| Patent | Date |
|---|
Microscopes with objective assembly crash detection and methods of utiliizing the same
Grant 11,454,799 - Gisler , et al. September 27, 2 | 2022-09-27 |
Method of centering probe head in mounting frame
App 20220276281 - Ghosh; Kalyanjit ; et al. | 2022-09-01 |
Probe Head Including a Guide Plate with Angled Holes to Determine Probe Flexure Direction
App 20220236304 - Collins; Sterling Tadashi ; et al. | 2022-07-28 |
Probe Systems Configured To Test A Device Under Test And Methods Of Operating The Probe Systems
App 20220236303 - Schindler; Martin ; et al. | 2022-07-28 |
Double-sided probe systems with thermal control systems and related methods
Grant 11,378,619 - Sameshima July 5, 2 | 2022-07-05 |
Probe systems and methods for testing a device under test
Grant 11,346,883 - Negishi May 31, 2 | 2022-05-31 |
Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure
Grant 11,313,936 - Frankel , et al. April 26, 2 | 2022-04-26 |
Probe on carrier architecture for vertical probe arrays
Grant 11,293,947 - Selvaraj , et al. April 5, 2 | 2022-04-05 |
Methods for maintaining gap spacing between an optical probe of a probe system and an optical device of a device under test, and probe systems that perform the methods
Grant 11,204,383 - Frankel December 21, 2 | 2021-12-21 |
Multi-Conductor Transmission Line Probe
App 20210389348 - Lesher; Tim ; et al. | 2021-12-16 |
Methods Of Producing Augmented Probe System Images And Associated Probe Systems
App 20210373073 - Lord; Anthony James ; et al. | 2021-12-02 |
3D electrical integration using component carrier edge connections to a 2D contact array
App 20210375733 - Henson; Roy J. ; et al. | 2021-12-02 |
Probe systems and methods including electric contact detection
Grant 11,181,550 - Beng , et al. November 23, 2 | 2021-11-23 |
MEMS probe card assembly having decoupled electrical and mechanical probe connections
Grant 11,156,640 - Selvaraj , et al. October 26, 2 | 2021-10-26 |
Electrical test probes having decoupled electrical and mechanical design
Grant 11,156,637 - Kister , et al. October 26, 2 | 2021-10-26 |
Probe systems for optically probing a device under test and methods of operating the probe systems
Grant 11,131,709 - Frankel , et al. September 28, 2 | 2021-09-28 |
Beamforming Device Testing
App 20210211210 - Rosenauer; Dennis ; et al. | 2021-07-08 |
Probe tip with embedded skate
Grant 11,054,443 - Kister , et al. July 6, 2 | 2021-07-06 |
Probe systems and methods
Grant 11,047,879 - Fisher , et al. June 29, 2 | 2021-06-29 |
Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems
Grant 11,047,795 - Negishi , et al. June 29, 2 | 2021-06-29 |
Double-sided Probe Systems With Thermal Control Systems And Related Methods
App 20210190860 - Sameshima; Masahiro | 2021-06-24 |
Methods of controlling the operation of probe stations and probe stations that perform the methods, the methods including generating and executing a test routine that directs the probe station to electrically test a test subset of a plurality of DUTs and to pre-test a pre-test subset of a plurality
Grant 11,016,121 - Beng , et al. May 25, 2 | 2021-05-25 |
Probe on carrier architecture for vertical probe arrays
App 20200341030 - Selvaraj; Mukesh ; et al. | 2020-10-29 |
Shielding for vertical probe heads
Grant 10,598,697 - Eldridge | 2020-03-24 |
Vertical probe array having a tiled membrane space transformer
Grant 10,578,649 - Eldridge , et al. | 2020-03-03 |
Probe head with inductance reducing structure
Grant 10,527,647 - Eldridge , et al. J | 2020-01-07 |
Electrical test probes having decoupled electrical and mechanical design
App 20190383857 - Kister; January ; et al. | 2019-12-19 |
Probe tip with embedded skate
App 20190293685 - Kister; January ; et al. | 2019-09-26 |
Probes with spring mechanisms for impeding unwanted movement in guide holes
Grant 10,359,447 - Breinlinger , et al. | 2019-07-23 |
LED light source probe card technology for testing CMOS image scan devices
Grant 10,352,870 - Kawamata , et al. July 16, 2 | 2019-07-16 |
MEMS Probe Card Assembly having Decoupled Electrical and Mechanical Probe connections
App 20190128924 - Selvaraj; Mukesh ; et al. | 2019-05-02 |
Direct Metalized Guide Plate
App 20190120876 - Cosman; Jason William ; et al. | 2019-04-25 |
Contactor devices with carbon nanotube probes embedded in a flexible film and processes of making such
Grant 10,266,402 - Yaglioglu , et al. | 2019-04-23 |
Vertical probe array having a tiled membrane space transformer
App 20190064220 - Eldridge; Benjamin N. ; et al. | 2019-02-28 |
Multipath electrical probe and probe assemblies with signal paths through secondary paths between electrically conductive guide plates
Grant 10,132,833 - Eldridge November 20, 2 | 2018-11-20 |
Probe Head with Inductance Reducing Structure
App 20180299486 - Eldridge; Benjamin N. ; et al. | 2018-10-18 |
Shielding for Vertical Probe Heads
App 20180196086 - Eldridge; Benjamin N. | 2018-07-12 |
Probes with programmable motion
Grant 10,006,938 - Breinlinger , et al. June 26, 2 | 2018-06-26 |
LED light source probe card technology for testing CMOS image scan devices
App 20180164223 - Kawamata; Nobuhiro ; et al. | 2018-06-14 |
