U.S. patent application number 12/994793 was filed with the patent office on 2011-03-24 for referenced inspection device.
This patent application is currently assigned to KLA-TENCOR CORPORATION. Invention is credited to Alexander Belyaev, Paul Doyle, J. Rex Runyon, Guoheng Zhao.
Application Number | 20110069306 12/994793 |
Document ID | / |
Family ID | 41417359 |
Filed Date | 2011-03-24 |
United States Patent
Application |
20110069306 |
Kind Code |
A1 |
Doyle; Paul ; et
al. |
March 24, 2011 |
Referenced Inspection Device
Abstract
A tool for investigating a substrate, where the tool has a tool
head for investigating the substrate, a chuck for disposing an
upper surface of the substrate in proximity to the tool head, and
an air bearing disposed on the tool head adjacent the substrate.
The air bearing has a pressure source and a vacuum source, where
the vacuum source draws the substrate toward the air bearing and
the pressure source prevents the substrate from physically
contacting the air bearing. The pressure source and the vacuum
source work in cooperation to dispose the upper surface of the
substrate at a known distance from the tool head. By using the air
bearing as part of the tool in this manner, registration of the
substrate to the tool head is accomplished relative to the upper
surface of the substrate, not the back side of the substrate.
Inventors: |
Doyle; Paul; (San Jose,
CA) ; Zhao; Guoheng; (Milpitas, CA) ; Belyaev;
Alexander; (Campbell, CA) ; Runyon; J. Rex;
(Fremont, CA) |
Assignee: |
KLA-TENCOR CORPORATION
Milpitas
CA
|
Family ID: |
41417359 |
Appl. No.: |
12/994793 |
Filed: |
May 29, 2009 |
PCT Filed: |
May 29, 2009 |
PCT NO: |
PCT/US2009/045704 |
371 Date: |
November 26, 2010 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
61059861 |
Jun 9, 2008 |
|
|
|
Current U.S.
Class: |
356/237.5 ;
324/762.01; 73/865.8 |
Current CPC
Class: |
H01L 21/6838
20130101 |
Class at
Publication: |
356/237.5 ;
324/762.01; 73/865.8 |
International
Class: |
G01N 21/88 20060101
G01N021/88; G01R 31/26 20060101 G01R031/26 |
Claims
1. A tool for investigating a substrate, the tool comprising: a
tool head for investigating the substrate, a chuck for disposing an
upper surface of the substrate in proximity to the tool head, and
an air bearing disposed on the tool head adjacent the substrate,
the air bearing having a pressure source and a vacuum source, the
vacuum source for drawing the substrate toward the air bearing and
the pressure source for preventing the substrate from physically
contacting the air bearing, where the pressure source and the
vacuum source work in cooperation to dispose the upper surface of
the substrate at a known distance from the tool head.
2. The tool of claim 1, wherein the air bearing forms a
substantially hermetic seal between an interior orifice formed in
the air bearing and an environment exterior to the air bearing.
3. The tool of claim 1, wherein the air bearing forms a
contamination barrier between an interior orifice formed in the air
bearing and an environment exterior to the air bearing.
4. The tool of claim 1, wherein the tool is an integrated circuit
inspection tool.
5. The tool of claim 1, wherein the tool is an integrated circuit
measurement tool.
6. The tool of claim 1, wherein the tool performs optical-based
investigations of the substrate.
7. The tool of claim 1, wherein the tool performs electrical-based
investigations of the substrate.
8. The tool of claim 1, wherein the substrate is a semiconductor
substrate with integrated circuits at least partially formed
thereon.
9. The tool of claim 1, wherein the substrate is a mask with
integrated circuit patterns formed thereon.
10. The tool of claim 1, wherein the air bearing is formed of a
porous material through which the pressure source is delivered, the
porous material forming annular channels through which the vacuum
source is delivered.
11. The tool of claim 1, wherein the air bearing is formed of a
porous material through which the pressure source is delivered, the
porous material forming substantially evenly spaced voids through
which the vacuum source is delivered.
12. The tool of claim 1, wherein the air bearing is formed of a
non-porous material that forms first channels through which the
pressure source is delivered, and second channels through which the
vacuum source is delivered.
13. The tool of claim 1, wherein the tool head investigates the
substrate through an orifice formed in a central location of the
air bearing.
14. The tool of claim 1, wherein the tool head investigates the
substrate through an orifice formed in a peripheral location of the
air bearing.
15. The tool of claim 1, further comprising retention pieces on the
chuck for substantially retaining the substrate at desired
positions within an x-y plane adjacent the air bearing, while
allowing the air bearing to adjust the desired positions of the
substrate in a z axis to the known distance from the tool head.
