U.S. patent application number 09/864737 was filed with the patent office on 2001-09-27 for method for sawing wafers employing multiple indexing techniques for multiple die dimensions.
Invention is credited to Akram, Salman, Gochnour, Derek J., Hembree, David R., Hess, Michael E..
Application Number | 20010023973 09/864737 |
Document ID | / |
Family ID | 25004503 |
Filed Date | 2001-09-27 |
United States Patent
Application |
20010023973 |
Kind Code |
A1 |
Akram, Salman ; et
al. |
September 27, 2001 |
Method for sawing wafers employing multiple indexing techniques for
multiple die dimensions
Abstract
A semiconductor wafer saw and method of using the same for
dicing semiconductor wafers comprising a wafer saw including
variable lateral indexing capabilities and multiple blades. The
wafer saw, because of its variable indexing capabilities, can dice
wafers having a plurality of differently sized semiconductor
devices thereon into their respective discrete components. In
addition, the wafer saw with its multiple blades, some of which may
be independently laterally or vertically movable relative to other
blades, can more efficiently dice silicon wafers into individual
semiconductor devices.
Inventors: |
Akram, Salman; (Boise,
ID) ; Gochnour, Derek J.; (Boise, ID) ; Hess,
Michael E.; (Kuna, ID) ; Hembree, David R.;
(Boise, ID) |
Correspondence
Address: |
TRASK BRITT
P.O. BOX 2550
SALT LAKE CITY
UT
84110
US
|
Family ID: |
25004503 |
Appl. No.: |
09/864737 |
Filed: |
May 23, 2001 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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09864737 |
May 23, 2001 |
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09567262 |
May 9, 2000 |
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6255196 |
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09567262 |
May 9, 2000 |
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09434147 |
Nov 4, 1999 |
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6196096 |
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09434147 |
Nov 4, 1999 |
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09270539 |
Mar 17, 1999 |
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6155247 |
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09270539 |
Mar 17, 1999 |
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09069561 |
Apr 29, 1998 |
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6119675 |
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09069561 |
Apr 29, 1998 |
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08747299 |
Nov 12, 1996 |
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6250192 |
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Current U.S.
Class: |
257/499 |
Current CPC
Class: |
Y10T 83/7868 20150401;
Y10T 83/7726 20150401; H01L 21/67092 20130101; Y10T 83/0363
20150401; B28D 5/024 20130101; B28D 5/029 20130101; Y10T 83/7809
20150401; Y10T 83/04 20150401; Y10T 83/0222 20150401; Y10T 83/0524
20150401 |
Class at
Publication: |
257/499 |
International
Class: |
H01L 029/00 |
Claims
What is claimed is:
1. A semiconductor device substrate including at least two
different types of electronic elements, at least one of said at
least two types of electronic elements comprising a semiconductor
device.
2. The semiconductor device substrate of claim 1, comprising at
least a portion of a wafer including semiconductor material.
3. The semiconductor device substrate of claim 1, wherein each of
said at least two different types of electronic elements comprises
a component of a radio-frequency ID device.
4. The semiconductor device substrate of claim 1, wherein at least
one of said at least two different types of electronic elements
comprises at least one of a battery, an integrated circuit chip,
and an antenna.
5. The semiconductor device substrate of claim 1, including columns
of electronic elements, at least one of said columns comprising at
least one electronic element of a different type than a type of
electronic element in a column adjacent thereto.
6. The semiconductor device substrate of claim 5, wherein said at
least one electronic element of said different type has a different
width than said type of electronic element in said column adjacent
thereto.
7. The semiconductor device substrate of claim 5, wherein said at
least one electronic element of said different type comprises one
of a battery, an integrated circuit chip, and an antenna and said
type of electronic element in said column adjacent thereto
comprises another of a battery, an integrated circuit chip, and an
antenna.
8. The semiconductor device substrate of claim 1, wherein said at
least two electronic elements have different sizes from one
another.
9. A semiconductor device substrate including a plurality of
different types of electronic elements to be used in a single
electronic device, comprising: a first electronic element type; and
a second electronic element type having a lateral dimension that
differs from a corresponding lateral dimension of said first
electronic element type.