Floating nest for a test socket
Grant 9,958,476 - Eldridge May 1, 2 | 2018-05-01 |
Wiring substrate with filled vias to accommodate custom terminals
Grant 9,869,697 - Powell January 16, 2 | 2018-01-16 |
Non-linear vertical leaf spring
Grant 9,702,904 - Breinlinger , et al. July 11, 2 | 2017-07-11 |
Automated attaching and detaching of an interchangeable probe head
Grant 9,689,915 - Kasai , et al. June 27, 2 | 2017-06-27 |
Floating Nest for a Test Socket
App 20170146566 - Eldridge; Benjamin N. | 2017-05-25 |
Wiring Substrate With Filled Vias To Accommodate Custom Terminals
App 20170067937 - Powell; Shawn | 2017-03-09 |
Probe card assembly for testing electronic devices
Grant 9,588,139 - Fan , et al. March 7, 2 | 2017-03-07 |
Wiring substrate with filled vias to accommodate custom terminals
Grant 9,523,715 - Powell December 20, 2 | 2016-12-20 |
Multiple contact probes
Grant 9,316,670 - Kister April 19, 2 | 2016-04-19 |
Probe retention arrangement
Grant 9,310,428 - Kister , et al. April 12, 2 | 2016-04-12 |
Vertical probe array arranged to provide space transformation
Grant 9,274,143 - Kister March 1, 2 | 2016-03-01 |
Hybrid electrical contactor
Grant 9,229,029 - Breinlinger January 5, 2 | 2016-01-05 |
Probes with offset arm and suspension structure
Grant 9,121,868 - Kister September 1, 2 | 2015-09-01 |
Layered probes with core
Grant 9,097,740 - Kister August 4, 2 | 2015-08-04 |
Attachment of an electrical element to an electronic device using a conductive material
Grant 9,081,037 - Kim July 14, 2 | 2015-07-14 |
Multiple Contact Probes
App 20150192615 - Kister; January | 2015-07-09 |
Probe with cantilevered beam having solid and hollow sections
Grant 9,052,342 - Fan , et al. June 9, 2 | 2015-06-09 |
Wireless probe card verification system and method
Grant 9,037,432 - Kaneko May 19, 2 | 2015-05-19 |
Sharpened, oriented contact tip structures
Grant 9,030,222 - Eldridge , et al. May 12, 2 | 2015-05-12 |
Probe Retention Arrangement
App 20150091596 - Kister; January ; et al. | 2015-04-02 |
Multipath Electrical Probe And Probe Assemblies With Signal Paths Through Secondary Paths Between Electrically Conductive Guide Plates
App 20150015289 - Eldridge; Benjamin N. | 2015-01-15 |
Testing techniques for through-device vias
Grant 8,896,336 - Eldridge November 25, 2 | 2014-11-25 |
Automated Attaching And Detaching Of An Interchangeable Probe Head
App 20140340103 - Kasai; Toshihiro ; et al. | 2014-11-20 |
Probe Card Assembly For Testing Electronic Devices
App 20140327461 - Fan; Li ; et al. | 2014-11-06 |
Wafer test cassette system
Grant 8,872,532 - Breinlinger , et al. October 28, 2 | 2014-10-28 |
Elastic encapsulated carbon nanotube based electrical contacts
Grant 8,872,176 - Fang , et al. October 28, 2 | 2014-10-28 |
Method and apparatus for testing devices using serially controlled intelligent switches
Grant 8,872,534 - Berry , et al. October 28, 2 | 2014-10-28 |
Fine pitch guided vertical probe array having enclosed probe flexures
Grant 8,829,937 - Kister September 9, 2 | 2014-09-09 |
Methods and apparatuses for dynamic probe adjustment
Grant 8,781,779 - Casler, Jr. , et al. July 15, 2 | 2014-07-15 |
Carbon nanotube contact structures for use with semiconductor dies and other electronic devices
Grant 8,756,802 - Gritters , et al. June 24, 2 | 2014-06-24 |
Probe card stiffener with decoupling
Grant 8,736,294 - Chang , et al. May 27, 2 | 2014-05-27 |
Contactor Devices With Carbon Nanotube Probes Embedded In A Flexible Film And Processes Of Making Such
App 20140139250 - Yaglioglu; Onnik ; et al. | 2014-05-22 |
Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide Holes
App 20140118016 - Breinlinger; Keith J. ; et al. | 2014-05-01 |
Pre-aligner search
Grant 8,706,289 - Monteen , et al. April 22, 2 | 2014-04-22 |
Fuel cell using carbon nanotubes
Grant 8,697,301 - Eldridge , et al. April 15, 2 | 2014-04-15 |
Vertical Probes For Multi-pitch Full Grid Contact Array
App 20140043054 - Kister; January | 2014-02-13 |
Probe Fabrication Using Combined Laser And Micro-fabrication Technologies
App 20140044985 - Kister; January | 2014-02-13 |
Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures
Grant 8,638,113 - Crafts , et al. January 28, 2 | 2014-01-28 |
Wiring Substrate With Filled Vias To Accommodate Custom Terminals
App 20130271175 - Powell; Shawn | 2013-10-17 |
Multi-stage spring system
Grant 8,528,885 - Yao September 10, 2 | 2013-09-10 |
Compliance control methods and apparatuses
Grant 8,519,728 - Yalei , et al. August 27, 2 | 2013-08-27 |
Method and apparatus for providing active compliance in a probe card assembly
Grant 8,513,965 - Breinlinger August 20, 2 | 2013-08-20 |
Method of forming a probe substrate by layering probe row structures and probe substrates formed thereby
Grant 8,513,942 - Eldridge , et al. August 20, 2 | 2013-08-20 |
Apparatus and method of testing singulated dies
Grant 8,513,969 - Dozier, II , et al. August 20, 2 | 2013-08-20 |
Space transformers employing wire bonds for interconnections with fine pitch contacts
Grant RE44,407 - Kister August 6, 2 | 2013-08-06 |
Method of wirebonding that utilizes a gas flow within a capillary from which a wire is played out
