Runyon; J. Rex
Patent Applications and Registrations
Patent applications and USPTO patent grants for Runyon; J. Rex.The latest application filed is for "detecting defects on a wafer using template image matching".
- Runyon; J. Rex - Fremont CA
| Patent | Date |
|---|---|
| Detecting defects on a wafer using template image matching Grant 9,311,698 - Chu , et al. April 12, 2 | 2016-04-12 |
| Air bearing for substrate inspection device Grant 8,817,250 - Doyle , et al. August 26, 2 | 2014-08-26 |
| Detecting Defects on a Wafer Using Template Image Matching App 20140193065 - Chu; Xing ; et al. | 2014-07-10 |
| Referenced Inspection Device App 20120062877 - Doyle; Paul ; et al. | 2012-03-15 |
| Referenced Inspection Device App 20110069306 - Doyle; Paul ; et al. | 2011-03-24 |
| UV compatible programmable spatial filter App 20030184739 - Wilk, Dieter E. ; et al. | 2003-10-02 |
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