10. The semiconductor device substrate of claim 9, further
comprising a third electronic element type.
11. The semiconductor device substrate of claim 9, wherein
electronic elements of each column of semiconductor devices formed
thereon are of the same electronic element type.
12. The semiconductor device substrate of claim 9, wherein a first
column of semiconductor devices formed thereon includes at least
one electronic element having a different width than an adjacent
semiconductor device located in a second column adjacent to said
first column.
13. The semiconductor device substrate of claim 9, wherein the
single electronic device comprises a radio-frequency ID device.
14. The semiconductor device substrate of claim 13, wherein said
first electronic element type comprises one of a battery, an
integrated circuit chip, and an antenna.
15. The semiconductor device substrate of claim 14, wherein said
second electronic element type comprises another of a battery, an
integrated circuit chip, and an antenna.
16. The semiconductor device substrate of claim 15, comprising a
third electronic element type which comprises yet another of a
battery, an integrated circuit chip, and an antenna.
17. A semiconductor device substrate including a plurality of
electronic elements to be used in a radio-frequency ID device,
comprising: a first electronic element type comprising one of a
battery, an integrated circuit chip, and an antenna; and a second
electronic element type comprising another of a battery, an
integrated circuit chip, and an antenna.
18. The semiconductor device substrate of claim 17, further
comprising a third electronic element type comprising yet another
of a battery, an integrated circuit chip, and an antenna.
19. The semiconductor device substrate of claim 18, wherein said
first electronic element type has a different lateral dimension
than a corresponding lateral dimension of said second electronic
element type.
20. The semiconductor device substrate of claim 19, wherein said
lateral dimension comprises width.
21. The semiconductor device substrate of claim 20, comprising a
first column consisting essentially of electronic elements of said
first electronic element type and an adjacent, second column
consisting essentially of electronic elements of said second
electronic element type.
Description
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application is a continuation of application Ser. No.
09/567,262, filed May 9, 2000, pending, which is a divisional of
application Ser. No. 09/434,147, filed Nov. 4, 1999, now U.S. Pat.
No. 6,196,096 B1, issued Mar. 6, 2001, which is a continuation of
application Ser. No. 09/270,539, filed Mar. 17, 1999, abandoned,
which is a divisional of application Ser. No. 09/069,561, filed
Apr. 29, 1998, abandoned, which is a divisional of application Ser.
No. 08/747,299, filed Nov. 12, 1996, pending.
BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] This invention relates generally to a method and apparatus
for sawing semiconductor substrates such as wafers and, more
specifically, to a wafer saw and method of using the same employing
multiple indexing techniques and multiple blades for more efficient
sawing and for sawing multiple die sizes and shapes from a single
semiconductor wafer.
[0004] 2. State of the Art
[0005] An individual integrated circuit or chip is usually formed
from a larger structure known as a semiconductor wafer, which is
usually comprised primarily of silicon, although other materials
such as gallium arsenide and indium phosphide are also sometimes
used. Each semiconductor wafer has a plurality of integrated
circuits arranged in rows and columns with the periphery of each
integrated circuit being rectangular. Typically, the wafer is sawn
or "diced" into rectangularly shaped discrete integrated circuits
along two mutually perpendicular sets of parallel lines or streets
lying between each of the rows and columns thereof Hence, the
separated or singulated integrated circuits are commonly referred
to as dice.
[0006] One exemplary wafer saw includes a rotating dicing blade
mounted to an aluminum hub and attached to a rotating spindle, the
spindle being connected to a motor. Cutting action of the blade may
be effected by diamond particles bonded thereto, or a traditional
"toothed" type blade may be employed. Many rotating wafer saw blade
structures are known in the art. The present invention is
applicable to any saw blade construction, so further structures
will not be described herein.