Grant 8,485,418 - Eldridge , et al. July 16, 2 | 2013-07-16 |
Probes With Programmable Motion
App 20130169301 - Breinlinger; Keith J. ; et al. | 2013-07-04 |
Wiring substrate with customization layers
Grant 8,476,538 - Eldridge , et al. July 2, 2 | 2013-07-02 |
Carbon Nanotube Contact Structures For Use With Semiconductor Dies And Other Electronic Devices
App 20130140057 - Gritters; John K. ; et al. | 2013-06-06 |
Hybrid Electrical Contactor
App 20130135001 - Breinlinger; Keith J. | 2013-05-30 |
Methods And Apparatuses For Dynamic Probe Adjustment
App 20130103338 - Casler, JR.; Richard James ; et al. | 2013-04-25 |
Probe card assembly having an actuator for bending the probe substrate
Grant 8,427,183 - Mathieu , et al. April 23, 2 | 2013-04-23 |
Probe element having a substantially zero stiffness and applications thereof
Grant 8,427,186 - McFarland April 23, 2 | 2013-04-23 |
Vertical Probe Array Arranged To Provide Space Transformation
App 20130093450 - Kister; January | 2013-04-18 |
Method And Apparatus For Designing A Custom Test System
App 20130096866 - Kemmerling; Todd R. | 2013-04-18 |
Probe With Cantilevered Beam Having Solid And Hollow Sections
App 20130082729 - Fan; Li ; et al. | 2013-04-04 |
Method and apparatus for thermally conditioning probe cards
Grant 8,400,173 - Hobbs March 19, 2 | 2013-03-19 |
Wafer level contactor
Grant 8,400,176 - Arkin , et al. March 19, 2 | 2013-03-19 |
Method to build robust mechanical structures on substrate surfaces
Grant 8,383,958 - Grube , et al. February 26, 2 | 2013-02-26 |
Probe card assembly and kit, and methods of making same
Grant 8,373,428 - Eldridge , et al. February 12, 2 | 2013-02-12 |
Carbon nanotube columns and methods of making and using carbon nanotube columns as probes
Grant 8,354,855 - Eldridge , et al. January 15, 2 | 2013-01-15 |
Probe card thermal conditioning system
Grant 8,350,191 - Ondricek January 8, 2 | 2013-01-08 |
Thin wafer chuck
Grant 8,336,188 - Monteen , et al. December 25, 2 | 2012-12-25 |
Increasing thermal isolation of a probe card assembly
Grant 8,324,915 - Yasumura , et al. December 4, 2 | 2012-12-04 |
Stacked die module
Grant 8,324,725 - Khandros , et al. December 4, 2 | 2012-12-04 |
Methods and apparatuses for dynamic probe adjustment
Grant 8,311,758 - Casler, Jr. , et al. November 13, 2 | 2012-11-13 |
Method for improving motion times of a stage
Grant 8,310,195 - Yalei , et al. November 13, 2 | 2012-11-13 |
Non-Linear Vertical Leaf Spring
App 20120242363 - Breinlinger; Keith J. ; et al. | 2012-09-27 |
Anchoring carbon nanotube columns
Grant 8,272,124 - Fang , et al. September 25, 2 | 2012-09-25 |
Wireless Probe Card Verification System And Method
App 20120239339 - Kaneko; Susumu | 2012-09-20 |
Method and apparatus for multilayer support substrate
Grant 8,269,514 - Hobbs , et al. September 18, 2 | 2012-09-18 |
Single support structure probe group with staggered mounting pattern
Grant 8,203,352 - Fan , et al. June 19, 2 | 2012-06-19 |
Probing apparatus with guarded signal traces
Grant 8,203,351 - Eldridge , et al. June 19, 2 | 2012-06-19 |
Probe Card Stiffener With Decoupling
App 20120146679 - Chang; Kevin S. ; et al. | 2012-06-14 |
Elastic Encapsulated Carbon Nanotube Based Electrical Contacts
App 20120086004 - Fang; Treliant ; et al. | 2012-04-12 |
Self-referencing voltage regulator
Grant 8,154,315 - Henson , et al. April 10, 2 | 2012-04-10 |
Process of positioning groups of contact structures
Grant 8,148,646 - Fan , et al. April 3, 2 | 2012-04-03 |
Carbon nanotube spring contact structures with mechanical and electrical components
Grant 8,149,007 - Chen , et al. April 3, 2 | 2012-04-03 |
Pre-aligner search
Grant 8,145,349 - Monteen , et al. March 27, 2 | 2012-03-27 |
Switch for use in microelectromechanical systems (MEMS) and MEMS devices incorporating same
Grant 8,138,859 - Gritters , et al. March 20, 2 | 2012-03-20 |
Electrical guard structures for protecting a signal trace from electrical interference
Grant 8,130,005 - Breinlinger March 6, 2 | 2012-03-06 |
Probe card assembly with carbon nanotube probes having a spring mechanism therein
Grant 8,130,007 - Eldridge , et al. March 6, 2 | 2012-03-06 |
Stiffener assembly for use with testing devices
Grant 8,120,373 - Hobbs , et al. February 21, 2 | 2012-02-21 |
Method and apparatus for processing failures during semiconductor device testing
Grant 8,122,309 - Kemmerling February 21, 2 | 2012-02-21 |
Method for improving motion times of a stage
Grant 8,120,304 - Yalei , et al. February 21, 2 | 2012-02-21 |
Microspring array having reduced pitch contact elements
Grant 8,115,504 - Gritters February 14, 2 | 2012-02-14 |
Method and apparatus for terminating a test signal applied to multiple semiconductor loads under test
Grant 8,098,076 - Chen , et al. January 17, 2 | 2012-01-17 |
Testing Techniques For Through-device Vias
App 20120007626 - Eldridge; Benjamin N. | 2012-01-12 |
Method and apparatus for testing semiconductor devices with autonomous expected value generation
Grant 8,095,841 - Kemmerling January 10, 2 | 2012-01-10 |
Method of expanding tester drive and measurement capability
Grant 8,067,951 - Miller November 29, 2 | 2011-11-29 |
Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches
