Sample holder for ionized sample analysis

Ohmura , et al. A

Patent Grant D893742

U.S. patent number D893,742 [Application Number D/656,983] was granted by the patent office on 2020-08-18 for sample holder for ionized sample analysis. This patent grant is currently assigned to HAMAMATSU PHOTONICS K.K.. The grantee listed for this patent is HAMAMATSU PHOTONICS K.K.. Invention is credited to Masahiro Kotani, Takayuki Ohmura.


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United States Patent D893,742
Ohmura ,   et al. August 18, 2020

Sample holder for ionized sample analysis

Claims

CLAIM The ornamental design for a sample holder for ionized sample analysis, as shown and described.
Inventors: Ohmura; Takayuki (Hamamatsu, JP), Kotani; Masahiro (Hamamatsu, JP)
Applicant:
Name City State Country Type

HAMAMATSU PHOTONICS K.K.

Hamamatsu-shi, Shizuoka

N/A

JP
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka, JP)
Appl. No.: D/656,983
Filed: July 18, 2018

Foreign Application Priority Data

Jan 19, 2018 [JP] 2018-000962
Current U.S. Class: D24/224; D24/225
Current International Class: 2402
Field of Search: ;D24/216,223-227,229-232 ;D9/537,545,549 ;D3/203.1,203.2 ;D10/81

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Other References

Makeup Tool Kit 33 in 1 Make up Cosmetics Including Eyeshadow Blush Powder Lip gloss With Makeup Box Makeup Set for Gift. Online, published date unknown. Retrieved on Nov. 17, 2019 from URL: https://kozeez.com/products/makup-tool-kit-33-in-1-make-up-cosmetics-incl- uding-eyeshadow-blush-powder-lip-gloss-with-makeup-box. cited by examiner .
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Primary Examiner: Hattan; Susan Bennett
Assistant Examiner: Agilee; Omeed
Attorney, Agent or Firm: Faegre Drinker Biddle & Reath LLP

Description



FIG. 1 is a front view of a sample holder for ionized sample analysis of the present invention;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a rear perspective view thereof;

FIG. 9 is an enlarged cross-sectional view along the line 9-9 in FIG. 1, in the area designated by 9'-9' in FIG. 1;

FIG. 10 is an enlarged cross-sectional view along the line 10-10 in FIG. 1, in the area designated by 10'40' in FIG. 1;

FIG. 11 is an enlarged cross-sectional view along the line 11-11 in FIG. 1, in the area designated by 11'-11' in FIG. 1;

FIG. 12 is an enlarged cross-sectional view along the line 12-12 in FIG. 1, in the area designated by 12'-12' in FIG. 1; and,

FIG. 13 is an enlarged cross-sectional view along the line 13-13 in FIG. 1, in the area designated by 13'-13' in FIG. 1.

The dash-dot-dash broken lines depict indicators for sectional views and enlarged views and depict boundaries in the enlarged sectional views and enlarged views, the dash-dot-dash broken lines form no part of the claimed design.

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References

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