[0007] Because semiconductor wafers in the art usually contain a
plurality of substantially identical integrated circuits arranged
in rows and columns, two sets of mutually parallel streets
extending perpendicular to each other over substantially the entire
surface of the wafer are formed between each discrete integrated
circuit and are sized to allow passage of a wafer saw blade between
adjacent integrated circuits without affecting any of their
internal circuitry. A typical wafer sawing operation includes
attaching the semiconductor wafer to a wafer saw carrier,
mechanically, adhesively or otherwise as known in the art, and
mounting the wafer saw carrier on the table of the wafer saw. A
blade of the wafer saw is passed through the surface of the
semiconductor wafer, either by moving the blade relative to the
wafer, the table of the saw and the wafer relative to a stationary
blade, or a combination of both. To dice the wafer, the blade cuts
precisely along each street, returning back over (but not in
contact with) the wafer while the wafer is laterally indexed to the
next cutting location. Once all cuts associated with mutually
parallel streets having one orientation are complete, either the
blade is rotated 90.degree. relative to the wafer or the wafer is
rotated 90.degree., and cuts are made through streets in a
direction perpendicular to the initial direction of cut. Since each
integrated circuit on a conventional wafer has the same size and
rectangular configuration, each pass of the wafer saw blade is
incrementally indexed one unit (a unit being equal to the distance
from one street to the next) in a particular orientation of the
wafer. As such, the wafer saw and the software controlling it are
designed to provide uniform and precise indexing in fixed
increments across the surface of a wafer.
[0008] It may, however, be desirable to design and fabricate a
semiconductor wafer having various integrated circuits and other
semiconductor devices thereon, each of which may be of a different
size. For example, in radio-frequency ID (RFID) applications, a
battery, chip and antenna could be incorporated into the same wafer
such that all semiconductor devices of an RFID electronic device
are fabricated from a single semiconductor wafer. Alternatively,
memory dice of different capacities, for example, 4, 16 and 64
megabyte DRAMs, might be fabricated on a single wafer to maximize
the use of silicon "real estate" and reduce thiefage or waste of
material near the periphery of the almost-circular (but for the
flat) wafer. Such semiconductor wafers, in order to be diced,
however, would require modifications to and/or replacement of
existing wafer saw hardware and software.
SUMMARY OF THE INVENTION
[0009] Accordingly, an apparatus and method for sawing
semiconductor wafers, including wafers having a plurality of
semiconductor devices of different sizes and/or shapes therein, is
provided. In particular, the present invention provides a wafer saw
and method of using the same capable of "multiple indexing" of a
wafer saw blade or blades to provide the desired cutting
capabilities. As used herein, the term "multiple indexing"
contemplates and encompasses both the lateral indexing of a saw
blade at multiples of a fixed interval and at varying intervals
which may not comprise exact multiples of one another. Thus, for
conventional wafer configurations containing a number of equally
sized integrated circuits, the wafer saw and method herein can
substantially simultaneously saw the wafers with multiple blades
and therefore cut more quickly than single blade wafer saws known
in the art. Moreover, for wafers having a plurality of
differently-sized or shaped integrated circuits, the apparatus and
method herein provides a multiple indexing capability to cut
non-uniform dice from the same wafer.
[0010] In a preferred embodiment, a single-blade, multi-indexing
saw is provided for cutting a wafer containing variously configured
integrated circuits. By providing multiple-indexing capabilities,
the wafer saw can sever the wafer into differently sized dice
corresponding to the configuration of the integrated circuits
contained thereon.
[0011] In another preferred embodiment, a wafer saw is provided
having at least two wafer saw blades spaced a lateral distance from
one another and having their centers of rotation in substantial
parallel mutual alignment. The blades are preferably spaced apart a
distance equal to the distance between adjacent streets on the
wafer in question. With such a saw configuration, multiple parallel
cuts through the wafer can be made substantially simultaneously,
thus essentially increasing the speed of cutting a wafer by the
number of blades utilized in tandem. Because of the small size of
the individual integrated circuits and the correspondingly small
distances between adjacent streets on the wafer, it may be
desirable to space the blades of the wafer saw more than one street
apart. For example, if the blades of a two-blade saw are spaced two
streets apart, a first pass of the blades would cut the first and
third laterally separated streets. A second pass of the blades
through the wafer would cut through the second and fourth streets.