App 20110267085 - Berry; Tommie Edward ; et al. | 2011-11-03 |
Microelectronic contact structure
Grant 8,033,838 - Eldridge , et al. October 11, 2 | 2011-10-11 |
Wiring Substrate With Customization Layers
App 20110214910 - Eldridge; Benjamin N. ; et al. | 2011-09-08 |
Method of repairing segmented contactor
Grant 8,011,089 - Eslamy , et al. September 6, 2 | 2011-09-06 |
Process and apparatus for adjusting traces
Grant 8,015,536 - Stevens September 6, 2 | 2011-09-06 |
Electronic device with integrated micromechanical contacts and cooling system
Grant 7,999,375 - Hobbs , et al. August 16, 2 | 2011-08-16 |
Methods For Planarizing A Semiconductor Contactor
App 20110193583 - Mathieu; Gaetan L. ; et al. | 2011-08-11 |
Calibration substrate
Grant 7,994,803 - Miller August 9, 2 | 2011-08-09 |
Fuel Cell Using Carbon Nanotubes
App 20110189564 - Eldridge; Benjamin N. ; et al. | 2011-08-04 |
Method of designing a probe card apparatus with desired compliance characteristics
Grant 7,990,164 - Eldridge August 2, 2 | 2011-08-02 |
Segmented Contactor
App 20110171838 - Eslamy; Mohammad ; et al. | 2011-07-14 |
Probe Element Having A Substantially Zero Stiffness And Applications Thereof
App 20110169516 - McFarland; Andrew W. | 2011-07-14 |
Method and apparatus for probe card alignment in a test system
Grant 7,977,956 - Breinlinger , et al. July 12, 2 | 2011-07-12 |
Method and apparatus for testing devices using serially controlled intelligent switches
Grant 7,977,959 - Berry , et al. July 12, 2 | 2011-07-12 |
Bi-directional buffer for interfacing test system channel
Grant 7,977,958 - Miller July 12, 2 | 2011-07-12 |
Test Systems And Methods For Testing Electronic Devices
App 20110156734 - Berry; Tommie E. ; et al. | 2011-06-30 |
Wafer Test Cassette System
App 20110156735 - Breinlinger; Keith J. ; et al. | 2011-06-30 |
Electrical contactor, especially wafer level contactor, using fluid pressure
Grant 7,967,621 - Eldridge June 28, 2 | 2011-06-28 |
Self-monitoring switch
Grant 7,965,084 - Martens , et al. June 21, 2 | 2011-06-21 |
Closed-grid bus architecture for wafer interconnect structure
Grant 7,960,990 - Miller , et al. June 14, 2 | 2011-06-14 |
Mechanical decoupling of a probe card assembly to improve thermal response
Grant 7,960,989 - Breinlinger , et al. June 14, 2 | 2011-06-14 |
Stacked guard structures
Grant 7,956,633 - Eldridge June 7, 2 | 2011-06-07 |
Stiffener assembly for use with testing devices
Grant 7,956,635 - Hobbs , et al. June 7, 2 | 2011-06-07 |
Stiffener Assembly For Use With Testing Devices
App 20110128029 - Hobbs; Eric D. ; et al. | 2011-06-02 |
AC coupled parameteric test probe
Grant 7,952,375 - Eldridge , et al. May 31, 2 | 2011-05-31 |
Multilayered probe card
Grant 7,948,252 - Grube , et al. May 24, 2 | 2011-05-24 |
Integrated circuit tester with high bandwidth probe assembly
App 20110115512 - Miller; Charles A. | 2011-05-19 |
Method and apparatus for providing a tester integrated circuit for testing a semiconductor device under test
Grant 7,944,225 - Kemmerling May 17, 2 | 2011-05-17 |
Providing an electrically conductive wall structure adjacent a contact structure of an electronic device
Grant 7,936,177 - Breinlinger , et al. May 3, 2 | 2011-05-03 |
Contactless interfacing of test signals with a device under test
Grant 7,928,750 - Miller April 19, 2 | 2011-04-19 |
Method and system for designing a probe card
Grant 7,930,219 - Eldridge , et al. April 19, 2 | 2011-04-19 |
Probe card assembly for electronic device testing with DC test resource sharing
Grant 7,924,035 - Huebner April 12, 2 | 2011-04-12 |
Remote test facility with wireless interface to local test facilities
Grant 7,920,989 - Khandros , et al. April 5, 2 | 2011-04-05 |
Attachment Of An Electrical Element To An Electronic Device Using A Conductive Material
App 20110067231 - Kim; Tae Ma | 2011-03-24 |
Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out
App 20110057018 - Eldridge; Benjamin N. ; et al. | 2011-03-10 |
Method And Apparatus For Multilayer Support Substrate
App 20110050265 - HOBBS; ERIC D. ; et al. | 2011-03-03 |
Probe card assembly with an interchangeable probe insert
Grant 7,898,242 - Eldridge , et al. March 1, 2 | 2011-03-01 |
Re-assembly process for MEMS structures
Grant 7,897,435 - Eldridge , et al. March 1, 2 | 2011-03-01 |
Method And Apparatus For Providing Active Compliance In A Probe Card Assembly
App 20110043240 - Breinlinger; Keith | 2011-02-24 |
Wafer Level Contactor
App 20110043233 - Arkin; Brian ; et al. | 2011-02-24 |
Method and apparatus for enhanced probe card architecture
Grant 7,893,701 - Arkin February 22, 2 | 2011-02-22 |
Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer
Grant 7,893,700 - Huebner , et al. February 22, 2 | 2011-02-22 |
Electromagnetically coupled interconnect system architecture
Grant 7,889,022 - Miller February 15, 2 | 2011-02-15 |
Method and apparatus for testing devices using serially controlled resources
Grant 7,888,955 - Berry February 15, 2 | 2011-02-15 |
Stiffener assembly for use with testing devices
Grant 7,884,627 - Hobbs , et al. February 8, 2 | 2011-02-08 |
Method to build a wirebond probe card in a many at a time fashion