16. The tool of claim 1, wherein the chuck imparts translational,
rotational, and elevational movement to the substrate relative to
the tool head.
17. A tool for investigating a substrate, the tool comprising: a
tool head for investigating the substrate, a chuck for disposing an
upper surface of the substrate in proximity to the tool head, an
air bearing disposed on the tool head adjacent the substrate, the
air bearing having a pressure source and a vacuum source, the
vacuum source for drawing the substrate toward the air bearing and
the pressure source for preventing the substrate from physically
contacting the air bearing, where the pressure source and the
vacuum source work in cooperation to dispose the upper surface of
the substrate at a known distance from the tool head, and retention
pieces on the chuck for substantially retaining the substrate at
desired positions within an x-y plane adjacent the air bearing,
while allowing the air bearing to adjust the desired positions of
the substrate in a z axis to the known distance from the tool
head.
18. The tool of claim 17, wherein the tool is an integrated circuit
inspection tool.
19. The tool of claim 17, wherein the tool is an integrated circuit
measurement tool.
20. An optical inspection tool for inspecting a substrate, the tool
comprising: an optical tool head for inspecting the substrate, a
chuck for disposing an upper surface of the substrate in proximity
to the tool head, wherein the chuck imparts translational,
rotational, and elevational movement to the substrate relative to
the tool head, an air bearing disposed on the tool head adjacent
the substrate, the air bearing having a pressure source and a
vacuum source, the vacuum source for drawing the substrate toward
the air bearing and the pressure source for preventing the
substrate from physically contacting the air bearing, where the
pressure source and the vacuum source work in cooperation to
dispose the upper surface of the substrate at a known distance from
the tool head, wherein the air bearing is formed of a porous
material through which the pressure source is delivered, the porous
material forming annular channels through which the vacuum source
is delivered, and retention pieces on the chuck for substantially
retaining the substrate at desired positions within an x-y plane
adjacent the air bearing, while allowing the air bearing to adjust
the desired positions of the substrate in a z axis to the known
distance from the tool head.
Description
[0001] This application claims all rights and priority on U.S.
provisional application Ser. No. 61/059,861 filed Jun. 6, 2008 and
PCT application serial number PCT/US2009/045704 filed May 5, 2009.
This invention relates to the field of integrated circuit
fabrication. More particularly, this invention relates to
registration of tool heads to substrate surfaces.
FIELD
Background
[0002] During integrated circuit fabrication processes, the
integrated circuits typically receive a variety of different
surface inspections and measurements, such as optical inspections
and measurement. As the term is used herein, "integrated circuit"
includes devices such as those formed on monolithic semiconducting
substrates, such as those formed of group IV materials like silicon
or germanium, or group III-V compounds like gallium arsenide, or
mixtures of such materials. The term includes all types of devices
formed, such as memory and logic, and all designs of such devices,
such as MOS and bipolar. The term also comprehends applications
such as flat panel displays, solar cells, and charge coupled
devices.
[0003] The term "tool" as used herein generally refers to
inspection or measurement systems used in the integrated circuit
fabrication industry. The term "investigation" as used herein
generally refers to the process of inspection or measurement as
used in the integrated circuit fabrication industry. As used
herein, the term "substrate" refers to the substrates on which the
integrated circuits are fabricated, the masks or reticles from
which the patterns used to form the integrated circuits are
transferred, and other types of substrates as used in the
integrated circuit fabrication industry.
[0004] Current methods of investigation typically reference the
backside of the substrate to a chuck while inspecting the front
side of the substrate. In other words, the backside of the
substrate is placed on the surface of a chuck, which is then
brought into some kind of alignment with the operative head of the
tool. The tool is most frequently designed to investigate the top
surface of the substrate. Assumptions are made in the operation of
the tool, such as that the chuck is flat and moves in a level
manner, that the substrate is of a known and uniform thickness, and
other such. These assumptions are used to align the head of the
tool to the top surface of the substrate, when the position of the
chuck is known.
[0005] This method is vulnerable to inconsistencies in the flatness
of the chuck, variances in substrate geometry that affect the
height of the substrate, and other problems that make the
assumptions invalid. For example, if the substrate thickness varies
from what is assumed, then the distance between the head and the
top surface of the substrate will vary across the
substrate--unbeknownst to the tool. Similarly, if the chuck height
varies from what is assumed, then the distance between the head and
the top surface of the substrate will vary across the
chuck--unbeknownst to the tool.
[0006] This situation is typically resolved by using an active
focusing mechanism to compensate for height changes as the
substrate is moved with respect to the tool head. A typical
auto-focus mechanism, including a control system, can cost
thousands of dollars to implement, and many times that to engineer,
especially when considering software development costs. History has
proven that these are problematic mechanisms when implemented with
the accuracy and repeatability that are expected by the customer.
