Sample holder for ionized sample analysis

Description

FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged view showing a portion of FIG. 1 defined by lines 9-9 and 9'-9';

FIG. 10 is an enlarged view showing a portion of FIG. 4 defined by line 10-10;

FIG. 11 is an enlarged view showing a portion of FIG. 7 defined by lines 11-11 and 11'-11';

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 10, in the area designated by 12'-12' in FIG. 9;

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 10, in the area designated by 13'-13' in FIG. 9;

FIG. 14 is an enlarged cross-sectional view along the line 14-14 in FIG. 10, in the area designated by 14'-14' in FIG. 9; and,

FIG. 15 is an enlarged cross-sectional view along the line 15-15 in FIG. 10, in the area designated by 15'-15' in FIG. 9.

The features shown in evenly-dashed broken lines depict portions of the sample holder for ionized sample analysis that form no part of the claimed design. The dot-dash-dot broken lines depict the boundaries of the claim and form no part thereof. The dash-dot-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dot-dash broken lines form no part of the claimed design.

Claims

CLAIM The ornamental design for a sample holder for ionized sample analysis, as shown and described.

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Inventors:	Ohmura; Takayuki (Hamamatsu, JP), Kotani; Masahiro (Hamamatsu, JP)
Applicant:	Name City State Country Type HAMAMATSU PHOTONICS K.K. Hamamatsu-shi, Shizuoka N/A JP
Assignee:	HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka, JP)
Appl. No.:	D/656,968
Filed:	July 18, 2018

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Foreign Application Priority Data

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Jan 19, 2018 [JP]			2018-000948
Jan 19, 2018 [JP]			2018-000949
Jan 19, 2018 [JP]			2018-000950

Current U.S. Class:	D24/226; D24/224
Current International Class:	2402
Field of Search:	;D24/216,223-227,229-232 ;D9/537,545,549,756-760,761 ;D3/203.1,203.2 ;D10/81 ;D28/8

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References Cited [Referenced By]

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Primary Examiner: Hattan; Susan Bennett
Assistant Examiner: Agilee; Omeed
Attorney, Agent or Firm: Faegre Drinker Biddle & Reath LLP

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