Grant 7,884,006 - Eldridge , et al. February 8, 2 | 2011-02-08 |
High Performance Probe System
App 20110025361 - Miller; Charles A. | 2011-02-03 |
Printing of redistribution traces on electronic component
Grant 7,880,489 - Eldridge , et al. February 1, 2 | 2011-02-01 |
Method and apparatus for increasing operating frequency of a system for testing electronic devices
Grant 7,880,486 - Miller February 1, 2 | 2011-02-01 |
Composite motion probing
Grant 7,868,632 - Cooper , et al. January 11, 2 | 2011-01-11 |
Probe card cooling assembly with direct cooling of active electronic components
Grant 7,863,915 - Miller January 4, 2 | 2011-01-04 |
Method And Apparatus For Thermally Conditioning Probe Cards
App 20100327891 - Hobbs; Eric D. | 2010-12-30 |
Sharpened, Oriented Contact Tip Structures
App 20100323551 - Eldridge; Benjamin N. ; et al. | 2010-12-23 |
Single Support Structure Probe Group With Staggered Mounting Pattern
App 20100315111 - Fan; Li ; et al. | 2010-12-16 |
Rotating contact element and methods of fabrication
Grant 7,851,794 - Hobbs December 14, 2 | 2010-12-14 |
Sharing resources in a system for testing semiconductor devices
Grant 7,852,094 - Chraft , et al. December 14, 2 | 2010-12-14 |
Method and apparatus for adjusting a multi-substrate probe structure
Grant 7,845,072 - Hobbs , et al. December 7, 2 | 2010-12-07 |
Spring interconnect structures
Grant 7,841,863 - Mathieu , et al. November 30, 2 | 2010-11-30 |
Apparatus for testing devices
Grant 7,843,202 - Hobbs , et al. November 30, 2 | 2010-11-30 |
Electrical Contactor, Especially Wafer Level Contactor, Using Fluid Pressure
App 20100297863 - Eldridge; Benjamin N. | 2010-11-25 |
Method of repairing a contactor apparatus
Grant 7,836,587 - Kim November 23, 2 | 2010-11-23 |
Alignment features in a probing device
Grant 7,834,647 - Kim , et al. November 16, 2 | 2010-11-16 |
Probe card configuration for low mechanical flexural strength electrical routing substrates
Grant 7,825,674 - Shinde , et al. November 2, 2 | 2010-11-02 |
Method and apparatus for remotely buffering test channels
Grant 7,825,652 - Miller November 2, 2 | 2010-11-02 |
Method and apparatus for providing active compliance in a probe card assembly
Grant 7,825,675 - Breinlinger November 2, 2 | 2010-11-02 |
Method And Apparatus For Probe Card Alignment In A Test System
App 20100271062 - Breinlinger; Keith J. ; et al. | 2010-10-28 |
Test system with wireless communications
Grant 7,821,255 - Khandros , et al. October 26, 2 | 2010-10-26 |
Closed-grid Bus Architecture For Wafer Interconnect Structure
App 20100264947 - Miller; Charles A. ; et al. | 2010-10-21 |
Flexure Band And Use Thereof In A Probe Card Assembly
App 20100264949 - Hobbs; Eric D. | 2010-10-21 |
Methods For Planarizing A Semiconductor Contactor
App 20100263432 - Mathieu; Gaetan L. ; et al. | 2010-10-21 |
Process and apparatus for finding paths through a routing space
Grant 7,814,453 - Stevens , et al. October 12, 2 | 2010-10-12 |
Anchoring Carbon Nanotube Columns
App 20100253375 - Fang; Treliant ; et al. | 2010-10-07 |
Method and apparatus for Terminating A Test Signal Applied To Multiple Semiconductor Loads Under Test
App 20100253374 - Chen; Guang ; et al. | 2010-10-07 |
Carbon Nanotube Contact Structures For Use With Semiconductor Dies And Other Electronic Devices
App 20100252317 - Gritters; John K. ; et al. | 2010-10-07 |
Component assembly and alignment
Grant 7,808,259 - Eldridge , et al. October 5, 2 | 2010-10-05 |
Apparatus And Method Of Testing Singulated Dies
App 20100244873 - Dozier, II; Thomas H. ; et al. | 2010-09-30 |
Microelectronic contact structures
Grant 7,798,822 - Eldridge , et al. September 21, 2 | 2010-09-21 |
Method To Build Robust Mechanical Structures On Substrate Surfaces
App 20100224303 - Grube; Gary W. ; et al. | 2010-09-09 |
Probing Apparatus With Guarded Signal Traces
App 20100225344 - Eldridge; Benjamin N. ; et al. | 2010-09-09 |
Single support structure probe group with staggered mounting pattern
Grant 7,782,072 - Fan , et al. August 24, 2 | 2010-08-24 |
Mechanical decoupling of a probe card assembly to improve thermal response
Grant 7,772,863 - Breinlinger , et al. August 10, 2 | 2010-08-10 |
Electronic package with direct cooling of active electronic components
Grant 7,768,777 - Miller August 3, 2 | 2010-08-03 |
High performance probe system
Grant 7,764,075 - Miller July 27, 2 | 2010-07-27 |
Biased Gap-closing Actuator
App 20100164323 - Hobbs; Eric D. ; et al. | 2010-07-01 |
Method and apparatus for indirect planarization
Grant 7,746,089 - Hobbs , et al. June 29, 2 | 2010-06-29 |
Efficient wired interface for differential signals
Grant 7,746,937 - Miller June 29, 2 | 2010-06-29 |
Printed Solar Panel
App 20100154861 - Gritters; John K. | 2010-06-24 |
Methods for planarizing a semiconductor contactor
Grant 7,737,709 - Mathieu , et al. June 15, 2 | 2010-06-15 |
Microspring Array Having Reduced Pitch Contact Elements
App 20100141290 - Gritters; John K. | 2010-06-10 |
Process For Manufacturing Contact Elements For Probe Card Assembles
App 20100140793 - Fan; Li ; et al. | 2010-06-10 |
Apparatus and method of testing singulated dies
Grant 7,733,106 - Dozier, II , et al. June 8, 2 | 2010-06-08 |