As customers demand faster through-put, the auto-focus mechanism
needs to respond faster as well. Because they are mechanical in
nature, these mechanisms have limited response times, which often
are not sufficient to meet the through-put demanded. Some
inspection systems have such large optical elements that moving
them to track height variations at a high speed is just not a
realistic option.
[0007] What is needed, therefore, is a system that overcomes
problems such as those described above, at least in part.
SUMMARY
[0008] The above and other needs are met by a tool for
investigating a substrate, where the tool has a tool head for
investigating the substrate, a chuck for disposing an upper surface
of the substrate in proximity to the tool head, and an air bearing
disposed on the tool head adjacent the substrate. The air bearing
has a pressure source and a vacuum source, where the vacuum source
draws the substrate toward the air bearing and the pressure source
prevents the substrate from physically contacting the air bearing.
The pressure source and the vacuum source work in cooperation to
dispose the upper surface of the substrate at a known distance from
the tool head.
[0009] By using the air bearing as part of the tool in this manner,
registration of the substrate to the tool head is accomplished
relative to the upper surface of the substrate, not the back side
of the substrate. Because it is the upper surface of the substrate
that will be investigated, the registration is more accurate and
does not rely on the assumptions made above. However, the substrate
is not damaged by the tool head, because the air bearing prevents
physical contact between the air bearing or the tool head and the
upper surface of the substrate.
[0010] In various embodiments, the tool is an integrated circuit
inspection tool or an integrated circuit measurement tool. In some
embodiments the tool performs optical-based investigations of the
substrate, and in some embodiments the tool performs
electrical-based investigations of the substrate. The substrate in
various embodiments is a semiconductor substrate with integrated
circuits at least partially formed thereon, or a mask with
integrated circuit patterns formed thereon.
[0011] In some embodiments the air bearing is formed of a porous
material through which the pressure source is delivered, where the
porous material forms annular channels through which the vacuum
source is delivered. In other embodiments the air bearing is formed
of a porous material through which the pressure source is
delivered, where the porous material forms substantially evenly
spaced voids through which the vacuum source is delivered. In some
embodiments the air bearing is formed of a non-porous material that
forms first channels through which the pressure source is
delivered, and second channels through which the vacuum source is
delivered.
[0012] In some embodiments the tool head investigates the substrate
through an orifice formed in a central location of the air bearing,
and in other embodiments the orifice is formed in a peripheral
location of the air bearing. In some embodiments retention pieces
on the chuck substantially retain the substrate at desired
positions within an x-y plane adjacent the air bearing, while
allowing the air bearing to adjust the desired positions of the
substrate in a z axis to the known distance from the tool head. In
some embodiments the chuck imparts translational, rotational, and
elevational movement to the substrate relative to the tool
head.
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] Further advantages of the invention are apparent by
reference to the detailed description when considered in
conjunction with the figures, which are not to scale so as to more
clearly show the details, wherein like reference numbers indicate
like elements throughout the several views, and wherein:
[0014] FIG. 1 is a cross sectional depiction of a tool according to
an embodiment of the present invention.
[0015] FIG. 2 is a cross sectional depiction of a tool head and air
bearing according to an embodiment of the present invention.
[0016] FIG. 3 is a cross sectional depiction of an air bearing
according to a first embodiment of the present invention.
[0017] FIG. 4 is a cross sectional depiction of an air bearing
according to a second embodiment of the present invention.
[0018] FIG. 5 is a cross sectional depiction of air bearings
according to a third and fourth embodiment of the present
invention.
[0019] FIG. 6 is a cross sectional depiction of an air bearing
according to a fifth embodiment of the present invention.
[0020] FIG. 7 is a cross sectional depiction of an air bearing
according to a sixth embodiment of the present invention.
[0021] FIG. 8 is a cross sectional depiction of an air bearing
according to a seventh embodiment of the present invention.
DETAILED DESCRIPTION
[0022] With reference now to FIG. 1, there is depicted a tool 10,
including a tool head 20, chuck 14 and spindle 18. A substrate 12
is disposed on the chuck 14, and is brought via relative motion to
be under the tool head 20. A vacuum preloaded air bearing 22 at the
end of the tool head 20 is used to reference the top side of the
substrate 12. The chuck 14 includes movable substrate 12 retention
pieces 16, which allow the substrate 12 to move up and down to some
extent, so that the vertical registration of the substrate 12 with
reference to the tool head 20 is accomplished to a fine degree with
the air bearing 22, and only to a gross degree with the chuck 14.
