design and function of the die. For
example, the circuit may include one or more transistors, diodes,
and other circuit elements formed within the active surface to
implement analog circuits or digital circuits, such as DSP, ASIC,
memory, or other signal processing circuit. Semiconductor die 406
and 408 may also contain IPDs, such as inductors, capacitors, and
resistors, for RF signal processing.
[0110] Semiconductor die 406 is mounted to conductive traces 412
formed on substrate 414 using bump material 416 formed on contact
pads 418, using any of the embodiments from FIGS. 10a-10g, 11a-11d,
12a-12d, 13a-13c, and 14a-14b. Conductive traces 412 is applicable
to the interconnect structure formed with the solder mask patch, as
described in FIGS. 5-8. Semiconductor die 408 is electrically
connected to contact pads 420 formed on substrate 414 using bond
wires 422. The opposite end of bond wire 422 is bonded to contact
pads 424 on semiconductor die 406.
[0111] Masking layer 426 is formed over substrate 414 and opened
beyond the footprint of semiconductor die 406. While masking layer
426 does not confine bump material 416 to conductive traces 412
during reflow, the open mask can operate as a dam to prevent
encapsulant 428 from migrating to contact pads 420 or bond wires
422 during MUF. Encapsulant 428 is deposited between semiconductor
die 408 and substrate 414, similar to FIGS. 15a-15c. Masking layer
426 blocks MUF encapsulant 428 from reaching contact pads 420 and
bond wires 422, which could cause a defect. Masking layer 426
allows a larger semiconductor die to be placed on a given substrate
without risk of encapsulant 428 bleeding onto contact pads 420.
[0112] While one or more embodiments of the present invention have
been illustrated in detail, the skilled artisan will appreciate
that modifications and adaptations to those embodiments may be made
without departing from the scope of the present invention as set
forth in the following claims.
* * * * *