Method to build robust mechanical structures on substrate surfaces
Grant 7,732,713 - Grube , et al. June 8, 2 | 2010-06-08 |
Biased gap-closing actuator
Grant 7,732,975 - Hobbs , et al. June 8, 2 | 2010-06-08 |
Carbon nanotube contact structures
Grant 7,731,503 - Eldridge , et al. June 8, 2 | 2010-06-08 |
Microelectronic contact structure
Grant 7,731,546 - Grube , et al. June 8, 2 | 2010-06-08 |
Mechanical Decoupling Of A Probe Card Assembly To Improve Thermal Response
App 20100134127 - Breinlinger; Keith J. ; et al. | 2010-06-03 |
Mechanical Decoupling Of A Probe Card Assembly To Improve Thermal Response
App 20100134129 - Breinlinger; Keith J. ; et al. | 2010-06-03 |
Thermocentric Alignment Of Elements On Parts Of An Apparatus
App 20100134128 - Hobbs; Eric D. | 2010-06-03 |
Air bridge structures and methods of making and using air bridge structures
Grant 7,729,878 - Mathieu June 1, 2 | 2010-06-01 |
Electrical contactor, especially wafer level contactor, using fluid pressure
Grant 7,722,371 - Eldridge May 25, 2 | 2010-05-25 |
Probing apparatus with guarded signal traces
Grant 7,724,004 - Eldridge , et al. May 25, 2 | 2010-05-25 |
Wafer Level Interposer
App 20100120267 - Eldridge; Benjamin N. ; et al. | 2010-05-13 |
Lithographically defined microelectronic contact structures
Grant 7,714,235 - Pedersen , et al. May 11, 2 | 2010-05-11 |
Contact carriers (tiles) for populating larger substrates with spring contacts
Grant 7,714,598 - Eldridge , et al. May 11, 2 | 2010-05-11 |
Predictive, adaptive power supply for an integrated circuit under test
Grant 7,714,603 - Eldridge , et al. May 11, 2 | 2010-05-11 |
Printing Of Redistribution Traces On Electronic Component
App 20100109688 - Eldridge; Benjamin N. ; et al. | 2010-05-06 |
Carbon Nanotube Contact Structures
App 20100112828 - Eldridge; Benjamin N. ; et al. | 2010-05-06 |
Apparatus And Method For Making And Using A Tooling Die
App 20100104678 - Khandros; Igor Y. ; et al. | 2010-04-29 |
Electronic device testing using a probe tip having multiple contact features
Grant 7,701,243 - Cooper , et al. April 20, 2 | 2010-04-20 |
High density planar electrical interface
Grant 7,699,616 - Miller , et al. April 20, 2 | 2010-04-20 |
Lithographic Contact Elements
App 20100088888 - Mathieu; Gaetan L. ; et al. | 2010-04-15 |
Microelectronic Contact Structure And Method Of Making Same
App 20100093229 - Eldridge; Benjamin N. ; et al. | 2010-04-15 |
Carbon Nanotube Columns And Methods Of Making And Using Carbon Nanotube Columns As Probes
App 20100083489 - Eldridge; Benjamin N. ; et al. | 2010-04-08 |
Sawing tile corners on probe card substrates
Grant 7,692,433 - Eldridge , et al. April 6, 2 | 2010-04-06 |
Test method for yielding a known good die
Grant 7,694,246 - Miller , et al. April 6, 2 | 2010-04-06 |
Process of Positioning Groups of Contact Structures
App 20100078206 - Fan; Li ; et al. | 2010-04-01 |
Method And Apparatus For Providing A Tester Integrated Circuit For Testing A Semiconductor Device Under Test
App 20100079159 - Kemmerling; Todd Ryland | 2010-04-01 |
Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies
Grant 7,688,063 - McFarland , et al. March 30, 2 | 2010-03-30 |
Wafer-level burn-in and test
Grant 7,688,090 - Khandros , et al. March 30, 2 | 2010-03-30 |
Contactor having a global spring structure and methods of making and using the contactor
Grant 7,688,085 - Gritters March 30, 2 | 2010-03-30 |
Method for interconnecting an integrated circuit multiple die assembly
Grant 7,681,309 - Miller March 23, 2 | 2010-03-23 |
Adjustable delay transmission line
Grant 7,683,738 - Miller March 23, 2 | 2010-03-23 |
Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out
App 20100065963 - Eldridge; Benjamin N. ; et al. | 2010-03-18 |
Alignment Features In A Probing Device
App 20100066397 - Kim; Tae Ma ; et al. | 2010-03-18 |
Wireless test system
Grant 7,675,311 - Khandros , et al. March 9, 2 | 2010-03-09 |
Method and apparatus for making a determination relating to resistance of probes
Grant 7,675,299 - Lane March 9, 2 | 2010-03-09 |
Electronic components with plurality of contoured microelectronic spring contacts
Grant 7,675,301 - Eldridge , et al. March 9, 2 | 2010-03-09 |
Resilient contact element and methods of fabrication
Grant 7,674,112 - Gritters , et al. March 9, 2 | 2010-03-09 |
Probe Card Cooling Assembly With Direct Cooling Of Active Electronic Components
App 20100052714 - Miller; Charles A. | 2010-03-04 |
Electromagnetically Coupled Interconnect System Architecture
App 20100045407 - Miller; Charles A. | 2010-02-25 |
Segmented Contactor
App 20100043226 - Eslamy; Mohammad ; et al. | 2010-02-25 |
Remote Test Facility With Wireless Interface To Local Test Facilities
App 20100049356 - Khandros; Igor Y. ; et al. | 2010-02-25 |
Method And Apparatus For Testing Semiconductor Devices With Autonomous Expected Value Generation
App 20100050029 - Kemmerling; Todd Ryland | 2010-02-25 |
Probe Head Controlling Mechanism For Probe Card Assemblies
App 20100039133 - McFarland; Andrew Weston ; et al. | 2010-02-18 |
Voltage Fault Detection And Protection
App 20100039739 - Barbara; Bruce J. ; et al. | 2010-02-18 |
Configuration Of Shared Tester Channels To Avoid Electrical Connections Across Die Area Boundary On A Wafer