In other words, the chuck 14 brings the substrate 12 adjacent the
head 20, and the air bearing 22 adjusts the vertical distance of
the upper surface of the substrate 12 to the tool head 20. The
retention pieces 16 in one embodiment hold the substrate 12
substantially fixed in rotation and translation, but not in
elevation.
[0023] The air bearing 22 in one embodiment is attached directly to
the tool head 20, such as a microscope objective 28 within a tool
head orifice 30, as depicted in FIG. 2, and the substrate 12 to be
inspected is then brought to the tool head 20. Once the substrate
12 is brought close enough to the air bearing 22, a vacuum provided
along vacuum source 26 pulls the substrate 12 closer to the head 20
while a pressure provided along pressure source 24 pushes the
substrate 12 away, until the distance between the substrate 12 and
the air bearing 22 creates an equilibrium condition with respect to
the vacuum 26 and the pressure 24.
[0024] In this manner, the substrate 12 is held in a very precise
vertical position regardless of the geometry of the substrate 12,
because the upper surface of the substrate 12 is mechanically
referenced to the tool head 20. Because the air bearing 22 applies
a pressure force that increases as the gap decreases between the
substrate 12 and the air bearing 22, there is only a very low
probability of the substrate 12 ever actually contacting the air
bearing 22, and damaging the surface of the substrate 12. Thus,
this method of referencing the surface of the substrate 12 is
essentially a non contact method. Further, filtering the gas in the
pressure source 24 makes this method substantially compatible with
highly contamination sensitive applications.
[0025] The air bearing 22 in some embodiments forms a substantially
hermetic seal between the tool head orifice 30 formed in the air
bearing 22 and an environment exterior to the air bearing 22. This
enables a vacuum to be drawn within the tool head orifice 30, such
as would be used for certain types of tools 10, such as an electron
microscope. The air bearing 22 in some embodiments forms a
contamination barrier between the tool head orifice 30 formed in
the air bearing 22, and an environment exterior to the air bearing
22. In this manner, contaminants--such as particulate or vapor
contamination--will not interfere with the proper operation of the
tool 10.
[0026] Different configurations of the air bearing 22 are depicted
in FIGS. 3-6. In FIG. 3, the air bearing 22 has annular vacuum
sources 26 disposed within a porous media in which the pressure
sources 24 are formed, with the tool head orifice 30 disposed in
the center of the air bearing 22. FIG. 4 depicts another embodiment
of the air bearing 22, where the pressure sources 24 are disposed
within a porous media in which the vacuum sources 26 are disposed.
A tool head orifice 30 is centrally disposed in this embodiment as
well.
[0027] In the embodiments depicted, it is appreciated that the
pressure sources 24 and the vacuum sources 26 could be switched as
to any of the specific configurations. Alternately, in some
embodiments some of the openings in the block material of the air
bearing 22 are pressure sources 24 and some of the openings are
vacuum sources 26.
[0028] With reference now to FIGS. 5 and 6, there are depicted some
alternate embodiments of the air bearing 22, where the tool head
orifice 30 is not disposed in the center of the air bearing 22.
FIGS. 7-8 provide some detail as to other embodiments of a
configuration of the pressure source 24 and the vacuum source
26.
[0029] Similar methods could be performed with alternate air
bearing 22 technologies, which utilize either porous media or
orifices, as described above. In one embodiment an electrostatic
chuck with alternating charge areas is used in vacuum environments.
In yet another embodiment, magnetic levitation is used in a non
contact manner of registering the substrate 12 to the tool head
20.
[0030] The embodiments as described above can be used for substrate
12 inspection and measurement tools. As the industry demands finer
and finer resolution, it is a reality that depth of field gets
smaller and smaller. This requires extremely flat chucks 14 to hold
the substrates 12 and extremely precise mechanisms to transport
them under the tool head 20 at a precisely controlled height. The
mechanisms described herein can be attached directly to a tool head
20, thereby reducing the precision necessary in the chuck 14 and
transport mechanism 18, while eliminating the costly auto focus
mechanisms that would otherwise be required to compensate for
substrate 12 and chuck 14 thickness and geometry variations.
[0031] The foregoing description of preferred embodiments for this
invention has been presented for purposes of illustration and
description. It is not intended to be exhaustive or to limit the
invention to the precise form disclosed. Obvious modifications or
variations are possible in light of the above teachings. The
embodiments are chosen and described in an effort to provide the
best illustrations of the principles of the invention and its
practical application, and to thereby enable one of ordinary skill
in the art to utilize the invention in various embodiments and with
various modifications as are suited to the particular use
contemplated. All such modifications and variations are within the
scope of the invention as determined by the appended claims when
interpreted in accordance with the breadth to which they are
fairly, legally, and equitably entitled.
* * * * *