The blades would then be indexed to cut through the fifth and
seventh streets, then sixth and eighth, and so on.
[0012] In another preferred embodiment, at least one blade of a
multi-blade saw is independently raisable relative to the other
blade or blades when only a single cut is desired on a particular
pass of the carriage. Such a saw configuration has special utility
where the blades are spaced close enough to cut in parallel on
either side of larger integrated circuits, but use single blade
capability for dicing any smaller integrated circuits. For example,
a first pass of the blades of a two blade saw could cut a first set
of adjacent streets defining a column of larger integrated circuits
of the wafer. One blade could then be independently raised or
elevated to effect a subsequent pass of the remaining blade cutting
along a street that may be too laterally close to an adjacent
street to allow both blades to cut simultaneously, or that merely
defines a single column of narrower dice. This feature would also
permit parallel scribing of the surface of the wafer to mutually
isolate conductors from, for example, tie bars or other common
links required during fabrication, with subsequent passage by a
single blade indexed to track between the scribe lines to
completely sever or singulate the adjacent portions of the
wafer.
[0013] In yet another preferred embodiment, at least one blade of a
multi-blade saw is independently laterally translatable relative to
the other blade or blades. Thus, in a two-blade saw, for example,
the blades could be laterally adjusted between consecutive saw
passes of the sawing operation to accommodate different widths
between streets. It should be noted that this preferred embodiment
could be combined with other embodiments herein to provide a wafer
saw that has blades that are both laterally translatable and
independently raisable, or one translatable and one raisable, as
desired.
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
[0014] FIG. 1 is a schematic side view of a first preferred
embodiment of a wafer saw in accordance with the present
invention;
[0015] FIG. 2 is a schematic front view of the wafer saw
illustrated in FIG. 1;
[0016] FIG. 3 is a schematic front view of a second embodiment of a
wafer saw in accordance with the present invention;
[0017] FIG. 4 is a schematic view of a first silicon semiconductor
wafer having a conventional configuration to be diced with the
wafer saw of the present invention;
[0018] FIG. 5 is a schematic view of a second silicon semiconductor
wafer having variously sized semiconductor devices therein to be
diced with the wafer saw of the present invention;
[0019] FIG. 6 is a schematic front view of a third embodiment of a
wafer saw in accordance with the present invention;
[0020] FIG. 7 is a schematic view of a third silicon semiconductor
wafer having variously sized semiconductor devices therein to be
diced with the wafer saw of the present invention;
[0021] FIG. 8 is a top elevation of a portion of a semiconductor
substrate bearing conductive traces connected by tie bars; and
[0022] FIG. 9 is a top elevation of a portion of a semiconductor
substrate bearing three different types of components formed
thereon.
DETAILED DESCRIPTION OF THE INVENTION
[0023] As illustrated in FIGS. 1 and 2, an exemplary wafer saw 10
according to the invention is comprised of a base 12 to which
extension arms 14 and 15 suspended by support 16 are attached. A
wafer saw blade 18 is attached to a spindle or hub 20 which is
rotatably attached to the extension arm 15. The blade 18 may be
secured to the hub 20 and extension arm 15 by a threaded nut 21 or
other means of attachment known in the art. The wafer saw 10 also
includes a translatable wafer table 22 movably attached in both X
and Y directions (as indicated by arrows in FIGS. 1 and 2) to the
base 12. Alternatively, blade 18 may be translatable relative to
the table 22 to achieve the same relative X-Y movement of the blade
18 to the table 22. A silicon wafer 24 to be scribed or sawed may
be securely mounted to the table 22. As used herein, the term "saw"
includes scribing of a wafer, the resulting scribe line 26 not
completely extending through the wafer substrate. Further, the term
"wafer" includes traditional full semiconductor wafers of silicon,
gallium arsenide, or indium phosphide and other semiconductor
materials, partial wafers, and equivalent structures known in the
art wherein a semiconductor material table or substrate is present.
For example, so-called silicon-on-insulator or "SOI" structures,
wherein silicon is carried on a glass, ceramic or sapphire ("SOS")
base, or other such structures as known in the art, are encompassed
by the term "wafer" as used herein. Likewise, "semiconductor
substrate" may be used to identify wafers and other structures to
be singulated into smaller elements.