App 20100019787 - Huebner; Michael W. ; et al. | 2010-01-28 |
Dc Test Resource Sharing For Electronic Device Testing
App 20100013503 - Huebner; Michael W. | 2010-01-21 |
Method And Apparatus For Calibrating And/or Deskewing Communications Channels
App 20100017662 - Miller; Charles A. | 2010-01-21 |
Method And System For Designing A Probe Card
App 20100011334 - Eldridge; Benjamin N. ; et al. | 2010-01-14 |
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
App 20100000080 - Eldridge; Benjamin N. ; et al. | 2010-01-07 |
Probe Card Thermal Conditioning System
App 20090289050 - ONDRICEK; DOUGLAS S. | 2009-11-26 |
Probe Card Assembly And Kit, And Methods Of Making Same
App 20090291573 - Eldridge; Benjamin N. ; et al. | 2009-11-26 |
Microelectronic Contact Structures, And Methods Of Making Same
App 20090286429 - Eldridge; Benjamin N. ; et al. | 2009-11-19 |
Method And Apparatus For Enhanced Probe Card Architecture
App 20090273358 - Arkin; Brian | 2009-11-05 |
Method Of Expanding Tester Drive And Measurement Capability
App 20090267627 - Miller; Charles A. | 2009-10-29 |
Switch For Use In Microelectromechanical Systems (mems) And Mems Devices Incorporating Same
App 20090260960 - Gritters; John K. ; et al. | 2009-10-22 |
Spring Interconnect Structures
App 20090263986 - Mathieu; Gaetan L. ; et al. | 2009-10-22 |
Self-monitoring Switch
App 20090260962 - Martens; Rodney Ivan ; et al. | 2009-10-22 |
Multi-stage Spring System
App 20090261517 - YAO; JUN JASON | 2009-10-22 |
Wireless Test Cassette
App 20090251162 - Khandros; Igor Y. ; et al. | 2009-10-08 |
Self-Referencing Voltage Regulator
App 20090251123 - Henson; Roy John ; et al. | 2009-10-08 |
Increasing Thermal Isolation Of A Probe Card Assembly
App 20090230981 - Yasumura; Kevin Y. ; et al. | 2009-09-17 |
Method And Apparatus For Processing Failures During Semiconductor Device Testing
App 20090235131 - Kemmerling; Todd Ryland | 2009-09-17 |
Providing An Electrically Conductive Wall Structure Adjacent A Contact Structure Of An Electronic Device
App 20090224785 - Breinlinger; Keith J. ; et al. | 2009-09-10 |
Method And Apparatus For Designing A Custom Test System
App 20090224793 - Kemmerling; Todd Ryland | 2009-09-10 |
Method Of Estimating Channel Bandwidth From A Time Domain Reflectometer (tdr) Measurement
App 20090212790 - Miller; Charles A. ; et al. | 2009-08-27 |
Apparatus And Method For Adjusting Thermally Induced Movement Of Electro-mechanical Assemblies
App 20090206860 - McFarland; Andrew W. ; et al. | 2009-08-20 |
Carbon Nanotube Spring Contact Structures With Mechanical And Electrical Components
App 20090197484 - Chen; Jimmy K. ; et al. | 2009-08-06 |
Closed-grid Bus Architecture For Wafer Interconnect Structure
App 20090179659 - Miller; Charles A. ; et al. | 2009-07-16 |
Method And Apparatus For Adjusting A Multi-substrate Probe Structure
App 20090158586 - Hobbs; Eric D. ; et al. | 2009-06-25 |
Probe Card Assembly With An Interchangeable Probe Insert
App 20090160432 - Eldridge; Benjamin N. ; et al. | 2009-06-25 |
Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System
App 20090164931 - Kemmerling; Todd Ryland | 2009-06-25 |
Method And Apparatus For Making A Determination Relating To Resistance Of Probes
App 20090160464 - Lane; Frederick J. | 2009-06-25 |
Probe Array And Method Of Its Manufacture
App 20090139965 - Mathieu; Gaetan L. ; et al. | 2009-06-04 |
Apparatuses And Methods For Cleaning Test Probes
App 20090139040 - Grube; Gary W. | 2009-06-04 |
Method To Build A Wirebond Probe Card In A Many At A Time Fashion
App 20090142707 - Eldridge; Benjamin N. ; et al. | 2009-06-04 |
System For Measuring Signal Path Resistance For An Integrated Circuit Tester Interconnect Structure
App 20090134905 - Long; John | 2009-05-28 |
Apparatus And Method For Limiting Over Travel In A Probe Card Assembly
App 20090134897 - Cooper; Timothy E. ; et al. | 2009-05-28 |
High Performance Probe System
App 20090134895 - Miller; Charles A. | 2009-05-28 |
Method And Apparatus For Remotely Buffering Test Channels
App 20090132190 - Miller; Charles A. | 2009-05-21 |
Stiffener Assembly For Use With Testing Devices
App 20090108861 - Hobbs; Eric D. ; et al. | 2009-04-30 |
Contactless Interfacing Of Test Signals With A Device Under Test
App 20090102494 - Miller; Charles A. | 2009-04-23 |
Probing A Device
App 20090085592 - Cooper; Timothy E. ; et al. | 2009-04-02 |
Method And Apparatus For Testing Devices Using Serially Controlled Intelligent Switches
App 20090085590 - Berry; Tommie Edward ; et al. | 2009-04-02 |
Method And Apparatus For Testing Devices Using Serially Controlled Resources
App 20090079448 - Berry; Tommie Edward | 2009-03-26 |
Reduced Scrub Contact Element
App 20090079455 - Gritters; John K. | 2009-03-26 |
Component Assembly And Alignment
App 20090079452 - Eldridge; Benjamin N. ; et al. | 2009-03-26 |
Electrical Contactor, Especially Wafer Level Contactor, Using Fluid Pressure
App 20090072848 - Eldridge; Benjamin N. | 2009-03-19 |
Making And Using Carbon Nanotube Probes
App 20090066352 - Gritters; John K. ; et al. | 2009-03-12 |
Process And Apparatus For Adjusting Traces
App 20090055791 - Stevens; Mac | 2009-02-26 |