[0024] The saw 10 is capable of lateral multi-indexing of the table
22 or blade 18 or, in other words, translatable from side-to-side
in FIG. 2 and into and out of the plane of the page in FIG. 1
various non-uniform distances. As noted before, such non-uniform
distances may be mere multiples of a unit distance, or may comprise
unrelated varying distances, as desired. Accordingly, a wafer 24
having variously sized integrated circuits or other electronic
devices, elements, or components therein may be sectioned or diced
into its non-uniformly sized components by the multi-indexing wafer
saw 10. In addition, as previously alluded, the saw 10 may be used
to create scribe lines or cuts that do not extend through the wafer
24. The wafer 24 can then subsequently be diced by other methods
known in the art or sawed completely through after the blade 18 has
been lowered to traverse the wafer to its full depth or
thickness.
[0025] Before proceeding further, it will be understood and
appreciated that design and fabrication of a wafer saw according to
the invention having the previously-referenced, multi-indexing
capabilities, independent lateral blade translation and independent
blade raising or elevation are within the ability of one of
ordinary skill in the art, and that likewise the control of such a
device to effect the multiple-indexing (whether in units of fixed
increments or otherwise), lateral blade translation and blade
elevation may be effected by suitable programming of the
software-controlled operating system, as known in the art.
Accordingly, no further description of hardware components or of a
control system to effectuate operation of the apparatus of the
invention is necessary.
[0026] Referring now to FIG. 3, another illustrated embodiment of a
wafer saw 30 is shown having two laterally-spaced blades 32 and 34
with their centers of rotation in substantial parallel alignment
transverse to the planes of the blades. For a conventional,
substantially circular silicon semiconductor wafer 40 (flat
omitted), as illustrated in FIG. 4, having a plurality of similarly
configured integrated circuits 42 arranged in evenly spaced rows
and columns, the blades can be spaced a distance D substantially
equal to the distance between adjacent streets 44 defining the
space between each integrated circuit 42. In addition, if the
streets 44 of wafer 40 are too closely spaced for side-by-side
blades 32 and 34 to cut along adjacent streets, the blades 32 and
34 can be spaced a distance D substantially equal to the distance
between two or more streets. For example, a first pass of the
blades 32 and 34 could cut along streets 44a and 44c and a second
pass along streets 44b and 44d. The blades could then be indexed to
cut the next series of streets and the process repeated for streets
44e, 44f, 44g, and 44h. If, however, the integrated circuits of a
wafer 52 have various sizes, such as integrated circuits 50 and 51
as illustrated in FIG. 5, at least one blade 34 is laterally
translatable relative to the other blade 32 to cut along the
streets, such as street 56, separating the variously sized
integrated circuits 50. The blade 34 may be variously translatable
by a stepper motor 36 having a lead screw 38 or by other devices
known in the art, such as high precision gearing in combination
with an electric motor or hydraulics, or other suitable mechanical
drive and control assemblies. For a wafer 52, the integrated
circuits, such as integrated circuits 50 and 51, may be diced by
setting the blades 32 and 34 to simultaneously cut along streets 56
and 57, indexing the blades, setting them to a wider lateral spread
and cutting along streets 58 and 59, indexing the blades while
monitoring the same lateral spread or separation and cutting along
streets 60 and 61, and then narrowing the blade spacing and
indexing the blades and cutting along streets 62 and 63. The wafer
52 could then be rotated 90.degree., as illustrated by the arrow in
FIG. 5, and the blade separation and indexing process repeated for
streets 64 and 65, streets 66 and 67, and streets 68 and 69.