Air Bridge Structures And Methods Of Making And Using Air Bridge Structures
App 20090051378 - Mathieu; Gaetan L. | 2009-02-26 |
Electronic Package With Direct Cooling Of Active Electronic Components
App 20090032938 - Miller; Charles A. | 2009-02-05 |
Interconnect Assemblies And Methods
App 20090035959 - Eldridge; Benjamin N. ; et al. | 2009-02-05 |
Method and Apparatus For Increasing Operating Frequency Of A System For Testing Electronic Devices
App 20080303541 - Miller; Charles A. | 2008-12-11 |
Method Of Manufacturing A Probe Card
App 20080272794 - Grube; Gary W. ; et al. | 2008-11-06 |
Wafer Level Interposer
App 20080265922 - Eldridge; Benjamin N. ; et al. | 2008-10-30 |
Spring Interconnect Structures
App 20080254651 - Mathieu; Gaetan L. ; et al. | 2008-10-16 |
Method Of Designing A Probe Card Apparatus With Desired Compliance Characteristics
App 20080238458 - Eldridge; Benjamin N. | 2008-10-02 |
Reinforced Contact Elements
App 20080238467 - Gritters; John K. | 2008-10-02 |
Rhodium Electroplated Structures And Methods Of Making Same
App 20080241482 - Armstrong; Michael ; et al. | 2008-10-02 |
Stiffening Connector And Probe Card Assembly Incorporating Same
App 20080231258 - Hobbs; Eric D. ; et al. | 2008-09-25 |
Contact Carriers (tiles) For Populating Larger Substrates With Spring Contacts
App 20080231305 - Khandros; Igor Y. ; et al. | 2008-09-25 |
Adjustment Mechanism
App 20080203268 - Hobbs; Eric D. ; et al. | 2008-08-28 |
Isolation Buffers With Controlled Equal Time Delays
App 20080191722 - Miller; Charles A. | 2008-08-14 |
Apparatus For Testing Devices
App 20080186040 - Hobbs; Eric D. ; et al. | 2008-08-07 |
Probe Card Assembly And Kit
App 20080180121 - Khandros; Igor Y. ; et al. | 2008-07-31 |
Probing Structure With Fine Pitch Probes
App 20080174328 - Miller; Charles A. | 2008-07-24 |
Stiffener Assembly For Use With Testing Devices
App 20080157791 - Hobbs; Eric D. ; et al. | 2008-07-03 |
Rotating Contact Element And Methods Of Fabrication
App 20080157789 - Hobbs; Eric D. | 2008-07-03 |
Resilient Contact Element And Methods Of Fabrication
App 20080157799 - Gritters; John K. ; et al. | 2008-07-03 |
Wafer-level Burn-in And Test
App 20080157808 - Khandros; Igor Y. ; et al. | 2008-07-03 |
Stiffener Assembly For Use With Testing Devices
App 20080157790 - Hobbs; Eric D. ; et al. | 2008-07-03 |
Alignment Features In A Probing Device
App 20080150566 - Kim; Tae Ma ; et al. | 2008-06-26 |
High Density Planar Electrical Interface
App 20080150571 - Miller; Charles A. ; et al. | 2008-06-26 |
Electrical Guard Structures For Protecting A Signal Trace From Electrical Interference
App 20080143358 - Breinlinger; Keith J. | 2008-06-19 |
Reinforced Contact Elements
App 20080143359 - Gritters; John K. | 2008-06-19 |
Sharing Resources In A System For Testing Semiconductor Devices
App 20080136432 - Chraft; Matthew E. ; et al. | 2008-06-12 |
Method Of Making A Socket To Perform Testing On Integrated Circuits And Socket Made
App 20080132095 - Khandros; Igor Y. ; et al. | 2008-06-05 |
Interconnect For Microelectronic Structures With Enhanced Spring Characteristics
App 20080120833 - Mathieu; Gaetan L. ; et al. | 2008-05-29 |
Contact Tip Structure For Microelectronic Interconnection Elements And Methods Of Making Same
App 20080116927 - Dozier; Thomas H. ; et al. | 2008-05-22 |
Lithographic Contact Elements
App 20080115353 - Mathieu; Gaetan L. ; et al. | 2008-05-22 |
Method And Apparatus For Providing Active Compliance In A Probe Card Assembly
App 20080100312 - Breinlinger; Keith | 2008-05-01 |
Intelligent probe card architecture
App 20080100320 - Miller; Charles A. ; et al. | 2008-05-01 |
Method and System for Compensating Thermally Induced Motion of Probe Cards
App 20080094088 - Eldridge; Benjamin N. ; et al. | 2008-04-24 |
Electronic Device With Integrated Micromechanical Contacts And Cooling System
App 20080088010 - Hobbs; Eric D. ; et al. | 2008-04-17 |
Attaching And Interconnecting Dies To A Substrate
App 20080088030 - Eldridge; Benjamin N. ; et al. | 2008-04-17 |
Method And Apparatus For Indirect Planarization
App 20080079449 - Hobbs; Eric D. | 2008-04-03 |
Single Support Structure Probe Group With Staggered Mounting Pattern
App 20080074132 - Fan; Li ; et al. | 2008-03-27 |
Attachment of an Electrical Element to an Electronic Device Using a Conductive Material
App 20080074131 - Kim; Tae Ma | 2008-03-27 |
Method And Apparatus For Making A Determination Relating To Resistance Of Probes
App 20080061803 - Lane; Frederick J. | 2008-03-13 |
Rhodium Sulfate Production For Rhodium Plating
App 20080063594 - Armstrong; Michael J. ; et al. | 2008-03-13 |
Method And Appartus For Switching Tester Resources
App 20080054917 - Henson; Roy J. ; et al. | 2008-03-06 |
Methods For Planarizing A Semiconductor Contactor
App 20080048688 - Mathieu; Gaetan L. ; et al. | 2008-02-28 |
Apparatus And Method For Managing Thermally Induced Motion Of A Probe Card Assembly
App 20080042668 - Eldridge; Benjamin N. ; et al. | 2008-02-21 |
Adjustment Mechanism
App 20080036480 - Hobbs; Eric D. ; et al. | 2008-02-14 |
Closed-grid Bus Architecture For Wafer Interconnect Structure
App 20080024143 - Miller; Charles A. ; et al. | 2008-01-31 |
| 