[0027] As illustrated in FIG. 6, a wafer saw 70 according to the
present invention is shown having two blades 72 and 74, one of
which is independently raisable (as indicated by an arrow) relative
to the other. As used herein, the term "raisable" includes vertical
translation either up or down. Such a configuration may be
beneficial for situations where the distance between adjacent
streets is less than the minimum lateral achievable distance
between blades 72 and 74, or only a single column of narrow dice is
to be cut, such as at the edge of a wafer. Thus, when cutting a
wafer 80, as better illustrated in FIG. 7, the two blades 72 and 74
can make a first pass along streets 82 and 83. One blade 72 can
then be raised, the wafer 80 indexed relative to the unraised blade
74 and a second pass performed along street 84 only. Blade 72 can
then be lowered and the wafer 80 indexed for cutting along streets
85 and 86. The process can be repeated for streets 87 (single-blade
pass), 88, and 89 (double-blade pass). The elevation mechanism 76
for blade 72 may comprise a stepper motor, a precision-geared
hydraulic or electric mechanism, a pivotable arm which is
electrically, hydraulically or pneumatically powered, or other
means well known in the art.
[0028] Finally, it may be desirable to combine the lateral
translation feature of the embodiment of the wafer saw 30
illustrated in FIG. 3 with the independent blade raising feature of
the wafer saw 70 of FIG. 6. Such a wafer saw could use a single
blade to cut along streets that are too closely spaced for
dual-blade cutting or in other suitable situations, and use both
blades to cut along variously spaced streets where the lateral
distance between adjacent streets is sufficient for both blades to
be engaged.
[0029] It will be appreciated by those skilled in the art that the
embodiments herein described while illustrating certain embodiments
are not intended to so limit the invention or the scope of the
appended claims. More specifically, this invention, while being
described with reference to semiconductor wafers containing
integrated circuits or other semiconductor devices, has equal
utility to any type of substrate to be scribed or singulated. For
example, fabrication of test inserts or chip carriers formed from a
silicon (or other semiconductor) wafer and used to make temporary
or permanent chip-to-wafer, chip-to-chip and chip-to-carrier
interconnections and that are cut into individual or groups of
inserts, as described in U.S. Pat. Nos. 5,326,428 and 4,937,653,
may benefit from the multi-indexing method and apparatus described
herein.
[0030] For example, illustrated in FIG. 8, a semiconductor
substrate 100 may have traces 102 formed thereon by
electrodeposition techniques requiring connection of a plurality of
traces 102 through a tie bar 104. A two-blade saw in accordance
with the present invention may be employed to simultaneously scribe
substrate 100 along parallel lines 106 and 108 flanking a street
110 in order to sever tie bars 104 of adjacent substrate segments
112 from their associated traces 102. Following such severance, the
two columns of adjacent substrate segments 112 (corresponding to
what would be termed "dice" if integrated circuits were formed
thereon) are completely severed along street 110 after the
two-blade saw is indexed for alignment of one blade therewith, and
the other blade raised out of contact with substrate 100.
Subsequently, when either the saw or the substrate carrier is
rotated 90.degree., singulation of the segments 112 is completed
along mutually parallel streets 114. Thus, substrate segments 112
for test or packaging purposes may be fabricated more efficiently
in the same manner as dice and in the same sizes and shapes.
[0031] Further, and as previously noted, RFID modules may be more
easily fabricated when all components of a module are formed on a
single wafer and retrieved therefrom for placement on a carrier
substrate providing mechanical support and electrical
interconnection between components.
[0032] As shown in FIG. 9, a portion of a substrate 200 is depicted
with three adjacent columns of varying-width segments, the three
widths of segments illustrating batteries 202, chips 204 and
antennas 206 of an RFID device. With all of the RFID components
formed on a single substrate 200, an RFID module may be assembled
by a single pick-and-place apparatus at a single work station.
Thus, complete modules may be assembled without transfer of
partially-assembled modules from one station to the next to add
components. Of course, this approach may be employed to any module
assembly wherein all of the components are capable of being
fabricated on a single semiconductor substrate. Fabrication of
different components by semiconductor device fabrication techniques
known in the art is within the ability of those of ordinary skill
in the art and, therefore, no detailed explanation of the
fabrication process leading to the presence of different components
on a common wafer or other substrate is necessary. Masking of
semiconductor device elements not involved in a particular process
step is widely practiced, and so similar isolation of entire
components is also easily effected to protect the elements of a
component until the next process step with which it is
involved.
* * * * *